with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch

Industry

CPC
G01R1/07364

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/07364with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch

Industries

Patents Grantslast 30 patents

Information Patent Grant
Probe head for a testing apparatus of electronic devices with enhan...
- Patent number 11,971,449
- Issue date Apr 30, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor fabricating apparatus including a probe station
- Patent number 11,733,269
- Issue date Aug 22, 2023
- SK Hynix Inc.
- Jun-Kyu Cho
- G01 - MEASURING TESTING
Information Patent Grant
Short interconnect assembly with strip elastomer
- Patent number 11,674,977
- Issue date Jun 13, 2023
- JF Microtechnology Sdn. Bhd.
- Wei Kuong Foong
- G01 - MEASURING TESTING
Information Patent Grant
Low-profile gimbal platform for high-resolution in situ co-planarit...
- Patent number 11,674,980
- Issue date Jun 13, 2023
- Intel Corporation
- Paul J. Diglio
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 11,567,122
- Issue date Jan 31, 2023
- Dyi-Chung Hu
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit spike check test point identification apparatus...
- Patent number 11,454,665
- Issue date Sep 27, 2022
- Texas Instruments Incorporated
- William Joshua Bush
- G01 - MEASURING TESTING
Information Patent Grant
Probe card management system and probe card management method
- Patent number 11,340,259
- Issue date May 24, 2022
- Tokyo Electron Limited
- Shinjiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
High voltage probe card system
- Patent number 11,275,106
- Issue date Mar 15, 2022
- Celadon Systems, Inc.
- Adam J. Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Devices for high-density probing techniques and method of implement...
- Patent number 11,249,112
- Issue date Feb 15, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mill-Jer Wang
- G01 - MEASURING TESTING
Information Patent Grant
Differential test probe
- Patent number 11,187,723
- Issue date Nov 30, 2021
- Rohde & Schwarz GmbH & Co. KG
- Alexander Kunze
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for a testing apparatus of electronic devices with enhan...
- Patent number 11,163,004
- Issue date Nov 2, 2021
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Probe card module
- Patent number 11,156,639
- Issue date Oct 26, 2021
- Global Unichip Corporation
- Chih-Chieh Liao
- G01 - MEASURING TESTING
Information Patent Grant
Test device
- Patent number 11,150,270
- Issue date Oct 19, 2021
- LEENO INDUSTRIAL INC.
- Geun-su Kim
- G01 - MEASURING TESTING
Information Patent Grant
Probe device, electrical inspection apparatus, and electrical inspe...
- Patent number 11,137,437
- Issue date Oct 5, 2021
- Nippon Mektron, Ltd.
- Shoji Takano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical testing apparatus with lateral movement of a probe suppo...
- Patent number 11,073,538
- Issue date Jul 27, 2021
- Intel Corporation
- Paul Diglio
- G01 - MEASURING TESTING
Information Patent Grant
Probe systems and methods
- Patent number 11,047,879
- Issue date Jun 29, 2021
- FormFactor, Inc.
- Gavin Neil Fisher
- G01 - MEASURING TESTING
Information Patent Grant
Unclamped inductor switching test at wafer probe
- Patent number 11,041,901
- Issue date Jun 22, 2021
- Texas Instruments Incorporated
- Pavan Pakala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe card device and three-dimensional signal transfer structure t...
- Patent number 11,009,526
- Issue date May 18, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
System, a tangent probe card and a probe head assembly for testing...
- Patent number 10,962,570
- Issue date Mar 30, 2021
- Wing Cheuk Leung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for testing semiconductor packages
- Patent number 10,962,581
- Issue date Mar 30, 2021
- Samsung Electronics Co., Ltd.
- Ji Nyeong Yun
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for electrical inspection of flat panel display...
- Patent number 10,962,567
- Issue date Mar 30, 2021
- Photon Dynamics, Inc.
- Gordon Yue
- G01 - MEASURING TESTING
Information Patent Grant
Probe card alignment
- Patent number 10,955,440
- Issue date Mar 23, 2021
- International Business Machines Corporation
- Martin Eckert
- G01 - MEASURING TESTING
Information Patent Grant
Probe pin alignment apparatus
- Patent number 10,845,386
- Issue date Nov 24, 2020
- CHROMA ATE INC.
- Yu-Yen Wang
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device
- Patent number 10,845,385
- Issue date Nov 24, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Universal test socket, semiconductor test device, and method of tes...
- Patent number 10,802,048
- Issue date Oct 13, 2020
- Samsung Electronics Co., Ltd.
- Daisuke Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Image sensor testing probe card
- Patent number 10,775,413
- Issue date Sep 15, 2020
- OmniVision Technologies, Inc.
- Chih-Pin Jen
- G01 - MEASURING TESTING
Information Patent Grant
Low-profile gimbal platform for high-resolution in situ co-planarit...
- Patent number 10,775,414
- Issue date Sep 15, 2020
- Intel Corporation
- Paul J. Diglio
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus having a configurable probe fixture
- Patent number 10,739,382
- Issue date Aug 11, 2020
- Keysight Technologies, Inc.
- Daniel Mak
- G01 - MEASURING TESTING
Information Patent Grant
Devices for high-density probing techniques and method of implement...
- Patent number 10,718,790
- Issue date Jul 21, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mill-Jer Wang
- G01 - MEASURING TESTING
Information Patent Grant
Multifunctional substrate inspection apparatus and multifunctional...
- Patent number 10,718,792
- Issue date Jul 21, 2020
- WIT CO., LTD.
- Masato Utsumi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NEEDLE BLOCK FOR EASY ADJUSTMENT OF TIP LENGTH OF NEEDLE UNIT
- Publication number 20240077518
- Publication date Mar 7, 2024
- WILLTECHNOLOGY CO., LTD.
- Song Yeon WI
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE CARD HAVING DIFFERENT PROBES
- Publication number 20230314477
- Publication date Oct 5, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE CARD AND FENCE-LIKE PROBE THEREOF
- Publication number 20230314478
- Publication date Oct 5, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20230194571
- Publication date Jun 22, 2023
- HERMES TESTING SOLUTIONS INC.
- TZU-CHIEN WANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SOCKET
- Publication number 20230050000
- Publication date Feb 16, 2023
- Yokowo Co., Ltd.
- Takayoshi OKUNO
- G01 - MEASURING TESTING
Information Patent Application
SHORT INTERCONNECT ASSEMBLY WITH STRIP ELASTOMER
- Publication number 20220390488
- Publication date Dec 8, 2022
- JF Microtechnology Sdn. Bhd.
- Wei Kuong FOONG
- G01 - MEASURING TESTING
Information Patent Application
Calibration System
- Publication number 20220349937
- Publication date Nov 3, 2022
- XCERRA CORPORATION
- WILLIAM REID
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES WITH ENHAN...
- Publication number 20220034966
- Publication date Feb 3, 2022
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR FABRICATING APPARATUS INCLUDING A PROBE STATION
- Publication number 20210255219
- Publication date Aug 19, 2021
- SK HYNIX INC.
- Jun-Kyu CHO
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD MODULE
- Publication number 20210223290
- Publication date Jul 22, 2021
- GLOBAL UNICHIP CORPORATION
- Chih-Chieh Liao
- G01 - MEASURING TESTING
Information Patent Application
LOW-PROFILE GIMBAL PLATFORM FOR HIGH-RESOLUTION IN SITU CO-PLANARIT...
- Publication number 20200371136
- Publication date Nov 26, 2020
- Intel Corporation
- Paul J. Diglio
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, A TANGENT PROBE CARD AND A PROBE HEAD ASSEMBLY FOR TESTING...
- Publication number 20200363453
- Publication date Nov 19, 2020
- Wing Cheuk LEUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICES FOR HIGH-DENSITY PROBING TECHNIQUES AND METHOD OF IMPLEMENT...
- Publication number 20200348341
- Publication date Nov 5, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Mill-Jer WANG
- G01 - MEASURING TESTING
Information Patent Application
ENERGY TREATMENT INSTRUMENT
- Publication number 20200326357
- Publication date Oct 15, 2020
- OLYMPUS CORPORATION
- Yuji SAKAI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
UNCLAMPED INDUCTOR SWITCHING TEST AT WAFER PROBE
- Publication number 20200292610
- Publication date Sep 17, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Pavan Pakala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TOUCHLESS PROBE CARD CLEANING APPARATUS AND METHOD
- Publication number 20200200798
- Publication date Jun 25, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Lorence Sy Pareja
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD MANAGEMENT SYSTEM AND PROBE CARD MANAGEMENT METHOD
- Publication number 20200191830
- Publication date Jun 18, 2020
- TOKYO ELECTRON LIMITED
- Shinjiro WATANABE
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICE, ELECTRICAL INSPECTION APPARATUS, AND ELECTRICAL INSPE...
- Publication number 20200166564
- Publication date May 28, 2020
- NIPPON MEKTRON, LTD.
- Shoji TAKANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST POSITION ALIGNMENT AND CALIBRATION DEVICE
- Publication number 20200158807
- Publication date May 21, 2020
- KEST SYSTEMS & SERVICE LTD.
- SHENG-TAO PENG
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE
- Publication number 20200141980
- Publication date May 7, 2020
- LEENO INDUSTRIAL INC.
- Geun-su Kim
- G01 - MEASURING TESTING
Information Patent Application
PROBE PIN ALIGNMENT APPARATUS
- Publication number 20200132724
- Publication date Apr 30, 2020
- CHROMA ATE INC.
- Yu-Yen WANG
- G01 - MEASURING TESTING
Information Patent Application
HIGH VOLTAGE PROBE CARD SYSTEM
- Publication number 20200110126
- Publication date Apr 9, 2020
- Celadon Systems, Inc.
- Adam J. SCHULTZ
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS HAVING A CONFIGURABLE PROBE FIXTURE
- Publication number 20200088765
- Publication date Mar 19, 2020
- KEYSIGHT TECHNOLOGIES, INC.
- Daniel Mak
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS, PROBE INSPECTION METHOD, AND STORAGE MEDIUM
- Publication number 20200049762
- Publication date Feb 13, 2020
- TOKYO ELECTRON LIMITED
- Tomohiro Ota
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS AND METHODS
- Publication number 20200041544
- Publication date Feb 6, 2020
- FormFactor Beaverton, Inc.
- Gavin Neil Fisher
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT SPIKE CHECK PROBING APPARATUS AND METHOD
- Publication number 20200033403
- Publication date Jan 30, 2020
- TEXAS INSTRUMENTS INCORPORATED
- William Joshua Bush
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING SEMICONDUCTOR PACKAGES
- Publication number 20200011915
- Publication date Jan 9, 2020
- Samsung Electronics Co., Ltd.
- JI NYEONG YUN
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD ALIGNMENT
- Publication number 20190391179
- Publication date Dec 26, 2019
- International Business Machines Corporation
- Martin Eckert
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND FLAT SIGNAL TRANSFER STRUCTURE THEREOF
- Publication number 20190377003
- Publication date Dec 12, 2019
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND THREE-DIMENSIONAL SIGNAL TRANSFER STRUCTURE T...
- Publication number 20190377004
- Publication date Dec 12, 2019
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING

with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Probe head for a testing apparatus of electronic devices with enhan...

Semiconductor fabricating apparatus including a probe station

Short interconnect assembly with strip elastomer

Low-profile gimbal platform for high-resolution in situ co-planarit...

Semiconductor device and manufacturing method thereof

Integrated circuit spike check test point identification apparatus...

Probe card management system and probe card management method

High voltage probe card system

Devices for high-density probing techniques and method of implement...

Differential test probe

Probe head for a testing apparatus of electronic devices with enhan...

Probe card module

Test device

Probe device, electrical inspection apparatus, and electrical inspe...

Electrical testing apparatus with lateral movement of a probe suppo...

Probe systems and methods

Unclamped inductor switching test at wafer probe

Probe card device and three-dimensional signal transfer structure t...

System, a tangent probe card and a probe head assembly for testing...

Apparatus for testing semiconductor packages

Systems and methods for electrical inspection of flat panel display...

Probe card alignment

Probe pin alignment apparatus

Probe card device

Universal test socket, semiconductor test device, and method of tes...

Image sensor testing probe card

Low-profile gimbal platform for high-resolution in situ co-planarit...

Testing apparatus having a configurable probe fixture

Devices for high-density probing techniques and method of implement...

Multifunctional substrate inspection apparatus and multifunctional...

Patents Applicationslast 30 patents

NEEDLE BLOCK FOR EASY ADJUSTMENT OF TIP LENGTH OF NEEDLE UNIT

VERTICAL PROBE CARD HAVING DIFFERENT PROBES

VERTICAL PROBE CARD AND FENCE-LIKE PROBE THEREOF

PROBE CARD

INSPECTION SOCKET

SHORT INTERCONNECT ASSEMBLY WITH STRIP ELASTOMER

Calibration System

PROBE HEAD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES WITH ENHAN...

SEMICONDUCTOR FABRICATING APPARATUS INCLUDING A PROBE STATION

PROBE CARD MODULE

LOW-PROFILE GIMBAL PLATFORM FOR HIGH-RESOLUTION IN SITU CO-PLANARIT...

SYSTEM, A TANGENT PROBE CARD AND A PROBE HEAD ASSEMBLY FOR TESTING...

DEVICES FOR HIGH-DENSITY PROBING TECHNIQUES AND METHOD OF IMPLEMENT...

ENERGY TREATMENT INSTRUMENT

UNCLAMPED INDUCTOR SWITCHING TEST AT WAFER PROBE

TOUCHLESS PROBE CARD CLEANING APPARATUS AND METHOD

PROBE CARD MANAGEMENT SYSTEM AND PROBE CARD MANAGEMENT METHOD

PROBE DEVICE, ELECTRICAL INSPECTION APPARATUS, AND ELECTRICAL INSPE...

TEST POSITION ALIGNMENT AND CALIBRATION DEVICE

TEST DEVICE

PROBE PIN ALIGNMENT APPARATUS

HIGH VOLTAGE PROBE CARD SYSTEM

TESTING APPARATUS HAVING A CONFIGURABLE PROBE FIXTURE

PROBE APPARATUS, PROBE INSPECTION METHOD, AND STORAGE MEDIUM

PROBE SYSTEMS AND METHODS

INTEGRATED CIRCUIT SPIKE CHECK PROBING APPARATUS AND METHOD

APPARATUS FOR TESTING SEMICONDUCTOR PACKAGES

PROBE CARD ALIGNMENT

PROBE CARD DEVICE AND FLAT SIGNAL TRANSFER STRUCTURE THEREOF

PROBE CARD DEVICE AND THREE-DIMENSIONAL SIGNAL TRANSFER STRUCTURE T...