using test interfaces

Industry

CPC
G01R31/2844

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2844using test interfaces

Industries

Patents Grantslast 30 patents

Information Patent Grant
Autonomous detection of memory insertion into test equipment withou...
- Patent number 12,117,481
- Issue date Oct 15, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G01 - MEASURING TESTING
Information Patent Grant
Wafer-level multi-device tester and system including the same preli...
- Patent number 12,105,146
- Issue date Oct 1, 2024
- Samsung Electronics Co., Ltd.
- Seongkwan Lee
- G01 - MEASURING TESTING
Information Patent Grant
Test socket for performing a test on an electronic device
- Patent number 12,038,473
- Issue date Jul 16, 2024
- Samsung Electronics Co., Ltd.
- Kiljoong Yun
- G01 - MEASURING TESTING
Information Patent Grant
Module and method for initializing and calibrating a product during...
- Patent number 11,953,551
- Issue date Apr 9, 2024
- Continental Automotive Technologies GmbH
- Eduardo Lopez Arce Vivas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment comprising a device under test loopback an...
- Patent number 11,913,987
- Issue date Feb 27, 2024
- Advantest Corporation
- Andreas Hantsch
- G01 - MEASURING TESTING
Information Patent Grant
Integrated test cell using active thermal interposer (ATI) with par...
- Patent number 11,841,392
- Issue date Dec 12, 2023
- Advantest Test Solutiions, Inc.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
System and method for formal fault propagation analysis
- Patent number 11,816,410
- Issue date Nov 14, 2023
- Siemens Electronic Design Automation Gmbh
- Dominik Strasser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bi-directional coupler with termination point for a test point
- Patent number 11,802,903
- Issue date Oct 31, 2023
- ARRIS Enterprises LLC
- Zhijian Sun
- G01 - MEASURING TESTING
Information Patent Grant
Transmission rate adaptation
- Patent number 11,742,979
- Issue date Aug 29, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Miika Niiranen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Condensation prevention type transmission window for CMS module tes...
- Patent number 11,713,614
- Issue date Aug 1, 2023
- SP TECHNOLOGY CO., LTD.
- Yong Jin Park
- G01 - MEASURING TESTING
Information Patent Grant
Test card and test display adapter with shorter time for preliminar...
- Patent number 11,703,540
- Issue date Jul 18, 2023
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Yidong Ji
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for data storage devices
- Patent number 11,698,408
- Issue date Jul 11, 2023
- Western Digital Technologies, Inc.
- Ba Duong Phan
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method for reducing interference of power on/off to har...
- Patent number 11,644,502
- Issue date May 9, 2023
- ZHENGZHOU YUNHAI INFORMATION TECHNOLOGY CO., LTD.
- Zhihua Ge
- G01 - MEASURING TESTING
Information Patent Grant
Testing device of array substrates and testing method
- Patent number 11,567,118
- Issue date Jan 31, 2023
- HKC CORPORATION LIMITED
- Bei Zhou Huang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for formal fault propagation analysis
- Patent number 11,520,963
- Issue date Dec 6, 2022
- OneSpin Solutions GmbH
- Dominik Strasser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated test cell using active thermal interposer (ATI) with par...
- Patent number 11,493,551
- Issue date Nov 8, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Testing device and testing method for performing an electrical stre...
- Patent number 11,442,099
- Issue date Sep 13, 2022
- HKC CORPORATION LIMITED
- Bei Zhou Huang
- G02 - OPTICS
Information Patent Grant
Diagnosis of a control device
- Patent number 11,293,971
- Issue date Apr 5, 2022
- ZF Friedrichshafen AG
- Mohammad Kabany
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Switched bypass capacitor for component characterization
- Patent number 11,243,244
- Issue date Feb 8, 2022
- Infineon Technologies AG
- Stefano di Martino
- G01 - MEASURING TESTING
Information Patent Grant
Chip testing method for testing chips by chip testing system
- Patent number 11,193,971
- Issue date Dec 7, 2021
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Relay circuit for reducing a voltage glitch during device testing
- Patent number 11,150,295
- Issue date Oct 19, 2021
- Marvell Asia Pte, Ltd.
- Quang Nguyen
- G01 - MEASURING TESTING
Information Patent Grant
Chip testing device
- Patent number 11,125,809
- Issue date Sep 21, 2021
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Blind-mate PIM testing adapter connector and fixture
- Patent number 11,125,810
- Issue date Sep 21, 2021
- CommScope Technologies LLC
- Hongjuan An
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and circuitry for open load detection
- Patent number 11,105,842
- Issue date Aug 31, 2021
- Texas Instruments Incorporated
- JianQuan Liao
- G01 - MEASURING TESTING
Information Patent Grant
Test system and method
- Patent number 11,099,228
- Issue date Aug 24, 2021
- Advantest Corporation
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for acquisition of test data
- Patent number 11,041,907
- Issue date Jun 22, 2021
- Advantest Corporation
- Ben Rogel-Favila
- G01 - MEASURING TESTING
Information Patent Grant
Contactless coupling between test and measurement system and a devi...
- Patent number 11,041,880
- Issue date Jun 22, 2021
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Scalable platform for system level testing
- Patent number 11,002,787
- Issue date May 11, 2021
- Advantest Corporation
- Roland Wolff
- G01 - MEASURING TESTING
Information Patent Grant
Modular power supply monitoring by accessory interface of a test an...
- Patent number 10,955,488
- Issue date Mar 23, 2021
- Tektronix, Inc.
- Haiping Lv
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically configurable remote instrument interface
- Patent number 10,746,761
- Issue date Aug 18, 2020
- Keithley Intstruments, LLC
- Michael D. Rayman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
UNIFIED MEASUREMENT SYSTEM FOR STATIC AND DYNAMIC CHARACTERIZATION...
- Publication number 20240248131
- Publication date Jul 25, 2024
- KEITHLEY INSTRUMENTS, LLC
- Gregory Sobolewski
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR TIN WHISKER ISOLATION AND DETECTION
- Publication number 20240219450
- Publication date Jul 4, 2024
- International Business Machines Corporation
- MATTHEW DOYLE
- G01 - MEASURING TESTING
Information Patent Application
AUTONOMOUS DETECTION OF MEMORY INSERTION INTO TEST EQUIPMENT WITHOU...
- Publication number 20240210464
- Publication date Jun 27, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TESTING
- Publication number 20240175919
- Publication date May 30, 2024
- TouchNetix AS
- Steinar MYREN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...
- Publication number 20240133943
- Publication date Apr 25, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik RANGANATHAN
- G01 - MEASURING TESTING
Information Patent Application
WAFER-LEVEL MULTI-DEVICE TESTER AND SYSTEM INCLUDING THE SAME
- Publication number 20240085478
- Publication date Mar 14, 2024
- Samsung Electronics Co., Ltd.
- Seongkwan Lee
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST EQUIPMENT COMPRISING A DEVICE UNDER TEST LOOPBACK AN...
- Publication number 20240061034
- Publication date Feb 22, 2024
- Advantest Corporation
- Andreas Hantsch
- G01 - MEASURING TESTING
Information Patent Application
Automatic Selection of Connecting Cables for In-line Test
- Publication number 20240019484
- Publication date Jan 18, 2024
- SoftIron Limited
- Kevin Peters
- G01 - MEASURING TESTING
Information Patent Application
LIGHT EMITTING DISPLAY APPARATUS
- Publication number 20230207575
- Publication date Jun 29, 2023
- LG Display Co., Ltd.
- DongHee YOO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR DIAGNOSING ELECTRONIC APPARATUS
- Publication number 20230160952
- Publication date May 25, 2023
- Samsung Electronics Co., Ltd.
- Hangseok CHOI
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SYSTEMS AND METHODS FOR REMAINING USEFUL LIFE PREDICTION IN ELECTRO...
- Publication number 20230160950
- Publication date May 25, 2023
- UNIVERSITY OF HOUSTON SYSTEM
- Harish Krishnamoorthy
- G01 - MEASURING TESTING
Information Patent Application
TESTING BOARD
- Publication number 20230152366
- Publication date May 18, 2023
- BIZLINK INTERNATIONAL CORP.
- Chin-An HSIEH
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET FOR PERFORMING A TEST ON AN ELECTRONIC DEVICE
- Publication number 20230098635
- Publication date Mar 30, 2023
- Samsung Electronics Co., Ltd.
- Kiljoong YUN
- G01 - MEASURING TESTING
Information Patent Application
TEST AND DEBUG SUPPORT WITH HBI CHIPLET ARCHITECTURE
- Publication number 20230095914
- Publication date Mar 30, 2023
- Intel Corporation
- Gerald PASDAST
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS FOR DATA STORAGE DEVICES
- Publication number 20230060313
- Publication date Mar 2, 2023
- Western Digital Technologies, Inc.
- Ba Duong Phan
- G01 - MEASURING TESTING
Information Patent Application
TEST CARD AND TEST DISPLAY ADAPTER
- Publication number 20230062716
- Publication date Mar 2, 2023
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Yidong JI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TRANSMISSION RATE ADAPTATION
- Publication number 20230017470
- Publication date Jan 19, 2023
- Siemens Industry Software Inc.
- Miika Niiranen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM AND METHOD FOR FORMAL FAULT PROPAGATION ANALYSIS
- Publication number 20220414306
- Publication date Dec 29, 2022
- Onespin Solutions GmbH
- Dominik Strasser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING DEVICE OF ARRAY SUBSTRATES AND TESTING METHOD
- Publication number 20220381819
- Publication date Dec 1, 2022
- HKC Corporation Limited
- BEI ZHOU HUANG
- G01 - MEASURING TESTING
Information Patent Application
MODULE AND METHOD FOR INITIALIZING AND CALIBRATING A PRODUCT DURING...
- Publication number 20220317183
- Publication date Oct 6, 2022
- Continental Teves AG & Co. OHG
- Eduardo Lopez Arce Vivas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...
- Publication number 20220299563
- Publication date Sep 22, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik RANGANATHAN
- G01 - MEASURING TESTING
Information Patent Application
UNIFIED MEASUREMENT SYSTEM FOR STATIC AND DYNAMIC CHARACTERIZATION...
- Publication number 20220291278
- Publication date Sep 15, 2022
- KEITHLEY INSTRUMENTS, LLC
- Gregory Sobolewski
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST EQUIPMENT COMPRISING A DEVICE UNDER TEST LOOPBACK AN...
- Publication number 20220236318
- Publication date Jul 28, 2022
- Advantest Corporation
- Andreas Hantsch
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...
- Publication number 20210396801
- Publication date Dec 23, 2021
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik RANGANATHAN
- G01 - MEASURING TESTING
Information Patent Application
BI-DIRECTIONAL COUPLER WITH TERMINATION POINT FOR A TEST POINT
- Publication number 20210341532
- Publication date Nov 4, 2021
- ARRIS Enterprises LLC
- Zhijian SUN
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE OF ARRAY SUBSTRATES AND TESTING METHOD
- Publication number 20210325448
- Publication date Oct 21, 2021
- HKC Corporation Limited
- BEI ZHOU HUANG
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT AND METHOD FOR REDUCING INTERFERENCE OF POWER ON/OFF TO HAR...
- Publication number 20210247444
- Publication date Aug 12, 2021
- ZHENGZHOU YUNHAI INFORMATION TECHNOLOGY CO., LTD.
- Zhihua GE
- G01 - MEASURING TESTING
Information Patent Application
Switched Bypass Capacitor for Component Characterization
- Publication number 20210109148
- Publication date Apr 15, 2021
- INFINEON TECHNOLOGIES AG
- Stefano di Martino
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING METHOD
- Publication number 20210018558
- Publication date Jan 21, 2021
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING DEVICE
- Publication number 20210018557
- Publication date Jan 21, 2021
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING

using test interfaces

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Autonomous detection of memory insertion into test equipment withou...

Wafer-level multi-device tester and system including the same preli...

Test socket for performing a test on an electronic device

Module and method for initializing and calibrating a product during...

Automated test equipment comprising a device under test loopback an...

Integrated test cell using active thermal interposer (ATI) with par...

System and method for formal fault propagation analysis

Bi-directional coupler with termination point for a test point

Transmission rate adaptation

Condensation prevention type transmission window for CMS module tes...

Test card and test display adapter with shorter time for preliminar...

Testing apparatus for data storage devices

Circuit and method for reducing interference of power on/off to har...

Testing device of array substrates and testing method

System and method for formal fault propagation analysis

Integrated test cell using active thermal interposer (ATI) with par...

Testing device and testing method for performing an electrical stre...

Diagnosis of a control device

Switched bypass capacitor for component characterization

Chip testing method for testing chips by chip testing system

Relay circuit for reducing a voltage glitch during device testing

Chip testing device

Blind-mate PIM testing adapter connector and fixture

Method and circuitry for open load detection

Test system and method

Method and system for acquisition of test data

Contactless coupling between test and measurement system and a devi...

Scalable platform for system level testing

Modular power supply monitoring by accessory interface of a test an...

Dynamically configurable remote instrument interface

Patents Applicationslast 30 patents

UNIFIED MEASUREMENT SYSTEM FOR STATIC AND DYNAMIC CHARACTERIZATION...

APPARATUS AND METHOD FOR TIN WHISKER ISOLATION AND DETECTION

AUTONOMOUS DETECTION OF MEMORY INSERTION INTO TEST EQUIPMENT WITHOU...

INTEGRATED CIRCUIT TESTING

INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...

WAFER-LEVEL MULTI-DEVICE TESTER AND SYSTEM INCLUDING THE SAME

AUTOMATED TEST EQUIPMENT COMPRISING A DEVICE UNDER TEST LOOPBACK AN...

Automatic Selection of Connecting Cables for In-line Test

LIGHT EMITTING DISPLAY APPARATUS

METHOD AND APPARATUS FOR DIAGNOSING ELECTRONIC APPARATUS

SYSTEMS AND METHODS FOR REMAINING USEFUL LIFE PREDICTION IN ELECTRO...

TESTING BOARD

TEST SOCKET FOR PERFORMING A TEST ON AN ELECTRONIC DEVICE

TEST AND DEBUG SUPPORT WITH HBI CHIPLET ARCHITECTURE

TESTING APPARATUS FOR DATA STORAGE DEVICES

TEST CARD AND TEST DISPLAY ADAPTER

TRANSMISSION RATE ADAPTATION

SYSTEM AND METHOD FOR FORMAL FAULT PROPAGATION ANALYSIS

TESTING DEVICE OF ARRAY SUBSTRATES AND TESTING METHOD

MODULE AND METHOD FOR INITIALIZING AND CALIBRATING A PRODUCT DURING...

INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...

UNIFIED MEASUREMENT SYSTEM FOR STATIC AND DYNAMIC CHARACTERIZATION...

AUTOMATED TEST EQUIPMENT COMPRISING A DEVICE UNDER TEST LOOPBACK AN...

INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...

BI-DIRECTIONAL COUPLER WITH TERMINATION POINT FOR A TEST POINT

TESTING DEVICE OF ARRAY SUBSTRATES AND TESTING METHOD

CIRCUIT AND METHOD FOR REDUCING INTERFERENCE OF POWER ON/OFF TO HAR...

Switched Bypass Capacitor for Component Characterization

CHIP TESTING METHOD

CHIP TESTING DEVICE