Vanadium [V] as principal constituent

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    Interconnect Crack Arrestor Structure and Methods

    • Publication number 20190326228
    • Publication date Oct 24, 2019
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Chen-Hua Yu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Pillar Design for Conductive Bump

    • Publication number 20140361432
    • Publication date Dec 11, 2014
    • Cheng-Chieh Hsieh
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Interconnect Crack Arrestor Structure and Methods

    • Publication number 20130207239
    • Publication date Aug 15, 2013
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Chen-Hua Yu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Pillar Design for Conductive Bump

    • Publication number 20130020698
    • Publication date Jan 24, 2013
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Cheng-Chieh Hsieh
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Metal Bump Formation

    • Publication number 20120322255
    • Publication date Dec 20, 2012
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Ming-Da Cheng
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR PACKAGES

    • Publication number 20120299197
    • Publication date Nov 29, 2012
    • Samsung Electronics Co., Ltd.
    • Heungkyu KWON
    • H01 - BASIC ELECTRIC ELEMENTS