with rotating optics and moving stage

Industry

CPC
G01N2201/1047

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

Current Industry

G01N2201/1047with rotating optics and moving stage

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Multi-modal imaging systems and methods
- Patent number 12,184,037
- Issue date Dec 31, 2024
- LI-COR BIOTECH, LLC
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for monitoring particle flow in a stack
- Patent number 11,609,179
- Issue date Mar 21, 2023
- ENVEA UK Ltd
- David Christopher Unitt
- G08 - SIGNALLING
Information Patent Grant
Inspection system for inspection of a lateral surface of a three-di...
- Patent number 11,506,616
- Issue date Nov 22, 2022
- MÜHLBAUER GMBH & CO. KG
- Oliver Habermann
- G01 - MEASURING TESTING
Information Patent Grant
Multi-view imaging system
- Patent number 11,371,948
- Issue date Jun 28, 2022
- Rapiscan Systems, Inc.
- Edward James Morton
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Combined scatter and transmission multi-view imaging system
- Patent number 10,746,674
- Issue date Aug 18, 2020
- Rapiscan Systems, Inc.
- Edward James Morton
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Sensing apparatus having optical assembly that collimates emitted l...
- Patent number 7,528,374
- Issue date May 5, 2009
- Vidar Systems Corporation
- Asbjorn Smitt
- G01 - MEASURING TESTING
Information Patent Grant
Circular scanning patterns
- Patent number 6,603,589
- Issue date Aug 5, 2003
- Tokyo Seimitsu (Israel) Ltd.
- Jacob Karin
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection device and lithographic apparatus provided with...
- Patent number 5,917,590
- Issue date Jun 29, 1999
- U.S. Philips Corporation
- Peter F. Greve
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR INSPECTING LATERAL SURFACE OF CYLINDRICAL BATTERY
- Publication number 20240361252
- Publication date Oct 31, 2024
- LG ENERGY SOLUTION, LTD.
- Tae Young KIM
- G01 - MEASURING TESTING
Information Patent Application
LIGHT IRRADIATION APPARATUS
- Publication number 20210140874
- Publication date May 13, 2021
- Cellsystem Co., Ltd.
- Osamu WATARI
- G01 - MEASURING TESTING
Information Patent Application
Sensing apparatus having an optical assembly that collimates emitte...
- Publication number 20090194699
- Publication date Aug 6, 2009
- VIDAR Systems Corporation
- Asbjom Smitt
- G01 - MEASURING TESTING
Information Patent Application
Sensing apparatus having optical assembly that collimates emitted l...
- Publication number 20070205365
- Publication date Sep 6, 2007
- Asbjorn Smitt
- G01 - MEASURING TESTING
Information Patent Application
Multiple scanning system and method
- Publication number 20040075879
- Publication date Apr 22, 2004
- ACCRETECH (ISRAEL) LTD
- Jacob Karin
- G02 - OPTICS
Information Patent Application
Circular scanning patterns
- Publication number 20030099022
- Publication date May 29, 2003
- Tokyo Seimitsu (Israel) Ltd.
- Jacob Karin
- G01 - MEASURING TESTING

with rotating optics and moving stage

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Multi-modal imaging systems and methods

Apparatus and method for monitoring particle flow in a stack

Inspection system for inspection of a lateral surface of a three-di...

Multi-view imaging system

Combined scatter and transmission multi-view imaging system

Sensing apparatus having optical assembly that collimates emitted l...

Circular scanning patterns

Optical inspection device and lithographic apparatus provided with...

Patents Applicationslast 30 patents

DEVICE FOR INSPECTING LATERAL SURFACE OF CYLINDRICAL BATTERY

LIGHT IRRADIATION APPARATUS

Sensing apparatus having an optical assembly that collimates emitte...

Sensing apparatus having optical assembly that collimates emitted l...

Multiple scanning system and method

Circular scanning patterns