The invention relates generally to materials and systems capable of use for imaging systems, and in particular to graphene-based windows for environmental cell photoelectron spectroscopy.
The requirement for high-vacuum conditions in conventional electron spectroscopy studies, such as X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and electron energy loss spectroscopy (EELS), imposes an obstacle for analyzing interfacial physiochemical processes under ambient conditions. Consequently, there has been a persistent trend, mainly in the field of heterogenous catalysis and environmental remediation, to overcome the so-called “pressure gap” and observe processes taking place at surfaces and interfaces under operating conditions, namely elevated or ambient gas pressure or liquid environments. Some progress has been made in this regard in high-resolution transmission electron microscopy (HRTEM) coupled with the analytical power of EELS and X-ray fluorescence spectroscopy using open environmental cells (E-cells). Since the 1930s, elevated pressure has been used in environmental studies using transmission electron microscopy (TEM) and scanning electron microscopy (SEM) by implementing non-permeable windows that have been made from materials such as aluminum, collodion, or amorphous carbon. Later, microfabricated SiO2, Si3N4, or 10-100 nanometer (nm)-thick polymer membranes were used, which are highly transparent to the commonly used 10-300 keV electrons and 1×103 to 1×104 eV X-rays. This closed-cell design, in combination with a variety of commercially available microfabricated membranes, has boosted activity in environmental electron microscopy and X-ray sectromicroscopy research.
However, it still remains a challenge to adapt powerful, surface tools such as XPS or AES (i.e., tools in which the action is based on the detection of emitted electrons with relatively low kinetic energy in the general range of 1×102 to 1×103 eV) to explore objects at ambient conditions. This difficulty is mainly due to the short electron inelastic mean free path (IMFP), λIMFP, in dense media, which is of the order of a nanometer in condensed matter and a micrometer (μm) in gasses at atmospheric pressure (i.e., a one-thousand fold difference). To date, the main impediments have been largely resolved through the development of an electron energy analyzer with differentially pumped lens systems, which can decouple the spectrometer from the high-pressure ambient conditions of the sample placed immediately adjacent to the analyzer entrance aperture, as shown in
Some embodiments of the invention include a method for preparing a carbon-containing membrane, such as a graphene and/or a graphene-oxide membrane. In some embodiments, the method can include preparing a carbon-containing solution and then washing and filtering the carbon-containing solution. The method may further provide adding a volume of the washed and filtered carbon-containing solution to a receptacle, which may include an aqueous solution. In some embodiments, after a predetermined amount of time, the carbon-containing solution will substantially or completely equilibrate and can form sheets of carbon-containing material, such as graphene sheets or graphene-oxide sheets, which float on a surface of the aqueous solution. The method may further include defining at least one aperture through at least a portion of a substrate and then inserting the substrate in the receptacle so that at least a portion of the carbon-containing sheets adhere to the substrate. In some embodiments, when adhering to the substrate, the carbon-containing sheets can cover at least a portion of the aperture. Moreover, in some embodiments, the carbon-containing membrane can be thermally treated to improve molecular impermeability properties.
Additional objectives, advantages and novel features will be set forth in the description which follows or will become apparent to those skilled in the art upon examination of the drawings and detailed description which follows.
Corresponding reference characters indicate corresponding elements among the view of the drawings. The headings used in the figures should not be interpreted to limit the scope of the claims.
Referring to the drawings, embodiments of an imaging system are illustrated and generally indicated as 100 in
In some embodiments, the imaging system 100 can be configured using some or many components of known, conventional imaging systems. For example, the imaging system 100 can be generally configured as one or more of the following systems: X-ray photoelectron spectroscopy (XPS), an Auger electron spectroscopy (AES), and/or an electron energy loss spectroscopy (EELS). In other embodiments, the imaging system 100 can be configured to employ high-resolution transmission electron microscopy (HRTEM) coupled with the analytical power of EELS and X-ray fluorescence spectroscopy using open environmental cells (E-cells), transmission electron microscopy (TEM), and/or scanning electron microscopy (SEM). In yet other embodiments, the imaging system 100 can be adapted to operate as any other conventional spectroscopy or microscopy system. Future discussions in this paper may refer to the imaging system 100 being configured as an XPS system; however, these discussions are intended only as examples for illustrating some embodiments of the imaging system 100 and are not intended as limitations of the disclosure.
For example, in some embodiments, the imaging system 100 can be generally configured as an XPS system. The imaging system 100 can include one or more E-cells 102, a radiation source 104, and an electron energy analyzer 106. Moreover, the E-cells 102, which are described in greater detail below, may be configured to support a liquid, solid, and/or gaseous sample or analyte 108 for analysis using the imaging system 100. In addition, the imaging system 100 may generally operate as an XPS system. For example, the radiation source 104 can produce one or more bursts of radiation 110 (i.e., X-rays shown in
In some embodiments, the E-cell 102 can be configured to enable study of the sample or analyte 108 in a generally controlled atmosphere (e.g., controlled pressure, temperature, relative humidity, etc.). Accordingly, in some embodiments, it can be desirous to place a membrane or other structure over a portion of the E-cell 102 (e.g., before or after depositing the sample 108 within the E-cell 102) that is relatively or completely impermeable to environmental factors that can alter the atmosphere within the E-cell 102, but configured to enable the radiation 110 and photoelectron beams 112 to ingress and egress from the E-cell 102, respectively. For example, in some embodiments, the E-cell 102 may include a membrane 114 to provide for atmospheric control and transmission of radiation 110 and photoelectron beams 112.
In some embodiments, the membrane 114 can exhibit a generally thin configuration. For example, in some embodiment, the membrane 114 can have a thickness less than one millimeter (mm). In some particular embodiments, the membrane 114 can have a thickness less than one micron (μm). For example, in one embodiment, the membrane 114 can have a thickness less than or substantially equal to one nanometer (nm). As a result of at least some of these thicknesses, radiation 110 and photoelectron beams 112 can readily pass through the membrane 114.
In some embodiments, the membrane 114 can be composed of one or more carbon-containing materials. For example, in some embodiments, the membrane 114 is at least partially composed of graphene oxide or graphene. In other embodiments, the membrane 114 can be composed of other materials, such as, but not limited to WS2BN, MoS2, NbSe2, Si2Sr2CaCu2Ox, Bi2Te3, and others. As a result of forming the membrane 114 from one or more of these materials, the membrane 114 can be configured to substantially or completely seal the E-cell 102 to provide a relatively or completely controlled atmosphere therewithin.
Referring now to
In some embodiments, the method of assembling a membrane 114 can include providing a substrate 116. As shown in
In some embodiments, a plurality of graphene-oxide (GO) sheets 120 can be prepared using substantially conventional methods either before or after preparing the substrate 116. For example, a GO solution can be prepared, filtered, washed, and added to a receptacle 122 (e.g., a trough) that is holding an aqueous solution (e.g., water). In some embodiments, the GO solution can be “floated” on top of the aqueous solution and allowed to equilibrate to form the GO sheets 120 that reside on top of aqueous solution. Then, as shown in
In addition, as shown in
Furthermore, in some embodiments, a sealant 124 can be placed around at least a portion of the membrane 114 and/or the substrate 116. As shown in
The following discussion is intended only as examples of some embodiments of the invention. The details set forth below are not intended to limit the scope of the disclosure, but are rather to provide exemplary uses of some embodiments of the invention.
Fabrication and characterization of graphene oxide membranes and environmental cells (E-cells).
Referring to
After dialysis, the Langmuir-Blodgett assembly method was used to assemble the GO, as disclosed in Cote et al, “Flash Reduction and Patterning of Graphite Oxide and its Polymer Composite,” J. Am. Chem. Soc. 131, 11027-11032 (2009), which is herein incorporated by reference. Briefly, the dialyzed GO was diluted using a 5:1 methanol:water solution. A receptacle (e.g., a trough) was cleaned with chloroform and then filled with deionized water. The GO solution was spread drop-wise onto the water surface using a syringe, to a total volume of between about 10 to about 15 mL, and then the film was allowed to equilibrate for at least 20 minutes. As a result, individual 100-1000 μm2 GO sheets formed, as illustrated in
At least a portion of the experimental examples detailed below were carried out using conventional frames or similar structures (e.g., 200 μm thick) with 50 nm thick 100×100 μm2 SiN4 (or SiO2) windows as primary membranes or substrates. Windows to be used with GO deposition were generally refined by ion-beam milling of the primary membrane using a Helios NanoLab Dual Beam SEM/Focused Ion Beam (FIB). For example, one or more 3-10 μm apertures were milled in the primary membranes using a FIB, which helped ensure the mechanical stability of the windows, as illustrated in
In addition, three types of samples were used in some of the following studies. The first sample type had unconjugated mono-dispersed 50 nm gold colloids drop-cast onto the back of the membrane and dried. In the second sample type, to evaluate the transparency of the freestanding GO membranes, about 5 to about 10 nm of gold was d.c. sputtered on the backside of the GO membrane, as shown in
In the third sample type, 3 M Nal aqueous solution in double distilled water was used. Specifically, about 1×10−2 μL of analyte was filled in a compartment of the substrate and a second silicon wafer was placed over the filled compartment to create a sealed E-cell. The excess water was removed and the entire assembly sealed using an Ultraviolet-curable Norland optical adhesive NOA-81, as illustrated in
In addition, prior to ultra-high vacuum (UHV) measurements, the mechanical integrity and vacuum compatibility of the sealed sample cells were tested in an intermediate-vacuum interlock chamber. For example, as shown in
By way of example only, SEM imaging was performed in reflection mode by collecting secondary electrons, and also in transmission mode using a two-segment, solid-state STEM detector with either bright-field or dark-field electron collection. The imaging conditions were at an acceleration voltage of 10 kV, beam current of about 1×10−11 Amps, and an electron dose of about 1 mC per cm2. TEM imaging was carried out with a JEOL JEM-2100F FAST TEM using an acceleration voltage of 200 kV.
Atomic force microscopy (AFM) images were recorded using a Park-XE100 microscope. The scanning probe microscope (SPM) was equipped with a silicon cantilever with a force constant of 40 Newtons per meter and a curvature radius of 10 nm. AFM was operated in non-contact mode at a resonance frequency of 270 kHz. Image scanning was performed with a speed of 0.5 Hz, which corresponds to one line per second. SPEM measurements were carried out at the ESCA microscopy beamline in synchrotron facilities. As previously mentioned, the incident soft X-ray photon beam (e.g., about 200-1,400 eV) was focused to a small spot with a diameter of about 100 nm at the sample surface. The sample could be scanned with an accuracy of about 10 nm in front of the beam. The measured flux in the probe was 1×109 to 1×1019 photons per second. For XPS spectra and imaging, a hemispherical 100 mm energy analyzer with a 16-channel detector and an energy resolution better than 200 meV was used. XPS spectra analysis and image data was processed using IGOR Pro Software. For quantitative intensity comparisons, peak areas were determined after Shirley background subtraction. The oxygen 1s spectra were fitted assuming a Doniach Sunjic line shape of low asymmetry (α=0.02), a Lorentzian linewidth of 0.25 eV, and a Gaussian linewidth ranging from between 1.8 and 2.6 eV and subtracting a linear background. The peak positions of the indicated species were 532.0-532.5 eV (C═O, C—OH, SiO2, O═C—OH, which are species of the membrane), 533.6 eV (liquid water), and 536.8 eV (water vapor).
In using some embodiments of the invention, for spectroscopic and signal attenuation tests, gold 4f core levels were selected. These levels provide the combination of appreciable photo-ionization cross-section (e.g., about 1-4 Mbarn) for excitation with soft X-rays (e.g, about 650 and 777 eV) and relative low binding energy (e.g., Eb=83.9 and 87.6 eV for 4f5/2 and 4f7/2, respectively), which means that the kinetic energy of the emitted gold 4f photoelectrons is high enough for penetration through the GO membrane of the window. For example, the principle and geometry of the experimental setup using GO layers to form a GO membrane on a gold/silicon substrate can be seen in
As shown in
where d is the thickness of the GO overlayer, λIMFP is the inelastic mean free path of the gold 4f electrons in GO, and θ is the emission angle with respect to the sample normal. By substituting λIMFP with the effective attenuation length (λEAL) to account for elastic scatting effects, the), λEAL value for GO can be obtained. Unlike graphene, the reported experimental data for the GO monolayer thickness scatters significantly from 0.35 nm to 1.7 nm. One of the reasons for this scattering is that the thickness of GO results from different degrees of thermal and chemical reduction of the film/membrane and intrinsic surface roughness. In addition, the X-ray beam-induced effects cannot be excluded, such as the photothermal de-oxygenation reaction. Accordingly, instead of the thickness of GO, dGO, it is more feasible to measure the ratio of λEAL/dGO, which can be obtained from the experimental values of Io/In from the SLA-derived expression:
The best fit gives λEAL/dGO=2.53±0.05, where the only unambiguous number of the GO layers (n<5) is used, as shown by the line in
In addition, the enhanced transparency of the GO membrane for photoelectrons has been confirmed by the ability to collect XPS spectra and images from samples placed on the back side of the suspended GO membranes or windows. Due at least in part to the appreciable λEAL value, this shows that windows with GO membranes consisting of one to four layers can be used for quantitative in situ XPS. Comparing the data obtained with the two types of gold samples, the photoelectron signal from the percolating gold nanoparticle layer evaporated directly on the back side of the GO membrane is much higher than the one form the drop-cast colloidal gold, which is most likely due to presence of surfactant molecular layers at the interface between the gold colloid nanoparticles and membrane, in the latter case. These comparative experiments indicate that for this technique, the immediate proximity of the tested sample to the membrane surface is a relevant feature. In some embodiments, the proximity can be a critical feature, but does not have to be in all embodiments.
For example, the SEM image of
Moreover, referring back to
Next, the feasibility of conducting photoelectron spectromicroscopy of liquid media was tested by filling the E-cell compartment with 3M Nal aqueous solution, and subsequently vacuum sealing it using the procedure described above. It was found that a few nanometer-thick GO membrane is capable of maintaining the liquid and/or elevated-pressure water (vapor) for an extended period of time for conventional XPS studies. Some interfacial diffusion between the GO layers and the primary silicon nitride membrane was observed in only a few cells after long experiments. Similar phenomena, namely interfacial mass transport and trapping of water layers have also been observed. The vacuum tightness of the E-cell front side is determined by the initial adhesion of the GO sheets to the silicon nitride window, which, in some embodiments, may be enhanced by some thermal annealing. These samples sustained the UHV environment for a plurality of hours of continuous measurements and experimentation. For example,
In some other circumstances, graphene-based membranes were generated and tested (data not shown). In these circumstances, the graphene-based membranes were produced as discussed below.
Graphene was assembled on copper foil using chemical vapor deposition to fabricate single layer graphene membranes or sheets while multilayer graphene sheets were grown on nickel film on a silicon wafer, with the latter being used to produce thicker and more robust windows. Commercial stainless steel frames (Lenox Laser Inc. 10 mm in diameter and 0.05-0.1 mm thick) having laser drilled apertures with diameters of between about 2 and about 10 microns were used as exchangeable supporting frames for at least some of the windows. Prior to graphene transfer, the orifices were electro polished in a 45% phosphoric acid, 30% sulfuric acid, and 25% glycerol (by volume) solution to eliminate the laser induced edge roughness near the aperture. Graphene was transferred to these To transfer graphene to these stainless steel frames using a conventional Poly(methyl methacrylate) (PMMA)-based protocol substantially similar to the protocol described in Li et al, “Transfer of Large-Area Graphene Films for High-Performance Transparent Conductive Electrodes,” 9 Nano Letters 4369 (2009), which is herein incorporated by reference in its entirety.
Briefly, after transfer of the PMMA and the graphene layer from the distilled water onto a target substrate, the assembly was dried in air and then exposed to saturated acetone vapor above a 65° C. acetone bath to induce gradual softening and melting of the polymer support. This procedure can eliminate the effect of mesoscopic interfacial roughness of the contact between graphene and the support frame/substrate and ensure adhesion of the graphene to the substrate. The polymer film softening and melting was visually monitored and controlled in real time with optical microscope. After the complete adhesion of melted polymer was achieved the entire assembly was slowly immersed in to the hot acetone bath to dissolve completely PMMA film. A second warm bath of acetone was used for final cleaning of the window to remove some or all possible remaining polymer residue. This additional cleaning of the window in the second acetone bath was found to be helpful because the organic residue can form with the high-aspect ratio, few micrometer wide aperture of the support frame upon drying if not cleaned with solvent. Moreover, in some embodiments, the above-described protocol works using a drop-cast method (as discussed in Example 2) with lacquer diluted 1:10 in acetone in lieu of the PMMA.
A GO dispersion in water of 1 mg/mL was obtained using a modification of Hummers method, which was disclosed in Hummers, W. S. & Offeman, R. E., “Preparation of Graphitic Oxide,” J. Am. Chem. Soc. 80 1339 (1958), which is herein incorporated in its entirety by reference. As a result of this protocol, GO sheets were produced with a size on the order of a few to a few tenths of a micron. Discs made of Cu, Ni, and stainless steel were used in the following experiments. For example, electrochemically formed and/or laser-drilled metal aperture discs were used. In some experiments, SiN, SiO2, and ruby discs were also used. The aperture diameters ranged from about 4 to about 50 μm.
As shown in
Referring now to
Regardless of the method of manufacture, all membranes were allowed to substantially or completely dry at 125±5° C. for approximately 30 minutes. This drying step eliminates any excess water caught between layers of the GO membrane, strengthens the membrane, improves impermeability of the membrane, and improves the membranes adhesion to the disc.
Unlike conventional SiO2 or SiN membrane microfabrication technologies, the above-described methods offer the opportunity to create the membranes selectively at predefined locations with adjustable thickness. For example, the thickness H of the membrane can be controlled via dilution level of the concentration of the primary GO dispersion solution (CGO) and/or controlled via the diameter D of the contact area of the droplet of GO dispersion using the following equation:
H=(4VLπρGO)(CGO/D2) (3)
Where VL and ρGO are the initial volume of the droplet and the density of the formed GO membrane, respectively. Since the droplet contact line remains pinned during the drying process, the thickness can be controlled within the range of from a few to hundreds of nanometers, as discussed in greater detail below.
For example, a possible diameter of the contact area of the droplet on a Si/SiO2 wafer and on metal apertures was on the order of 1 mm under normal conditions and can be adjusted or modulated by modifying the wetting properties of the wafer or creating a hydrophobic barrier of a predefined diameter using a liquid blocker.
In order to examine this dependence, an array of 3 μL droplets with different concentrations of GO was allowed to dry on a clean Si/SiO2 surface. After drying, part of the residual GO film/membrane was mechanically removed along the radius and step height histograms were measured using AFM at different locations along the ridge, as shown in
Next, a cell having a gas inlet and connection to an accurate pressure gauge was designed to facilitate monitoring of the morphological changes and deflections of the membrane during pressurization. The topology of a 40 nm thick membrane suspended over a 50 μm aperture is depicted in
For example, more than 30 membranes with thicknesses between 20 and 250 nm and orifice diameters between 4 and 50 μm were tested. The data shows that 50 μm membranes with a thickness of about 30-50 nm were found to be a workable compromise between mechanical stability and electron transparency. These GO membranes were generally able to withstand a pressure differential of up to 1.3×105 Pa, which is sufficient for most practical needs of environmental electron microscopy; however smaller membranes (e.g., those less than 10 μm in diameter) can withstand similar (e.g., higher) pressure differentials.
Similarly, the tensile strength σmax of GO membranes was also evaluated using the bulge test method. Measuring the bulge height h (after removal of the initial slack) and Pmax of the pressurized suspended membrane, along with the thickness t and diameter D just before the failure for typical 40 nm thick and 50 μm wide membranes, the average stress σmax was evaluated to be about 80 MPa.
A relevant consideration for conducting SEM imaging with membrane-based E-cells is the proximity of the sample to the backside of the membrane. The liquid containing samples, such as nanoparticle solutions, can be casted directly on to the backside of the GO membrane, as discussed above in Example 1. The adhered nanoparticles become immobilized at the backside of the membrane and therefore can be imaged. However, free nanoparticles in Brownian motion may move too fast compared to the beam rastering rate. The placing of nonplanar or large rigid samples that do not adhere to the GO membrane surface may not be realized by mechanically pressing them against the membrane because this may cause disruption of the membrane. To overcome this potential limitation, an encapsulation methodology can be used. This methodology may employ a secondary drop-casted GO membrane as a capping agent (i.e., to form a GO-membrane “sandwich” with the analyte between two GO membranes). As a result of this method, samples can be gently adhered to the surface of the electron-transparent membrane while the wet environment around the sample is preserved.
An analysis of images taken with the ETD as a function of the beam energy reveals particularities of the contrast formation mechanism. Using some embodiments of the invention, it was possible to image gold nanoparticles through the GO membrane using low electron beam energies (e.g., around 2 keV or greater). Since the thickness of the GO membrane (20-40 nm) at least partially exceeds the inelastic mean free path for second electrons in GO, it is plausible that the SEM signal from gold nanoparticles is formed mainly by secondary electrons of SII and SIII induced by electrons backscattered from the gold nanoparticles.
Referring now to
Additionally, electron-beam-induced direction movement of nanoparticles that were weakly bound to the backside of the GO membrane was also observed.
As discussed above, some embodiments of the invention provide for a window/membrane composition for environmental cells to enable XPS and other imaging studies using a liquid or dense gaseous media. As discussed above, a plurality of layers of suspended GO sheets assemble to form GO membranes and have sufficient transparency to function as photo-suspended membranes. Moreover, in some embodiments, the GO membranes have sufficient transparency for photo-emitted electrons with kinetic energies less than, equal to, or greater than 450-500 eV. The results discussed above indicate that in addition the their unique electronic, thermal, magnetic, mechanical, and other properties, the two-dimensional and quasi-two-dimensional crystals, such as graphene, GO, GN, MoS2, NbSe2, Si2Sr2CaCu2Ox, Bi2Te3, and others, appear to provide an improved platform for experimental XPS tests of interfacial, electron transport, and inelastic phenomena in solids because the morphology and the thickness of such an over-layer can be nearly or completely precisely determined.
It should be understood from the foregoing that, while particular embodiments have been illustrated and described, various modifications can be made thereto without departing from the spirit and scope of the invention as will be apparent to those skilled in the art. Such changes and modifications are within the scope and teachings of this invention as defined in the claims appended hereto.
The present application claims priority under 35 U.S.C. §119(e) to U.S. Provisional Application No. 61/569,888 filed on Dec. 13, 2011, the entire contents and disclosure of which are herein incorporated by reference.
Number | Date | Country | |
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61569888 | Dec 2011 | US |