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G01N23/2251
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00
Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00
Current Industry
G01N23/2251
with incident electron beam
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Patents Grants
last 30 patents
Information
Patent Grant
Inspection method and inspection apparatus
Patent number
11,978,195
Issue date
May 7, 2024
Kioxia Corporation
Keisuke Chiba
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of examining a sample using a charged particle microscope
Patent number
11,971,372
Issue date
Apr 30, 2024
FEI Company
Jan Klusácek
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for monitoring slope stability
Patent number
11,971,373
Issue date
Apr 30, 2024
Muon Vision Inc.
Tancredi Botto
E21 - EARTH DRILLING MINING
Information
Patent Grant
Determination method, elimination method and apparatus for electron...
Patent number
11,971,368
Issue date
Apr 30, 2024
SOUTH CHINA AGRICULTURAL UNIVERSITY
Fang Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Charge-resistant epoxy resins for electron microscopy applications
Patent number
11,965,840
Issue date
Apr 23, 2024
The Regents of the University of California
Thomas Deerinck
G01 - MEASURING TESTING
Information
Patent Grant
Geometry based three dimensional reconstruction of a semiconductor...
Patent number
11,953,316
Issue date
Apr 9, 2024
Applied Materials Israel Ltd.
Rafael Bistritzer
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for real time stereo imaging using multiple ele...
Patent number
11,942,303
Issue date
Mar 26, 2024
ASML Netherlands B.V.
Yan Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method to determine relative thermal maturity from porosities measu...
Patent number
11,940,398
Issue date
Mar 26, 2024
Saudi Arabian Oil Company
Shannon Lee Eichmann
E21 - EARTH DRILLING MINING
Information
Patent Grant
Method for the detection and quantification of nano or micro plasti...
Patent number
11,933,740
Issue date
Mar 19, 2024
The European Union, Represented by the European Commission
Andrea Valsesia
G01 - MEASURING TESTING
Information
Patent Grant
Lateral recess measurement in a semiconductor specimen
Patent number
11,921,063
Issue date
Mar 5, 2024
Applied Materials Israel Ltd.
Michael Chemama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System for ultra-high temperature in-situ fretting fatigue experiment
Patent number
11,921,066
Issue date
Mar 5, 2024
Nanjing University of Aeronautics and Astronautics
Qinan Han
G01 - MEASURING TESTING
Information
Patent Grant
Scanning electron microscope device and electron beam inspection ap...
Patent number
11,908,657
Issue date
Feb 20, 2024
Zhongke Jingyuan Electron Limited
Qinglang Meng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron spectrometer
Patent number
11,898,975
Issue date
Feb 13, 2024
Tohoku University
Masahiko Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus adjustment system and inspection apparatus adj...
Patent number
11,898,968
Issue date
Feb 13, 2024
HITACHI HIGH-TECH CORPORATION
Taichi Maeda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Charged particle beam device, computer, and signal processing metho...
Patent number
11,898,974
Issue date
Feb 13, 2024
HITACHI HIGH-TECH CORPORATION
Hiroshi Oinuma
G01 - MEASURING TESTING
Information
Patent Grant
Detection and correction of system responses in real-time
Patent number
11,894,214
Issue date
Feb 6, 2024
KLA Corporation
Henning Stoschus
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Material properties from two-dimensional image
Patent number
11,885,757
Issue date
Jan 30, 2024
BP Corporation North America Inc.
Glen L. Gettemy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Build material handling unit for a powder module for an apparatus f...
Patent number
11,878,463
Issue date
Jan 23, 2024
CONCEPT LASER GMBH
Dominik Eideloth
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Systems and methods for predicting film thickness of individual lay...
Patent number
11,862,520
Issue date
Jan 2, 2024
Applied Materials, Inc.
Bharath Ram Sundar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus of plural charged-particle beams
Patent number
RE49784
Issue date
Jan 2, 2024
ASML Netherlands B.V.
Weiming Ren
Information
Patent Grant
Biological tissue image processing system, and machine learning method
Patent number
11,854,201
Issue date
Dec 26, 2023
Nikon Corporation
Kohki Konishi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image processing system
Patent number
11,852,599
Issue date
Dec 26, 2023
HITACHI HIGH-TECH CORPORATION
Nobuhiro Okai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Shape measuring method, shape measuring device, and program
Patent number
11,835,334
Issue date
Dec 5, 2023
Kioxia Corporation
Kazuki Hagihara
G01 - MEASURING TESTING
Information
Patent Grant
Charged particle optical device, objective lens assembly, detector,...
Patent number
11,821,859
Issue date
Nov 21, 2023
ASML Netherlands B.V.
Marco Jan-Jaco Wieland
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for accurately characterizing crystal three-dimensional orie...
Patent number
11,815,474
Issue date
Nov 14, 2023
Dalian University of Technology
Guoqing Chen
G01 - MEASURING TESTING
Information
Patent Grant
Optical objective lens
Patent number
11,808,930
Issue date
Nov 7, 2023
ASML Netherlands B.V.
Jian Zhang
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Composite overlay metrology target
Patent number
11,809,090
Issue date
Nov 7, 2023
KLA Corporation
Anna Golotsvan
G01 - MEASURING TESTING
Information
Patent Grant
Pattern measurement device and computer program
Patent number
11,802,763
Issue date
Oct 31, 2023
HITACHI HIGH-TECH CORPORATION
Hiroshi Fukuda
G01 - MEASURING TESTING
Information
Patent Grant
Defect detection device, defect detection method, and defect observ...
Patent number
11,802,841
Issue date
Oct 31, 2023
HITACHI HIGH-TECH CORPORATION
Yuji Takagi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Collision avoidance for particle beam instruments
Patent number
11,798,774
Issue date
Oct 24, 2023
Oxford Instruments Nanotechnology Tools Limited
Stuart Andrew Swan
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SUBSTRATE INSPECTION APPARATUS AND A METHOD OF INSPECTING A SUBSTRA...
Publication number
20240151664
Publication date
May 9, 2024
Samsung Electronics Co., Ltd.
Kwang-Eun KIM
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM
Publication number
20240151665
Publication date
May 9, 2024
Hitachi High-Tech Corporation
Yohei NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
ELECTRON MICROSCOPE, DEVICE FOR MEASURING ELECTRON-PHOTON CORRELATI...
Publication number
20240153736
Publication date
May 9, 2024
Japan Science and Technology Agency
Takumi SANNOMIYA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEFECT DETECTION DEVICE AND METHOD THEREOF
Publication number
20240127425
Publication date
Apr 18, 2024
Samsung Electronics Co., Ltd.
Sungwook HWANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Dynamic Data Driven Detector Tuning for Improved Investigation of S...
Publication number
20240110880
Publication date
Apr 4, 2024
FEI Company
Maurice PEEMEN
G01 - MEASURING TESTING
Information
Patent Application
Systems And Methods For Detecting Beam Displacement
Publication number
20240110881
Publication date
Apr 4, 2024
FEI Company
James B. McGinn
G01 - MEASURING TESTING
Information
Patent Application
ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK
Publication number
20240094151
Publication date
Mar 21, 2024
FEI Company
Pavel Potocek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
Publication number
20240094150
Publication date
Mar 21, 2024
APPLIED MATERIALS ISRAEL LTD.
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
Publication number
20240085174
Publication date
Mar 14, 2024
NOVA MEASURING INSTRUMENTS INC.
Heath POIS
G01 - MEASURING TESTING
Information
Patent Application
Thin Film Damage Detection Function and Charged Particle Beam Device
Publication number
20240085352
Publication date
Mar 14, 2024
Hitachi High-Tech Corporation
Michio HATANO
G01 - MEASURING TESTING
Information
Patent Application
MEASURING METHOD AND MEASURING DEVICE
Publication number
20240085355
Publication date
Mar 14, 2024
Japan Display Inc.
Satoru TOMITA
G01 - MEASURING TESTING
Information
Patent Application
SCINTILLATOR STRUCTURE AND METHOD OF EVALUATING SCINTILLATOR
Publication number
20240069221
Publication date
Feb 29, 2024
Hitachi Metals, Ltd.
Shunsuke GOTO
G01 - MEASURING TESTING
Information
Patent Application
NOISE DIAGNOSTICS FOR AN ELECTRON BEAM INSPECTION SYSTEM WITH SWATHING
Publication number
20240068967
Publication date
Feb 29, 2024
KLA Corporation
Bo Xiong
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LIGHT-EMITTING ELEMENT, OPTICAL DETECTION MODULE, MANUFACTURING MET...
Publication number
20240063328
Publication date
Feb 22, 2024
Hamamatsu Photonics K.K.
Kuniyoshi YAMAUCHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD TO DETERMINE RELATIVE THERMAL MATURITY FROM POROSITIES MEASU...
Publication number
20240060915
Publication date
Feb 22, 2024
ARAMCO SERVICES COMPANY
Shannon Lee Eichmann
E21 - EARTH DRILLING MINING
Information
Patent Application
OVERLAY MEASURING METHOD
Publication number
20240060916
Publication date
Feb 22, 2024
Samsung Electronics Co., Ltd.
Wonjun YANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF EVALUATING CENTRAL SEGREGATION IN STEEL
Publication number
20240044822
Publication date
Feb 8, 2024
JFE STEEL CORPORATION
Tomoharu ISHIDA
G01 - MEASURING TESTING
Information
Patent Application
CHARGED PARTICLE OPTICAL DEVICE, OBJECTIVE LENS ASSEMBLY, DETECTOR,...
Publication number
20240044824
Publication date
Feb 8, 2024
ASML NETHERLANDS B.V.
Marco Jan-Jaco WIELAND
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF INSPECTING SAMPLES WITH A BEAM OF CHARGED PARTICLES
Publication number
20240044820
Publication date
Feb 8, 2024
ASML NETHERLANDS B.V.
Kuo-Feng TSENG
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR QUANTITATIVE EVALUATION OF SEALING PROPERTY O...
Publication number
20240044823
Publication date
Feb 8, 2024
China University of Petroleum (East China)
Yuxin HAO
G01 - MEASURING TESTING
Information
Patent Application
SUBSTRATE INSPECTION METHOD
Publication number
20240019380
Publication date
Jan 18, 2024
Samsung Electronics Co., Ltd.
Kihong Chung
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Using Pyrolysis Data to Correct for the Impact of Soluble Organic M...
Publication number
20230408429
Publication date
Dec 21, 2023
Saudi Arabian Oil Company
Shannon L. Eichmann
G01 - MEASURING TESTING
Information
Patent Application
SIMULATION DEVICE FOR ELECTRON-EXCITED ATMOSPHERIC RADIATION
Publication number
20230394990
Publication date
Dec 7, 2023
Hefei Institutes of Physical Science, CAS
Congming DAI
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR EVALUATING COMPATIBILITY OF THERMOSETTING RESIN COMPOSIT...
Publication number
20230392002
Publication date
Dec 7, 2023
Shuichi ISHIBASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF EVALUATING PRIMARY OPTICAL SYSTEM OF ELECTRON BEAM OBSERV...
Publication number
20230393085
Publication date
Dec 7, 2023
EBARA CORPORATION
Kenji WATANABE
G01 - MEASURING TESTING
Information
Patent Application
BINDING SITE IN TYPE 1 RYANODINE RECEPTOR
Publication number
20230386615
Publication date
Nov 30, 2023
THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
Andrew R. MARKS
G01 - MEASURING TESTING
Information
Patent Application
Charged Particle Beam Device, Charged Particle Beam System, and Adj...
Publication number
20230386781
Publication date
Nov 30, 2023
HITACHI HIGH-TECH CORPORATION
Zhao JINYU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Pattern Measurement Device
Publication number
20230375338
Publication date
Nov 23, 2023
Hitachi High-Tech Corporation
Long ZHANG
G01 - MEASURING TESTING
Information
Patent Application
Charged Particle Beam Apparatus
Publication number
20230366841
Publication date
Nov 16, 2023
HITACHI HIGH-TECH CORPORATION
Wei Chean TAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR DETERMINING PROTEIN STRUCTURE USING CRYO-ELECTRON MICROS...
Publication number
20230349847
Publication date
Nov 2, 2023
SHENZHEN INSTITUTES OF ADVANCED TECHNOLOGY CHINESE ACADEMY OF SCIENCES
Horst VOGEL
G01 - MEASURING TESTING