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G01R31/31924
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/31924
Voltage or current aspects
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Process for scan chain in a memory
Patent number
11,971,448
Issue date
Apr 30, 2024
Ceremorphic, Inc.
Robert F. Wiser
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Multi-die debug stop clock trigger
Patent number
11,946,969
Issue date
Apr 2, 2024
Apple Inc.
Charles J. Fleckenstein
G01 - MEASURING TESTING
Information
Patent Grant
Output voltage glitch reduction in ate systems
Patent number
11,940,496
Issue date
Mar 26, 2024
Analog Devices, Inc.
Michael E. Harrell
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Determining charge pump efficiency using clock edge counting
Patent number
11,927,635
Issue date
Mar 12, 2024
SanDisk Technologies LLC
Keyur Payak
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for testing electronic devices
Patent number
11,860,221
Issue date
Jan 2, 2024
AEHR Test Systems
Donald P. Richmond
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Circuit simulation test method and apparatus, device, and medium
Patent number
11,846,674
Issue date
Dec 19, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC.
Feng Lin
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and a method for measuring a device current of a device u...
Patent number
11,821,944
Issue date
Nov 21, 2023
Infineon Technologies AG
Josef-Paul Schaffer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Measurement system and method of measuring a device under test
Patent number
11,821,948
Issue date
Nov 21, 2023
Rohde & Schwarz GmbH & Co. KG
Philipp Weigell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Identifying data valid windows
Patent number
11,815,554
Issue date
Nov 14, 2023
Micron Technology, Inc.
Phillip A. Rasmussen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Decoupling BTI and HCI mechanism in ring oscillator
Patent number
11,789,064
Issue date
Oct 17, 2023
International Business Machines Corporation
Huimei Zhou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detection system and detection method
Patent number
11,782,093
Issue date
Oct 10, 2023
AmTRAN TECHNOLOGY Co., Ltd
Yen-Ting Tung
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Estimation of unknown electronic load
Patent number
11,768,248
Issue date
Sep 26, 2023
KEITHLEY INSTRUMENTS, LLC
William C. Weeman
G01 - MEASURING TESTING
Information
Patent Grant
Signal generator and a method for controlling the signal generator
Patent number
11,762,016
Issue date
Sep 19, 2023
Anritsu Corporation
Jesse Paulo Valencia Macabasco
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pulsed high current technique for characterization of device under...
Patent number
11,705,894
Issue date
Jul 18, 2023
KEITHLEY INSTRUMENTS, LLC
Gregory Sobolewski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scan chain for memory with reduced power consumption
Patent number
11,693,056
Issue date
Jul 4, 2023
Ceremorphic, Inc.
Robert F. Wiser
G01 - MEASURING TESTING
Information
Patent Grant
Path loss compensation for comparator
Patent number
11,686,773
Issue date
Jun 27, 2023
Analog Devices, Inc.
Christopher C. McQuilkin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Built-in self-test circuit and temperature measurement circuit incl...
Patent number
11,686,766
Issue date
Jun 27, 2023
Samsung Electronics Co., Ltd.
Junhee Shin
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and device for monitoring connection of semiconductor of pow...
Patent number
11,630,154
Issue date
Apr 18, 2023
Mitsubishi Electric Corporation
Jeffrey Ewanchuk
G01 - MEASURING TESTING
Information
Patent Grant
Temporal resolution control for temporal point spread function gene...
Patent number
11,607,132
Issue date
Mar 21, 2023
HI LLC
Bruno Do Valle
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit test apparatus
Patent number
11,587,634
Issue date
Feb 21, 2023
Hyundai Mobis Co., Ltd.
Yeon-Ho Kim
G01 - MEASURING TESTING
Information
Patent Grant
Electrical testing apparatus for spintronics devices
Patent number
11,573,270
Issue date
Feb 7, 2023
Taiwan Semiconductor Manufacturing Company, Ltd
Guenole Jan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Circuit measuring device and method
Patent number
11,543,455
Issue date
Jan 3, 2023
Anpec Electronics Corporation
Chuang-Shun Xu
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Multi-die debug stop clock trigger
Patent number
11,422,184
Issue date
Aug 23, 2022
Apple Inc.
Charles J. Fleckenstein
G01 - MEASURING TESTING
Information
Patent Grant
Status check for a switch
Patent number
11,346,881
Issue date
May 31, 2022
Infineon Technologies AG
Denis Bilstein
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for non-invasive current estimation
Patent number
11,300,616
Issue date
Apr 12, 2022
Mayo Foundation for Medical Education and Research
Jonathan L. Fasig
G01 - MEASURING TESTING
Information
Patent Grant
Chip testing circuit and testing method thereof
Patent number
11,287,466
Issue date
Mar 29, 2022
ONE TEST SYSTEMS
Chen-Lung Tsai
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device having chip-to-chip bonding structure
Patent number
11,282,819
Issue date
Mar 22, 2022
SK hynix Inc.
Sung Lae Oh
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus for testing electronic devices
Patent number
11,255,903
Issue date
Feb 22, 2022
AEHR Test Systems
Donald P. Richmond
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Low power active load
Patent number
11,209,485
Issue date
Dec 28, 2021
Patrick G. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
System and method for performing a test procedure
Patent number
11,142,345
Issue date
Oct 12, 2021
Textron Innovations Inc.
Sébastien Giroux
G05 - CONTROLLING REGULATING
Patents Applications
last 30 patents
Information
Patent Application
TEST INTERFACE CIRCUIT
Publication number
20240110980
Publication date
Apr 4, 2024
NANYA TECHNOLOGY CORPORATION
Che-Wei Chen
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR ACCESSING REMOTE TEST DATA REGISTERS
Publication number
20240103077
Publication date
Mar 28, 2024
Intel Corporation
Rakesh KANDULA
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
Publication number
20240103068
Publication date
Mar 28, 2024
Aehr Test Systems
Donald P. Richmond
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FAILURE INSERTION UNIT
Publication number
20240094294
Publication date
Mar 21, 2024
dSPACE GmbH
Bjoern MUELLER
G01 - MEASURING TESTING
Information
Patent Application
TEST BOARD AND TEST METHOD FOR SEMICONDUCTOR DEVICE USING THE SAME
Publication number
20240077535
Publication date
Mar 7, 2024
Samsung Electronics Co., Ltd.
Soonil KWON
G01 - MEASURING TESTING
Information
Patent Application
125V SWITCH GLITCH MITIGATION
Publication number
20240036114
Publication date
Feb 1, 2024
Analog Devices International Unlimited Company
David Aherne
G01 - MEASURING TESTING
Information
Patent Application
ESTIMATION OF UNKNOWN ELECTRONIC LOAD
Publication number
20230393213
Publication date
Dec 7, 2023
KEITHLEY INSTRUMENTS, LLC
William C. Weeman
G01 - MEASURING TESTING
Information
Patent Application
DETERMINING CHARGE PUMP EFFICIENCY USING CLOCK EDGE COUNTING
Publication number
20230349972
Publication date
Nov 2, 2023
KEYUR PAYAK
G01 - MEASURING TESTING
Information
Patent Application
BIAS GENERATOR TESTING USING GROUPED BIAS CURRENTS
Publication number
20230333161
Publication date
Oct 19, 2023
NXP B.V.
Cristian Pavao Moreira
G01 - MEASURING TESTING
Information
Patent Application
Process for Scan Chain in a Memory
Publication number
20230296672
Publication date
Sep 21, 2023
Ceremorphic, Inc.
Robert F. Wiser
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...
Publication number
20230280398
Publication date
Sep 7, 2023
Samsung Electronics Co., Ltd.
Junhee Shin
G01 - MEASURING TESTING
Information
Patent Application
OUTPUT VOLTAGE COMPENSATION METHOD
Publication number
20230251313
Publication date
Aug 10, 2023
Chih-Huan FANG
G01 - MEASURING TESTING
Information
Patent Application
Scan Chain for Memory with Reduced Power Consumption
Publication number
20230194607
Publication date
Jun 22, 2023
Ceremorphic, Inc.
Shakti SINGH
G01 - MEASURING TESTING
Information
Patent Application
OUTPUT VOLTAGE GLITCH REDUCTION IN ATE SYSTEMS
Publication number
20230114208
Publication date
Apr 13, 2023
Analog Devices, Inc.
Michael E. Harrell
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
MONITORING CIRCUIT, INTEGRATED CIRCUIT INCLUDING THE SAME, AND OPER...
Publication number
20230068821
Publication date
Mar 2, 2023
Samsung Electronics Co., Ltd.
Yongwoo KIM
G05 - CONTROLLING REGULATING
Information
Patent Application
CIRCUIT SIMULATION TEST METHOD AND APPARATUS, DEVICE, AND MEDIUM
Publication number
20230032066
Publication date
Feb 2, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC
Feng Lin
G01 - MEASURING TESTING
Information
Patent Application
Multi-Die Debug Stop Clock Trigger
Publication number
20230025207
Publication date
Jan 26, 2023
Apple Inc.
Charles J. Fleckenstein
G01 - MEASURING TESTING
Information
Patent Application
SHORT PATTERN WAVEFORM DATABASE BASED MACHINE LEARNING FOR MEASUREMENT
Publication number
20220373598
Publication date
Nov 24, 2022
Tektronix, Inc.
Kan TAN
G01 - MEASURING TESTING
Information
Patent Application
DC Resistance Measurement Contact Checking via Alternating Current...
Publication number
20220365123
Publication date
Nov 17, 2022
National Instruments Corporation
Chin-Hong CHEAH
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and a Method for Measuring a Device Current of a Device U...
Publication number
20220268834
Publication date
Aug 25, 2022
INFINEON TECHNOLOGIES AG
Josef-Paul Schaffer
G01 - MEASURING TESTING
Information
Patent Application
DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...
Publication number
20220268838
Publication date
Aug 25, 2022
TEXAS INSTRUMENTS INCORPORATED
Charles Kasimer SESTOK
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SIGNAL GENERATOR AND A METHOD FOR CONTROLLING THE SIGNAL GENERATOR
Publication number
20220236327
Publication date
Jul 28, 2022
Anritsu Corporation
Jesse Paulo Valencia MACABASCO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IDENTIFYING DATA VALID WINDOWS
Publication number
20220229108
Publication date
Jul 21, 2022
Micron Technology, Inc.
Phillip A. Rasmussen
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT MEASURING DEVICE AND METHOD
Publication number
20220170984
Publication date
Jun 2, 2022
ANPEC ELECTRONICS CORPORATION
CHUANG-SHUN XU
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Application
MEASUREMENT SYSTEM AND METHOD OF MEASURING A DEVICE UNDER TEST
Publication number
20220155369
Publication date
May 19, 2022
ROHDE & SCHWARZ GMBH & CO. KG
Philipp Weigell
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
Publication number
20220137121
Publication date
May 5, 2022
Aehr Test Systems
Donald P. Richmond
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND DEVICE FOR MONITORING CONNECTION OF SEMICONDUCTOR OF POW...
Publication number
20220107363
Publication date
Apr 7, 2022
Mitsubishi Electric Corporation
Jeffrey EWANCHUK
G01 - MEASURING TESTING
Information
Patent Application
POWER CONSUMPTION MEASUREMENT ASSEMBLY AND METHOD, AND CHIP POWER C...
Publication number
20220099741
Publication date
Mar 31, 2022
CHANGXIN MEMORY TECHNOLOGIES, INC
Xinwang CHEN
G01 - MEASURING TESTING
Information
Patent Application
DETECTION SYSTEM AND DETECTION METHOD
Publication number
20210373076
Publication date
Dec 2, 2021
AmTRAN TECHNOLOGY CO., LTD
Yen-Ting TUNG
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Electrical Testing Apparatus for Spintronics Devices
Publication number
20210325460
Publication date
Oct 21, 2021
Taiwan Semiconductor Manufacturing Company, Ltd.
Guenole Jan
G06 - COMPUTING CALCULATING COUNTING