with incident electron beam

Industry

CPC
G01N23/2251

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/2251with incident electron beam

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus
- Patent number 12,169,182
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Wei Chean Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for Schottky TFE inspection
- Patent number 12,165,834
- Issue date Dec 10, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam delayering system and method, topographically enhanced del...
- Patent number 12,165,840
- Issue date Dec 10, 2024
- Techinsights Inc.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manipulating and detecting biological samples
- Patent number 12,158,402
- Issue date Dec 3, 2024
- Singular Genomics Systems, Inc.
- Yuji Ishitsuka
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Cell analysis apparatus and cell analysis method
- Patent number 12,146,846
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Akiko Hisada
- G01 - MEASURING TESTING
Information Patent Grant
Self-differential confocal tilt sensor for measuring level variatio...
- Patent number 12,142,456
- Issue date Nov 12, 2024
- ASML Netherlands B.V.
- Jinmei Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Serial arrangement having multiple plies of asymmetric filter media...
- Patent number 12,115,502
- Issue date Oct 15, 2024
- Sartorius Stedim Biotech GmbH
- Volkmar Thom
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
System for estimating the occurrence of defects, and computer-reada...
- Patent number 12,111,272
- Issue date Oct 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for monitoring beam profile and power
- Patent number 12,105,036
- Issue date Oct 1, 2024
- ASML Netherlands B.V.
- Jian Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Construction method for photocathode indirect competition sensor an...
- Patent number 12,092,601
- Issue date Sep 17, 2024
- Oil Crops Research Institute of Chinese Academy of Agricultural Sciences
- Zhaowei Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Image contrast enhancement in sample inspection
- Patent number 12,087,542
- Issue date Sep 10, 2024
- ASML Netherlands B.V.
- Yixiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptive specimen image acquisition using an artificial neural network
- Patent number 12,085,523
- Issue date Sep 10, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample rotation system and method
- Patent number 12,085,522
- Issue date Sep 10, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Kuojung Chiu
- G01 - MEASURING TESTING
Information Patent Grant
Cross-talk cancellation in multiple charged-particle beam inspection
- Patent number 12,080,513
- Issue date Sep 3, 2024
- ASML Netherlands B.V.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation analysis system, charged particle beam system, and radiat...
- Patent number 12,078,763
- Issue date Sep 3, 2024
- HITACHI HIGH-TECH CORPORATION
- Akira Takano
- G01 - MEASURING TESTING
Information Patent Grant
Defect characterization method and apparatus
- Patent number 12,067,704
- Issue date Aug 20, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Ning Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Estimating heights of defects in a wafer by scaling a 3D model usin...
- Patent number 12,057,336
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Shashank Shrikant Agashe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method, inspection system, and semiconductor fabrication...
- Patent number 12,055,861
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Kihyun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System to inspect, modify or analyze a region of interest of a samp...
- Patent number 12,044,638
- Issue date Jul 23, 2024
- Carl Zeiss SMT GmbH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
Method of preventing lamellar silica formation in glass container
- Patent number 12,042,830
- Issue date Jul 23, 2024
- Amgen Inc.
- Yasser Nashed-Samuel
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Crystal defect observation method for compound semiconductor
- Patent number 12,038,396
- Issue date Jul 16, 2024
- Mitsubishi Electric Corporation
- Hajime Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect inspection method and defect inspection device
- Patent number 12,039,716
- Issue date Jul 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for positioning and transferring a sample
- Patent number 12,000,789
- Issue date Jun 4, 2024
- FEI Company
- Libor Novak
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive specimen image acquisition
- Patent number 11,982,634
- Issue date May 14, 2024
- FEI Company
- Pavel Potocek
- G01 - MEASURING TESTING
Information Patent Grant
Material properties from two-dimensional image
- Patent number 11,982,635
- Issue date May 14, 2024
- BP Corporation North America Inc.
- Glen L. Gettemy
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor structure inspection using a high atomic number material
- Patent number 11,984,365
- Issue date May 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Pei-Hsuan Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system to mimic a random structural pattern
- Patent number 11,981,789
- Issue date May 14, 2024
- UNM Rainforest Innovations
- Sang Eon Han
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 11,978,195
- Issue date May 7, 2024
- Kioxia Corporation
- Keisuke Chiba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,971,372
- Issue date Apr 30, 2024
- FEI Company
- Jan Klusácek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determination method, elimination method and apparatus for electron...
- Patent number 11,971,368
- Issue date Apr 30, 2024
- SOUTH CHINA AGRICULTURAL UNIVERSITY
- Fang Lin
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
FRICTION REGULATION METHOD, APPARATUS AND SYSTEM FOR MOLYBDENUM DIS...
- Publication number 20240410916
- Publication date Dec 12, 2024
- Tsinghua University
- Dameng Liu
- C10 - PETROLEUM, GAS OR COKE INDUSTRIES TECHNICAL GASES CONTAINING CARBON MON...
Information Patent Application
SYSTEMS AND METHODS FOR MONITORING SLOPE STABILITY
- Publication number 20240410842
- Publication date Dec 12, 2024
- Muon Vision Inc.
- Tancredi Botto
- E21 - EARTH DRILLING MINING
Information Patent Application
MULTI-BEAM PARTICLE MICROSCOPE FOR REDUCING PARTICLE BEAM-INDUCED T...
- Publication number 20240402104
- Publication date Dec 5, 2024
- Carl Zeiss MultiSEM GmbH
- Gero Storeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED BEAM ON EDGE VIBRATION ANALYSIS
- Publication number 20240402102
- Publication date Dec 5, 2024
- FEI Company
- Scott Connors
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR THREE-DIMENSIONAL TOMOGRAPHY OF ELONGATED SAMPLES
- Publication number 20240402103
- Publication date Dec 5, 2024
- FEI Company
- Erik Michiel Franken
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CHARACTERIZING A NETWORK TO BE ANALYSED COMPRISING PERIO...
- Publication number 20240394867
- Publication date Nov 28, 2024
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Lucas JALOUSTRE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analysis System
- Publication number 20240393270
- Publication date Nov 28, 2024
- Hitachi High-Tech Corporation
- Azusa KONNO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR ANALYSING AN IMAGE OF A MICROLITHOGRAPHIC MIC...
- Publication number 20240393269
- Publication date Nov 28, 2024
- Carl Zeiss SMT GMBH
- Jens Oster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODELLING AND PREDICTION OF VIRTUAL QUALITY CONTROL DATA INCORPORAT...
- Publication number 20240387295
- Publication date Nov 21, 2024
- SANDISK TECHNOLOGIES, INC.
- Tsuyoshi Sendoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analysis Device and Analysis Method
- Publication number 20240385131
- Publication date Nov 21, 2024
- JEOL Ltd.
- Takeshi Otsuka
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONVERTING METROLOGY DATA
- Publication number 20240377343
- Publication date Nov 14, 2024
- ASML NETHERLANDS B.V.
- Yunbo GUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED FESEM AND LDI-TOF-MS ANALYSIS SYSTEM
- Publication number 20240369504
- Publication date Nov 7, 2024
- LG ENERGY SOLUTION, LTD.
- Soeun KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHODS FOR CHEMICAL MECHANICAL POLISHING
- Publication number 20240363447
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Te-Chien HOU
- B24 - GRINDING POLISHING
Information Patent Application
SYSTEM AND METHOD FOR DENOISING A REGION OF INTEREST OF A PATTERN
- Publication number 20240361262
- Publication date Oct 31, 2024
- ETROLOGY, LLC
- Vladislav Kaplan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PREVENTING LAMELLAR SILICA FORMATION IN GLASS CONTAINER
- Publication number 20240342771
- Publication date Oct 17, 2024
- Amgen Inc.
- Yasser Nashed-Samuel
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Application
METHOD AND SYSTEM FOR ANOMALY-BASED DEFECT INSPECTION
- Publication number 20240331132
- Publication date Oct 3, 2024
- ASML NETHERLANDS B.V.
- Haoyi LIANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEM-EDS HOLDER DEVICE FOR THIN FILTER-TYPE SAMPLE
- Publication number 20240328968
- Publication date Oct 3, 2024
- Korea Institute of Science and Technology
- Hye Jung Chang
- G01 - MEASURING TESTING
Information Patent Application
TRAINING SCANNING ELECTRON MICROSCOPY IMAGE SELECTION METHOD AND SE...
- Publication number 20240320816
- Publication date Sep 26, 2024
- Samsung Electronics Co., Ltd.
- Nohong Kwak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...
- Publication number 20240319123
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Achim WOESSNER
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD AND APPARATUS FOR SEMICONDUCTOR FEATURES WITH IN...
- Publication number 20240311698
- Publication date Sep 19, 2024
- Carl Zeiss SMT GMBH
- Alexander Freytag
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS OF CHARACTERIZING LIQUID
- Publication number 20240310324
- Publication date Sep 19, 2024
- THE UNIVERSITY OF LIVERPOOL
- Beata Layla MEHDI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE FOR EXAMINING A SPECIMEN
- Publication number 20240302304
- Publication date Sep 12, 2024
- Carl Zeiss SMT GMBH
- Moritz Becker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND INSPECTION DEVICE
- Publication number 20240297012
- Publication date Sep 5, 2024
- Hitachi High-Tech Corporation
- Atsuko Shintani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD
- Publication number 20240288389
- Publication date Aug 29, 2024
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- B08 - CLEANING
Information Patent Application
SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...
- Publication number 20240288391
- Publication date Aug 29, 2024
- Carl Zeiss SMT GMBH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ANALYZING SOLID ELECTROLYTE FILM STRUCTURE
- Publication number 20240288390
- Publication date Aug 29, 2024
- LG ENERGY SOLUTION, LTD.
- Jung Pil LEE
- G01 - MEASURING TESTING
Information Patent Application
Inspection Device and Inspection Method
- Publication number 20240280520
- Publication date Aug 22, 2024
- Hitachi High-Tech Corporation
- Takashi HIROI
- G01 - MEASURING TESTING
Information Patent Application
CRYSTALLINE RESIN CONTAINING MICROSCOPIC SURFACE RELIEFS AND METHOD...
- Publication number 20240280521
- Publication date Aug 22, 2024
- Ori Lieberman
- G01 - MEASURING TESTING
Information Patent Application
3D VOLUME INSPECTION METHOD AND METHOD OF CONFIGURING OF A 3D VOLUM...
- Publication number 20240281952
- Publication date Aug 22, 2024
- Carl Zeiss SMT GMBH
- Thomas Korb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE DETECTOR
- Publication number 20240280517
- Publication date Aug 22, 2024
- ASML NETHERLANDS B.V.
- Albertus Victor Gerardus MANGNUS
- G01 - MEASURING TESTING

with incident electron beam

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Charged particle beam apparatus

Method and apparatus for Schottky TFE inspection

Ion beam delayering system and method, topographically enhanced del...

Manipulating and detecting biological samples

Cell analysis apparatus and cell analysis method

Self-differential confocal tilt sensor for measuring level variatio...

Serial arrangement having multiple plies of asymmetric filter media...

System for estimating the occurrence of defects, and computer-reada...

Method and apparatus for monitoring beam profile and power

Construction method for photocathode indirect competition sensor an...

Image contrast enhancement in sample inspection

Adaptive specimen image acquisition using an artificial neural network

Sample rotation system and method

Cross-talk cancellation in multiple charged-particle beam inspection

Radiation analysis system, charged particle beam system, and radiat...

Defect characterization method and apparatus

Estimating heights of defects in a wafer by scaling a 3D model usin...

Inspection method, inspection system, and semiconductor fabrication...

System to inspect, modify or analyze a region of interest of a samp...

Method of preventing lamellar silica formation in glass container

Crystal defect observation method for compound semiconductor

Defect inspection method and defect inspection device

Method and system for positioning and transferring a sample

Adaptive specimen image acquisition

Material properties from two-dimensional image

Semiconductor structure inspection using a high atomic number material

Method and system to mimic a random structural pattern

Inspection method and inspection apparatus

Method of examining a sample using a charged particle microscope

Determination method, elimination method and apparatus for electron...

Patents Applicationslast 30 patents

FRICTION REGULATION METHOD, APPARATUS AND SYSTEM FOR MOLYBDENUM DIS...

SYSTEMS AND METHODS FOR MONITORING SLOPE STABILITY

MULTI-BEAM PARTICLE MICROSCOPE FOR REDUCING PARTICLE BEAM-INDUCED T...

AUTOMATED BEAM ON EDGE VIBRATION ANALYSIS

METHODS FOR THREE-DIMENSIONAL TOMOGRAPHY OF ELONGATED SAMPLES

METHOD FOR CHARACTERIZING A NETWORK TO BE ANALYSED COMPRISING PERIO...

Analysis System

METHOD AND DEVICE FOR ANALYSING AN IMAGE OF A MICROLITHOGRAPHIC MIC...

MODELLING AND PREDICTION OF VIRTUAL QUALITY CONTROL DATA INCORPORAT...

Analysis Device and Analysis Method

METHOD FOR CONVERTING METROLOGY DATA

INTEGRATED FESEM AND LDI-TOF-MS ANALYSIS SYSTEM

APPARATUS AND METHODS FOR CHEMICAL MECHANICAL POLISHING

SYSTEM AND METHOD FOR DENOISING A REGION OF INTEREST OF A PATTERN

METHOD OF PREVENTING LAMELLAR SILICA FORMATION IN GLASS CONTAINER

METHOD AND SYSTEM FOR ANOMALY-BASED DEFECT INSPECTION

SEM-EDS HOLDER DEVICE FOR THIN FILTER-TYPE SAMPLE

TRAINING SCANNING ELECTRON MICROSCOPY IMAGE SELECTION METHOD AND SE...

SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...

MEASUREMENT METHOD AND APPARATUS FOR SEMICONDUCTOR FEATURES WITH IN...

METHOD AND APPARATUS OF CHARACTERIZING LIQUID

ELECTRON MICROSCOPE FOR EXAMINING A SPECIMEN

CHARGED PARTICLE BEAM DEVICE AND INSPECTION DEVICE

CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD

SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...

METHOD FOR ANALYZING SOLID ELECTROLYTE FILM STRUCTURE

Inspection Device and Inspection Method

CRYSTALLINE RESIN CONTAINING MICROSCOPIC SURFACE RELIEFS AND METHOD...

3D VOLUME INSPECTION METHOD AND METHOD OF CONFIGURING OF A 3D VOLUM...

CHARGED PARTICLE DETECTOR