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G01J3/0208
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
G01J3/00
Spectrometry Spectrophotometry Monochromators Measuring colour
Current Industry
G01J3/0208
using focussing or collimating elements
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Patents Grants
last 30 patents
Information
Patent Grant
Quadrilateral common-path time-modulated interferometric spectral i...
Patent number
11,971,303
Issue date
Apr 30, 2024
WUHAN UNIVERSITY
Ruyi Wei
G01 - MEASURING TESTING
Information
Patent Grant
Hyperspectral image sensor and operating method thereof
Patent number
11,971,299
Issue date
Apr 30, 2024
Samsung Electronics Co., Ltd.
Unjeong Kim
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring Raman spectrum and method thereof
Patent number
11,965,779
Issue date
Apr 23, 2024
TimeGate Instruments Oy
Lauri Kurki
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer device and method for producing a spectrometer device
Patent number
11,959,802
Issue date
Apr 16, 2024
Robert Bosch GmbH
Ralf Noltemeyer
G01 - MEASURING TESTING
Information
Patent Grant
High power actively Q-switched downhole LIBS analysis systems
Patent number
11,953,443
Issue date
Apr 9, 2024
Energy, United States Department of
Dustin Langdon McIntyre
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Raman spectroscopy equipment
Patent number
11,946,803
Issue date
Apr 2, 2024
Answeray Inc.
Seong Ho Cho
G01 - MEASURING TESTING
Information
Patent Grant
System and method for controlling the colour of a moving article
Patent number
11,940,328
Issue date
Mar 26, 2024
VEORIA
Philippe Copin
G01 - MEASURING TESTING
Information
Patent Grant
Multi-spectral method for detection of anomalies during powder bed...
Patent number
11,940,325
Issue date
Mar 26, 2024
The Penn State Research Foundation
Abdalla R. Nassar
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Optical technique for material characterization
Patent number
11,927,481
Issue date
Mar 12, 2024
Nova Ltd.
Gilad Barak
G01 - MEASURING TESTING
Information
Patent Grant
Fourier spectrophotometer with polarization multiplexing optical sy...
Patent number
11,927,483
Issue date
Mar 12, 2024
Yokogawa Electric Corporation
Yasuyuki Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Measuring apparatus for measuring positional relation between a chu...
Patent number
11,919,114
Issue date
Mar 5, 2024
Disco Corporation
Keiji Nomaru
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Optical spectrometry method and optical spectrometer
Patent number
11,920,983
Issue date
Mar 5, 2024
Xiamen University
Quan Liu
G01 - MEASURING TESTING
Information
Patent Grant
Limitation of noise on light detectors using an aperture
Patent number
11,921,206
Issue date
Mar 5, 2024
Waymo LLC
Pierre-Yves Droz
G01 - MEASURING TESTING
Information
Patent Grant
Image sensor and method of operating
Patent number
11,920,982
Issue date
Mar 5, 2024
Samsung Electronics Co., Ltd.
Radwanul Hasan Siddique
G01 - MEASURING TESTING
Information
Patent Grant
Optical module and mobile device having same
Patent number
11,913,837
Issue date
Feb 27, 2024
TRIPLE WIN TECHNOLOGY(SHENZHEN) CO. LTD.
Hsin-Yen Hsu
G01 - MEASURING TESTING
Information
Patent Grant
Spatially offset Raman probe with coaxial excitation and collection...
Patent number
11,913,834
Issue date
Feb 27, 2024
Endress+Hauser Optical Analysis, Inc.
James M. Tedesco
G01 - MEASURING TESTING
Information
Patent Grant
Dispersion measurement apparatus and dispersion measurement method
Patent number
11,913,836
Issue date
Feb 27, 2024
Hamamatsu Photonics K.K.
Koyo Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Compact detection module for flow cytometers
Patent number
11,913,868
Issue date
Feb 27, 2024
Cytek Biosciences, Inc.
Ming Yan
G01 - MEASURING TESTING
Information
Patent Grant
Illumination device for a spectrophotometer having integrated mixin...
Patent number
11,906,357
Issue date
Feb 20, 2024
X-Rite Europe GmbH
Mark Wegmüller
G01 - MEASURING TESTING
Information
Patent Grant
Attenuated total reflection measuring apparatus capable of Raman sp...
Patent number
11,898,908
Issue date
Feb 13, 2024
Jasco Corporation
Masateru Usuki
G01 - MEASURING TESTING
Information
Patent Grant
Processing chamber with optical fiber with bragg grating sensors
Patent number
11,901,165
Issue date
Feb 13, 2024
William J. O'Banion
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Freeform offner spectrometer
Patent number
11,898,907
Issue date
Feb 13, 2024
Raytheon Company
Benjamin James Lewis
G01 - MEASURING TESTING
Information
Patent Grant
Methods and devices for standoff differential Raman spectroscopy wi...
Patent number
11,885,681
Issue date
Jan 30, 2024
Pendar Technologies, LLC
Daryoosh Vakhshoori
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Miniaturized spectrometers on transparent substrates
Patent number
11,877,845
Issue date
Jan 23, 2024
Brigham Young University
Robert Davis
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Cellphone-based raman spectrometer system for the detection and ide...
Patent number
11,879,777
Issue date
Jan 23, 2024
The Texas A&M University System
Peter M. Rentzepis
G01 - MEASURING TESTING
Information
Patent Grant
Coherent anti-Stokes Raman scattering microscope imaging apparatus
Patent number
11,879,780
Issue date
Jan 23, 2024
WEIPENG (SUZHOU) MEDICAL DEVICES CO., LTD.
Yan Xia
G02 - OPTICS
Information
Patent Grant
Device for measuring transmittance curve of Fabry-Perot using frequ...
Patent number
11,874,169
Issue date
Jan 16, 2024
HEFEI INSTITUTE OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES
Yingjian Wang
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer
Patent number
11,874,167
Issue date
Jan 16, 2024
METROHM SPECTRO, INC.
Mark Watson
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for multiple source excitation Raman spectroscopy
Patent number
11,874,229
Issue date
Jan 16, 2024
Onto Innovation Inc.
George Andrew Antonelli
G02 - OPTICS
Information
Patent Grant
Self-homing optical device
Patent number
11,867,558
Issue date
Jan 9, 2024
Danial Clark Barkhurst
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
LOW-COST SPECTROMETRY SYSTEM FOR END-USER FOOD ANALYSIS
Publication number
20240142302
Publication date
May 2, 2024
Verifood Ltd
Damian GOLDRING
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM, ROBOT AND METHOD FOR MEASURING THE COLOR OF AN AREA OF A SA...
Publication number
20240133803
Publication date
Apr 25, 2024
FYLA LASER, S. L.
Pere PÉREZ MILLÁN
G01 - MEASURING TESTING
Information
Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR DETECTING MATERIALS BASED ON...
Publication number
20240133739
Publication date
Apr 25, 2024
Wayne State University
Gregory William Auner
G01 - MEASURING TESTING
Information
Patent Application
Ultra-Miniature Spatial Heterodyne Spectrometer
Publication number
20240125649
Publication date
Apr 18, 2024
California Institute of Technology
Seyedeh Sona Hosseini
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETRY DEVICE AND SPECTROMETRY METHOD
Publication number
20240110830
Publication date
Apr 4, 2024
OSAKA UNIVERSITY
Katsumasa FUJITA
G01 - MEASURING TESTING
Information
Patent Application
DISPERSION MEASUREMENT APPARATUS AND DISPERSION MEASUREMENT METHOD
Publication number
20240110833
Publication date
Apr 4, 2024
HAMAMATSU PHOTONICS K. K.
Koyo WATANABE
G01 - MEASURING TESTING
Information
Patent Application
ULTRATHIN MICRO-SPECTROMETER AND METHOD OF MANUFACTURING THE SAME
Publication number
20240102859
Publication date
Mar 28, 2024
Korea Advanced Institute of Science and Technology
Ki Hun Jeong
G01 - MEASURING TESTING
Information
Patent Application
Raman Infrared Compound Microscope Device
Publication number
20240094130
Publication date
Mar 21, 2024
Shimadzu Corporation
Fumiya KATSUTANI
G02 - OPTICS
Information
Patent Application
OPTICAL META-LENS SPECTROMETER TO ANALYZE SPECTRAL CHARACTERISTICS...
Publication number
20240085241
Publication date
Mar 14, 2024
Tunoptix, Inc.
Alan ZHAN
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
COMPACT HOLOGRAPHIC SLM SPECTROMETER
Publication number
20240077356
Publication date
Mar 7, 2024
ORTA DOGU TEKNIK UNIVERSITESI
Emre YUCE
G01 - MEASURING TESTING
Information
Patent Application
LIGHT MEASURING DEVICE AND METHOD OF MANUFACTURING LIGHT MEASURING...
Publication number
20240068866
Publication date
Feb 29, 2024
HAMAMATSU PHOTONICS K. K.
Tatsuo DOUGAKIUCHI
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETRY SYSTEM WITH DECREASED LIGHT PATH
Publication number
20240060820
Publication date
Feb 22, 2024
VERIFOOD, LTD.
Damian GOLDRING
G01 - MEASURING TESTING
Information
Patent Application
Spectrometer with Self-Referenced Calibration
Publication number
20240053198
Publication date
Feb 15, 2024
Wisconsin Alumni Research Foundation
Scott Sanders
G01 - MEASURING TESTING
Information
Patent Application
HYPERSPECTRAL IMAGING DEVICE AND METHOD
Publication number
20240053199
Publication date
Feb 15, 2024
UNIVERSITA' DEGLI STUDI DI BARI ''ALDO MORO''
Milena D'ANGELO
G01 - MEASURING TESTING
Information
Patent Application
IMAGE PICKUP APPARATUS, MEASURING APPARATUS, AND ARTICLE MANUFACTUR...
Publication number
20240053197
Publication date
Feb 15, 2024
Canon Kabushiki Kaisha
Soya SAIJO
G01 - MEASURING TESTING
Information
Patent Application
RAMAN SPECTROSCOPY PROBE AND RAMAN SPECTROSCOPY DETECTION DEVICE
Publication number
20240044708
Publication date
Feb 8, 2024
NANJING NUOYUAN MEDICAL DEVICES CO., LTD.
Huiming CAI
G01 - MEASURING TESTING
Information
Patent Application
LINEAR ARRAY SCANNING BRILLOUIN SCATTERING ELASTIC IMAGING DEVICE
Publication number
20240044709
Publication date
Feb 8, 2024
NANCHANG HANGKONG UNIVERSITY
Jiulin SHI
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL IMAGE SENSORS AND ELECTRONIC APPARATUSES INCLUDING THE SAME
Publication number
20240019306
Publication date
Jan 18, 2024
Samsung Electronics Co., Ltd.
Heejin CHOI
G01 - MEASURING TESTING
Information
Patent Application
VERY HIGH RESOLUTION SPECTROMETER FOR MONITORING OF SEMICONDUCTOR P...
Publication number
20240019302
Publication date
Jan 18, 2024
Verity Instruments, Inc.
Andrew Weeks Kueny
G01 - MEASURING TESTING
Information
Patent Application
SPATIAL SPECTROMETER
Publication number
20240011832
Publication date
Jan 11, 2024
Shphotonics Ltd
Lei SUN
G01 - MEASURING TESTING
Information
Patent Application
APPARATUSES AND METHODS FOR EXAMINING THE MOVEMENT OF CONSTITUENTS...
Publication number
20240011903
Publication date
Jan 11, 2024
PURDUE RESEARCH FOUNDATION
David D. NOLTE
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR MEASURING AN ESTIMATED DEGREE OF LINEAR POLARIZATION OF...
Publication number
20230417598
Publication date
Dec 28, 2023
Commissariat A L'Energie Atomique et Aux Energies Alternatives
François Deneuville
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL FIBER SURFACE ELECTRIC FIELD SCREENING APPARATUS
Publication number
20230408332
Publication date
Dec 21, 2023
Liaocheng University
Nan-Kuang CHEN
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
Benchtop Optical Spectroscopy Providing Improved Workflow
Publication number
20230408333
Publication date
Dec 21, 2023
Radom Corporation
Ashok Menon
G01 - MEASURING TESTING
Information
Patent Application
QUADRILATERAL COMMON-PATH TIME-MODULATED INTERFEROMETRIC SPECTRAL I...
Publication number
20230408337
Publication date
Dec 21, 2023
WUHAN UNIVERSITY
Ruyi WEI
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER
Publication number
20230408335
Publication date
Dec 21, 2023
VisEra Technologies Company Ltd.
Wen-Yu SHIH
G01 - MEASURING TESTING
Information
Patent Application
IMAGE-BASED CELL SORTING SYSTEMS AND METHODS
Publication number
20230384208
Publication date
Nov 30, 2023
The Regents of the University of California
Yu-Hwa Lo
G01 - MEASURING TESTING
Information
Patent Application
SOLID-STATE SPECTROMETER
Publication number
20230384217
Publication date
Nov 30, 2023
MASIMO CORPORATION
Björn Le Normand
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER
Publication number
20230384157
Publication date
Nov 30, 2023
VisEra Technologies Company Ltd.
Lai-Hung LAI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PLASMA PROCESSING APPARATUS AND METHOD OF MANUFACTURE
Publication number
20230377857
Publication date
Nov 23, 2023
Samsung Electronics Co., Ltd.
SE JIN OH
H01 - BASIC ELECTRIC ELEMENTS