using electron or ion microprobe or incident electron or ion beam

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CPC
G01N23/225

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/225using electron or ion microprobe or incident electron or ion beam

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Highly selective chromatography-molecular rotational resonance spec...
- Patent number 12,292,399
- Issue date May 6, 2025
- BrightSpec, Inc.
- Justin L. Neill
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid scanning electron microscopy and acousto-optic based metrology
- Patent number 12,278,085
- Issue date Apr 15, 2025
- Applied Materials Israel Ltd.
- Guy Shwartz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System to inspect, modify or analyze a region of interest of a samp...
- Patent number 12,270,774
- Issue date Apr 8, 2025
- Carl Zeiss SMT GmbH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
Thin film damage detection function and charged particle beam device
- Patent number 12,265,041
- Issue date Apr 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Michio Hatano
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 12,265,043
- Issue date Apr 1, 2025
- NuFlare Technology, Inc.
- Riki Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Living cell microbeam directional and quantitative irradiation imag...
- Patent number 12,259,344
- Issue date Mar 25, 2025
- Harbin Institute of Technology
- Chenguang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method of preventing lamellar silica formation in glass container
- Patent number 12,251,743
- Issue date Mar 18, 2025
- Amgen Inc.
- Yasser Nashed-Samuel
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Grant
Method, apparatus, and program for determining condition related to...
- Patent number 12,243,711
- Issue date Mar 4, 2025
- HITACHI HIGH-TECH CORPORATION
- Takahiro Nishihata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and inspection device
- Patent number 12,237,145
- Issue date Feb 25, 2025
- HITACHI HIGH-TECH CORPORATION
- Atsuko Shintani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for voltage contrast defect detection
- Patent number 12,196,692
- Issue date Jan 14, 2025
- ASML Netherlands B.V.
- Weiming Ren
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring distribution of pores in electrode for seconda...
- Patent number 12,196,651
- Issue date Jan 14, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Hoon Han
- G01 - MEASURING TESTING
Information Patent Grant
Imaging systems and methods of operating the same
- Patent number 12,196,693
- Issue date Jan 14, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Methods for growing crystals on QCM sensors
- Patent number 12,195,840
- Issue date Jan 14, 2025
- Saudi Arabian Oil Company
- Ayrat Gizzatov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
System and method for detecting microbial agents
- Patent number 12,188,886
- Issue date Jan 7, 2025
- Nanoscout Holdings Pty Ltd.
- Samuel Weitzman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for tissue section immobilization and retention
- Patent number 12,181,388
- Issue date Dec 31, 2024
- Singular Genomics Systems, Inc.
- Yuji Ishitsuka
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Utilize machine learning in selecting high quality averaged SEM ima...
- Patent number 12,182,983
- Issue date Dec 31, 2024
- ASML Netherlands B.V.
- Chen Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern measurement device and pattern measurement method
- Patent number 12,174,551
- Issue date Dec 24, 2024
- Hitachi High-Technologies Corporation
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 12,169,182
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Wei Chean Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for Schottky TFE inspection
- Patent number 12,165,834
- Issue date Dec 10, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam delayering system and method, topographically enhanced del...
- Patent number 12,165,840
- Issue date Dec 10, 2024
- Techinsights Inc.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 12,165,863
- Issue date Dec 10, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manipulating and detecting biological samples
- Patent number 12,158,402
- Issue date Dec 3, 2024
- Singular Genomics Systems, Inc.
- Yuji Ishitsuka
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Cell analysis apparatus and cell analysis method
- Patent number 12,146,846
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Akiko Hisada
- G01 - MEASURING TESTING
Information Patent Grant
Self-differential confocal tilt sensor for measuring level variatio...
- Patent number 12,142,456
- Issue date Nov 12, 2024
- ASML Netherlands B.V.
- Jinmei Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual speed acquisition for drift corrected, fast, low dose, adaptiv...
- Patent number 12,136,532
- Issue date Nov 5, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single cell analysis using secondary ion mass spectrometry
- Patent number 12,135,300
- Issue date Nov 5, 2024
- The Board of Trustees of the Leland Stanford Junior University
- Garry P. Nolan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for projecting an array of multiple charged pa...
- Patent number 12,123,841
- Issue date Oct 22, 2024
- DELMIC IP B.V.
- Andries Pieter Johan Effting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Serial arrangement having multiple plies of asymmetric filter media...
- Patent number 12,115,502
- Issue date Oct 15, 2024
- Sartorius Stedim Biotech GmbH
- Volkmar Thom
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Sample preparation method and sample preparing apparatus
- Patent number 12,111,264
- Issue date Oct 8, 2024
- Nikon Corporation
- Ichiro Sase
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
System for estimating the occurrence of defects, and computer-reada...
- Patent number 12,111,272
- Issue date Oct 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
FIELD OF VIEW SELECTION FOR METROLOGY ASSOCIATED WITH SEMICONDUCTOR...
- Publication number 20250147433
- Publication date May 8, 2025
- ASML NETHERLANDS B.V.
- G01 - MEASURING TESTING
Information Patent Application
Ion Milling Device, and Inspection System
- Publication number 20250149288
- Publication date May 8, 2025
- Hitachi High-Tech Corporation
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF S...
- Publication number 20250130185
- Publication date Apr 24, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Uri Hadar
- G01 - MEASURING TESTING
Information Patent Application
SPECTRA DELTA METROLOGY
- Publication number 20250123225
- Publication date Apr 17, 2025
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR EXTRACTION OF STRUCTURAL DATA OF A SAMPLE FRO...
- Publication number 20250116617
- Publication date Apr 10, 2025
- Yeda Research and Development Co. Ltd.
- Michael Elbaum
- G01 - MEASURING TESTING
Information Patent Application
SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS
- Publication number 20250102451
- Publication date Mar 27, 2025
- FEI Company
- Vojtech MAHEL
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES
- Publication number 20250095955
- Publication date Mar 20, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Konstantin Chirko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBCELLULAR SELF-TRACER ION IMAGING AND LOCALIZATION METHOD OF META...
- Publication number 20250093285
- Publication date Mar 20, 2025
- Shandong Laboratory of Advanced Agricultural Sciences in Weifang
- Xiaohua HUANG
- G01 - MEASURING TESTING
Information Patent Application
UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...
- Publication number 20250078244
- Publication date Mar 6, 2025
- ASML NETHERLANDS B.V.
- Chen ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE FOR TISSUE SECTION IMMOBILIZATION AND RETENTION
- Publication number 20250067638
- Publication date Feb 27, 2025
- Singular Genomics Systems, Inc.
- Yuji Ishitsuka
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR TISSUE SECTION IMMOBILIZATION AND RETENTION
- Publication number 20250067639
- Publication date Feb 27, 2025
- Singular Genomics Systems, Inc.
- Yuji Ishitsuka
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Pattern Measurement Device and Pattern Measurement Method
- Publication number 20250060678
- Publication date Feb 20, 2025
- HITACHI HIGH-TECH CORPORATION
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR EVALUATING THE BENDING STIFFNESS OF HIGH ASPECT RATIO NA...
- Publication number 20250052703
- Publication date Feb 13, 2025
- IMEC vzw
- XiuMei Xu
- B82 - NANO-TECHNOLOGY
Information Patent Application
INSPECTION DEVICE AND FILM QUALITY INSPECTION METHOD
- Publication number 20250046569
- Publication date Feb 6, 2025
- Hitachi High-Tech Corporation
- Yasuhiro SHIRASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS AND METHOD FOR GENERATING INSPECTION IMAGE
- Publication number 20250037269
- Publication date Jan 30, 2025
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELF-DIFFERENTIAL CONFOCAL TILT SENSOR FOR MEASURING LEVEL VARIATIO...
- Publication number 20250037966
- Publication date Jan 30, 2025
- ASML NETHERLANDS B.V.
- Jinmei YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Spectrum Processing Device, Specimen Analyzing Device, and Spectrum...
- Publication number 20250029225
- Publication date Jan 23, 2025
- JEOL Ltd.
- Yuka Ebata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD...
- Publication number 20250028253
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- YEN-FONG CHAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Surface Analysis Method and Surface Analysis Apparatus
- Publication number 20250020603
- Publication date Jan 16, 2025
- Shimadzu Corporation
- Osamu FURUHASHI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED THIN FILM DEPOSITION SYSTEM AND THIN FILM DEPOSITION METH...
- Publication number 20250011918
- Publication date Jan 9, 2025
- Seoul National University R&DB Foundation
- Gyu Chul Yi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Determining Properties of a Substrate
- Publication number 20250012743
- Publication date Jan 9, 2025
- Eric Arno Vigen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM OF IMAGE ANALYSIS AND CRITICAL DIMENSION MATCHING...
- Publication number 20250003899
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Tim HOUBEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FOREIGN OBJECT HEIGHT MEASUREMENT METHOD AND CHARGED PARTICLE BEAM...
- Publication number 20250003898
- Publication date Jan 2, 2025
- HITACHI HIGH-TECH CORPORATION
- Wei SUN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION
- Publication number 20250006456
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT OF LATERAL DOPANT CONCENTRATION AND DISTRIBUTION IN HIG...
- Publication number 20240429105
- Publication date Dec 26, 2024
- Applied Materials, Inc.
- Dimitry KOUZMINOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Magnetic Deflector and Methods of Use Thereof
- Publication number 20240418662
- Publication date Dec 19, 2024
- University of North Texas
- Gary Alan Glass
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...
- Publication number 20240418660
- Publication date Dec 19, 2024
- FEI Company
- Daniel TOTONJIAN
- G01 - MEASURING TESTING
Information Patent Application
FRICTION REGULATION METHOD, APPARATUS AND SYSTEM FOR MOLYBDENUM DIS...
- Publication number 20240410916
- Publication date Dec 12, 2024
- Tsinghua University
- Dameng Liu
- C10 - PETROLEUM, GAS OR COKE INDUSTRIES TECHNICAL GASES CONTAINING CARBON MON...
Information Patent Application
SYSTEMS AND METHODS FOR MONITORING SLOPE STABILITY
- Publication number 20240410842
- Publication date Dec 12, 2024
- Muon Vision Inc.
- Tancredi Botto
- E21 - EARTH DRILLING MINING
Information Patent Application
MULTI-BEAM PARTICLE MICROSCOPE FOR REDUCING PARTICLE BEAM-INDUCED T...
- Publication number 20240402104
- Publication date Dec 5, 2024
- Carl Zeiss MultiSEM GmbH
- Gero Storeck
- H01 - BASIC ELECTRIC ELEMENTS

using electron or ion microprobe or incident electron or ion beam

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Highly selective chromatography-molecular rotational resonance spec...

Hybrid scanning electron microscopy and acousto-optic based metrology

System to inspect, modify or analyze a region of interest of a samp...

Thin film damage detection function and charged particle beam device

Inspection apparatus

Living cell microbeam directional and quantitative irradiation imag...

Method of preventing lamellar silica formation in glass container

Method, apparatus, and program for determining condition related to...

Charged particle beam device and inspection device

Systems and methods for voltage contrast defect detection

Method for measuring distribution of pores in electrode for seconda...

Imaging systems and methods of operating the same

Methods for growing crystals on QCM sensors

System and method for detecting microbial agents

Device for tissue section immobilization and retention

Utilize machine learning in selecting high quality averaged SEM ima...

Pattern measurement device and pattern measurement method

Charged particle beam apparatus

Method and apparatus for Schottky TFE inspection

Ion beam delayering system and method, topographically enhanced del...

Systems and approaches for semiconductor metrology and surface anal...

Manipulating and detecting biological samples

Cell analysis apparatus and cell analysis method

Self-differential confocal tilt sensor for measuring level variatio...

Dual speed acquisition for drift corrected, fast, low dose, adaptiv...

Single cell analysis using secondary ion mass spectrometry

Apparatus and method for projecting an array of multiple charged pa...

Serial arrangement having multiple plies of asymmetric filter media...

Sample preparation method and sample preparing apparatus

System for estimating the occurrence of defects, and computer-reada...

Patents Applicationslast 30 patents

FIELD OF VIEW SELECTION FOR METROLOGY ASSOCIATED WITH SEMICONDUCTOR...

Ion Milling Device, and Inspection System

NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF S...

SPECTRA DELTA METROLOGY

SYSTEM AND METHOD FOR EXTRACTION OF STRUCTURAL DATA OF A SAMPLE FRO...

SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS

METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES

SUBCELLULAR SELF-TRACER ION IMAGING AND LOCALIZATION METHOD OF META...

UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...

DEVICE FOR TISSUE SECTION IMMOBILIZATION AND RETENTION

METHOD FOR TISSUE SECTION IMMOBILIZATION AND RETENTION

Pattern Measurement Device and Pattern Measurement Method

METHOD FOR EVALUATING THE BENDING STIFFNESS OF HIGH ASPECT RATIO NA...

INSPECTION DEVICE AND FILM QUALITY INSPECTION METHOD

INSPECTION APPARATUS AND METHOD FOR GENERATING INSPECTION IMAGE

SELF-DIFFERENTIAL CONFOCAL TILT SENSOR FOR MEASURING LEVEL VARIATIO...

Spectrum Processing Device, Specimen Analyzing Device, and Spectrum...

METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD...

Surface Analysis Method and Surface Analysis Apparatus

AUTOMATED THIN FILM DEPOSITION SYSTEM AND THIN FILM DEPOSITION METH...

System and Method for Determining Properties of a Substrate

METHOD AND SYSTEM OF IMAGE ANALYSIS AND CRITICAL DIMENSION MATCHING...

FOREIGN OBJECT HEIGHT MEASUREMENT METHOD AND CHARGED PARTICLE BEAM...

CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION

MEASUREMENT OF LATERAL DOPANT CONCENTRATION AND DISTRIBUTION IN HIG...

Magnetic Deflector and Methods of Use Thereof

PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...

FRICTION REGULATION METHOD, APPARATUS AND SYSTEM FOR MOLYBDENUM DIS...

SYSTEMS AND METHODS FOR MONITORING SLOPE STABILITY

MULTI-BEAM PARTICLE MICROSCOPE FOR REDUCING PARTICLE BEAM-INDUCED T...