using interferometry

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CPC
G01B11/2441

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/2441using interferometry

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for measuring interfaces of an optical element
- Patent number 12,359,910
- Issue date Jul 15, 2025
- FOGALE NANOTECH
- Sylvain Petitgrand
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measurement device
- Patent number 12,359,906
- Issue date Jul 15, 2025
- CKD Corporation
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Grant
Laser and synthetic profilometry of a positive displacement motor (...
- Patent number 12,345,520
- Issue date Jul 1, 2025
- Turnco LLC
- Lonnie L. Smith
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement method for interferometrically determining a surface shape
- Patent number 12,332,043
- Issue date Jun 17, 2025
- Carl Zeiss SMT GmbH
- Hans Michael Stiepan
- G02 - OPTICS
Information Patent Grant
Vibration insensitive interferometry for measuring thickness and pr...
- Patent number 12,326,402
- Issue date Jun 10, 2025
- Korean Research Institute of Standard and Science
- Yong-sik Ghim
- G01 - MEASURING TESTING
Information Patent Grant
Low-coherence interferometer with surface power compensation
- Patent number 12,305,981
- Issue date May 20, 2025
- Corning Incorporated
- Joshua Monroe Cobb
- G01 - MEASURING TESTING
Information Patent Grant
Structured light three-dimensional measurement method based on join...
- Patent number 12,307,696
- Issue date May 20, 2025
- Hangzhou Chengguang Medical Technology Co., Ltd.
- Mengyu Jia
- G01 - MEASURING TESTING
Information Patent Grant
Operation accuracy measuring method
- Patent number 12,298,126
- Issue date May 13, 2025
- Disco Corporation
- Atsushi Oda
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Calculating distributed twist of a multi-fiber 3D shape sensor bund...
- Patent number 12,292,353
- Issue date May 6, 2025
- The Shape Sensing Company
- Alex Tongue
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric lens aligner and method
- Patent number 12,292,274
- Issue date May 6, 2025
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for characterizing the surface shape of an optica...
- Patent number 12,292,281
- Issue date May 6, 2025
- Carl Zeiss SMT GmbH
- Regina Christ
- G01 - MEASURING TESTING
Information Patent Grant
Optically computed phase microscopy
- Patent number 12,281,888
- Issue date Apr 22, 2025
- New Jersey Institute of Technology
- Xuan Liu
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and measurement method
- Patent number 12,270,638
- Issue date Apr 8, 2025
- Industrial Technology Research Institute
- Hsiang-Chun Wei
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for characterizing laser machining properties b...
- Patent number 12,257,644
- Issue date Mar 25, 2025
- IPG Photonics Corporation
- Paul J. L. Webster
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Three-dimensional measurement device
- Patent number 12,259,230
- Issue date Mar 25, 2025
- CKD Corporation
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Grant
Autonomous vehicle charging station
- Patent number 12,253,352
- Issue date Mar 18, 2025
- RENU ROBOTICS CORP.
- John Henry Gold
- G01 - MEASURING TESTING
Information Patent Grant
Autonomous vehicle terrain prediction and detection
- Patent number 12,247,828
- Issue date Mar 11, 2025
- RENU ROBOTICS CORP.
- Tim Alan Matus
- G02 - OPTICS
Information Patent Grant
Diffractive optical element for a test interferometer
- Patent number 12,235,097
- Issue date Feb 25, 2025
- Carl Zeiss SMT GmbH
- Alexander Winkler
- G01 - MEASURING TESTING
Information Patent Grant
Polarizing Fizeau interferometer
- Patent number 12,228,400
- Issue date Feb 18, 2025
- Mitutoyo Corporation
- Shimpei Matsuura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor measurement apparatus
- Patent number 12,222,282
- Issue date Feb 11, 2025
- Samsung Electronics Co., Ltd.
- Seoyeon Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement device and multiple mirror
- Patent number 12,222,198
- Issue date Feb 11, 2025
- HOCHSCHULE TRIER
- Michael Schuth
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method of optical coherence tomography device and camera
- Patent number 12,196,541
- Issue date Jan 14, 2025
- HUVITZ CO., LTD.
- Seong Hun Shin
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining post bonding overlay
- Patent number 12,197,137
- Issue date Jan 14, 2025
- KLA Corporation
- Franz Zach
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring wafer profile
- Patent number 12,188,761
- Issue date Jan 7, 2025
- Shin-Etsu Handotai Co., Ltd.
- Masato Ohnishi
- G01 - MEASURING TESTING
Information Patent Grant
Birefringence mitigation in an optical network
- Patent number 12,188,762
- Issue date Jan 7, 2025
- The Shape Sensing Company
- Alex Tongue
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for imaging and interferometry measurements
- Patent number 12,163,777
- Issue date Dec 10, 2024
- FOGALE NANOTECH
- Alain Courteville
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Solar-based semi-mobile recharge skid
- Patent number 12,163,774
- Issue date Dec 10, 2024
- RENU ROBOTICS CORP.
- Tim Alan Matus
- G02 - OPTICS
Information Patent Grant
Surface processing equipment and surface processing method
- Patent number 12,154,768
- Issue date Nov 26, 2024
- Industrial Technology Research Institute
- Chih-Chieh Chen
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System and method for detecting thickness and bow of large-sized wa...
- Patent number 12,123,699
- Issue date Oct 22, 2024
- WUXI XIVI SCIENCE AND TECHNOLOGY CO., LTD.
- Minjie Lu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Surface metrology systems and methods thereof
- Patent number 12,123,701
- Issue date Oct 22, 2024
- Optipro Systems, LLC
- James Fredric Munro
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods and Systems for Characterizing Laser Machining Properties b...
- Publication number 20250229357
- Publication date Jul 17, 2025
- IPG PHOTONICS CORPORATION
- Paul J.L. Webster
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
DEVICE FOR MEASURING SEMICONDUCTORS
- Publication number 20250224328
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Sangwoo BAE
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION FOR IN-PLANE DISTORTION TOOL-TO-TOOL MATCHING
- Publication number 20250216188
- Publication date Jul 3, 2025
- KLA Corporation
- Wenjiang Guo
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE
- Publication number 20250189298
- Publication date Jun 12, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- Katsuya NOZAWA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE
- Publication number 20250189301
- Publication date Jun 12, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- Katsuya NOZAWA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR COMBINING HEIGHT MAPS AND PROFILOMETER FOR THE SAME
- Publication number 20250189303
- Publication date Jun 12, 2025
- MITUTOYO CORPORATION
- Ruslan Akhmedovich SEPKHANOV
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL CONTOUR MEASUREMENT SYSTEM
- Publication number 20250180347
- Publication date Jun 5, 2025
- TRIPLE WIN TECHNOLOGY(SHENZHEN) CO.LTD.
- HSUAN-WEI HO
- G01 - MEASURING TESTING
Information Patent Application
LASER AND SYNTHETIC PROFILOMETRY OF A POSITIVE DISPLACEMENT MOTOR (...
- Publication number 20250123098
- Publication date Apr 17, 2025
- Turnco LLC
- Lonnie L. Smith
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BIREFRINGENCE MITIGATION IN AN OPTICAL NETWORK
- Publication number 20250093151
- Publication date Mar 20, 2025
- The Shape Sensing Company
- Alex Tongue
- G01 - MEASURING TESTING
Information Patent Application
DEVICE, SYSTEM, AND METHOD FOR IN-SITU MEASUREMENT OF THREE-DIMENSI...
- Publication number 20250076031
- Publication date Mar 6, 2025
- WUHAN UNIVERSITY
- Hui LI
- B22 - CASTING POWDER METALLURGY
Information Patent Application
THIN FILM THICKNESS ADJUSTMENTS FOR THREE-DIMENSIONAL INTERFEROMETR...
- Publication number 20250044073
- Publication date Feb 6, 2025
- ORBOTECH LTD.
- Yulia Lovsky
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SHAPE MEASURING DEVICE AND THREE-DIMENSIONAL SHAP...
- Publication number 20250035426
- Publication date Jan 30, 2025
- TOKYO SEIMITSU CO., LTD.
- Takashi OGURA
- G01 - MEASURING TESTING
Information Patent Application
INFEROMETRIC MEASURING APPARATUS
- Publication number 20250027764
- Publication date Jan 23, 2025
- Carl Zeiss SMT GMBH
- Steffen SIEGLER
- G01 - MEASURING TESTING
Information Patent Application
CALCULATING DISTRIBUTED TWIST OF A MULTI-FIBER 3D SHAPE SENSOR BUND...
- Publication number 20250027839
- Publication date Jan 23, 2025
- The Shape Sensing Company
- Alex Tongue
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR QUANTITATIVE EVALUATION OF CONTACT LENS EDGE LIFT BASED...
- Publication number 20250003731
- Publication date Jan 2, 2025
- Alcon Inc.
- Yeming Gu
- G02 - OPTICS
Information Patent Application
OFF-AXIS MOTION CHARACTERIZATION OF A LINEAR ACTUATOR
- Publication number 20250003737
- Publication date Jan 2, 2025
- Applied Materials, Inc.
- Andrew Thomas Koll
- G01 - MEASURING TESTING
Information Patent Application
SURFACE PROCESSING EQUIPMENT
- Publication number 20250006475
- Publication date Jan 2, 2025
- Industrial Technology Research Institute
- Chih-Chieh Chen
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD AND DEVICE FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT
- Publication number 20240402039
- Publication date Dec 5, 2024
- FOGALE NANOTECH
- Eric LEGROS
- G01 - MEASURING TESTING
Information Patent Application
SURFACE METROLOGY SYSTEMS AND METHODS THEREOF
- Publication number 20240401938
- Publication date Dec 5, 2024
- OptiPro Systems, LLC
- James Fredric Munro
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING BENDING OF AN ELONGATE VERTICALLY ORIENTED CHANNEL
- Publication number 20240401937
- Publication date Dec 5, 2024
- JOINT STOCK COMPANY "ROSENERGOATOM"
- Artyom Nikolaevich FEDOROV
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE FUNCTIONAL CHARACTERISATION OF OPTICAL LENSES
- Publication number 20240402040
- Publication date Dec 5, 2024
- FOGALE NANOTECH
- Eric LEGROS
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SHAPE MEASURING DEVICE, REFERENCE SURFACE POSITIO...
- Publication number 20240393097
- Publication date Nov 28, 2024
- TOKYO SEIMITSU CO., LTD.
- Yoshiyuki KAWATA
- G01 - MEASURING TESTING
Information Patent Application
Analysis System
- Publication number 20240393270
- Publication date Nov 28, 2024
- Hitachi High-Tech Corporation
- Azusa KONNO
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTMENT METHOD FOR SHAPE MEASURING DEVICE
- Publication number 20240393098
- Publication date Nov 28, 2024
- TOKYO SEIMITSU CO., LTD.
- Yoshiyuki KAWATA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE SHAPE MEASURING DEVICE AND SURFACE SHAPE MEASUREMENT METHOD
- Publication number 20240393104
- Publication date Nov 28, 2024
- TOKYO SEIMITSU CO., LTD.
- Yoshiyuki KAWATA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
IN-LINE WAFER EDGE SEALING MONITORING SYSTEM AND METHODS OF OPERATION
- Publication number 20240371666
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hau-Yi HSIAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL HETERODYNE INTERFERENCE MEASUREMENT DEVICE AND OPTICAL HETE...
- Publication number 20240361120
- Publication date Oct 31, 2024
- Hamamatsu Photonics K.K.
- Naoaki KATO
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC SPECKLE VISIBILITY SPECTROSCOPY
- Publication number 20240302158
- Publication date Sep 12, 2024
- California Institute of Technology
- Joshua Brake
- G01 - MEASURING TESTING
Information Patent Application
Optical Metrology System and Methods for the Measurement of Optical...
- Publication number 20240288266
- Publication date Aug 29, 2024
- MBRYONICS Ltd
- Niamh Fitzgerald
- G01 - MEASURING TESTING
Information Patent Application
Method for Eliminating Interference Pattern in Image, and Apparatus
- Publication number 20240233303
- Publication date Jul 11, 2024
- Honor Device Co., Ltd.
- Wenzhao Liu
- G06 - COMPUTING CALCULATING COUNTING

using interferometry

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device and method for measuring interfaces of an optical element

Three-dimensional measurement device

Laser and synthetic profilometry of a positive displacement motor (...

Measurement method for interferometrically determining a surface shape

Vibration insensitive interferometry for measuring thickness and pr...

Low-coherence interferometer with surface power compensation

Structured light three-dimensional measurement method based on join...

Operation accuracy measuring method

Calculating distributed twist of a multi-fiber 3D shape sensor bund...

Interferometric lens aligner and method

Method and device for characterizing the surface shape of an optica...

Optically computed phase microscopy

Measurement system and measurement method

Methods and systems for characterizing laser machining properties b...

Three-dimensional measurement device

Autonomous vehicle charging station

Autonomous vehicle terrain prediction and detection

Diffractive optical element for a test interferometer

Polarizing Fizeau interferometer

Semiconductor measurement apparatus

Optical measurement device and multiple mirror

Calibration method of optical coherence tomography device and camera

System and method for determining post bonding overlay

Method for measuring wafer profile

Birefringence mitigation in an optical network

Device and method for imaging and interferometry measurements

Solar-based semi-mobile recharge skid

Surface processing equipment and surface processing method

System and method for detecting thickness and bow of large-sized wa...

Surface metrology systems and methods thereof

Patents Applicationslast 30 patents

Methods and Systems for Characterizing Laser Machining Properties b...

DEVICE FOR MEASURING SEMICONDUCTORS

CALIBRATION FOR IN-PLANE DISTORTION TOOL-TO-TOOL MATCHING

MEASUREMENT DEVICE

MEASUREMENT DEVICE

METHOD FOR COMBINING HEIGHT MAPS AND PROFILOMETER FOR THE SAME

THREE-DIMENSIONAL CONTOUR MEASUREMENT SYSTEM

LASER AND SYNTHETIC PROFILOMETRY OF A POSITIVE DISPLACEMENT MOTOR (...

BIREFRINGENCE MITIGATION IN AN OPTICAL NETWORK

DEVICE, SYSTEM, AND METHOD FOR IN-SITU MEASUREMENT OF THREE-DIMENSI...

THIN FILM THICKNESS ADJUSTMENTS FOR THREE-DIMENSIONAL INTERFEROMETR...

THREE-DIMENSIONAL SHAPE MEASURING DEVICE AND THREE-DIMENSIONAL SHAP...

INFEROMETRIC MEASURING APPARATUS

CALCULATING DISTRIBUTED TWIST OF A MULTI-FIBER 3D SHAPE SENSOR BUND...

METHOD FOR QUANTITATIVE EVALUATION OF CONTACT LENS EDGE LIFT BASED...

OFF-AXIS MOTION CHARACTERIZATION OF A LINEAR ACTUATOR

SURFACE PROCESSING EQUIPMENT

METHOD AND DEVICE FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT

SURFACE METROLOGY SYSTEMS AND METHODS THEREOF

METHOD OF MEASURING BENDING OF AN ELONGATE VERTICALLY ORIENTED CHANNEL

METHOD FOR THE FUNCTIONAL CHARACTERISATION OF OPTICAL LENSES

THREE-DIMENSIONAL SHAPE MEASURING DEVICE, REFERENCE SURFACE POSITIO...

Analysis System

ADJUSTMENT METHOD FOR SHAPE MEASURING DEVICE

SURFACE SHAPE MEASURING DEVICE AND SURFACE SHAPE MEASUREMENT METHOD

IN-LINE WAFER EDGE SEALING MONITORING SYSTEM AND METHODS OF OPERATION

OPTICAL HETERODYNE INTERFERENCE MEASUREMENT DEVICE AND OPTICAL HETE...

INTERFEROMETRIC SPECKLE VISIBILITY SPECTROSCOPY

Optical Metrology System and Methods for the Measurement of Optical...

Method for Eliminating Interference Pattern in Image, and Apparatus