using electron or ion microprobe or incident electron or ion beam

Industry

CPC
G01N23/225

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/225using electron or ion microprobe or incident electron or ion beam

Industries

Patents Grantslast 30 patents

Information Patent Grant
Scintillator structure and method of evaluating scintillator
- Patent number 12,366,671
- Issue date Jul 22, 2025
- PROTERIAL, LTD.
- Shunsuke Goto
- G01 - MEASURING TESTING
Information Patent Grant
Graphene oxide affinity sample grids for Cyro-EM
- Patent number 12,360,021
- Issue date Jul 15, 2025
- The Regents of the University of California
- Feng Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample image display system and charged particle beam apparatus
- Patent number 12,354,830
- Issue date Jul 8, 2025
- HITACHI HIGH-TECH CORPORATION
- Wei Chean Tan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple secondary electron beam alignment method, multiple seconda...
- Patent number 12,339,241
- Issue date Jun 24, 2025
- NuFlare Technology, Inc.
- Koichi Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for automated characterization of fillers in po...
- Patent number 12,340,500
- Issue date Jun 24, 2025
- Honeywell Federal Manufacturing & Technologies, LLC
- Joseph Sang Kim
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic spectral acquisition for material studies
- Patent number 12,332,194
- Issue date Jun 17, 2025
- FEI Company
- Darius Koĉár
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for calibrating parameter error of electron probe microanaly...
- Patent number 12,332,195
- Issue date Jun 17, 2025
- Shanghai Institute of Measurement and Testing Technology
- Lihua Lei
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device
- Patent number 12,334,299
- Issue date Jun 17, 2025
- HITACHI HIGH-TECH CORPORATION
- U Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron spectroscopy based techniques for determining various chem...
- Patent number 12,326,410
- Issue date Jun 10, 2025
- COZAI LTD
- Hagai Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Automatic particle beam focusing
- Patent number 12,327,342
- Issue date Jun 10, 2025
- FEI Company
- Yuchen Deng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample component determination method, sample component determinati...
- Patent number 12,326,409
- Issue date Jun 10, 2025
- Shimadzu Corporation
- Akira Ogoshi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Quality control evaluation method of cyanate ester matrix resin mat...
- Patent number 12,320,765
- Issue date Jun 3, 2025
- THE AEROSPACE CORPORATION
- Rafael J. Zaldivar
- G01 - MEASURING TESTING
Information Patent Grant
System and methods of charged particle detectors for blast furnace...
- Patent number 12,320,764
- Issue date Jun 3, 2025
- Decision Sciences International Corporation
- Anthony Crego
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system, lithographic apparatus, and inspection method
- Patent number 12,313,980
- Issue date May 27, 2025
- ASML Netherlands B.V.
- Alexey Olegovich Polyakov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for inspecting a sample by means of multiple c...
- Patent number 12,306,121
- Issue date May 20, 2025
- DELMIC IP B.V.
- Andries Pieter Johan Effting
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method for obtaining information about a sample
- Patent number 12,306,100
- Issue date May 20, 2025
- LAVCHIEFF Analytics GmbH
- Ventsislav Lavchiev
- G01 - MEASURING TESTING
Information Patent Grant
Study method for chlorite growth pattern based on in-situ high-prec...
- Patent number 12,298,292
- Issue date May 13, 2025
- CHENGDU UNIVERSITY OF TECHNOLOGY
- Laixing Cai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for tissue section immobilization and retention
- Patent number 12,298,211
- Issue date May 13, 2025
- Singular Genomics Systems, Inc.
- Yuji Ishitsuka
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Method and system for stress testing of materials using laser accel...
- Patent number 12,298,263
- Issue date May 13, 2025
- Institut National de la Recherche Scientifique
- Patrizio Antici
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Highly selective chromatography-molecular rotational resonance spec...
- Patent number 12,292,399
- Issue date May 6, 2025
- BrightSpec, Inc.
- Justin L. Neill
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid scanning electron microscopy and acousto-optic based metrology
- Patent number 12,278,085
- Issue date Apr 15, 2025
- Applied Materials Israel Ltd.
- Guy Shwartz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System to inspect, modify or analyze a region of interest of a samp...
- Patent number 12,270,774
- Issue date Apr 8, 2025
- Carl Zeiss SMT GmbH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
Thin film damage detection function and charged particle beam device
- Patent number 12,265,041
- Issue date Apr 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Michio Hatano
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 12,265,043
- Issue date Apr 1, 2025
- NuFlare Technology, Inc.
- Riki Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Living cell microbeam directional and quantitative irradiation imag...
- Patent number 12,259,344
- Issue date Mar 25, 2025
- Harbin Institute of Technology
- Chenguang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method of preventing lamellar silica formation in glass container
- Patent number 12,251,743
- Issue date Mar 18, 2025
- Amgen Inc.
- Yasser Nashed-Samuel
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Grant
Method, apparatus, and program for determining condition related to...
- Patent number 12,243,711
- Issue date Mar 4, 2025
- HITACHI HIGH-TECH CORPORATION
- Takahiro Nishihata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and inspection device
- Patent number 12,237,145
- Issue date Feb 25, 2025
- HITACHI HIGH-TECH CORPORATION
- Atsuko Shintani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring distribution of pores in electrode for seconda...
- Patent number 12,196,651
- Issue date Jan 14, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Hoon Han
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for voltage contrast defect detection
- Patent number 12,196,692
- Issue date Jan 14, 2025
- ASML Netherlands B.V.
- Weiming Ren
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
THIN FILM THICKNESS MEASURING DEVICE AND THIN FILM THICKNESS MEASUR...
- Publication number 20250237621
- Publication date Jul 24, 2025
- SAMSUNG DISPLAY CO., LTD.
- Won Hyuk JANG
- G01 - MEASURING TESTING
Information Patent Application
ELEMENTAL IDENTIFICATION BASED ON PHASE ANALYSIS
- Publication number 20250231127
- Publication date Jul 17, 2025
- FEI Company
- Marek Vanatka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER INSPECTION METHOD
- Publication number 20250231121
- Publication date Jul 17, 2025
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- G01 - MEASURING TESTING
Information Patent Application
IMPROVED SCANNING ELECTRON MICROSCOPE AND METHOD OF USING THE SAME
- Publication number 20250231130
- Publication date Jul 17, 2025
- FEI Company
- Jan Trojek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
E-BEAM OPTIMIZATION FOR OVERLAY MEASUREMENT OF BURIED FEATURES
- Publication number 20250231129
- Publication date Jul 17, 2025
- ASML NETHERLANDS B.V.
- Benoit Herve GAURY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING SYSTEMS WITH SMALL X-RAY SOURCES
- Publication number 20250231131
- Publication date Jul 17, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Yurun LIU
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VI...
- Publication number 20250231132
- Publication date Jul 17, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR TISSUE SECTION IMMOBILIZATION AND RETENTION
- Publication number 20250224314
- Publication date Jul 10, 2025
- Singular Genomics Systems, Inc.
- Yuji Ishitsuka
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
DEFECT REGION DETECTION DEVICE AND WAFER DEFECT DETECTION SYSTEM IN...
- Publication number 20250217960
- Publication date Jul 3, 2025
- Samsung Electronics Co., Ltd.
- Minsu Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM
- Publication number 20250216346
- Publication date Jul 3, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Ron MEIRY
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VI...
- Publication number 20250216347
- Publication date Jul 3, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Uri Hadar
- G01 - MEASURING TESTING
Information Patent Application
Analysis System, Analysis Method, and Analysis Program
- Publication number 20250208076
- Publication date Jun 26, 2025
- Hitachi High-Tech Corporation
- Keiichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
Steel Evaluation Method and Non-Transitory Computer Readable Medium
- Publication number 20250208075
- Publication date Jun 26, 2025
- PROTERIAL, LTD.
- Shiho Fukumoto
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION
- Publication number 20250208074
- Publication date Jun 26, 2025
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INSPECTING GROUP-III ELEMENT NITRIDE SUBSTRATE, METHOD OF...
- Publication number 20250201636
- Publication date Jun 19, 2025
- NGK Insulators, Ltd.
- Yoshitaka KURAOKA
- C30 - CRYSTAL GROWTH
Information Patent Application
PARTICLE-INDUCED X-RAY EMISSION USING LIGHT AND HEAVY PARTICLE BEAMS
- Publication number 20250189469
- Publication date Jun 12, 2025
- FEI Company
- Sean M. Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Analysis System, Analysis Method, and Analysis Program
- Publication number 20250189468
- Publication date Jun 12, 2025
- Hitachi High-Tech Corporation
- Keiichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
CARTRIDGE
- Publication number 20250172901
- Publication date May 29, 2025
- Canon Kabushiki Kaisha
- TAKASHI HIRAMATSU
- G01 - MEASURING TESTING
Information Patent Application
DEEP LEARNING OF BISMUTH TELLURIDE CRYSTAL SIZE AND GRAIN BOUNDARIE...
- Publication number 20250164423
- Publication date May 22, 2025
- ATS IP, LLC
- Jake Perez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for evaluating suitability of a pharmaceutical container for...
- Publication number 20250164424
- Publication date May 22, 2025
- SCHOTT Pharma AG & Co. KGaA
- Matthias BICKER
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD OF PREVENTING LAMELLAR SILICA FORMATION IN GLASS CONTAINER
- Publication number 20250153228
- Publication date May 15, 2025
- Amgen Inc.
- Yasser Nashed-Samuel
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Application
HIGH-CONTRAST EN-BLOC STAINING OF MOUSE WHOLE-BRAIN AND HUMAN BRAIN...
- Publication number 20250155336
- Publication date May 15, 2025
- Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V.
- Kun SONG
- G01 - MEASURING TESTING
Information Patent Application
FIELD OF VIEW SELECTION FOR METROLOGY ASSOCIATED WITH SEMICONDUCTOR...
- Publication number 20250147433
- Publication date May 8, 2025
- ASML NETHERLANDS B.V.
- Tsung-Pao FANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Ion Milling Device, and Inspection System
- Publication number 20250149288
- Publication date May 8, 2025
- Hitachi High-Tech Corporation
- Naohiro FUJITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF S...
- Publication number 20250130185
- Publication date Apr 24, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Uri Hadar
- G01 - MEASURING TESTING
Information Patent Application
SPECTRA DELTA METROLOGY
- Publication number 20250123225
- Publication date Apr 17, 2025
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR EXTRACTION OF STRUCTURAL DATA OF A SAMPLE FRO...
- Publication number 20250116617
- Publication date Apr 10, 2025
- Yeda Research and Development Co. Ltd.
- Michael Elbaum
- G01 - MEASURING TESTING
Information Patent Application
SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS
- Publication number 20250102451
- Publication date Mar 27, 2025
- FEI Company
- Vojtech MAHEL
- G01 - MEASURING TESTING
Information Patent Application
SUBCELLULAR SELF-TRACER ION IMAGING AND LOCALIZATION METHOD OF META...
- Publication number 20250093285
- Publication date Mar 20, 2025
- Shandong Laboratory of Advanced Agricultural Sciences in Weifang
- Xiaohua HUANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES
- Publication number 20250095955
- Publication date Mar 20, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Konstantin Chirko
- H01 - BASIC ELECTRIC ELEMENTS

using electron or ion microprobe or incident electron or ion beam

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Scintillator structure and method of evaluating scintillator

Graphene oxide affinity sample grids for Cyro-EM

Sample image display system and charged particle beam apparatus

Multiple secondary electron beam alignment method, multiple seconda...

Systems and methods for automated characterization of fillers in po...

Dynamic spectral acquisition for material studies

Method for calibrating parameter error of electron probe microanaly...

Charged particle beam device

Electron spectroscopy based techniques for determining various chem...

Automatic particle beam focusing

Sample component determination method, sample component determinati...

Quality control evaluation method of cyanate ester matrix resin mat...

System and methods of charged particle detectors for blast furnace...

Inspection system, lithographic apparatus, and inspection method

Method and apparatus for inspecting a sample by means of multiple c...

Measurement system and method for obtaining information about a sample

Study method for chlorite growth pattern based on in-situ high-prec...

Device for tissue section immobilization and retention

Method and system for stress testing of materials using laser accel...

Highly selective chromatography-molecular rotational resonance spec...

Hybrid scanning electron microscopy and acousto-optic based metrology

System to inspect, modify or analyze a region of interest of a samp...

Thin film damage detection function and charged particle beam device

Inspection apparatus

Living cell microbeam directional and quantitative irradiation imag...

Method of preventing lamellar silica formation in glass container

Method, apparatus, and program for determining condition related to...

Charged particle beam device and inspection device

Method for measuring distribution of pores in electrode for seconda...

Systems and methods for voltage contrast defect detection

Patents Applicationslast 30 patents

THIN FILM THICKNESS MEASURING DEVICE AND THIN FILM THICKNESS MEASUR...

ELEMENTAL IDENTIFICATION BASED ON PHASE ANALYSIS

WAFER INSPECTION METHOD

IMPROVED SCANNING ELECTRON MICROSCOPE AND METHOD OF USING THE SAME

E-BEAM OPTIMIZATION FOR OVERLAY MEASUREMENT OF BURIED FEATURES

IMAGING SYSTEMS WITH SMALL X-RAY SOURCES

NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VI...

DEVICE FOR TISSUE SECTION IMMOBILIZATION AND RETENTION

DEFECT REGION DETECTION DEVICE AND WAFER DEFECT DETECTION SYSTEM IN...

DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM

NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VI...

Analysis System, Analysis Method, and Analysis Program

Steel Evaluation Method and Non-Transitory Computer Readable Medium

SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION

METHOD OF INSPECTING GROUP-III ELEMENT NITRIDE SUBSTRATE, METHOD OF...

PARTICLE-INDUCED X-RAY EMISSION USING LIGHT AND HEAVY PARTICLE BEAMS

Analysis System, Analysis Method, and Analysis Program

CARTRIDGE

DEEP LEARNING OF BISMUTH TELLURIDE CRYSTAL SIZE AND GRAIN BOUNDARIE...

Method for evaluating suitability of a pharmaceutical container for...

METHOD OF PREVENTING LAMELLAR SILICA FORMATION IN GLASS CONTAINER

HIGH-CONTRAST EN-BLOC STAINING OF MOUSE WHOLE-BRAIN AND HUMAN BRAIN...

FIELD OF VIEW SELECTION FOR METROLOGY ASSOCIATED WITH SEMICONDUCTOR...

Ion Milling Device, and Inspection System

NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF S...

SPECTRA DELTA METROLOGY

SYSTEM AND METHOD FOR EXTRACTION OF STRUCTURAL DATA OF A SAMPLE FRO...

SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS

SUBCELLULAR SELF-TRACER ION IMAGING AND LOCALIZATION METHOD OF META...

METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES