using photoelectric detection means

Industry

CPC
G01B11/272

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/272using photoelectric detection means

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Method and system of operating overlay measuring
- Patent number 12,242,246
- Issue date Mar 4, 2025
- NANYA TECHNOLOGY CORPORATION
- Chien-Hsien Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning overlay metrology with high signal to noise ratio
- Patent number 12,235,588
- Issue date Feb 25, 2025
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Vehicle component with image sensor aimed at fiducial marker
- Patent number 12,196,891
- Issue date Jan 14, 2025
- Continental Autonomous Mobility US, LLC
- Luis Alfredo Villalobos-Martinez
- B60 - VEHICLES IN GENERAL
Information Patent Grant
System and method for capturing tire sidewall data from a moving ve...
- Patent number 12,188,845
- Issue date Jan 7, 2025
- Hunter Engineering Company
- David A. Voeller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Photo-alignment device and photo-alignment method
- Patent number 12,189,148
- Issue date Jan 7, 2025
- WUHAN BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Xiaofeng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for positioning center of V-type notch of wafer,...
- Patent number 12,183,616
- Issue date Dec 31, 2024
- XI'AN ESWIN MATERIAL TECHNOLOGY CO., LTD.
- Leilei Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser device and laser beam detector for detecting light of a laser...
- Patent number 12,174,019
- Issue date Dec 24, 2024
- Spectra Precision (Kaiserslautern) GmbH
- Lars Schumacher
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining three-dimensional shape of object
- Patent number 12,146,734
- Issue date Nov 19, 2024
- Koh Young Technology Inc.
- Chan Kwon Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement apparatus that measures position information of measure...
- Patent number 12,148,181
- Issue date Nov 19, 2024
- Canon Kabushiki Kaisha
- Satoru Jimbo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for use in wafer processing
- Patent number 12,148,640
- Issue date Nov 19, 2024
- Infineon Technologies AG
- Thomas Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tool and method for measuring parallelism and coaxiality of rotatin...
- Patent number 12,140,418
- Issue date Nov 12, 2024
- CHINA AUTOMOTIVE TECHNOLOGY AND RESEARCH CENTER CO., LTD
- Yongqiang Wu
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method for centering an optical element in an optical system for an...
- Patent number 12,135,436
- Issue date Nov 5, 2024
- Olympus Winter & IBE GmbH
- Uwe Schoeler
- G02 - OPTICS
Information Patent Grant
Apparatus and method for determining three-dimensional shape of object
- Patent number 12,135,204
- Issue date Nov 5, 2024
- Koh Young Technology Inc.
- Chan Kwon Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Support structure for vehicle ADAS calibration and wheel alignment...
- Patent number 12,123,707
- Issue date Oct 22, 2024
- Hunter Engineering Company
- Brian M. Cejka
- G01 - MEASURING TESTING
Information Patent Grant
Combiner alignment detector
- Patent number 12,123,705
- Issue date Oct 22, 2024
- Rockwell Collins, Inc.
- Eric P. Stratton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical metrology utilizing short-wave infrared wavelengths
- Patent number 12,111,580
- Issue date Oct 8, 2024
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for aligning substrates
- Patent number 12,106,993
- Issue date Oct 1, 2024
- EV Group E. Thallner GmbH
- Jozsef Krol
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device feature specific edge placement error (EPE)
- Patent number 12,092,966
- Issue date Sep 17, 2024
- KLA Corporation
- Amnon Manassen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Laser-based levelling system
- Patent number 12,078,483
- Issue date Sep 3, 2024
- Leica Geosystems AG
- Markus Hammerer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measurement apparatus, measurement method, lithography apparatus an...
- Patent number 12,072,175
- Issue date Aug 27, 2024
- Canon Kabushiki Kaisha
- Wataru Yamaguchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Position monitoring of a gasket between tunnel segments
- Patent number 12,066,103
- Issue date Aug 20, 2024
- FNV IP B.V.
- Arnoud Marc Jongsma
- G01 - MEASURING TESTING
Information Patent Grant
Optical-based validation of parallelism between internal facets
- Patent number 12,061,080
- Issue date Aug 13, 2024
- LUMUS LTD.
- Jonathan Gelberg
- G01 - MEASURING TESTING
Information Patent Grant
Detection method, detection apparatus, lithography apparatus, and a...
- Patent number 12,061,079
- Issue date Aug 13, 2024
- Canon Kabushiki Kaisha
- Masaharu Kajitani
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for validating parallelism between internal facets
- Patent number 12,055,385
- Issue date Aug 6, 2024
- LUMUS LTD.
- Jonathan Gelberg
- G01 - MEASURING TESTING
Information Patent Grant
Positional error compensation in assembly of discrete components by...
- Patent number 12,046,504
- Issue date Jul 23, 2024
- KULICKE & SOFFA NETHERLANDS B.V.
- Matthew R. Semler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging overlay with mutually coherent oblique illumination
- Patent number 12,032,300
- Issue date Jul 9, 2024
- KLA Corporation
- Andrew V. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Illuminated vehicle sensor calibration target
- Patent number 12,031,849
- Issue date Jul 9, 2024
- GM CRUISE HOLDINGS LLC
- Zhi Yuan Sherwin Lau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining the orientation of at least one object and method for r...
- Patent number 12,018,932
- Issue date Jun 25, 2024
- SMS group GMBH
- Martin Friedrich
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Vehicles with automatic headlight alignment
- Patent number 12,017,577
- Issue date Jun 25, 2024
- Apple Inc.
- Christopher P Child
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,013,349
- Issue date Jun 18, 2024
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Manufacturing Tool Alignment Device And Method
- Publication number 20250096025
- Publication date Mar 20, 2025
- DIODES INCORPORATED
- Bartosz Kielban
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAMERA MONITOR SYSTEM UTILIZING TRAILER ANGLE DETECTION BASED UPON...
- Publication number 20250083602
- Publication date Mar 13, 2025
- Stoneridge, Inc.
- Liang Ma
- B60 - VEHICLES IN GENERAL
Information Patent Application
MEASURING PARALLELISM
- Publication number 20250052559
- Publication date Feb 13, 2025
- Samsung Electronics Co., Ltd.
- Minhwan Seo
- G01 - MEASURING TESTING
Information Patent Application
GOLF LAUNCH MONITOR AND TARGET ALIGNMENT METHOD OF GOLF LAUNCH MONITOR
- Publication number 20250044080
- Publication date Feb 6, 2025
- VIEWORKS CO., LTD.
- Joonggeun KIM
- G01 - MEASURING TESTING
Information Patent Application
Manufacturing Method of Electrode Assembly
- Publication number 20250046892
- Publication date Feb 6, 2025
- LG ENERGY SOLUTION, LTD.
- Tai Joon Seo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT APPARATUS THAT MEASURES POSITION INFORMATION OF MEASURE...
- Publication number 20250029276
- Publication date Jan 23, 2025
- Canon Kabushiki Kaisha
- Satoru JIMBO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT
- Publication number 20250027766
- Publication date Jan 23, 2025
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APERTURE AND METHOD
- Publication number 20250031294
- Publication date Jan 23, 2025
- ASML NETHERLANDS B.V.
- Roger Anton Marie TIMMERMANS
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT
- Publication number 20250012565
- Publication date Jan 9, 2025
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MISALIGNMENT MEASUREMENT SYSTEM, WELDED STEEL PIPE MANUFACTURING FA...
- Publication number 20250014171
- Publication date Jan 9, 2025
- JFE STEEL CORPORATION
- Yusuke TSUKAMOTO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
TOOL CENTER POINT CALIBRATION DEVICE AND METHOD
- Publication number 20240401933
- Publication date Dec 5, 2024
- CAPTRON Electronic GmbH
- Roland Aubauer
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
FOCUS OPTIMIZATION FOR WAFER WHICH HAS MULTI-PEAK FOCUS
- Publication number 20240377190
- Publication date Nov 14, 2024
- Samsung Electronics Co., Ltd.
- Jun Yeob KIM
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL-BASED VALIDATION OF PARALLELISM BETWEEN INTERNAL FACETS
- Publication number 20240369353
- Publication date Nov 7, 2024
- LUMUS LTD.
- Jonathan GELBERG
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD, LITHOGRAPHY APPARATUS AN...
- Publication number 20240369347
- Publication date Nov 7, 2024
- Canon Kabushiki Kaisha
- Wataru Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
SHAFT ALIGNMENT SYSTEM INCLUDING A MEASURING UNIT EMITTING A LASER...
- Publication number 20240344825
- Publication date Oct 17, 2024
- Aktiebolaget SKF
- Sylvain Georges Henri HUMBERT
- G01 - MEASURING TESTING
Information Patent Application
STANDARD-LIGHT GENERATOR FOR STRAIGHTNESS MEASUREMENT, METHOD OF PR...
- Publication number 20240337856
- Publication date Oct 10, 2024
- ADTEC ENGINEERING CO., LTD.
- Yoneta TANAKA
- G01 - MEASURING TESTING
Information Patent Application
IMAGING OVERLAY WITH MUTUALLY COHERENT OBLIQUE ILLUMINATION
- Publication number 20240329543
- Publication date Oct 3, 2024
- KLA Corporation
- Andrew V. Hill
- G01 - MEASURING TESTING
Information Patent Application
Automatic Light Alignment
- Publication number 20240317132
- Publication date Sep 26, 2024
- Apple Inc.
- Christopher P. Child
- B60 - VEHICLES IN GENERAL
Information Patent Application
OPTICAL ELEMENT FOR USE IN METROLOGY SYSTEMS
- Publication number 20240302164
- Publication date Sep 12, 2024
- ASML NETHERLANDS B.V.
- Tzu-Yi YANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240302292
- Publication date Sep 12, 2024
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
OVERLAY MEASUREMENT APPARATUS AND OVERLAY MEASUREMENT METHOD
- Publication number 20240296547
- Publication date Sep 5, 2024
- AUROS Technology, Inc.
- Ji Hoon KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING OVERLAY METROLOGY WITH HIGH SIGNAL TO NOISE RATIO
- Publication number 20240280914
- Publication date Aug 22, 2024
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
INTENSITY IMBALANCE CALIBRATION ON AN OVERFILLED BIDIRECTIONAL MARK
- Publication number 20240263941
- Publication date Aug 8, 2024
- ASML NETHERLANDS B.V.
- Rui CHENG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND SYSTEMS FOR VALIDATING PARALLELISM BETWEEN INTERNAL FACETS
- Publication number 20240263940
- Publication date Aug 8, 2024
- LUMUS LTD.
- Jonathan GELBERG
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Positioning Center of V-Type Notch of Wafer,...
- Publication number 20240266198
- Publication date Aug 8, 2024
- Xi'an ESWIN Material Technology Co., Ltd.
- Leilei WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL-BASED VALIDATION OF PARALLELISM BETWEEN INTERNAL FACETS
- Publication number 20240255281
- Publication date Aug 1, 2024
- LUMUS LTD.
- Jonathan GELBERG
- G01 - MEASURING TESTING
Information Patent Application
Alignment of Rotational Shafts
- Publication number 20240230322
- Publication date Jul 11, 2024
- Shoreline Alignment & Vibration, LLC
- Deron Jozokos
- F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information Patent Application
OBJECT ANGLE DETECTION
- Publication number 20240202970
- Publication date Jun 20, 2024
- FORD GLOBAL TECHNOLOGIES, L.L.C.
- Kunle Olutomilayo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ASYMMETRY EXTENDED GRID MODEL FOR WAFER ALIGNMENT
- Publication number 20240168397
- Publication date May 23, 2024
- ASML NETHERLANDS B.V.
- Joshua ADAMS
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FEATURE SPECIFIC EDGE PLACEMENT ERROR (EPE)
- Publication number 20240168391
- Publication date May 23, 2024
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING

using photoelectric detection means

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and system of operating overlay measuring

Scanning overlay metrology with high signal to noise ratio

Vehicle component with image sensor aimed at fiducial marker

System and method for capturing tire sidewall data from a moving ve...

Photo-alignment device and photo-alignment method

Method and system for positioning center of V-type notch of wafer,...

Laser device and laser beam detector for detecting light of a laser...

Apparatus and method for determining three-dimensional shape of object

Measurement apparatus that measures position information of measure...

Method and apparatus for use in wafer processing

Tool and method for measuring parallelism and coaxiality of rotatin...

Method for centering an optical element in an optical system for an...

Apparatus and method for determining three-dimensional shape of object

Support structure for vehicle ADAS calibration and wheel alignment...

Combiner alignment detector

Optical metrology utilizing short-wave infrared wavelengths

Method and device for aligning substrates

Device feature specific edge placement error (EPE)

Laser-based levelling system

Measurement apparatus, measurement method, lithography apparatus an...

Position monitoring of a gasket between tunnel segments

Optical-based validation of parallelism between internal facets

Detection method, detection apparatus, lithography apparatus, and a...

Methods and systems for validating parallelism between internal facets

Positional error compensation in assembly of discrete components by...

Imaging overlay with mutually coherent oblique illumination

Illuminated vehicle sensor calibration target

Determining the orientation of at least one object and method for r...

Vehicles with automatic headlight alignment

Inspection apparatus and inspection method

Patents Applicationslast 30 patents

Semiconductor Manufacturing Tool Alignment Device And Method

CAMERA MONITOR SYSTEM UTILIZING TRAILER ANGLE DETECTION BASED UPON...

MEASURING PARALLELISM

GOLF LAUNCH MONITOR AND TARGET ALIGNMENT METHOD OF GOLF LAUNCH MONITOR

Manufacturing Method of Electrode Assembly

MEASUREMENT APPARATUS THAT MEASURES POSITION INFORMATION OF MEASURE...

APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT

APERTURE AND METHOD

APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT

MISALIGNMENT MEASUREMENT SYSTEM, WELDED STEEL PIPE MANUFACTURING FA...

TOOL CENTER POINT CALIBRATION DEVICE AND METHOD

FOCUS OPTIMIZATION FOR WAFER WHICH HAS MULTI-PEAK FOCUS

OPTICAL-BASED VALIDATION OF PARALLELISM BETWEEN INTERNAL FACETS

MEASUREMENT APPARATUS, MEASUREMENT METHOD, LITHOGRAPHY APPARATUS AN...

SHAFT ALIGNMENT SYSTEM INCLUDING A MEASURING UNIT EMITTING A LASER...

STANDARD-LIGHT GENERATOR FOR STRAIGHTNESS MEASUREMENT, METHOD OF PR...

IMAGING OVERLAY WITH MUTUALLY COHERENT OBLIQUE ILLUMINATION

Automatic Light Alignment

OPTICAL ELEMENT FOR USE IN METROLOGY SYSTEMS

INSPECTION APPARATUS AND INSPECTION METHOD

OVERLAY MEASUREMENT APPARATUS AND OVERLAY MEASUREMENT METHOD

SCANNING OVERLAY METROLOGY WITH HIGH SIGNAL TO NOISE RATIO

INTENSITY IMBALANCE CALIBRATION ON AN OVERFILLED BIDIRECTIONAL MARK

METHODS AND SYSTEMS FOR VALIDATING PARALLELISM BETWEEN INTERNAL FACETS

Method and System for Positioning Center of V-Type Notch of Wafer,...

OPTICAL-BASED VALIDATION OF PARALLELISM BETWEEN INTERNAL FACETS

Alignment of Rotational Shafts

OBJECT ANGLE DETECTION

ASYMMETRY EXTENDED GRID MODEL FOR WAFER ALIGNMENT

DEVICE FEATURE SPECIFIC EDGE PLACEMENT ERROR (EPE)