using interferometry

Industry

CPC
G01B11/2441

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/2441using interferometry

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring wafer profile
- Patent number 12,188,761
- Issue date Jan 7, 2025
- Shin-Etsu Handotai Co., Ltd.
- Masato Ohnishi
- G01 - MEASURING TESTING
Information Patent Grant
Birefringence mitigation in an optical network
- Patent number 12,188,762
- Issue date Jan 7, 2025
- The Shape Sensing Company
- Alex Tongue
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for imaging and interferometry measurements
- Patent number 12,163,777
- Issue date Dec 10, 2024
- FOGALE NANOTECH
- Alain Courteville
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Solar-based semi-mobile recharge skid
- Patent number 12,163,774
- Issue date Dec 10, 2024
- RENU ROBOTICS CORP.
- Tim Alan Matus
- G02 - OPTICS
Information Patent Grant
Surface processing equipment and surface processing method
- Patent number 12,154,768
- Issue date Nov 26, 2024
- Industrial Technology Research Institute
- Chih-Chieh Chen
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System and method for detecting thickness and bow of large-sized wa...
- Patent number 12,123,699
- Issue date Oct 22, 2024
- WUXI XIVI SCIENCE AND TECHNOLOGY CO., LTD.
- Minjie Lu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Surface metrology systems and methods thereof
- Patent number 12,123,701
- Issue date Oct 22, 2024
- Optipro Systems, LLC
- James Fredric Munro
- G01 - MEASURING TESTING
Information Patent Grant
Autonomous vehicle terrain prediction and detection
- Patent number 12,123,702
- Issue date Oct 22, 2024
- RENU ROBOTICS CORP.
- Tim Alan Matus
- G01 - MEASURING TESTING
Information Patent Grant
Optical fiber sensor, optical system and method of optically interr...
- Patent number 12,111,191
- Issue date Oct 8, 2024
- Koninklijke Philips N.V.
- Gert Wim 'T Hooft
- G01 - MEASURING TESTING
Information Patent Grant
Spatially filtered talbot interferometer for wafer distortion measu...
- Patent number 12,104,891
- Issue date Oct 1, 2024
- Daniel Gene Smith
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus and method of wafer geometry
- Patent number 12,072,176
- Issue date Aug 27, 2024
- Nanjing ZhongAn Semiconductor Equipment Ltd
- An Andrew Zeng
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for determining a three-dimensional definition of...
- Patent number 12,031,812
- Issue date Jul 9, 2024
- VIRELUX Inspection Systems Sàrl
- Tom Reichert
- G01 - MEASURING TESTING
Information Patent Grant
Transient digital moire phase-shifting interferometric measuring de...
- Patent number 12,018,930
- Issue date Jun 25, 2024
- BEIJING INSTITUTE OF TECHNOLOGY
- Qun Hao
- G02 - OPTICS
Information Patent Grant
Surface profile inspection methods and systems
- Patent number 12,018,931
- Issue date Jun 25, 2024
- Nanyang Technological University
- Xuan Quoc Vo
- G01 - MEASURING TESTING
Information Patent Grant
Polarization-separated, phase-shifted interferometer
- Patent number 12,000,698
- Issue date Jun 4, 2024
- Massachusetts Institute of Technology
- Noah Gilbert
- G01 - MEASURING TESTING
Information Patent Grant
Optical vehicle diagnostic system
- Patent number 11,994,386
- Issue date May 28, 2024
- Red Tuna
- Pierre Nicolau-Guillaumet
- G01 - MEASURING TESTING
Information Patent Grant
High resolution distributed sensor utilizing offset core optical fiber
- Patent number 11,933,600
- Issue date Mar 19, 2024
- OFS Fitel, LLC
- Raja A Ahmad
- G01 - MEASURING TESTING
Information Patent Grant
Intra-oral scanning device with integrated optical coherence tomogr...
- Patent number 11,925,435
- Issue date Mar 12, 2024
- D4D Technologies, LLC
- Ye Li
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and device for characterizing the surface shape of an optica...
- Patent number 11,927,500
- Issue date Mar 12, 2024
- Carl Zeiss SMT GmbH
- Steffen Siegler
- G01 - MEASURING TESTING
Information Patent Grant
On-chip signal processing method and pixel-array signal
- Patent number 11,921,285
- Issue date Mar 5, 2024
- Arizona Board of Regents on behalf of the University of Arizona
- John Koshel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
All-in-focus imager and associated method
- Patent number 11,910,104
- Issue date Feb 20, 2024
- Arizona Board of Regents on Behalf of the University of Arizona, a body corpo...
- John Koshel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measuring apparatus for interferometrically determining a surface s...
- Patent number 11,892,283
- Issue date Feb 6, 2024
- Carl Zeiss SMT GmbH
- Stefan Schulte
- G01 - MEASURING TESTING
Information Patent Grant
Surface analysis tools for process control of laser treatment of co...
- Patent number 11,885,725
- Issue date Jan 30, 2024
- The Boeing Company
- Eileen O. Kutscha
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for characterizing the surface shape of a test ob...
- Patent number 11,879,720
- Issue date Jan 23, 2024
- Carl Zeiss SMT GmbH
- Jochen Hetzler
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measurement method and interferometric measurement...
- Patent number 11,879,721
- Issue date Jan 23, 2024
- Carl Zeiss SMT GmbH
- Alexander Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric speckle visibility spectroscopy
- Patent number 11,867,505
- Issue date Jan 9, 2024
- California Institute of Technology
- Joshua Brake
- G01 - MEASURING TESTING
Information Patent Grant
Method for examining a coating of a probe surface
- Patent number 11,859,962
- Issue date Jan 2, 2024
- BASF Coatings GmbH
- Rolf Doering
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining post bonding overlay
- Patent number 11,829,077
- Issue date Nov 28, 2023
- KLA Corporation
- Franz Zach
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring interfaces of an optical element
- Patent number 11,808,656
- Issue date Nov 7, 2023
- FOGALE NANOTECH
- Alain Courteville
- G01 - MEASURING TESTING
Information Patent Grant
Light emitting device, optical detection system, optical detection...
- Patent number 11,796,311
- Issue date Oct 24, 2023
- SKYVERSE TECHNOLOGY CO., LTD.
- Lu Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR QUANTITATIVE EVALUATION OF CONTACT LENS EDGE LIFT BASED...
- Publication number 20250003731
- Publication date Jan 2, 2025
- Alcon Inc.
- Yeming Gu
- G02 - OPTICS
Information Patent Application
OFF-AXIS MOTION CHARACTERIZATION OF A LINEAR ACTUATOR
- Publication number 20250003737
- Publication date Jan 2, 2025
- Applied Materials, Inc.
- Andrew Thomas Koll
- G01 - MEASURING TESTING
Information Patent Application
SURFACE PROCESSING EQUIPMENT
- Publication number 20250006475
- Publication date Jan 2, 2025
- Industrial Technology Research Institute
- Chih-Chieh Chen
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD AND DEVICE FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT
- Publication number 20240402039
- Publication date Dec 5, 2024
- FOGALE NANOTECH
- Eric LEGROS
- G01 - MEASURING TESTING
Information Patent Application
SURFACE METROLOGY SYSTEMS AND METHODS THEREOF
- Publication number 20240401938
- Publication date Dec 5, 2024
- OptiPro Systems, LLC
- James Fredric Munro
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING BENDING OF AN ELONGATE VERTICALLY ORIENTED CHANNEL
- Publication number 20240401937
- Publication date Dec 5, 2024
- JOINT STOCK COMPANY "ROSENERGOATOM"
- Artyom Nikolaevich FEDOROV
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE FUNCTIONAL CHARACTERISATION OF OPTICAL LENSES
- Publication number 20240402040
- Publication date Dec 5, 2024
- FOGALE NANOTECH
- Eric LEGROS
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SHAPE MEASURING DEVICE, REFERENCE SURFACE POSITIO...
- Publication number 20240393097
- Publication date Nov 28, 2024
- TOKYO SEIMITSU CO., LTD.
- Yoshiyuki KAWATA
- G01 - MEASURING TESTING
Information Patent Application
Analysis System
- Publication number 20240393270
- Publication date Nov 28, 2024
- Hitachi High-Tech Corporation
- Azusa KONNO
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTMENT METHOD FOR SHAPE MEASURING DEVICE
- Publication number 20240393098
- Publication date Nov 28, 2024
- TOKYO SEIMITSU CO., LTD.
- Yoshiyuki KAWATA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE SHAPE MEASURING DEVICE AND SURFACE SHAPE MEASUREMENT METHOD
- Publication number 20240393104
- Publication date Nov 28, 2024
- TOKYO SEIMITSU CO., LTD.
- Yoshiyuki KAWATA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
IN-LINE WAFER EDGE SEALING MONITORING SYSTEM AND METHODS OF OPERATION
- Publication number 20240371666
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hau-Yi HSIAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL HETERODYNE INTERFERENCE MEASUREMENT DEVICE AND OPTICAL HETE...
- Publication number 20240361120
- Publication date Oct 31, 2024
- Hamamatsu Photonics K.K.
- Naoaki KATO
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC SPECKLE VISIBILITY SPECTROSCOPY
- Publication number 20240302158
- Publication date Sep 12, 2024
- California Institute of Technology
- Joshua Brake
- G01 - MEASURING TESTING
Information Patent Application
Optical Metrology System and Methods for the Measurement of Optical...
- Publication number 20240288266
- Publication date Aug 29, 2024
- MBRYONICS Ltd
- Niamh Fitzgerald
- G01 - MEASURING TESTING
Information Patent Application
Method for Eliminating Interference Pattern in Image, and Apparatus
- Publication number 20240233303
- Publication date Jul 11, 2024
- Honor Device Co., Ltd.
- Wenzhao Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERFEROMETRIC SYSTEM WITH DEEP LEARNING ALGORITHM TO PROCESS TWO...
- Publication number 20240210158
- Publication date Jun 27, 2024
- Arizona Board of Regents on behalf of The University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
- Publication number 20240200935
- Publication date Jun 20, 2024
- Industrial Technology Research Institute
- Hsiang-Chun Wei
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MEASURING HEIGHT PROPERTIES OF SURFACES
- Publication number 20240191986
- Publication date Jun 13, 2024
- Nikon Corporation
- Eric Peter Goodwin
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM FOR DETECTING DEEP-HOLE SURFACE TOPOGRAPHY BASED...
- Publication number 20240167812
- Publication date May 23, 2024
- HEFEI UNIVERSITY OF TECHNOLOGY
- Huining ZHAO
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION DEVICE AND SHAPE MEASUREMENT SOFTWARE
- Publication number 20240159520
- Publication date May 16, 2024
- Hitachi High-Tech Corporation
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
Shape Sensing of Multimode Optical Fibers
- Publication number 20240151517
- Publication date May 9, 2024
- Ramot at Tel Aviv University Ltd.
- Avishay Eyal
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING A THREE-DIMENSIONAL DEFINITION OF...
- Publication number 20240125594
- Publication date Apr 18, 2024
- VIRELUX INSPECTION SYSTEMS SARL
- Tom REICHERT
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING POST BONDING OVERLAY
- Publication number 20240094642
- Publication date Mar 21, 2024
- KLA Corporation
- Franz Zach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT DEVICE FOR INTERFEROMETRIC MEASUREMENT OF A SURFACE SHAPE
- Publication number 20240077305
- Publication date Mar 7, 2024
- Carl Zeiss SMT GMBH
- Jochen HETZLER
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT METHOD, SHAPE MEASURING METHOD AND SHAPE MEASURING APPARATUS
- Publication number 20240077304
- Publication date Mar 7, 2024
- TOKYO SEIMITSU CO., LTD.
- Tasuku SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE AND MACHINING DEVICE
- Publication number 20240068798
- Publication date Feb 29, 2024
- TOKYO SEIMITSU CO., LTD.
- Tasuku SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
Optically Computed Phase Microscopy
- Publication number 20240068803
- Publication date Feb 29, 2024
- NEW JERSEY INSTITUTE OF TECHNOLOGY
- Xuan Liu
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS, METHOD FOR MEASURING BY INTERFEROMETRY, PROC...
- Publication number 20240035811
- Publication date Feb 1, 2024
- Carl Zeiss SMT GMBH
- Stefan SCHULTE
- G01 - MEASURING TESTING
Information Patent Application
3D PROFILOMETRY WITH A LINNIK INTERFEROMETER
- Publication number 20240035810
- Publication date Feb 1, 2024
- Amnon Manassen
- G01 - MEASURING TESTING

using interferometry

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for measuring wafer profile

Birefringence mitigation in an optical network

Device and method for imaging and interferometry measurements

Solar-based semi-mobile recharge skid

Surface processing equipment and surface processing method

System and method for detecting thickness and bow of large-sized wa...

Surface metrology systems and methods thereof

Autonomous vehicle terrain prediction and detection

Optical fiber sensor, optical system and method of optically interr...

Spatially filtered talbot interferometer for wafer distortion measu...

Measuring apparatus and method of wafer geometry

Method and system for determining a three-dimensional definition of...

Transient digital moire phase-shifting interferometric measuring de...

Surface profile inspection methods and systems

Polarization-separated, phase-shifted interferometer

Optical vehicle diagnostic system

High resolution distributed sensor utilizing offset core optical fiber

Intra-oral scanning device with integrated optical coherence tomogr...

Method and device for characterizing the surface shape of an optica...

On-chip signal processing method and pixel-array signal

All-in-focus imager and associated method

Measuring apparatus for interferometrically determining a surface s...

Surface analysis tools for process control of laser treatment of co...

Device and method for characterizing the surface shape of a test ob...

Interferometric measurement method and interferometric measurement...

Interferometric speckle visibility spectroscopy

Method for examining a coating of a probe surface

System and method for determining post bonding overlay

Device and method for measuring interfaces of an optical element

Light emitting device, optical detection system, optical detection...

Patents Applicationslast 30 patents

METHOD FOR QUANTITATIVE EVALUATION OF CONTACT LENS EDGE LIFT BASED...

OFF-AXIS MOTION CHARACTERIZATION OF A LINEAR ACTUATOR

SURFACE PROCESSING EQUIPMENT

METHOD AND DEVICE FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT

SURFACE METROLOGY SYSTEMS AND METHODS THEREOF

METHOD OF MEASURING BENDING OF AN ELONGATE VERTICALLY ORIENTED CHANNEL

METHOD FOR THE FUNCTIONAL CHARACTERISATION OF OPTICAL LENSES

THREE-DIMENSIONAL SHAPE MEASURING DEVICE, REFERENCE SURFACE POSITIO...

Analysis System

ADJUSTMENT METHOD FOR SHAPE MEASURING DEVICE

SURFACE SHAPE MEASURING DEVICE AND SURFACE SHAPE MEASUREMENT METHOD

IN-LINE WAFER EDGE SEALING MONITORING SYSTEM AND METHODS OF OPERATION

OPTICAL HETERODYNE INTERFERENCE MEASUREMENT DEVICE AND OPTICAL HETE...

INTERFEROMETRIC SPECKLE VISIBILITY SPECTROSCOPY

Optical Metrology System and Methods for the Measurement of Optical...

Method for Eliminating Interference Pattern in Image, and Apparatus

INTERFEROMETRIC SYSTEM WITH DEEP LEARNING ALGORITHM TO PROCESS TWO...

MEASUREMENT SYSTEM AND MEASUREMENT METHOD

SYSTEMS AND METHODS FOR MEASURING HEIGHT PROPERTIES OF SURFACES

MEASUREMENT SYSTEM FOR DETECTING DEEP-HOLE SURFACE TOPOGRAPHY BASED...

SURFACE INSPECTION DEVICE AND SHAPE MEASUREMENT SOFTWARE

Shape Sensing of Multimode Optical Fibers

METHOD AND SYSTEM FOR DETERMINING A THREE-DIMENSIONAL DEFINITION OF...

SYSTEM AND METHOD FOR DETERMINING POST BONDING OVERLAY

MEASUREMENT DEVICE FOR INTERFEROMETRIC MEASUREMENT OF A SURFACE SHAPE

ALIGNMENT METHOD, SHAPE MEASURING METHOD AND SHAPE MEASURING APPARATUS

MEASURING DEVICE AND MACHINING DEVICE

Optically Computed Phase Microscopy

MEASUREMENT APPARATUS, METHOD FOR MEASURING BY INTERFEROMETRY, PROC...

3D PROFILOMETRY WITH A LINNIK INTERFEROMETER