Using polarization in the interferometer

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G01B2290/70

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02

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G01B2290/70Using polarization in the interferometer

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Patents Grantslast 30 patents

Information Patent Grant
Compact dual pass interferometer for a plane mirror interferometer
- Patent number 12,270,644
- Issue date Apr 8, 2025
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G02 - OPTICS
Information Patent Grant
Distance measurement device and method based on secondary mixing of...
- Patent number 12,259,240
- Issue date Mar 25, 2025
- Harbin Institute of Technology
- Ruitao Yang
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measurement device
- Patent number 12,259,230
- Issue date Mar 25, 2025
- CKD Corporation
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Grant
Bidirectional Littrow two-degree-of-freedom grating interference me...
- Patent number 12,241,739
- Issue date Mar 4, 2025
- Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of...
- Wenhao Li
- G01 - MEASURING TESTING
Information Patent Grant
Polarizing Fizeau interferometer
- Patent number 12,228,400
- Issue date Feb 18, 2025
- Mitutoyo Corporation
- Shimpei Matsuura
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne light source for use in metrology system
- Patent number 12,228,399
- Issue date Feb 18, 2025
- Mitutoyo Corporation
- Nick Hartmann
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus, measuring method using the same, and...
- Patent number 12,215,974
- Issue date Feb 4, 2025
- Samsung Electronics Co., Ltd.
- Seung Woo Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for polarization-sensitive optical coherence to...
- Patent number 12,209,952
- Issue date Jan 28, 2025
- Singapore Health Services Pte Ltd.
- Leopold Schmetterer
- G01 - MEASURING TESTING
Information Patent Grant
Compact snapshot dual-mode interferometric system
- Patent number 12,203,752
- Issue date Jan 21, 2025
- Arizona Board of Regents on behalf of the University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Grant
Broadband interferometry and method for measurement range extension...
- Patent number 12,196,551
- Issue date Jan 14, 2025
- Automated Precision Inc.
- Yongwoo Park
- G01 - MEASURING TESTING
Information Patent Grant
Laser interferometer
- Patent number 12,181,277
- Issue date Dec 31, 2024
- Seiko Epson Corporation
- Kohei Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Composite measurement system for measuring nanometer displacement
- Patent number 12,174,017
- Issue date Dec 24, 2024
- National Institute of Metrology, China
- Yushu Shi
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for imaging and interferometry measurements
- Patent number 12,163,777
- Issue date Dec 10, 2024
- FOGALE NANOTECH
- Alain Courteville
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical coherence tomography system
- Patent number 12,140,426
- Issue date Nov 12, 2024
- AIT Austrian Institute of Technology GmbH
- Rainer Hainberger
- G01 - MEASURING TESTING
Information Patent Grant
Four-quadrant interferometry system based on an integrated array wa...
- Patent number 12,140,425
- Issue date Nov 12, 2024
- National Institute of Metrology, China
- Xiaofei Diao
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring a substrate and method for correcting cyclic e...
- Patent number 12,135,211
- Issue date Nov 5, 2024
- Carl Zeiss SMT GmbH
- Stephan Zschaeck
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus, systems and methods for detecting light
- Patent number 12,072,188
- Issue date Aug 27, 2024
- PANTECH CORPORATION
- Xin Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Determining angular orientation for imaging
- Patent number 12,004,842
- Issue date Jun 11, 2024
- NINEPOINT MEDICAL, INC.
- Benedikt Graf
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Polarization-separated, phase-shifted interferometer
- Patent number 12,000,698
- Issue date Jun 4, 2024
- Massachusetts Institute of Technology
- Noah Gilbert
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and optical instrument with integrated optical compo...
- Patent number 11,933,609
- Issue date Mar 19, 2024
- Yokogawa Electric Corporation
- Nobuhide Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring thickness and refractive index of m...
- Patent number 11,906,281
- Issue date Feb 20, 2024
- Korea Research Institute of Standards and Science
- Young-Sik Ghim
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems of holographic interferometry
- Patent number 11,892,292
- Issue date Feb 6, 2024
- RD Synergy Ltd.
- Dov Furman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Device for interferometric distance measurement
- Patent number 11,885,607
- Issue date Jan 30, 2024
- Dr. Johannes Heidenhain GmbH
- Herbert Huber-Lenk
- G01 - MEASURING TESTING
Information Patent Grant
Laser interferometer having a vibrator to modulate light for displa...
- Patent number 11,879,730
- Issue date Jan 23, 2024
- Seiko Epson Corporation
- Jun Kitagawa
- G02 - OPTICS
Information Patent Grant
Heterodyne one-dimensional grating measuring device and measuring m...
- Patent number 11,860,057
- Issue date Jan 2, 2024
- Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of...
- Wenhao Li
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous phase-shift point diffraction interferometer and metho...
- Patent number 11,788,829
- Issue date Oct 17, 2023
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Peng Feng
- G01 - MEASURING TESTING
Information Patent Grant
Thin films and surface topography measurement using polarization re...
- Patent number 11,761,753
- Issue date Sep 19, 2023
- Svarog LLC
- Boris V. Kamenev
- G01 - MEASURING TESTING
Information Patent Grant
Multi-environment Rayleigh interferometer
- Patent number 11,761,750
- Issue date Sep 19, 2023
- Aaron Pung
- G01 - MEASURING TESTING
Information Patent Grant
Micro optic assemblies and optical interrogation systems
- Patent number 11,761,754
- Issue date Sep 19, 2023
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G01 - MEASURING TESTING
Information Patent Grant
Demodulation of fiber optic interferometric sensors
- Patent number 11,747,133
- Issue date Sep 5, 2023
- Board of Trustees of Michigan State University
- Ming Han
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
BACKLIGHT-FREE AUGMENTED REALITY USING DIGITAL HOLOGRAPHY
- Publication number 20250004275
- Publication date Jan 2, 2025
- NVIDIA Corp.
- Jonghyun Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multi-Channel Self-Mixing Interferometric Sensor
- Publication number 20240384980
- Publication date Nov 21, 2024
- Apple Inc.
- Tong Chen
- G01 - MEASURING TESTING
Information Patent Application
Laser Interferometer And Method Of Adjusting Optical Axis Of Laser...
- Publication number 20240384978
- Publication date Nov 21, 2024
- SEIKO EPSON CORPORATION
- Jun KITAGAWA
- G01 - MEASURING TESTING
Information Patent Application
METHOD, INTERFEROMETER AND SIGNAL PROCESSING DEVICE, EACH FOR DETER...
- Publication number 20240369345
- Publication date Nov 7, 2024
- Martin Berz
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20240361253
- Publication date Oct 31, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER FOR CARRYING OUT AN OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20240337480
- Publication date Oct 10, 2024
- HEIDELBERG ENGINEERING GMBH
- Andreas FRITZ
- G01 - MEASURING TESTING
Information Patent Application
Laser Interferometer
- Publication number 20240318951
- Publication date Sep 26, 2024
- SEIKO EPSON CORPORATION
- Nobuhito HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING ANGULAR ORIENTATION FOR IMAGING
- Publication number 20240285169
- Publication date Aug 29, 2024
- NINEPOINT MEDICAL, INC.
- Benedikt GRAF
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240230314
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Garam CHOI
- G01 - MEASURING TESTING
Information Patent Application
RAPID COHERENT SYNTHETIC WAVELENGTH INTERFEROMETRIC ABSOLUTE DISTAN...
- Publication number 20240219167
- Publication date Jul 4, 2024
- DUKE UNIVERSITY
- Joseph A. IZATT
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC SYSTEM WITH DEEP LEARNING ALGORITHM TO PROCESS TWO...
- Publication number 20240210158
- Publication date Jun 27, 2024
- Arizona Board of Regents on behalf of The University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT DEVICE
- Publication number 20240183650
- Publication date Jun 6, 2024
- Mitsubishi Electric Corporation
- Takanori YAMAUCHI
- G01 - MEASURING TESTING
Information Patent Application
Laser Interferometer
- Publication number 20240175674
- Publication date May 30, 2024
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240133673
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Garam CHOI
- G01 - MEASURING TESTING
Information Patent Application
LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME
- Publication number 20240118072
- Publication date Apr 11, 2024
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING
Information Patent Application
MULTIPHASE OPTICAL COHERENCE MICROSCOPY IMAGING
- Publication number 20240061226
- Publication date Feb 22, 2024
- THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
- Stephen A. Boppart
- G02 - OPTICS
Information Patent Application
MICRO OPTIC ASSEMBLIES AND OPTICAL INTERROGATION SYSTEMS
- Publication number 20230417541
- Publication date Dec 28, 2023
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G02 - OPTICS
Information Patent Application
INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM AND METHOD
- Publication number 20230417532
- Publication date Dec 28, 2023
- BEIJING U-PRECISION TECH CO., LTD.
- Guohua SUN
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE FIBER INTERFEROMETER DISPLACEMENT MEASURING SYSTEM AND M...
- Publication number 20230408250
- Publication date Dec 21, 2023
- BEIJING U-PRECISION TECH CO.. LTD.
- Guohua SUN
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE GRATING INTERFEROMETRY SYSTEM BASED ON SECONDARY DIFFRAC...
- Publication number 20230366667
- Publication date Nov 16, 2023
- TSINGHUA UNIVERSITY
- Yu ZHU
- G01 - MEASURING TESTING
Information Patent Application
BROADBAND INTERFEROMETRY AND METHOD FOR MEASUREMENT RANGE EXTENSION...
- Publication number 20230324165
- Publication date Oct 12, 2023
- Automated Precision Inc.
- Yongwoo PARK
- G01 - MEASURING TESTING
Information Patent Application
COMPACT SHEAROGRAPHY SYSTEM WITH ADJUSTABLE SHEAR DISTANCE
- Publication number 20230296368
- Publication date Sep 21, 2023
- Nikon Corporation
- Eric Peter Goodwin
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COMPLEX AMPLITUDE MEASUREMENT DEVICE AND OPTICAL COMPLEX AM...
- Publication number 20230288182
- Publication date Sep 14, 2023
- Nippon Telegraph and Telephone Corporation
- Hiroki SAKUMA
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
- Publication number 20230243643
- Publication date Aug 3, 2023
- CKD CORPORATION
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Application
COMPACT SNAPSHOT DUAL-MODE INTERFEROMETRIC SYSTEM
- Publication number 20230168075
- Publication date Jun 1, 2023
- Arizona Board of Regents on behalf of The University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Application
Polarization-Separated, Phase-Shifted Interferometer
- Publication number 20230160682
- Publication date May 25, 2023
- Massachusetts Institute of Technology
- Noah GILBERT
- G01 - MEASURING TESTING
Information Patent Application
FOUR-QUADRANT INTERFEROMETRY SYSTEM BASED ON AN INTEGRATED ARRAY WA...
- Publication number 20230127285
- Publication date Apr 27, 2023
- National Institute of Metrology,China
- Xiaofei Diao
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CONCURRENT MEASUREMENTS OF INTERFEROMETRIC...
- Publication number 20230098439
- Publication date Mar 30, 2023
- ALLAGI INC.
- Michael J. Darwin
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE LIGHT SOURCE FOR USE IN METROLOGY SYSTEM
- Publication number 20230062525
- Publication date Mar 2, 2023
- MITUTOYO CORPORATION
- Nick HARTMANN
- G01 - MEASURING TESTING
Information Patent Application
POLARIZING FIZEAU INTERFEROMETER
- Publication number 20230068859
- Publication date Mar 2, 2023
- Mitutoyo Corporation
- Shimpei Matsuura
- G01 - MEASURING TESTING

Using polarization in the interferometer

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Compact dual pass interferometer for a plane mirror interferometer

Distance measurement device and method based on secondary mixing of...

Three-dimensional measurement device

Bidirectional Littrow two-degree-of-freedom grating interference me...

Polarizing Fizeau interferometer

Heterodyne light source for use in metrology system

Optical measurement apparatus, measuring method using the same, and...

Methods and systems for polarization-sensitive optical coherence to...

Compact snapshot dual-mode interferometric system

Broadband interferometry and method for measurement range extension...

Laser interferometer

Composite measurement system for measuring nanometer displacement

Device and method for imaging and interferometry measurements

Optical coherence tomography system

Four-quadrant interferometry system based on an integrated array wa...

Device for measuring a substrate and method for correcting cyclic e...

Apparatus, systems and methods for detecting light

Determining angular orientation for imaging

Polarization-separated, phase-shifted interferometer

Interferometer and optical instrument with integrated optical compo...

Device and method for measuring thickness and refractive index of m...

Methods and systems of holographic interferometry

Device for interferometric distance measurement

Laser interferometer having a vibrator to modulate light for displa...

Heterodyne one-dimensional grating measuring device and measuring m...

Simultaneous phase-shift point diffraction interferometer and metho...

Thin films and surface topography measurement using polarization re...

Multi-environment Rayleigh interferometer

Micro optic assemblies and optical interrogation systems

Demodulation of fiber optic interferometric sensors

Patents Applicationslast 30 patents

BACKLIGHT-FREE AUGMENTED REALITY USING DIGITAL HOLOGRAPHY

Multi-Channel Self-Mixing Interferometric Sensor

Laser Interferometer And Method Of Adjusting Optical Axis Of Laser...

METHOD, INTERFEROMETER AND SIGNAL PROCESSING DEVICE, EACH FOR DETER...

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

INTERFEROMETER FOR CARRYING OUT AN OPTICAL COHERENCE TOMOGRAPHY

Laser Interferometer

DETERMINING ANGULAR ORIENTATION FOR IMAGING

SEMICONDUCTOR MEASUREMENT APPARATUS

RAPID COHERENT SYNTHETIC WAVELENGTH INTERFEROMETRIC ABSOLUTE DISTAN...

INTERFEROMETRIC SYSTEM WITH DEEP LEARNING ALGORITHM TO PROCESS TWO...

OPTICAL MEASUREMENT DEVICE

Laser Interferometer

SEMICONDUCTOR MEASUREMENT APPARATUS

LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME

MULTIPHASE OPTICAL COHERENCE MICROSCOPY IMAGING

MICRO OPTIC ASSEMBLIES AND OPTICAL INTERROGATION SYSTEMS

INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM AND METHOD

HETERODYNE FIBER INTERFEROMETER DISPLACEMENT MEASURING SYSTEM AND M...

HETERODYNE GRATING INTERFEROMETRY SYSTEM BASED ON SECONDARY DIFFRAC...

BROADBAND INTERFEROMETRY AND METHOD FOR MEASUREMENT RANGE EXTENSION...

COMPACT SHEAROGRAPHY SYSTEM WITH ADJUSTABLE SHEAR DISTANCE

OPTICAL COMPLEX AMPLITUDE MEASUREMENT DEVICE AND OPTICAL COMPLEX AM...

THREE-DIMENSIONAL MEASUREMENT DEVICE

COMPACT SNAPSHOT DUAL-MODE INTERFEROMETRIC SYSTEM

Polarization-Separated, Phase-Shifted Interferometer

FOUR-QUADRANT INTERFEROMETRY SYSTEM BASED ON AN INTEGRATED ARRAY WA...

SYSTEMS AND METHODS FOR CONCURRENT MEASUREMENTS OF INTERFEROMETRIC...

HETERODYNE LIGHT SOURCE FOR USE IN METROLOGY SYSTEM

POLARIZING FIZEAU INTERFEROMETER