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GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
Y10
USPC classification
Y10S
TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
Y10S977/00
Nanotechnology
Current Industry
Y10S977/849
with scanning probe
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Patents Grants
last 30 patents
Information
Patent Grant
Fluid delivery for scanning probe microscopy
Patent number
9,075,082
Issue date
Jul 7, 2015
Victor B. Kley
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe-based lithography method
Patent number
8,387,160
Issue date
Feb 26, 2013
International Business Machines Corporation
Michel Despont
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Etching and hole arrays
Patent number
8,192,795
Issue date
Jun 5, 2012
Northwestern University
Chad A. Mirkin
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Methods utilizing scanning probe microscope tips and products there...
Patent number
8,187,673
Issue date
May 29, 2012
Northwestern University
Chad A. Mirkin
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method for fabricating a long-range ordered periodic array of nano-...
Patent number
8,178,165
Issue date
May 15, 2012
The Regents of the University of California
Sungho Jin
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Methods and apparatus for statistical characterization of nano-part...
Patent number
8,119,985
Issue date
Feb 21, 2012
FEI Company
Diane K. Stewart
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe apparatus
Patent number
8,035,089
Issue date
Oct 11, 2011
Canon Kabushiki Kaisha
Takao Kusaka
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method for direct fabrication of nanostructures
Patent number
7,998,528
Issue date
Aug 16, 2011
Massachusetts Institute of Technology
Brian Hubert
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Nanometric emitter/receiver guides
Patent number
7,945,966
Issue date
May 17, 2011
Tiberiu Minea
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method for forming composites of sub-arrays of fullerene nanotubes
Patent number
7,939,136
Issue date
May 10, 2011
William Marsh Rice University
Richard E. Smalley
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Fluid delivery for scanning probe microscopy
Patent number
7,930,766
Issue date
Apr 19, 2011
General Nanotechnology L.L.C.
Victor B. Kley
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Aligned nanostructures on a tip
Patent number
7,917,966
Issue date
Mar 29, 2011
SNU R&DB Foundation
Yong Hyup Kim
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe-based lithography method
Patent number
7,862,858
Issue date
Jan 4, 2011
International Business Machines Corporation
Michel Despont
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Self-sensing tweezer devices and associated methods for micro and n...
Patent number
7,735,358
Issue date
Jun 15, 2010
Insitutec, Inc.
Marcin B. Bauza
G01 - MEASURING TESTING
Information
Patent Grant
SPM cantilever and manufacturing method thereof
Patent number
7,735,357
Issue date
Jun 15, 2010
Olympus Corporation
Masashi Kitazawa
G01 - MEASURING TESTING
Information
Patent Grant
Continuous fiber of fullerene nanotubes
Patent number
7,655,302
Issue date
Feb 2, 2010
William Marsh Rice University
Richard E. Smalley
D21 - PAPER-MAKING PRODUCTION OF CELLULOSE
Information
Patent Grant
Array of fullerene nanotubes
Patent number
7,632,569
Issue date
Dec 15, 2009
William Marsh Rice University
Richard E. Smalley
D21 - PAPER-MAKING PRODUCTION OF CELLULOSE
Information
Patent Grant
Near-field scanning optical microscope probe having a light emittin...
Patent number
7,621,964
Issue date
Nov 24, 2009
The Board of Regents, University of Texas System
Kazunori Hoshino
G01 - MEASURING TESTING
Information
Patent Grant
Rotatable multi-cantilever scanning probe microscopy head
Patent number
7,597,717
Issue date
Oct 6, 2009
The United States of America as represented by the Secretary of the Navy
Ryan P. Lu
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope system
Patent number
7,578,853
Issue date
Aug 25, 2009
Honda Motor Co., Ltd.
Tatsuya Hattori
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe apparatus
Patent number
7,569,817
Issue date
Aug 4, 2009
Canon Kabushiki Kaisha
Takao Kusaka
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for statistical characterization of nano-part...
Patent number
7,544,938
Issue date
Jun 9, 2009
FEI, Company
Diane K. Stewart
G01 - MEASURING TESTING
Information
Patent Grant
Thermal control of deposition in dip pen nanolithography
Patent number
7,541,062
Issue date
Jun 2, 2009
The United States of America as represented by the Secretary of the Navy
Paul E. Sheehan
G01 - MEASURING TESTING
Information
Patent Grant
Methods utilizing scanning probe microscope tips and products there...
Patent number
7,524,534
Issue date
Apr 28, 2009
Northwestern University
Chad A. Mirkin
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Grant
Method for forming a patterned array of fullerene nanotubes
Patent number
7,510,695
Issue date
Mar 31, 2009
William Marsh Rice University
Richard E. Smalley
D21 - PAPER-MAKING PRODUCTION OF CELLULOSE
Information
Patent Grant
Fluid delivery for scanning probe microscopy
Patent number
7,503,206
Issue date
Mar 17, 2009
General Nanotechnology L.L.C.
Victor B. Kley
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe-based lithography method
Patent number
7,491,425
Issue date
Feb 17, 2009
International Business Machines Corporation
Michel Despont
G01 - MEASURING TESTING
Information
Patent Grant
Method for cutting fullerene nanotubes
Patent number
7,481,989
Issue date
Jan 27, 2009
William Marsh Rice University
Richard E. Smalley
D21 - PAPER-MAKING PRODUCTION OF CELLULOSE
Information
Patent Grant
Optical detection alignment/tracking method and apparatus
Patent number
7,478,552
Issue date
Jan 20, 2009
Veeco Instruments Inc.
Doug Gotthard
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope and scanning method
Patent number
7,456,400
Issue date
Nov 25, 2008
Seiko Instruments Inc.
Masatsugu Shigeno
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Fluid Delivery for Scanning Probe Microscopy
Publication number
20140082776
Publication date
Mar 20, 2014
Victor B. Kley
B82 - NANO-TECHNOLOGY
Information
Patent Application
ETCHING AND HOLE ARRAYS
Publication number
20120225251
Publication date
Sep 6, 2012
Northwestern University
Chad A. Mirkin
B82 - NANO-TECHNOLOGY
Information
Patent Application
FLUID DELIVERY FOR SCANNING PROBE MICROSCOPY
Publication number
20120066800
Publication date
Mar 15, 2012
General Nanotechnology LLC
Victor B. Kley
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for Direct Fabrication of Nanostructures
Publication number
20110297084
Publication date
Dec 8, 2011
Massachusetts Institute of Technology
Brian Hubert
B82 - NANO-TECHNOLOGY
Information
Patent Application
METHOD FOR FORMING COMPOSITES OF SUB-ARRAYS OF FULLERENE NANOTUBES
Publication number
20110086781
Publication date
Apr 14, 2011
William Marsh Rice University
Richard E. Smalley
D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information
Patent Application
SCANNING PROBE-BASED LITHOGRAPHY METHOD
Publication number
20110020533
Publication date
Jan 27, 2011
International Business Machines Corporation
Michel Despont
G01 - MEASURING TESTING
Information
Patent Application
METHODS UTILIZING SCANNING PROBE MICROSCOPE TIPS AND PRODUCTS THERE...
Publication number
20100330345
Publication date
Dec 30, 2010
Northwestern University
Chad A MIRKIN
G01 - MEASURING TESTING
Information
Patent Application
Fluid Delivery for Scanning Probe Microscopy
Publication number
20100132076
Publication date
May 27, 2010
General Nanotechnology LLC
Victor B. Kley
G01 - MEASURING TESTING
Information
Patent Application
ALIGNED NANOSTRUCTURES ON A TIP
Publication number
20100047621
Publication date
Feb 25, 2010
SNU R&DB Foundation
Yong Hyup Kim
G01 - MEASURING TESTING
Information
Patent Application
Methods and Apparatus for Statistical Characterization of Nano-Part...
Publication number
20090326866
Publication date
Dec 31, 2009
FEI Company
Diane K. Stewart
G01 - MEASURING TESTING
Information
Patent Application
THERMAL CONTROL OF DEPOSITION IN DIP PEN NANOLITHOGRAPHY
Publication number
20090255465
Publication date
Oct 15, 2009
Paul E. Sheehan
G01 - MEASURING TESTING
Information
Patent Application
SCANNING PROBE APPARATUS
Publication number
20090230320
Publication date
Sep 17, 2009
Canon Kabushiki Kaisha
Takao KUSAKA
G01 - MEASURING TESTING
Information
Patent Application
ARRAY OF FULLERENE NANOTUBES
Publication number
20090169463
Publication date
Jul 2, 2009
William Marsh Rice University
Richard E. Smalley
D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information
Patent Application
NANOMETRIC EMITTER/RECEIVER GUIDES
Publication number
20090172846
Publication date
Jul 2, 2009
Centre National De La Recherche Scientifique-cnrs
Tiberiu Minea
G01 - MEASURING TESTING
Information
Patent Application
Multicomponent Nanorods
Publication number
20090155587
Publication date
Jun 18, 2009
Northwestern University
Chad A. Mirkin
G01 - MEASURING TESTING
Information
Patent Application
SCANNING PROBE-BASED LITHOGRAPHY METHOD
Publication number
20090100553
Publication date
Apr 16, 2009
International Business Machines Corporation
Michel Despont
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CUTTING FULLERENE NANOTUBES
Publication number
20090004094
Publication date
Jan 1, 2009
William Marsh Rice University
Richard E. Smalley
D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information
Patent Application
METHOD FOR FORMING A PATTERNED ARRAY OF FULLERENE NANOTUBES
Publication number
20080311025
Publication date
Dec 18, 2008
William Marsh Rice University
Richard E. Smalley
D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information
Patent Application
Method for Fabricating a Long-Range Ordered Periodic Array of Nano-...
Publication number
20080260941
Publication date
Oct 23, 2008
Sungho Jin
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
METHODS FOR PRODUCING COMPOSITES OF FULLERENE NANOTUBES AND COMPOSI...
Publication number
20080224100
Publication date
Sep 18, 2008
William Marsh Rice University
Richard E. Smalley
D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information
Patent Application
ETCHING AND HOLE ARRAYS
Publication number
20080182079
Publication date
Jul 31, 2008
Northwestern University
Chad Mirkin
B82 - NANO-TECHNOLOGY
Information
Patent Application
METHOD FOR PRODUCING A CATALYST SUPPORT AND COMPOSITIONS THEREOF
Publication number
20080107586
Publication date
May 8, 2008
William Marsh Rice University
Richard E. Smalley
D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information
Patent Application
FULLERENE NANOTUBE COMPOSITIONS
Publication number
20080089830
Publication date
Apr 17, 2008
William Marsh Rice University
Richard E. Smalley
D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information
Patent Application
WIRELESS TECHNIQUE FOR MICROACTIVATION
Publication number
20080072593
Publication date
Mar 27, 2008
Ken Clements
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
METHOD FOR PURIFICATION OF AS-PRODUCED FULLERENE NANOTUBES
Publication number
20080063588
Publication date
Mar 13, 2008
William Marsh Rice University
Richard E. Smalley
D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information
Patent Application
Near-Field Scanning Optical Microscope Probe Having a Light Emittin...
Publication number
20080054168
Publication date
Mar 6, 2008
Kazunori Hoshino
G01 - MEASURING TESTING
Information
Patent Application
Scanning Probe Microscope System
Publication number
20080017809
Publication date
Jan 24, 2008
Honda Motor Co., Ltd.
Tatsuya Hattori
G01 - MEASURING TESTING
Information
Patent Application
Spm Cantilever and Manufacturing Method Thereof
Publication number
20080000293
Publication date
Jan 3, 2008
OLYMPUS CORPORATION
Masashi Kitazawa
G01 - MEASURING TESTING
Information
Patent Application
Self-sensing tweezer devices and associated methods for micro and n...
Publication number
20070240516
Publication date
Oct 18, 2007
INSITUTEC, INC.
Marcin B. Bauza
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
Optical detection alignment/tracking method and apparatus
Publication number
20070220958
Publication date
Sep 27, 2007
Veeco Instruments Inc.
Doug Gotthard
G01 - MEASURING TESTING