using thermal means

Industry

CPC
G01B21/085

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B21/00Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the preceding groups

Current Industry

G01B21/085using thermal means

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring the wall thickness of a hollow glass article
- Patent number 12,123,710
- Issue date Oct 22, 2024
- Heye International GmbH
- Dirk Pörtner
- G01 - MEASURING TESTING
Information Patent Grant
Portable optic metrology thermal chamber module and method therefor
- Patent number 12,104,975
- Issue date Oct 1, 2024
- Optikos Corporation
- David Imrie
- G01 - MEASURING TESTING
Information Patent Grant
Temperature sensing arrayal for freeboard detection
- Patent number 12,098,916
- Issue date Sep 24, 2024
- The United States of America, as represented by the Secretary of the Navy
- David A. Mellick
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Thickness measurement method, thickness measurement device, defect...
- Patent number 11,965,735
- Issue date Apr 23, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yousuke Irie
- G01 - MEASURING TESTING
Information Patent Grant
Water heater, and scale detection system and method
- Patent number 11,920,923
- Issue date Mar 5, 2024
- A. O. Smith Corporation
- Tao Chen
- F24 - HEATING RANGES VENTILATING
Information Patent Grant
Oxide film thickness measurement device and method
- Patent number 11,852,458
- Issue date Dec 26, 2023
- Kobe Steel, Ltd.
- Masahiro Inui
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Portable optic metrology thermal chamber module and method therefor
- Patent number 11,635,344
- Issue date Apr 25, 2023
- Optikos Corporation
- David Imrie
- G01 - MEASURING TESTING
Information Patent Grant
Method of performing visualized measurement on thickness distributi...
- Patent number 11,371,839
- Issue date Jun 28, 2022
- Korea Advanced Institute of Science and Technology
- Hoon Sohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for optimizing a manufacturing process based on a...
- Patent number 11,280,751
- Issue date Mar 22, 2022
- General Electric Company
- Eric John Ruggiero
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Manufacturing process control with deep learning-based predictive m...
- Patent number 11,242,575
- Issue date Feb 8, 2022
- International Business Machines Corporation
- Young Min Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thermographic examination means and method for non-destructive exam...
- Patent number 11,226,301
- Issue date Jan 18, 2022
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Jens Doege
- G01 - MEASURING TESTING
Information Patent Grant
System and method for large sample analysis of thin film
- Patent number 11,175,127
- Issue date Nov 16, 2021
- Illumina, Inc.
- Alexander Fuhrmann
- G01 - MEASURING TESTING
Information Patent Grant
Thickness measurement method, thickness measurement device, defect...
- Patent number 11,054,252
- Issue date Jul 6, 2021
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yousuke Irie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection of a shoe with a thermal camera
- Patent number 10,908,315
- Issue date Feb 2, 2021
- Alessandro Manneschi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Deposit monitor
- Patent number 10,816,490
- Issue date Oct 27, 2020
- Ecolab USA Inc.
- Mita Chattoraj
- G01 - MEASURING TESTING
Information Patent Grant
Method for coating a surface of a metal strip and a metal strip-coa...
- Patent number 10,739,286
- Issue date Aug 11, 2020
- ThyssenKrupp Steel Europe AG
- Thomas Möller
- G01 - MEASURING TESTING
Information Patent Grant
Variable temperature controlled soldering iron
- Patent number 10,688,578
- Issue date Jun 23, 2020
- OK INTERNATIONAL, INC.
- Hoa Nguyen
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Batch and continuous methods for evaluating the physical and therma...
- Patent number 10,684,128
- Issue date Jun 16, 2020
- Alliance for Sustainable Energy, LLC
- Bhushan Lal Sopori
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing process control with deep learning-based predictive m...
- Patent number 10,633,716
- Issue date Apr 28, 2020
- International Business Machines Corporation
- Young Min Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for predicting thickness of oxide layer of silicon wafer
- Patent number 10,615,085
- Issue date Apr 7, 2020
- SK SILTRON CO., LTD.
- Jung Kil Park
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing process control with deep learning-based predictive m...
- Patent number 10,604,814
- Issue date Mar 31, 2020
- International Business Machines Coporation
- Young Min Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for accretion detection
- Patent number 10,444,079
- Issue date Oct 15, 2019
- TATA Consultancy Services Limited
- Bashisht Narayan Singh
- G02 - OPTICS
Information Patent Grant
Deposit monitor
- Patent number 10,295,489
- Issue date May 21, 2019
- Ecolab USA Inc.
- Mita Chattoraj
- G01 - MEASURING TESTING
Information Patent Grant
Pipeline constriction detection
- Patent number 10,274,381
- Issue date Apr 30, 2019
- ExxonMobil Upstream Research Company
- Mohan G. Kulkarni
- E21 - EARTH DRILLING MINING
Information Patent Grant
Flash thermography double wall thickness measurement
- Patent number 9,964,404
- Issue date May 8, 2018
- United Technologies Corporation
- Zhong Ouyang
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring the thickness of a layer of material, galvaniz...
- Patent number 9,797,709
- Issue date Oct 24, 2017
- ENOVASENSE
- Jean Inard-Charvin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for thermally monitoring process for forming plastic blow-mo...
- Patent number 9,778,031
- Issue date Oct 3, 2017
- Graham Packaging Company, L.P.
- Patrick M. O'Connell
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Apparatus and method of monitoring for matter accumulation on an ai...
- Patent number 9,527,595
- Issue date Dec 27, 2016
- Instrumar Limited
- Stuart Inkpen
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Method for measuring thickness by pulsed infrared thermal wave tech...
- Patent number 9,464,891
- Issue date Oct 11, 2016
- Capital Normal University
- Zhi Zeng
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring slab thickness
- Patent number 9,279,664
- Issue date Mar 8, 2016
- AVEMIS S.A.S.
- Michel Dussud
- C21 - METALLURGY OF IRON

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETECTING THE CONVECTIVE HEAT TRANSFER COEFFICIENT AND T...
- Publication number 20240247985
- Publication date Jul 25, 2024
- Fraunhofer Gesellschaft zur Forderung der angewandten Forschung e.V.
- ERHARD MAYER
- G01 - MEASURING TESTING
Information Patent Application
THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT...
- Publication number 20240219175
- Publication date Jul 4, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Yousuke IRIE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING THE THICKNESS OF REFRACTORIES
- Publication number 20240085175
- Publication date Mar 14, 2024
- Saint-Gobain do Brasil Produtos Industriais e Para Construção Ltda.
- Haysler Apolinário Amoroso LIMA
- G01 - MEASURING TESTING
Information Patent Application
INTERNAL OXIDE LAYER THICKNESS ESTIMATION DEVICE, INTERNAL OXIDE LA...
- Publication number 20230400298
- Publication date Dec 14, 2023
- NIPPON STEEL CORPORATION
- Tooru AKASHI
- G01 - MEASURING TESTING
Information Patent Application
Calculation Method for thickness of inner oxide layer of martensiti...
- Publication number 20230341242
- Publication date Oct 26, 2023
- Wuhan University
- Xue Wang
- G01 - MEASURING TESTING
Information Patent Application
PORTABLE OPTIC METROLOGY THERMAL CHAMBER MODULE AND METHOD THEREFOR
- Publication number 20230258527
- Publication date Aug 17, 2023
- OPTIKOS CORPORATION
- David Imrie
- G02 - OPTICS
Information Patent Application
ESTIMATION DEVICE, ESTIMATION METHOD, AND NON-TRANSITORY COMPUTER-R...
- Publication number 20230104465
- Publication date Apr 6, 2023
- YOKOGAWA ELECTRIC CORPORATION
- Shumpei Ito
- G01 - MEASURING TESTING
Information Patent Application
ESTIMATION DEVICE, ESTIMATION METHOD, AND NON-TRANSITORY COMPUTER-R...
- Publication number 20230105228
- Publication date Apr 6, 2023
- YOKOGAWA ELECTRIC CORPORATION
- Shumpei Ito
- G01 - MEASURING TESTING
Information Patent Application
IN-MOLD SOLIDIFIED SHELL THICKNESS ESTIMATION APPARATUS, IN-MOLD SO...
- Publication number 20220333921
- Publication date Oct 20, 2022
- JFE STEEL CORPORATION
- Ryosuke MASUDA
- B22 - CASTING POWDER METALLURGY
Information Patent Application
WATER HEATER, AND SCALE DETECTION SYSTEM AND METHOD
- Publication number 20220187065
- Publication date Jun 16, 2022
- A.O. SMITH (CHINA) WATER HEATER CO., LTD.
- Tao CHEN
- F24 - HEATING RANGES VENTILATING
Information Patent Application
Method and Apparatus for Determining a Layer Thickness of a Layer A...
- Publication number 20220107178
- Publication date Apr 7, 2022
- Stefan Böttger
- G01 - MEASURING TESTING
Information Patent Application
A METHOD FOR ESTIMATING A POWDER LAYER THICKNESS
- Publication number 20220042797
- Publication date Feb 10, 2022
- Arcam AB
- Anders Snis
- B22 - CASTING POWDER METALLURGY
Information Patent Application
THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT...
- Publication number 20210364282
- Publication date Nov 25, 2021
- Panasonic Intellectual Property Management Co., Ltd.
- Yousuke IRIE
- G01 - MEASURING TESTING
Information Patent Application
OXIDE FILM THICKNESS MEASUREMENT DEVICE AND METHOD
- Publication number 20210356253
- Publication date Nov 18, 2021
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Masahiro INUI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PERFORMING VISUALIZED MEASUREMENT ON THICKNESS DISTRIBUTI...
- Publication number 20210223037
- Publication date Jul 22, 2021
- Korea Advanced Institute of Science and Technology
- Hoon Sohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CALCULATING THICKNESS OF OXIDE FILM OF MARTENSITE HEAT-R...
- Publication number 20210202050
- Publication date Jul 1, 2021
- China Energy Science and Technology Research Institute Co., Ltd.
- Yalin ZHANG
- G01 - MEASURING TESTING
Information Patent Application
SCALE THICKNESS ESTIMATION SYSTEM, SCALE THICKNESS ESTIMATION METHO...
- Publication number 20210108917
- Publication date Apr 15, 2021
- National University Corporation Tokyo University of Marine Science and Techno...
- Tatsuya HAZUKU
- G01 - MEASURING TESTING
Information Patent Application
Method for Measuring the Wall Thickness of a Hollow Glass Article
- Publication number 20210041233
- Publication date Feb 11, 2021
- Heye International GmbH
- Dirk Pörtner
- G01 - MEASURING TESTING
Information Patent Application
PORTABLE OPTIC METROLOGY THERMAL CHAMBER MODULE AND METHOD THEREFOR
- Publication number 20200249119
- Publication date Aug 6, 2020
- OPTIKOS CORPORATION
- David Imrie
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING PROCESS CONTROL WITH DEEP LEARNING-BASED PREDICTIVE M...
- Publication number 20200172989
- Publication date Jun 4, 2020
- International Business Machines Corporation
- Young Min Lee
- C21 - METALLURGY OF IRON
Information Patent Application
System and Method for Optimizing a Manufacturing Process Based on a...
- Publication number 20200173943
- Publication date Jun 4, 2020
- GENERAL ELECTRIC COMPANY
- Eric John Ruggiero
- G01 - MEASURING TESTING
Information Patent Application
DEPOSIT MONITOR
- Publication number 20190234893
- Publication date Aug 1, 2019
- ECOLAB USA INC.
- Mita Chattoraj
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PREDICTING THICKNESS OF OXIDE LAYER OF SILICON WAFER
- Publication number 20190131191
- Publication date May 2, 2019
- SK SILTRON CO., LTD.
- Jung Kil PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING PROCESS CONTROL WITH DEEP LEARNING-BASED PREDICTIVE M...
- Publication number 20190093187
- Publication date Mar 28, 2019
- International Business Machines Corporation
- Young Min Lee
- C21 - METALLURGY OF IRON
Information Patent Application
MANUFACTURING PROCESS CONTROL WITH DEEP LEARNING-BASED PREDICTIVE M...
- Publication number 20190093186
- Publication date Mar 28, 2019
- International Business Machines Corporation
- Young Min Lee
- C21 - METALLURGY OF IRON
Information Patent Application
METHODS AND APPARATUS FOR MANUFACTURING GLASS
- Publication number 20180297884
- Publication date Oct 18, 2018
- Corning Incorporated
- Tomohiro Aburada
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Application
METHOD FOR COATING A SURFACE OF A METAL STRIP AND A METAL STRIP-COA...
- Publication number 20180202954
- Publication date Jul 19, 2018
- ThyssenKrupp Steel Europe AG
- Thomas MÖLLER
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
Method of Manufacturing Semiconductor Device, Substrate Processing...
- Publication number 20180171467
- Publication date Jun 21, 2018
- Hitachi Kokusai Electric Inc.
- Hiroki HATTA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
BATCH AND CONTINUOUS METHODS FOR EVALUATING THE PHYSICAL AND THERMA...
- Publication number 20180066940
- Publication date Mar 8, 2018
- ALLIANCE FOR SUSTAINABLE ENERGY, LLC
- Bhushan Lal Sopori
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR THERMALLY MONITORING PROCESS FOR FORMING PLAS...
- Publication number 20170343342
- Publication date Nov 30, 2017
- GRAHAM PACKAGING COMPANY, L.P
- Patrick M. O'Connell
- G01 - MEASURING TESTING

using thermal means

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for measuring the wall thickness of a hollow glass article

Portable optic metrology thermal chamber module and method therefor

Temperature sensing arrayal for freeboard detection

Thickness measurement method, thickness measurement device, defect...

Water heater, and scale detection system and method

Oxide film thickness measurement device and method

Portable optic metrology thermal chamber module and method therefor

Method of performing visualized measurement on thickness distributi...

System and method for optimizing a manufacturing process based on a...

Manufacturing process control with deep learning-based predictive m...

Thermographic examination means and method for non-destructive exam...

System and method for large sample analysis of thin film

Thickness measurement method, thickness measurement device, defect...

Inspection of a shoe with a thermal camera

Deposit monitor

Method for coating a surface of a metal strip and a metal strip-coa...

Variable temperature controlled soldering iron

Batch and continuous methods for evaluating the physical and therma...

Manufacturing process control with deep learning-based predictive m...

Method for predicting thickness of oxide layer of silicon wafer

Manufacturing process control with deep learning-based predictive m...

System and method for accretion detection

Deposit monitor

Pipeline constriction detection

Flash thermography double wall thickness measurement

Method for measuring the thickness of a layer of material, galvaniz...

Method for thermally monitoring process for forming plastic blow-mo...

Apparatus and method of monitoring for matter accumulation on an ai...

Method for measuring thickness by pulsed infrared thermal wave tech...

Device for measuring slab thickness

Patents Applicationslast 30 patents

METHOD FOR DETECTING THE CONVECTIVE HEAT TRANSFER COEFFICIENT AND T...

THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT...

SYSTEM AND METHOD FOR MEASURING THE THICKNESS OF REFRACTORIES

INTERNAL OXIDE LAYER THICKNESS ESTIMATION DEVICE, INTERNAL OXIDE LA...

Calculation Method for thickness of inner oxide layer of martensiti...

PORTABLE OPTIC METROLOGY THERMAL CHAMBER MODULE AND METHOD THEREFOR

ESTIMATION DEVICE, ESTIMATION METHOD, AND NON-TRANSITORY COMPUTER-R...

ESTIMATION DEVICE, ESTIMATION METHOD, AND NON-TRANSITORY COMPUTER-R...

IN-MOLD SOLIDIFIED SHELL THICKNESS ESTIMATION APPARATUS, IN-MOLD SO...

WATER HEATER, AND SCALE DETECTION SYSTEM AND METHOD

Method and Apparatus for Determining a Layer Thickness of a Layer A...

A METHOD FOR ESTIMATING A POWDER LAYER THICKNESS

THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT...

OXIDE FILM THICKNESS MEASUREMENT DEVICE AND METHOD

METHOD OF PERFORMING VISUALIZED MEASUREMENT ON THICKNESS DISTRIBUTI...

METHOD FOR CALCULATING THICKNESS OF OXIDE FILM OF MARTENSITE HEAT-R...

SCALE THICKNESS ESTIMATION SYSTEM, SCALE THICKNESS ESTIMATION METHO...

Method for Measuring the Wall Thickness of a Hollow Glass Article

PORTABLE OPTIC METROLOGY THERMAL CHAMBER MODULE AND METHOD THEREFOR

MANUFACTURING PROCESS CONTROL WITH DEEP LEARNING-BASED PREDICTIVE M...

System and Method for Optimizing a Manufacturing Process Based on a...

DEPOSIT MONITOR

METHOD FOR PREDICTING THICKNESS OF OXIDE LAYER OF SILICON WAFER

MANUFACTURING PROCESS CONTROL WITH DEEP LEARNING-BASED PREDICTIVE M...

MANUFACTURING PROCESS CONTROL WITH DEEP LEARNING-BASED PREDICTIVE M...

METHODS AND APPARATUS FOR MANUFACTURING GLASS

METHOD FOR COATING A SURFACE OF A METAL STRIP AND A METAL STRIP-COA...

Method of Manufacturing Semiconductor Device, Substrate Processing...

BATCH AND CONTINUOUS METHODS FOR EVALUATING THE PHYSICAL AND THERMA...

METHOD AND SYSTEM FOR THERMALLY MONITORING PROCESS FOR FORMING PLAS...