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G01J1/0444
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
G01J1/00
Photometry
Current Industry
G01J1/0444
using means for replacing an element by another
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Patents Grants
last 30 patents
Information
Patent Grant
Terminal-imaging seeker using a spatial light modulator based coded...
Patent number
10,996,104
Issue date
May 4, 2021
Rosemount Aerospace Inc.
Jason Graham
G01 - MEASURING TESTING
Information
Patent Grant
Variable modulation of radiation and components
Patent number
9,891,427
Issue date
Feb 13, 2018
Halliburton Energy Services, Inc.
David L. Perkins
G02 - OPTICS
Information
Patent Grant
Electronic devices with light sensors
Patent number
9,664,555
Issue date
May 30, 2017
Apple Inc.
Boon W. Shiu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Variable modulation of radiation and components
Patent number
9,519,133
Issue date
Dec 13, 2016
Halliburton Energy Services, Inc.
David L. Perkins
G02 - OPTICS
Information
Patent Grant
Apparatus and method for measuring optical component
Patent number
9,429,469
Issue date
Aug 30, 2016
Labrox Oy
Pauli Salmelainen
G01 - MEASURING TESTING
Information
Patent Grant
Microtiter plate reader apparatus and dynamic filter storage
Patent number
9,354,173
Issue date
May 31, 2016
Labrox Oy
Antero Yli-Koski
G01 - MEASURING TESTING
Information
Patent Grant
System and method for determining size and location of minimum beam...
Patent number
9,116,044
Issue date
Aug 25, 2015
KLA-Tencor Corporation
Daniel Hey
G01 - MEASURING TESTING
Information
Patent Grant
Calibration system for detector
Patent number
8,716,651
Issue date
May 6, 2014
Raytheon Company
Howard M. De Ruyter
G01 - MEASURING TESTING
Information
Patent Grant
High-speed optical measurement apparatus
Patent number
8,619,259
Issue date
Dec 31, 2013
ENC Technology Co., Ltd.
Seong Weon Lee
G01 - MEASURING TESTING
Information
Patent Grant
Large-angle uniform radiance source
Patent number
8,194,125
Issue date
Jun 5, 2012
Raytheon Company
John A. Mack
G01 - MEASURING TESTING
Information
Patent Grant
Microscope
Patent number
7,944,608
Issue date
May 17, 2011
Olympus Corporation
Kazuhiro Hayashi
G01 - MEASURING TESTING
Information
Patent Grant
Spectral and luminance measuring device employing array and single-...
Patent number
7,897,912
Issue date
Mar 1, 2011
Photo Research, Inc.
Francis A. Dominic
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus, microscope with an apparatus, and method for calibration...
Patent number
7,576,316
Issue date
Aug 18, 2009
Leica Microsystems CMS GmbH
Volker Seyfried
G01 - MEASURING TESTING
Information
Patent Grant
Telescope accessory
Patent number
7,130,051
Issue date
Oct 31, 2006
American Museum of Natural History
Ben R. Oppenheimer
G01 - MEASURING TESTING
Information
Patent Grant
LED measuring device
Patent number
7,022,969
Issue date
Apr 4, 2006
Photo Research, Inc.
Thomas H. Bulpitt
G01 - MEASURING TESTING
Information
Patent Grant
Cosine corrected optical pathway of a spectral radiometer
Patent number
6,005,249
Issue date
Dec 21, 1999
Smithsonian Environmental Research Center
Douglass R. Hayes
G01 - MEASURING TESTING
Information
Patent Grant
Optical detector calibrator system
Patent number
5,561,290
Issue date
Oct 1, 1996
The United States of America as represented by the administrator of the Natio...
James P. Strobel
G08 - SIGNALLING
Patents Applications
last 30 patents
Information
Patent Application
TERMINAL-IMAGING SEEKER USING A SPATIAL LIGHT MODULATOR BASED CODED...
Publication number
20200049550
Publication date
Feb 13, 2020
Rosemount Aerospace Inc.
Jason Graham
G01 - MEASURING TESTING
Information
Patent Application
VARIABLE MODULATION OF RADIATION AND COMPONENTS
Publication number
20170211976
Publication date
Jul 27, 2017
Halliburton Energy Services, Inc.
David L. Perkins
G02 - OPTICS
Information
Patent Application
Apparatus and method for measuring optical component
Publication number
20150177060
Publication date
Jun 25, 2015
LABROX OY
Pauli Salmelainen
G01 - MEASURING TESTING
Information
Patent Application
Electronic Devices with Light Sensors
Publication number
20140166867
Publication date
Jun 19, 2014
Apple Inc.
Boon W. Shiu
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR DETERMINING SIZE AND LOCATION OF MINIMUM BEAM...
Publication number
20140098363
Publication date
Apr 10, 2014
KLA-Tencor Corporation
Daniel Hey
G01 - MEASURING TESTING
Information
Patent Application
MICROTITER PLATE READER APPARATUS AND DYNAMIC FILTER STORAGE
Publication number
20130050705
Publication date
Feb 28, 2013
LABROX OY
Antero Yli-Koski
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION SYSTEM FOR DETECTOR
Publication number
20130043390
Publication date
Feb 21, 2013
Raytheon Company
Howard M. DE RUYTER
G01 - MEASURING TESTING
Information
Patent Application
HIGH-SPEED OPTICAL MEASUREMENT APPARATUS
Publication number
20110299087
Publication date
Dec 8, 2011
ENC TECHNOLOGY CO., LTD.
Seong Weon LEE
G01 - MEASURING TESTING
Information
Patent Application
MICROSCOPE
Publication number
20090161209
Publication date
Jun 25, 2009
OLYMPUS CORPORATION
Kazuhiro HAYASHI
G02 - OPTICS
Information
Patent Application
Large-angle uniform radiance source
Publication number
20090108213
Publication date
Apr 30, 2009
John A. Mack
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS WITH MULTIPLE LIGHT DETECTORS AND METHODS OF USE AND MANU...
Publication number
20070272844
Publication date
Nov 29, 2007
Photo Research, Inc.
Francis A. Dominic
G01 - MEASURING TESTING
Information
Patent Application
Apparatus, microscope with an apparatus, and method for calibration...
Publication number
20070200052
Publication date
Aug 30, 2007
Leica Microsystems CMS GmbH
Volker Seyfried
G01 - MEASURING TESTING
Information
Patent Application
LED measuring device
Publication number
20050253046
Publication date
Nov 17, 2005
Photo Research, Inc.
Thomas H. Bulpitt
G01 - MEASURING TESTING
Information
Patent Application
Telescope accessory
Publication number
20040156087
Publication date
Aug 12, 2004
American Museum of Natural History
Ben R. Oppenheimer
G02 - OPTICS