with incident electron beam

Industry

CPC
G01N23/2251

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/2251with incident electron beam

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Scintillator structure and method of evaluating scintillator
- Patent number 12,366,671
- Issue date Jul 22, 2025
- PROTERIAL, LTD.
- Shunsuke Goto
- G01 - MEASURING TESTING
Information Patent Grant
Graphene oxide affinity sample grids for Cyro-EM
- Patent number 12,360,021
- Issue date Jul 15, 2025
- The Regents of the University of California
- Feng Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample image display system and charged particle beam apparatus
- Patent number 12,354,830
- Issue date Jul 8, 2025
- HITACHI HIGH-TECH CORPORATION
- Wei Chean Tan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for automated characterization of fillers in po...
- Patent number 12,340,500
- Issue date Jun 24, 2025
- Honeywell Federal Manufacturing & Technologies, LLC
- Joseph Sang Kim
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device
- Patent number 12,334,299
- Issue date Jun 17, 2025
- HITACHI HIGH-TECH CORPORATION
- U Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron spectroscopy based techniques for determining various chem...
- Patent number 12,326,410
- Issue date Jun 10, 2025
- COZAI LTD
- Hagai Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Automatic particle beam focusing
- Patent number 12,327,342
- Issue date Jun 10, 2025
- FEI Company
- Yuchen Deng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Quality control evaluation method of cyanate ester matrix resin mat...
- Patent number 12,320,765
- Issue date Jun 3, 2025
- THE AEROSPACE CORPORATION
- Rafael J. Zaldivar
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system, lithographic apparatus, and inspection method
- Patent number 12,313,980
- Issue date May 27, 2025
- ASML Netherlands B.V.
- Alexey Olegovich Polyakov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement system and method for obtaining information about a sample
- Patent number 12,306,100
- Issue date May 20, 2025
- LAVCHIEFF Analytics GmbH
- Ventsislav Lavchiev
- G01 - MEASURING TESTING
Information Patent Grant
Study method for chlorite growth pattern based on in-situ high-prec...
- Patent number 12,298,292
- Issue date May 13, 2025
- CHENGDU UNIVERSITY OF TECHNOLOGY
- Laixing Cai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for tissue section immobilization and retention
- Patent number 12,298,211
- Issue date May 13, 2025
- Singular Genomics Systems, Inc.
- Yuji Ishitsuka
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Method and system for stress testing of materials using laser accel...
- Patent number 12,298,263
- Issue date May 13, 2025
- Institut National de la Recherche Scientifique
- Patrizio Antici
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Hybrid scanning electron microscopy and acousto-optic based metrology
- Patent number 12,278,085
- Issue date Apr 15, 2025
- Applied Materials Israel Ltd.
- Guy Shwartz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System to inspect, modify or analyze a region of interest of a samp...
- Patent number 12,270,774
- Issue date Apr 8, 2025
- Carl Zeiss SMT GmbH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
Thin film damage detection function and charged particle beam device
- Patent number 12,265,041
- Issue date Apr 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Michio Hatano
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 12,265,043
- Issue date Apr 1, 2025
- NuFlare Technology, Inc.
- Riki Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preventing lamellar silica formation in glass container
- Patent number 12,251,743
- Issue date Mar 18, 2025
- Amgen Inc.
- Yasser Nashed-Samuel
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Grant
Method, apparatus, and program for determining condition related to...
- Patent number 12,243,711
- Issue date Mar 4, 2025
- HITACHI HIGH-TECH CORPORATION
- Takahiro Nishihata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and inspection device
- Patent number 12,237,145
- Issue date Feb 25, 2025
- HITACHI HIGH-TECH CORPORATION
- Atsuko Shintani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for voltage contrast defect detection
- Patent number 12,196,692
- Issue date Jan 14, 2025
- ASML Netherlands B.V.
- Weiming Ren
- G01 - MEASURING TESTING
Information Patent Grant
Methods for growing crystals on QCM sensors
- Patent number 12,195,840
- Issue date Jan 14, 2025
- Saudi Arabian Oil Company
- Ayrat Gizzatov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
System and method for detecting microbial agents
- Patent number 12,188,886
- Issue date Jan 7, 2025
- Nanoscout Holdings Pty Ltd.
- Samuel Weitzman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for tissue section immobilization and retention
- Patent number 12,181,388
- Issue date Dec 31, 2024
- Singular Genomics Systems, Inc.
- Yuji Ishitsuka
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Utilize machine learning in selecting high quality averaged SEM ima...
- Patent number 12,182,983
- Issue date Dec 31, 2024
- ASML Netherlands B.V.
- Chen Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 12,169,182
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Wei Chean Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for Schottky TFE inspection
- Patent number 12,165,834
- Issue date Dec 10, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam delayering system and method, topographically enhanced del...
- Patent number 12,165,840
- Issue date Dec 10, 2024
- Techinsights Inc.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manipulating and detecting biological samples
- Patent number 12,158,402
- Issue date Dec 3, 2024
- Singular Genomics Systems, Inc.
- Yuji Ishitsuka
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Cell analysis apparatus and cell analysis method
- Patent number 12,146,846
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Akiko Hisada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELEMENTAL IDENTIFICATION BASED ON PHASE ANALYSIS
- Publication number 20250231127
- Publication date Jul 17, 2025
- FEI Company
- Marek Vanatka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER INSPECTION METHOD
- Publication number 20250231121
- Publication date Jul 17, 2025
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- G01 - MEASURING TESTING
Information Patent Application
IMPROVED SCANNING ELECTRON MICROSCOPE AND METHOD OF USING THE SAME
- Publication number 20250231130
- Publication date Jul 17, 2025
- FEI Company
- Jan Trojek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
E-BEAM OPTIMIZATION FOR OVERLAY MEASUREMENT OF BURIED FEATURES
- Publication number 20250231129
- Publication date Jul 17, 2025
- ASML NETHERLANDS B.V.
- Benoit Herve GAURY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR TISSUE SECTION IMMOBILIZATION AND RETENTION
- Publication number 20250224314
- Publication date Jul 10, 2025
- Singular Genomics Systems, Inc.
- Yuji Ishitsuka
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
DEFECT REGION DETECTION DEVICE AND WAFER DEFECT DETECTION SYSTEM IN...
- Publication number 20250217960
- Publication date Jul 3, 2025
- Samsung Electronics Co., Ltd.
- Minsu Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM
- Publication number 20250216346
- Publication date Jul 3, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Ron MEIRY
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION
- Publication number 20250208074
- Publication date Jun 26, 2025
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INSPECTING GROUP-III ELEMENT NITRIDE SUBSTRATE, METHOD OF...
- Publication number 20250201636
- Publication date Jun 19, 2025
- NGK Insulators, Ltd.
- Yoshitaka KURAOKA
- C30 - CRYSTAL GROWTH
Information Patent Application
DEEP LEARNING OF BISMUTH TELLURIDE CRYSTAL SIZE AND GRAIN BOUNDARIE...
- Publication number 20250164423
- Publication date May 22, 2025
- ATS IP, LLC
- Jake Perez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PREVENTING LAMELLAR SILICA FORMATION IN GLASS CONTAINER
- Publication number 20250153228
- Publication date May 15, 2025
- Amgen Inc.
- Yasser Nashed-Samuel
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Application
HIGH-CONTRAST EN-BLOC STAINING OF MOUSE WHOLE-BRAIN AND HUMAN BRAIN...
- Publication number 20250155336
- Publication date May 15, 2025
- Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V.
- Kun SONG
- G01 - MEASURING TESTING
Information Patent Application
FIELD OF VIEW SELECTION FOR METROLOGY ASSOCIATED WITH SEMICONDUCTOR...
- Publication number 20250147433
- Publication date May 8, 2025
- ASML NETHERLANDS B.V.
- Tsung-Pao FANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Ion Milling Device, and Inspection System
- Publication number 20250149288
- Publication date May 8, 2025
- Hitachi High-Tech Corporation
- Naohiro FUJITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECTRA DELTA METROLOGY
- Publication number 20250123225
- Publication date Apr 17, 2025
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR EXTRACTION OF STRUCTURAL DATA OF A SAMPLE FRO...
- Publication number 20250116617
- Publication date Apr 10, 2025
- Yeda Research and Development Co. Ltd.
- Michael Elbaum
- G01 - MEASURING TESTING
Information Patent Application
SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS
- Publication number 20250102451
- Publication date Mar 27, 2025
- FEI Company
- Vojtech MAHEL
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES
- Publication number 20250095955
- Publication date Mar 20, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Konstantin Chirko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBCELLULAR SELF-TRACER ION IMAGING AND LOCALIZATION METHOD OF META...
- Publication number 20250093285
- Publication date Mar 20, 2025
- Shandong Laboratory of Advanced Agricultural Sciences in Weifang
- Xiaohua HUANG
- G01 - MEASURING TESTING
Information Patent Application
UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...
- Publication number 20250078244
- Publication date Mar 6, 2025
- ASML NETHERLANDS B.V.
- Chen ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE FOR TISSUE SECTION IMMOBILIZATION AND RETENTION
- Publication number 20250067638
- Publication date Feb 27, 2025
- Singular Genomics Systems, Inc.
- Yuji Ishitsuka
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR TISSUE SECTION IMMOBILIZATION AND RETENTION
- Publication number 20250067639
- Publication date Feb 27, 2025
- Singular Genomics Systems, Inc.
- Yuji Ishitsuka
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR EVALUATING THE BENDING STIFFNESS OF HIGH ASPECT RATIO NA...
- Publication number 20250052703
- Publication date Feb 13, 2025
- IMEC vzw
- XiuMei Xu
- B82 - NANO-TECHNOLOGY
Information Patent Application
INSPECTION APPARATUS AND METHOD FOR GENERATING INSPECTION IMAGE
- Publication number 20250037269
- Publication date Jan 30, 2025
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELF-DIFFERENTIAL CONFOCAL TILT SENSOR FOR MEASURING LEVEL VARIATIO...
- Publication number 20250037966
- Publication date Jan 30, 2025
- ASML NETHERLANDS B.V.
- Jinmei YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Spectrum Processing Device, Specimen Analyzing Device, and Spectrum...
- Publication number 20250029225
- Publication date Jan 23, 2025
- JEOL Ltd.
- Yuka Ebata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED THIN FILM DEPOSITION SYSTEM AND THIN FILM DEPOSITION METH...
- Publication number 20250011918
- Publication date Jan 9, 2025
- Seoul National University R&DB Foundation
- Gyu Chul Yi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Determining Properties of a Substrate
- Publication number 20250012743
- Publication date Jan 9, 2025
- Eric Arno Vigen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM OF IMAGE ANALYSIS AND CRITICAL DIMENSION MATCHING...
- Publication number 20250003899
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Tim HOUBEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FOREIGN OBJECT HEIGHT MEASUREMENT METHOD AND CHARGED PARTICLE BEAM...
- Publication number 20250003898
- Publication date Jan 2, 2025
- HITACHI HIGH-TECH CORPORATION
- Wei SUN
- G06 - COMPUTING CALCULATING COUNTING

with incident electron beam

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Scintillator structure and method of evaluating scintillator

Graphene oxide affinity sample grids for Cyro-EM

Sample image display system and charged particle beam apparatus

Systems and methods for automated characterization of fillers in po...

Charged particle beam device

Electron spectroscopy based techniques for determining various chem...

Automatic particle beam focusing

Quality control evaluation method of cyanate ester matrix resin mat...

Inspection system, lithographic apparatus, and inspection method

Measurement system and method for obtaining information about a sample

Study method for chlorite growth pattern based on in-situ high-prec...

Device for tissue section immobilization and retention

Method and system for stress testing of materials using laser accel...

Hybrid scanning electron microscopy and acousto-optic based metrology

System to inspect, modify or analyze a region of interest of a samp...

Thin film damage detection function and charged particle beam device

Inspection apparatus

Method of preventing lamellar silica formation in glass container

Method, apparatus, and program for determining condition related to...

Charged particle beam device and inspection device

Systems and methods for voltage contrast defect detection

Methods for growing crystals on QCM sensors

System and method for detecting microbial agents

Device for tissue section immobilization and retention

Utilize machine learning in selecting high quality averaged SEM ima...

Charged particle beam apparatus

Method and apparatus for Schottky TFE inspection

Ion beam delayering system and method, topographically enhanced del...

Manipulating and detecting biological samples

Cell analysis apparatus and cell analysis method

Patents Applicationslast 30 patents

ELEMENTAL IDENTIFICATION BASED ON PHASE ANALYSIS

WAFER INSPECTION METHOD

IMPROVED SCANNING ELECTRON MICROSCOPE AND METHOD OF USING THE SAME

E-BEAM OPTIMIZATION FOR OVERLAY MEASUREMENT OF BURIED FEATURES

DEVICE FOR TISSUE SECTION IMMOBILIZATION AND RETENTION

DEFECT REGION DETECTION DEVICE AND WAFER DEFECT DETECTION SYSTEM IN...

DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM

SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION

METHOD OF INSPECTING GROUP-III ELEMENT NITRIDE SUBSTRATE, METHOD OF...

DEEP LEARNING OF BISMUTH TELLURIDE CRYSTAL SIZE AND GRAIN BOUNDARIE...

METHOD OF PREVENTING LAMELLAR SILICA FORMATION IN GLASS CONTAINER

HIGH-CONTRAST EN-BLOC STAINING OF MOUSE WHOLE-BRAIN AND HUMAN BRAIN...

FIELD OF VIEW SELECTION FOR METROLOGY ASSOCIATED WITH SEMICONDUCTOR...

Ion Milling Device, and Inspection System

SPECTRA DELTA METROLOGY

SYSTEM AND METHOD FOR EXTRACTION OF STRUCTURAL DATA OF A SAMPLE FRO...

SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS

METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES

SUBCELLULAR SELF-TRACER ION IMAGING AND LOCALIZATION METHOD OF META...

UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...

DEVICE FOR TISSUE SECTION IMMOBILIZATION AND RETENTION

METHOD FOR TISSUE SECTION IMMOBILIZATION AND RETENTION

METHOD FOR EVALUATING THE BENDING STIFFNESS OF HIGH ASPECT RATIO NA...

INSPECTION APPARATUS AND METHOD FOR GENERATING INSPECTION IMAGE

SELF-DIFFERENTIAL CONFOCAL TILT SENSOR FOR MEASURING LEVEL VARIATIO...

Spectrum Processing Device, Specimen Analyzing Device, and Spectrum...

AUTOMATED THIN FILM DEPOSITION SYSTEM AND THIN FILM DEPOSITION METH...

System and Method for Determining Properties of a Substrate

METHOD AND SYSTEM OF IMAGE ANALYSIS AND CRITICAL DIMENSION MATCHING...

FOREIGN OBJECT HEIGHT MEASUREMENT METHOD AND CHARGED PARTICLE BEAM...