using masks, aperture plates, spatial light modulators or spatial filters

Industry

CPC
G01J3/0229

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Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

Current Industry

G01J3/0229using masks, aperture plates, spatial light modulators or spatial filters

Industries

Patents Grantslast 30 patents

Information Patent Grant
Spectral analysis of a sample
- Patent number 12,329,496
- Issue date Jun 17, 2025
- Agilent Technologies LDA UK Limited
- Philip Valmont Wilson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for determining or classifying the surface col...
- Patent number 12,326,362
- Issue date Jun 10, 2025
- ams Sensors Germany GmbH
- Gunter Siess
- G01 - MEASURING TESTING
Information Patent Grant
Linear array scanning brillouin scattering elastic imaging device
- Patent number 12,326,366
- Issue date Jun 10, 2025
- NANCHANG HANGKONG UNIVERSITY
- Jiulin Shi
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometry systems with decreased light path
- Patent number 12,313,464
- Issue date May 27, 2025
- SCIO Solutions Ltd
- Damian Goldring
- G01 - MEASURING TESTING
Information Patent Grant
Quantification of heart failure using molecular chemical imaging
- Patent number 12,295,743
- Issue date May 13, 2025
- ChemImage Corporation
- Jeffrey K. Cohen
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Multi-spectral and polarization imaging apparatus with atmospheric...
- Patent number 12,298,468
- Issue date May 13, 2025
- The Boeing Company
- David R. Gerwe
- G01 - MEASURING TESTING
Information Patent Grant
Dual camera module including hyperspectral camera module, apparatus...
- Patent number 12,301,961
- Issue date May 13, 2025
- Samsung Electronics Co., Ltd.
- Youngzoon Yoon
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Spectrometry apparatus
- Patent number 12,292,330
- Issue date May 6, 2025
- HITACHI HIGH-TECH CORPORATION
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Limitation of noise on light detectors using an aperture
- Patent number 12,292,502
- Issue date May 6, 2025
- Waymo LLC
- Pierre-Yves Droz
- G01 - MEASURING TESTING
Information Patent Grant
Illumination systems and optical devices for laser beam shaping
- Patent number 12,270,703
- Issue date Apr 8, 2025
- IDEX Health & Science LLC
- Jeffrey M. Bendick
- G02 - OPTICS
Information Patent Grant
Optical sensor device
- Patent number 12,253,412
- Issue date Mar 18, 2025
- Viavi Solutions Inc.
- William D. Houck
- G01 - MEASURING TESTING
Information Patent Grant
Image sensor and method of operating
- Patent number 12,247,879
- Issue date Mar 11, 2025
- Samsung Electronics Co., Ltd.
- Radwanul Hasan Siddique
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring optical constant
- Patent number 12,241,781
- Issue date Mar 4, 2025
- The University of Tokyo
- Daisuke Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Sensor device and method of use
- Patent number 12,216,004
- Issue date Feb 4, 2025
- Viavi Solutions Inc.
- William D. Houck
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensor device
- Patent number 12,209,906
- Issue date Jan 28, 2025
- Viavi Solutions Inc.
- William D. Houck
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Concealment component for an optical sensor device
- Patent number 12,196,611
- Issue date Jan 14, 2025
- Viavi Solutions Inc.
- William D. Houck
- G01 - MEASURING TESTING
Information Patent Grant
System and method for authenticating and classifying products using...
- Patent number 12,188,821
- Issue date Jan 7, 2025
- BOTTLEVIN, INC.
- Leslie Young Harvill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reconfigurable polarization imaging system
- Patent number 12,169,144
- Issue date Dec 17, 2024
- Arizona Board of Regents on behalf of the University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Grant
Large spot size spectrometer
- Patent number 12,163,833
- Issue date Dec 10, 2024
- Si-Ware Systems
- Mohamed Sadek Radwan
- G01 - MEASURING TESTING
Information Patent Grant
Gas detection device, gas detection system, and gas detection method
- Patent number 12,163,881
- Issue date Dec 10, 2024
- NEC Platforms, Ltd.
- Fujio Okumura
- G01 - MEASURING TESTING
Information Patent Grant
Photothermal infrared spectroscopy utilizing spatial light manipula...
- Patent number 12,140,475
- Issue date Nov 12, 2024
- Photothermal Spectroscopy Corp.
- Derek Decker
- G01 - MEASURING TESTING
Information Patent Grant
System, apparatus and method for rapid evaluation of light transmis...
- Patent number 12,140,535
- Issue date Nov 12, 2024
- The Boeing Company
- Paul Vahey
- G01 - MEASURING TESTING
Information Patent Grant
Optical filter and spectrometer
- Patent number 12,135,239
- Issue date Nov 5, 2024
- Viavi Solutions Inc.
- Paula Smith
- G02 - OPTICS
Information Patent Grant
Optical filter and electronic apparatus
- Patent number 12,124,025
- Issue date Oct 22, 2024
- Seiko Epson Corporation
- Tomoaki Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer and method of detecting an electromagnetic (EM) wave s...
- Patent number 12,098,950
- Issue date Sep 24, 2024
- National University of Singapore
- Guangya James Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Optical device and method
- Patent number 12,098,954
- Issue date Sep 24, 2024
- Oxford University Innovation Limited
- Robin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Colorimeter and reflectivity measuring method based on multichannel...
- Patent number 12,098,957
- Issue date Sep 24, 2024
- CaiPu Technology (Zhejiang) Co., Ltd.
- Kun Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Solid-state spectrometer
- Patent number 12,092,571
- Issue date Sep 17, 2024
- Masimo Corporation
- Björn Le Normand
- G01 - MEASURING TESTING
Information Patent Grant
Optical filter for an optical sensor device
- Patent number 12,085,444
- Issue date Sep 10, 2024
- Viavi Solutions Inc.
- William D. Houck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spatial light modulator spectroscopy
- Patent number 12,072,241
- Issue date Aug 27, 2024
- Texas Instruments Incorporated
- Philip Scott King
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DIFFRACTIVE EUV SPECTRAL PURITY FILTERS FOR OPTICAL SYSTEMS
- Publication number 20250216254
- Publication date Jul 3, 2025
- KLA Corporation
- Alon Rosenthal
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR DETECTING CHEMICALS IN A SAMPLE
- Publication number 20250216306
- Publication date Jul 3, 2025
- Centre National de la Recherche Scientifique
- Hilton BARBOSA DE AGUIAR
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSOR DEVICE
- Publication number 20250189371
- Publication date Jun 12, 2025
- VIAVI SOLUTIONS INC.
- William D. HOUCK
- G02 - OPTICS
Information Patent Application
SENSOR DEVICE AND METHOD OF USE
- Publication number 20250172432
- Publication date May 29, 2025
- VIAVI SOLUTIONS INC.
- William D. Houck
- G01 - MEASURING TESTING
Information Patent Application
CONCEALMENT COMPONENT FOR AN OPTICAL SENSOR DEVICE
- Publication number 20250146866
- Publication date May 8, 2025
- VIAVI SOLUTIONS INC.
- William D. HOUCK
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRY APPARATUS AND SPECTROMETRY METHOD
- Publication number 20250116552
- Publication date Apr 10, 2025
- OSAKA UNIVERSITY
- Yasuaki Kumamoto
- G01 - MEASURING TESTING
Information Patent Application
HYPER-SPECTRAL MULTI-SPOT OPTICAL REFLECTOMETER
- Publication number 20250102356
- Publication date Mar 27, 2025
- Applied Materials, Inc.
- Pengyu HAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR RESTRICTING LASER BEAMS ENTERING AN APERTURE TO A CHOSEN...
- Publication number 20250085163
- Publication date Mar 13, 2025
- Richard Fauconier
- G01 - MEASURING TESTING
Information Patent Application
COLOR MATCHING OBSERVATION BOX FOR LED STANDARD LIGHT SOURCE
- Publication number 20250076119
- Publication date Mar 6, 2025
- Wenzhou Jiayi Instruments Co.,Ltd
- Binhui QIU
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MODULE, SPECTROSCOPIC DEVICE FOR HYPERSPECTRAL IMAGING, AND...
- Publication number 20250076116
- Publication date Mar 6, 2025
- Samsung Electronics Co., Ltd.
- Sunhong Jun
- G01 - MEASURING TESTING
Information Patent Application
COMPENSATION OF OPTICAL ALIGNMENT ISSUES FOR SECTORED-VIEW MULTI-SP...
- Publication number 20250067596
- Publication date Feb 27, 2025
- ams Sensors Germany GmbH
- Gunter Siess
- G01 - MEASURING TESTING
Information Patent Application
SOLID-STATE SPECTROMETER
- Publication number 20250067663
- Publication date Feb 27, 2025
- MASIMO CORPORATION
- Björn Le Normand
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FILTER AND SPECTROMETER
- Publication number 20250052610
- Publication date Feb 13, 2025
- VIAVI SOLUTIONS INC.
- Paula SMITH
- G01 - MEASURING TESTING
Information Patent Application
PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULA...
- Publication number 20250003797
- Publication date Jan 2, 2025
- Photothermal Spectroscopy Corp.
- Derek Decker
- G01 - MEASURING TESTING
Information Patent Application
META-MATERIAL INTERFEROMETRY SYSTEMS AND METHODS
- Publication number 20240402008
- Publication date Dec 5, 2024
- Danbury Mission Technologies LLC
- Alexander J. Majewski
- G02 - OPTICS
Information Patent Application
COLORIMETER AND REFLECTIVITY MEASURING METHOD BASED ON MULTICHANNEL...
- Publication number 20240393181
- Publication date Nov 28, 2024
- CaiPu Technology (Zhejiang) Co., Ltd.
- Kun YUAN
- G01 - MEASURING TESTING
Information Patent Application
Limitation of Noise on Light Detectors using an Aperture
- Publication number 20240385320
- Publication date Nov 21, 2024
- WAYMO LLC
- Pierre-Yves Droz
- G01 - MEASURING TESTING
Information Patent Application
CASCADED, SELF-CALIBRATED, SINGLE-PIXEL INFRARED HADAMARD TRANSFORM...
- Publication number 20240377252
- Publication date Nov 14, 2024
- National University of Singapore
- Zi Heng LIM
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRY SYSTEMS WITH DECREASED LIGHT PATH
- Publication number 20240377253
- Publication date Nov 14, 2024
- Verifood Ltd
- Damian GOLDRING
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPIC RAMAN SPECTROSCOPY DEVICE
- Publication number 20240344990
- Publication date Oct 17, 2024
- SHIMADZU CORPORATION
- Tomoki SASAYAMA
- G02 - OPTICS
Information Patent Application
APPARATUS FOR FILTERING LIGHTING SOURCE OF SEMICONDUCTOR APPEARANCE...
- Publication number 20240344884
- Publication date Oct 17, 2024
- Shanghai Huali Integrated Circuit Corporation
- Peng CHENG
- G02 - OPTICS
Information Patent Application
TUNABLE HYPERSPECTRAL-POLARIMETRIC IMAGING SYSTEM
- Publication number 20240288309
- Publication date Aug 29, 2024
- Purdue Research Foundation
- Xueji Wang
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM FOR REFERENCE SWITCHING
- Publication number 20240288306
- Publication date Aug 29, 2024
- Apple Inc.
- Mark Alan ARBORE
- G01 - MEASURING TESTING
Information Patent Application
DIVIDED-APERTURE INFRA-RED SPECTRAL IMAGING SYSTEM
- Publication number 20240210244
- Publication date Jun 27, 2024
- REBELLION PHOTONICS, INC.
- Robert Timothy Kester
- G01 - MEASURING TESTING
Information Patent Application
Measurements Of Semiconductor Structures Based On Spectral Differen...
- Publication number 20240186191
- Publication date Jun 6, 2024
- KLA Corporation
- Ming Di
- G01 - MEASURING TESTING
Information Patent Application
IMAGE SENSOR AND METHOD OF OPERATING
- Publication number 20240175750
- Publication date May 30, 2024
- Samsung Electronics Co., LTD
- Radwanul Hasan SIDDIQUE
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-DETECTOR DOUBLE-PATH INTENSITY-MODULATION SPECTROMETER
- Publication number 20240167877
- Publication date May 23, 2024
- Government of the United States of America, as Represented by the Secretary o...
- Young Jong Lee
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR QUANTITATIVE AND DEPTH RESOLVED HYPERSPECT...
- Publication number 20240148291
- Publication date May 9, 2024
- The Trustees of Dartmouth College
- Pablo Valdes
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SPECTRAL AND POLARIZATION IMAGING APPARATUS WITH ATMOSPHERIC...
- Publication number 20240125973
- Publication date Apr 18, 2024
- The Boeing Company
- David R. Gerwe
- G01 - MEASURING TESTING
Information Patent Application
DISPERSION MEASUREMENT APPARATUS AND DISPERSION MEASUREMENT METHOD
- Publication number 20240110833
- Publication date Apr 4, 2024
- HAMAMATSU PHOTONICS K. K.
- Koyo WATANABE
- G01 - MEASURING TESTING

using masks, aperture plates, spatial light modulators or spatial filters

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Spectral analysis of a sample

Method and apparatus for determining or classifying the surface col...

Linear array scanning brillouin scattering elastic imaging device

Spectrometry systems with decreased light path

Quantification of heart failure using molecular chemical imaging

Multi-spectral and polarization imaging apparatus with atmospheric...

Dual camera module including hyperspectral camera module, apparatus...

Spectrometry apparatus

Limitation of noise on light detectors using an aperture

Illumination systems and optical devices for laser beam shaping

Optical sensor device

Image sensor and method of operating

Device and method for measuring optical constant

Sensor device and method of use

Optical sensor device

Concealment component for an optical sensor device

System and method for authenticating and classifying products using...

Reconfigurable polarization imaging system

Large spot size spectrometer

Gas detection device, gas detection system, and gas detection method

Photothermal infrared spectroscopy utilizing spatial light manipula...

System, apparatus and method for rapid evaluation of light transmis...

Optical filter and spectrometer

Optical filter and electronic apparatus

Spectrometer and method of detecting an electromagnetic (EM) wave s...

Optical device and method

Colorimeter and reflectivity measuring method based on multichannel...

Solid-state spectrometer

Optical filter for an optical sensor device

Spatial light modulator spectroscopy

Patents Applicationslast 30 patents

DIFFRACTIVE EUV SPECTRAL PURITY FILTERS FOR OPTICAL SYSTEMS

APPARATUS FOR DETECTING CHEMICALS IN A SAMPLE

OPTICAL SENSOR DEVICE

SENSOR DEVICE AND METHOD OF USE

CONCEALMENT COMPONENT FOR AN OPTICAL SENSOR DEVICE

SPECTROMETRY APPARATUS AND SPECTROMETRY METHOD

HYPER-SPECTRAL MULTI-SPOT OPTICAL REFLECTOMETER

METHOD FOR RESTRICTING LASER BEAMS ENTERING AN APERTURE TO A CHOSEN...

COLOR MATCHING OBSERVATION BOX FOR LED STANDARD LIGHT SOURCE

OPTICAL MODULE, SPECTROSCOPIC DEVICE FOR HYPERSPECTRAL IMAGING, AND...

COMPENSATION OF OPTICAL ALIGNMENT ISSUES FOR SECTORED-VIEW MULTI-SP...

SOLID-STATE SPECTROMETER

OPTICAL FILTER AND SPECTROMETER

PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULA...

META-MATERIAL INTERFEROMETRY SYSTEMS AND METHODS

COLORIMETER AND REFLECTIVITY MEASURING METHOD BASED ON MULTICHANNEL...

Limitation of Noise on Light Detectors using an Aperture

CASCADED, SELF-CALIBRATED, SINGLE-PIXEL INFRARED HADAMARD TRANSFORM...

SPECTROMETRY SYSTEMS WITH DECREASED LIGHT PATH

MICROSCOPIC RAMAN SPECTROSCOPY DEVICE

APPARATUS FOR FILTERING LIGHTING SOURCE OF SEMICONDUCTOR APPEARANCE...

TUNABLE HYPERSPECTRAL-POLARIMETRIC IMAGING SYSTEM

OPTICAL SYSTEM FOR REFERENCE SWITCHING

DIVIDED-APERTURE INFRA-RED SPECTRAL IMAGING SYSTEM

Measurements Of Semiconductor Structures Based On Spectral Differen...

IMAGE SENSOR AND METHOD OF OPERATING

SINGLE-DETECTOR DOUBLE-PATH INTENSITY-MODULATION SPECTROMETER

METHOD AND APPARATUS FOR QUANTITATIVE AND DEPTH RESOLVED HYPERSPECT...

MULTI-SPECTRAL AND POLARIZATION IMAGING APPARATUS WITH ATMOSPHERIC...

DISPERSION MEASUREMENT APPARATUS AND DISPERSION MEASUREMENT METHOD