3774088

Information

• Patent Grant
• 3774088

• References
• Source

• Patent Number

  3,774,088

• Date Filed

  Not available

• Date Issued

  Tuesday, November 20, 1973
  51 years ago

• CPC

  • H01L22/34 - Circuits for electrically characterising or monitoring manufacturing processes
  • G01R31/2884 - using dedicated test connectors, test elements or test circuits on the IC under test
  • Y10S148/037 - Diffusion-deposition
  • Y10S148/085 - Isolated-integrated
  • Y10S148/117 - Oxidation, selective
  • Y10S148/145 - Shaped junctions
  • Y10S148/151 - Simultaneous diffusion
  • Y10S148/162 - Testing steps

• US Classifications

  • 257 - Active solid-state devices
  • 148 - Metal treatment
  • 438 - Semiconductor device manufacturing: process