Voltage or current aspects

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G01R31/31924

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/31924Voltage or current aspects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Bias generator testing using grouped bias currents
- Patent number 12,174,253
- Issue date Dec 24, 2024
- NXP B.V.
- Cristian Pavao Moreira
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 12,163,999
- Issue date Dec 10, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monitoring circuit, integrated circuit including the same, and oper...
- Patent number 12,158,501
- Issue date Dec 3, 2024
- Samsung Electronics Co., Ltd.
- Yongwoo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Tester channel multiplexing in test equipment
- Patent number 12,136,958
- Issue date Nov 5, 2024
- Yangtze Memory Technologies Co., Ltd.
- Yangyang Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test interface circuit
- Patent number 12,130,331
- Issue date Oct 29, 2024
- NANYA TECHNOLOGY CORPORATION
- Che-Wei Chen
- G01 - MEASURING TESTING
Information Patent Grant
Clock conversion device, test system having the same, and method of...
- Patent number 12,032,019
- Issue date Jul 9, 2024
- Samsung Electronics Co., Ltd.
- Yongjeong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power consumption measurement assembly and method, and chip power c...
- Patent number 12,032,022
- Issue date Jul 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xinwang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method for semiconductor device interface circuitry functionality a...
- Patent number 12,025,663
- Issue date Jul 2, 2024
- Celerint, LLC
- Howard H. Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Device under test (DUT) measurement circuit having harmonic minimiz...
- Patent number 12,000,892
- Issue date Jun 4, 2024
- Texas Instruments Incorporated
- Charles Kasimer Sestok
- G01 - MEASURING TESTING
Information Patent Grant
DC resistance measurement contact checking via alternating current...
- Patent number 11,994,545
- Issue date May 28, 2024
- National Instruments Corporation
- Chin-Hong Cheah
- G01 - MEASURING TESTING
Information Patent Grant
Process for scan chain in a memory
- Patent number 11,971,448
- Issue date Apr 30, 2024
- Ceremorphic, Inc.
- Robert F. Wiser
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Multi-die debug stop clock trigger
- Patent number 11,946,969
- Issue date Apr 2, 2024
- Apple Inc.
- Charles J. Fleckenstein
- G01 - MEASURING TESTING
Information Patent Grant
Output voltage glitch reduction in ate systems
- Patent number 11,940,496
- Issue date Mar 26, 2024
- Analog Devices, Inc.
- Michael E. Harrell
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Determining charge pump efficiency using clock edge counting
- Patent number 11,927,635
- Issue date Mar 12, 2024
- SanDisk Technologies LLC
- Keyur Payak
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 11,860,221
- Issue date Jan 2, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit simulation test method and apparatus, device, and medium
- Patent number 11,846,674
- Issue date Dec 19, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Feng Lin
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and a method for measuring a device current of a device u...
- Patent number 11,821,944
- Issue date Nov 21, 2023
- Infineon Technologies AG
- Josef-Paul Schaffer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement system and method of measuring a device under test
- Patent number 11,821,948
- Issue date Nov 21, 2023
- Rohde & Schwarz GmbH & Co. KG
- Philipp Weigell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Identifying data valid windows
- Patent number 11,815,554
- Issue date Nov 14, 2023
- Micron Technology, Inc.
- Phillip A. Rasmussen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Decoupling BTI and HCI mechanism in ring oscillator
- Patent number 11,789,064
- Issue date Oct 17, 2023
- International Business Machines Corporation
- Huimei Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection system and detection method
- Patent number 11,782,093
- Issue date Oct 10, 2023
- AmTRAN TECHNOLOGY Co., Ltd
- Yen-Ting Tung
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Estimation of unknown electronic load
- Patent number 11,768,248
- Issue date Sep 26, 2023
- KEITHLEY INSTRUMENTS, LLC
- William C. Weeman
- G01 - MEASURING TESTING
Information Patent Grant
Signal generator and a method for controlling the signal generator
- Patent number 11,762,016
- Issue date Sep 19, 2023
- Anritsu Corporation
- Jesse Paulo Valencia Macabasco
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pulsed high current technique for characterization of device under...
- Patent number 11,705,894
- Issue date Jul 18, 2023
- KEITHLEY INSTRUMENTS, LLC
- Gregory Sobolewski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scan chain for memory with reduced power consumption
- Patent number 11,693,056
- Issue date Jul 4, 2023
- Ceremorphic, Inc.
- Robert F. Wiser
- G01 - MEASURING TESTING
Information Patent Grant
Path loss compensation for comparator
- Patent number 11,686,773
- Issue date Jun 27, 2023
- Analog Devices, Inc.
- Christopher C. McQuilkin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Built-in self-test circuit and temperature measurement circuit incl...
- Patent number 11,686,766
- Issue date Jun 27, 2023
- Samsung Electronics Co., Ltd.
- Junhee Shin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and device for monitoring connection of semiconductor of pow...
- Patent number 11,630,154
- Issue date Apr 18, 2023
- Mitsubishi Electric Corporation
- Jeffrey Ewanchuk
- G01 - MEASURING TESTING
Information Patent Grant
Temporal resolution control for temporal point spread function gene...
- Patent number 11,607,132
- Issue date Mar 21, 2023
- HI LLC
- Bruno Do Valle
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit test apparatus
- Patent number 11,587,634
- Issue date Feb 21, 2023
- Hyundai Mobis Co., Ltd.
- Yeon-Ho Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
GENERATING A TEST PROGRAM
- Publication number 20240426906
- Publication date Dec 26, 2024
- Teradyne, Inc.
- Charles J. Carline
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURABLE PIN DRIVER CIRCUIT OUTPUT IMPEDANCE BACKGROUND
- Publication number 20240418777
- Publication date Dec 19, 2024
- Analog Devices, Inc.
- Christopher C. McQuilkin
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND ELECTRONIC CONTROL DEVICE
- Publication number 20240377451
- Publication date Nov 14, 2024
- DENSO CORPORATION
- RYUKI TOMOHIRO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SEMICONDUCTOR DEVICE INTERFACE CIRCUITRY FUNCTIONALITY A...
- Publication number 20240361386
- Publication date Oct 31, 2024
- CELERINT, LLC.
- Howard H. ROBERTS
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT AND TEST APPARATUS COMPRISING THE TEST CIRCUIT
- Publication number 20240337694
- Publication date Oct 10, 2024
- MONTAGE TECHNOLOGY CO., LTD.
- Dongming LOU
- G01 - MEASURING TESTING
Information Patent Application
DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...
- Publication number 20240310440
- Publication date Sep 19, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Charles Kasimer SESTOK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST LOAD CIRCUIT
- Publication number 20240241189
- Publication date Jul 18, 2024
- QUANTA COMPUTER INC.
- Kuo-Chan HSU
- G01 - MEASURING TESTING
Information Patent Application
TEST INTERFACE CIRCUIT
- Publication number 20240110980
- Publication date Apr 4, 2024
- NANYA TECHNOLOGY CORPORATION
- Che-Wei Chen
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20240103068
- Publication date Mar 28, 2024
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR ACCESSING REMOTE TEST DATA REGISTERS
- Publication number 20240103077
- Publication date Mar 28, 2024
- Intel Corporation
- Rakesh KANDULA
- G01 - MEASURING TESTING
Information Patent Application
FAILURE INSERTION UNIT
- Publication number 20240094294
- Publication date Mar 21, 2024
- dSPACE GmbH
- Bjoern MUELLER
- G01 - MEASURING TESTING
Information Patent Application
TEST BOARD AND TEST METHOD FOR SEMICONDUCTOR DEVICE USING THE SAME
- Publication number 20240077535
- Publication date Mar 7, 2024
- Samsung Electronics Co., Ltd.
- Soonil KWON
- G01 - MEASURING TESTING
Information Patent Application
125V SWITCH GLITCH MITIGATION
- Publication number 20240036114
- Publication date Feb 1, 2024
- Analog Devices International Unlimited Company
- David Aherne
- G01 - MEASURING TESTING
Information Patent Application
ESTIMATION OF UNKNOWN ELECTRONIC LOAD
- Publication number 20230393213
- Publication date Dec 7, 2023
- KEITHLEY INSTRUMENTS, LLC
- William C. Weeman
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING CHARGE PUMP EFFICIENCY USING CLOCK EDGE COUNTING
- Publication number 20230349972
- Publication date Nov 2, 2023
- KEYUR PAYAK
- G01 - MEASURING TESTING
Information Patent Application
BIAS GENERATOR TESTING USING GROUPED BIAS CURRENTS
- Publication number 20230333161
- Publication date Oct 19, 2023
- NXP B.V.
- Cristian Pavao Moreira
- G01 - MEASURING TESTING
Information Patent Application
Process for Scan Chain in a Memory
- Publication number 20230296672
- Publication date Sep 21, 2023
- Ceremorphic, Inc.
- Robert F. Wiser
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...
- Publication number 20230280398
- Publication date Sep 7, 2023
- Samsung Electronics Co., Ltd.
- Junhee Shin
- G01 - MEASURING TESTING
Information Patent Application
OUTPUT VOLTAGE COMPENSATION METHOD
- Publication number 20230251313
- Publication date Aug 10, 2023
- Chih-Huan FANG
- G01 - MEASURING TESTING
Information Patent Application
Scan Chain for Memory with Reduced Power Consumption
- Publication number 20230194607
- Publication date Jun 22, 2023
- Ceremorphic, Inc.
- Shakti SINGH
- G01 - MEASURING TESTING
Information Patent Application
OUTPUT VOLTAGE GLITCH REDUCTION IN ATE SYSTEMS
- Publication number 20230114208
- Publication date Apr 13, 2023
- Analog Devices, Inc.
- Michael E. Harrell
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MONITORING CIRCUIT, INTEGRATED CIRCUIT INCLUDING THE SAME, AND OPER...
- Publication number 20230068821
- Publication date Mar 2, 2023
- Samsung Electronics Co., Ltd.
- Yongwoo KIM
- G05 - CONTROLLING REGULATING
Information Patent Application
CIRCUIT SIMULATION TEST METHOD AND APPARATUS, DEVICE, AND MEDIUM
- Publication number 20230032066
- Publication date Feb 2, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Feng Lin
- G01 - MEASURING TESTING
Information Patent Application
Multi-Die Debug Stop Clock Trigger
- Publication number 20230025207
- Publication date Jan 26, 2023
- Apple Inc.
- Charles J. Fleckenstein
- G01 - MEASURING TESTING
Information Patent Application
SHORT PATTERN WAVEFORM DATABASE BASED MACHINE LEARNING FOR MEASUREMENT
- Publication number 20220373598
- Publication date Nov 24, 2022
- Tektronix, Inc.
- Kan TAN
- G01 - MEASURING TESTING
Information Patent Application
DC Resistance Measurement Contact Checking via Alternating Current...
- Publication number 20220365123
- Publication date Nov 17, 2022
- National Instruments Corporation
- Chin-Hong CHEAH
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and a Method for Measuring a Device Current of a Device U...
- Publication number 20220268834
- Publication date Aug 25, 2022
- INFINEON TECHNOLOGIES AG
- Josef-Paul Schaffer
- G01 - MEASURING TESTING
Information Patent Application
DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...
- Publication number 20220268838
- Publication date Aug 25, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Charles Kasimer SESTOK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SIGNAL GENERATOR AND A METHOD FOR CONTROLLING THE SIGNAL GENERATOR
- Publication number 20220236327
- Publication date Jul 28, 2022
- Anritsu Corporation
- Jesse Paulo Valencia MACABASCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IDENTIFYING DATA VALID WINDOWS
- Publication number 20220229108
- Publication date Jul 21, 2022
- Micron Technology, Inc.
- Phillip A. Rasmussen
- G01 - MEASURING TESTING

Voltage or current aspects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Bias generator testing using grouped bias currents

Apparatus for testing electronic devices

Monitoring circuit, integrated circuit including the same, and oper...

Tester channel multiplexing in test equipment

Test interface circuit

Clock conversion device, test system having the same, and method of...

Power consumption measurement assembly and method, and chip power c...

Method for semiconductor device interface circuitry functionality a...

Device under test (DUT) measurement circuit having harmonic minimiz...

DC resistance measurement contact checking via alternating current...

Process for scan chain in a memory

Multi-die debug stop clock trigger

Output voltage glitch reduction in ate systems

Determining charge pump efficiency using clock edge counting

Apparatus for testing electronic devices

Circuit simulation test method and apparatus, device, and medium

Apparatus and a method for measuring a device current of a device u...

Measurement system and method of measuring a device under test

Identifying data valid windows

Decoupling BTI and HCI mechanism in ring oscillator

Detection system and detection method

Estimation of unknown electronic load

Signal generator and a method for controlling the signal generator

Pulsed high current technique for characterization of device under...

Scan chain for memory with reduced power consumption

Path loss compensation for comparator

Built-in self-test circuit and temperature measurement circuit incl...

Method and device for monitoring connection of semiconductor of pow...

Temporal resolution control for temporal point spread function gene...

Integrated circuit test apparatus

Patents Applicationslast 30 patents

GENERATING A TEST PROGRAM

CONFIGURABLE PIN DRIVER CIRCUIT OUTPUT IMPEDANCE BACKGROUND

INSPECTION DEVICE AND ELECTRONIC CONTROL DEVICE

METHOD FOR SEMICONDUCTOR DEVICE INTERFACE CIRCUITRY FUNCTIONALITY A...

TEST CIRCUIT AND TEST APPARATUS COMPRISING THE TEST CIRCUIT

DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...

TEST LOAD CIRCUIT

TEST INTERFACE CIRCUIT

APPARATUS FOR TESTING ELECTRONIC DEVICES

METHOD AND APPARATUS FOR ACCESSING REMOTE TEST DATA REGISTERS

FAILURE INSERTION UNIT

TEST BOARD AND TEST METHOD FOR SEMICONDUCTOR DEVICE USING THE SAME

125V SWITCH GLITCH MITIGATION

ESTIMATION OF UNKNOWN ELECTRONIC LOAD

DETERMINING CHARGE PUMP EFFICIENCY USING CLOCK EDGE COUNTING

BIAS GENERATOR TESTING USING GROUPED BIAS CURRENTS

Process for Scan Chain in a Memory

BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...

OUTPUT VOLTAGE COMPENSATION METHOD

Scan Chain for Memory with Reduced Power Consumption

OUTPUT VOLTAGE GLITCH REDUCTION IN ATE SYSTEMS

MONITORING CIRCUIT, INTEGRATED CIRCUIT INCLUDING THE SAME, AND OPER...

CIRCUIT SIMULATION TEST METHOD AND APPARATUS, DEVICE, AND MEDIUM

Multi-Die Debug Stop Clock Trigger

SHORT PATTERN WAVEFORM DATABASE BASED MACHINE LEARNING FOR MEASUREMENT

DC Resistance Measurement Contact Checking via Alternating Current...

Apparatus and a Method for Measuring a Device Current of a Device U...

DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...

SIGNAL GENERATOR AND A METHOD FOR CONTROLLING THE SIGNAL GENERATOR

IDENTIFYING DATA VALID WINDOWS