using multilayer structures

Industry

CPC
G01R33/093

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R33/00Arrangements or instruments for measuring magnetic variables

Current Industry

G01R33/093using multilayer structures

Industries

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Patents Grantslast 30 patents

Information Patent Grant
System and method for GMR-based detection of biomarkers
- Patent number 12,174,135
- Issue date Dec 24, 2024
- ZEPTO LIFE TECHNOLOGY, INC.
- Todd Michael Klein
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Magnetic Isolator
- Patent number 12,169,228
- Issue date Dec 17, 2024
- MultiDimension Technology Co., Ltd.
- Haiping Guo
- G01 - MEASURING TESTING
Information Patent Grant
Sensor including a plurality of insulating layers made of different...
- Patent number 12,164,009
- Issue date Dec 10, 2024
- TDK Corporation
- Keisuke Takasugi
- G01 - MEASURING TESTING
Information Patent Grant
Method of designing and manufacturing magnetic sensor
- Patent number 12,158,510
- Issue date Dec 3, 2024
- TDK Corporation
- Tsuyoshi Umehara
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor including a plurality of magnetoresistive elements...
- Patent number 12,153,104
- Issue date Nov 26, 2024
- TDK Corporation
- Tetsuya Hiraki
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistive random access memory and method for fabricating th...
- Patent number 12,146,927
- Issue date Nov 19, 2024
- United Microelectronics Corp.
- Hui-Lin Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Position sensor system, optical lens system and display
- Patent number 12,140,647
- Issue date Nov 12, 2024
- Infineon Technologies AG
- Gernot Binder
- G01 - MEASURING TESTING
Information Patent Grant
Redundant current sensor
- Patent number 12,123,926
- Issue date Oct 22, 2024
- Infineon Technologies AG
- Sebastian Maerz
- G01 - MEASURING TESTING
Information Patent Grant
Tunnel magnetoresistive effect element, magnetic memory, and built-...
- Patent number 12,120,890
- Issue date Oct 15, 2024
- TDK Corporation
- Zhenyao Tang
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic offset and amplitude tracker
- Patent number 12,117,291
- Issue date Oct 15, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Christophe Lutz
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistive memory device and method of operating same using f...
- Patent number 12,106,790
- Issue date Oct 1, 2024
- SanDisk Technologies LLC
- Alan Kalitsov
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic sensor
- Patent number 12,105,165
- Issue date Oct 1, 2024
- TDK Corporation
- Kazuya Watanabe
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic tunnel junction comprising an inhomogeneous granular free...
- Patent number 12,100,437
- Issue date Sep 24, 2024
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Bernard Dieny
- G11 - INFORMATION STORAGE
Information Patent Grant
XMR sensors with serial segment strip configurations
- Patent number 12,092,704
- Issue date Sep 17, 2024
- Infineon Technologies AG
- Juergen Zimmer
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor, position detection apparatus and electronic device
- Patent number 12,092,705
- Issue date Sep 17, 2024
- TDK Corporation
- Takafumi Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor structure and fabrication method thereof
- Patent number 12,075,705
- Issue date Aug 27, 2024
- Semiconductor Manufacturing International (Shanghai) Corporation
- Wen Bin Xia
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic field detection apparatus
- Patent number 12,072,397
- Issue date Aug 27, 2024
- TDK Corporation
- Keisuke Takasugi
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic tunnel junction (MTJ) element and its fabrication process
- Patent number 12,069,961
- Issue date Aug 20, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Ya-Ling Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for magnetic sensor producing a changing magne...
- Patent number 12,061,246
- Issue date Aug 13, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Paul A. David
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 12,061,247
- Issue date Aug 13, 2024
- TDK Corporation
- Kazuya Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Passive magnetic detection and discrimination for security screening
- Patent number 12,050,299
- Issue date Jul 30, 2024
- Xtract One Technologies Inc.
- Yongming Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor chip and magnetic sensor device
- Patent number 12,044,755
- Issue date Jul 23, 2024
- Murata Manufacturing Co., Ltd.
- Masashi Kubota
- G01 - MEASURING TESTING
Information Patent Grant
Sensor having at least part of sensor element disposed on inclined...
- Patent number 12,044,753
- Issue date Jul 23, 2024
- TDK Corporation
- Hiromichi Umehara
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 12,044,754
- Issue date Jul 23, 2024
- TDK Corporation
- Hidekazu Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistance effect element
- Patent number 12,040,115
- Issue date Jul 16, 2024
- TDK Corporation
- Kazuumi Inubushi
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetoresistive device comprising a synthetic antiferromagnetic co...
- Patent number 12,040,114
- Issue date Jul 16, 2024
- Western Digital Technologies, Inc.
- Susumu Okamura
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetoresistance effect element
- Patent number 12,035,635
- Issue date Jul 9, 2024
- TDK Corporation
- Shinto Ichikawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic field sensor
- Patent number 12,032,041
- Issue date Jul 9, 2024
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Vinayak Bharat Naik
- G01 - MEASURING TESTING
Information Patent Grant
Current sensor for compensation of on-die temperature gradient
- Patent number 12,032,042
- Issue date Jul 9, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Noémie Belin
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic level gauge
- Patent number 12,018,973
- Issue date Jun 25, 2024
- MultiDimension Technology Co., Ltd.
- Bin Qi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TUNNEL MAGNETORESISTANCE ELEMENT TO DETECT OUT-OF-PLANE CHANGES IN...
- Publication number 20240418805
- Publication date Dec 19, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Paolo Campiglio
- G01 - MEASURING TESTING
Information Patent Application
Highly Textured Buffer Layer to Grow YBiPt (110) For Spintronic App...
- Publication number 20240420733
- Publication date Dec 19, 2024
- Western Digital Technologies, Inc.
- Quang LE
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETIC SENSOR
- Publication number 20240418804
- Publication date Dec 19, 2024
- TDK Corporation
- Kazuya WATANABE
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETORESISTANCE ELEMENT INCLUDING A SKYRMION LAYER AND A VORTEX L...
- Publication number 20240420878
- Publication date Dec 19, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Samridh JAISWAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPIN HALL MAGNETIC SENSOR AND METHOD OF MEASURING MAGNETORESISTANCE...
- Publication number 20240393413
- Publication date Nov 28, 2024
- Hyundai Motor Company
- Joon-Hyun Kwon
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD DETECTION APPARATUS
- Publication number 20240369651
- Publication date Nov 7, 2024
- TDK Corporation
- Keisuke TAKASUGI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC TUNNEL JUNCTION (MTJ) ELEMENT AND ITS FABRICATION PROCESS
- Publication number 20240365676
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- YA-LING LEE
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETIC SENSOR
- Publication number 20240361404
- Publication date Oct 31, 2024
- TDK Corporation
- Kazuya WATANABE
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20240345188
- Publication date Oct 17, 2024
- TDK Corporation
- Hidekazu KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETORESISTANCE EFFECT ELEMENT
- Publication number 20240339255
- Publication date Oct 10, 2024
- TDK Corporation
- Kazuumi INUBUSHI
- G11 - INFORMATION STORAGE
Information Patent Application
OPTICAL DETECTION DEVICE AND SIGNAL PROCESSING METHOD
- Publication number 20240329165
- Publication date Oct 3, 2024
- TDK Corporation
- Takekazu YAMANE
- G01 - MEASURING TESTING
Information Patent Application
INDUCING MECHANICAL STRESS IN MAGNETORESISTIVE SENSING ELEMENT TO A...
- Publication number 20240329166
- Publication date Oct 3, 2024
- INFINEON TECHNOLOGIES AG
- Bernhard ENDRES
- G01 - MEASURING TESTING
Information Patent Application
MAGNETORESISTANCE EFFECT ELEMENT
- Publication number 20240334839
- Publication date Oct 3, 2024
- TDK Corporation
- Shinto ICHIKAWA
- G11 - INFORMATION STORAGE
Information Patent Application
SENSOR
- Publication number 20240319292
- Publication date Sep 26, 2024
- TDK Corporation
- Hiromichi UMEHARA
- G01 - MEASURING TESTING
Information Patent Application
SPIN ORBIT TORQUE BASED THERMAL SENSOR FOR INSITU MONITORING OF MAG...
- Publication number 20240310459
- Publication date Sep 19, 2024
- Western Digital Technologies, Inc.
- Quang LE
- G01 - MEASURING TESTING
Information Patent Application
MAGNETORESISTIVE SENSOR HAVING A SHIELDING ELEMENT WITH VORTEX MAGN...
- Publication number 20240310461
- Publication date Sep 19, 2024
- INFINEON TECHNOLOGIES AG
- Bernhard ENDRES
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20240310460
- Publication date Sep 19, 2024
- TDK Corporation
- Takehiro ISODA
- G01 - MEASURING TESTING
Information Patent Application
SENSOR
- Publication number 20240280651
- Publication date Aug 22, 2024
- TDK Corporation
- Hiromichi UMEHARA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR DEVICE
- Publication number 20240280652
- Publication date Aug 22, 2024
- TDK Corporation
- Norikazu OTA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20240272249
- Publication date Aug 15, 2024
- TDK Corporation
- Hirokazu TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETORESISTANCE EFFECT ELEMENT
- Publication number 20240266099
- Publication date Aug 8, 2024
- TDK Corporation
- Kazuumi INUBUSHI
- G11 - INFORMATION STORAGE
Information Patent Application
REDUCING ANGLE ERROR IN ANGLE SENSOR DUE TO ORTHOGONALITY DRIFT OVE...
- Publication number 20240255592
- Publication date Aug 1, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Samridh Jaiswal
- G01 - MEASURING TESTING
Information Patent Application
LOW-MAGNETIC-FIELD MAGNETORESISTIVE ANGLE SENSOR
- Publication number 20240255271
- Publication date Aug 1, 2024
- Multidimension Technology Co., Ltd
- James Geza Deak
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR AND MAGNETIC DETECTION SYSTEM
- Publication number 20240248157
- Publication date Jul 25, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Takafumi TSUSHIMA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSOR WITH INCREASED SNR
- Publication number 20240241193
- Publication date Jul 18, 2024
- EVERSPIN TECHNOLOGIES, INC.
- Phillip G. MATHER
- G01 - MEASURING TESTING
Information Patent Application
REMOTE SENSOR ARRANGEMENT
- Publication number 20240241082
- Publication date Jul 18, 2024
- Endress + Hauser Wetzer GmbH + Co. KG
- Dietmar Frühauf
- G01 - MEASURING TESTING
Information Patent Application
SENSOR
- Publication number 20240241192
- Publication date Jul 18, 2024
- TDK Corporation
- Hiromichi UMEHARA
- G01 - MEASURING TESTING
Information Patent Application
SELF-CALIBRATING MAGNETORESISTANCE-BASED MAGNETIC FIELD SENSORS
- Publication number 20240230791
- Publication date Jul 11, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Hernan D. Romero
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20240230798
- Publication date Jul 11, 2024
- TDK Corporation
- Yuta Saito
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING MAGNETORESISTANCE ELEMENT USING LASER PINNI...
- Publication number 20240230792
- Publication date Jul 11, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Samridh Jaiswal
- G01 - MEASURING TESTING

using multilayer structures

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for GMR-based detection of biomarkers

Magnetic Isolator

Sensor including a plurality of insulating layers made of different...

Method of designing and manufacturing magnetic sensor

Magnetic sensor including a plurality of magnetoresistive elements...

Magnetoresistive random access memory and method for fabricating th...

Position sensor system, optical lens system and display

Redundant current sensor

Tunnel magnetoresistive effect element, magnetic memory, and built-...

Dynamic offset and amplitude tracker

Magnetoresistive memory device and method of operating same using f...

Magnetic sensor

Magnetic tunnel junction comprising an inhomogeneous granular free...

XMR sensors with serial segment strip configurations

Magnetic sensor, position detection apparatus and electronic device

Semiconductor structure and fabrication method thereof

Magnetic field detection apparatus

Magnetic tunnel junction (MTJ) element and its fabrication process

Method and apparatus for magnetic sensor producing a changing magne...

Magnetic sensor

Passive magnetic detection and discrimination for security screening

Magnetic sensor chip and magnetic sensor device

Sensor having at least part of sensor element disposed on inclined...

Magnetic sensor

Magnetoresistance effect element

Magnetoresistive device comprising a synthetic antiferromagnetic co...

Magnetoresistance effect element

Magnetic field sensor

Current sensor for compensation of on-die temperature gradient

Magnetic level gauge

Patents Applicationslast 30 patents

TUNNEL MAGNETORESISTANCE ELEMENT TO DETECT OUT-OF-PLANE CHANGES IN...

Highly Textured Buffer Layer to Grow YBiPt (110) For Spintronic App...

MAGNETIC SENSOR

MAGNETORESISTANCE ELEMENT INCLUDING A SKYRMION LAYER AND A VORTEX L...

SPIN HALL MAGNETIC SENSOR AND METHOD OF MEASURING MAGNETORESISTANCE...

MAGNETIC FIELD DETECTION APPARATUS

MAGNETIC TUNNEL JUNCTION (MTJ) ELEMENT AND ITS FABRICATION PROCESS

MAGNETIC SENSOR

MAGNETIC SENSOR

MAGNETORESISTANCE EFFECT ELEMENT

OPTICAL DETECTION DEVICE AND SIGNAL PROCESSING METHOD

INDUCING MECHANICAL STRESS IN MAGNETORESISTIVE SENSING ELEMENT TO A...

MAGNETORESISTANCE EFFECT ELEMENT

SENSOR

SPIN ORBIT TORQUE BASED THERMAL SENSOR FOR INSITU MONITORING OF MAG...

MAGNETORESISTIVE SENSOR HAVING A SHIELDING ELEMENT WITH VORTEX MAGN...

MAGNETIC SENSOR

SENSOR

MAGNETIC SENSOR DEVICE

MAGNETIC SENSOR

MAGNETORESISTANCE EFFECT ELEMENT

REDUCING ANGLE ERROR IN ANGLE SENSOR DUE TO ORTHOGONALITY DRIFT OVE...

LOW-MAGNETIC-FIELD MAGNETORESISTIVE ANGLE SENSOR

MAGNETIC SENSOR AND MAGNETIC DETECTION SYSTEM

MAGNETIC FIELD SENSOR WITH INCREASED SNR

REMOTE SENSOR ARRANGEMENT

SENSOR

SELF-CALIBRATING MAGNETORESISTANCE-BASED MAGNETIC FIELD SENSORS

MAGNETIC SENSOR

METHOD OF MANUFACTURING MAGNETORESISTANCE ELEMENT USING LASER PINNI...