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using electron or ion microprobe or incident electron or ion beam
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G01N23/225
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00
Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00
Current Industry
G01N23/225
using electron or ion microprobe or incident electron or ion beam
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Patents Grants
last 30 patents
Information
Patent Grant
Adaptive specimen image acquisition
Patent number
11,982,634
Issue date
May 14, 2024
FEI Company
Pavel Potocek
G01 - MEASURING TESTING
Information
Patent Grant
Material properties from two-dimensional image
Patent number
11,982,635
Issue date
May 14, 2024
BP Corporation North America Inc.
Glen L. Gettemy
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor structure inspection using a high atomic number material
Patent number
11,984,365
Issue date
May 14, 2024
Taiwan Semiconductor Manufacturing Company, Ltd
Pei-Hsuan Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system to mimic a random structural pattern
Patent number
11,981,789
Issue date
May 14, 2024
UNM Rainforest Innovations
Sang Eon Han
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Methods and systems for determining variability of cryo-EM protein...
Patent number
11,977,039
Issue date
May 7, 2024
Ali Punjani
G01 - MEASURING TESTING
Information
Patent Grant
Inspection method and inspection apparatus
Patent number
11,978,195
Issue date
May 7, 2024
Kioxia Corporation
Keisuke Chiba
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of examining a sample using a charged particle microscope
Patent number
11,971,372
Issue date
Apr 30, 2024
FEI Company
Jan Klusácek
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for monitoring slope stability
Patent number
11,971,373
Issue date
Apr 30, 2024
Muon Vision Inc.
Tancredi Botto
E21 - EARTH DRILLING MINING
Information
Patent Grant
Determination method, elimination method and apparatus for electron...
Patent number
11,971,368
Issue date
Apr 30, 2024
SOUTH CHINA AGRICULTURAL UNIVERSITY
Fang Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Surface analyzer
Patent number
11,965,841
Issue date
Apr 23, 2024
Shimadzu Corporation
Akira Ogoshi
G01 - MEASURING TESTING
Information
Patent Grant
Charge-resistant epoxy resins for electron microscopy applications
Patent number
11,965,840
Issue date
Apr 23, 2024
The Regents of the University of California
Thomas Deerinck
G01 - MEASURING TESTING
Information
Patent Grant
Geometry based three dimensional reconstruction of a semiconductor...
Patent number
11,953,316
Issue date
Apr 9, 2024
Applied Materials Israel Ltd.
Rafael Bistritzer
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for real time stereo imaging using multiple ele...
Patent number
11,942,303
Issue date
Mar 26, 2024
ASML Netherlands B.V.
Yan Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method to determine relative thermal maturity from porosities measu...
Patent number
11,940,398
Issue date
Mar 26, 2024
Saudi Arabian Oil Company
Shannon Lee Eichmann
E21 - EARTH DRILLING MINING
Information
Patent Grant
Method for improving an EBSD/TKD map
Patent number
11,940,396
Issue date
Mar 26, 2024
Bruker Nano GmbH
Daniel Radu Goran
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for the detection and quantification of nano or micro plasti...
Patent number
11,933,740
Issue date
Mar 19, 2024
The European Union, Represented by the European Commission
Andrea Valsesia
G01 - MEASURING TESTING
Information
Patent Grant
Nondestructive sensing device and method for inspection and measuri...
Patent number
11,933,749
Issue date
Mar 19, 2024
Texas Research International, Inc.
Doyle T. Motes
G01 - MEASURING TESTING
Information
Patent Grant
Lateral recess measurement in a semiconductor specimen
Patent number
11,921,063
Issue date
Mar 5, 2024
Applied Materials Israel Ltd.
Michael Chemama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and systems for inclusion analysis
Patent number
11,921,053
Issue date
Mar 5, 2024
FEI Company
Jean-Marc Bohlen
G01 - MEASURING TESTING
Information
Patent Grant
System for ultra-high temperature in-situ fretting fatigue experiment
Patent number
11,921,066
Issue date
Mar 5, 2024
Nanjing University of Aeronautics and Astronautics
Qinan Han
G01 - MEASURING TESTING
Information
Patent Grant
Method for quantitatively analyzing reservoir formation of ultra-de...
Patent number
11,921,099
Issue date
Mar 5, 2024
SOUTHWEST PETROLEUM UNIVERSITY
Fei Huo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope device and electron beam inspection ap...
Patent number
11,908,657
Issue date
Feb 20, 2024
Zhongke Jingyuan Electron Limited
Qinglang Meng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron spectrometer
Patent number
11,898,975
Issue date
Feb 13, 2024
Tohoku University
Masahiko Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus adjustment system and inspection apparatus adj...
Patent number
11,898,968
Issue date
Feb 13, 2024
HITACHI HIGH-TECH CORPORATION
Taichi Maeda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Charged particle beam device, computer, and signal processing metho...
Patent number
11,898,974
Issue date
Feb 13, 2024
HITACHI HIGH-TECH CORPORATION
Hiroshi Oinuma
G01 - MEASURING TESTING
Information
Patent Grant
Detection and correction of system responses in real-time
Patent number
11,894,214
Issue date
Feb 6, 2024
KLA Corporation
Henning Stoschus
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Material properties from two-dimensional image
Patent number
11,885,757
Issue date
Jan 30, 2024
BP Corporation North America Inc.
Glen L. Gettemy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Build material handling unit for a powder module for an apparatus f...
Patent number
11,878,463
Issue date
Jan 23, 2024
CONCEPT LASER GMBH
Dominik Eideloth
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Systems and methods for predicting film thickness of individual lay...
Patent number
11,862,520
Issue date
Jan 2, 2024
Applied Materials, Inc.
Bharath Ram Sundar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus of plural charged-particle beams
Patent number
RE49784
Issue date
Jan 2, 2024
ASML Netherlands B.V.
Weiming Ren
Patents Applications
last 30 patents
Information
Patent Application
SUBSTRATE INSPECTION APPARATUS AND A METHOD OF INSPECTING A SUBSTRA...
Publication number
20240151664
Publication date
May 9, 2024
Samsung Electronics Co., Ltd.
Kwang-Eun KIM
G01 - MEASURING TESTING
Information
Patent Application
ELECTRON MICROSCOPE, DEVICE FOR MEASURING ELECTRON-PHOTON CORRELATI...
Publication number
20240153736
Publication date
May 9, 2024
Japan Science and Technology Agency
Takumi SANNOMIYA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INSPECTION SYSTEM
Publication number
20240151665
Publication date
May 9, 2024
Hitachi High-Tech Corporation
Yohei NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CALIBRATING PARAMETER ERROR OF ELECTRON PROBE MICROANALY...
Publication number
20240151666
Publication date
May 9, 2024
Shanghai Institute of Measurement and Testing Technology
Lihua LEI
G01 - MEASURING TESTING
Information
Patent Application
Analyzing Method and Analyzer
Publication number
20240142395
Publication date
May 2, 2024
JEOL Ltd.
Koki Kato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE
Publication number
20240125718
Publication date
Apr 18, 2024
Silanna UV Technologies Pte Ltd
Petar Atanackovic
G01 - MEASURING TESTING
Information
Patent Application
DEFECT DETECTION DEVICE AND METHOD THEREOF
Publication number
20240127425
Publication date
Apr 18, 2024
Samsung Electronics Co., Ltd.
Sungwook HWANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Dynamic Data Driven Detector Tuning for Improved Investigation of S...
Publication number
20240110880
Publication date
Apr 4, 2024
FEI Company
Maurice PEEMEN
G01 - MEASURING TESTING
Information
Patent Application
Systems And Methods For Detecting Beam Displacement
Publication number
20240110881
Publication date
Apr 4, 2024
FEI Company
James B. McGinn
G01 - MEASURING TESTING
Information
Patent Application
ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK
Publication number
20240094151
Publication date
Mar 21, 2024
FEI Company
Pavel Potocek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
Publication number
20240094150
Publication date
Mar 21, 2024
APPLIED MATERIALS ISRAEL LTD.
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Z-PROFILING OF WAFERS BASED ON X-RAY MEASUREMENTS
Publication number
20240085356
Publication date
Mar 14, 2024
APPLIED MATERIALS ISRAEL LTD.
Doron Girmonsky
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Scanning Electron Microscope and Map Display Method for Absorption...
Publication number
20240085357
Publication date
Mar 14, 2024
JEOL Ltd.
Hideyuki Takahashi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MULTIPLE PLASMA ION SOURCE FOR INLINE SECONDARY ION MASS SPECTROMETRY
Publication number
20240090111
Publication date
Mar 14, 2024
Ming Hong YANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
Publication number
20240085174
Publication date
Mar 14, 2024
NOVA MEASURING INSTRUMENTS INC.
Heath POIS
G01 - MEASURING TESTING
Information
Patent Application
Thin Film Damage Detection Function and Charged Particle Beam Device
Publication number
20240085352
Publication date
Mar 14, 2024
Hitachi High-Tech Corporation
Michio HATANO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
Publication number
20240087869
Publication date
Mar 14, 2024
NOVA MEASURING INSTRUMENTS INC.
David A. REED
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MEASURING METHOD AND MEASURING DEVICE
Publication number
20240085355
Publication date
Mar 14, 2024
Japan Display Inc.
Satoru TOMITA
G01 - MEASURING TESTING
Information
Patent Application
SCINTILLATOR STRUCTURE AND METHOD OF EVALUATING SCINTILLATOR
Publication number
20240069221
Publication date
Feb 29, 2024
Hitachi Metals, Ltd.
Shunsuke GOTO
G01 - MEASURING TESTING
Information
Patent Application
NOISE DIAGNOSTICS FOR AN ELECTRON BEAM INSPECTION SYSTEM WITH SWATHING
Publication number
20240068967
Publication date
Feb 29, 2024
KLA Corporation
Bo Xiong
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LIGHT-EMITTING ELEMENT, OPTICAL DETECTION MODULE, MANUFACTURING MET...
Publication number
20240063328
Publication date
Feb 22, 2024
Hamamatsu Photonics K.K.
Kuniyoshi YAMAUCHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ENERGY DISPERSIVE X-RAY SPECTROSCOPY SENSING UNIT BACKGROUND
Publication number
20240060912
Publication date
Feb 22, 2024
APPLIED MATERIALS ISRAEL LTD.
Martin Chauvin
G01 - MEASURING TESTING
Information
Patent Application
METHOD TO DETERMINE RELATIVE THERMAL MATURITY FROM POROSITIES MEASU...
Publication number
20240060915
Publication date
Feb 22, 2024
ARAMCO SERVICES COMPANY
Shannon Lee Eichmann
E21 - EARTH DRILLING MINING
Information
Patent Application
OVERLAY MEASURING METHOD
Publication number
20240060916
Publication date
Feb 22, 2024
Samsung Electronics Co., Ltd.
Wonjun YANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF EVALUATING CENTRAL SEGREGATION IN STEEL
Publication number
20240044822
Publication date
Feb 8, 2024
JFE STEEL CORPORATION
Tomoharu ISHIDA
G01 - MEASURING TESTING
Information
Patent Application
CHARGED PARTICLE OPTICAL DEVICE, OBJECTIVE LENS ASSEMBLY, DETECTOR,...
Publication number
20240044824
Publication date
Feb 8, 2024
ASML NETHERLANDS B.V.
Marco Jan-Jaco WIELAND
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF INSPECTING SAMPLES WITH A BEAM OF CHARGED PARTICLES
Publication number
20240044820
Publication date
Feb 8, 2024
ASML NETHERLANDS B.V.
Kuo-Feng TSENG
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR QUANTITATIVE EVALUATION OF SEALING PROPERTY O...
Publication number
20240044823
Publication date
Feb 8, 2024
China University of Petroleum (East China)
Yuxin HAO
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
Publication number
20240027377
Publication date
Jan 25, 2024
FEI Company
Jan Klusácek
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR QUANTITATIVELY ANALYZING RESERVOIR FORMATION OF ULTRA-DE...
Publication number
20240019414
Publication date
Jan 18, 2024
SOUTHWEST PETROLEUM UNIVERSITY
Fei HUO
H01 - BASIC ELECTRIC ELEMENTS