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G01B11/2441
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B11/00
Measuring arrangements characterised by the use of optical means
Current Industry
G01B11/2441
using interferometry
Industries
Overview
Organizations
People
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
High resolution distributed sensor utilizing offset core optical fiber
Patent number
11,933,600
Issue date
Mar 19, 2024
OFS Fitel, LLC
Raja A Ahmad
G01 - MEASURING TESTING
Information
Patent Grant
Intra-oral scanning device with integrated optical coherence tomogr...
Patent number
11,925,435
Issue date
Mar 12, 2024
D4D Technologies, LLC
Ye Li
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method and device for characterizing the surface shape of an optica...
Patent number
11,927,500
Issue date
Mar 12, 2024
Carl Zeiss SMT GmbH
Steffen Siegler
G01 - MEASURING TESTING
Information
Patent Grant
On-chip signal processing method and pixel-array signal
Patent number
11,921,285
Issue date
Mar 5, 2024
Arizona Board of Regents on behalf of the University of Arizona
John Koshel
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
All-in-focus imager and associated method
Patent number
11,910,104
Issue date
Feb 20, 2024
Arizona Board of Regents on Behalf of the University of Arizona, a body corpo...
John Koshel
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Measuring apparatus for interferometrically determining a surface s...
Patent number
11,892,283
Issue date
Feb 6, 2024
Carl Zeiss SMT GmbH
Stefan Schulte
G01 - MEASURING TESTING
Information
Patent Grant
Surface analysis tools for process control of laser treatment of co...
Patent number
11,885,725
Issue date
Jan 30, 2024
The Boeing Company
Eileen O. Kutscha
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for characterizing the surface shape of a test ob...
Patent number
11,879,720
Issue date
Jan 23, 2024
Carl Zeiss SMT GmbH
Jochen Hetzler
G01 - MEASURING TESTING
Information
Patent Grant
Interferometric measurement method and interferometric measurement...
Patent number
11,879,721
Issue date
Jan 23, 2024
Carl Zeiss SMT GmbH
Alexander Wolf
G01 - MEASURING TESTING
Information
Patent Grant
Interferometric speckle visibility spectroscopy
Patent number
11,867,505
Issue date
Jan 9, 2024
California Institute of Technology
Joshua Brake
G01 - MEASURING TESTING
Information
Patent Grant
Method for examining a coating of a probe surface
Patent number
11,859,962
Issue date
Jan 2, 2024
BASF Coatings GmbH
Rolf Doering
G01 - MEASURING TESTING
Information
Patent Grant
System and method for determining post bonding overlay
Patent number
11,829,077
Issue date
Nov 28, 2023
KLA Corporation
Franz Zach
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for measuring interfaces of an optical element
Patent number
11,808,656
Issue date
Nov 7, 2023
FOGALE NANOTECH
Alain Courteville
G01 - MEASURING TESTING
Information
Patent Grant
Light emitting device, optical detection system, optical detection...
Patent number
11,796,311
Issue date
Oct 24, 2023
SKYVERSE TECHNOLOGY CO., LTD.
Lu Chen
G01 - MEASURING TESTING
Information
Patent Grant
Optical fiber sensor, optical system and method of optically interr...
Patent number
11,788,868
Issue date
Oct 17, 2023
KONINKLIJKE PHILIPS N.V.
Gert Wim 'T Hooft
G01 - MEASURING TESTING
Information
Patent Grant
Surface sensing probe and methods of use
Patent number
11,781,855
Issue date
Oct 10, 2023
Lyle G. Shirley
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Alignment of a measurement optical system and a sample under test
Patent number
11,774,236
Issue date
Oct 3, 2023
ARIZONA OPTICAL METROLOGY LLC
James Burge
G01 - MEASURING TESTING
Information
Patent Grant
Method for calibrating a measuring apparatus
Patent number
11,774,237
Issue date
Oct 3, 2023
Carl Zeiss SMT GmbH
Jochen Hetzler
G01 - MEASURING TESTING
Information
Patent Grant
Thin films and surface topography measurement using polarization re...
Patent number
11,761,753
Issue date
Sep 19, 2023
Svarog LLC
Boris V. Kamenev
G01 - MEASURING TESTING
Information
Patent Grant
Fast measurement method for micro-nano deep groove structure based...
Patent number
11,733,034
Issue date
Aug 22, 2023
Zhejiang University
Kexin Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining geometrical parameters of a soft contact lens
Patent number
11,692,906
Issue date
Jul 4, 2023
Alcon Inc.
Thomas Tonn
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Displacement sensor and profile measurement apparatus
Patent number
11,686,570
Issue date
Jun 27, 2023
Mitutoyo Corporation
Akihide Kimura
G01 - MEASURING TESTING
Information
Patent Grant
Shape measuring system and shape measuring method
Patent number
11,635,295
Issue date
Apr 25, 2023
Hitachi, Ltd.
Tatsuo Hariyama
G01 - MEASURING TESTING
Information
Patent Grant
Detection aided two-stage phase unwrapping on pattern wafer geometr...
Patent number
11,629,952
Issue date
Apr 18, 2023
KLA Corporation
Helen Liu
G01 - MEASURING TESTING
Information
Patent Grant
Composite laminate damage detection method using an in-situ thermal...
Patent number
11,618,591
Issue date
Apr 4, 2023
The Boeing Company
Samuel R. Goertz
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Grant
3D intraoral camera using frequency modulation
Patent number
11,543,232
Issue date
Jan 3, 2023
Dental Imaging Technologies Corporation
Chuanmao Fan
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Analysis apparatus, analysis method, and interference measurement s...
Patent number
11,536,562
Issue date
Dec 27, 2022
Mitutoyo Corp.
Shimpei Matsuura
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for analyzing the surface of parts having cooling...
Patent number
11,529,704
Issue date
Dec 20, 2022
Siemens Energy Global GmbH & Co. KG
Thomas Beck
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Fast phase-shift interferometry by laser frequency shift
Patent number
11,469,571
Issue date
Oct 11, 2022
KLA Corporation
Haifeng Huang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Surface quality sensing using self-mixing interferometry
Patent number
11,460,293
Issue date
Oct 4, 2022
Apple Inc.
Tong Chen
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Patents Applications
last 30 patents
Information
Patent Application
SURFACE INSPECTION DEVICE AND SHAPE MEASUREMENT SOFTWARE
Publication number
20240159520
Publication date
May 16, 2024
Hitachi High-Tech Corporation
Toshifumi HONDA
G01 - MEASURING TESTING
Information
Patent Application
Shape Sensing of Multimode Optical Fibers
Publication number
20240151517
Publication date
May 9, 2024
Ramot at Tel Aviv University Ltd.
Avishay Eyal
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR DETERMINING A THREE-DIMENSIONAL DEFINITION OF...
Publication number
20240125594
Publication date
Apr 18, 2024
VIRELUX INSPECTION SYSTEMS SARL
Tom REICHERT
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR DETERMINING POST BONDING OVERLAY
Publication number
20240094642
Publication date
Mar 21, 2024
KLA Corporation
Franz Zach
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MEASUREMENT DEVICE FOR INTERFEROMETRIC MEASUREMENT OF A SURFACE SHAPE
Publication number
20240077305
Publication date
Mar 7, 2024
Carl Zeiss SMT GMBH
Jochen HETZLER
G01 - MEASURING TESTING
Information
Patent Application
ALIGNMENT METHOD, SHAPE MEASURING METHOD AND SHAPE MEASURING APPARATUS
Publication number
20240077304
Publication date
Mar 7, 2024
TOKYO SEIMITSU CO., LTD.
Tasuku SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
MEASURING DEVICE AND MACHINING DEVICE
Publication number
20240068798
Publication date
Feb 29, 2024
TOKYO SEIMITSU CO., LTD.
Tasuku SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
Optically Computed Phase Microscopy
Publication number
20240068803
Publication date
Feb 29, 2024
NEW JERSEY INSTITUTE OF TECHNOLOGY
Xuan Liu
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT APPARATUS, METHOD FOR MEASURING BY INTERFEROMETRY, PROC...
Publication number
20240035811
Publication date
Feb 1, 2024
Carl Zeiss SMT GMBH
Stefan SCHULTE
G01 - MEASURING TESTING
Information
Patent Application
3D PROFILOMETRY WITH A LINNIK INTERFEROMETER
Publication number
20240035810
Publication date
Feb 1, 2024
Amnon Manassen
G01 - MEASURING TESTING
Information
Patent Application
MEASURING DEVICE FOR INTERFEROMETRICALLY MEASURING A SURFACE FORM
Publication number
20240011768
Publication date
Jan 11, 2024
Carl Zeiss SMT GMBH
Martin Endres
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL FIBER SENSOR, OPTICAL SYSTEM AND METHOD OF OPTICALLY INTERR...
Publication number
20230417580
Publication date
Dec 28, 2023
Koninklijke Philips N.V.
Gert Wim 'T HOOFT
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
Publication number
20230375463
Publication date
Nov 23, 2023
Samsung Electronics Co., Ltd.
Seoyeon JEONG
G02 - OPTICS
Information
Patent Application
DEVICE AND METHOD FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT
Publication number
20230332885
Publication date
Oct 19, 2023
FOGALE NANOTECH
Sylvain PETITGRAND
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT METHOD OF SURFACE SHAPE AND SURFACE SHAPE MEASUREMENT D...
Publication number
20230324168
Publication date
Oct 12, 2023
MITUTOYO CORPORATION
Yumiko MORI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASUREMENT METHOD OF SURFACE SHAPE AND SURFACE SHAPE MEASUREMENT D...
Publication number
20230304790
Publication date
Sep 28, 2023
MITUTOYO CORPORATION
Yumiko MORI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Non-Contact Automated Measurement for Interface Gaps
Publication number
20230271281
Publication date
Aug 31, 2023
The Boeing Company
Farahnaz Sisco
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
Publication number
20230243643
Publication date
Aug 3, 2023
CKD CORPORATION
Hiroyuki Ishigaki
G01 - MEASURING TESTING
Information
Patent Application
PRODUCTION METHOD AND MEASUREMENT METHOD
Publication number
20230243644
Publication date
Aug 3, 2023
Carl Zeiss SMT GMBH
Hans Michael STIEPAN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
INTERFEROMETRIC MEASURING DEVICE
Publication number
20230236006
Publication date
Jul 27, 2023
TAYLOR HOBSON LTD.
Thilo May
G01 - MEASURING TESTING
Information
Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
Publication number
20230204345
Publication date
Jun 29, 2023
CKD CORPORATION
Hiroyuki Ishigaki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CALIBRATION METHOD OF OPTICAL COHERENCE TOMOGRAPHY DEVICE AND CAMERA
Publication number
20230194245
Publication date
Jun 22, 2023
HUVITZ CO., LTD.
Seong Hun SHIN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR INSPECTING PHOTOMASKS
Publication number
20230175839
Publication date
Jun 8, 2023
THE TEXAS A&M UNIVERSITY SYSTEM
ChaBum Lee
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
SYSTEM FOR GENERATING A SIGNAL REPRESENTATIVE OF THE PROFILE OF A S...
Publication number
20230168082
Publication date
Jun 1, 2023
COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN
BASTIEN GRIMALDI
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR OBTAINING THE PROFILE OF A SURFACE MOVING IN RELATION TO...
Publication number
20230168079
Publication date
Jun 1, 2023
COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN
BASTIEN GRIMALDI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR GENERATING A SIGNAL REPRESENTATIVE OF THE PROFILE OF A S...
Publication number
20230168083
Publication date
Jun 1, 2023
COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN
BASTIEN GRIMALDI
G01 - MEASURING TESTING
Information
Patent Application
Polarization-Separated, Phase-Shifted Interferometer
Publication number
20230160682
Publication date
May 25, 2023
Massachusetts Institute of Technology
Noah GILBERT
G01 - MEASURING TESTING
Information
Patent Application
LOW-COHERENCE INTERFEROMETER WITH SURFACE POWER COMPENSATION
Publication number
20230160686
Publication date
May 25, 2023
Corning Incorporated
Joshua Monroe Cobb
G01 - MEASURING TESTING
Information
Patent Application
FAST MEASUREMENT METHOD FOR MICRO-NANO DEEP GROOVE STRUCTURE BASED...
Publication number
20230118227
Publication date
Apr 20, 2023
ZHEJIANG UNIVERSITY
Kexin Zhang
G01 - MEASURING TESTING
Information
Patent Application
ALIGNMENT OF A MEASUREMENT OPTICAL SYSTEM AND A SAMPLE UNDER TEST
Publication number
20230123150
Publication date
Apr 20, 2023
ARIZONA OPTICAL METROLOGY LLC
James BURGE
G02 - OPTICS