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with detectors on both sides of the object to be measured
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G01B2210/44
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PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B2210/00
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G01B2210/44
with detectors on both sides of the object to be measured
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Patents Grants
last 30 patents
Information
Patent Grant
Acoustic sensor having waveguide and inspection device
Patent number
11,692,819
Issue date
Jul 4, 2023
Kabushiki Kaisha Toshiba
Kazuhiro Itsumi
G01 - MEASURING TESTING
Information
Patent Grant
Bending beam for a swivel bending machine
Patent number
11,583,908
Issue date
Feb 21, 2023
Trumpf Maschinen Austria GmbH & Co. KG.
Michael Auzinger
B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information
Patent Grant
Device for the contactless three-dimensional inspection of a mechan...
Patent number
11,371,836
Issue date
Jun 28, 2022
Didier Le Neel
G01 - MEASURING TESTING
Information
Patent Grant
Device for the contactless three-dimensional inspection of a mechan...
Patent number
10,724,852
Issue date
Jul 28, 2020
Mesure-Systems3D SAS
Didier Le Neel
G01 - MEASURING TESTING
Information
Patent Grant
System and method for determining tow parameters
Patent number
10,690,485
Issue date
Jun 23, 2020
Vanderbilt University
David J. Koester
G01 - MEASURING TESTING
Information
Patent Grant
Solder printing inspection device
Patent number
10,679,332
Issue date
Jun 9, 2020
CKD Corporation
Manabu Okuda
G01 - MEASURING TESTING
Information
Patent Grant
Device for determining the quality of a corrugated board web
Patent number
10,655,950
Issue date
May 19, 2020
BHS Corrugated Maschinen-und Anlagenbau GmbH
Karl Ruhland
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Thickness detection experiment platform
Patent number
10,378,879
Issue date
Aug 13, 2019
Tyco Electronics (Shanghai) Co. Ltd.
Lei Zhou
G05 - CONTROLLING REGULATING
Information
Patent Grant
Device for determining the quality of a corrugated board web
Patent number
10,359,274
Issue date
Jul 23, 2019
BHS Corrugated Maschinen-und Anlagenbau GmbH
Karl Ruhland
B31 - MAKING ARTICLES OF PAPER OR CARDBOARD WORKING PAPER OR CARDBOARD
Information
Patent Grant
Online thickness detection platform
Patent number
10,352,687
Issue date
Jul 16, 2019
Tyco Electronics (Shanghai) Co. Ltd.
Lei Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Model based measurement systems with improved electromagnetic solve...
Patent number
10,345,095
Issue date
Jul 9, 2019
KLA-Tencor Corporation
Stilian Ivanov Pandev
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
In line web process measurement apparatus and method
Patent number
10,281,318
Issue date
May 7, 2019
SolveTech, lnc.
Douglas Lawrence
G01 - MEASURING TESTING
Information
Patent Grant
Method for thickness measurement on measurement objects and device...
Patent number
10,234,274
Issue date
Mar 19, 2019
Micro-Epsilon Messtechnik GmbH & Co. KG
Herbert Fuellmeier
G01 - MEASURING TESTING
Information
Patent Grant
Measuring unit for measuring the bending radius and the forwarding...
Patent number
10,092,937
Issue date
Oct 9, 2018
CTE SISTEMI S.r.l.
Marco Dani
G01 - MEASURING TESTING
Information
Patent Grant
Independently driven, dual sided scanner heads
Patent number
10,088,305
Issue date
Oct 2, 2018
Honeywell Limited
Ronald E. Beselt
G01 - MEASURING TESTING
Information
Patent Grant
Caliper sensor and method using mid-infrared interferometry
Patent number
10,072,922
Issue date
Sep 11, 2018
Honeywell Limited
Sebastien Tixier
G01 - MEASURING TESTING
Information
Patent Grant
Diametral measurement system for evaluation of cylindrical objects,...
Patent number
9,897,428
Issue date
Feb 20, 2018
Monte Hieb
G01 - MEASURING TESTING
Information
Patent Grant
Method for centering grinding wheel in thread grinder and measureme...
Patent number
9,707,649
Issue date
Jul 18, 2017
NSK Ltd.
Kiyoshi Igarashi
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Caliper sensor and method using mid-infrared interferometry
Patent number
9,581,433
Issue date
Feb 28, 2017
Honeywell ASCA Inc.
Sebastien Tixier
G01 - MEASURING TESTING
Information
Patent Grant
Measurement device and measurement method for measuring the thickne...
Patent number
9,528,811
Issue date
Dec 27, 2016
Trumpf Maschinen Austria GmbH & Co. KG.
Michael Auzinger
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for measuring the thickness of a measurement o...
Patent number
9,335,145
Issue date
May 10, 2016
Micro-Epsilon Messtechnik GmbH & Co. KG
Achim Sonntag
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for three dimensional inspection of wafer saw...
Patent number
9,140,546
Issue date
Sep 22, 2015
KLA-Tencor Corporation
Benoit Maison
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for three dimensional inspection of wafer saw...
Patent number
9,103,665
Issue date
Aug 11, 2015
KLA-Tencor Corporation
Benoit Maison
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for contactless determination of the thickness of...
Patent number
9,046,349
Issue date
Jun 2, 2015
Voith Patent GmbH
Pekka Typpo
D21 - PAPER-MAKING PRODUCTION OF CELLULOSE
Information
Patent Grant
Ultrasonic measuring method and ultrasonic measuring system
Patent number
8,826,739
Issue date
Sep 9, 2014
Toyota Jidosha Kabushiki Kaisha
Seiichi Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Testing device for planeness
Patent number
8,650,768
Issue date
Feb 18, 2014
HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
Xian-Gang Fan
G01 - MEASURING TESTING
Information
Patent Grant
Thickness measuring system for measuring a thickness of a plate-sha...
Patent number
8,625,112
Issue date
Jan 7, 2014
HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
Xin Yang
G01 - MEASURING TESTING
Information
Patent Grant
Scanner belt load and stretch compensation control system
Patent number
8,564,851
Issue date
Oct 22, 2013
Honeywell ASCA Inc.
Ron Beselt
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method for calibrating a thickness gauge
Patent number
8,554,503
Issue date
Oct 8, 2013
Micro-Epsilon Messetechnik GmbH
Günter Schallmoser
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring the shape and thickness variatio...
Patent number
8,537,369
Issue date
Sep 17, 2013
KLA Tencor
Shouhong Tang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS, DEVICES, AND METHODS FOR UNMANNED POWER LINE DIAMETER MEAS...
Publication number
20230384078
Publication date
Nov 30, 2023
BEIROBOTICS LLC
Michael Kenneth BEIRO
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Application
DEVICE FOR THE CONTACTLESS THREE-DIMENSIONAL INSPECTION OF A MECHAN...
Publication number
20210108914
Publication date
Apr 15, 2021
DWFritz Automation, Inc.
Didier Le Neel
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR MEASURING HEIGHT IN THE PRESENCE OF THIN LAYERS
Publication number
20180364028
Publication date
Dec 20, 2018
UNITY SEMICONDUCTOR
Jean-Philippe PIEL
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR DETERMINING THE QUALITY OF A CORRUGATED BOARD WEB
Publication number
20180073861
Publication date
Mar 15, 2018
BHS Corrugated Maschinen-und Anlagenbau GmbH
Karl RUHLAND
B31 - MAKING ARTICLES OF PAPER OR CARDBOARD WORKING PAPER OR CARDBOARD
Information
Patent Application
MEASUREMENT DEVICE AND MEASUREMENT METHOD FOR MEASURING THE THICKNE...
Publication number
20150292853
Publication date
Oct 15, 2015
TRUMPF MASCHINEN AUSTRIA GMBH & CO. KG.
Michael Auzinger
G01 - MEASURING TESTING
Information
Patent Application
MEASURING APPARATUS
Publication number
20140355009
Publication date
Dec 4, 2014
HON HAI PRECISION INDUSTRY CO., LTD.
KUEI-YANG LIN
G01 - MEASURING TESTING
Information
Patent Application
THICKNESS MEASUREMENT SYSTEM AND THICKNESS MEASUREMENT METHOD
Publication number
20140268183
Publication date
Sep 18, 2014
Kabushiki Kaisha Toshiba
Tetsuo Furuta
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Method for Measuring the Thickness of a Measurement O...
Publication number
20140101954
Publication date
Apr 17, 2014
MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
Achim Sonntag
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR MEASURING SHAPE AND THICKNESS VARIATION OF...
Publication number
20130188179
Publication date
Jul 25, 2013
KLA-Tencor Corporation
Shouhong Tang
G01 - MEASURING TESTING
Information
Patent Application
THICKNESS MEASURING SYSTEM FOR MEASURING A THICKNESS OF A PLATE-SHA...
Publication number
20130141737
Publication date
Jun 6, 2013
HON HAI Precision Industry CO., LTD.
XIN YANG
G01 - MEASURING TESTING
Information
Patent Application
TESTING DEVICE FOR PLANENESS
Publication number
20130104412
Publication date
May 2, 2013
HON HAI Precision Industry CO., LTD.
XIAN-GANG FAN
G01 - MEASURING TESTING
Information
Patent Application
Scanner Belt Load and Stretch Compensation Control System
Publication number
20130100503
Publication date
Apr 25, 2013
Honeywell ASCA Inc.
Ron Beselt
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CONTACTLESS DETERMINATION OF THE THICKNESS OF A WEB OF M...
Publication number
20130003047
Publication date
Jan 3, 2013
Pekka Typpo
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR THREE DIMENSIONAL INSPECTION OF WAFER SAW...
Publication number
20120300039
Publication date
Nov 29, 2012
KLA-Tencor Corporation
Benoit Maison
G01 - MEASURING TESTING
Information
Patent Application
ULTRASONIC MEASURING METHOD AND ULTRASONIC MEASURING SYSTEM
Publication number
20120186348
Publication date
Jul 26, 2012
Seiichi MATSUMOTO
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR CONTACTLESS DETERMINATION OF THE THICKNESS OF...
Publication number
20120170059
Publication date
Jul 5, 2012
Pekka Typpo
G01 - MEASURING TESTING
Information
Patent Application
FILM THICKNESS MEASUREMENT
Publication number
20120088026
Publication date
Apr 12, 2012
John Stephen Massa
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR CALIBRATING A MULTIPLE-BEAM CURVATURE/FLATNES...
Publication number
20110228282
Publication date
Sep 22, 2011
Xerox Corporation.
Ming Yang
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CALIBRATING A THICKNESS GAUGE
Publication number
20110125442
Publication date
May 26, 2011
Günter Schallmoser
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR MEASUREMENT OF PARAMETERS OF A FLAT MATERIAL
Publication number
20090281764
Publication date
Nov 12, 2009
Alexander M. Raykhman
G01 - MEASURING TESTING
Information
Patent Application
Sheet Stabilization With Dual Opposing Cross Direction Air Clamps
Publication number
20090260772
Publication date
Oct 22, 2009
Tamer Mark Alev
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
Publication number
20090108853
Publication date
Apr 30, 2009
ONO SOKKI CO., LTD.
Minoru Yuyama
G01 - MEASURING TESTING
Information
Patent Application
Method for determining the absolute thickness of non-transparent an...
Publication number
20090059243
Publication date
Mar 5, 2009
Mark A. Weber
G02 - OPTICS
Information
Patent Application
MEASURING DEVICE FOR MEASURING ASPECTS OF OBJECTS
Publication number
20090037141
Publication date
Feb 5, 2009
HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD
Qing LIU
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS OF ARRAYED, CLUSTERED OR COUPLED EDDY CURRENT...
Publication number
20070163712
Publication date
Jul 19, 2007
Yehiel Gotkis
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for measurement of thickness and warpage of su...
Publication number
20070022618
Publication date
Feb 1, 2007
Rodney L. Kirstine
G01 - MEASURING TESTING
Information
Patent Application
Measuring device
Publication number
20050157314
Publication date
Jul 21, 2005
Pekka Typpoe
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for measurement of thickness and warpage of su...
Publication number
20050039342
Publication date
Feb 24, 2005
Rodney L. Kirstine
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus of arrayed sensors for metrological control
Publication number
20050000653
Publication date
Jan 6, 2005
Lam Research Corporation
Yehiel Gotkis
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus of arrayed, clustered or coupled eddy current...
Publication number
20040206455
Publication date
Oct 21, 2004
Lam Research Corporation
Yehiel Gotkis
G01 - MEASURING TESTING