Using polarization in the interferometer

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CPC
G01B2290/70

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02

Current Industry

G01B2290/70Using polarization in the interferometer

Industries

Patents Grantslast 30 patents

Information Patent Grant
Interferometer and optical instrument with integrated optical compo...
- Patent number 11,933,609
- Issue date Mar 19, 2024
- Yokogawa Electric Corporation
- Nobuhide Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring thickness and refractive index of m...
- Patent number 11,906,281
- Issue date Feb 20, 2024
- Korea Research Institute of Standards and Science
- Young-Sik Ghim
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems of holographic interferometry
- Patent number 11,892,292
- Issue date Feb 6, 2024
- RD Synergy Ltd.
- Dov Furman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Device for interferometric distance measurement
- Patent number 11,885,607
- Issue date Jan 30, 2024
- Dr. Johannes Heidenhain GmbH
- Herbert Huber-Lenk
- G01 - MEASURING TESTING
Information Patent Grant
Laser interferometer having a vibrator to modulate light for displa...
- Patent number 11,879,730
- Issue date Jan 23, 2024
- Seiko Epson Corporation
- Jun Kitagawa
- G02 - OPTICS
Information Patent Grant
Heterodyne one-dimensional grating measuring device and measuring m...
- Patent number 11,860,057
- Issue date Jan 2, 2024
- Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of...
- Wenhao Li
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous phase-shift point diffraction interferometer and metho...
- Patent number 11,788,829
- Issue date Oct 17, 2023
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Peng Feng
- G01 - MEASURING TESTING
Information Patent Grant
Thin films and surface topography measurement using polarization re...
- Patent number 11,761,753
- Issue date Sep 19, 2023
- Svarog LLC
- Boris V. Kamenev
- G01 - MEASURING TESTING
Information Patent Grant
Multi-environment Rayleigh interferometer
- Patent number 11,761,750
- Issue date Sep 19, 2023
- Aaron Pung
- G01 - MEASURING TESTING
Information Patent Grant
Micro optic assemblies and optical interrogation systems
- Patent number 11,761,754
- Issue date Sep 19, 2023
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G01 - MEASURING TESTING
Information Patent Grant
Demodulation of fiber optic interferometric sensors
- Patent number 11,747,133
- Issue date Sep 5, 2023
- Board of Trustees of Michigan State University
- Ming Han
- G01 - MEASURING TESTING
Information Patent Grant
Laser interferometer
- Patent number 11,733,027
- Issue date Aug 22, 2023
- Seiko Epson Corporation
- Kohei Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems of holographic interferometry
- Patent number 11,719,531
- Issue date Aug 8, 2023
- RD Synergy Ltd.
- Dov Furman
- G02 - OPTICS
Information Patent Grant
System and method of phase-locked fiber interferometry
- Patent number 11,644,301
- Issue date May 9, 2023
- National Technology & Engineering Solutions of Sandia, LLC
- Aaron Michael Katzenmeyer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Integrated optical system with wavelength tuning and spatial switching
- Patent number 11,579,356
- Issue date Feb 14, 2023
- Eric Swanson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Displacement detection device
- Patent number 11,512,942
- Issue date Nov 29, 2022
- DMG MORI CO., LTD.
- Akinori Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for stabilization of multi-path optical interfero...
- Patent number 11,506,477
- Issue date Nov 22, 2022
- INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Mehedi Islam
- G01 - MEASURING TESTING
Information Patent Grant
Micro optic assemblies and optical interrogation systems
- Patent number 11,499,818
- Issue date Nov 15, 2022
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G02 - OPTICS
Information Patent Grant
Optical coherence tomography receiver
- Patent number 11,490,804
- Issue date Nov 8, 2022
- Alcon Inc.
- Muhammad K Al-Qaisi
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometer
- Patent number 11,493,322
- Issue date Nov 8, 2022
- Samsung Electronics Co., Ltd.
- Yasuhiro Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring depth-resolved tissue birefringe...
- Patent number 11,473,897
- Issue date Oct 18, 2022
- The General Hospital Corporation
- Brett Bouma
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring the thickness and refractive ind...
- Patent number 11,466,978
- Issue date Oct 11, 2022
- KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE
- Young-sik Ghim
- G01 - MEASURING TESTING
Information Patent Grant
Polarization enhanced interferometric imaging
- Patent number 11,428,626
- Issue date Aug 30, 2022
- Trustees of Boston University
- M. Selim Ünlü
- G01 - MEASURING TESTING
Information Patent Grant
Determining angular orientation for imaging
- Patent number 11,399,718
- Issue date Aug 2, 2022
- NINEPOINT MEDICAL, INC.
- Benedikt Graf
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Spoof detection for biometric validation
- Patent number 11,382,537
- Issue date Jul 12, 2022
- Joshua Noel Hogan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for measuring complex degree of coherence of random optical...
- Patent number 11,366,017
- Issue date Jun 21, 2022
- Soochow University
- Yahong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Polarization holographic microscope system and sample image acquisi...
- Patent number 11,365,961
- Issue date Jun 21, 2022
- Korea University Research and Business Foundation
- Youngwoon Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Laser interference device
- Patent number 11,353,315
- Issue date Jun 7, 2022
- Mitutoyo Corporation
- Yuichiro Yokoyama
- G02 - OPTICS
Information Patent Grant
Fiber splitter device for digital holographic imaging and interfero...
- Patent number 11,340,438
- Issue date May 24, 2022
- Lyncee Tec S.A.
- Etienne Cuche
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Common path mode fiber tip diffraction interferometer for wavefront...
- Patent number 11,333,487
- Issue date May 17, 2022
- KLA Corporation
- Haifeng Huang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240133673
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Garam CHOI
- G01 - MEASURING TESTING
Information Patent Application
LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME
- Publication number 20240118072
- Publication date Apr 11, 2024
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING
Information Patent Application
MULTIPHASE OPTICAL COHERENCE MICROSCOPY IMAGING
- Publication number 20240061226
- Publication date Feb 22, 2024
- THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
- Stephen A. Boppart
- G02 - OPTICS
Information Patent Application
MICRO OPTIC ASSEMBLIES AND OPTICAL INTERROGATION SYSTEMS
- Publication number 20230417541
- Publication date Dec 28, 2023
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G02 - OPTICS
Information Patent Application
INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM AND METHOD
- Publication number 20230417532
- Publication date Dec 28, 2023
- BEIJING U-PRECISION TECH CO., LTD.
- Guohua SUN
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE FIBER INTERFEROMETER DISPLACEMENT MEASURING SYSTEM AND M...
- Publication number 20230408250
- Publication date Dec 21, 2023
- BEIJING U-PRECISION TECH CO.. LTD.
- Guohua SUN
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE GRATING INTERFEROMETRY SYSTEM BASED ON SECONDARY DIFFRAC...
- Publication number 20230366667
- Publication date Nov 16, 2023
- TSINGHUA UNIVERSITY
- Yu ZHU
- G01 - MEASURING TESTING
Information Patent Application
BROADBAND INTERFEROMETRY AND METHOD FOR MEASUREMENT RANGE EXTENSION...
- Publication number 20230324165
- Publication date Oct 12, 2023
- Automated Precision Inc.
- Yongwoo PARK
- G01 - MEASURING TESTING
Information Patent Application
COMPACT SHEAROGRAPHY SYSTEM WITH ADJUSTABLE SHEAR DISTANCE
- Publication number 20230296368
- Publication date Sep 21, 2023
- Nikon Corporation
- Eric Peter Goodwin
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COMPLEX AMPLITUDE MEASUREMENT DEVICE AND OPTICAL COMPLEX AM...
- Publication number 20230288182
- Publication date Sep 14, 2023
- Nippon Telegraph and Telephone Corporation
- Hiroki SAKUMA
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
- Publication number 20230243643
- Publication date Aug 3, 2023
- CKD CORPORATION
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Application
COMPACT SNAPSHOT DUAL-MODE INTERFEROMETRIC SYSTEM
- Publication number 20230168075
- Publication date Jun 1, 2023
- Arizona Board of Regents on behalf of The University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Application
Polarization-Separated, Phase-Shifted Interferometer
- Publication number 20230160682
- Publication date May 25, 2023
- Massachusetts Institute of Technology
- Noah GILBERT
- G01 - MEASURING TESTING
Information Patent Application
FOUR-QUADRANT INTERFEROMETRY SYSTEM BASED ON AN INTEGRATED ARRAY WA...
- Publication number 20230127285
- Publication date Apr 27, 2023
- National Institute of Metrology,China
- Xiaofei Diao
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CONCURRENT MEASUREMENTS OF INTERFEROMETRIC...
- Publication number 20230098439
- Publication date Mar 30, 2023
- ALLAGI INC.
- Michael J. Darwin
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE LIGHT SOURCE FOR USE IN METROLOGY SYSTEM
- Publication number 20230062525
- Publication date Mar 2, 2023
- MITUTOYO CORPORATION
- Nick HARTMANN
- G01 - MEASURING TESTING
Information Patent Application
POLARIZING FIZEAU INTERFEROMETER
- Publication number 20230068859
- Publication date Mar 2, 2023
- Mitutoyo Corporation
- Shimpei Matsuura
- G01 - MEASURING TESTING
Information Patent Application
MICRO OPTIC ASSEMBLIES AND OPTICAL INTERROGATION SYSTEMS
- Publication number 20230032157
- Publication date Feb 2, 2023
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY RECEIVER
- Publication number 20230021386
- Publication date Jan 26, 2023
- Alcon Inc.
- Muhammad K. Al-Qaisi
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITE MEASUREMENT SYSTEM FOR MEASURING NANOMETER DISPLACEMENT
- Publication number 20220412719
- Publication date Dec 29, 2022
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- Yushu SHI
- G01 - MEASURING TESTING
Information Patent Application
LASER INTERFEROMETER AND METHOD FOR CONTROLLING LASER INTERFEROMETER
- Publication number 20220390756
- Publication date Dec 8, 2022
- SEIKO EPSON CORPORATION
- Nobuhito HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
LASER INTERFEROMETER
- Publication number 20220390755
- Publication date Dec 8, 2022
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING ANGULAR ORIENTATION FOR IMAGING
- Publication number 20220322946
- Publication date Oct 13, 2022
- NINEPOINT MEDICAL, INC.
- Benedikt GRAF
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY SYSTEM
- Publication number 20220290970
- Publication date Sep 15, 2022
- AIT AUSTRIAN INSTITUTE OF TECHNOLOGY GMBH
- Rainer HAINBERGER
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR INTERFEROMETRIC DISTANCE MEASUREMENT
- Publication number 20220276040
- Publication date Sep 1, 2022
- Dr. Johannes Heidenhain Gmbh
- Herbert HUBER-LENK
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MEASURING A SUBSTRATE AND METHOD FOR CORRECTING CYCLIC E...
- Publication number 20220260359
- Publication date Aug 18, 2022
- Carl Zeiss SMT GMBH
- Stephan Zschaeck
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER AND OPTICAL INSTRUMENT
- Publication number 20220196381
- Publication date Jun 23, 2022
- YOKOGAWA ELECTRIC CORPORATION
- Nobuhide Yamada
- G01 - MEASURING TESTING
Information Patent Application
Two-Dimensional Second Harmonic Dispersion Interferometer
- Publication number 20220091032
- Publication date Mar 24, 2022
- Frank Joseph Wessel
- G01 - MEASURING TESTING
Information Patent Application
Laser Interferometer
- Publication number 20220065614
- Publication date Mar 3, 2022
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G01 - MEASURING TESTING
Information Patent Application
METHOD, INTERFEROMETER AND SIGNAL DEVICE, EACH FOR DETERMINING AN I...
- Publication number 20220034645
- Publication date Feb 3, 2022
- Martin BERZ
- G01 - MEASURING TESTING

Using polarization in the interferometer

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Interferometer and optical instrument with integrated optical compo...

Device and method for measuring thickness and refractive index of m...

Methods and systems of holographic interferometry

Device for interferometric distance measurement

Laser interferometer having a vibrator to modulate light for displa...

Heterodyne one-dimensional grating measuring device and measuring m...

Simultaneous phase-shift point diffraction interferometer and metho...

Thin films and surface topography measurement using polarization re...

Multi-environment Rayleigh interferometer

Micro optic assemblies and optical interrogation systems

Demodulation of fiber optic interferometric sensors

Laser interferometer

Methods and systems of holographic interferometry

System and method of phase-locked fiber interferometry

Integrated optical system with wavelength tuning and spatial switching

Displacement detection device

System and method for stabilization of multi-path optical interfero...

Micro optic assemblies and optical interrogation systems

Optical coherence tomography receiver

Ellipsometer

Method and apparatus for measuring depth-resolved tissue birefringe...

Apparatus and method for measuring the thickness and refractive ind...

Polarization enhanced interferometric imaging

Determining angular orientation for imaging

Spoof detection for biometric validation

Method for measuring complex degree of coherence of random optical...

Polarization holographic microscope system and sample image acquisi...

Laser interference device

Fiber splitter device for digital holographic imaging and interfero...

Common path mode fiber tip diffraction interferometer for wavefront...

Patents Applicationslast 30 patents

SEMICONDUCTOR MEASUREMENT APPARATUS

LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME

MULTIPHASE OPTICAL COHERENCE MICROSCOPY IMAGING

MICRO OPTIC ASSEMBLIES AND OPTICAL INTERROGATION SYSTEMS

INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM AND METHOD

HETERODYNE FIBER INTERFEROMETER DISPLACEMENT MEASURING SYSTEM AND M...

HETERODYNE GRATING INTERFEROMETRY SYSTEM BASED ON SECONDARY DIFFRAC...

BROADBAND INTERFEROMETRY AND METHOD FOR MEASUREMENT RANGE EXTENSION...

COMPACT SHEAROGRAPHY SYSTEM WITH ADJUSTABLE SHEAR DISTANCE

OPTICAL COMPLEX AMPLITUDE MEASUREMENT DEVICE AND OPTICAL COMPLEX AM...

THREE-DIMENSIONAL MEASUREMENT DEVICE

COMPACT SNAPSHOT DUAL-MODE INTERFEROMETRIC SYSTEM

Polarization-Separated, Phase-Shifted Interferometer

FOUR-QUADRANT INTERFEROMETRY SYSTEM BASED ON AN INTEGRATED ARRAY WA...

SYSTEMS AND METHODS FOR CONCURRENT MEASUREMENTS OF INTERFEROMETRIC...

HETERODYNE LIGHT SOURCE FOR USE IN METROLOGY SYSTEM

POLARIZING FIZEAU INTERFEROMETER

MICRO OPTIC ASSEMBLIES AND OPTICAL INTERROGATION SYSTEMS

OPTICAL COHERENCE TOMOGRAPHY RECEIVER

COMPOSITE MEASUREMENT SYSTEM FOR MEASURING NANOMETER DISPLACEMENT

LASER INTERFEROMETER AND METHOD FOR CONTROLLING LASER INTERFEROMETER

LASER INTERFEROMETER

DETERMINING ANGULAR ORIENTATION FOR IMAGING

OPTICAL COHERENCE TOMOGRAPHY SYSTEM

DEVICE FOR INTERFEROMETRIC DISTANCE MEASUREMENT

DEVICE FOR MEASURING A SUBSTRATE AND METHOD FOR CORRECTING CYCLIC E...

INTERFEROMETER AND OPTICAL INSTRUMENT

Two-Dimensional Second Harmonic Dispersion Interferometer

Laser Interferometer

METHOD, INTERFEROMETER AND SIGNAL DEVICE, EACH FOR DETERMINING AN I...