TREA

using electron or ion microprobe or incident electron or ion beam

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Industry

  • CPC
  • G01N23/225
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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/225using electron or ion microprobe or incident electron or ion beam
Industries