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Vanadium [V] as principal constituent
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H01L2224/13672
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ELECTRICITY
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Electric elements
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SEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
H01L2224/00
Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
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H01L2224/13672
Vanadium [V] as principal constituent
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last 30 patents
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Patent Grant
Interconnect crack arrestor structure and methods
Patent number
11,257,767
Issue date
Feb 22, 2022
Taiwan Semiconductor Manufacturing Company, Ltd
Chen-Hua Yu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Interconnect crack arrestor structure and methods
Patent number
10,340,226
Issue date
Jul 2, 2019
Taiwan Semiconductor Manufacturing Company, Ltd.
Chen-Hua Yu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pillar design for conductive bump
Patent number
9,953,948
Issue date
Apr 24, 2018
Taiwan Semiconductor Manufacturing Company
Cheng-Chieh Hsieh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor packages
Patent number
9,698,088
Issue date
Jul 4, 2017
Samsung Electronics Co., Ltd.
Heungkyu Kwon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Interconnect crack arrestor structure and methods
Patent number
9,230,932
Issue date
Jan 5, 2016
Taiwan Semiconductor Manufacturing Company, Ltd.
Chen-Hua Yu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pillar design for conductive bump
Patent number
8,816,498
Issue date
Aug 26, 2014
Taiwan Semiconductor Manufacturing Company, Ltd.
Cheng-Chieh Hsieh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Metal bump formation
Patent number
8,501,615
Issue date
Aug 6, 2013
Taiwan Semiconductor Manufacturing Company, Ltd.
Ming-Da Cheng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming dual height solder interconnections
Patent number
5,251,806
Issue date
Oct 12, 1993
International Business Machines Corporation
Birendra N. Agarwala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Solder mass having conductive encapsulating arrangement
Patent number
5,130,779
Issue date
Jul 14, 1992
International Business Machines Corporation
Birendra N. Agarwala
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Interconnect Crack Arrestor Structure and Methods
Publication number
20190326228
Publication date
Oct 24, 2019
Taiwan Semiconductor Manufacturing Company, Ltd.
Chen-Hua Yu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Pillar Design for Conductive Bump
Publication number
20140361432
Publication date
Dec 11, 2014
Cheng-Chieh Hsieh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Interconnect Crack Arrestor Structure and Methods
Publication number
20130207239
Publication date
Aug 15, 2013
Taiwan Semiconductor Manufacturing Company, Ltd.
Chen-Hua Yu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Pillar Design for Conductive Bump
Publication number
20130020698
Publication date
Jan 24, 2013
Taiwan Semiconductor Manufacturing Company, Ltd.
Cheng-Chieh Hsieh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Metal Bump Formation
Publication number
20120322255
Publication date
Dec 20, 2012
Taiwan Semiconductor Manufacturing Company, Ltd.
Ming-Da Cheng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR PACKAGES
Publication number
20120299197
Publication date
Nov 29, 2012
Samsung Electronics Co., Ltd.
Heungkyu KWON
H01 - BASIC ELECTRIC ELEMENTS