with comparison between actual response and known fault free response

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G01R31/3193

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/3193with comparison between actual response and known fault free response

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit with timing correction circuitry
- Patent number 12,123,911
- Issue date Oct 22, 2024
- NXP USA, INC.
- Shilpa Gupta
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus
- Patent number 12,038,472
- Issue date Jul 16, 2024
- Advantest Corporation
- Naoya Toyota
- G01 - MEASURING TESTING
Information Patent Grant
Power consumption measurement assembly and method, and chip power c...
- Patent number 12,032,022
- Issue date Jul 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xinwang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for integrated circuit testing
- Patent number 12,007,439
- Issue date Jun 11, 2024
- Winbond Electronics Corp.
- Kuo-Min Liao
- G01 - MEASURING TESTING
Information Patent Grant
Integrated transmitter slew rate calibration
- Patent number 11,955,971
- Issue date Apr 9, 2024
- RAMBUS INC.
- Robert E. Palmer
- G11 - INFORMATION STORAGE
Information Patent Grant
System on chip for performing scan test and method of designing the...
- Patent number 11,940,494
- Issue date Mar 26, 2024
- Samsung Electronics Co., Ltd.
- Woohyun Son
- G01 - MEASURING TESTING
Information Patent Grant
Memory device test method, apparatus, and system, medium, and elect...
- Patent number 11,867,755
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yu Yu
- G01 - MEASURING TESTING
Information Patent Grant
Test method for control chip and related device
- Patent number 11,867,758
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chuanqi Shi
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method to measure simulation to silicon timing correlation
- Patent number 11,835,580
- Issue date Dec 5, 2023
- MediaTek Singapore Pte Ltd.
- Ashish Kumar Nayak
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Three-dimensional stacked memory device and method
- Patent number 11,830,562
- Issue date Nov 28, 2023
- Samsung Electronics Co., Ltd.
- Shinhaeng Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement system and measurement method
- Patent number 11,789,079
- Issue date Oct 17, 2023
- Rohde & Schwarz GmbH & Co. KG
- Michael Feilen
- G01 - MEASURING TESTING
Information Patent Grant
Leakage screening based on use-case power prediction
- Patent number 11,768,237
- Issue date Sep 26, 2023
- Google LLC
- Emre Tuncer
- G01 - MEASURING TESTING
Information Patent Grant
End of life performance throttling to prevent data loss
- Patent number 11,756,638
- Issue date Sep 12, 2023
- Micron Technology, Inc.
- Sebastien Andre Jean
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device and operating method thereof
- Patent number 11,740,285
- Issue date Aug 29, 2023
- Kioxia Corporation
- Yuusuke Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for testing artificial intelligence chip, devi...
- Patent number 11,714,128
- Issue date Aug 1, 2023
- KUNLUNXIN TECHNOLOGY (BEIJING) COMPANY LIMITED
- Ziyu Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for ground fault detection
- Patent number 11,703,549
- Issue date Jul 18, 2023
- Northrop Grumman Systems Corporation
- Sunny Bagga
- G01 - MEASURING TESTING
Information Patent Grant
System, apparatus and method for functional testing of one or more...
- Patent number 11,686,767
- Issue date Jun 27, 2023
- Intel Corporation
- Lakshminarayana Pappu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for eliminating fake faults in gate-level simulation
- Patent number 11,668,749
- Issue date Jun 6, 2023
- Silicon Motion, Inc.
- Chia-Cheng Pai
- G01 - MEASURING TESTING
Information Patent Grant
Configurable multiplier-free multirate filter
- Patent number 11,658,643
- Issue date May 23, 2023
- Raytheon Company
- Antoine Rouphael
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method, apparatus and storage medium for testing chip, and chip the...
- Patent number 11,639,964
- Issue date May 2, 2023
- Beijing Baidu Netcom Science and Technology Co., Ltd
- Ziyu Guo
- G01 - MEASURING TESTING
Information Patent Grant
Measuring and evaluating a test signal generated by a device under...
- Patent number 11,632,200
- Issue date Apr 18, 2023
- ROKU, INC.
- Nermin Osmanovic
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Fault injection in a clock monitor unit
- Patent number 11,609,833
- Issue date Mar 21, 2023
- NXP USA, INC.
- Praveen Durga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-die aging measurements for dynamic timing modeling
- Patent number 11,609,262
- Issue date Mar 21, 2023
- Intel Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Grant
Error rate measuring apparatus and error rate measuring method
- Patent number 11,579,192
- Issue date Feb 14, 2023
- Anritsu Corporation
- Hisao Kidokoro
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Multi-channel timing calibration device and method
- Patent number 11,531,065
- Issue date Dec 20, 2022
- Youngtek Electronics Corporation
- Ching-Yung Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Row redundancy techniques
- Patent number 11,521,703
- Issue date Dec 6, 2022
- ARM Limited
- Amandeep Kaur
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for facilitating built-in self-test of system-on-...
- Patent number 11,513,153
- Issue date Nov 29, 2022
- NXP USA, INC.
- Rohan Poudel
- G01 - MEASURING TESTING
Information Patent Grant
Setup time and hold time detection system and detection method
- Patent number 11,506,714
- Issue date Nov 22, 2022
- DigWise Technology Corporation, LTD
- Shih-Hao Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer test system and methods thereof
- Patent number 11,486,899
- Issue date Nov 1, 2022
- NANYA TECHNOLOGY CORPORATION
- Chia-Lin Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Secondary monitoring system for a machine under test
- Patent number 11,480,603
- Issue date Oct 25, 2022
- The Boeing Company
- Steven F Griffin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MIXED SIGNAL CIRCUIT, METHODS AND DEVICES FOR TESTING MIXED SIGNAL...
- Publication number 20240402251
- Publication date Dec 5, 2024
- Intel Corporation
- Aryeh FARBER
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH TIMING CORRECTION CIRCUITRY
- Publication number 20240345163
- Publication date Oct 17, 2024
- NXP USA, Inc.
- Shilpa Gupta
- G01 - MEASURING TESTING
Information Patent Application
TESTING A CONTROL DEVICE USING A TEST ASSEMBLY
- Publication number 20240337695
- Publication date Oct 10, 2024
- dSPACE GmbH
- Remigiusz SEILER
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND EVALUATION SYSTEM
- Publication number 20240319271
- Publication date Sep 26, 2024
- Rohm Co., Ltd.
- Hideki Miyoshi
- G01 - MEASURING TESTING
Information Patent Application
TEST LOAD CIRCUIT
- Publication number 20240241189
- Publication date Jul 18, 2024
- QUANTA COMPUTER INC.
- Kuo-Chan HSU
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION DEVICE, TEST SYSTEM, AND GENERATION DEVICE
- Publication number 20240230759
- Publication date Jul 11, 2024
- KIOXIA Corporation
- Mikio SHIRAISHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INTEGRATED CIRCUIT TESTING
- Publication number 20240219465
- Publication date Jul 4, 2024
- WINBOND ELECTRONICS CORP.
- Kuo-Min Liao
- G01 - MEASURING TESTING
Information Patent Application
SELF-DIAGNOSIS CIRCUIT AND SEMICONDUCTOR DEVICE
- Publication number 20240175922
- Publication date May 30, 2024
- Rohm Co., Ltd.
- Ryosuke SUMII
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION DEVICE, TEST SYSTEM, AND GENERATION DEVICE
- Publication number 20240133953
- Publication date Apr 25, 2024
- KIOXIA Corporation
- Mikio SHIRAISHI
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT AND METHOD TO MEASURE SIMULATION TO SILICON TIMING CORRELATION
- Publication number 20240085475
- Publication date Mar 14, 2024
- MEDIATEK SINGAPORE PTE LTD
- Ashish Kumar Nayak
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUIT AND METHOD TO MEASURE SIMULATION TO SILICON TIMING CORRELATION
- Publication number 20240077533
- Publication date Mar 7, 2024
- MEDIATEK SINGAPORE PTE LTD
- Ashish Kumar Nayak
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TRAINING METHOD AND TEST APPARATUS USING THE SAME
- Publication number 20230417832
- Publication date Dec 28, 2023
- Samsung Electronics Co., Ltd.
- Kwang Kyu KIM
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST APPARATUS CAPABLE OF INDUCING REDUCTION OF POWER...
- Publication number 20230420068
- Publication date Dec 28, 2023
- YIK Corporation
- Hyo Sang JO
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS OF ANALYZING DATA, AND STORAGE MEDIUM
- Publication number 20230288476
- Publication date Sep 14, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Huan LU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM ON CHIP FOR PERFORMING SCAN TEST AND METHOD OF DESIGNING THE...
- Publication number 20230141786
- Publication date May 11, 2023
- Samsung Electronics Co., Ltd.
- WOOHYUN SON
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Measurement of a Parameter of a DUT
- Publication number 20230147947
- Publication date May 11, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tsung-Hsien Tsai
- G01 - MEASURING TESTING
Information Patent Application
On-Die Aging Measurements for Dynamic Timing Modeling
- Publication number 20230129176
- Publication date Apr 27, 2023
- Intel Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR FACILITATING BUILT-IN SELF-TEST OF SYSTEM-ON-...
- Publication number 20220334181
- Publication date Oct 20, 2022
- NXP USA, Inc.
- Rohan Poudel
- G01 - MEASURING TESTING
Information Patent Application
SETUP TIME AND HOLD TIME DETECTION SYSTEM AND DETECTION METHOD
- Publication number 20220326304
- Publication date Oct 13, 2022
- DigWise Technology Corporation, LTD
- Shih-Hao CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Row Redundancy Techniques
- Publication number 20220319632
- Publication date Oct 6, 2022
- ARM Limited
- Amandeep Kaur
- G11 - INFORMATION STORAGE
Information Patent Application
THREE-DIMENSIONAL STACKED MEMORY DEVICE AND METHOD
- Publication number 20220310194
- Publication date Sep 29, 2022
- Samsung Electronics Co., Ltd.
- Shinhaeng KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
- Publication number 20220308111
- Publication date Sep 29, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Michael Feilen
- G01 - MEASURING TESTING
Information Patent Application
MEMORY DEVICE TEST METHOD, APPARATUS, AND SYSTEM, MEDIUM, AND ELECT...
- Publication number 20220291284
- Publication date Sep 15, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Yu Yu
- G01 - MEASURING TESTING
Information Patent Application
Leakage Screening Based on Use-Case Power Prediction
- Publication number 20220268835
- Publication date Aug 25, 2022
- Google LLC
- Emre Tuncer
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED TRANSMITTER SLEW RATE CALIBRATION
- Publication number 20220255550
- Publication date Aug 11, 2022
- Rambus Inc.
- Robert E. Palmer
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURABLE MULTIPLIER-FREE MULTIRATE FILTER
- Publication number 20220231670
- Publication date Jul 21, 2022
- Raytheon Company
- Antoine Rouphael
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MULTI-CHANNEL TIMING CALIBRATION DEVICE AND METHOD
- Publication number 20220146575
- Publication date May 12, 2022
- YOUNGTEK ELECTRONICS CORPORATION
- Ching-Yung Tseng
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TESTING MACHINE WITH DATA PROCESSING FUNCTION AND INFORMA...
- Publication number 20220099729
- Publication date Mar 31, 2022
- SPIROX CORPORATION
- HSING-FU LIN
- G01 - MEASURING TESTING
Information Patent Application
POWER CONSUMPTION MEASUREMENT ASSEMBLY AND METHOD, AND CHIP POWER C...
- Publication number 20220099741
- Publication date Mar 31, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Xinwang CHEN
- G01 - MEASURING TESTING
Information Patent Application
ERROR RATE MEASURING APPARATUS AND ERROR RATE MEASURING METHOD
- Publication number 20220074987
- Publication date Mar 10, 2022
- Anritsu Corporation
- Hisao KIDOKORO
- G01 - MEASURING TESTING

with comparison between actual response and known fault free response

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Integrated circuit with timing correction circuitry

Test apparatus

Power consumption measurement assembly and method, and chip power c...

Method and apparatus for integrated circuit testing

Integrated transmitter slew rate calibration

System on chip for performing scan test and method of designing the...

Memory device test method, apparatus, and system, medium, and elect...

Test method for control chip and related device

Circuit and method to measure simulation to silicon timing correlation

Three-dimensional stacked memory device and method

Measurement system and measurement method

Leakage screening based on use-case power prediction

End of life performance throttling to prevent data loss

Semiconductor integrated circuit device and operating method thereof

Method and apparatus for testing artificial intelligence chip, devi...

Systems and methods for ground fault detection

System, apparatus and method for functional testing of one or more...

Method for eliminating fake faults in gate-level simulation

Configurable multiplier-free multirate filter

Method, apparatus and storage medium for testing chip, and chip the...

Measuring and evaluating a test signal generated by a device under...

Fault injection in a clock monitor unit

On-die aging measurements for dynamic timing modeling

Error rate measuring apparatus and error rate measuring method

Multi-channel timing calibration device and method

Row redundancy techniques

System and method for facilitating built-in self-test of system-on-...

Setup time and hold time detection system and detection method

Wafer test system and methods thereof

Secondary monitoring system for a machine under test

Patents Applicationslast 30 patents

MIXED SIGNAL CIRCUIT, METHODS AND DEVICES FOR TESTING MIXED SIGNAL...

INTEGRATED CIRCUIT WITH TIMING CORRECTION CIRCUITRY

TESTING A CONTROL DEVICE USING A TEST ASSEMBLY

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND EVALUATION SYSTEM

TEST LOAD CIRCUIT

DETERMINATION DEVICE, TEST SYSTEM, AND GENERATION DEVICE

METHOD AND APPARATUS FOR INTEGRATED CIRCUIT TESTING

SELF-DIAGNOSIS CIRCUIT AND SEMICONDUCTOR DEVICE

DETERMINATION DEVICE, TEST SYSTEM, AND GENERATION DEVICE

CIRCUIT AND METHOD TO MEASURE SIMULATION TO SILICON TIMING CORRELATION

CIRCUIT AND METHOD TO MEASURE SIMULATION TO SILICON TIMING CORRELATION

TRAINING METHOD AND TEST APPARATUS USING THE SAME

SEMICONDUCTOR TEST APPARATUS CAPABLE OF INDUCING REDUCTION OF POWER...

METHOD AND APPARATUS OF ANALYZING DATA, AND STORAGE MEDIUM

SYSTEM ON CHIP FOR PERFORMING SCAN TEST AND METHOD OF DESIGNING THE...

Systems and Methods for Measurement of a Parameter of a DUT

On-Die Aging Measurements for Dynamic Timing Modeling

SYSTEM AND METHOD FOR FACILITATING BUILT-IN SELF-TEST OF SYSTEM-ON-...

SETUP TIME AND HOLD TIME DETECTION SYSTEM AND DETECTION METHOD

Row Redundancy Techniques

THREE-DIMENSIONAL STACKED MEMORY DEVICE AND METHOD

MEASUREMENT SYSTEM AND MEASUREMENT METHOD

MEMORY DEVICE TEST METHOD, APPARATUS, AND SYSTEM, MEDIUM, AND ELECT...

Leakage Screening Based on Use-Case Power Prediction

INTEGRATED TRANSMITTER SLEW RATE CALIBRATION

CONFIGURABLE MULTIPLIER-FREE MULTIRATE FILTER

MULTI-CHANNEL TIMING CALIBRATION DEVICE AND METHOD

AUTOMATED TESTING MACHINE WITH DATA PROCESSING FUNCTION AND INFORMA...

POWER CONSUMPTION MEASUREMENT ASSEMBLY AND METHOD, AND CHIP POWER C...

ERROR RATE MEASURING APPARATUS AND ERROR RATE MEASURING METHOD