where the device under test is an electronic circuit

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G01R31/002

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/002where the device under test is an electronic circuit

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Measuring apparatus and a measuring method of electromagnetic inter...
- Patent number 12,163,993
- Issue date Dec 10, 2024
- EMZER TECHNOLOGICAL SOLUTIONS, S.L.
- Albert Miquel Sanchez Delgado
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Handling of lost time synchronization in a substation network
- Patent number 12,166,350
- Issue date Dec 10, 2024
- HITACHI ENERGY LTD
- Carl Byman
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
On-chip electrostatic discharge sensor
- Patent number 12,148,748
- Issue date Nov 19, 2024
- The Regents of the University of California
- Subramanian Iyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for charge storage and providing power
- Patent number 12,140,619
- Issue date Nov 12, 2024
- Analog Devices International Unlimited Company
- Alan J. O'Donnell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Classifying comparators based on comparator offsets
- Patent number 12,134,713
- Issue date Nov 5, 2024
- Microchip Technology Incorporated
- Zhi-Yuan Zou
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
In vitro neural implant tester with hardware-in-the-loop simulation
- Patent number 12,130,326
- Issue date Oct 29, 2024
- NEURALINK CORP.
- Amir Mazaheripour
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for detection and identification of counterfei...
- Patent number 12,117,476
- Issue date Oct 15, 2024
- NOKOMIS, INC.
- Walter J. Keller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray sensitive materials for data protection
- Patent number 12,079,377
- Issue date Sep 3, 2024
- International Business Machines Corporation
- Eric J. Campbell
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Two-terminator RF adapter for background/environment noise measurement
- Patent number 12,078,656
- Issue date Sep 3, 2024
- National Technology & Engineering Solutions of Sandia, LLC
- Jeffrey Kolski
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Embedded PHY (EPHY) IP core for FPGA
- Patent number 12,066,488
- Issue date Aug 20, 2024
- SanDisk Technologies, Inc.
- Doron Ganon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spark gap structures for detection and protection against electrica...
- Patent number 12,055,569
- Issue date Aug 6, 2024
- Analog Devices International Unlimited Company
- David J. Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronics card insitu testing apparatus and method utilizing unin...
- Patent number 12,040,531
- Issue date Jul 16, 2024
- NOKOMIS, INC.
- Walter J. Keller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for testing antenna-in-package modules and method for using...
- Patent number 12,025,657
- Issue date Jul 2, 2024
- Ohmplus Technology Inc.
- Hsi-Tseng Chou
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring and data analysis systems and methods
- Patent number 12,019,125
- Issue date Jun 25, 2024
- GRID20/20, Inc.
- Joe Beaudet
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Circuit check method and electronic apparatus
- Patent number 11,959,956
- Issue date Apr 16, 2024
- Realtek Semiconductor Corp.
- Yun-Jing Lin
- G01 - MEASURING TESTING
Information Patent Grant
Fire mitigation and downed conductor detection systems and methods
- Patent number 11,946,982
- Issue date Apr 2, 2024
- GRID20/20, Inc.
- W. Alan Snook
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Evaluation of wafer carcass alpha particle emission
- Patent number 11,927,616
- Issue date Mar 12, 2024
- International Business Machines Corporation
- Michael S. Gordon
- G01 - MEASURING TESTING
Information Patent Grant
Program storage medium, method, and information processing device f...
- Patent number 11,913,982
- Issue date Feb 27, 2024
- Fujitsu Limited
- Yusuke Oishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Relating to testing
- Patent number 11,906,565
- Issue date Feb 20, 2024
- BAE Systems plc
- Ben Anthony Murphy
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic apparatus
- Patent number 11,876,670
- Issue date Jan 16, 2024
- Nippon Telegraph and Telephone Corporation
- Takuya Oda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Separating receive and transmit antennas of a radar test system
- Patent number 11,867,832
- Issue date Jan 9, 2024
- Keysight Technologies, Inc.
- Gregory Douglas Vanwiggeren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid state ESD SiC simulator
- Patent number 11,846,664
- Issue date Dec 19, 2023
- FEI Company
- Marcos Hernandez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resistance measurement device, film manufacturing apparatus, and ma...
- Patent number 11,789,053
- Issue date Oct 17, 2023
- Nitto Denko Corporation
- Daiki Morimitsu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Relay pogo charged device model tester using electrostatic discharg...
- Patent number 11,782,083
- Issue date Oct 10, 2023
- Wei Huang
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing semiconductor package
- Patent number 11,769,698
- Issue date Sep 26, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chi-Hui Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electromagnetic interference suppression circuit and related sensin...
- Patent number 11,754,611
- Issue date Sep 12, 2023
- AnApp Technologies Limited
- Franki Ngai Kit Poon
- G01 - MEASURING TESTING
Information Patent Grant
Probe for non-intrusively detecting imperfections in a test object
- Patent number 11,733,282
- Issue date Aug 22, 2023
- Airbus Helicopters
- Laurent Bianchi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detection and identification of counterfei...
- Patent number 11,733,283
- Issue date Aug 22, 2023
- NOKOMIS, INC.
- Walter John Keller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Storage medium, EMI calculation method, and EMI calculation apparatus
- Patent number 11,719,733
- Issue date Aug 8, 2023
- Fujitsu Limited
- Shohei Yamane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated method to check electrostatic discharge effect on a victi...
- Patent number 11,714,117
- Issue date Aug 1, 2023
- Synopsys, Inc.
- Jeffrey Ellis Byrd
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PHYSICAL SECURITY PROTECTION FOR INTEGRATED CIRCUITS
- Publication number 20240386145
- Publication date Nov 21, 2024
- NORDIC SEMICONDUCTOR ASA
- Frode PEDERSEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR EARLY WARNING OF DEVICE UNDER TEST FAILURE DU...
- Publication number 20240377447
- Publication date Nov 14, 2024
- ROHDE & SCHWARZ GMBH & CO. KG
- Hendrik BARTKO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Embedded PHY (EPHY) IP Core for FPGA
- Publication number 20240369628
- Publication date Nov 7, 2024
- SANDISK TECHNOLOGIES, INC.
- Doron GANON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electronics card insitu testing apparatus and method utilizing unin...
- Publication number 20240356196
- Publication date Oct 24, 2024
- NOKOMIS, INC.
- Walter J. Keller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIRE MITIGATION AND DOWNED CONDUCTOR DETECTION SYSTEMS AND METHODS
- Publication number 20240345181
- Publication date Oct 17, 2024
- GRID20/20, Inc.
- W. Alan Snook
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Plug-Type Electric Discharge Detection Unit and Electric Discharge...
- Publication number 20240345151
- Publication date Oct 17, 2024
- NITTO KOGYO CORPORATION
- Atsushi Miyamoto
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC...
- Publication number 20240175907
- Publication date May 30, 2024
- SAMSUNG DISPLAY CO., LTD.
- YOUNG JE CHO
- G01 - MEASURING TESTING
Information Patent Application
WEARABLE DEVICE WITH ENERGY HARVESTING
- Publication number 20240159804
- Publication date May 16, 2024
- Analog Devices International Unlimited Company
- David J. Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PACKAGING DEVICE CAPABLE OF DETECTING RISK OF IMPACT OF ELECTROSTAT...
- Publication number 20240120241
- Publication date Apr 11, 2024
- PANJIT INTERNATIONAL INC.
- Chung-Hsiung HO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR DETECTION AND IDENTIFICATION OF COUNTERFEI...
- Publication number 20240044963
- Publication date Feb 8, 2024
- NOKOMIS, INC.
- Walter J. Keller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SOLID STATE ESD SIC SIMULATOR
- Publication number 20240044964
- Publication date Feb 8, 2024
- FEI Company
- Marcos Hernandez
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR DETERMINING PARASITIC CAPACITANCES
- Publication number 20240027508
- Publication date Jan 25, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Aatish Chandak
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING A RESPONSE OF A DEVICE UNDER T...
- Publication number 20240019480
- Publication date Jan 18, 2024
- UNIVERSITAT DER BUNDESWEHR MUNCHEN
- Dennis Helmut
- G01 - MEASURING TESTING
Information Patent Application
SPARK GAP STRUCTURES FOR DETECTION AND PROTECTION AGAINST ELECTRICA...
- Publication number 20230375600
- Publication date Nov 23, 2023
- Analog Devices International Unlimited Company
- David J. Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF TESTING SEMICONDUCTOR PACKAGE
- Publication number 20230369139
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- CHI-HUI LAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARC DETECTION DEVICE, ARC DETECTION SYSTEM, ARC DETECTION METHOD, A...
- Publication number 20230305047
- Publication date Sep 28, 2023
- Panasonic Intellectual Property Management Co., Ltd.
- Kazunori KIDERA
- G01 - MEASURING TESTING
Information Patent Application
Embedded PHY (EPHY) IP Core for FPGA
- Publication number 20230305058
- Publication date Sep 28, 2023
- Western Digital Technologies, Inc.
- Doron GANON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Field Collapse Pulser
- Publication number 20230236238
- Publication date Jul 27, 2023
- Pragma Design, Inc.
- Jeffrey C. Dunnihoo
- G01 - MEASURING TESTING
Information Patent Application
Electrostatic Withstand Voltage Test Device and Electrostatic Withs...
- Publication number 20230213567
- Publication date Jul 6, 2023
- MITSUBISHI ELECTRIC CORPORATION
- Kohei NAKANISHI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20230204657
- Publication date Jun 29, 2023
- RENESAS ELECTRONICS CORPORATION
- Kazuki SHIMADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR TESTING ANTENNA-IN-PACKAGE MODULES AND METHOD FOR USING...
- Publication number 20230160955
- Publication date May 25, 2023
- OHMPLUS TECHNOLOGY INC.
- HSI-TSENG CHOU
- G01 - MEASURING TESTING
Information Patent Application
In Vitro Neural Implant Tester with Hardware-in-the-Loop Simulation
- Publication number 20230147266
- Publication date May 11, 2023
- Neuralink Corp.
- Amir Mazaheripour
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SOLID STATE ESD SIC SIMULATOR
- Publication number 20230040961
- Publication date Feb 9, 2023
- FEI Company
- Marcos Hernandez
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND A MEASURING METHOD OF ELECTROMAGNETIC INTER...
- Publication number 20230027767
- Publication date Jan 26, 2023
- EMZER TECHNOLOGICAL SOLUTIONS, S.L.
- Albert Miquel SANCHEZ DELGADO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TESTING SEMICONDUCTOR PACKAGE
- Publication number 20230019013
- Publication date Jan 19, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- CHI-HUI LAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ON-CHIP ELECTROSTATIC DISCHARGE SENSOR
- Publication number 20220392893
- Publication date Dec 8, 2022
- The Regents of the University of California
- Subramanian IYER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RELAY POGO CHARGED DEVICE MODEL TESTER USING ELECTROSTATIC DISCHARG...
- Publication number 20220341981
- Publication date Oct 27, 2022
- ESDEMC Technology LLC
- Wei Huang
- G01 - MEASURING TESTING
Information Patent Application
REDUCED FOOTPRINT SSD WITH TEST STATION FOR AN UNDERGROUND PIPELINE
- Publication number 20220341982
- Publication date Oct 27, 2022
- Ark Engineering & Technical Services Inc.
- Michael Conroy
- G01 - MEASURING TESTING
Information Patent Application
STORAGE MEDIUM, EMI CALCULATION METHOD, AND EMI CALCULATION APPARATUS
- Publication number 20220341979
- Publication date Oct 27, 2022
- Fujitsu Limited
- Shohei YAMANE
- G01 - MEASURING TESTING
Information Patent Application
KIVIAT TUBE BASED EMI FINGERPRINTING FOR COUNTERFEIT DEVICE DETECTION
- Publication number 20220326292
- Publication date Oct 13, 2022
- ORACLE INTERNATIONAL CORPORATION
- Edward R. WETHERBEE
- G06 - COMPUTING CALCULATING COUNTING

where the device under test is an electronic circuit

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Measuring apparatus and a measuring method of electromagnetic inter...

Handling of lost time synchronization in a substation network

On-chip electrostatic discharge sensor

Systems and methods for charge storage and providing power

Classifying comparators based on comparator offsets

In vitro neural implant tester with hardware-in-the-loop simulation

Method and apparatus for detection and identification of counterfei...

X-ray sensitive materials for data protection

Two-terminator RF adapter for background/environment noise measurement

Embedded PHY (EPHY) IP core for FPGA

Spark gap structures for detection and protection against electrica...

Electronics card insitu testing apparatus and method utilizing unin...

System for testing antenna-in-package modules and method for using...

Monitoring and data analysis systems and methods

Circuit check method and electronic apparatus

Fire mitigation and downed conductor detection systems and methods

Evaluation of wafer carcass alpha particle emission

Program storage medium, method, and information processing device f...

Relating to testing

Diagnostic apparatus

Separating receive and transmit antennas of a radar test system

Solid state ESD SiC simulator

Resistance measurement device, film manufacturing apparatus, and ma...

Relay pogo charged device model tester using electrostatic discharg...

Method of testing semiconductor package

Electromagnetic interference suppression circuit and related sensin...

Probe for non-intrusively detecting imperfections in a test object

Method and apparatus for detection and identification of counterfei...

Storage medium, EMI calculation method, and EMI calculation apparatus

Automated method to check electrostatic discharge effect on a victi...

Patents Applicationslast 30 patents

PHYSICAL SECURITY PROTECTION FOR INTEGRATED CIRCUITS

METHOD AND DEVICE FOR EARLY WARNING OF DEVICE UNDER TEST FAILURE DU...

Embedded PHY (EPHY) IP Core for FPGA

Electronics card insitu testing apparatus and method utilizing unin...

FIRE MITIGATION AND DOWNED CONDUCTOR DETECTION SYSTEMS AND METHODS

Plug-Type Electric Discharge Detection Unit and Electric Discharge...

DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC...

WEARABLE DEVICE WITH ENERGY HARVESTING

PACKAGING DEVICE CAPABLE OF DETECTING RISK OF IMPACT OF ELECTROSTAT...

METHOD AND APPARATUS FOR DETECTION AND IDENTIFICATION OF COUNTERFEI...

SOLID STATE ESD SIC SIMULATOR

METHODS AND APPARATUS FOR DETERMINING PARASITIC CAPACITANCES

APPARATUS AND METHOD FOR DETERMINING A RESPONSE OF A DEVICE UNDER T...

SPARK GAP STRUCTURES FOR DETECTION AND PROTECTION AGAINST ELECTRICA...

METHOD OF TESTING SEMICONDUCTOR PACKAGE

ARC DETECTION DEVICE, ARC DETECTION SYSTEM, ARC DETECTION METHOD, A...

Embedded PHY (EPHY) IP Core for FPGA

Field Collapse Pulser

Electrostatic Withstand Voltage Test Device and Electrostatic Withs...

SEMICONDUCTOR DEVICE

SYSTEM FOR TESTING ANTENNA-IN-PACKAGE MODULES AND METHOD FOR USING...

In Vitro Neural Implant Tester with Hardware-in-the-Loop Simulation

SOLID STATE ESD SIC SIMULATOR

MEASURING APPARATUS AND A MEASURING METHOD OF ELECTROMAGNETIC INTER...

METHOD OF TESTING SEMICONDUCTOR PACKAGE

ON-CHIP ELECTROSTATIC DISCHARGE SENSOR

RELAY POGO CHARGED DEVICE MODEL TESTER USING ELECTROSTATIC DISCHARG...

REDUCED FOOTPRINT SSD WITH TEST STATION FOR AN UNDERGROUND PIPELINE

STORAGE MEDIUM, EMI CALCULATION METHOD, AND EMI CALCULATION APPARATUS

KIVIAT TUBE BASED EMI FINGERPRINTING FOR COUNTERFEIT DEVICE DETECTION