Claims
- 52. An apparatus for abatement of effluent from a CVD process using an organometallic copper source reagent, said apparatus comprising:
a sorbent bed comprising sorbent material having sorptive affinity for the organometallic copper source reagent and decomposition byproducts thereof; and a flow path joining the sorbent bed in gas flow communication with the process, so that effluent is flowed through the gas flow path to the sorbent bed for at least partial removal of residual copper source reagent and decomposition products from the effluent; and a pump in the flow path.
- 53. The apparatus of claim 52, wherein said pump provides a subatmospheric pressure level.
- 56. An apparatus for abatement of effluent from a CVD process using an organometallic copper source reagent, said apparatus comprising:
a sorbent bed comprising sorbent material having sorptive affinity for the organometallic copper source reagent and decomposition byproducts thereof; and a flow path joining the sorbent bed in gas flow communication with the process, so that effluent is flowed through the gas flow path to the sorbent bed for at least partial removal of residual copper source reagent and decomposition products from the effluent; and an endpoint detector arranged to detect breakthrough of an effluent component from said sorbent bed.
- 57. An apparatus for abatement of effluent from a CVD process for depositing copper on a substrate from a Cu(hfac)TMVS source reagent, said apparatus comprising:
a sorbent bed having sorptive affinity for Cu(hfac)TMVS, Cu(hfac)2 and TMVS; a flow path joining the sorbent bed in gas flow communication with the process, so that effluent from the CVD process passes through said sorbent bed, to remove residual Cu(hfac)TMVS, Cu(hfac)2 and TMVS from the effluent; and a pump in said flow path.
- 58. The apparatus of claim 57, wherein said pump provides a subatmospheric pressure level.
- 61. The apparatus of claim 57, further comprising means for regenerating the sorbent bed.
- 62. An apparatus for abatement of effluent from a CVD process for depositing copper on a substrate from a Cu(hfac)TMVS source reagent, said apparatus comprising:
a sorbent bed having sorptive affinity for Cu(hfac)TMVS, Cu(hfac)2 and TMVS; a flow path joining the sorbent bed in gas flow communication with the process, so that effluent from the CVD process passes through said sorbent bed, to remove residual Cu(hfac)TMVS, Cu(hfac)2 and TMVS from the effluent; and means for detecting the endpoint of sorption in the sorbent bed.
- 63. The apparatus of claim 62, wherein said means for detecting the endpoint of sorption in the sorbent bed, comprise a quartz microbalance detector.
- 64. The apparatus of claim 57, further including a semiconductor manufacturing facility whose operation comprises said CVD process.
Parent Case Info
[0001] This is a continuation of U.S. application Ser. No. 09/828,422, filed on Apr. 6, 2001, now pending, which is a divisional of U.S. application Ser. No. 09/420,108, filed on Oct. 18, 1999, now U.S. Pat. No. 6,391,385, granted May 21, 2002.
Divisions (1)
|
Number |
Date |
Country |
Parent |
09420108 |
Oct 1999 |
US |
Child |
09828422 |
Apr 2001 |
US |
Continuations (1)
|
Number |
Date |
Country |
Parent |
09828422 |
Apr 2001 |
US |
Child |
10358972 |
Feb 2003 |
US |