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using resistors, thermistors, or semi-conductors sensitive to radiation
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G01J5/20
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
G01J5/00
Radiation pyrometry
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G01J5/20
using resistors, thermistors, or semi-conductors sensitive to radiation
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Patents Grants
last 30 patents
Information
Patent Grant
Multi sensor handheld medical diagnostic device
Patent number
12,285,243
Issue date
Apr 29, 2025
O/D Vision Inc.
Marcus Charles Bernard Soori-Arachi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Infrared imaging microbolometer and associated production methods
Patent number
12,270,710
Issue date
Apr 8, 2025
LYNRED
Willy Ludurczak
G01 - MEASURING TESTING
Information
Patent Grant
Vertically integrated micro-bolometer and manufacturing method thereof
Patent number
12,264,972
Issue date
Apr 1, 2025
Industrial Technology Research Institute
Yu-Wen Hsu
G01 - MEASURING TESTING
Information
Patent Grant
Devices, systems, and methods for calibrating and maintaining a tem...
Patent number
12,257,626
Issue date
Mar 25, 2025
Arcam AB
Tomas Lock
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Microbolometer systems and methods
Patent number
12,255,221
Issue date
Mar 18, 2025
Teledyne FLIR Commercial Systems, Inc.
Eric A. Kurth
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Microbolometer and method of manufacturing the same
Patent number
12,241,787
Issue date
Mar 4, 2025
Hon Hai Precision Industry Co., Ltd.
Chun-Yuan Chou
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
On-board radiation sensing apparatus
Patent number
12,241,788
Issue date
Mar 4, 2025
CALUMINO PTY LTD
Gabrielle de Wit
G01 - MEASURING TESTING
Information
Patent Grant
Microbolometer systems and methods
Patent number
12,243,904
Issue date
Mar 4, 2025
Teledyne FLIR Commercial Systems, Inc.
Eric A. Kurth
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical readout for thermal detector array
Patent number
12,209,912
Issue date
Jan 28, 2025
GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
Nathan Andrew Tomlin
G01 - MEASURING TESTING
Information
Patent Grant
Interface circuit for photodetectors providing full-frame integrati...
Patent number
12,192,658
Issue date
Jan 7, 2025
Nu-Trek, Inc.
Stephen Holden Black
G01 - MEASURING TESTING
Information
Patent Grant
Method for manufacturing a microbolometer with thermistor material...
Patent number
12,188,830
Issue date
Jan 7, 2025
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Jean-Jacques Yon
G01 - MEASURING TESTING
Information
Patent Grant
Interface circuit for photodetectors providing full-frame integrati...
Patent number
12,155,951
Issue date
Nov 26, 2024
Nu-Trek, Inc.
Stephen Holden Black
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Camera having a reduced dark current photodetector
Patent number
12,148,855
Issue date
Nov 19, 2024
Shimon Maimon
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Design, test, and operation of a small thermal imaging core
Patent number
12,104,962
Issue date
Oct 1, 2024
SEEK THERMAL, INC.
William J. Parrish
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Imager health monitoring systems and methods
Patent number
12,101,459
Issue date
Sep 24, 2024
Teledyne FLIR Commercial Systems, Inc.
Dylan M. Rodriguez
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Electromagnetic radiation detection structure with optimised absorp...
Patent number
12,094,912
Issue date
Sep 17, 2024
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Abdelkader Aliane
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sequential beam splitting in a radiation sensing apparatus
Patent number
12,078,546
Issue date
Sep 3, 2024
CALUMINO PTY LTD
Gabrielle de Wit
G01 - MEASURING TESTING
Information
Patent Grant
Microbolometer with filtering function
Patent number
12,078,545
Issue date
Sep 3, 2024
LYNRED
Nicolas Boudou
G01 - MEASURING TESTING
Information
Patent Grant
Process for producing a microbolometer comprising a vanadium-oxide-...
Patent number
12,066,332
Issue date
Aug 20, 2024
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Denis Pelenc
G01 - MEASURING TESTING
Information
Patent Grant
Sensor configured to sense heat or infrared light and electronic de...
Patent number
12,066,334
Issue date
Aug 20, 2024
Samsung Electronics Co., Ltd.
Yeong Suk Choi
G01 - MEASURING TESTING
Information
Patent Grant
Floating bridge structure and infrared sensing device
Patent number
12,061,120
Issue date
Aug 13, 2024
Hon Hai Precision Industry Co., Ltd.
Shang-Yu Chuang
G01 - MEASURING TESTING
Information
Patent Grant
Thermographic sensor with thermo-couples on a suspended grid and pr...
Patent number
12,055,441
Issue date
Aug 6, 2024
STMicroelectronics S.r.l.
Maria Eloisa Castagna
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Motion based thermal image processing systems and methods
Patent number
12,058,473
Issue date
Aug 6, 2024
FLIR Systems AB
Tien C. Nguyen
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method for processing an image
Patent number
12,044,578
Issue date
Jul 23, 2024
Schneider Electric Industries SAS
Laurent Chiesi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Far-infrared sensor packaging structure
Patent number
12,040,416
Issue date
Jul 16, 2024
PixArt Imaging Inc.
Yi-Chang Chang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
MEMS and NEMS structures
Patent number
12,006,209
Issue date
Jun 11, 2024
OBSIDIAN SENSORS, INC.
John Hong
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optical detector
Patent number
11,976,979
Issue date
May 7, 2024
trinamiX GmbH
Sebastian Valouch
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Reduced dark current photodetector
Patent number
11,961,936
Issue date
Apr 16, 2024
Shimon Maimon
B82 - NANO-TECHNOLOGY
Information
Patent Grant
MEMS sensors and systems
Patent number
11,959,806
Issue date
Apr 16, 2024
OBSIDIAN SENSORS, INC.
John Hong
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Microbolometer systems and methods
Patent number
11,955,504
Issue date
Apr 9, 2024
Teledyne FLIR Commercial Systems, Inc.
Eric A. Kurth
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
MICROBOLOMETER AND METHOD OF MANUFACTURING THE SAME
Publication number
20250130110
Publication date
Apr 24, 2025
Samsung Electronics Co., Ltd.
Jae Chul PARK
G01 - MEASURING TESTING
Information
Patent Application
INFRARED IMAGING MICROBOLOMETER
Publication number
20250113735
Publication date
Apr 3, 2025
LYNRED
Marc Guillaumont
G01 - MEASURING TESTING
Information
Patent Application
BROADBAND ELECTRICAL SUBSTITUTION RADIOMETER, ARRAY OF SAME, AND PE...
Publication number
20250102364
Publication date
Mar 27, 2025
Government of the United States of America, as Represented by the Secretary o...
Christopher Shing-Yu Yung
G01 - MEASURING TESTING
Information
Patent Application
SENSING DEVICE
Publication number
20250076123
Publication date
Mar 6, 2025
InnoLux Corporation
Yu-Tsung LIU
G01 - MEASURING TESTING
Information
Patent Application
BOLOMETER AND MANUFACTURING METHOD
Publication number
20250067601
Publication date
Feb 27, 2025
NEC Corporation
Mayumi KOSAKA
G01 - MEASURING TESTING
Information
Patent Application
MEMS AND NEMS STRUCTURES
Publication number
20250042727
Publication date
Feb 6, 2025
Obsidian Sensors, Inc.
John HONG
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DEVICE FOR DETECTING THE PASSAGE OF AN INFRARED RADIATION EMITTING...
Publication number
20250027817
Publication date
Jan 23, 2025
STMicroelectronics International N.V.
Carlo GUADALUPI
G01 - MEASURING TESTING
Information
Patent Application
INFRARED DETECTOR BASED ON CMOS PROCESS
Publication number
20250020516
Publication date
Jan 16, 2025
Beijing North Gaoye Technology Co., Ltd.
Guangjie ZHAI
G01 - MEASURING TESTING
Information
Patent Application
CAMERA HAVING A REDUCED DARK CURRENT PHOTODETECTOR
Publication number
20250022979
Publication date
Jan 16, 2025
Shimon Maimon
B82 - NANO-TECHNOLOGY
Information
Patent Application
MULTI SENSOR HANDHELD MEDICAL DIAGNOSTIC DEVICE
Publication number
20250000374
Publication date
Jan 2, 2025
O/D Vision Inc.
Marcus Charles Bernard SOORI-ARACHI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
INFRARED SENSOR AND METHOD FOR MANUFACTURING THE SAME
Publication number
20250003804
Publication date
Jan 2, 2025
NEC Corporation
Noriyuki TONOUCHI
B82 - NANO-TECHNOLOGY
Information
Patent Application
BOLOMETRIC DETECTOR
Publication number
20240426670
Publication date
Dec 26, 2024
Commissariat a I'Energie Atomique et aux Energies Alternatives
Thomas Perrillat-Bottonet
G01 - MEASURING TESTING
Information
Patent Application
COMPOSITE MATERIAL, BOLOMETER, AND COMPOSITE MATERIAL FORMING METHOD
Publication number
20240410759
Publication date
Dec 12, 2024
NEC Corporation
Akinobu SHIBUYA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
BOLOMETER-TYPE INFRARED DETECTOR AND METHOD OF MANUFACTURING THE SAME
Publication number
20240377261
Publication date
Nov 14, 2024
NEC Corporation
Tomo TANAKA
G01 - MEASURING TESTING
Information
Patent Application
THERMAL SENSOR DEVICE AND METHOD OF MANUFACTURE THEREOF
Publication number
20240369415
Publication date
Nov 7, 2024
MELEXIS TECHNOLOGIES NV
Jian CHEN
G01 - MEASURING TESTING
Information
Patent Application
BOLOMETER AND BOLOMETER MANUFACTURING METHOD
Publication number
20240361184
Publication date
Oct 31, 2024
NEC Corporation
Mayumi KOSAKA
B82 - NANO-TECHNOLOGY
Information
Patent Application
THERMAL IMAGING DEVICE
Publication number
20240344889
Publication date
Oct 17, 2024
Rayprus Technology (Foshan) Co., Ltd.
HSIANG-CHIEH YU
G02 - OPTICS
Information
Patent Application
MICROBOLOMETER SYSTEMS AND METHODS
Publication number
20240339482
Publication date
Oct 10, 2024
Teledyne FLIR Commercial Systems, Inc.
Eric A. Kurth
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LOW-STRESS NBN SUPERCONDUCTING THIN FILM AND PREPARATION METHOD AND...
Publication number
20240334841
Publication date
Oct 3, 2024
ZHEJIANG LAB
LIHUI YANG
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
THERMISTOR ELEMENT AND ELECTROMAGNETIC WAVE SENSOR
Publication number
20240304361
Publication date
Sep 12, 2024
TDK Corporation
Maiko KOKUBO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MICROBOLOMETER DETECTORS WITH OPTICAL ABSORBER STRUCTURES FOR DETEC...
Publication number
20240288310
Publication date
Aug 29, 2024
Institut National D'Optique
Hassane OULACHGAR
G01 - MEASURING TESTING
Information
Patent Application
ELEMENT USING CARBON NANOTUBE FILM, A BOLOMETER USING THE SAME AND...
Publication number
20240276863
Publication date
Aug 15, 2024
NEC Corporation
Tomo TANAKA
B82 - NANO-TECHNOLOGY
Information
Patent Application
DESIGN, TEST, AND OPERATION OF A SMALL THERMAL IMAGING CORE
Publication number
20240240988
Publication date
Jul 18, 2024
Seek Thermal, Inc.
William J. Parrish
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
MICROBOLOMETER DETECTORS WITH RESONANT CAVITIES FOR ENHANCED OPTICA...
Publication number
20240240990
Publication date
Jul 18, 2024
Institut National D'Optique
Francis GÉNÉREUX
G01 - MEASURING TESTING
Information
Patent Application
DIVIDED-APERTURE INFRA-RED SPECTRAL IMAGING SYSTEM
Publication number
20240230417
Publication date
Jul 11, 2024
REBELLION PHOTONICS, INC.
Robert Timothy Kester
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
CAMERA HAVING A REDUCED DARK CURRENT PHOTODETECTOR
Publication number
20240222544
Publication date
Jul 4, 2024
Shimon Maimon
G01 - MEASURING TESTING
Information
Patent Application
VERTICALLY INTEGRATED MICRO-BOLOMETER AND MANUFACTURING METHOD THEREOF
Publication number
20240219239
Publication date
Jul 4, 2024
Industrial Technology Research Institute
Yu-Wen HSU
G01 - MEASURING TESTING
Information
Patent Application
THERMAL IMAGING PIXEL, THERMAL IMAGING SENSOR, AND BOLOMETER
Publication number
20240219240
Publication date
Jul 4, 2024
Samsung Electronics Co., Ltd.
Jinmyoung KIM
G01 - MEASURING TESTING
Information
Patent Application
ELECTROCONDUCTIVE THERMAL INSULATING MATERIAL AND INRARED SENSOR
Publication number
20240183718
Publication date
Jun 6, 2024
Panasonic Intellectual Property Management Co., Ltd.
KUNIHIKO NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
MICROBOLOMETER SYSTEMS AND METHODS
Publication number
20240162272
Publication date
May 16, 2024
Teledyne FLIR, LLC
Eric A. Kurth
H01 - BASIC ELECTRIC ELEMENTS