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with rotating optics and moving stage
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G01N2201/1047
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2201/00
Features of devices classified in G01N21/00
Current Industry
G01N2201/1047
with rotating optics and moving stage
Industries
Overview
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus and method for monitoring particle flow in a stack
Patent number
11,609,179
Issue date
Mar 21, 2023
ENVEA UK Ltd
David Christopher Unitt
G08 - SIGNALLING
Information
Patent Grant
Inspection system for inspection of a lateral surface of a three-di...
Patent number
11,506,616
Issue date
Nov 22, 2022
MÜHLBAUER GMBH & CO. KG
Oliver Habermann
G01 - MEASURING TESTING
Information
Patent Grant
Multi-view imaging system
Patent number
11,371,948
Issue date
Jun 28, 2022
Rapiscan Systems, Inc.
Edward James Morton
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Combined scatter and transmission multi-view imaging system
Patent number
10,746,674
Issue date
Aug 18, 2020
Rapiscan Systems, Inc.
Edward James Morton
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Sensing apparatus having optical assembly that collimates emitted l...
Patent number
7,528,374
Issue date
May 5, 2009
Vidar Systems Corporation
Asbjorn Smitt
G01 - MEASURING TESTING
Information
Patent Grant
Circular scanning patterns
Patent number
6,603,589
Issue date
Aug 5, 2003
Tokyo Seimitsu (Israel) Ltd.
Jacob Karin
G01 - MEASURING TESTING
Information
Patent Grant
Optical inspection device and lithographic apparatus provided with...
Patent number
5,917,590
Issue date
Jun 29, 1999
U.S. Philips Corporation
Peter F. Greve
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
LIGHT IRRADIATION APPARATUS
Publication number
20210140874
Publication date
May 13, 2021
Cellsystem Co., Ltd.
Osamu WATARI
G01 - MEASURING TESTING
Information
Patent Application
Sensing apparatus having an optical assembly that collimates emitte...
Publication number
20090194699
Publication date
Aug 6, 2009
VIDAR Systems Corporation
Asbjom Smitt
G01 - MEASURING TESTING
Information
Patent Application
Sensing apparatus having optical assembly that collimates emitted l...
Publication number
20070205365
Publication date
Sep 6, 2007
Asbjorn Smitt
G01 - MEASURING TESTING
Information
Patent Application
Multiple scanning system and method
Publication number
20040075879
Publication date
Apr 22, 2004
ACCRETECH (ISRAEL) LTD
Jacob Karin
G02 - OPTICS
Information
Patent Application
Circular scanning patterns
Publication number
20030099022
Publication date
May 29, 2003
Tokyo Seimitsu (Israel) Ltd.
Jacob Karin
G01 - MEASURING TESTING