where the device under test is an electronic circuit

Industry

CPC
G01R31/002

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/002where the device under test is an electronic circuit

Industries

Patents Grantslast 30 patents

Information Patent Grant
Circuit check method and electronic apparatus
- Patent number 11,959,956
- Issue date Apr 16, 2024
- Realtek Semiconductor Corp.
- Yun-Jing Lin
- G01 - MEASURING TESTING
Information Patent Grant
Fire mitigation and downed conductor detection systems and methods
- Patent number 11,946,982
- Issue date Apr 2, 2024
- GRID20/20, Inc.
- W. Alan Snook
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Evaluation of wafer carcass alpha particle emission
- Patent number 11,927,616
- Issue date Mar 12, 2024
- International Business Machines Corporation
- Michael S. Gordon
- G01 - MEASURING TESTING
Information Patent Grant
Program storage medium, method, and information processing device f...
- Patent number 11,913,982
- Issue date Feb 27, 2024
- Fujitsu Limited
- Yusuke Oishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Relating to testing
- Patent number 11,906,565
- Issue date Feb 20, 2024
- BAE Systems plc
- Ben Anthony Murphy
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic apparatus
- Patent number 11,876,670
- Issue date Jan 16, 2024
- Nippon Telegraph and Telephone Corporation
- Takuya Oda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Separating receive and transmit antennas of a radar test system
- Patent number 11,867,832
- Issue date Jan 9, 2024
- Keysight Technologies, Inc.
- Gregory Douglas Vanwiggeren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid state ESD SiC simulator
- Patent number 11,846,664
- Issue date Dec 19, 2023
- FEI Company
- Marcos Hernandez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resistance measurement device, film manufacturing apparatus, and ma...
- Patent number 11,789,053
- Issue date Oct 17, 2023
- Nitto Denko Corporation
- Daiki Morimitsu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Relay pogo charged device model tester using electrostatic discharg...
- Patent number 11,782,083
- Issue date Oct 10, 2023
- Wei Huang
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing semiconductor package
- Patent number 11,769,698
- Issue date Sep 26, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chi-Hui Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electromagnetic interference suppression circuit and related sensin...
- Patent number 11,754,611
- Issue date Sep 12, 2023
- AnApp Technologies Limited
- Franki Ngai Kit Poon
- G01 - MEASURING TESTING
Information Patent Grant
Probe for non-intrusively detecting imperfections in a test object
- Patent number 11,733,282
- Issue date Aug 22, 2023
- Airbus Helicopters
- Laurent Bianchi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detection and identification of counterfei...
- Patent number 11,733,283
- Issue date Aug 22, 2023
- NOKOMIS, INC.
- Walter John Keller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Storage medium, EMI calculation method, and EMI calculation apparatus
- Patent number 11,719,733
- Issue date Aug 8, 2023
- Fujitsu Limited
- Shohei Yamane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated method to check electrostatic discharge effect on a victi...
- Patent number 11,714,117
- Issue date Aug 1, 2023
- Synopsys, Inc.
- Jeffrey Ellis Byrd
- G01 - MEASURING TESTING
Information Patent Grant
Kiviat tube based EMI fingerprinting for counterfeit device detection
- Patent number 11,686,756
- Issue date Jun 27, 2023
- Oracle International Corporation
- Edward R. Wetherbee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Embedded PHY (EPHY) IP core for FPGA
- Patent number 11,675,008
- Issue date Jun 13, 2023
- Western Digital Technologies, Inc.
- Doron Ganon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spark gap structures for detection and protection against electrica...
- Patent number 11,668,734
- Issue date Jun 6, 2023
- Analog Devices International Unlimited Company
- David J. Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for testing coupled AC circuit
- Patent number 11,656,268
- Issue date May 23, 2023
- GM CRUISE HOLDINGS LLC
- Vladimir Ilchenko
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing an integrated circuit involving performing...
- Patent number 11,650,237
- Issue date May 16, 2023
- Samsung Electronics Co., Ltd.
- Bonggyu Kang
- G01 - MEASURING TESTING
Information Patent Grant
Charge storage with electrical overstress protection
- Patent number 11,644,497
- Issue date May 9, 2023
- Analog Devices International Unlimited Company
- Alan J. O'Donnell
- G08 - SIGNALLING
Information Patent Grant
Source measure apparatus including feedback path and measurement path
- Patent number 11,619,666
- Issue date Apr 4, 2023
- Keysight Technologies, Inc.
- Nobuaki Iwaki
- G01 - MEASURING TESTING
Information Patent Grant
Field collapse pulser
- Patent number 11,609,256
- Issue date Mar 21, 2023
- Pragma Design, Inc.
- Jeffrey C. Dunnihoo
- G01 - MEASURING TESTING
Information Patent Grant
Antenna in package production test
- Patent number 11,592,479
- Issue date Feb 28, 2023
- Infineon Technologies AG
- Saverio Trotta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing device, testing system, and testing method
- Patent number 11,536,760
- Issue date Dec 27, 2022
- ASE TEST, INC.
- Hung-Jen Huang
- G01 - MEASURING TESTING
Information Patent Grant
EMC test system and EMC test method using LiFi
- Patent number 11,506,699
- Issue date Nov 22, 2022
- Rohde & Schwarz GmbH & Co. KG
- Erik Araojo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Reduced footprint SSD with test station for an underground pipeline
- Patent number 11,480,598
- Issue date Oct 25, 2022
- Ark Engineering & Technical Services Inc.
- Michael Conroy
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for detecting ageing of a power electronic app...
- Patent number 11,480,605
- Issue date Oct 25, 2022
- ZF Friedrichshafen AG
- Marco Denk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Counterfeit device detection using EMI fingerprints
- Patent number 11,460,500
- Issue date Oct 4, 2022
- Oracle International Corporation
- Edward R. Wetherbee
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PACKAGING DEVICE CAPABLE OF DETECTING RISK OF IMPACT OF ELECTROSTAT...
- Publication number 20240120241
- Publication date Apr 11, 2024
- PANJIT INTERNATIONAL INC.
- Chung-Hsiung HO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR DETECTION AND IDENTIFICATION OF COUNTERFEI...
- Publication number 20240044963
- Publication date Feb 8, 2024
- NOKOMIS, INC.
- Walter J. Keller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SOLID STATE ESD SIC SIMULATOR
- Publication number 20240044964
- Publication date Feb 8, 2024
- FEI Company
- Marcos Hernandez
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR DETERMINING PARASITIC CAPACITANCES
- Publication number 20240027508
- Publication date Jan 25, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Aatish Chandak
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING A RESPONSE OF A DEVICE UNDER T...
- Publication number 20240019480
- Publication date Jan 18, 2024
- UNIVERSITAT DER BUNDESWEHR MUNCHEN
- Dennis Helmut
- G01 - MEASURING TESTING
Information Patent Application
SPARK GAP STRUCTURES FOR DETECTION AND PROTECTION AGAINST ELECTRICA...
- Publication number 20230375600
- Publication date Nov 23, 2023
- Analog Devices International Unlimited Company
- David J. Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF TESTING SEMICONDUCTOR PACKAGE
- Publication number 20230369139
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- CHI-HUI LAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARC DETECTION DEVICE, ARC DETECTION SYSTEM, ARC DETECTION METHOD, A...
- Publication number 20230305047
- Publication date Sep 28, 2023
- Panasonic Intellectual Property Management Co., Ltd.
- Kazunori KIDERA
- G01 - MEASURING TESTING
Information Patent Application
Embedded PHY (EPHY) IP Core for FPGA
- Publication number 20230305058
- Publication date Sep 28, 2023
- Western Digital Technologies, Inc.
- Doron GANON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Field Collapse Pulser
- Publication number 20230236238
- Publication date Jul 27, 2023
- Pragma Design, Inc.
- Jeffrey C. Dunnihoo
- G01 - MEASURING TESTING
Information Patent Application
Electrostatic Withstand Voltage Test Device and Electrostatic Withs...
- Publication number 20230213567
- Publication date Jul 6, 2023
- MITSUBISHI ELECTRIC CORPORATION
- Kohei NAKANISHI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20230204657
- Publication date Jun 29, 2023
- RENESAS ELECTRONICS CORPORATION
- Kazuki SHIMADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR TESTING ANTENNA-IN-PACKAGE MODULES AND METHOD FOR USING...
- Publication number 20230160955
- Publication date May 25, 2023
- OHMPLUS TECHNOLOGY INC.
- HSI-TSENG CHOU
- G01 - MEASURING TESTING
Information Patent Application
In Vitro Neural Implant Tester with Hardware-in-the-Loop Simulation
- Publication number 20230147266
- Publication date May 11, 2023
- Neuralink Corp.
- Amir Mazaheripour
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SOLID STATE ESD SIC SIMULATOR
- Publication number 20230040961
- Publication date Feb 9, 2023
- FEI Company
- Marcos Hernandez
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND A MEASURING METHOD OF ELECTROMAGNETIC INTER...
- Publication number 20230027767
- Publication date Jan 26, 2023
- EMZER TECHNOLOGICAL SOLUTIONS, S.L.
- Albert Miquel SANCHEZ DELGADO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TESTING SEMICONDUCTOR PACKAGE
- Publication number 20230019013
- Publication date Jan 19, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- CHI-HUI LAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ON-CHIP ELECTROSTATIC DISCHARGE SENSOR
- Publication number 20220392893
- Publication date Dec 8, 2022
- The Regents of the University of California
- Subramanian IYER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RELAY POGO CHARGED DEVICE MODEL TESTER USING ELECTROSTATIC DISCHARG...
- Publication number 20220341981
- Publication date Oct 27, 2022
- ESDEMC Technology LLC
- Wei Huang
- G01 - MEASURING TESTING
Information Patent Application
REDUCED FOOTPRINT SSD WITH TEST STATION FOR AN UNDERGROUND PIPELINE
- Publication number 20220341982
- Publication date Oct 27, 2022
- Ark Engineering & Technical Services Inc.
- Michael Conroy
- G01 - MEASURING TESTING
Information Patent Application
STORAGE MEDIUM, EMI CALCULATION METHOD, AND EMI CALCULATION APPARATUS
- Publication number 20220341979
- Publication date Oct 27, 2022
- Fujitsu Limited
- Shohei YAMANE
- G01 - MEASURING TESTING
Information Patent Application
KIVIAT TUBE BASED EMI FINGERPRINTING FOR COUNTERFEIT DEVICE DETECTION
- Publication number 20220326292
- Publication date Oct 13, 2022
- ORACLE INTERNATIONAL CORPORATION
- Edward R. WETHERBEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EVALUATION OF WAFER CARCASS ALPHA PARTICLE EMISSION
- Publication number 20220317172
- Publication date Oct 6, 2022
- International Business Machines Corporation
- Michael S. Gordon
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR ELECTROSTATIC DISCHARGE TEST
- Publication number 20220299554
- Publication date Sep 22, 2022
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Dong Yun JUNG
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR NON-INTRUSIVELY DETECTING IMPERFECTIONS IN A TEST OBJECT
- Publication number 20220291269
- Publication date Sep 15, 2022
- AIRBUS HELICOPTERS
- Laurent BIANCHI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SENSITIVE MATERIALS FOR DATA PROTECTION
- Publication number 20220284131
- Publication date Sep 8, 2022
- International Business Machines Corporation
- Eric J. Campbell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEPARATING RECEIVE AND TRANSMIT ANTENNAS OF A RADAR TEST SYSTEM
- Publication number 20220260674
- Publication date Aug 18, 2022
- KEYSIGHT TECHNOLOGIES, INC.
- Gregory Douglas Vanwiggeren
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TESTING ACOUSTIC WAVE DEVICES
- Publication number 20220244301
- Publication date Aug 4, 2022
- Skyworks Solutions, Inc.
- Zhaogeng Xu
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED METHOD TO CHECK ELECTROSTATIC DISCHARGE EFFECT ON A VICTI...
- Publication number 20220163580
- Publication date May 26, 2022
- Synopsys, Inc.
- Jeffrey Ellis BYRD
- G01 - MEASURING TESTING
Information Patent Application
IMPROVEMENTS IN AND RELATING TO TESTING
- Publication number 20220120801
- Publication date Apr 21, 2022
- BAE Systems plc
- Ben Anthony Murphy
- G01 - MEASURING TESTING

where the device under test is an electronic circuit

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Circuit check method and electronic apparatus

Fire mitigation and downed conductor detection systems and methods

Evaluation of wafer carcass alpha particle emission

Program storage medium, method, and information processing device f...

Relating to testing

Diagnostic apparatus

Separating receive and transmit antennas of a radar test system

Solid state ESD SiC simulator

Resistance measurement device, film manufacturing apparatus, and ma...

Relay pogo charged device model tester using electrostatic discharg...

Method of testing semiconductor package

Electromagnetic interference suppression circuit and related sensin...

Probe for non-intrusively detecting imperfections in a test object

Method and apparatus for detection and identification of counterfei...

Storage medium, EMI calculation method, and EMI calculation apparatus

Automated method to check electrostatic discharge effect on a victi...

Kiviat tube based EMI fingerprinting for counterfeit device detection

Embedded PHY (EPHY) IP core for FPGA

Spark gap structures for detection and protection against electrica...

Apparatus and method for testing coupled AC circuit

Method of manufacturing an integrated circuit involving performing...

Charge storage with electrical overstress protection

Source measure apparatus including feedback path and measurement path

Field collapse pulser

Antenna in package production test

Testing device, testing system, and testing method

EMC test system and EMC test method using LiFi

Reduced footprint SSD with test station for an underground pipeline

Method and apparatus for detecting ageing of a power electronic app...

Counterfeit device detection using EMI fingerprints

Patents Applicationslast 30 patents

PACKAGING DEVICE CAPABLE OF DETECTING RISK OF IMPACT OF ELECTROSTAT...

METHOD AND APPARATUS FOR DETECTION AND IDENTIFICATION OF COUNTERFEI...

SOLID STATE ESD SIC SIMULATOR

METHODS AND APPARATUS FOR DETERMINING PARASITIC CAPACITANCES

APPARATUS AND METHOD FOR DETERMINING A RESPONSE OF A DEVICE UNDER T...

SPARK GAP STRUCTURES FOR DETECTION AND PROTECTION AGAINST ELECTRICA...

METHOD OF TESTING SEMICONDUCTOR PACKAGE

ARC DETECTION DEVICE, ARC DETECTION SYSTEM, ARC DETECTION METHOD, A...

Embedded PHY (EPHY) IP Core for FPGA

Field Collapse Pulser

Electrostatic Withstand Voltage Test Device and Electrostatic Withs...

SEMICONDUCTOR DEVICE

SYSTEM FOR TESTING ANTENNA-IN-PACKAGE MODULES AND METHOD FOR USING...

In Vitro Neural Implant Tester with Hardware-in-the-Loop Simulation

SOLID STATE ESD SIC SIMULATOR

MEASURING APPARATUS AND A MEASURING METHOD OF ELECTROMAGNETIC INTER...

METHOD OF TESTING SEMICONDUCTOR PACKAGE

ON-CHIP ELECTROSTATIC DISCHARGE SENSOR

RELAY POGO CHARGED DEVICE MODEL TESTER USING ELECTROSTATIC DISCHARG...

REDUCED FOOTPRINT SSD WITH TEST STATION FOR AN UNDERGROUND PIPELINE

STORAGE MEDIUM, EMI CALCULATION METHOD, AND EMI CALCULATION APPARATUS

KIVIAT TUBE BASED EMI FINGERPRINTING FOR COUNTERFEIT DEVICE DETECTION

EVALUATION OF WAFER CARCASS ALPHA PARTICLE EMISSION

APPARATUS FOR ELECTROSTATIC DISCHARGE TEST

PROBE FOR NON-INTRUSIVELY DETECTING IMPERFECTIONS IN A TEST OBJECT

X-RAY SENSITIVE MATERIALS FOR DATA PROTECTION

SEPARATING RECEIVE AND TRANSMIT ANTENNAS OF A RADAR TEST SYSTEM

METHOD OF TESTING ACOUSTIC WAVE DEVICES

AUTOMATED METHOD TO CHECK ELECTROSTATIC DISCHARGE EFFECT ON A VICTI...

IMPROVEMENTS IN AND RELATING TO TESTING