X-rays

Industry

CPC
H01J2237/2807

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2807X-rays

Industries

Patents Grantslast 30 patents

Information Patent Grant
Scanning charged-particle-beam microscopy with energy-dispersive x-...
- Patent number 12,094,684
- Issue date Sep 17, 2024
- Mochii, Inc.
- Christopher Su-Yan Own
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D metrology from 3D datacube created from stack of registered imag...
- Patent number 11,728,126
- Issue date Aug 15, 2023
- Applied Materials Israel Ltd.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for determining sample composition from spectral...
- Patent number 11,703,468
- Issue date Jul 18, 2023
- FEI Company
- Oleksii Kaplenko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus and setting assisting method
- Patent number 11,557,458
- Issue date Jan 17, 2023
- Jeol Ltd.
- Kazutaka Watakabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for nanoscale X-ray imaging
- Patent number 11,437,218
- Issue date Sep 6, 2022
- Massachusetts Institute of Technology
- Richard C. Lanza
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Acquisition and processing of data in a tomographic imaging apparatus
- Patent number 11,428,828
- Issue date Aug 30, 2022
- FEI Company
- Andrew Kingston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High-resolution x-ray spectroscopy surface material analysis
- Patent number 11,404,244
- Issue date Aug 2, 2022
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for component analysis of spectral data
- Patent number 11,373,839
- Issue date Jun 28, 2022
- FEI Company
- Petr Hlavenka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and data analysis system for semi-automated particle analysi...
- Patent number 10,955,368
- Issue date Mar 23, 2021
- Carl Zeiss Microscopy Ltd.
- Champ Gohil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope and measurement method for obtaining i...
- Patent number 10,879,035
- Issue date Dec 29, 2020
- Jeol Ltd.
- Noriaki Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Cross sectional depth composition generation utilizing scanning ele...
- Patent number 10,830,715
- Issue date Nov 10, 2020
- International Business Machines Corporation
- Eric J. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Cross sectional depth composition generation utilizing scanning ele...
- Patent number 10,763,075
- Issue date Sep 1, 2020
- International Business Machines Corporation
- Eric J. Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and control method
- Patent number 10,741,359
- Issue date Aug 11, 2020
- Jeol Ltd.
- Akira Abe
- G01 - MEASURING TESTING
Information Patent Grant
Retractable detector
- Patent number 10,714,305
- Issue date Jul 14, 2020
- Applied Materials Israel Ltd.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Statistical analysis in X-ray imaging
- Patent number 10,685,759
- Issue date Jun 16, 2020
- FEI Company
- Wilfred Kelsham Fullagar
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for in situ high temperature X-ray spectroscopy...
- Patent number 10,656,106
- Issue date May 19, 2020
- EDAX, Incorporated
- Patrick Paul Camus
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive sample imaging
- Patent number 10,468,230
- Issue date Nov 5, 2019
- BAE Systems Information and Electronic Systems Integration Inc.
- Eugene M. Lavely
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wide field atmospheric scanning electron microscope
- Patent number 10,262,832
- Issue date Apr 16, 2019
- Gerasimos Daniel Danilatos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Acquisition and processing of data in a tomographic imaging apparatus
- Patent number 10,254,419
- Issue date Apr 9, 2019
- FEI Company
- Andrew Kingston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Retractable detector
- Patent number 10,211,026
- Issue date Feb 19, 2019
- Applied Materials Israel Ltd.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of constructing 3D image, image processor, and electron micr...
- Patent number 10,132,761
- Issue date Nov 20, 2018
- Jeol Ltd.
- Yoshitaka Aoyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross-section processing and observation method and cross-section p...
- Patent number 9,966,226
- Issue date May 8, 2018
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam apparatus, method for observing cross-section of s...
- Patent number 9,934,938
- Issue date Apr 3, 2018
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi mode system with a dispersion X-ray detector
- Patent number 9,818,577
- Issue date Nov 14, 2017
- Applied Materials Israel Ltd.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated mineral classification
- Patent number 9,778,215
- Issue date Oct 3, 2017
- FEI Company
- Michael James Owen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of performing tomographic imaging of a sample in a charged-p...
- Patent number 9,618,460
- Issue date Apr 11, 2017
- FEI Company
- Remco Schoenmakers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Notched magnetic lens for improved sample access in an SEM
- Patent number 9,443,693
- Issue date Sep 13, 2016
- KLA-Tencor Corporation
- Christopher M. Sears
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning ion microscope and secondary particle control method
- Patent number 9,058,959
- Issue date Jun 16, 2015
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope with integrated detector(s)
- Patent number 8,987,665
- Issue date Mar 24, 2015
- FEI Company
- Frederick H. Schamber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interface, a method for observing an object within a non-vacuum env...
- Patent number 8,779,358
- Issue date Jul 15, 2014
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
3D METROLOGY FROM 3D DATACUBE CREATED FROM STACK OF REGISTERED IMAG...
- Publication number 20230335370
- Publication date Oct 19, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING A SAMPLE BY MEANS OF MULTIPLE C...
- Publication number 20230020967
- Publication date Jan 19, 2023
- DELMIC IP B.V.
- Andries Pieter Johan EFFTING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-RESOLUTION X-RAY SPECTROSCOPY SURFACE MATERIAL ANALYSIS
- Publication number 20220254598
- Publication date Aug 11, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Apparatus and Setting Assisting Method
- Publication number 20220028653
- Publication date Jan 27, 2022
- JEOL Ltd.
- Kazutaka Watakabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR NANOSCALE X-RAY IMAGING
- Publication number 20210151288
- Publication date May 20, 2021
- Massachusetts Institute of Technology
- Richard C. Lanza
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20210042943
- Publication date Feb 11, 2021
- Shimadzu Corporation
- Ryuta MATSUMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NONDESTRUCTIVE SAMPLE IMAGING
- Publication number 20190311881
- Publication date Oct 10, 2019
- BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC
- Eugene M. Lavely
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR IN SITU HIGH TEMPERATURE X-RAY SPECTROSCOPY...
- Publication number 20190242836
- Publication date Aug 8, 2019
- EDAX, Incorporated
- Patrick Paul Camus
- G01 - MEASURING TESTING
Information Patent Application
Scanning Electron Microscope and Measurement Method
- Publication number 20190228948
- Publication date Jul 25, 2019
- JEOL Ltd.
- Noriaki Mizuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NOVEL ACQUISITION AND PROCESSING OF DATA IN A TOMOGRAPHIC IMAGING A...
- Publication number 20190187306
- Publication date Jun 20, 2019
- FEI Company
- Andrew Kingston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RETRACTABLE DETECTOR
- Publication number 20190189391
- Publication date Jun 20, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIDE FIELD ATOMOSPHERIC SCANNING ELECTRON MICROSCOPE
- Publication number 20180226221
- Publication date Aug 9, 2018
- Gerasimos Daniel DANILATOS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI MODE SYSTEM WITH A DISPERSION X-RAY DETECTOR
- Publication number 20180012728
- Publication date Jan 11, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...
- Publication number 20160155606
- Publication date Jun 2, 2016
- B-NANO LTD.
- Dov SHACHAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...
- Publication number 20150262788
- Publication date Sep 17, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ION MICROSCOPE AND SECONDARY PARTICLE CONTROL METHOD
- Publication number 20150048247
- Publication date Feb 19, 2015
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...
- Publication number 20140361166
- Publication date Dec 11, 2014
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSED ION BEAM APPARATUS, METHOD FOR OBSERVING CROSS-SECTION OF S...
- Publication number 20140291508
- Publication date Oct 2, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- G01 - MEASURING TESTING
Information Patent Application
CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...
- Publication number 20140131575
- Publication date May 15, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- G01 - MEASURING TESTING
Information Patent Application
Automated Mineral Classification
- Publication number 20140117231
- Publication date May 1, 2014
- Michael James Owen
- G01 - MEASURING TESTING
Information Patent Application
Method of Performing Tomographic Imaging of a Sample in a Charged-P...
- Publication number 20140070095
- Publication date Mar 13, 2014
- FEI Company
- Remco Schoenmakers
- G01 - MEASURING TESTING
Information Patent Application
CLUSTER ANALYSIS OF UNKNOWNS IN SEM-EDS DATASET
- Publication number 20140001356
- Publication date Jan 2, 2014
- FEI Company
- Michael Buhot
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE LIGHT SOURCE MICROSCOPE
- Publication number 20130335817
- Publication date Dec 19, 2013
- Shinichiro Isobe
- G02 - OPTICS
Information Patent Application
Electron Microscope with Integrated Detector(s)
- Publication number 20130299698
- Publication date Nov 14, 2013
- Frederick H. Schamber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GRAPHENE-BASED MEMBRANES AS ELECTRON TRANSPARENT WINDOWS FOR AMBIEN...
- Publication number 20130146221
- Publication date Jun 13, 2013
- SOUTHERN ILLINOIS UNIVERSITY CARBONDALE
- Andrei Kolmakov
- B82 - NANO-TECHNOLOGY
Information Patent Application
COMBINE APPARATUS OF SCANNING ELECTRON MICROSCOPE AND ENERGY DISPER...
- Publication number 20130070900
- Publication date Mar 21, 2013
- COXEM CO., LTD.
- Jun-Hee Lee
- G01 - MEASURING TESTING
Information Patent Application
CHARGED-PARTICLE MICROSCOPY WITH OCCLUSION DETECTION
- Publication number 20120292503
- Publication date Nov 22, 2012
- FEI Company
- Daniel Woodrow Phifer, JR.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-Ray Detection System
- Publication number 20120292508
- Publication date Nov 22, 2012
- JEOL Ltd.
- Masami Terauchi
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...
- Publication number 20120241608
- Publication date Sep 27, 2012
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH COLLECTION EFFICIENCY X-RAY SPECTROMETER SYSTEM WITH INTEGRATE...
- Publication number 20120160999
- Publication date Jun 28, 2012
- UChicago Argonne, LLC
- Nestor J. Zaluzec
- H01 - BASIC ELECTRIC ELEMENTS

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Scanning charged-particle-beam microscopy with energy-dispersive x-...

3D metrology from 3D datacube created from stack of registered imag...

Method and system for determining sample composition from spectral...

Charged particle beam apparatus and setting assisting method

Apparatus and method for nanoscale X-ray imaging

Acquisition and processing of data in a tomographic imaging apparatus

High-resolution x-ray spectroscopy surface material analysis

Method and system for component analysis of spectral data

Method and data analysis system for semi-automated particle analysi...

Scanning electron microscope and measurement method for obtaining i...

Cross sectional depth composition generation utilizing scanning ele...

Cross sectional depth composition generation utilizing scanning ele...

Electron microscope and control method

Retractable detector

Statistical analysis in X-ray imaging

Systems and methods for in situ high temperature X-ray spectroscopy...

Nondestructive sample imaging

Wide field atmospheric scanning electron microscope

Acquisition and processing of data in a tomographic imaging apparatus

Retractable detector

Method of constructing 3D image, image processor, and electron micr...

Cross-section processing and observation method and cross-section p...

Focused ion beam apparatus, method for observing cross-section of s...

Multi mode system with a dispersion X-ray detector

Automated mineral classification

Method of performing tomographic imaging of a sample in a charged-p...

Notched magnetic lens for improved sample access in an SEM

Scanning ion microscope and secondary particle control method

Electron microscope with integrated detector(s)

Interface, a method for observing an object within a non-vacuum env...

Patents Applicationslast 30 patents

3D METROLOGY FROM 3D DATACUBE CREATED FROM STACK OF REGISTERED IMAG...

METHOD AND APPARATUS FOR INSPECTING A SAMPLE BY MEANS OF MULTIPLE C...

HIGH-RESOLUTION X-RAY SPECTROSCOPY SURFACE MATERIAL ANALYSIS

Charged Particle Beam Apparatus and Setting Assisting Method

APPARATUS AND METHOD FOR NANOSCALE X-RAY IMAGING

SCANNING ELECTRON MICROSCOPE

NONDESTRUCTIVE SAMPLE IMAGING

SYSTEMS AND METHODS FOR IN SITU HIGH TEMPERATURE X-RAY SPECTROSCOPY...

Scanning Electron Microscope and Measurement Method

NOVEL ACQUISITION AND PROCESSING OF DATA IN A TOMOGRAPHIC IMAGING A...

RETRACTABLE DETECTOR

WIDE FIELD ATOMOSPHERIC SCANNING ELECTRON MICROSCOPE

MULTI MODE SYSTEM WITH A DISPERSION X-RAY DETECTOR

INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...

CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...

SCANNING ION MICROSCOPE AND SECONDARY PARTICLE CONTROL METHOD

INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...

FOCUSED ION BEAM APPARATUS, METHOD FOR OBSERVING CROSS-SECTION OF S...

CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...

Automated Mineral Classification

Method of Performing Tomographic Imaging of a Sample in a Charged-P...

CLUSTER ANALYSIS OF UNKNOWNS IN SEM-EDS DATASET

MULTIPLE LIGHT SOURCE MICROSCOPE

Electron Microscope with Integrated Detector(s)

GRAPHENE-BASED MEMBRANES AS ELECTRON TRANSPARENT WINDOWS FOR AMBIEN...

COMBINE APPARATUS OF SCANNING ELECTRON MICROSCOPE AND ENERGY DISPER...

CHARGED-PARTICLE MICROSCOPY WITH OCCLUSION DETECTION

X-Ray Detection System

INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...

HIGH COLLECTION EFFICIENCY X-RAY SPECTROMETER SYSTEM WITH INTEGRATE...