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with electromagnetic counterbalancing means
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G01P15/132
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PHYSICS
G01
Measuring instruments
G01P
MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
G01P15/00
Measuring acceleration Measuring deceleration Measuring shock
Current Industry
G01P15/132
with electromagnetic counterbalancing means
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Patents Grants
last 30 patents
Information
Patent Grant
Vibration remote sensor based on speckles tracking, which uses an o...
Patent number
12,210,032
Issue date
Jan 28, 2025
Spacearth Technology S.R.L.
Emanuele Giacomozzi
G01 - MEASURING TESTING
Information
Patent Grant
Bias performance in force balance accelerometers
Patent number
12,140,606
Issue date
Nov 12, 2024
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Grant
Sensor having stress relieving support structure
Patent number
12,123,893
Issue date
Oct 22, 2024
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Grant
Vibration rectification error correction circuit, physical quantity...
Patent number
11,808,572
Issue date
Nov 7, 2023
Seiko Epson Corporation
Masayoshi Todorokihara
G01 - MEASURING TESTING
Information
Patent Grant
Multilayer magnetic circuit assembly
Patent number
11,521,772
Issue date
Dec 6, 2022
Honeywell International Inc.
Paul W. Dwyer
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Stress relieving sensor flange
Patent number
11,422,152
Issue date
Aug 23, 2022
Honeywell International Inc.
Paul W. Dwyer
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Low-noise multi axis MEMS accelerometer
Patent number
11,377,346
Issue date
Jul 5, 2022
Murata Manufacturing Co., Ltd.
Hannu Vesterinen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Accelerometer including rectangular coil and rectangular pole piece
Patent number
11,275,098
Issue date
Mar 15, 2022
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Grant
Multilayer excitation ring
Patent number
11,169,175
Issue date
Nov 9, 2021
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometer control
Patent number
10,900,994
Issue date
Jan 26, 2021
ATLANTIC INERTIAL SYSTEMS, LIMITED
Alan Malvern
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometer with built-in temperature correction
Patent number
10,677,812
Issue date
Jun 9, 2020
Applied Physics Systems, Inc.
William Goodman
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Vibrating-mass gyroscope system
Patent number
10,648,811
Issue date
May 12, 2020
Northrop Grumman Systems Corporation
Alexander A. Trusov
G01 - MEASURING TESTING
Information
Patent Grant
De-centralized control architecture for improved sensitivity of acc...
Patent number
10,564,312
Issue date
Feb 18, 2020
Lockheed Martin Corporation
Thomas J. Meyer
G01 - MEASURING TESTING
Information
Patent Grant
High-precision magnetic suspension accelerometer
Patent number
10,444,257
Issue date
Oct 15, 2019
CHINA THREE GORGES UNIVERSITY
Liqing Pan
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometer with built-in temperature correction
Patent number
10,416,185
Issue date
Sep 17, 2019
Applied Physics Systems
William Goodman
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
De-centralized control architecture for improved sensitivity of acc...
Patent number
10,416,345
Issue date
Sep 17, 2019
Lockheed Martin Corporation
Thomas J. Meyer
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometer
Patent number
10,401,378
Issue date
Sep 3, 2019
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Grant
Reducing bias in an accelerometer via current adjustment
Patent number
10,180,445
Issue date
Jan 15, 2019
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Grant
Reducing bias in an accelerometer via a pole piece
Patent number
10,161,956
Issue date
Dec 25, 2018
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Grant
Reducing hysteresis effects in an accelerometer
Patent number
10,036,765
Issue date
Jul 31, 2018
Honeywell International Inc.
Paul W. Dwyer
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Fabrication process and package design for use in a micro-machined...
Patent number
9,869,796
Issue date
Jan 16, 2018
Kinemetrics, Inc.
William Thomas Pike
G01 - MEASURING TESTING
Information
Patent Grant
Closed loop control techniques for displacement sensors with optica...
Patent number
9,702,992
Issue date
Jul 11, 2017
SILICON AUDIO SEISMIC, LLC
Bradley Dean Avenson
G01 - MEASURING TESTING
Information
Patent Grant
Reducing hysteresis effects in accelerometer
Patent number
9,658,244
Issue date
May 23, 2017
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Grant
Stress reduction components for sensors
Patent number
9,400,287
Issue date
Jul 26, 2016
Honeywell International Inc.
Ryan Roehnelt
G01 - MEASURING TESTING
Information
Patent Grant
Stress reduction components for sensors
Patent number
9,164,117
Issue date
Oct 20, 2015
Honeywell International Inc.
Ryan Roehnelt
G01 - MEASURING TESTING
Information
Patent Grant
Hung mass accelerometer with differential Eddy current sensing
Patent number
9,121,865
Issue date
Sep 1, 2015
Raytheon Company
John Joseph Anagnost
G01 - MEASURING TESTING
Information
Patent Grant
MEMS accelerometer having a flux concentrator between parallel magnets
Patent number
9,016,126
Issue date
Apr 28, 2015
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Grant
Fabrication process and package design for use in a micro-machined...
Patent number
8,978,246
Issue date
Mar 17, 2015
Kinemetrics, Inc.
William T. Pike
G01 - MEASURING TESTING
Information
Patent Grant
Precision apparatus using low thermal expansion component
Patent number
8,490,570
Issue date
Jul 23, 2013
Japan Aviation Electronics Industry, Limited
Kenji Kuramoto
G01 - MEASURING TESTING
Information
Patent Grant
Magnetically reinforced servo accelerometer
Patent number
8,459,113
Issue date
Jun 11, 2013
Japan Aviation Electronics Industry, Limited
Kenji Kuramoto
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ACCELEROMETER WITH THERMAL EXPANSION STRAIN PROTECTION
Publication number
20240409394
Publication date
Dec 12, 2024
Honeywell International Inc.
Paul W. Dwyer
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ACCELEROMETER FORMING A RECESS ENCLOSING AN ELECTROMAGNETIC COIL
Publication number
20240118309
Publication date
Apr 11, 2024
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Application
SENSOR HAVING STRESS RELIEVING SUPPORT STRUCTURE
Publication number
20240061012
Publication date
Feb 22, 2024
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Application
BIAS PERFORMANCE IN FORCE BALANCE ACCELEROMETERS
Publication number
20240044933
Publication date
Feb 8, 2024
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Application
VIBRATION REMOTE SENSOR BASED ON SPECKLES TRACKING, WHICH USES AN O...
Publication number
20230105395
Publication date
Apr 6, 2023
SPACEARTH TECHNOLOGY S.R.L.
Emanuele GIACOMOZZI
G02 - OPTICS
Information
Patent Application
TEMPERATURE DEPENDENT ACCELERATION CURRENT SOURCE CIRCUITRY
Publication number
20230055100
Publication date
Feb 23, 2023
TEXAS INSTRUMENTS INCORPORATED
Carsten Ingo Stoerk
G01 - MEASURING TESTING
Information
Patent Application
ACCELEROMETER INCLUDING RECTANGULAR COIL AND RECTANGULAR POLE PIECE
Publication number
20220018872
Publication date
Jan 20, 2022
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Application
MULTILAYER EXCITATION RING
Publication number
20210247418
Publication date
Aug 12, 2021
HONEYWELL INTERNATIONAL INC.
Paul W. Dwyer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STRESS RELIEVING SENSOR FLANGE
Publication number
20210172974
Publication date
Jun 10, 2021
HONEYWELL INTERNATIONAL INC.
Paul W. Dwyer
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
LOW-NOISE MULTI AXIS MEMS ACCELEROMETER
Publication number
20210070609
Publication date
Mar 11, 2021
Murata Manufacturing Co., Ltd.
Hannu VESTERINEN
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ACCELEROMETER WITH BUILT-IN TEMPERATURE CORRECTION
Publication number
20210011047
Publication date
Jan 14, 2021
William Goodman
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
ACCELEROMETER WITH BUILT-IN TEMPERATURE CORRECTION
Publication number
20200158748
Publication date
May 21, 2020
William Goodman
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
VIBRATION RECTIFICATION ERROR CORRECTION CIRCUIT, PHYSICAL QUANTITY...
Publication number
20190331491
Publication date
Oct 31, 2019
SEIKO EPSON CORPORATION
Masayoshi TODOROKIHARA
G01 - MEASURING TESTING
Information
Patent Application
ACCELEROMETER CONTROL
Publication number
20180128851
Publication date
May 10, 2018
Atlantic Inertial Systems, Limited
Alan MALVERN
G01 - MEASURING TESTING
Information
Patent Application
ACCELEROMETER WITH BUILT-IN TEMPERATURE CORRECTION
Publication number
20180031593
Publication date
Feb 1, 2018
William Goodman
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
HIGH-PRECISION MAGNETIC SUSPENSION ACCELEROMETER
Publication number
20170242050
Publication date
Aug 24, 2017
CHINA THREE GORGES UNIVERSITY
Liqing PAN
G01 - MEASURING TESTING
Information
Patent Application
REDUCING HYSTERESIS EFFECTS IN AN ACCELEROMETER
Publication number
20170010297
Publication date
Jan 12, 2017
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Application
Hung Mass Accelerometer With Differential Eddy Current Sensing
Publication number
20140157897
Publication date
Jun 12, 2014
Raytheon Company
John Joseph Anagnost
G01 - MEASURING TESTING
Information
Patent Application
STRESS REDUCTION COMPONENTS FOR SENSORS
Publication number
20140109673
Publication date
Apr 24, 2014
Honeywell International Inc.
Ryan Roehnelt
G01 - MEASURING TESTING
Information
Patent Application
Servo Accelerometer
Publication number
20110209545
Publication date
Sep 1, 2011
Japan Aviation Electronics Industry Limited
Kenji Kuramoto
G01 - MEASURING TESTING
Information
Patent Application
Precision Apparatus Using Low Thermal Expansion Component
Publication number
20110203511
Publication date
Aug 25, 2011
Japan Aviation Electronics Industry Limited
Kenji Kuramoto
G01 - MEASURING TESTING
Information
Patent Application
FABRICATION PROCESS AND PACKAGE DESIGN FOR USE IN A MICRO-MACHINED...
Publication number
20110170376
Publication date
Jul 14, 2011
William T. Pike
G01 - MEASURING TESTING
Information
Patent Application
TRANSLATIONAL MASS IN-PLANE MEMS ACCELEROMETER
Publication number
20110005317
Publication date
Jan 13, 2011
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR SENSING ACCELERATION USING A TRANSLATIONAL MASS IN-PLANE...
Publication number
20110005318
Publication date
Jan 13, 2011
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Application
USING POLE PIECES TO GUIDE MAGNETIC FLUX THROUGH A MEMS DEVICE AND...
Publication number
20100242601
Publication date
Sep 30, 2010
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Application
USING POLE PIECES TO GUIDE MAGNETIC FLUX THROUGH A MEMS DEVICE AND...
Publication number
20100244164
Publication date
Sep 30, 2010
Honeywell International Inc.
Ryan Roehnelt
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Servo Accelerometer
Publication number
20100192691
Publication date
Aug 5, 2010
Japan Aviation Electronics Industry Limited
Shuichi Yamamoto
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR INCREASED FLUX DENSITY D'ARSONVAL MEMS ACCELE...
Publication number
20100180681
Publication date
Jul 22, 2010
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Application
MEMS ACCELEROMETER HAVING A FLUX CONCENTRATOR BETWEEN PARALLEL MAGNETS
Publication number
20100170341
Publication date
Jul 8, 2010
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Application
D'ARSONVAL MOVEMENT MEMS ACCELEROMETER
Publication number
20100083761
Publication date
Apr 8, 2010
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING