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using photoelectric detection means
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G01B11/272
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B11/00
Measuring arrangements characterised by the use of optical means
Current Industry
G01B11/272
using photoelectric detection means
Industries
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method for determining a center of a radiation spot, sensor and sta...
Patent number
11,982,948
Issue date
May 14, 2024
ASML Netherlands B.V.
Mihaita Popinciuc
G01 - MEASURING TESTING
Information
Patent Grant
Target installation apparatus and target installation method using...
Patent number
11,976,919
Issue date
May 7, 2024
Honda Motor Co., Ltd.
Eiji Ohmori
G01 - MEASURING TESTING
Information
Patent Grant
Laser level alignment tool
Patent number
11,971,255
Issue date
Apr 30, 2024
Milwaukee Electric Tool Corporation
Benjamin T. Jones
G01 - MEASURING TESTING
Information
Patent Grant
Optical parallelism system for extended reality metrology
Patent number
11,971,249
Issue date
Apr 30, 2024
MLOptic Corp.
Pengfei Wu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical parallelism system for extended reality metrology
Patent number
11,971,555
Issue date
Apr 30, 2024
MLOptic Corp.
Pengfei Wu
G01 - MEASURING TESTING
Information
Patent Grant
Wavelength-tunable fiber optic light source and overlay measurement...
Patent number
11,971,248
Issue date
Apr 30, 2024
AUROS TECHNOLOGY, INC.
Hyeon Gi Shin
G01 - MEASURING TESTING
Information
Patent Grant
Reducing device overlay errors
Patent number
11,971,664
Issue date
Apr 30, 2024
KLA-Tencor Corporation
Liran Yerushalmi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Lithographic apparatus, metrology systems, phased array illuminatio...
Patent number
11,966,169
Issue date
Apr 23, 2024
ASML Holding N.V.
Mohamed Swillam
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wafer detection device and wafer detection method using the same
Patent number
11,961,749
Issue date
Apr 16, 2024
HANGZHOU SIZONE ELECTRONIC TECHNOLOGY INC.
Ming Zhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Estimating core-cladding concentricity error in optical fibers usin...
Patent number
11,933,605
Issue date
Mar 19, 2024
NEC Corporation
Fatih Yaman
G01 - MEASURING TESTING
Information
Patent Grant
Combiner alignment detector
Patent number
11,920,922
Issue date
Mar 5, 2024
Rockwell Collins, Inc.
Eric P. Stratton
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Measurement system, substrate processing system, and device manufac...
Patent number
11,915,961
Issue date
Feb 27, 2024
Nikon Corporation
Go Ichinose
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Measurement apparatus
Patent number
11,874,103
Issue date
Jan 16, 2024
ASML Netherlands B.V.
Franciscus Godefridus Casper Bijnen
G01 - MEASURING TESTING
Information
Patent Grant
Thick photo resist layer metrology target
Patent number
11,874,102
Issue date
Jan 16, 2024
KLA Corporation
Lingyi Guo
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Apparatus for transferring optical instrument
Patent number
11,874,104
Issue date
Jan 16, 2024
AUROS TECHNOLOGY, INC.
Dea Kyung Won
G01 - MEASURING TESTING
Information
Patent Grant
Multiplexing control of multiple positional sensors in device manuf...
Patent number
11,862,499
Issue date
Jan 2, 2024
Applied Materials, Inc.
Kiyki-Shiy Shang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Head-mounted electronic device with alignment sensors
Patent number
11,860,439
Issue date
Jan 2, 2024
Apple Inc.
Muhammad F. Hossain
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Tester and method for calibrating probe card and device under testi...
Patent number
11,852,657
Issue date
Dec 26, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC.
You-Hsien Lin
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for metrology with layer-specific illumination...
Patent number
11,852,590
Issue date
Dec 26, 2023
KLA Corporation
Amnon Manassen
G01 - MEASURING TESTING
Information
Patent Grant
Chromatic confocal sensor with imaging capability for 6-axis spatia...
Patent number
11,852,464
Issue date
Dec 26, 2023
MLOptic Corp.
Wei Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Reverse driving assistance system
Patent number
11,851,102
Issue date
Dec 26, 2023
Bayerische Motoren Werke Aktiengesellschaft
Michael Stroebel
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Moiré scatterometry overlay
Patent number
11,841,621
Issue date
Dec 12, 2023
KLA Corporation CA
Andrew V. Hill
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
WFOV backward-propagating active-to-passive autoalignment system
Patent number
11,841,217
Issue date
Dec 12, 2023
Raytheon Company
Lacy G. Cook
G01 - MEASURING TESTING
Information
Patent Grant
Multifunctional unit for the analysis and calibration of devices an...
Patent number
11,837,035
Issue date
Dec 5, 2023
Texa S.P.A.
Manuele Cavalli
G07 - CHECKING-DEVICES
Information
Patent Grant
Using a two-dimensional scanner to speed registration of three-dime...
Patent number
11,815,600
Issue date
Nov 14, 2023
Faro Technologies, Inc.
Oliver Zweigle
G05 - CONTROLLING REGULATING
Information
Patent Grant
Optical near-field metrology
Patent number
11,815,347
Issue date
Nov 14, 2023
KLA-Tencor Corporation
Yuri Paskover
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Template, workpiece, and alignment method
Patent number
11,815,348
Issue date
Nov 14, 2023
Kioxia Corporation
Takashi Sato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ultra-compact, modular laser sensor for tactical environments
Patent number
11,788,822
Issue date
Oct 17, 2023
Raytheon Company
Jason R. Lavine
F41 - WEAPONS
Information
Patent Grant
Machine learning for metrology measurements
Patent number
11,783,466
Issue date
Oct 10, 2023
KLA Corporation
Boaz Ophir
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Alignment inspection apparatus for electrode assembly and alignment...
Patent number
11,781,859
Issue date
Oct 10, 2023
LG ENERGY SOLUTION, LTD.
Tai Jin Jung
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
COMBINER ALIGNMENT DETECTOR
Publication number
20240159523
Publication date
May 16, 2024
Rockwell Collins, Inc.
Eric P. Stratton
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ACTIVE PIEZO STABILIZATION OF AN ION TRAP
Publication number
20240159524
Publication date
May 16, 2024
IonQ, Inc.
Kai Makoto HUDEK
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASUREMENT APPARATUS
Publication number
20240151520
Publication date
May 9, 2024
ASML NETHERLANDS B.V.
Franciscus Godefridus Casper BIJNEN
G01 - MEASURING TESTING
Information
Patent Application
IMAGE ACQUISITION METHOD AND DEVICE
Publication number
20240155211
Publication date
May 9, 2024
AUROS TECHNOLOGY, INC.
Seung Soo LEE
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SYSTEM FOR AUTOMATED SURVEYING OF MOTOR VEHICLES
Publication number
20240151512
Publication date
May 9, 2024
TKR SPEZIALWERKZEUGE GMBH
Torsten Kreischer
B60 - VEHICLES IN GENERAL
Information
Patent Application
INTEGRATED OPTICAL SENSOR CONTROLLER FOR DEVICEMANUFACTURING MACHINES
Publication number
20240128114
Publication date
Apr 18, 2024
Applied Materials, Inc.
Kiyki-Shiy Shang
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
APPARATUS AND METHOD FOR COAXIALLY ALIGNING TWO ROTATABLE SHAFTS
Publication number
20240093986
Publication date
Mar 21, 2024
REDALIGN LLC
Fred L. STRUNK
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
SYSTEMS AND METHODS FOR MEASURING INTENSITY IN A LITHOGRAPHIC ALIGN...
Publication number
20240077308
Publication date
Mar 7, 2024
ASML Holding N.V.
Mohamed SWILLAM
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Head-Mounted Electronic Device With Alignment Sensors
Publication number
20240077695
Publication date
Mar 7, 2024
Apple Inc.
Muhammad F. Hossain
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MULTI-PITCH GRID OVERLAY TARGET FOR SCANNING OVERLAY METROLOGY
Publication number
20240068804
Publication date
Feb 29, 2024
KLA Corporation
Yuval Lubashevsky
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETECTION DEVICE AND DETECTION METHOD
Publication number
20240068805
Publication date
Feb 29, 2024
LAPIS SEMICONDUCTOR CO., LTD.
ARATA NAGANUMA
G01 - MEASURING TESTING
Information
Patent Application
DETECTION OF A POSITION OF A WAFER WITHIN A TRANSFER ROBOT VACUUM C...
Publication number
20240063038
Publication date
Feb 22, 2024
Tower Semiconductor Ltd.
Slava Superfine
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METROLOGY TARGET FOR ONE-DIMENSIONAL MEASUREMENT OF PERIODIC MISREG...
Publication number
20240035812
Publication date
Feb 1, 2024
KLA Corporation
Yoel Feler
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR IMAGING NONSTATIONARY OBJECT
Publication number
20240004313
Publication date
Jan 4, 2024
ASML NETHERLANDS B.V.
Coen Adrianus VERSCHUREN
G02 - OPTICS
Information
Patent Application
VEHICLE COMPONENT WITH IMAGE SENSOR AIMED AT FIDUCIAL MARKER
Publication number
20230408659
Publication date
Dec 21, 2023
Continental Autonomous Mobility US, LLC
Luis Alfredo Villalobos-Martinez
B60 - VEHICLES IN GENERAL
Information
Patent Application
SYSTEMS AND METHODS FOR ALIGNING AND LOCALIZING A TOOL
Publication number
20230390933
Publication date
Dec 7, 2023
Oliver Crispin Robotics Limited
Todd William Danko
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
APPARATUS FOR TRANSFERRING OPTICAL INSTRUMENT
Publication number
20230392926
Publication date
Dec 7, 2023
AUROS TECHNOLOGY, INC.
Dea Kyung WON
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ASSEMBLY FOR PARALLELISM MEASUREMENT, OPTICAL APPARATUS INC...
Publication number
20230392925
Publication date
Dec 7, 2023
Samsung Electronics Co., Ltd.
Jiyoung Chu
G01 - MEASURING TESTING
Information
Patent Application
HIGH PRECISION PHOTONIC ALIGNMENT DEVICE
Publication number
20230375336
Publication date
Nov 23, 2023
Quantinuum LLC
Christopher Ertsgaard
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
DETECTION DEVICE, SYSTEM AND METHOD FOR DETERMINATION OF INCIDENCE...
Publication number
20230375337
Publication date
Nov 23, 2023
Valstybinis Moksliniu Tyrimu Institutas Fiziniu Ir Technologijos Mokslu Centras
Julijanas ZELUDEVICIUS
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR ISOLATION OF SPECIFIC FOURIER PUPIL FREQUENCY...
Publication number
20230314344
Publication date
Oct 5, 2023
Yuri Paskover
G01 - MEASURING TESTING
Information
Patent Application
SCANNING SCATTEROMETRY OVERLAY METROLOGY
Publication number
20230314319
Publication date
Oct 5, 2023
Amnon Manassen
G01 - MEASURING TESTING
Information
Patent Application
HETERODYNING OPTICAL PHASE MEASURING DEVICE FOR DIFFRACTION BASED O...
Publication number
20230296374
Publication date
Sep 21, 2023
ALLAGI INC.
Michael J. Darwin
G01 - MEASURING TESTING
Information
Patent Application
PACKAGE IMAGING FOR DIE LOCATION CORRECTION IN DIGITAL LITHOGRAPHY
Publication number
20230288822
Publication date
Sep 14, 2023
Applied Materials, Inc.
Ulrich Mueller
G01 - MEASURING TESTING
Information
Patent Application
Support Structure for Vehicle ADAS Calibration and Wheel Alignment...
Publication number
20230280155
Publication date
Sep 7, 2023
HUNTER ENGINEERING COMPANY
Brian M. Cejka
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM OF OPERATING OVERLAY MEASURING
Publication number
20230273590
Publication date
Aug 31, 2023
NANYA TECHNOLOGY CORPORATION
CHIEN-HSIEN LIU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DETECTION METHOD, DETECTION APPARATUS, LITHOGRAPHY APPARATUS, AND A...
Publication number
20230273016
Publication date
Aug 31, 2023
Canon Kabushiki Kaisha
MASAHARU KAJITANI
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD, LITHOGRAPHY APPARATUS AN...
Publication number
20230273011
Publication date
Aug 31, 2023
Canon Kabushiki Kaisha
Wataru Yamaguchi
G02 - OPTICS
Information
Patent Application
IMAGING OVERLAY WITH MUTUALLY COHERENT OBLIQUE ILLUMINATION
Publication number
20230259040
Publication date
Aug 17, 2023
Andrew V. Hill
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
PARALLAX METHOD FOR A SINGLE-CELL DIFFRACTION BASED MEASUREMENT OF...
Publication number
20230259041
Publication date
Aug 17, 2023
KLA Corporation
Mordechy Kot
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY