using means for replacing an element by another

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G01J1/0444

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J1/00Photometry

Current Industry

G01J1/0444using means for replacing an element by another

Industries

Patents Grantslast 30 patents

Information Patent Grant
Terminal-imaging seeker using a spatial light modulator based coded...
- Patent number 10,996,104
- Issue date May 4, 2021
- Rosemount Aerospace Inc.
- Jason Graham
- G01 - MEASURING TESTING
Information Patent Grant
Variable modulation of radiation and components
- Patent number 9,891,427
- Issue date Feb 13, 2018
- Halliburton Energy Services, Inc.
- David L. Perkins
- G02 - OPTICS
Information Patent Grant
Electronic devices with light sensors
- Patent number 9,664,555
- Issue date May 30, 2017
- Apple Inc.
- Boon W. Shiu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Variable modulation of radiation and components
- Patent number 9,519,133
- Issue date Dec 13, 2016
- Halliburton Energy Services, Inc.
- David L. Perkins
- G02 - OPTICS
Information Patent Grant
Apparatus and method for measuring optical component
- Patent number 9,429,469
- Issue date Aug 30, 2016
- Labrox Oy
- Pauli Salmelainen
- G01 - MEASURING TESTING
Information Patent Grant
Microtiter plate reader apparatus and dynamic filter storage
- Patent number 9,354,173
- Issue date May 31, 2016
- Labrox Oy
- Antero Yli-Koski
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining size and location of minimum beam...
- Patent number 9,116,044
- Issue date Aug 25, 2015
- KLA-Tencor Corporation
- Daniel Hey
- G01 - MEASURING TESTING
Information Patent Grant
Calibration system for detector
- Patent number 8,716,651
- Issue date May 6, 2014
- Raytheon Company
- Howard M. De Ruyter
- G01 - MEASURING TESTING
Information Patent Grant
High-speed optical measurement apparatus
- Patent number 8,619,259
- Issue date Dec 31, 2013
- ENC Technology Co., Ltd.
- Seong Weon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Large-angle uniform radiance source
- Patent number 8,194,125
- Issue date Jun 5, 2012
- Raytheon Company
- John A. Mack
- G01 - MEASURING TESTING
Information Patent Grant
Microscope
- Patent number 7,944,608
- Issue date May 17, 2011
- Olympus Corporation
- Kazuhiro Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Spectral and luminance measuring device employing array and single-...
- Patent number 7,897,912
- Issue date Mar 1, 2011
- Photo Research, Inc.
- Francis A. Dominic
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, microscope with an apparatus, and method for calibration...
- Patent number 7,576,316
- Issue date Aug 18, 2009
- Leica Microsystems CMS GmbH
- Volker Seyfried
- G01 - MEASURING TESTING
Information Patent Grant
Telescope accessory
- Patent number 7,130,051
- Issue date Oct 31, 2006
- American Museum of Natural History
- Ben R. Oppenheimer
- G01 - MEASURING TESTING
Information Patent Grant
LED measuring device
- Patent number 7,022,969
- Issue date Apr 4, 2006
- Photo Research, Inc.
- Thomas H. Bulpitt
- G01 - MEASURING TESTING
Information Patent Grant
Cosine corrected optical pathway of a spectral radiometer
- Patent number 6,005,249
- Issue date Dec 21, 1999
- Smithsonian Environmental Research Center
- Douglass R. Hayes
- G01 - MEASURING TESTING
Information Patent Grant
Optical detector calibrator system
- Patent number 5,561,290
- Issue date Oct 1, 1996
- The United States of America as represented by the administrator of the Natio...
- James P. Strobel
- G08 - SIGNALLING

Patents Applicationslast 30 patents

Information Patent Application
TERMINAL-IMAGING SEEKER USING A SPATIAL LIGHT MODULATOR BASED CODED...
- Publication number 20200049550
- Publication date Feb 13, 2020
- Rosemount Aerospace Inc.
- Jason Graham
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE MODULATION OF RADIATION AND COMPONENTS
- Publication number 20170211976
- Publication date Jul 27, 2017
- Halliburton Energy Services, Inc.
- David L. Perkins
- G02 - OPTICS
Information Patent Application
Apparatus and method for measuring optical component
- Publication number 20150177060
- Publication date Jun 25, 2015
- LABROX OY
- Pauli Salmelainen
- G01 - MEASURING TESTING
Information Patent Application
Electronic Devices with Light Sensors
- Publication number 20140166867
- Publication date Jun 19, 2014
- Apple Inc.
- Boon W. Shiu
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING SIZE AND LOCATION OF MINIMUM BEAM...
- Publication number 20140098363
- Publication date Apr 10, 2014
- KLA-Tencor Corporation
- Daniel Hey
- G01 - MEASURING TESTING
Information Patent Application
MICROTITER PLATE READER APPARATUS AND DYNAMIC FILTER STORAGE
- Publication number 20130050705
- Publication date Feb 28, 2013
- LABROX OY
- Antero Yli-Koski
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION SYSTEM FOR DETECTOR
- Publication number 20130043390
- Publication date Feb 21, 2013
- Raytheon Company
- Howard M. DE RUYTER
- G01 - MEASURING TESTING
Information Patent Application
HIGH-SPEED OPTICAL MEASUREMENT APPARATUS
- Publication number 20110299087
- Publication date Dec 8, 2011
- ENC TECHNOLOGY CO., LTD.
- Seong Weon LEE
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPE
- Publication number 20090161209
- Publication date Jun 25, 2009
- OLYMPUS CORPORATION
- Kazuhiro HAYASHI
- G02 - OPTICS
Information Patent Application
Large-angle uniform radiance source
- Publication number 20090108213
- Publication date Apr 30, 2009
- John A. Mack
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS WITH MULTIPLE LIGHT DETECTORS AND METHODS OF USE AND MANU...
- Publication number 20070272844
- Publication date Nov 29, 2007
- Photo Research, Inc.
- Francis A. Dominic
- G01 - MEASURING TESTING
Information Patent Application
Apparatus, microscope with an apparatus, and method for calibration...
- Publication number 20070200052
- Publication date Aug 30, 2007
- Leica Microsystems CMS GmbH
- Volker Seyfried
- G01 - MEASURING TESTING
Information Patent Application
LED measuring device
- Publication number 20050253046
- Publication date Nov 17, 2005
- Photo Research, Inc.
- Thomas H. Bulpitt
- G01 - MEASURING TESTING
Information Patent Application
Telescope accessory
- Publication number 20040156087
- Publication date Aug 12, 2004
- American Museum of Natural History
- Ben R. Oppenheimer
- G02 - OPTICS

using means for replacing an element by another

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Terminal-imaging seeker using a spatial light modulator based coded...

Variable modulation of radiation and components

Electronic devices with light sensors

Variable modulation of radiation and components

Apparatus and method for measuring optical component

Microtiter plate reader apparatus and dynamic filter storage

System and method for determining size and location of minimum beam...

Calibration system for detector

High-speed optical measurement apparatus

Large-angle uniform radiance source

Microscope

Spectral and luminance measuring device employing array and single-...

Apparatus, microscope with an apparatus, and method for calibration...

Telescope accessory

LED measuring device

Cosine corrected optical pathway of a spectral radiometer

Optical detector calibrator system

Patents Applicationslast 30 patents

TERMINAL-IMAGING SEEKER USING A SPATIAL LIGHT MODULATOR BASED CODED...

VARIABLE MODULATION OF RADIATION AND COMPONENTS

Apparatus and method for measuring optical component

Electronic Devices with Light Sensors

SYSTEM AND METHOD FOR DETERMINING SIZE AND LOCATION OF MINIMUM BEAM...

MICROTITER PLATE READER APPARATUS AND DYNAMIC FILTER STORAGE

CALIBRATION SYSTEM FOR DETECTOR

HIGH-SPEED OPTICAL MEASUREMENT APPARATUS

MICROSCOPE

Large-angle uniform radiance source

APPARATUS WITH MULTIPLE LIGHT DETECTORS AND METHODS OF USE AND MANU...

Apparatus, microscope with an apparatus, and method for calibration...

LED measuring device

Telescope accessory