using focussing or collimating elements

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G01J3/0208

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

Current Industry

G01J3/0208using focussing or collimating elements

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Dispersion measurement apparatus and dispersion measurement method
- Patent number 12,366,480
- Issue date Jul 22, 2025
- Hamamatsu Photonics K.K.
- Koyo Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Deployable micro-spectrometer bullets
- Patent number 12,359,967
- Issue date Jul 15, 2025
- SPACE AGE TECHNOLOGIES, LLC.
- Sang H. Choi
- F41 - WEAPONS
Information Patent Grant
Systems and methods for optical metrology
- Patent number 12,359,968
- Issue date Jul 15, 2025
- Nova Ltd.
- Yonatan Oren
- G01 - MEASURING TESTING
Information Patent Grant
Microscope device, spectroscope, and microscope system
- Patent number 12,352,945
- Issue date Jul 8, 2025
- Sony Group Corporation
- Tetsuro Kuwayama
- G01 - MEASURING TESTING
Information Patent Grant
Smartphone-based OCT systems and methods
- Patent number 12,352,622
- Issue date Jul 8, 2025
- Vanderbilt University
- Audrey K. Bowden
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spectrometers having a fringe tilted grating
- Patent number 12,345,949
- Issue date Jul 1, 2025
- Captain JRT LLC
- Eric Todd Marple
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices for standoff differential Raman spectroscopy wi...
- Patent number 12,339,165
- Issue date Jun 24, 2025
- Pendar Technologies, LLC
- Daryoosh Vakhshoori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stylus and color information transmitting method
- Patent number 12,333,092
- Issue date Jun 17, 2025
- Wacom Co., Ltd.
- Vanio Kirilov Ivanov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for Raman signal analysis
- Patent number 12,332,178
- Issue date Jun 17, 2025
- Apollon Inc.
- Miyeon Jue
- G01 - MEASURING TESTING
Information Patent Grant
Spectral analysis of a sample
- Patent number 12,329,496
- Issue date Jun 17, 2025
- Agilent Technologies LDA UK Limited
- Philip Valmont Wilson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Two-dimensional terahertz radiation detector
- Patent number 12,326,365
- Issue date Jun 10, 2025
- Office National D'Etudes et de Recherches Aerospatiales
- Arthur Salmon
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Spectroscope
- Patent number 12,326,363
- Issue date Jun 10, 2025
- Answeray Inc.
- Seong Ho Cho
- G01 - MEASURING TESTING
Information Patent Grant
Linear array scanning brillouin scattering elastic imaging device
- Patent number 12,326,366
- Issue date Jun 10, 2025
- NANCHANG HANGKONG UNIVERSITY
- Jiulin Shi
- G01 - MEASURING TESTING
Information Patent Grant
Hydrogen sulfide imaging system
- Patent number 12,326,430
- Issue date Jun 10, 2025
- Rebellion Photonics, Inc.
- Robert Timothy Kester
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Divided-aperture infra-red spectral imaging system
- Patent number 12,326,371
- Issue date Jun 10, 2025
- Rebellion Photonics, Inc.
- Robert Timothy Kester
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Spectrometry systems with decreased light path
- Patent number 12,313,464
- Issue date May 27, 2025
- SCIO Solutions Ltd
- Damian Goldring
- G01 - MEASURING TESTING
Information Patent Grant
Raman spectroscopic device
- Patent number 12,313,552
- Issue date May 27, 2025
- Answeray Inc.
- Seong Ho Cho
- G01 - MEASURING TESTING
Information Patent Grant
Hyperspectral imaging device
- Patent number 12,313,465
- Issue date May 27, 2025
- Teknologian tutkimuskeskus VTT Oy
- Kai Ojala
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating one or more optical sensors of a laser machi...
- Patent number 12,313,463
- Issue date May 27, 2025
- Precitec GmbH & Co. KG
- Rüdiger Moser
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Hyperspectral imager method and apparatus
- Patent number 12,306,043
- Issue date May 20, 2025
- Technological Resources Pty. Limited
- Richard J. Murphy
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for confocal microscopes
- Patent number 12,306,388
- Issue date May 20, 2025
- Arizona Board of Regents on behalf of the University of Arizona
- Dongkyun Kang
- G01 - MEASURING TESTING
Information Patent Grant
Optical technique for material characterization
- Patent number 12,298,182
- Issue date May 13, 2025
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometry apparatus
- Patent number 12,292,330
- Issue date May 6, 2025
- HITACHI HIGH-TECH CORPORATION
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Limitation of noise on light detectors using an aperture
- Patent number 12,292,502
- Issue date May 6, 2025
- Waymo LLC
- Pierre-Yves Droz
- G01 - MEASURING TESTING
Information Patent Grant
Raman infrared compound microscope device
- Patent number 12,292,383
- Issue date May 6, 2025
- Shimadzu Corporation
- Fumiya Katsutani
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses, systems, and methods for detecting materials based on...
- Patent number 12,281,942
- Issue date Apr 22, 2025
- Wayne State University
- Gregory William Auner
- G01 - MEASURING TESTING
Information Patent Grant
Optical meta-lens spectrometer to analyze spectral characteristics...
- Patent number 12,270,705
- Issue date Apr 8, 2025
- Tunoptix, Inc.
- Alan Zhan
- G02 - OPTICS
Information Patent Grant
Illumination systems and optical devices for laser beam shaping
- Patent number 12,270,703
- Issue date Apr 8, 2025
- IDEX Health & Science LLC
- Jeffrey M. Bendick
- G02 - OPTICS
Information Patent Grant
Apparatus comprising a first lens, a second lens, a third lens, a f...
- Patent number 12,265,029
- Issue date Apr 1, 2025
- EZconn Corporation
- Chin-Tsung Wu
- G01 - MEASURING TESTING
Information Patent Grant
Image sensor and method of operating
- Patent number 12,247,879
- Issue date Mar 11, 2025
- Samsung Electronics Co., Ltd.
- Radwanul Hasan Siddique
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLE-WAVELENGTH REFLECTIVE RAMAN PROBE AND RAMAN SPECTRA DETECT...
- Publication number 20250216262
- Publication date Jul 3, 2025
- NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Ding-Zheng LIN
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SPECTROMETER AND CAMERA WITH ROTATING PRISM
- Publication number 20250216259
- Publication date Jul 3, 2025
- Karl Storz Imaging, Inc.
- Eric L. Hale
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE APPARATUS
- Publication number 20250216264
- Publication date Jul 3, 2025
- Ushio Denki Kabushiki Kaisha
- Shingo AKAI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR SPECTRUM DETECTION BY DEFECT SCATTERING CA...
- Publication number 20250216255
- Publication date Jul 3, 2025
- NANJING INSTITUTE OF ASTRONOMICAL OPTICS & TECHNOLOGY, CHINESE ACADEMY OF SCI...
- Jinping HE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COMPONENT AND SYSTEM FOR SIMULTANEOUS 3D HYPERSPECTRAL IMAGING
- Publication number 20250216257
- Publication date Jul 3, 2025
- HI-Spectral, LLC
- Haosheng LIN
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SLIT CONFIGURED HYPERSPECTRAL IMAGER
- Publication number 20250198845
- Publication date Jun 19, 2025
- GHGSat Inc.
- Jason MCKEEVER
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SPECTROMETER SYSTEM WITH VOLUME HOLOGRAPHIC LIGHT GUIDE ELEMENT
- Publication number 20250198842
- Publication date Jun 19, 2025
- National Central University
- Wen-Kai LIN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR RAMAN SIGNAL ANALYSIS
- Publication number 20250189454
- Publication date Jun 12, 2025
- Apollon Inc.
- Miyeon JUE
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MULTI-TRACK RAMAN ANALYZER
- Publication number 20250189375
- Publication date Jun 12, 2025
- HORIBA INSTRUMENTS INCORPORATED
- Nicolas VEZARD
- G01 - MEASURING TESTING
Information Patent Application
Spectrometer With Meniscus Lens Having Integrated Diffraction Grati...
- Publication number 20250180404
- Publication date Jun 5, 2025
- Headwall Photonics Inc.
- Daniel Rundlett
- G01 - MEASURING TESTING
Information Patent Application
MULTISPECTRAL IMAGE SENSOR AND ELECTRONIC APPARATUS INCLUDING THE SAME
- Publication number 20250164314
- Publication date May 22, 2025
- Samsung Electronics Co., Ltd.
- Sookyoung ROH
- G01 - MEASURING TESTING
Information Patent Application
BROADBAND PHASE-MODULATED FOURIER TRANSFORM SPECTROSCOPY
- Publication number 20250155287
- Publication date May 15, 2025
- The Regents of the University of Michigan
- Jennifer OGILVIE
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPIC CONFOCAL FLUORESCENCE SPECTROMETER
- Publication number 20250146868
- Publication date May 8, 2025
- Shanxi University
- Yongming Fu
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CONFOCAL-CHROMATIC LINE DISTANCE MEASUREMENT
- Publication number 20250116506
- Publication date Apr 10, 2025
- MICRO-EPSILON OPTRONIC GMBH
- Tobias OTTO
- G01 - MEASURING TESTING
Information Patent Application
METAL MIRROR BASED MULTISPECTRAL FILTER ARRAY
- Publication number 20250113635
- Publication date Apr 3, 2025
- VIAVI SOLUTIONS INC.
- Georg J. OCKENFUSS
- G01 - MEASURING TESTING
Information Patent Application
HYPER-SPECTRAL MULTI-SPOT OPTICAL REFLECTOMETER
- Publication number 20250102356
- Publication date Mar 27, 2025
- Applied Materials, Inc.
- Pengyu HAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECTROSCOPIC ANALYZER
- Publication number 20250102358
- Publication date Mar 27, 2025
- HAMAMATSU PHOTONICS K. K.
- Tatsuo DOUGAKIUCHI
- G01 - MEASURING TESTING
Information Patent Application
Explosion-proof spectroscopy system with automatic motorized alignment
- Publication number 20250102357
- Publication date Mar 27, 2025
- KineoLabs, Inc.
- Walid A. Atia
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ADVANCED AUTOFOCUSING SPECTROSCOPY
- Publication number 20250093202
- Publication date Mar 20, 2025
- Impossible Sensing LLC
- Pablo Sobron
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ENHANCING A RAMAN CONTRIBUTION IN A SPECTRUM, SPECTROSCO...
- Publication number 20250093269
- Publication date Mar 20, 2025
- SERSTECH AB
- Katja SZYBEK
- G01 - MEASURING TESTING
Information Patent Application
AFFORDABLE HIGH SPECTRAL-RESOLUTION 3D IMAGING LEVERAGING ROBOTIC S...
- Publication number 20250093201
- Publication date Mar 20, 2025
- Arizona Board of Regents on behalf of Arizona State University
- Jnaneshwar DAS
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR RESTRICTING LASER BEAMS ENTERING AN APERTURE TO A CHOSEN...
- Publication number 20250085163
- Publication date Mar 13, 2025
- Richard Fauconier
- G01 - MEASURING TESTING
Information Patent Application
Sectional Multi Spectral Sensor with Optical Blurring
- Publication number 20250085160
- Publication date Mar 13, 2025
- ams Sensors Germany GmbH
- Gunter SIESS
- G01 - MEASURING TESTING
Information Patent Application
INTRAOPERATIVE ON-SPOT ABNORMAL TISSUE DETECTION
- Publication number 20250079017
- Publication date Mar 6, 2025
- DUKE UNIVERSITY
- Tanner Zachem
- G01 - MEASURING TESTING
Information Patent Application
AIMING EQUIPMENT AND SPECTROSCOPE MODULE THEREOF
- Publication number 20250076114
- Publication date Mar 6, 2025
- TAIZHOU GUANYU TECHNOLOGY CO., LTD.
- XIWEI XIE
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM MEASUREMENT DEVICE
- Publication number 20250076115
- Publication date Mar 6, 2025
- HTC CORPORATION
- Bo-Wen Xiao
- G01 - MEASURING TESTING
Information Patent Application
COMPENSATION OF OPTICAL ALIGNMENT ISSUES FOR SECTORED-VIEW MULTI-SP...
- Publication number 20250067596
- Publication date Feb 27, 2025
- ams Sensors Germany GmbH
- Gunter Siess
- G01 - MEASURING TESTING
Information Patent Application
FOCUS SCANNING APPARATUS RECORDING COLOR
- Publication number 20250064560
- Publication date Feb 27, 2025
- 3SHAPE A/S
- Bo ESBECH
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SOLID-STATE SPECTROMETER
- Publication number 20250067663
- Publication date Feb 27, 2025
- MASIMO CORPORATION
- Björn Le Normand
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FILTER AND SPECTROMETER
- Publication number 20250052610
- Publication date Feb 13, 2025
- VIAVI SOLUTIONS INC.
- Paula SMITH
- G01 - MEASURING TESTING

using focussing or collimating elements

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Dispersion measurement apparatus and dispersion measurement method

Deployable micro-spectrometer bullets

Systems and methods for optical metrology

Microscope device, spectroscope, and microscope system

Smartphone-based OCT systems and methods

Spectrometers having a fringe tilted grating

Methods and devices for standoff differential Raman spectroscopy wi...

Stylus and color information transmitting method

Method and apparatus for Raman signal analysis

Spectral analysis of a sample

Two-dimensional terahertz radiation detector

Spectroscope

Linear array scanning brillouin scattering elastic imaging device

Hydrogen sulfide imaging system

Divided-aperture infra-red spectral imaging system

Spectrometry systems with decreased light path

Raman spectroscopic device

Hyperspectral imaging device

Method for calibrating one or more optical sensors of a laser machi...

Hyperspectral imager method and apparatus

Method and apparatus for confocal microscopes

Optical technique for material characterization

Spectrometry apparatus

Limitation of noise on light detectors using an aperture

Raman infrared compound microscope device

Apparatuses, systems, and methods for detecting materials based on...

Optical meta-lens spectrometer to analyze spectral characteristics...

Illumination systems and optical devices for laser beam shaping

Apparatus comprising a first lens, a second lens, a third lens, a f...

Image sensor and method of operating

Patents Applicationslast 30 patents

MULTIPLE-WAVELENGTH REFLECTIVE RAMAN PROBE AND RAMAN SPECTRA DETECT...

IMAGING SPECTROMETER AND CAMERA WITH ROTATING PRISM

LIGHT SOURCE APPARATUS

APPARATUS AND METHOD FOR SPECTRUM DETECTION BY DEFECT SCATTERING CA...

OPTICAL COMPONENT AND SYSTEM FOR SIMULTANEOUS 3D HYPERSPECTRAL IMAGING

MULTI-SLIT CONFIGURED HYPERSPECTRAL IMAGER

SPECTROMETER SYSTEM WITH VOLUME HOLOGRAPHIC LIGHT GUIDE ELEMENT

METHOD AND APPARATUS FOR RAMAN SIGNAL ANALYSIS

MULTI-TRACK RAMAN ANALYZER

Spectrometer With Meniscus Lens Having Integrated Diffraction Grati...

MULTISPECTRAL IMAGE SENSOR AND ELECTRONIC APPARATUS INCLUDING THE SAME

BROADBAND PHASE-MODULATED FOURIER TRANSFORM SPECTROSCOPY

MICROSCOPIC CONFOCAL FLUORESCENCE SPECTROMETER

SYSTEM AND METHOD FOR CONFOCAL-CHROMATIC LINE DISTANCE MEASUREMENT

METAL MIRROR BASED MULTISPECTRAL FILTER ARRAY

HYPER-SPECTRAL MULTI-SPOT OPTICAL REFLECTOMETER

SPECTROSCOPIC ANALYZER

Explosion-proof spectroscopy system with automatic motorized alignment

METHOD AND SYSTEM FOR ADVANCED AUTOFOCUSING SPECTROSCOPY

METHOD FOR ENHANCING A RAMAN CONTRIBUTION IN A SPECTRUM, SPECTROSCO...

AFFORDABLE HIGH SPECTRAL-RESOLUTION 3D IMAGING LEVERAGING ROBOTIC S...

METHOD FOR RESTRICTING LASER BEAMS ENTERING AN APERTURE TO A CHOSEN...

Sectional Multi Spectral Sensor with Optical Blurring

INTRAOPERATIVE ON-SPOT ABNORMAL TISSUE DETECTION

AIMING EQUIPMENT AND SPECTROSCOPE MODULE THEREOF

SPECTRUM MEASUREMENT DEVICE

COMPENSATION OF OPTICAL ALIGNMENT ISSUES FOR SECTORED-VIEW MULTI-SP...

FOCUS SCANNING APPARATUS RECORDING COLOR

SOLID-STATE SPECTROMETER

OPTICAL FILTER AND SPECTROMETER