using multilayer structures

Industry

CPC
G01R33/093

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R33/00Arrangements or instruments for measuring magnetic variables

Current Industry

G01R33/093using multilayer structures

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Magnetic sensor and method of manufacturing such, and magnetic dete...
- Patent number 12,306,275
- Issue date May 20, 2025
- TDK Corporation
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistive random access memory and method for fabricating th...
- Patent number 12,306,274
- Issue date May 20, 2025
- United Microelectronics Corp.
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic sensor with an elongated element
- Patent number 12,306,023
- Issue date May 20, 2025
- TDK Corporation
- G01 - MEASURING TESTING
Information Patent Grant
Fabricating an electroconductive contact on a top surface of a tunn...
- Patent number 12,310,246
- Issue date May 20, 2025
- ALLEGRO MICROSYSTEMS, LLC
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic tunnel junction devices
- Patent number 12,298,362
- Issue date May 13, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jui-Fen Chien
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods for tunnel magnetoresistance multi-turn sensor manufacture...
- Patent number 12,298,365
- Issue date May 13, 2025
- Analog Devices International Unlimited Company
- Onur Necdet Urs
- G01 - MEASURING TESTING
Information Patent Grant
Sensor having protruding surface
- Patent number 12,298,364
- Issue date May 13, 2025
- TDK Corporation
- Hiromichi Umehara
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor having magnetoresistive effect element with incline...
- Patent number 12,298,363
- Issue date May 13, 2025
- TDK Corporation
- Yuta Saito
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring an external magnetic field by at least one mag...
- Patent number 12,292,486
- Issue date May 6, 2025
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Ricardo Sousa
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistive sensor element for sensing a two-dimensional magne...
- Patent number 12,287,381
- Issue date Apr 29, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Clarisse Ducruet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Implantable medical devices, and methods of use therewith, that det...
- Patent number 12,285,617
- Issue date Apr 29, 2025
- Pacesetter, Inc.
- Xing Pei
- G01 - MEASURING TESTING
Information Patent Grant
Sensor
- Patent number 12,282,076
- Issue date Apr 22, 2025
- TDK Corporation
- Hiromichi Umehara
- G01 - MEASURING TESTING
Information Patent Grant
Sensor
- Patent number 12,282,077
- Issue date Apr 22, 2025
- TDK Corporation
- Hiromichi Umehara
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistance effect element
- Patent number 12,278,033
- Issue date Apr 15, 2025
- TDK Corporation
- Shinto Ichikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnet structure for back-biased sensors
- Patent number 12,270,869
- Issue date Apr 8, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Rémy Lassalle-Balier
- G01 - MEASURING TESTING
Information Patent Grant
Photodetection element and receiver
- Patent number 12,272,476
- Issue date Apr 8, 2025
- TDK Corporation
- Tomohito Mizuno
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetoresistive stack without radiated field, sensor and magnetic...
- Patent number 12,274,177
- Issue date Apr 8, 2025
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Claude Fermon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magneto-resistive element and magnetic sensor
- Patent number 12,265,139
- Issue date Apr 1, 2025
- Murata Manufacturing Co., Ltd.
- Masashi Kubota
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor and its manufacturing method
- Patent number 12,265,140
- Issue date Apr 1, 2025
- TDK Corporation
- Yuichiro Yamaji
- G01 - MEASURING TESTING
Information Patent Grant
Sensor and inspection device
- Patent number 12,265,141
- Issue date Apr 1, 2025
- Kabushiki Kaisha Toshiba
- Akira Kikitsu
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistive sensor and manufacturing method thereof
- Patent number 12,256,644
- Issue date Mar 18, 2025
- National Tsing Hua University
- Chih-Huang Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-calibrating magnetoresistance-based magnetic field sensors
- Patent number 12,253,576
- Issue date Mar 18, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Hernan D. Romero
- G01 - MEASURING TESTING
Information Patent Grant
Rapid magnetic biosensor
- Patent number 12,253,577
- Issue date Mar 18, 2025
- SIEMENS HEALTHINEERS NEDERLAND B.V.
- Thea Van Der Wijk
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic sensor including magnetic detection element disposed on in...
- Patent number 12,248,040
- Issue date Mar 11, 2025
- TDK Corporation
- Hidekazu Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistive sensor array for molecule detection and related de...
- Patent number 12,241,950
- Issue date Mar 4, 2025
- Western Digital Technologies, Inc.
- Patrick Braganca
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for processing analyte signals in GMR-based detec...
- Patent number 12,241,851
- Issue date Mar 4, 2025
- ZEPTO LIFE TECHNOLOGY, INC.
- Todd Michael Klein
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Sensor including at least one inclined surface
- Patent number 12,235,334
- Issue date Feb 25, 2025
- TDK Corporation
- Hiromichi Umehara
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor including magnetic detection element including bott...
- Patent number 12,235,333
- Issue date Feb 25, 2025
- TDK Corporation
- Hidekazu Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Sensor with magnetic layers and inspection device
- Patent number 12,228,622
- Issue date Feb 18, 2025
- Kabushiki Kaisha Toshiba
- Akira Kikitsu
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor device
- Patent number 12,228,621
- Issue date Feb 18, 2025
- TDK Corporation
- Kenkichi Anagawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MAGNETIC SENSOR
- Publication number 20250155531
- Publication date May 15, 2025
- TDK Corporation
- Hidekazu KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
SENSOR
- Publication number 20250155530
- Publication date May 15, 2025
- TDK Corporation
- Hiromichi UMEHARA
- G01 - MEASURING TESTING
Information Patent Application
PAD OVER ACTIVE SENSOR CELLS INTEGRATED IN A CHIP PACKAGE
- Publication number 20250160219
- Publication date May 15, 2025
- INFINEON TECHNOLOGIES AG
- Walter HARTNER
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR, MAGNETIC ENCODER, LENS POSITION DETECTION DEVICE,...
- Publication number 20250155529
- Publication date May 15, 2025
- TDK Corporation
- Tsuyoshi UMEHARA
- G01 - MEASURING TESTING
Information Patent Application
MANAGING POWER STATES OF AN INFORMATION HANDLING SYSTEM
- Publication number 20250155952
- Publication date May 15, 2025
- Dell Products L.P.
- Cheng-Hung Yang
- G01 - MEASURING TESTING
Information Patent Application
MAGNETORESISTIVE SENSOR
- Publication number 20250147129
- Publication date May 8, 2025
- INFINEON TECHNOLOGIES AG
- Bernhard ENDRES
- G01 - MEASURING TESTING
Information Patent Application
SWITCH AND ELECTRONIC DEVICE
- Publication number 20250140497
- Publication date May 1, 2025
- GUANGDONG OPPO MOBILE TELECOMMUNICATIONS CORP., LTD.
- Weiwei PI
- G01 - MEASURING TESTING
Information Patent Application
SENSOR ELEMENT AND MANUFACTURING METHOD THEREFOR
- Publication number 20250138113
- Publication date May 1, 2025
- TDK Corporation
- Koji KUROKI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MAGNETIC FIELD DETECTION APPARATUS
- Publication number 20250123341
- Publication date Apr 17, 2025
- TDK Corporation
- Keisuke TAKASUGI
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE AND A METHOD FOR TESTING A MAGNETORESISTIVE SENSOR
- Publication number 20250116745
- Publication date Apr 10, 2025
- INFINEON TECHNOLOGIES AG
- Wolfgang RABERG
- G01 - MEASURING TESTING
Information Patent Application
Sensing Arrangements for Camera Modules
- Publication number 20250102367
- Publication date Mar 27, 2025
- Apple Inc.
- Himesh Patel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MAGNETIC SENSOR
- Publication number 20250093434
- Publication date Mar 20, 2025
- TDK Corporation
- Hirokazu TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSOR CIRCUIT AND MAGNETIC FIELD MEASUREMENT METHOD
- Publication number 20250085361
- Publication date Mar 13, 2025
- INFINEON TECHNOLOGIES AG
- Christoph KRALL
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20250085364
- Publication date Mar 13, 2025
- TDK Corporation
- Toshihide SUTO
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR DEVICE
- Publication number 20250085362
- Publication date Mar 13, 2025
- TDK Corporation
- Norikazu OTA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR DETECTING A MAGNETIC FIELD USING THE SPIN ORB...
- Publication number 20250076419
- Publication date Mar 6, 2025
- INFINEON TECHNOLOGIES AG
- Dieter SUESS
- G11 - INFORMATION STORAGE
Information Patent Application
SENSOR
- Publication number 20250060428
- Publication date Feb 20, 2025
- TDK Corporation
- Keisuke TAKASUGI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20250044383
- Publication date Feb 6, 2025
- TDK Corporation
- Tetsuya HIRAKI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20250035718
- Publication date Jan 30, 2025
- UNITED MICROELECTRONICS CORP.
- Hui-Lin Wang
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETIC MULTILAYERED STACK BASED ADFMR SENSORS WITH ENHANCED SENSI...
- Publication number 20250020741
- Publication date Jan 16, 2025
- Sonera, Inc.
- Kumar SRINIVASAN
- G01 - MEASURING TESTING
Information Patent Application
Passive Magnetic Detection and Discrimination for Security Screening
- Publication number 20250004158
- Publication date Jan 2, 2025
- Xtract One Technologies Inc.
- Yongming ZHANG
- G01 - MEASURING TESTING
Information Patent Application
TUNNEL MAGNETORESISTANCE ELEMENT TO DETECT OUT-OF-PLANE CHANGES IN...
- Publication number 20240418805
- Publication date Dec 19, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Paolo Campiglio
- G01 - MEASURING TESTING
Information Patent Application
Highly Textured Buffer Layer to Grow YBiPt (110) For Spintronic App...
- Publication number 20240420733
- Publication date Dec 19, 2024
- Western Digital Technologies, Inc.
- Quang LE
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETORESISTANCE ELEMENT INCLUDING A SKYRMION LAYER AND A VORTEX L...
- Publication number 20240420878
- Publication date Dec 19, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Samridh JAISWAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC SENSOR
- Publication number 20240418804
- Publication date Dec 19, 2024
- TDK Corporation
- Kazuya WATANABE
- G11 - INFORMATION STORAGE
Information Patent Application
SPIN HALL MAGNETIC SENSOR AND METHOD OF MEASURING MAGNETORESISTANCE...
- Publication number 20240393413
- Publication date Nov 28, 2024
- Hyundai Motor Company
- Joon-Hyun Kwon
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD DETECTION APPARATUS
- Publication number 20240369651
- Publication date Nov 7, 2024
- TDK Corporation
- Keisuke TAKASUGI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC TUNNEL JUNCTION (MTJ) ELEMENT AND ITS FABRICATION PROCESS
- Publication number 20240365676
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- YA-LING LEE
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETIC SENSOR
- Publication number 20240361404
- Publication date Oct 31, 2024
- TDK Corporation
- Kazuya WATANABE
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20240345188
- Publication date Oct 17, 2024
- TDK Corporation
- Hidekazu KOJIMA
- G01 - MEASURING TESTING

using multilayer structures

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Magnetic sensor and method of manufacturing such, and magnetic dete...

Magnetoresistive random access memory and method for fabricating th...

Magnetic sensor with an elongated element

Fabricating an electroconductive contact on a top surface of a tunn...

Magnetic tunnel junction devices

Methods for tunnel magnetoresistance multi-turn sensor manufacture...

Sensor having protruding surface

Magnetic sensor having magnetoresistive effect element with incline...

Method for measuring an external magnetic field by at least one mag...

Magnetoresistive sensor element for sensing a two-dimensional magne...

Implantable medical devices, and methods of use therewith, that det...

Sensor

Sensor

Magnetoresistance effect element

Magnet structure for back-biased sensors

Photodetection element and receiver

Magnetoresistive stack without radiated field, sensor and magnetic...

Magneto-resistive element and magnetic sensor

Magnetic sensor and its manufacturing method

Sensor and inspection device

Magnetoresistive sensor and manufacturing method thereof

Self-calibrating magnetoresistance-based magnetic field sensors

Rapid magnetic biosensor

Magnetic sensor including magnetic detection element disposed on in...

Magnetoresistive sensor array for molecule detection and related de...

System and method for processing analyte signals in GMR-based detec...

Sensor including at least one inclined surface

Magnetic sensor including magnetic detection element including bott...

Sensor with magnetic layers and inspection device

Magnetic sensor device

Patents Applicationslast 30 patents

MAGNETIC SENSOR

SENSOR

PAD OVER ACTIVE SENSOR CELLS INTEGRATED IN A CHIP PACKAGE

MAGNETIC SENSOR, MAGNETIC ENCODER, LENS POSITION DETECTION DEVICE,...

MANAGING POWER STATES OF AN INFORMATION HANDLING SYSTEM

MAGNETORESISTIVE SENSOR

SWITCH AND ELECTRONIC DEVICE

SENSOR ELEMENT AND MANUFACTURING METHOD THEREFOR

MAGNETIC FIELD DETECTION APPARATUS

SUBSTRATE AND A METHOD FOR TESTING A MAGNETORESISTIVE SENSOR

Sensing Arrangements for Camera Modules

MAGNETIC SENSOR

MAGNETIC FIELD SENSOR CIRCUIT AND MAGNETIC FIELD MEASUREMENT METHOD

MAGNETIC SENSOR

MAGNETIC SENSOR DEVICE

DEVICE AND METHOD FOR DETECTING A MAGNETIC FIELD USING THE SPIN ORB...

SENSOR

MAGNETIC SENSOR

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

MAGNETIC MULTILAYERED STACK BASED ADFMR SENSORS WITH ENHANCED SENSI...

Passive Magnetic Detection and Discrimination for Security Screening

TUNNEL MAGNETORESISTANCE ELEMENT TO DETECT OUT-OF-PLANE CHANGES IN...

Highly Textured Buffer Layer to Grow YBiPt (110) For Spintronic App...

MAGNETORESISTANCE ELEMENT INCLUDING A SKYRMION LAYER AND A VORTEX L...

MAGNETIC SENSOR

SPIN HALL MAGNETIC SENSOR AND METHOD OF MEASURING MAGNETORESISTANCE...

MAGNETIC FIELD DETECTION APPARATUS

MAGNETIC TUNNEL JUNCTION (MTJ) ELEMENT AND ITS FABRICATION PROCESS

MAGNETIC SENSOR

MAGNETIC SENSOR