Arrangement for energy conditioning

Information

  • Patent Grant
  • 9019679
  • Patent Number
    9,019,679
  • Date Filed
    Friday, November 15, 2013
    10 years ago
  • Date Issued
    Tuesday, April 28, 2015
    9 years ago
Abstract
Circuit arrangement embodiments that use relative groupings of energy pathways that include shielding circuit arrangements that can sustain and condition electrically complementary energy confluences.
Description
TECHNICAL FIELD

This application relates to balanced shielding arrangements that use complementary relative groupings of energy pathways, such as pathways for various energy propagations for multiple energy conditioning functions. These shielding arrangements may be operable as discrete or non-discrete embodiments that can sustain and condition electrically complementary energy confluences.


BACKGROUND OF THE INVENTION

Today, as the density of electronics within applications increases, unwanted noise byproducts of the increased density may limit the performance electronic circuitry.


Consequently, the avoidance of the effects of unwanted noise byproducts, such as by isolation or immunization of circuits against the effects of the undesirable noise is an important consideration for circuit arrangements and circuit design.


Differential and common mode noise energy may be generated by, and may propagate along or around, energy pathways, cables, circuit board tracks or traces, high-speed transmission lines, and/or bus line pathways. These energy conductors may act as, for example, an antenna that radiates energy fields. This antenna-analogous performance may exacerbate the noise problem in that, at higher frequencies, propagating energy utilizing prior art passive devices may experience increased levels of energy parasitic interference, such as various capacitive and/or inductive parasitics.


These increases may be due, in part, to the combination of constraints resulting from functionally or structurally limitations of prior art solutions, coupled with the inherent manufacturing or design imbalances and performance deficiencies of the prior art. These deficiencies inherently create, or induce, unwanted and unbalanced interference energy that may couple into associated electrical circuitry, thereby making at least partial shielding from these parasitics and electromagnetic interference desirable. Consequently, for broad frequency operating environments, solving these problems necessitates at least a combination of simultaneous filtration, careful systems layout having various grounding or anti-noise arrangements, as well as extensive isolating in combination with at least partial electrostatic and electromagnetic shielding.


BRIEF SUMMARY OF THE INVENTION

Thus, a need exists for a self-contained, energy-conditioning arrangement utilizing simplified energy pathway arrangements, which may additionally include other elements, amalgamated into a discrete or non-discrete component, which may be utilized in almost any circuit application for providing effective, symmetrically balanced, and sustainable, simultaneous energy conditioning functions selected from at least a decoupling function, transient suppression function, noise cancellation function, energy blocking function, and energy suppression functions.





BRIEF DESCRIPTION OF THE DRAWINGS

Understanding of the present invention will be facilitated by consideration of the following detailed description of the preferred embodiments of the present invention taken in conjunction with the accompanying drawings, in which like numerals refer to like parts and in which:



FIG. 1 is a relative location compass operable for determining relative locations of the various pathway extensions disclosed;



FIGS. 1A-1C show relative locations of the various pathway extensions disclosed according to an aspect of the present invention;



FIG. 2A shows a circuit schematic of the plan view of an embodiment of 2B according to an aspect of the present invention;



FIG. 2B is a plan view of an embodiment according to an aspect of the present invention;



FIG. 3A shows a circuit schematic of the plan view of an embodiment of 3B according to an aspect of the present invention;



FIG. 3B is a plan view of an embodiment according to an aspect of the present invention;



FIG. 3C shows a plan view of a shield according to an aspect of the present invention;



FIG. 4A shows a relative plan view of an embodiment according to an aspect of the present invention;



FIG. 4B shows a relative plan view of an embodiment according to an aspect of the present invention;



FIG. 4C shows a relative plan view of an embodiment according to an aspect of the present invention;



FIG. 4D shows a relative plan view of an embodiment according to an aspect of the present invention;



FIG. 4E shows a relative plan view of an embodiment according to an aspect of the present invention;



FIG. 4F shows a relative plan view of an embodiment according to an aspect of the present invention;



FIG. 4G shows a relative plan view of an embodiment according to an aspect of the present invention;



FIG. 4H shows a relative plan view of an embodiment according to an aspect of the present invention;



FIG. 4I shows a relative plan view of an embodiment according to an aspect of the present invention;



FIG. 5A shows a stacked multiple, circuit network including groups of pathways according to an aspect of the present invention;



FIG. 5B shows a stacked shield according to an aspect of the present invention;



FIG. 5C shows a relative plan view of a stacked multiple, non-shared circuit network having VIAs including groups of pathways according to an aspect of the present invention;



FIG. 6 shows a relative plan view of circuit arrangement variant according to an aspect of the present invention; and,



FIG. 7 shows a relative plan view of circuit arrangement variant according to an aspect of the present invention.





DETAILED DESCRIPTION OF THE INVENTION

It is to be understood that the figures and descriptions of the present invention have been simplified to illustrate elements that are relevant for a clear understanding of the present invention, while eliminating, for the purpose of clarity, many other elements found in typical energy conditioning systems and methods. Those of ordinary skill in the art will recognize that other elements and/or steps are desirable and/or required in implementing the present invention. However, because such elements and steps are well known in the art, and because they do not facilitate a better understanding of the present invention, a discussion of such elements and steps is not provided herein. The disclosure herein is directed to all such variations and modifications to such elements and methods known to those skilled in the art.


Additionally, it will be apparent to those skilled in the art that terms used herein that may include a whole, or a portion of a whole, such as “energy”, “system”, circuit, and the like, are contemplated to include both the portions of the whole, and the entire of the whole, as used, unless otherwise noted.


As used herein, an “energy pathway” or “pathway” may be at least one, or a number, of conductive materials, each one operable for sustained propagation of energy. Pathways may be conductive, thereby better propagating various electrical energies as compared to non-conductive or semi-conductive materials directly or indirectly coupled to, or adjacent to, the pathways. An energy pathway may facilitate propagation of a first energy by allowing for various energy conditioning functions, such as conditioning functions arising due to any one or a number of aspects, such as, but not limited to, the shielding, the orientation and/or the positioning of the energy pathways within the energy pathway arrangement, which various arrangements having an orientation and/or positioning thereby allow for interaction of the first energy with propagating energies that are complementary to at least the first energy. An energy pathway may include an energy pathway portion, an entire energy pathway, a conductor, an energy conductor, an electrode, at least one process-created conductor, and/or a shield. A plurality of energy pathways may include a plurality of each device or element discussed hereinabove with respect to energy pathway. Further, as used generally herein, a conductor may include, for example, an individual conductive material portion, a conductive plane, a conductive pathway, a pathway, an electrical wire, a via, an aperture, a conductive portion such as a resistive lead, a conductive material portion, or an electrical plate, such as plates separated by at least one medium 801, for example.


A shield may include a shielding electrode, a shielding pathway portion, a shielded pathway, a shielded conductor, a shielded energy conductor, a shielded electrode, and/or at least one process-created shielded pathway portion. A plurality of shields may include a plurality of the devices discussed hereinabove with respect to a shield.


As used generally herein, a pathway may be complementary positioned, or complementary orientated, with respect to a main-body 80,81, having various pathway extensions, designated 79“X”, 812“X”, 811“X” and 99“X”. Main-bodies 80, 81 may be in three-dimensional physical relationships individually, in pairs, groups, and/or pluralities as to distance, orientation, position, superposition, non-superposition, alignment, partial alignment, lapping, non-lapping, and partial lapping. Superposed main-body pathway 80, may, for example include a pairing of physically opposing and oppositely orientated main-body pathways 80 that are any one of, or any combination of, electrically null, electrically complementary, electrically differential, or electrically opposite.


A pathway arrangement may include at least a shield at least partially shielding at least one energy pathway, or a group of shields forming a shield structure that at least partially shielding, via a conductive shielding, at least a conductively isolated pairing of at least two energy pathways, such as vias, apertures or complementary paired pathways.


An exemplary embodiment may allow energy propagation on a conductively isolated pairing, such as complementary paired pathways, causing energy propagation on common shields, or at least one grouping of shields, serving an isolated circuit. This embodiment may allow a low inductance pathway to form among at least a single pair of isolated and separate parallel pathways serving at least one separate and distinct isolated circuit system. An exemplary embodiment may allow for the development of at least a low inductance pathway for utilization of energy propagating on at least one parallel pathway of at least two sets of isolated and separate parallel pathways and the development along at least one parallel pathway of at least one other low inductance pathway for utilization of energy propagating along at least one other separate and distinct isolated circuit system.


An exemplary embodiment utilized as part of a circuit assembly may have at least one pathway of relatively lower inductance, while other pathways may be electrically coupled to an energy source or an energy load. A pathway of a second plurality of pathways may have a lower impedance operable for portions of energy to be taken away from either of the same at least one energy source or at least one energy load of the circuit assembly. This same pathway of low impedance may not be electrically directly coupled to either the same at least one energy source or at least one energy load of the circuit assembly as the one pathway of lower inductance. A system may have both a pathway of least inductance and a pathway of least impedance which are not the same pathway.


In contrast to capacitors found in the industry wherein an equivalent series inductance (ESL) of a capacitor device is normally size dependant, in the present invention the pathway of least impedance and the pathway of least inductance for a circuit for energy conditioning may be achieved independent of the physical size of the device. These aspects depend on a predetermined capacitance developed by a predetermined layers in the present invention.


Arranging the pathways allows the resistance of the conductive material of the pathways to primarily determine the energy delivery, or relative efficiency or effect between at least one source of energy and one energy utilizing load of an integrated circuit, for example.


The ESL may be a negligible factor, rather than a primary factor for delivery outcome or decoupling void of debilitating inductances.


In an illustrative pathway arrangement illustrated in FIGS. 1A, 1B, 1C, 5A and 5B, wherein the various propagating energies may be complementary, the pathway arrangement, upon placement into a circuit arrangement, may allow for energy propagation within or along certain energy pathways of the pathway arrangement, thereby allowing for the mutual interaction of opposite portions of pathway-sourced magnetic fields produced by the propagation of energy field currents emanating outwardly from each set of the complementary conductors. This mutual interaction may be a mutual cancellation in embodiments wherein certain pathways may be partially or totally physically shielded from other complementary pathways, and may be placed within an influencing distance of those other complementary pathways. Further, a substantial similarity in size and shape of the respective complementary pathways, including the spaced-apart relationship and the interpositioning of a shielding between pathways, and the conductively isolated relationship of the pathways, may contribute to this mutual cancellation effect. Additionally, the shielding operations may be predicated on a relative positioning of a mating of the paired pathways relative to the conductive electrostatic shielding. At least the complementary energy conditioning functions and electrostatic shielding dynamics discussed herein may operate on various energy propagating in various directions along various predetermined pathways, and may operate on circuits having dynamic operation utilizing the pathway arrangement.


A sub-combination of electromagnetically/electrostatically actuated impedance states may develop along or within a pathway arrangement, or along or within a closely coupled external conductive portion conductively coupled to separate or multiple groupings of shields, to thereby form an energy conditioning circuit. These electromagnetically/electrostatically actuated impedance states may develop, for example, because of the energization of one paired set of pathways of one circuit portion, but not necessarily develop on another paired set of pathways from another circuit portion, for example.


According to an aspect of the present invention, each shield may include a main-body 81. Main-bodies 81 may collectively and conductively couple to one another and at the same time may substantially immure and shield the main-body 80 of the energy pathways. In other embodiments of the present invention, the collective shielding main-body 81 may only partially immure or shield the pathway main-body 80s in at least one portion of the shielding.


According to an aspect of the present invention, a balanced, symmetrical, pathway arrangement may result from the symmetry of certain superposed shields, from complementary pathway sizing and shaping, and/or from reciprocal positioning and pairing of the complementary pathways. Manufacturable balanced or symmetrical physical arrangements of pathways, wherein dynamic energy propagation, interactions, pairings or match-ups of various dynamic quantities occur, may operate at less than a fundamental limit of accuracy of testing equipment. Thus, when portions of these complementary energy quantities interact simultaneously, the energy may be beyond the quantifiable range of the typical testing equipment. Thus, the extent to which the measurement may be obtained may employ increased controllability, and thereby the electrical characteristics and the effect on electrical characteristics may be controlled, such as by predetermining the desired measurability, behavior or enhancement to be provided, and by a correspondent arrangement of the elements, such as specifically by an arrangement of the elements to provide the desired measurability or effect. For example, a desired electrical characteristic may be predetermined for a desired enhancement by varying at least a portion of the complementary balance, size, shape, and symmetry of at least one pathway pairing, as set forth herein below and as illustrated in FIGS. 1A, 1B, 1C, 5A and 5B, for example.


Thus, the extent of energy interactions, mutual energy propagation timings and interferences, for example, may be controlled by tolerances within the pathway arrangement.


A manufacturing process, or computer tolerance control, such as semiconductor process control, may control these tolerances, for example. Thus, the pathways of an embodiment may be formed using manufacturing processes, such as passive device processes, apparent to those skilled in the art. Mutual energy propagation measurements may thereby be cancelled or suppressed by the formation, and process of formation, of the pathway arrangement.


A pathway arrangement may, as set forth hereinabove, include a sequentially positioned grouping of pathways in an amalgamated electronic structure having balanced groupings of pathways. The balanced grouping may include a predetermined pathway architecture having a stacked hierarchy of pathways that are symmetrical and complementary in number, and that are positioned complementary to one another, thereby forming pairs, each of which pair is substantially equidistant from each side of a centrally positioned shield, wherein each shield may provide a symmetrical balancing point for both each pair pathway and the overall pathway hierarchy as depicted in FIGS. 1A to 4I, for example. Thus, predetermined identically sized, shaped and complementary positioned pathways may be present on either side of a centrally positioned shield for each separate circuit portion. A total circuit may have its complementary portions symmetrically divided into a complementary physical format including a reverse-mirror image positioning of paired shielded, complementary sized and shaped pathways, sandwiching at least one interposing shield.


According to an aspect of the present invention, each pathway may be, for example, a first interconnect substrate wrapping around, or holding, an integrated circuit wafer, a deposit, an etching, or a resultant of a doping process, and the shield may be, for example, a pathway substrate, an energy conditioning embodiment or energy conditioning substrate, a deposit, an etching, a resultant of a doping process, and may have, for example, resistive properties.


Additional elements may be utilized, including conductive and nonconductive elements, between the various pathways. These additional elements may take the form of ferromagnetic materials or ferromagnetic-like dielectric layers, and/or inductive-ferrite dielectric derivative materials. Additional pathway structural elements may be utilized, including conductive and nonconductive multiple pathways of different conductive material compositions, conductive magnetic field-influencing material hybrids and conductive polymer sheets, various processed conductive and nonconductive laminates, straight conductive deposits, multiple shielding pathways utilizing various types of magnetic material shields and selective shielding, and conductively doped and conductively deposited on the materials and termination solder, for example, in addition to various combinations of material and structural elements, to provide a host of energy conditioning options.


Non-conductor materials may also provide structural support of the various pathways, and these non-conductor materials may aid the overall energized circuit in maintaining the simultaneous, constant and uninterrupted energy propagation moving along the pathways.


Dielectric materials for example, may include one or more layers of material elements compatible with available processing technology. These dielectric materials may be a semiconductor material such as silicon, germanium, gallium arsenide, or a semi-insulating and insulating material such as, but not limited to any K, high K and low K dielectrics.


Pathway and conductor materials may be selected from a group consisting of Ag, Ag/Pd, Cu, Ni, Pt, Au, Pd and other such conductive materials and metals. Combinations of these metal materials are suitable for the purposes discussed herein, and may include appropriate metal oxides, such as ruthenium oxide, which, depending on the exigencies of a particular application, may be diluted with a suitable metal. Other pathways may be formed of a substantially non-resistive conductive material. Any substances and processes that may create pathways from conductive, non-conductive, semi-conductive material, and/or Mylar films printed circuit board materials, or any substances or processes that may create conductive areas such as doped polysilicons, sintered polycrystallines, metals, polysilicon silicates, or polysilicon silicide may be used within or with the pathway arrangement.


An exemplary embodiment of the present invention may utilize an internal shield structural architecture to insure energy balancing configurations within the various arrangements, rather than a specific external circuit balance. This balancing configuration is dependent upon the relative positioning of all the shields in relationship to the shared and centrally positioned shield, and the actual paired shields positioned in specific quantities, to simultaneously provide shielding for the electrically opposing shielded paired pathways utilized by propagating energy. This allows these electrically opposing complementary pathways to be located both electrically and physically on the opposite sides of the centrally positioned and shared common conductive shield. This interposition of the central and shared shields may create a voltage divider that divides various circuit voltages in half and that provides, to each of the oppositely paired shielded conductors, one half of the voltage energy normally expected. The energized circuitry, including shielded conductors, may be balanced electrically or in a charge-opposing manner and with respect to a centrally positioned shield, to a common and shared pathway, or to each respective, isolated circuit system portion.


Each common circuit member of an isolated circuit system may be attached or coupled to a common area or common pathway, thereby providing an external common zero voltage.


Thus, the embodiment may have multiple sets of shields electrically or physically located between at least one of the various electrically or charge opposing, shielded pairs or grouped complementary pairs of pathways in an interposed shielding relationship, supported with additional outer sandwiching shields, designated herein as -IM that are additionally coupled and, in part, form the shielding structure.


An exemplary embodiment may also be placed into one or more energy circuits that utilize different energy sources and that may supply one or more separate and distinct energy-utilizing loads. When energized for multiple energy conditioning operations and for providing simultaneous and effective energy conditioning functions, such as electromagnetic interference filtering, suppression, energy decoupling and energy surge protection, each separate and distinct circuit is utilizing the multiple commonly shared universal shield structure and circuit reference image, or node.


According to an aspect of the present invention, energy-conditioning functions may maintain an apparent balanced energy voltage reference and energy supply for each respective energy-utilizing load within a circuit. This energized arrangement may allow for specific energy propagation utilizing a single, or multiple, isolated pathway arrangement, and may not require balancing on a single, centralized shield. A shield may be physically and electrically located between one or multiple energy sources and one or multiple energy utilizing loads, depending upon the number of separate and isolated pathways. Thus shielding relative, centralized pathways may be in both co-planar and stacked variants of exemplary embodiment.


When the internally positioned paired shielded pathways are subsequently attached, or conductively coupled, to externally manufactured pathways, the internally positioned paired shields may be substantially enveloped within the cage-like shield structure, thereby minimizing internally generated energy strays and parasitics that may normally escape or couple to an adjacent shielded pathway. These shielding modes utilize propagating energy to the various pathways and may be separate of the electrostatic shield effect created by the energization of the shield structure. The propagating energy propagating in a complementary manner provides energy fields of mutually opposed, mutually cancelled fields as a result of the close proximity of opposite propagation. The complementary and paired pathways may provide an internally balanced opposing resistance load function.


A device according to an aspect of the present invention may mimic the functionality of at least one electrostatically shielded transformer. Transformers may be widely used to provide common mode isolation dependent upon a differential mode transfer across the inputs in order to magnetically link the primary windings to the secondary windings to transfer energy. As a result, common mode voltage across the primary winding is rejected. One flaw inherent in the manufacturing of transformers is the propagating energy source capacitance between the primary and secondary windings. As the frequency of the circuit increases, so does capacitive coupling, until circuit isolation may be compromised. If enough parasitic capacitance exists, high frequency RF energy may pass through the transformer and cause an upset in the circuits on the other side of the isolation gap subjected to the transient event.


A shield may be provided between the primary and secondary windings by coupling to a common pathway reference source designed to prevent capacitive coupling between the multiple sets of windings. A device according to an aspect of the present invention improves upon, and reduces the need for, transformers in circuits. The device may use a physical and relative, common pathway shield to suppress parasitics and also may use relative positioning of common pathway shields, a complementary paired pathway layering, the various couplings of the pathway layering, and an external conductive coupling to a conductive area per isolated circuit system, in combination with the various external circuitry, to effectively function as a transformer. If an isolated circuit system is upset by transients, the electrostatically shielded, transformer function of the device discussed herein may be effective for transient suppression and protection, and may simultaneously operate as a combined differential mode and common mode filter. Each set of relative shields and relative conductors may be conductively coupled to at least the same external pathway to provide a transformer functionality for example.


Propagated electromagnetic interference may be the product of both electric and magnetic fields. A device according to an aspect of the present invention may be capable of conditioning energy that uses DC, AC, and AC/DC hybrid-type propagation, including conditioning energy in systems that may contain different types of energy propagation formats and in systems that may contain more than one circuit propagation characteristic.


In an exemplary embodiment, perimeter conductive coupling material for coupling or connecting, by conductive joining, of external portions of a typical embodiment into an assembly may be accomplished by conductive or non-conductive attachments to various types of angled, parallel or perpendicular, as those terms apply relative to at least another pathway, conductors known as apertures or blind or non-blind VIAs, passing through, or almost through, portions respectively of an exemplary embodiment. Couplings to at least one or more load (s), such as a portion of an integrated circuit, for one aspect of the invention may involve a selective coupling, or not, to these various types of conductors, such as apertures and VIAs.


Fabricating a pathway may include forming one or more plated through hole (PTH) via(s) through one or more levels of a pathway. Electronic packages commonly include multiple interconnect levels. In such a package, the invention may include layering of patterned conductive material on one interconnect level that may be electrically insulated from patterned conductive material on another interconnect level, such as by dielectric material layers.


Connections or couplings between the conductive material at the various interconnect levels may be made by forming openings, referred to herein as vias or apertures, in the insulating portions or layers, that in turn can provide an electrically conductive structure such that the patterned or shaped conductive material portions or pathways from different levels are brought into electrical contact with each other. These structures can extend through one or more of the interconnect levels. Use of conductive, non-conductive or conductively-filled apertures and VIAs allows propagating energy to transverse an exemplary embodiment as if utilizing a by-pass or feed-through pathway configuration of an embodiment. An embodiment may serve as a support, a system or a subsystem platform that may contain both or either active and passive components layered to provide the benefits described for conditioning propagated energy between at least one source and at least one load.


An aspect of the present invention may provide a conductive architecture or structure suitable for inclusion in a packaging or an integrated circuit package having other elements.


Other elements may be directly coupled to the device for simultaneous physical and electrical shielding by allowing simultaneous energy interactions to take place between grouped and energized complementary conductors that are fed by other pathways. Typical capacitive balances found between at least one shielding pathway may be found when measuring opposite sides of the shared shield structure per isolated circuit, and may be maintained at measured capacitive levels within this isolated circuit portion, even with the use of common non-specialized dielectrics or pathway conductive materials. Thus, complementary capacitive balancing, or tolerance balancing characteristics, of this type of electrical circuit due to element positioning, size, separations and attachment positioning allow an exemplary embodiment having an isolated circuit system manufactured at 3% capacitive tolerance, internally, to pass to a conductively coupled and energized isolated circuit system a maintained and correlated 3% capacitive tolerance between electrically opposing and paired complementary pathways of each respective isolated circuit system, with respect to the dividing shield structures placed into the isolated circuit system.


An exemplary embodiment may allow utilization of relatively inexpensive dielectrics, conductive materials and various other material elements in a wide variety of ways. Due to the nature of the architecture, the physical and electrical dividing structure created may allow the voltage dividing and balancing among the grouped, adjacent elements, and may allow for the minimization of the effect of material hysteresis and piezoelectric phenomenon to such a degree that propagating energy normally disrupted or lost to these effects may be essentially retained in the form of active component switching response time, as well as instantaneous ability to appear to the various energy-utilizing loads as an apparent open energy flow simultaneously on both electrical sides of a pathway connecting or coupling from an energy source to a respective load, and from the load back to the source.


A structured layer may be shaped, buried within, enveloped by, or inserted into various electrical systems and sub-systems to perform line conditioning or decoupling, for example, and to aid in or to allow for a modifying of an electrical transmission of energy to a desired or predetermined electrical characteristic. Expensive, specialized, dielectric materials that attempt to maintain specific or narrow energy conditioning or voltage balancing may no longer be needed for bypass, feed through, or energy decoupling operations for a circuit.


A device according to an aspect of the present invention may, as set forth hereinabove, be placed between each isolated circuit and a paired plurality of pathways or differential pathways. This exemplary device may operate effectively across a broad frequency range, as compared to a single discrete capacitor or inductor component, and may continue to perform effectively within an isolated circuit system operating beyond, for example, a GHz.


As set forth hereinabove, the exemplary device may perform shielding functions in this broad frequency range. A physical shielding of paired, electrically opposing and adjacent complementary pathways may result from the size of the common pathways in relationship to the size of the complementary pathways, and from the energized, electrostatic suppression or minimization of parasitics originating from the sandwiched complementary conductors and preventing external parasitics. Further, the positioning of the shielding, relative to shielding that is more conductive, may be used to protect against inductive energy and “H-Field” coupling. This technique is known as mutual inductive cancellation.


Parasitic coupling is known as electric field coupling. The shielding function discussed hereinabove provides primary shielding of the various shielded pathways electrostatically against electric field parasitics. Parasitic coupling involving the passage of interfering propagating energy because of mutual or stray parasitic energy originating from the complementary conductor pathways may be thereby suppressed. A device according to an aspect of the present invention may, for example, block capacitive coupling by enveloping oppositely phased conductors in the universal shield architecture with stacked conductive hierarchical progression, thereby providing an electrostatic or Faraday shield effect with respect to the pathway positioning as to the respective layering and position, both vertically and horizontally, of the pathways. The shielding pathway architecture may be used to suppress and prevent internal and external parasitic coupling between potentially noisy conductors and victim conductors, such as by an imposition of a number of common pathway layers that are larger than the smaller paired complementary pathways, but that are positioned between each of the complementary pathway conductor pairs to suppress and to contain the stray parasitics.


Further, as set forth hereinabove, positioning of the shielding, relative to shielding that is more conductive, may be used against inductive energy and “H-Field” coupling. This cancellation is accomplished by physically shielding energy, while simultaneously using a complementary and paired pathway positioned to allow for the insetting of the contained and paired complementary pathways within an area size correspondent to the shield size. A device according to an aspect of the present invention is adapted to use shields separately as internal shields or groupings, thereby substantially isolating and sandwiching pairs of electrically opposing complementary pathways, and thereby providing a physically tight or minimized energy and circuit loop propagation path between each shield and the active load.


Close proximity of shields and non-shields may allow energy along shields even if a direct electrical isolation exists because of 801 material type or the spacing.


Flux cancellation of propagating energy along paired and electrically opposing or differential pathways may result from spacing of pathways apart by a very small distance for oppositely phased electrically complementary operations, thereby resulting in a simultaneous stray parasitic suppression and containment function attributable to tandem shielding, and thereby enhancing energy conditioning.


In attaining minimum areas for various current loops in an isolated circuit system, additional shielding energy currents may be distributed around component shielding architectures. A plurality of shields as described hereinabove may be electrically coupled as either an isolated circuit's reference node, or chassis ground, and may be relied on as a commonly used reference pathway for a circuit. Thus, the various groups of internally paired, complementary pathways may include propagating energy originating from one or more energy sources propagating along external pathways coupled to the circuit by a conductive material. Energy may thus enter the device, undergo conditioning, and continue to each respective load.


The shielding structure may allow for a portion of a shield to operate as the pathway of low impedance for dumping and suppressing, as well as at least partially blocking return of unwanted electromagnetic interference noise and energy into each of the respective energized circuits. In an embodiment, internally located shields may be conductively coupled to a conductive area, thereby adaptively utilizing shielding structure for low impedance dumping and suppressing and at least partially blocking return blocking of unwanted electromagnetic interference noise and energy. Additionally, another set of internally located shields may be conductively coupled to a second conductive area, thereby utilizing shields for low impedance dumping, suppressing and at least partially blocking the return of unwanted electromagnetic interference noise and energy. The conductive areas may be electrically or conductively isolated from one another.


Simultaneous suppression of energy parasitics may be attributed to the enveloping shielding pathway structure, in combination with the cancellation of mutually opposing energy fields, and may be further attributed to the electrically opposing shielded pathways and propagating energy along the various circuit pathways interacting within the various isolated circuits to undergo a conditioning effect taking place upon the propagating energy.


This conditioning may include minimizing effects of H-field energy and E-field energy through simultaneous functions, such as through isolated circuits that contain and maintain a defined electrical area adjacent to dynamic simultaneous low and high impedance pathways of shielding in which various paired pathways have their respective potentials respectively switching as a result of a given potential located on a shielding and used instantaneously and oppositely by these pairings with respect to the utilization by energy found along paired routings of the low and high impedance shields.


The various distance relationships created by the positional overlapping of energy routings within the isolated circuits combine with the various dynamic energy movements to enhance and cancel the various degrees of detrimental energy disruptions normally occurring within active components or loads. The efficient energy conditioning functions occurring within the passive layering architecture allow for development of a dynamic “0” impedance energy “black hole”, or energy drain, along a third pathway coupled common to both complementary pathways and adapted to allow energy to be contained and dissipated upon the shielding, within the various isolated circuits and attached or conductively coupled circuits. Thus, electrically opposing energies may be separated by dielectric material and/or by an interposition shield structure, thereby allowing dynamic and close distance relationship within a specific circuit architecture, and thereby taking advantage of propagating energy and relative distances to allow for exploitation of mutual enhancing cancellation phenomenon and an electrostatic suppression phenomenon to exponentially allow layered conductive and dielectric elements to become highly efficient in energy handling ability.


According to an aspect of the present invention, a device may utilize a single low impedance pathway or a common low impedance pathway as a voltage reference, while utilizing a circuit maintained and balanced within a relative electrical reference point, thereby maintaining minimal parasitic contribution and disruptive energy parasitics in the isolated circuit system. The various attachment schemes described herein may allow a “0” voltage reference, as discussed hereinabove, to develop with respect to each pair or plurality of paired complementary conductors located on opposite sides of the shared central shield, thereby allowing a voltage to be maintained and balanced, even with multiple Simultaneous Switching Operations states among transistor gates located within an active integrated circuit, with minimal disruptive energy parasitics in an isolated circuit.


Shields may be joined using principals of a cage-like conductive shield structure to create one or more shieldings. The conductive coupling of shields together with a larger external conductive area may suppress radiated electromagnetic emissions and as a larger area provides a greater conductive area in which dissipation of voltages and surges may occur. One or more of a plurality of conductive or dielectric materials having different electrical characteristics may be maintained between shields. A specific complementary pathway may include a plurality of commonly conductive structures performing differentially phased conditioning with respect to a “mate”, or paired, plurality of oppositely phased or charged structures forming half of the total sum of manufactured complementary pathways, wherein one half of the complementary pathways forms a first plurality of pathways, and wherein the second half forms a second plurality of pathways. The sum of the complementary pathways of the first and the second plurality of pathways may be evenly separated electrically, with an equal number of pathways used simultaneously, but with half the total sum of the individual complementary pathways operating from, for example, a range of 1 degree to approximately 180 degrees electrically out of phase from the oppositely positioned groupings. Small amounts of dielectric material, such as microns or less, may be used as the conductive material separation between pathways, in addition to the interposing shield, which dielectric may not directly physically or conductively couple to any of the complementarily operating shielded pathways.


An external ground area may couple or conductively connect as an alternative common pathway. Additional numbers of paired external pathways may be attached to lower the circuit impedance. This low impedance phenomenon may occur using alternative or auxiliary circuit return pathways.


A shield architecture may allow shields to be joined together, thereby facilitating energy propagation along a newly developed low impedance pathway, and thereby allowing unwanted electromagnetic interference or noise to move to this created low impedance pathway.


Referring now to FIG. 1A through FIG. 5B, which generally show various common principals of both common and individual variants of an exemplary embodiment configured in a co-planar variant (FIGS. 1A-4I) and a stacked variant (FIGS. 5A and 5B).


In FIG. 1A, there are shown relative locations of the various pathway extensions disclosed according to an aspect of the present invention. A portion of a relative balanced and complementary-symmetrical arrangement utilizing a center shielding pathway designated 8“XX”-“X”M is adapted in the arrangement as the fulcrum of balanced conductive portions in a co-planar variant. A pathway arrangement including at least a first and a second plurality of pathways, wherein the first plurality has at least one pair of pathways arranged electrically isolated from each other and orientated in a first complementary relationship, is illustrated.


Additionally, at least a first half of the second plurality is arranged electrically isolated from a second half of the second plurality, wherein at least two pathways of the second plurality are electrically isolated from the pathways of first plurality. The pathway arrangement may also include a material having properties, such as dielectric, ferromagnetic, or varistor for example, spacing apart pathways of the pathway arrangement. The pathways of the first half of the second plurality are electrically coupled to one another, and the pathways of the second half of the second plurality are electrically coupled to one another. A total number of pathways of the first half of the second plurality may be an odd number greater than one, and a total number of pathways of a second half of the second plurality may also be an odd number greater than one. According to an aspect of the present invention, the pathways of the first half of the second plurality are positioned in a first superposed alignment, while the pathways of the second half of the second plurality are positioned in a second superposed alignment, with the first and second superposed alignments in a mutual superposed alignment herein defined as a co-planar arrangement.


In a non co-planar arrangement, the pathways of the first half of the second plurality may be positioned in a first superposed alignment, and the pathways of the second half of the second plurality may be positioned in a second superposed alignment, with the first and second superposed alignments in arrangement one atop the other. In one arrangement, at least four pathways are electrically isolated.


An illustrative embodiment of the present invention may include at least three pluralities of pathways, including a first plurality of pathways and a second plurality of pathways. The first and second pluralities of pathways may include pathway members of the first plurality having an equal and opposite pathway member found in the second plurality of pathways. Members of the first and second pluralities of pathways may be substantially the same size and shape, and may be positioned complementary, and may also operate in an electrically complementary manner. Thus, the pairings of the first and second pluralities of pathways may result in identical numbers of members of the first and second pluralities of pathways. An exemplary embodiment may provide at least a first and a second shield allowing for development of individual isolated low circuit impedance pathways. Structurally, the shields may be accomplished by a third plurality of pathways and a fourth plurality of pathways. Each shielding plurality may include shields of equal size and shape. Each of the third and fourth plurality of pathways may be conductively coupled. Conductive coupling may be accomplished by a variety of methods and materials known to those possessing an ordinary skill in the pertinent arts. Thus, when the third and a fourth plurality are grouped as two sets of shields utilizing the first and second plurality receiving shielding, the third and fourth pluralities may be coupled to a common pathway to develop a low circuit impedance pathway for energy propagation for conditioning of the circuit energy.


Pathways may additionally be arranged in a bypass arrangement, such that when placed face to face, main-body pathways 80 may be aligned superposed, with the exception of any pathway extensions such as 812NNE, 811NNE, 812SSW and 811SSW of the lower sub-circuit portion, for example, shown as mirror images depicted in FIG. 5A and FIG. 5B, for example.


Within the pluralities, individual pathway members may be of substantially the same size and shape and may be conductively coupled. However, individual pathway members of one plurality may not be conductively coupled to members of a different plurality of pathways.


There may be situations wherein members of one plurality may be connected to members of a different plurality, such as wherein a first plurality of shields and a second plurality of shields are externally coupled to the same conductor.


Common elements may include energy flow in accordance with conceptual energy indicators 600, 601, 602, 603 depicting the dynamic energy movements in co-planar shielded by-pass pathways, such as those shown in FIG. 1A-1C. An embodiment may provide for at least multiple shields for development of multiple isolated low circuit impedance pathways for multiple circuits.


Referring still to FIG. 1A, pathways may be shielded by the relative, common pathways, and may include a main-body pathway 80 with at least one pathway extension 812“X”. The shields shown include a main-body shield pathway 81 with at least one pathway extension designated 99“X”/79“X”. The shields may sandwich and envelope the main-body 799, including a conductive inner pathway formed of conductive materials from the family of noble or base metals traditionally used in co-fired electronic components or conductive material, such as Ag, Ag/Pd, Cu, Ni, Pt, Au, Pd, or combination materials such as metal oxide and glass frit. A capacitance and a resistance value may be achieved in one family of pathways, as described hereinabove, such as by use of ruthenium oxide as the resistive material and Ag/Pd as the conductive material. Further, variations in pathway geometry may yield different resistance and capacitance values. Variations may be achieved by altering the materials from which the pathways are made. For example, a conductive metal, such as silver, may be selectively added to the metal oxide/glass frit material to lower the resistance of the material.


A plurality of pathways, 865-1 and 865-2, are shown positioned co-planar and spaced apart on a same portion of material 801. Each pathway of the co-planar pathways 865-1 and 865-2, may be formed of conductive material 799, or a hybrid of conductive material and another material, herein designated as 799“x”. Each co planar pathway 865-1 and 865-2 may also be formed as a bypass pathway, wherein each pathway includes a main-body pathway 80 having a corresponding main-body edge and perimeter, 803A and 803B, respectively and at least one pathway contiguous extension 812“X”. Each co-planar pathway 865-1 and 865-2, may include at least one pathway contiguous extension 812SSW and 811SSW with a portion of the main-body edge 803A and 803B extending therefrom. Extension 812“X” is a portion of the pathway material formed in conjunction with a main-body pathway 80 from which it extends. Main-body pathway 80, an 812“X” may be found as an extension of material 799 or 799“x” extending beyond an accepted average perimeter edge 803“X”. Extensions 812“X” and 79“X” may be found respectively positioned as a contiguous portion of the pathway from which it is formed. Each main-body pathway may have edge 803A, 803B positioned relative and spaced apart a distance 814F from the embodiment edge 817. Embodiment edge 817 may include a material 801. Co-planar main-body pathway's edge 803“x” may be positioned and spaced apart a distance 814J. Pathway extensions 812SSW and 811SSW may conductively couple a respective pathway main-body 80 to an outer pathway 890SSW and 891 SSW, which may be positioned at edge 817. The co-planar arranged, main-body pathway 80 may be positioned “sandwiched” between the area of registered coverage of two layering of co-planar, main-body pathway 81s.


Combining mutually opposing fields causes a cancellation or minimization effect. The closer the complementary, symmetrically oriented shields, the better the resulting mutually opposing cancellation effect on opposing energy propagation. The more superposed the orientation of the complementary, symmetrically oriented shields is, the better the resulting suppression of parasitics and cancellation effect.


Referring still to FIG. 1A, the edges of the plurality of co-planar shields may be represented by dotted lines 805A and 805B. Main-body pathways 81 of each of the plurality of shields are larger than a sandwiching main-body pathway 80 of any corresponding sandwiched pathway. This may create an inset area 806 relative to the positions of the shields and remaining pathways. The size of main-bodies 80 and 81 may be substantially similar, and thus the insetting positioning relationships may be minimal in certain embodiments. Increased parasitic suppression may be obtained by insetting pathways, including a main-body 80, to be shielded by larger pathway main-body 81s. For example, an inset of a main-body 80 of pathways 865-1 inset may be separated a distance of 1 to 20+ times the spacing provided by the thickness of the material 801 separating pathway 865-1 and adjacent center co-planar pathway 800-1-IM, as illustrated in FIG. 1B.


Plurality of co-planar shield edges 805A and 805B may be positioned and spaced apart a distance 814K, and may be a distance 814 relative to edges 805A and 805B and the edge 817. Other distances 814J relative from either edges 803A and 803B may be provided.


Further, distance 814F may be present between one 803“X” and an edge 817. Each co-planar shield may include a plurality of contiguous pathway extension portions, such as, for example, portions 79NNE, 79SSE, 99NNE and 99SSE, extending from the plurality of co-planar shield edges 805A and 805B. Plurality of co-planar shields may include a plurality of outer pathway material 901 NNE, 901 SSE, 902NNE and 902SSE positioned at the edge 817.


Conceptual energy indicators 602 represent the various dynamic energy movements within the co-planar pathways 865-1 and 865-2. Unwanted energy may be transferred to the co-planar shields in accordance with the provision by the shields providing for a low impedance pathway, which shields may additionally be electrically coupled to another pathway or conductive area.


Referring now to FIGS. 1B and 1C, layer sequences are illustrated for a first plurality of co-planar pathways 865-1, 865-2, a second plurality of co-planar pathways 855-1, 855-2, and a third plurality of co-planar pathways 825-1-IM, 825-2-IM, 815-1, 815-2, 800-1-IM, 800-2-IM, 810-1, 810-2, and 820-1-IM, 820-2-IM. The first, second, and third pluralities may be stacked to form an embodiment 3199, 3200, 3201. The third plurality of co-planar pathways may provide shielding. Main-bodies 81 of the plurality of co-planer shields 825-1-IM, 825-2-IM; 815-1, 815-2; 800-1-IM, 800-2-IM; 810-1, 810-2; and 820-1-IM, 820-2-IM may be substantially similar in size and shape, and may be spaced apart in co-planar locations on different layers of material 801. The first plurality of co-planar pathways 865-1 and 865-2 may have at least the corresponding, opposing, and complementary second plurality of co-planar pathways 855-1 and 855-2. These first and second pluralities of co-planar pathways, when oriented face to face, may have main-body pathways 80s co-registered and aligned except for the various contiguous pathway extensions 812“X”, 811“X”. As shown in FIGS. 1B and 1C, a pair of outer co-planar pathways 820-1-IM, 825-1-IM may serve as pathway shields, thereby improving the shielding effectiveness of the other conductively coupled pluralities of pathways with a main-body 81s.


As illustrated in the varied embodiments 3199, 3200, 3201, the location of extensions 79NNE, 79SSE, of shields 825-1-IM, 815-1, 800-1-IM, 810-1, and 820-1-IM and extensions 99NNE, 99SSE of the shields 825-2-IM, 815-2, 800-2-IM, 810-2, and 820-2-IM, may be varied. In FIG. 1B, for example, extensions 79NNE and 99NNE may be arranged spaced apart, diagonally from extensions 79SSE and 99SSE and on opposite sides of shield main-body 81. In FIG. 1C, for example, extensions 79NNE and 99NNE may be arranged spaced apart in line with extensions 79SSE and 99SSE on opposite sides of shield main-body 81. In FIG. 1B, extensions 812NNE and 811NNE may be arranged spaced apart, extending toward the same edge 812 of layer of material 801, and extensions 812SSW and 811 SSW may be arranged spaced apart, each extending toward the opposite edge 812 of layer of material 801. In FIG. 1C, pathways 865-1 and 865-2 may be mirror images, as discussed hereinabove. Comparably to FIG. 1B, extensions 812NNE and 811NNE may be arranged spaced apart, extending toward opposite edges 817 of layer of material 801. Extensions 812SSW and 811SSW may be arranged spaced apart, extending toward the opposite edge of layer of material 801, such that extensions 812NNE and 811 SSW extend toward opposite edges 812“X” of the respective layer of material 801.


Referring now to FIGS. 2A and 2B, FIG. 2A illustrates a schematic plan view of an embodiment of FIG. 2B according to an aspect of the present invention. FIG. 2B depicts a pathway arrangement including a layout of a first, a second, a third, a fourth, a fifth, a sixth, a seventh, a eighth, a ninth and a tenth pathway, wherein at least the third and the fourth pathway, for example, may be co-planar and arranged spaced apart from each other. FIG. 2B illustrates the first and the second pathway arranged below the third and the fourth pathway, and the fifth and the sixth pathway arranged above the third and the fourth pathway, and the seventh and the eighth pathway arranged above the fifth and the sixth pathway, and the ninth and the tenth pathway, arranged above the seventh and the eighth pathway. These pathways have various respective internal contiguous pathway extensions 812“X”, 811“X”, 79“X” and 99“X”, and may be discrete components having the same minimal numbers of layering.


Internal contiguous pathway extensions 812“X”, 811“X”, 79“X” and 99“X”, and conductively coupled external pathways 890“X”, 891“X” 802“X” and 902“X”, may be coupled to the inner pathway of the plurality of co-planar pathways of the main-body pathway 80 and 81.


Referring now to FIGS. 3A and 3B, in FIG. 3A there is shown a schematic plan view of an embodiment of FIG. 3B, wherein outer pathways may be selectively conductively coupled in at least two isolated circuit portions. FIG. 3B depicts an pathway arrangement including a minimal layout of a first, a second, a third, a fourth, a fifth, a sixth, a seventh, a eighth, a ninth and a tenth pathway, wherein at least the third and the fourth pathway, for example, are co-planar and arranged spaced apart from each other. The device shown in FIG. 3B may have the first and the second pathway arranged below the third and the fourth pathway, and the fifth and the sixth pathway arranged above the third and the fourth pathway, and the seventh and the eighth pathway arranged above the fifth and the sixth pathway, and the ninth and the tenth pathway arranged above the seventh and the eighth pathway. These pathways have various respective internal contiguous pathway extensions 812“X”, 811“X”, 79“X” and 99“X”, and may be discrete components having the same minimal number of layering.


Referring now to FIG. 3C, a plan view of a shield according to an aspect of the present invention is illustrated. The embodiment depicted in FIG. 3C includes at least one additional pathway, as compared to the device of FIG. 3B. This additional pathway 1100-IM“X” may be one of at least a plurality of shields in the stack of pathways, which shields may span across the two circuit portions. Pathway 1100-IM“X” may be one of at least two outer sandwiching shields in the stack of pathways. Shields may span across the two circuits by adding a centrally arranged 1100-IM“X” pathway electrically coupled to the outer 1100-IM“X” shields.


Pathways 1100-IM“X” may have at least one extension, and are illustrated with two extensions 1099E and 1099W, and may allow for sandwiching shields for all of the pathways within the present invention. At least three shields may be coupled together and may include a centering shield dividing an energy load or energy source of an isolated circuit or dividing two isolated circuits.


A shield 00GS may be electrically isolated from other shields and may be arranged to effect an energy propagation of an isolated circuit. An isolated circuit may be sandwiched by a shield. A shield may be electrically coupled to a conductive area that is isolated from any other conductive areas thereby effecting an energy propagation.



FIGS. 4A-4I depict assembled components of various embodiments according to aspects of the present invention. The arrangements of FIG. 4A to FIG. 4I may include minimal layouts of a first, a second, a third, a fourth, a fifth, a sixth, a seventh, a eighth, a ninth and a tenth pathway, wherein at least the third and the fourth pathway, for example, are co-planar and arranged spaced apart from each other. The first and the second pathway may be arranged below the third and the fourth pathway, and the fifth and the sixth pathway may be arranged above the third and the fourth pathway, and the seventh and the eighth pathway may be arranged above the fifth and the sixth pathway, and the ninth and the tenth pathway may be arranged above the seventh and the eighth pathway. These pathways have various respective internal contiguous pathway extensions 812“X”, 811“X”, 79“X” and 99“X”, and may be an assembled final discrete component, for example.


Referring to FIG. 5A, there is shown a stacking of multiple, non-shared circuits including groups of pathways according to an aspect of the present invention. Included in FIG. 5A is a marker 1000 showing a continuation of the stacking arrangement to the next column of FIG. 5A. Conceptual energy indicators 600,601, 602,603 indicate energy flow.


Material 799 may be deposited on material 801 for component 6900 shields designated 815-1, 800-1-IM, 810-1, 815-2, 800-2-IM, and 810-2. Shields 810-A and 810-B are separated shields of at least part of an isolated circuit system. Shields 815-A and 815-B are separated shields of at least part of an isolated circuit system. Shields 800-A and 800-B are separated shields of at least part of an isolated circuit system. Shields 835-A and 835-B are separated shields of at least part of an isolated circuit system. Conductors 855-1 and 855-2 are separated and shielded pathways in bypass configuration. Conductors 865-1 and 865-2 are separated and shielded pathways in bypass configuration. In FIG. 5A, a pathway arrangement is depicted including at least six orientations of pathways of two types of pathways, wherein each orientation of the pathways of the at least six orientations of pathways provides conductive isolation from the remaining orientations of pathways.


Referring to FIG. 5B, there is shown a stacked shield structure according to an aspect of the present invention. FIG. 5B depicts an embodiment similar to that of FIG. 5A, wherein two sets of 855“X” and 865“X” pathways are omitted for purposes of clarity, and wherein the shields of FIG. 5A are oriented in flip-flop for each relative set of 855“X” and 865“X” pathways. The 79“X” pathway extensions may be rotated 90 degrees relative to the various pathway extensions 811“x” and 812“X”. A dynamic result of this configuration, as illustrated by the conceptual energy indicators, may be enhanced by nulling the extensions of the two sets of 855“X” and 865“X” pathways of the two isolated circuits, and by relatively positioning the shield of each isolated circuit pairing 855A and 865A approximately 90 degrees null to the various pathway extensions of 855B and 865B.


Referring to FIG. 5B, there is shown a stacked shield structure according to an aspect of the present invention. FIG. 5B depicts an embodiment similar to that of FIG. 5A, wherein two sets of 855“X” and 865“X” pathways are omitted for purposes of clarity, and wherein the shields of FIG. 5A are oriented in flip-flop for each relative set of 855“X” and 865“X” pathways. The 79“X” pathway extensions may be rotated 90 degrees relative to the various pathway extensions 811“x” and 812“X”. A dynamic result of this configuration, as illustrated by the conceptual energy indicators, may be enhanced by nulling the extensions of the two sets of 855“X” and 865“X” pathways of the two isolated circuits, and by relatively positioning the shield of each isolated circuit pairing 865B and 865A approximately 90 degrees null to the various pathway extensions of 865B and 865A.


As discussed hereinabove, in an embodiment of the present invention, multiple complementary or paired shielded pathways may include the first and second pluralities of pathways. Energy may utilize the various paired, feed-through or bypass pathway layers in a generally parallel and even manner, for example. Pathway elements may include non-insulated and conductive apertures, and conductive through-VIAs, to provide propagating energy and maintain a generally non-parallel or perpendicular relationship, and additionally maintain a separate electrical relationship with an adjoining circuit. These pathways may maintain balance internally, and may facilitate an electrical opposition along opposing complementary pairings. This relationship among complementary pairs of pathways may occur while the pathways and the energy are undergoing an opposite operational usage within the shielding structure attached externally.


Referring now to FIG. 5C, there is shown a relative plan view of a stacked multiple, non-shared circuit network having VIAs and including groups of pathways according to an aspect of the present invention. The device according to an aspect of the present invention depicted in FIG. 5C includes a hole-through energy conditioner. Hole-through energy conditioners may be formed such that many of the energy propagation principals disclosed herein are retained, including the use of multiple sets of shields for energy conditioning possessing. FIG. 5C, further depicts null pathway sets with pathway arrangement 6969.


Pathway arrangement 6969 is similar to FIG. 5B, with the absence of pathway extensions 79“X”, 811“x” and 812“X”, and with the substitution of 8879“X”, 8811“X” and 8812“X” VIAs functioning from a different direction relative to the main-body 80 and 81.


Referring still to FIG. 5C, during the manufacturing process, conductive holes 912, VIAS or conductive apertures may be used to interconnect 8806 an integrated circuit, and may be formed through one or more pathway layers using mechanical drilling, laser drilling, etching, punching, or other hole formation techniques. Each specific interconnection 8806 may enable various pathways to be electrically connected or insulated. Each specific interconnection 8806 may extend through all layers of pathway arrangement 6969, or may be bounded above or below by one or more layers. Pathway arrangement 6969 may include an organic substrate, such as an epoxy material, or patterned conductive material. If an organic substrate is used, for example, standard printed circuit board materials such as FR-4 epoxy-glass, polymide-glass, benzocyclobutene, Teflon, other epoxy resins, or the like could be used in various embodiments. In alternate embodiments, a pathway arrangement could include an inorganic substance, such as ceramic, for example. In various embodiments, the thickness of the levels may be approximately 10-1000 microns. Interconnections 8806 between the various conductive layers may also be formed by selectively removing dielectric and conductive materials, thereby exposing the conductive material of the lower conductive layers 904 (not shown), and by filling the holes so formed by the removal with a conductive paste 799A or electrolytic plating 799B, for example.


Interconnections 8806 may couple exposed conductive layers to a relative side of the pathway arrangement 6969. Interconnections 8806 may take the form of pads or lands to which an integrated circuit may be attached, for example. Interconnections 8806 may be formed using known techniques, such as by filling the selectively removed portions of dielectric with conductive paste, electrolytic plating, photolithography, or screen printing, for example. The resulting pathway arrangement 6969 includes one or more layers of patterned conductive material 799, separated by non-conducting layers, and interconnected by interconnects 8806. Different techniques may be used to interconnect and isolate the various layers of patterned conductive material 799. For example, rather than forming and selectively removing portions of the various conducting 799 and non-conducting layers 801, openings between the various layers may be included by selectively adding the desired portions of the conducting 799 and non-conducting layers 801. Removal techniques, such as chemical mechanical planarization, may be used to physically abrade away multiple layers of different types of conducting and non-conducting materials, resulting in the desired openings for various interconnects.


Pathway arrangement 6969 may be configured using a multi-aperture, multilayer energy conditioning pathway set, with a substrate format adapted to condition propagating energy. Pathway arrangement 6969 may condition propagating energy by utilizing a combined energy conditioning methodology of conductively filled apertures, known in the art as VIAs 8879“X”, 8811“X” and 8812“X”, in combination with a multi-layer common conductive Faraday cage-like shielding technology with immured propagational pathways.


Interconnecting pathway arrangement and an IC may be achieved with wire bonding interconnection, flip-chip ball-grid array interconnections, microBall-grid interconnections, combinations thereof, or any other standard industry accepted methodologies. For example, a “flip chip” type of integrated circuit, meaning that the input/output terminations as well as any other pathways on the chip may occur at any point on its surface. After the IC chip is prepared for attachment to pathway arrangement 6969, the chip may be flipped over and attached, by solder bumps or balls to matching pads on the top surface of pathway arrangement 6969. Alternatively, an integrated circuit may be wire bonded by connecting input/output terminations to pathway arrangement 6969 using bond wires to pads on the top surface of pathway arrangement 6969.


The circuits within pathway arrangement 6969 may act as a source to load pathway arrangement requiring capacitance, noise suppression, and/or voltage dampening. This capacitance may be provided by formation of the capacitance developed and embedded within pathway arrangement 6969. This capacitance may be coupled to the integrated circuit loads using a paired pathway and the shield, as described above. Additional capacitance may be provided to a circuit electrically coupled to an integrated circuit to provide voltage dampening and noise suppression. Close proximity of off-chip energy sources may provide a capacitance each along the low inductance path to the load. Common shielding pathways may be utilized as the “0” voltage circuit reference node for both off-chip energy sources the common conductive interposer energy pathway configurations.


Pathway arrangement 6969 may be connected to an integrated circuit by commonly accepted industry connection methods and couplings 799A and 799B, including Bumpless Build-Up Layer (BBUL) packaging. This technology enables higher performance, thinner and lighter packages, and lowers power consumption. In a BBUL package, the silicon die or IC is embedded in a package with a pathway arrangement operable as a first level interconnect.


Thus, the BBUL package as a whole is not just attached to one surface of the IC. For example, electrical connections between the die and one or more of the various shields and the package may be made with copper lines, not necessarily C4 solder bumps. These features combine to make the package thinner and lighter than other IC packages, while delivering higher performance and reducing power consumption. BBUL may enhance the ability of a manufacturer to couple multiple silicon components to pathway arrangement 6969.


Shielded pathways 8811, 8812, and 8879 may be electrically connected between respective energy sources and respective load of the IC by common industry methodologies, thereby allowing for conditioning of propagating energy. Shields 8879 may conductively coupled to a shield including 1055-2. A shield and its other conductive portions including 8811 and 8812 may be electrically coupled to a respective complementary pathway which poses no polarity charge of significance before hook-up, thereby preventing each layer 8811 and 8812 from changing energy propagation direction functions, such preventing layer 8811 and 8812 from changing from input and output to output and input, respectively, as is understood by those possessing an ordinary skill in the pertinent arts.


For stacked variants depicted in FIGS. 5A, 5B and 5C, adding three pathways 110000-IM-“X”, including one between 810-1 and 815-2, designated as 1100-IM-“C”, may bisect a balanced symmetry of the total number of pathways located into equal numbers on opposite sides of 1100-IM-“C”. The addition of 1100-IM-1 and 1100-IM-2, electrically coupled to 1100-IM-C, creates a common or a shield structure (not all shown). Shields of a shield structure may be of substantially the same size or not. Shields may or may not be physically isolated from any other shields for any one or more embodiments of the present invention. Thus, shields may or may not be electrically or conductively isolated from any other shields for any one or more embodiments of the present invention.


An odd number of shields may be coupled together thereby allowing formation of a common reference or node utilizing all other shields. The number of shields 1100-IM-“X” is not confined to using extensions 1099E and 1099W such as shield 00GS, as any number of extensions in almost any direction may be used to facilitate a coupling. A relative balanced and complementary-symmetrical arrangement may be formed with respect to a center shield 8“XX” or shield 800/800-IM for a arrangement fulcrum of balanced conductive portions. At least a partial flux field cancellation of energy propagating along or between paired and electrically opposing complementary pathways occurs in this balanced but shifted embodiment. Further, simultaneous stray energy parasitics, complementary charged suppression, physical and electrical shielding containment and a faraday effect may also occur. This result is achieved because the magnetic flux energies travel at least partially along the shield wherein the RF return path is parallel and adjacent to a corresponding pathway. Thus, the magnetic flux energy may be measured or observed relative to a return. Shifted pathways may be in relative balance and complementarily and symmetrically positioned with respect to center shields, such as shields 800/800-“X”-IM, and may include a relatively shifted, balanced, complementary, and symmetrical arrangement of predetermined shields and pathways complementarily sandwiched around a centrally positioned shield, such as 800/800-IM, for example.


The exemplary embodiments of FIGS. 1A, 1B, 1C, through FIG. 4I, for example may include these ‘shifted’ embodiments. These shifted embodiments may include a multiplicity of layers having a shielding, a pathway, a shielding, a pathway, and a shielding. Each of these multiplicity of layers may be centered and complementary about a center shield 800/800-“X”-IM, such as for co-planar variants, and the entire multiplicity of layers may be centered about a main center shield. Complementarity and balance may be maintained about the center shield, and the main center shield, although individual shields may be shifted to create discrete imbalances as between a given matched pathway pair, for example. Shifting may expose a portion of at least one pathway outside the perimeter of the superposed shielding, thereby allowing for parasitics and thereby varying, for example, impedance characteristics.


For example, a given pathway may be shifted 5 points to the left. This shifting may be accounted for in the matched pairs about a center shield, and, consequently, either an adjacent matched pair pathway of opposing polarity may be shifted 5 points, or 5 adjacent pathways of opposite polarity may each shift 1 point, thereby maintaining complementarity and balance. Further, pathways may remain within the perimeter of the superposed shielding, and nonetheless be shifted thereunder. Such a shifting under the shielding may, nonetheless, make desirable a balancing. However, certain exemplary embodiments not shown may include situations wherein pathways are pulled toward the center of a shield, and remain under the shield evidencing differing electrical characteristics, such as inductive behavior, in a balanced or unbalanced state.


Referring now to FIG. 6, there is shown a stacked multiple circuit including embodiment 6900, conductive energy pathways, isolated energy sources, isolated energy-utilizing loads, and isolated common conductive pathways. The conductive energy pathways may be conductively coupled to embodiment 6900 by a conductive coupling material, such as, for example, by a solder or industry equivalent. Vias 315, conductive pathways continuing below the surface of the substrate, may couple to the conductive pathways, and may include conductive material that serves as a contiguous conductive pathway for propagating energies. The isolated common conductive pathways may not be directly coupled to the isolated energy sources or the isolated energy-utilizing loads. As discussed hereinabove, embodiment 6900 may include four pluralities of pathways including electrodes and shields, with each plurality electrically isolated. The shields may be conductively coupled. The conductively coupled shields may be externally coupled to an isolated common conductive pathway, which is not directly conductively coupled to the electrodes, using a conductive coupling material. As shown in FIG. 6 an electrode, 815-1, 800-1-IM and 810-1, may be conductively coupled to 802GA, 802GB. A shield, 815-2, 800-2-IM, and 810-2, may be conductively coupled to 902GA and 902 GB. These couplings may not be conductively coupled to the first plurality of electrodes or the second plurality of electrodes. In this configuration, both isolated circuits may be utilizing the isolated and separate voltage references and an isolated common impedance path such as REF 1 and REF 2 in FIG. 6.


Referring now to FIG. 7, there is shown a stacked co-planar multiple circuit including embodiment 3210, conductive energy pathways, isolated energy sources, isolated energy-utilizing loads, and isolated common conductive pathways. The conductive energy pathways may be conductively coupled to embodiment 3210 by a conductive coupling material. Vias 315, conductive pathways continuing below the surface of the substrate, may couple to the conductive pathways and may include conductive material that serves as a contiguous conductive pathway for propagating energies. The isolated common conductive pathways may not be directly coupled to the isolated energy sources or the isolated energy-utilizing loads. As discussed hereinabove, embodiment 3210 may include four pluralities of pathways including electrodes and shields, with each plurality electrically isolated. The conductively coupled shields may be externally coupled to an isolated common energy pathway, which is not directly conductively coupled to the first or the second plurality of electrodes in this co-planar arrangement. A third plurality of electrodes, 815-1, 800-1-IM and 810-1 may be conductively coupled to 802GA, 802 GB, 815-2 and 800-2-IM, and also, may be conductively coupled to 902GA, 902 GB, and may not be conductively coupled to the first plurality or the second plurality. In this configuration, both isolated circuits may be utilizing a separate and a respective isolated and separate voltage reference and a separate and a respective isolated impedance path, a separate and a respective isolated common impedance path and at least one separate and respective low inductance pathway such as REF 1 and REF 2 in FIG. 7.


Referring now to FIG. 4A thru to FIG. 7, the termination electrodes 890A, 890B, and 891A, 891 B, 802GA, 802GB, and 902GA, 902GB, may be monolithic or multi-layered.


Termination electrodes 802GA, 802GB, 902GA, 902GB, may be located at other respective portions of a sintered body. Each main body electrode layers 81 or 80, and the associate electrode extensions 99/79G“X” or 812“X”, may define an electrode which extends to, and conductively couples to, the associated termination electrodes 802GA, 802GB, 902GA, 902GB and 890A, 890B, and 891A, 891B.


The present invention may be utilized for many energy conditioning functions that utilize commonly coupled shielding structure element for emulating a center tap of resistor/voltage divider network. This resistor/voltage divider network may be normally constructed using a ratio of various integrated circuit resistors. However, various integrated circuit resistors may be replaced by a device according to an aspect of the present invention, the device utilizing, for example, specific conductive/resistive materials 799A or naturally occurring resistance properties of pathway material 799, or utilizing a varied physical layout.


A voltage dividing function may be present as portions of a common and shared pathway shield structure are utilized to define a common voltage reference located at both respective sides of the common pathway shield structure.


In embodiments, whether initially stacked vertically during a manufacturing process, or in combination with a co-planar pairings as described hereinabove, the number of complementary pathways pairings may be multiplied in a predetermined manner to create a number of pathway element combinations of a generally physically or electrically parallel nature.


Further, although not shown, a device of the present invention may be fabricated in silicon and directly incorporated into integrated circuit microprocessor circuitry or microprocessor chip packaging. Any suitable method for depositing electrically conductive materials may be used, such as plating, sputtering, vapor, electrical, screening, stenciling, vacuum, and chemical including chemical vapor deposition (CVD).


While certain embodiments have been herein described in position as “upper” or “above”, or “lower” or “below”, or any other positional or directional description, it will be understood that these descriptions are merely relative and are not intended to be limiting.


The present invention may be implemented in a number of different embodiments, including a energy conditioning embodiment as an energy conditioner for an electronic assembly, an energy conditioning substrate, an integrated circuit package, an electronic assembly or an electronic system in the form of a energy conditioning system, and may be fabricated using various methods. Other embodiments will be readily apparent to those of ordinary skill in the art.

Claims
  • 1. A conductive architecture comprising: 1.] a substrate;2.] three conductor plates including: (1) a first conductor plate,(2) a second conductor plate that is spaced apart from the first conductor plate, and(3) a third conductor plate that is spaced apart from both the first and second conductor plates, and wherein the three conductor plates are (a.) parallel to one another,(b.) conductively connected to one another,(c.) together vertically stacked such that the second conductor plate is located 1) below the first conductor plate,2) above the third conductor plate, and3) between the first and third conductor plates,(4) each at least partially embedded within the substrate;3.] a first grouping of four individual structurally aligned conductors, and wherein the four individual structurally aligned conductors of the first grouping are (1) each physically aligned in close proximity to at least one of the other individual structurally aligned conductors of the first grouping,(2) each physically positioned in a side by side arrangement to at least one of the other individual structurally aligned conductors of the first grouping within the space between the first and second conductor plates;4.] a second grouping of four individual structurally aligned conductors, and wherein the four individual structurally aligned conductors of the second grouping are (1) each physically aligned in close proximity to at least one of the other individual structurally aligned conductors of the second grouping,(2) each physically positioned in the side by side arrangement to at least one of the other individual structurally aligned conductors of the second grouping within the space between the second and third conductor plates;5.] a third grouping of four individual structurally aligned conductors, and wherein the four individual structurally aligned conductors of the third grouping are (1) each physically aligned in close proximity to at least one of the other individual structurally aligned conductors of the third grouping,(2) each physically positioned in a side by side arrangement to at least one of the other individual structurally aligned conductors of the third grouping within the space between the first and second conductor plates;6.] a fourth grouping of four individual structurally aligned conductors, and wherein the four individual structurally aligned conductors of the fourth grouping are (1) each physically aligned in close proximity to at least one of the other individual structurally aligned conductors of the fourth grouping,(2) each physically positioned in the side by side arrangement to at least one of the other individual structurally aligned conductors of the fourth grouping within the space between the second and third conductor plates;[A the three conductor plates are each parallel to all of the individual structurally aligned conductors,[B the three conductor plates are each larger in size than any one of the individual structurally aligned conductors,[C the individual structurally aligned conductors are embedded within the substrate,[D each individual structurally aligned conductor belongs to only one of the first, second, third, and fourth groupings,[E each of the individual structurally aligned conductors of the first, second, third and fourth groupings is a respective structurally straight elongated conductor portion of a respective larger, individual structurally elongated conductor of the conductive architecture,[F each of the individual structurally aligned conductors of the first, second, third and fourth groupings belongs to a different respective larger, individual structurally elongated conductor of the conductive architecture,[G none of the three conductor plates are conductively attached to any of the respective larger, individual structurally elongated conductors,[H the respective larger, individual structurally elongated conductors are each at least partially embedded within the substrate such that within the substrate, the respective larger, individual structurally elongated conductors are each conductively isolated from one another,[I the individual structurally aligned conductors of the first and second groupings are aligned parallel to one another such that all of the individual structurally aligned conductors of the first and second groupings are arranged together in the same physically longitudinal structure orientation,[J each of the individual structurally aligned conductors of the first grouping is vertically aligned to only one corresponding individual structurally aligned conductor of the second grouping and each of the individual structurally aligned conductors of the second grouping is vertically aligned to only one corresponding individual structurally aligned conductor of the first grouping, such that the first and second groupings both include [1] a respective first individual structurally aligned conductor such that both respective first individual structurally aligned conductors of the first and second groupings together are [a] physically shielded one another by the second conductor plate located therebetween, and[b] in a first superposed structurally aligned conductor arrangement,[2] a respective second individual structurally aligned conductor such that both respective second individual structurally aligned conductors of the first and second groupings together are [a] physically shielded one another by the second conductor plate located therebetween, and[b] in a second superposed structurally aligned conductor arrangement,[3] a respective third individual structurally aligned conductor such that both respective third individual structurally aligned conductors of the first and second groupings together are [a] physically shielded one another by the second conductor plate located therebetween, and[b] in a third superposed structurally aligned conductor arrangement,[4] a respective fourth individual structurally aligned conductor such that both respective fourth individual structurally aligned conductors of the first and second groupings together are [a] physically shielded one another by the second conductor plate located therebetween, and[b] in a fourth superposed structurally aligned conductor arrangement,[K the individual structurally aligned conductors of the third and fourth groupings are aligned parallel to one another such that all of the individual structurally aligned conductors of the third and fourth groupings are arranged together in the same physically longitudinal structure orientation,[L each of the individual structurally aligned conductors of the third grouping is vertically aligned to only one corresponding individual structurally aligned conductor of the fourth grouping and each of the individual structurally aligned conductors of the fourth grouping is vertically aligned to only one corresponding individual structurally aligned conductor of the third grouping, such that the third and fourth groupings both include [1] a respective first individual structurally aligned conductor such that both respective first individual structurally aligned conductors of the third and fourth groupings together are [a] physically shielded one another by the second conductor plate located therebetween, and[b] in a fifth superposed structurally aligned conductor arrangement,[2] a respective second individual structurally aligned conductor such that both respective second individual structurally aligned conductors of the third and fourth groupings together are [a] physically shielded one another by the second conductor plate located therebetween, and[b] in a sixth superposed structurally aligned conductor arrangement,[3] a respective third individual structurally aligned conductor such that both respective third individual structurally aligned conductors of the third and fourth groupings together are [a] physically shielded one another by the second conductor plate located therebetween, and[b] in a seventh superposed structurally aligned conductor arrangement,[4] a respective fourth individual structurally aligned conductor such that both respective fourth individual structurally aligned conductors of the third and fourth groupings together are [a] physically shielded one another by the second conductor plate located therebetween, and[b] in an eighth superposed structurally aligned conductor arrangement.
CROSS REFERENCE TO RELATED APPLICATIONS

This application is a continuation of application Ser. No. 13/195,495, filed Aug. 1, 2011, which is a continuation of application Ser. No. 13/079,789, filed Apr. 4, 2011, now issued as U.S. Pat. No. 8,023,241, which is a continuation of application Ser. No. 12/749,040, filed Mar. 29, 2010, now issued as U.S. Pat. No. 7,920,367, which is a continuation of application Ser. No. 12/030,253, filed Feb. 13, 2008, now issued as U.S. Pat. No. 7,688,565, which is a continuation of application Ser. No. 10/479,506, filed Dec. 10, 2003, now issued as U.S. Pat. No. 7,336,468, which is a U.S. National Stage Application of International Application PCT/US02/21238, filed Jul. 2, 2002, which is a continuation-in-part of application Ser. No. 10/023,467, filed Dec. 17, 2001, now abandoned, which is a continuation-in-part of application Ser. No. 09/996,355, filed Nov. 29, 2001, now abandoned, which is a continuation-in-part of application Ser. No. 10/003,711, filed Nov. 15, 2001, now abandoned, which is a continuation-in-part of application Ser. No. 09/982,553, filed Oct. 17, 2001, now abandoned; and this application is a continuation of application Ser. No. 13/195,495, filed Aug. 1, 2011, which is a continuation of application Ser. No. 13/079,789, filed Apr. 4, 2011, now issued as U.S. Pat. No. 8,023,241, which is a continuation of application Ser. No. 12/749,040, filed Mar. 29, 2010, now issued as U.S. Pat. No. 7,920,367, which is a continuation of application Ser. No. 12/030,253, filed Feb. 13, 2008, now issued as U.S. Pat. No. 7,688,565, which is a continuation of application Ser. No. 10/479,506, filed Dec. 10, 2003, now issued as U.S. Pat. No. 7,336,468, which is a continuation-in-part of application Ser. No. 10/115,159, filed Apr. 2, 2002, now issued as U.S. Pat. No. 6,894,884, which is a continuation-in-part of application Ser. No. 09/845,680, filed Apr. 30, 2001, now issued as U.S. Pat. No. 6,580,595, which is a continuation-in-part of application Ser. No. 09/777,021, filed Feb. 5, 2001, now issued as U.S. Pat. No. 6,687,108, which is a continuation-in-part of application Ser. No. 09/632,048, filed Aug. 3, 2000, now issued as U.S. Pat. No. 6,738,249, which is a continuation-in-part of application Ser. No. 09/594,447, filed Jun. 15, 2000, now issued as U.S. Pat. No. 6,636,406, which is a continuation-in-part of application Ser. No. 09/579,606, filed May 26, 2000, now issued as U.S. Pat. No. 6,373,673, which is a continuation-in-part of application Ser. No. 09/460,218, filed Dec. 13, 1999, now issued as U.S. Pat. No. 6,331,926, which is a continuation of application Ser. No. 09/056,379, filed Apr. 7, 1998, now issued as U.S. Pat. No. 6,018,448, which is a continuation-in-part of application Ser. No. 09/008,769, filed Jan. 19, 1998, now issued as U.S. Pat. No. 6,097,581, which is a continuation-in-part of application Ser. No. 08/841,940, filed Apr. 8, 1997, now issued as U.S. Pat. No. 5,909,350; and application Ser. No. 10/115,159 claims the benefit of provisional Application No. 60/280,819, filed Apr. 2, 2001, provisional Application No. 60/302,429, filed Jul. 2, 2001, provisional Application No. 60/310,962, filed Aug. 8, 2001; and application Ser. No. 09/845,680 claims the benefit of provisional Application No. 60/200,327, filed Apr. 28, 2000, provisional Application No. 60/215,314, filed Jun. 30, 2000, provisional Application No. 60/225,497, filed Aug. 15, 2000, provisional Application No. 60/255,818, filed Dec. 15, 2000; and application Ser. No. 09/777,021 claims the benefit of provisional Application No. 60/180,101, filed Feb. 3, 2000, provisional Application No. 60/185,320, filed Feb. 28, 2000, provisional Application No. 60/191,196, filed Mar. 22, 2000, provisional Application No. 60/200,327, filed Apr. 28, 2000, provisional Application No. 60/203,863, filed May 12, 2000, provisional Application No. 60/215,314, filed Jun. 30, 2000, provisional Application No. 60/225,497, filed Aug. 15, 2000, provisional Application No. 60/241,128, filed Oct. 17, 2000, provisional Application No. 60/248,914, filed Nov. 15, 2000, provisional Application No. 60/252,766, filed Nov. 22, 2000, provisional Application No. 60/253,793, filed Nov. 29, 2000, provisional Application 60/255,818, filed Dec. 15, 2000; and application Ser. No. 09/632,048 claims the benefit of provisional Application No. 60/146,987, filed Aug. 3, 1999, provisional Application No. 60/165,035, filed Nov. 12, 1999, provisional Application No. 60/180,101, filed Feb. 3, 2000, provisional Application No. 60/185,320, filed Feb. 28, 2000, provisional Application No. 60/191,196, filed Mar. 22, 2000, provisional Application No. 60/200,327, filed Apr. 28, 2000, provisional Application No. 60/203,863, filed May 12, 2000, provisional Application No. 60/215,314, filed Jun. 30, 2000; and application Ser. No. 09/594,447 claims the benefit of provisional Application No. 60/139,182, filed Jun. 15, 1999, provisional Application No. 60/146,987, filed Aug. 3, 1999, provisional Application No. 60/165,035, filed Nov. 12, 1999, provisional Application No. 60/180,101, filed Feb. 3, 2000, provisional Application No. 60/185,320, filed Feb. 28, 2000, provisional Application No. 60/191,196, filed Mar. 22, 2000, provisional Application No. 60/200,327, filed Apr. 28, 2000, provisional Application No. 60/203,863, filed May 12, 2000; and application Ser. No. 09/579,606 claims the benefit of provisional Application No. 60/136,451, filed May 28, 1999, provisional Application No. 60/139,182, filed Jun. 15, 1999, provisional Application No. 60/146,987, filed Aug. 3, 1999, provisional Application No. 60/165,035, filed Nov. 12, 1999, provisional Application No. 60/180,101, filed Feb. 3, 2000, provisional Application No. 60/185,320, filed Feb. 28, 2000, provisional Application No. 60/200,327, filed Apr. 28, 2000, provisional Application No. 60/203,863, filed May 12, 2000; and application Ser. No. 10/023,467 claims the benefit of provisional Application No. 60/255,818, filed Dec. 15, 2000, provisional Application No. 60/280,819, filed Apr. 2, 2001, provisional Application No. 60/302,429, filed Jul. 2, 2001, provisional Application No. 60/310,962, filed Aug. 8, 2001; and application Ser. No. 09/982,553 claims the benefit of provisional Application No. 60/241,128, filed Oct. 17, 2000; and application Ser. No. 09/996,355 claims the benefit of provisional Application No. 60/253,793, filed Nov. 29, 2000, provisional Application No. 60/255,818, filed Dec. 15, 2000, provisional Application No. 60/280,819, filed Apr. 2, 2001, provisional Application No. 60/302,429, filed Jul. 2, 2001, provisional Application No. 60/310,962, filed Aug. 8, 2001; and application Ser. No. 10/003,711 claims the benefit of provisional Application No. 60/248,914, filed Nov. 15, 2000, provisional Application No. 60/252,766, filed Nov. 22, 2000, provisional Application No. 60/253,793, filed Nov. 29, 2000, provisional Application No. 60/255,818, filed Dec. 15, 2000, provisional Application No. 60/280,819, filed Apr. 2, 2001, provisional Application No. 60/302,429, filed Jul. 2, 2001, and provisional Application No. 60/310,962, filed Aug. 8, 2001; and PCT application No. PCT/US02/21238 claims the benefit under 35 U.S.C. 119(e) of provisional Application No. 60/302,429, filed Jul. 2, 2001, provisional Application No. 60/310,962, filed Aug. 8, 2001, provisional Application No. 60/388,388, filed Jun. 12, 2002. This application incorporates by reference the disclosure of grandparent application Ser. No. 13/079,789, which is a continuation of application Ser. No. 12/749,040, which is a continuation of application Ser. No. 12/030,253, which is a continuation of application Ser. No. 10/479,506, which is a U.S. national stage entry of PCT application No. PCT/US02/21238, filed Jul. 2, 2002, which is continuation-in-part of co-pending application Ser. No. 10/023,467, filed Dec. 17, 2001, which is a continuation-in-part of co-pending application Ser. No. 09/996,355, filed Nov. 29, 2001, which is a continuation-in-part of co-pending application Ser. No. 10/003,711, filed Nov. 15, 2001, which is a continuation-in-part of co-pending application Ser. No. 09/982,553, filed Oct. 17, 2001, each of which is incorporated by reference herein. In addition, grandparent application Ser. No. 10/479,506 claims the benefit of provisional Application No. 60/302,429, filed Jul. 2, 2001, provisional Application No. 60/310,962, filed Aug. 8, 2001, provisional Application No. 60/349,954, filed Jan. 8, 2002, and provisional Application No. 60/388,388, filed Jun. 12, 2002, each of which is incorporated by reference herein.

US Referenced Citations (923)
Number Name Date Kind
676185 Gattinger Jun 1901 A
3104363 Butler Sep 1963 A
3240621 Flower, Jr. et al. Mar 1966 A
3273027 Bourgault et al. Sep 1966 A
3343034 Ovshinsky Sep 1967 A
3379943 Breedlove Apr 1968 A
3381244 Dalley Apr 1968 A
3488528 Emond Jan 1970 A
3496434 Prokopowicz Feb 1970 A
3519959 Bewley et al. Jul 1970 A
3534301 Golembeski Oct 1970 A
3568000 Martre et al. Mar 1971 A
3573677 Detar Apr 1971 A
3652941 Neuf Mar 1972 A
3680005 Bewley et al. Jul 1972 A
3681612 Vogl Aug 1972 A
3688361 Bonini Sep 1972 A
3691563 Shelton Sep 1972 A
3701958 Herbert Oct 1972 A
3736471 Donze et al. May 1973 A
3740678 Hill Jun 1973 A
3742420 Harnden, Jr. Jun 1973 A
3764727 Balde Oct 1973 A
3790858 Brancaleone et al. Feb 1974 A
3842374 Schlicke Oct 1974 A
3880493 Lockhart, Jr. Apr 1975 A
3896354 Coleman et al. Jul 1975 A
3898541 Weller Aug 1975 A
3921041 Stockman Nov 1975 A
4023071 Fussell May 1977 A
4030190 Varker Jun 1977 A
4071878 Stynes Jan 1978 A
4081770 Mayer Mar 1978 A
4119084 Eckels Oct 1978 A
4135132 Tafjord Jan 1979 A
4139783 Engeler Feb 1979 A
4148003 Colburn et al. Apr 1979 A
4160220 Stachejko Jul 1979 A
4191986 ta Huang et al. Mar 1980 A
4198613 Whitley Apr 1980 A
4237522 Thompson Dec 1980 A
4259604 Aoki Mar 1981 A
4262317 Baumbach Apr 1981 A
4275945 Krantz et al. Jun 1981 A
4290041 Utsumi et al. Sep 1981 A
4292558 Flick et al. Sep 1981 A
4308509 Tsuchiya et al. Dec 1981 A
4312023 Frappart et al. Jan 1982 A
4312026 Iwaya et al. Jan 1982 A
4320364 Sakamoto et al. Mar 1982 A
4322698 Takahashi et al. Mar 1982 A
4328530 Bajorek et al. May 1982 A
4328531 Nagashima et al. May 1982 A
4335417 Sakshaug et al. Jun 1982 A
4342143 Jennings Aug 1982 A
4349862 Bajorek et al. Sep 1982 A
4353040 Krumm et al. Oct 1982 A
4353044 Nossek Oct 1982 A
4366456 Ueno et al. Dec 1982 A
4374368 Viola et al. Feb 1983 A
4375053 Viola et al. Feb 1983 A
4384263 Neuman et al. May 1983 A
4394639 McGalliard Jul 1983 A
4412146 Futterer et al. Oct 1983 A
4424552 Saint Marcoux Jan 1984 A
4441088 Anderson Apr 1984 A
4494083 Josefsson et al. Jan 1985 A
4494092 Griffin et al. Jan 1985 A
4498122 Rainal Feb 1985 A
4533931 Mandai et al. Aug 1985 A
4541035 Carlson et al. Sep 1985 A
4551746 Gilbert et al. Nov 1985 A
4551747 Gilbert et al. Nov 1985 A
4553114 English et al. Nov 1985 A
4556929 Tanaka et al. Dec 1985 A
4560962 Barrow Dec 1985 A
4563659 Sakamoto Jan 1986 A
4577214 Schaper Mar 1986 A
4586104 Standler Apr 1986 A
4587589 Marek May 1986 A
4590537 Sakamoto May 1986 A
4592606 Mudra Jun 1986 A
4597029 Kucharek et al. Jun 1986 A
4612140 Mandai Sep 1986 A
4612497 Ulmer Sep 1986 A
4626958 Lockard et al. Dec 1986 A
4628411 Balderes et al. Dec 1986 A
4633368 Frederick Dec 1986 A
4636752 Saito Jan 1987 A
4639826 Val et al. Jan 1987 A
4654694 Val Mar 1987 A
4658334 McSparran et al. Apr 1987 A
4665465 Tanabe May 1987 A
4667267 Hernandez et al. May 1987 A
4675644 Ott et al. Jun 1987 A
4682129 Bakermans et al. Jul 1987 A
4685025 Carlomagno Aug 1987 A
4688151 Kraus et al. Aug 1987 A
4694265 Kupper Sep 1987 A
4698721 Warren Oct 1987 A
4703386 Speet et al. Oct 1987 A
4706162 Hernandez et al. Nov 1987 A
4707671 Suzuki et al. Nov 1987 A
4710854 Yamada et al. Dec 1987 A
4712062 Takamine Dec 1987 A
4712540 Tucker et al. Dec 1987 A
4713540 Gilby et al. Dec 1987 A
4720690 Popek et al. Jan 1988 A
4720760 Starr Jan 1988 A
4725878 Miyauchi et al. Feb 1988 A
4729058 Gupta et al. Mar 1988 A
4734818 Hernandez et al. Mar 1988 A
4734819 Hernandez et al. Mar 1988 A
4739448 Rowe et al. Apr 1988 A
4746557 Sakamoto et al. May 1988 A
4752752 Okubo Jun 1988 A
4755910 Val Jul 1988 A
4760485 Ari et al. Jul 1988 A
4772225 Ulery Sep 1988 A
4777460 Okubo Oct 1988 A
4780598 Fahey et al. Oct 1988 A
4782311 Ookubo Nov 1988 A
4785135 Ecker et al. Nov 1988 A
4785271 Higgins Nov 1988 A
4789847 Sakamoto et al. Dec 1988 A
4793058 Venaleck Dec 1988 A
4794485 Bennett Dec 1988 A
4794499 Ott Dec 1988 A
4795658 Kano et al. Jan 1989 A
4799070 Nishikawa Jan 1989 A
4799128 Chen Jan 1989 A
4801904 Sakamoto et al. Jan 1989 A
4814295 Mehta Mar 1989 A
4814938 Arakawa et al. Mar 1989 A
4814941 Speet et al. Mar 1989 A
4819126 Kornrumpf et al. Apr 1989 A
4827327 Miyauchi et al. May 1989 A
4845606 Herbert Jul 1989 A
4847730 Konno et al. Jul 1989 A
4856102 Insetta et al. Aug 1989 A
4864465 Robbins Sep 1989 A
4875087 Miyauchi et al. Oct 1989 A
4884170 Ohki et al. Nov 1989 A
4891616 Renken et al. Jan 1990 A
4891686 Krausse Jan 1990 A
4901039 Corzine et al. Feb 1990 A
4904967 Morii et al. Feb 1990 A
4908586 Kling et al. Mar 1990 A
4908590 Sakamoto et al. Mar 1990 A
4909909 Florjancic et al. Mar 1990 A
4916576 Herbert et al. Apr 1990 A
4924340 Sweet May 1990 A
4942353 Herbert et al. Jul 1990 A
4945399 Brown et al. Jul 1990 A
4947286 Kaneko et al. Aug 1990 A
4949217 Ngo Aug 1990 A
4954929 Baran Sep 1990 A
4967315 Schelhorn Oct 1990 A
4975761 Chu Dec 1990 A
4978906 Herbert et al. Dec 1990 A
4982311 Dehaine et al. Jan 1991 A
4989117 Hernandez Jan 1991 A
4990202 Murata et al. Feb 1991 A
4994936 Hernandez Feb 1991 A
4999595 Azumi et al. Mar 1991 A
5012386 McShane et al. Apr 1991 A
5018047 Insetta et al. May 1991 A
5027253 Lauffer et al. Jun 1991 A
5029062 Capel Jul 1991 A
5034709 Azumi et al. Jul 1991 A
5034710 Kawaguchi Jul 1991 A
5034850 Hernandez et al. Jul 1991 A
5034851 Monsorno et al. Jul 1991 A
5040092 Katho et al. Aug 1991 A
5040093 Greuel Aug 1991 A
5041899 Oku et al. Aug 1991 A
5051712 Naito et al. Sep 1991 A
5059140 Philippson et al. Oct 1991 A
5065284 Hernandez Nov 1991 A
5073523 Yamada et al. Dec 1991 A
5075665 Taira et al. Dec 1991 A
5079069 Howard et al. Jan 1992 A
5079223 Maroni Jan 1992 A
5079669 Williams Jan 1992 A
5083101 Frederick Jan 1992 A
5089688 Fang et al. Feb 1992 A
5089880 Meyer et al. Feb 1992 A
5089881 Panicker Feb 1992 A
5095402 Hernandez et al. Mar 1992 A
5099387 Kato et al. Mar 1992 A
5105333 Yamano et al. Apr 1992 A
5107394 Naito et al. Apr 1992 A
5109206 Carlile Apr 1992 A
5115221 Cowman May 1992 A
5119062 Nakamura et al. Jun 1992 A
5140297 Jacobs et al. Aug 1992 A
5140496 Heinks et al. Aug 1992 A
5140497 Kato et al. Aug 1992 A
5142352 Chambers et al. Aug 1992 A
5142430 Anthony Aug 1992 A
5146191 Mandai et al. Sep 1992 A
5148005 Fang et al. Sep 1992 A
5150088 Virga et al. Sep 1992 A
5151770 Inoue Sep 1992 A
5153379 Guzuk et al. Oct 1992 A
5155464 Cowman et al. Oct 1992 A
5155655 Howard et al. Oct 1992 A
5159750 Dutta et al. Nov 1992 A
5161086 Howard et al. Nov 1992 A
5162977 Paurus et al. Nov 1992 A
5165055 Metsler Nov 1992 A
5166772 Soldner et al. Nov 1992 A
5167483 Gardiner Dec 1992 A
5170317 Yamada et al. Dec 1992 A
5172299 Yamada et al. Dec 1992 A
5173670 Naito et al. Dec 1992 A
5173767 Lange et al. Dec 1992 A
5177594 Chance et al. Jan 1993 A
5177663 Ingleson et al. Jan 1993 A
5177670 Shinohara et al. Jan 1993 A
5179362 Okochi et al. Jan 1993 A
5181859 Foreman et al. Jan 1993 A
5184210 Westbrook Feb 1993 A
5186647 Denkmann et al. Feb 1993 A
5187455 Mandai et al. Feb 1993 A
5206786 Lee Apr 1993 A
5208502 Yamashita et al. May 1993 A
5212402 Higgins, III May 1993 A
5216278 Lin et al. Jun 1993 A
5218230 Tamamura et al. Jun 1993 A
5219812 Doi et al. Jun 1993 A
5220480 Kershaw, Jr. et al. Jun 1993 A
5220483 Scott Jun 1993 A
5223741 Bechtel et al. Jun 1993 A
5225709 Nishiuma et al. Jul 1993 A
5227951 deNeuf et al. Jul 1993 A
5235208 Katoh Aug 1993 A
5236376 Cohen Aug 1993 A
5237204 Val Aug 1993 A
5243308 Shusterman et al. Sep 1993 A
5251092 Brady et al. Oct 1993 A
5257950 Lenker et al. Nov 1993 A
5261153 Lucas Nov 1993 A
5262611 Danysh et al. Nov 1993 A
5264983 Petrinec Nov 1993 A
5268810 DiMarco et al. Dec 1993 A
5272590 Hernandez Dec 1993 A
5278524 Mullen Jan 1994 A
5283717 Hundt Feb 1994 A
5290191 Foreman et al. Mar 1994 A
5294751 Kamada Mar 1994 A
5294826 Marcantonio et al. Mar 1994 A
5299956 Brownell et al. Apr 1994 A
5300760 Batliwalla et al. Apr 1994 A
5303419 Ittipiboon et al. Apr 1994 A
5309024 Hirano May 1994 A
5309121 Kobayashi et al. May 1994 A
5310363 Brownell et al. May 1994 A
5311408 Ferchau et al. May 1994 A
5313176 Upadhyay May 1994 A
5319525 Lightfoot Jun 1994 A
5321373 Shusterman et al. Jun 1994 A
5321573 Person et al. Jun 1994 A
5326284 Bohbot et al. Jul 1994 A
5331505 Wilheim Jul 1994 A
5333095 Stevenson et al. Jul 1994 A
5337028 White Aug 1994 A
5338970 Boyle et al. Aug 1994 A
5349314 Shimizu et al. Sep 1994 A
5353189 Tomlinson Oct 1994 A
5353202 Ansell et al. Oct 1994 A
5355016 Swirbel et al. Oct 1994 A
5357568 Pelegris Oct 1994 A
5362249 Carter Nov 1994 A
5362254 Siemon et al. Nov 1994 A
5365203 Nakamura et al. Nov 1994 A
5367430 DeVoe et al. Nov 1994 A
5369379 Fujiki Nov 1994 A
5369390 Lin et al. Nov 1994 A
5369545 Bhattacharyya et al. Nov 1994 A
5371653 Kametani et al. Dec 1994 A
5374909 Hirai et al. Dec 1994 A
5376759 Marx et al. Dec 1994 A
5378407 Chandler et al. Jan 1995 A
5382928 Davis et al. Jan 1995 A
5382938 Hansson et al. Jan 1995 A
5386335 Amano et al. Jan 1995 A
5386627 Booth et al. Feb 1995 A
5396201 Ishizaki et al. Mar 1995 A
5396397 McClanahan et al. Mar 1995 A
5399898 Rostoker Mar 1995 A
5401952 Sugawa Mar 1995 A
5402318 Otsuka et al. Mar 1995 A
5404044 Booth et al. Apr 1995 A
5405466 Naito et al. Apr 1995 A
5414299 Wang et al. May 1995 A
5414393 Rose et al. May 1995 A
5414587 Kiser et al. May 1995 A
5420553 Sakamoto et al. May 1995 A
5426560 Amaya et al. Jun 1995 A
5428885 Takaya et al. Jul 1995 A
5430605 deNeuf et al. Jul 1995 A
5432484 Klas et al. Jul 1995 A
5446625 Urbish et al. Aug 1995 A
5448445 Yamate et al. Sep 1995 A
5450278 Lee et al. Sep 1995 A
5451919 Chu et al. Sep 1995 A
RE35064 Hernandez Oct 1995 E
5455734 Foreman et al. Oct 1995 A
5457340 Templeton et al. Oct 1995 A
5461351 Shusterman Oct 1995 A
5463232 Yamashita et al. Oct 1995 A
5467064 Gu Nov 1995 A
5468997 Imai et al. Nov 1995 A
5471027 Call et al. Nov 1995 A
5471035 Holmes Nov 1995 A
5471181 Park Nov 1995 A
5473813 Chobot et al. Dec 1995 A
5474458 Vafi et al. Dec 1995 A
5475262 Wang et al. Dec 1995 A
5475565 Bhattacharyya et al. Dec 1995 A
5475606 Muyshondt et al. Dec 1995 A
5477933 Nguyen Dec 1995 A
5481238 Carsten et al. Jan 1996 A
5483407 Anastasio et al. Jan 1996 A
5483413 Babb Jan 1996 A
5488540 Hatta Jan 1996 A
5489882 Ueno Feb 1996 A
5491299 Naylor et al. Feb 1996 A
5491301 Akiba et al. Feb 1996 A
5493259 Blalock et al. Feb 1996 A
5493260 Park Feb 1996 A
5495180 Huang et al. Feb 1996 A
5499445 Boyle et al. Mar 1996 A
5500629 Meyer Mar 1996 A
5500785 Funada Mar 1996 A
5500789 Miller et al. Mar 1996 A
5506755 Miyagi et al. Apr 1996 A
5508938 Wheeler Apr 1996 A
5512196 Mantese et al. Apr 1996 A
5519650 Ichimura et al. May 1996 A
5528083 Malladi et al. Jun 1996 A
5530288 Stone Jun 1996 A
5531003 Seifried et al. Jul 1996 A
5534837 Brandt Jul 1996 A
5535101 Miles et al. Jul 1996 A
5536978 Cooper et al. Jul 1996 A
5541482 Siao Jul 1996 A
5544002 Iwaya et al. Aug 1996 A
5546058 Azuma et al. Aug 1996 A
5548255 Spielman Aug 1996 A
5555150 Newman, Jr. Sep 1996 A
5556811 Agatstein et al. Sep 1996 A
5557142 Gilmore et al. Sep 1996 A
5566040 Cosquer et al. Oct 1996 A
5568348 Foreman et al. Oct 1996 A
5570278 Cross Oct 1996 A
5574630 Kresge et al. Nov 1996 A
5583359 Ng et al. Dec 1996 A
5583470 Okubo Dec 1996 A
5583738 Kohno et al. Dec 1996 A
5583739 Vu et al. Dec 1996 A
5586007 Funada Dec 1996 A
5586011 Alexander Dec 1996 A
5587333 Johansson et al. Dec 1996 A
5587920 Muyshondt et al. Dec 1996 A
5590016 Fujishiro Dec 1996 A
5590030 Kametani et al. Dec 1996 A
5592391 Muyshondt et al. Jan 1997 A
5604668 Wohrstein et al. Feb 1997 A
5610796 Lavene Mar 1997 A
5612657 Kledzik Mar 1997 A
5614111 Lavene Mar 1997 A
5614881 Duggal et al. Mar 1997 A
5618185 Aekins Apr 1997 A
5619079 Wiggins et al. Apr 1997 A
5623160 Liberkowski Apr 1997 A
5624592 Paustian Apr 1997 A
5625166 Natarajan Apr 1997 A
5625225 Huang et al. Apr 1997 A
5633479 Hirano May 1997 A
5634268 Dalal et al. Jun 1997 A
5635669 Kubota et al. Jun 1997 A
5635767 Wenzel et al. Jun 1997 A
5635775 Colburn et al. Jun 1997 A
5640048 Selna Jun 1997 A
5641988 Huang et al. Jun 1997 A
5644468 Wink et al. Jul 1997 A
5645746 Walsh Jul 1997 A
5647766 Nguyen Jul 1997 A
5647767 Scheer et al. Jul 1997 A
5659455 Herbert Aug 1997 A
5668511 Furutani et al. Sep 1997 A
5672911 Patil et al. Sep 1997 A
5682303 Goad Oct 1997 A
5692298 Goetz et al. Dec 1997 A
5700167 Pharney et al. Dec 1997 A
5708296 Bhansali Jan 1998 A
5708553 Hung Jan 1998 A
5717249 Yoshikawa et al. Feb 1998 A
5719440 Moden Feb 1998 A
5719450 Vora Feb 1998 A
5719477 Tomihari Feb 1998 A
5719750 Iwane Feb 1998 A
5726612 Mandai et al. Mar 1998 A
5731960 Fung Mar 1998 A
5734198 Stave Mar 1998 A
5741729 Selna Apr 1998 A
5742210 Chaturvedi et al. Apr 1998 A
5742470 Raets Apr 1998 A
5745333 Frankeny et al. Apr 1998 A
5751539 Stevenson et al. May 1998 A
5756380 Berg et al. May 1998 A
5757252 Cho et al. May 1998 A
5761049 Yoshidome et al. Jun 1998 A
5764489 Leigh et al. Jun 1998 A
5767446 Ha et al. Jun 1998 A
5770476 Stone Jun 1998 A
5777383 Stager et al. Jul 1998 A
5786238 Pai et al. Jul 1998 A
5786630 Bhansali et al. Jul 1998 A
5789999 Barnett et al. Aug 1998 A
5790368 Naito et al. Aug 1998 A
5796170 Marcantonio Aug 1998 A
5796568 Baiatu Aug 1998 A
5796595 Cross Aug 1998 A
5797770 Davis et al. Aug 1998 A
5801579 Le et al. Sep 1998 A
5801597 Carter et al. Sep 1998 A
5808873 Celaya et al. Sep 1998 A
5812380 Frech et al. Sep 1998 A
5815050 Brooks et al. Sep 1998 A
5815051 Hamasaki et al. Sep 1998 A
5815373 Johnsen et al. Sep 1998 A
5817130 Cox et al. Oct 1998 A
5818313 Estes et al. Oct 1998 A
5822174 Yamate et al. Oct 1998 A
5825084 Lau et al. Oct 1998 A
5825628 Garbelli et al. Oct 1998 A
5827382 Ogawa et al. Oct 1998 A
5828093 Naito et al. Oct 1998 A
5828272 Romerein et al. Oct 1998 A
5828555 Itoh Oct 1998 A
5831489 Wire Nov 1998 A
5834992 Kato et al. Nov 1998 A
5835338 Suzuki et al. Nov 1998 A
5838216 White et al. Nov 1998 A
5838551 Chan Nov 1998 A
5847936 Forehand et al. Dec 1998 A
5854534 Beilin et al. Dec 1998 A
5864089 Rainal Jan 1999 A
5867361 Wolf et al. Feb 1999 A
5870272 Seifried et al. Feb 1999 A
5870273 Sogabe et al. Feb 1999 A
5872695 Fasano et al. Feb 1999 A
5875099 Maesaka et al. Feb 1999 A
5880925 DuPre et al. Mar 1999 A
5889445 Ritter et al. Mar 1999 A
5892415 Okamura Apr 1999 A
5894252 Oida Apr 1999 A
5895990 Lau Apr 1999 A
5898403 Saitoh et al. Apr 1999 A
5898562 Cain et al. Apr 1999 A
5898576 Lockwood et al. Apr 1999 A
5900350 Provost et al. May 1999 A
5905627 Brendel et al. May 1999 A
5907265 Sakuragawa et al. May 1999 A
5908151 Elias Jun 1999 A
5909155 Anderson et al. Jun 1999 A
5909350 Anthony Jun 1999 A
5910755 Mishiro et al. Jun 1999 A
5910879 Herbert Jun 1999 A
5912809 Steigerwald et al. Jun 1999 A
5917388 Tronche et al. Jun 1999 A
5923523 Herbert Jul 1999 A
5923540 Asada et al. Jul 1999 A
5925925 Dehaine et al. Jul 1999 A
5926377 Nakao et al. Jul 1999 A
5928076 Clements et al. Jul 1999 A
5929729 Swarup Jul 1999 A
5955930 Anderson et al. Sep 1999 A
5959829 Stevenson et al. Sep 1999 A
5959846 Noguchi et al. Sep 1999 A
5969461 Anderson et al. Oct 1999 A
5969583 Hutchison Oct 1999 A
5973906 Stevenson et al. Oct 1999 A
5973928 Blasi et al. Oct 1999 A
5977845 Kitahara Nov 1999 A
5978231 Tohya et al. Nov 1999 A
5980718 Van Konynenburg et al. Nov 1999 A
5982018 Wark et al. Nov 1999 A
5986340 Mostafazadeh et al. Nov 1999 A
5995352 Gumley Nov 1999 A
5995591 Halim Nov 1999 A
5999067 D'Ostilio Dec 1999 A
5999398 Makl et al. Dec 1999 A
6004752 Loewy et al. Dec 1999 A
6013957 Puzo et al. Jan 2000 A
6016095 Herbert Jan 2000 A
6018448 Anthony Jan 2000 A
6021564 Hanson Feb 2000 A
6023210 Tulintseff Feb 2000 A
6023406 Kinoshita et al. Feb 2000 A
6031710 Wolf et al. Feb 2000 A
6034576 Kuth Mar 2000 A
6034864 Naito et al. Mar 2000 A
6037846 Oberhammer Mar 2000 A
6038121 Naito et al. Mar 2000 A
6042685 Shinada et al. Mar 2000 A
6046898 Seymour et al. Apr 2000 A
6052038 Savicki Apr 2000 A
6052272 Kuroda et al. Apr 2000 A
6054754 Bissey Apr 2000 A
6054758 Lamson Apr 2000 A
6061227 Nogi May 2000 A
6061228 Palmer et al. May 2000 A
6064286 Ziegner et al. May 2000 A
6069786 Horie et al. May 2000 A
6072687 Naito et al. Jun 2000 A
6072690 Farooq et al. Jun 2000 A
6075211 Tohya et al. Jun 2000 A
6075285 Taylor et al. Jun 2000 A
6078117 Perrin et al. Jun 2000 A
6078229 Funada et al. Jun 2000 A
6084779 Fang Jul 2000 A
6088235 Chiao et al. Jul 2000 A
6091310 Utsumi et al. Jul 2000 A
6092269 Yializis et al. Jul 2000 A
6094112 Goldberger et al. Jul 2000 A
6094339 Evans Jul 2000 A
6097260 Whybrew et al. Aug 2000 A
6097581 Anthony Aug 2000 A
6104258 Novak Aug 2000 A
6104599 Ahiko et al. Aug 2000 A
6108448 Song et al. Aug 2000 A
6111479 Myohga et al. Aug 2000 A
6120326 Brooks Sep 2000 A
6121761 Herbert Sep 2000 A
6125044 Cherniski Sep 2000 A
6130585 Whybrew et al. Oct 2000 A
6133805 Jain et al. Oct 2000 A
6137161 Gilliland et al. Oct 2000 A
6137392 Herbert Oct 2000 A
6142831 Ashman et al. Nov 2000 A
6144547 Retseptor Nov 2000 A
6147587 Hadano et al. Nov 2000 A
6150895 Steigerwald et al. Nov 2000 A
6157528 Anthony Dec 2000 A
6157547 Brown et al. Dec 2000 A
6160705 Stearns et al. Dec 2000 A
6163454 Strickler Dec 2000 A
6163456 Suzuki et al. Dec 2000 A
6165814 Wark et al. Dec 2000 A
6175287 Lampen et al. Jan 2001 B1
6180588 Walters Jan 2001 B1
6181004 Koontz et al. Jan 2001 B1
6181231 Bartilson Jan 2001 B1
6183685 Cowman et al. Feb 2001 B1
6184477 Tanahashi Feb 2001 B1
6184769 Nakamura et al. Feb 2001 B1
6185091 Tanahashi et al. Feb 2001 B1
6188565 Naito et al. Feb 2001 B1
6191472 Mazumder Feb 2001 B1
6191475 Skinner et al. Feb 2001 B1
6191479 Herrell et al. Feb 2001 B1
6191669 Shigemura Feb 2001 B1
6191932 Kuroda et al. Feb 2001 B1
6191933 Ishigaki et al. Feb 2001 B1
6195269 Hino Feb 2001 B1
6198123 Linder et al. Mar 2001 B1
6198362 Harada et al. Mar 2001 B1
6200400 Farooq et al. Mar 2001 B1
6204448 Garland et al. Mar 2001 B1
6205014 Inomata et al. Mar 2001 B1
6207081 Sasaki et al. Mar 2001 B1
6208063 Horikawa Mar 2001 B1
6208225 Miller Mar 2001 B1
6208226 Chen et al. Mar 2001 B1
6208494 Nakura et al. Mar 2001 B1
6208495 Wieloch et al. Mar 2001 B1
6208501 Ingalls et al. Mar 2001 B1
6208502 Hudis et al. Mar 2001 B1
6208503 Shimada et al. Mar 2001 B1
6208521 Nakatsuka Mar 2001 B1
6208525 Imasu et al. Mar 2001 B1
6211754 Nishida et al. Apr 2001 B1
6212060 Liu Apr 2001 B1
6212078 Hunt et al. Apr 2001 B1
6215373 Novak et al. Apr 2001 B1
6215647 Naito et al. Apr 2001 B1
6215649 Appelt et al. Apr 2001 B1
6218631 Hetzel et al. Apr 2001 B1
6219240 Sasov Apr 2001 B1
6222427 Kato et al. Apr 2001 B1
6222431 Ishizaki et al. Apr 2001 B1
6225876 Akino et al. May 2001 B1
6226169 Naito et al. May 2001 B1
6226182 Maehara May 2001 B1
6229226 Kramer et al. May 2001 B1
6236572 Teshome et al. May 2001 B1
6240621 Nellissen et al. Jun 2001 B1
6243253 DuPre et al. Jun 2001 B1
6249047 Corisis Jun 2001 B1
6249439 DeMore et al. Jun 2001 B1
6252161 Hailey et al. Jun 2001 B1
6252761 Branchevsky Jun 2001 B1
6262895 Forthun Jul 2001 B1
6266228 Naito et al. Jul 2001 B1
6266229 Naito et al. Jul 2001 B1
6272003 Schaper Aug 2001 B1
6281704 Ngai et al. Aug 2001 B2
6282074 Anthony Aug 2001 B1
6282079 Nagakari et al. Aug 2001 B1
6285109 Katagiri et al. Sep 2001 B1
6285542 Kennedy, III et al. Sep 2001 B1
6288344 Youker et al. Sep 2001 B1
6288906 Sprietsma et al. Sep 2001 B1
6292350 Naito et al. Sep 2001 B1
6292351 Ahiko et al. Sep 2001 B1
6300846 Brunker Oct 2001 B1
6307450 Takahashi et al. Oct 2001 B2
6309245 Sweeney Oct 2001 B1
6310286 Troxel et al. Oct 2001 B1
6310759 Ishigaki et al. Oct 2001 B2
6313584 Johnson et al. Nov 2001 B1
6320547 Fathy et al. Nov 2001 B1
6323116 Lamson Nov 2001 B1
6324047 Hayworth Nov 2001 B1
6324048 Liu Nov 2001 B1
6325672 Belopolsky et al. Dec 2001 B1
6327134 Kuroda et al. Dec 2001 B1
6327137 Yamamoto et al. Dec 2001 B1
6331808 Mikami et al. Dec 2001 B2
6331926 Anthony Dec 2001 B1
6331930 Kuroda Dec 2001 B1
6342681 Goldberger et al. Jan 2002 B1
6344961 Naito et al. Feb 2002 B1
6346743 Figueroa et al. Feb 2002 B1
6351120 Goldfine et al. Feb 2002 B2
6351194 Takahashi et al. Feb 2002 B2
6351369 Kuroda et al. Feb 2002 B1
6352914 Ball et al. Mar 2002 B2
6353375 Kurata Mar 2002 B2
6353540 Akiba et al. Mar 2002 B1
6365828 Kinoshita et al. Apr 2002 B1
6367133 Ikada et al. Apr 2002 B2
6370010 Kuroda et al. Apr 2002 B1
6370011 Naito et al. Apr 2002 B1
6370937 Hsu Apr 2002 B2
6373349 Gilbert Apr 2002 B2
6373673 Anthony Apr 2002 B1
6373711 Yamauchi et al. Apr 2002 B2
6377439 Sekidou et al. Apr 2002 B1
6381153 Brussels Apr 2002 B1
6388207 Figueroa et al. May 2002 B1
6388856 Anthony May 2002 B1
6388865 Honda et al. May 2002 B1
6392502 Sweeney et al. May 2002 B2
6392868 Ohya et al. May 2002 B2
6395996 Tsai et al. May 2002 B1
6396088 Kitsukawa et al. May 2002 B2
6407906 Ahiko et al. Jun 2002 B1
6414572 Satoh et al. Jul 2002 B2
6420941 Okada et al. Jul 2002 B2
6430025 Naito et al. Aug 2002 B2
6430030 Farooq et al. Aug 2002 B1
6437240 Smith Aug 2002 B2
6437409 Fujii Aug 2002 B2
6448873 Mostov Sep 2002 B1
6449828 Pahl et al. Sep 2002 B2
6456481 Stevenson Sep 2002 B1
6462628 Kondo et al. Oct 2002 B2
6462932 Naito et al. Oct 2002 B1
6466107 Yamamoto Oct 2002 B2
6469595 Anthony et al. Oct 2002 B2
6473292 Yoshida et al. Oct 2002 B1
6475854 Narwankar et al. Nov 2002 B2
6477034 Chakravorty et al. Nov 2002 B1
6480425 Yanagisawa et al. Nov 2002 B2
6483394 Kim Nov 2002 B2
6493202 Kappel et al. Dec 2002 B2
6496354 Naito et al. Dec 2002 B2
6498710 Anthony Dec 2002 B1
6501344 Ikata et al. Dec 2002 B2
6504451 Yamaguchi Jan 2003 B1
6507200 Brandelik et al. Jan 2003 B2
6509640 Li et al. Jan 2003 B1
6509807 Anthony et al. Jan 2003 B1
6510038 Satou et al. Jan 2003 B1
6522182 Tomita et al. Feb 2003 B2
6522516 Anthony Feb 2003 B2
6525628 Ritter et al. Feb 2003 B1
6525635 Murata et al. Feb 2003 B2
6532143 Figueroa et al. Mar 2003 B2
6534787 Hsu Mar 2003 B1
6538527 Hidaka Mar 2003 B2
6549389 Anthony et al. Apr 2003 B2
6549395 Naito et al. Apr 2003 B1
6559484 Li et al. May 2003 B1
6563688 Anthony et al. May 2003 B2
6567257 Brown May 2003 B2
6573805 Hidaka et al. Jun 2003 B2
6577493 Honda et al. Jun 2003 B2
6580595 Anthony et al. Jun 2003 B2
6587016 Kadota Jul 2003 B2
6587327 Devoe et al. Jul 2003 B1
6594128 Anthony Jul 2003 B2
6594136 Kuroda et al. Jul 2003 B2
6603372 Ishizaki et al. Aug 2003 B1
6603646 Anthony et al. Aug 2003 B2
6606011 Anthony et al. Aug 2003 B2
6606237 Naito et al. Aug 2003 B1
6608538 Wang Aug 2003 B2
6611419 Chakravorty Aug 2003 B1
6618268 Dibene, II et al. Sep 2003 B2
6618943 Ashe et al. Sep 2003 B2
6624692 Suzuki et al. Sep 2003 B2
6633528 Watanabe Oct 2003 B2
6636406 Anthony Oct 2003 B1
6638686 Sawada et al. Oct 2003 B2
6643903 Stevenson et al. Nov 2003 B2
6650203 Gerstenberg et al. Nov 2003 B2
6650525 Anthony Nov 2003 B2
6665053 Korenaga Dec 2003 B2
6674343 Gould et al. Jan 2004 B2
6687108 Anthony et al. Feb 2004 B1
6696952 Zirbes Feb 2004 B2
6700181 Coccioli Mar 2004 B1
6704190 Honda et al. Mar 2004 B2
6707685 Kabumoto et al. Mar 2004 B2
6710263 Kobayashi et al. Mar 2004 B2
6710997 Honda et al. Mar 2004 B2
6717301 De Daran et al. Apr 2004 B2
6738249 Anthony et al. May 2004 B1
6750739 Enokihara et al. Jun 2004 B2
6767787 Koh et al. Jul 2004 B2
6768630 Togashi Jul 2004 B2
6794961 Nagaishi et al. Sep 2004 B2
6801422 Mosley Oct 2004 B2
6806806 Anthony Oct 2004 B2
6812411 Belau et al. Nov 2004 B2
6823730 Buck et al. Nov 2004 B2
6828666 Herrell et al. Dec 2004 B1
6849945 Horiuchi et al. Feb 2005 B2
6873513 Anthony Mar 2005 B2
6879481 Honda et al. Apr 2005 B2
6894884 Anthony, Jr. et al. May 2005 B2
6909593 Kuroda et al. Jun 2005 B2
6942469 Seale et al. Sep 2005 B2
6950293 Anthony Sep 2005 B2
6954346 Anthony Oct 2005 B2
6956174 Khandros et al. Oct 2005 B2
6980414 Sutardja Dec 2005 B1
6995983 Anthony et al. Feb 2006 B1
7042303 Anthony et al. May 2006 B2
7042703 Anthony et al. May 2006 B2
7050284 Anthony May 2006 B2
7106570 Anthony, Jr. et al. Sep 2006 B2
7109569 Breisch et al. Sep 2006 B2
7110227 Anthony et al. Sep 2006 B2
7110235 Anthony, Jr. et al. Sep 2006 B2
7113383 Anthony et al. Sep 2006 B2
7141899 Anthony et al. Nov 2006 B2
7180718 Anthony et al. Feb 2007 B2
7193831 Anthony Mar 2007 B2
7224564 Anthony May 2007 B2
7262949 Anthony Aug 2007 B2
7274549 Anthony Sep 2007 B2
7301748 Anthony et al. Nov 2007 B2
7321485 Anthony et al. Jan 2008 B2
7336467 Anthony et al. Feb 2008 B2
7336468 Anthony et al. Feb 2008 B2
7423860 Anthony et al. Sep 2008 B2
7428134 Anthony Sep 2008 B2
7433168 Anthony Oct 2008 B2
7440252 Anthony Oct 2008 B2
7443647 Anthony Oct 2008 B2
7586728 Anthony Sep 2009 B2
7593208 Anthony et al. Sep 2009 B2
7609500 Anthony et al. Oct 2009 B2
7609501 Anthony et al. Oct 2009 B2
7630188 Anthony Dec 2009 B2
7675729 Anthony et al. Mar 2010 B2
7688565 Anthony et al. Mar 2010 B2
7733621 Anthony et al. Jun 2010 B2
7768763 Anthony et al. Aug 2010 B2
7782587 Anthony et al. Aug 2010 B2
7817397 Anthony Oct 2010 B2
7894176 Anthony Feb 2011 B1
7916444 Anthony et al. Mar 2011 B2
7920367 Anthony et al. Apr 2011 B2
7974062 Anthony et al. Jul 2011 B2
8004812 Anthony et al. Aug 2011 B2
8014119 Anthony Sep 2011 B2
8018706 Anthony et al. Sep 2011 B2
8023241 Anthony et al. Sep 2011 B2
8026777 Anthony Sep 2011 B2
8547677 Anthony et al. Oct 2013 B2
8587915 Anthony et al. Nov 2013 B2
20010001989 Smith May 2001 A1
20010002105 Brandelik et al. May 2001 A1
20010002624 Khandros et al. Jun 2001 A1
20010008288 Kimura et al. Jul 2001 A1
20010008302 Murakami et al. Jul 2001 A1
20010008478 McIntosh et al. Jul 2001 A1
20010008509 Watanabe Jul 2001 A1
20010009496 Kappel et al. Jul 2001 A1
20010010444 Pahl et al. Aug 2001 A1
20010011763 Ushijima et al. Aug 2001 A1
20010011934 Yamamoto Aug 2001 A1
20010011937 Satoh et al. Aug 2001 A1
20010013626 Fujii Aug 2001 A1
20010015643 Goldfine et al. Aug 2001 A1
20010015683 Mikami et al. Aug 2001 A1
20010017576 Kondo et al. Aug 2001 A1
20010017579 Kurata Aug 2001 A1
20010019869 Hsu Sep 2001 A1
20010020879 Takahashi et al. Sep 2001 A1
20010021097 Ohya et al. Sep 2001 A1
20010022547 Murata et al. Sep 2001 A1
20010023983 Kobayashi et al. Sep 2001 A1
20010024148 Gerstenberg et al. Sep 2001 A1
20010028581 Yanagisawa et al. Oct 2001 A1
20010029648 Ikada et al. Oct 2001 A1
20010031191 Korenaga Oct 2001 A1
20010033664 Poux et al. Oct 2001 A1
20010035801 Gilbert Nov 2001 A1
20010035802 Kadota Nov 2001 A1
20010035805 Suzuki et al. Nov 2001 A1
20010037680 Buck et al. Nov 2001 A1
20010039834 Hsu Nov 2001 A1
20010040484 Kim Nov 2001 A1
20010040487 Ikata et al. Nov 2001 A1
20010040488 Gould et al. Nov 2001 A1
20010041305 Sawada et al. Nov 2001 A1
20010043100 Tomita et al. Nov 2001 A1
20010043129 Hidaka et al. Nov 2001 A1
20010043450 Seale et al. Nov 2001 A1
20010043453 Narwankar et al. Nov 2001 A1
20010045810 Poon et al. Nov 2001 A1
20010048581 Anthony et al. Dec 2001 A1
20010048593 Yamauchi et al. Dec 2001 A1
20010048906 Lau et al. Dec 2001 A1
20010050550 Yoshida et al. Dec 2001 A1
20010050600 Anthony et al. Dec 2001 A1
20010050837 Stevenson et al. Dec 2001 A1
20010052833 Enokihara et al. Dec 2001 A1
20010054512 Belau et al. Dec 2001 A1
20010054734 Koh et al. Dec 2001 A1
20010054756 Horiuchi et al. Dec 2001 A1
20010054936 Okada et al. Dec 2001 A1
20020000521 Brown Jan 2002 A1
20020000583 Kitsukawa et al. Jan 2002 A1
20020000821 Haga et al. Jan 2002 A1
20020000893 Hidaka et al. Jan 2002 A1
20020000895 Takahashi et al. Jan 2002 A1
20020003454 Sweeney et al. Jan 2002 A1
20020005880 Ashe et al. Jan 2002 A1
20020024787 Anthony Feb 2002 A1
20020027263 Anthony et al. Mar 2002 A1
20020027760 Anthony Mar 2002 A1
20020044401 Anthony et al. Apr 2002 A1
20020075096 Anthony Jun 2002 A1
20020079116 Anthony Jun 2002 A1
20020089812 Anthony et al. Jul 2002 A1
20020113663 Anthony et al. Aug 2002 A1
20020122286 Anthony Sep 2002 A1
20020131231 Anthony Sep 2002 A1
20020149900 Anthony Oct 2002 A1
20020158515 Anthony, Jr. et al. Oct 2002 A1
20020186100 Anthony et al. Dec 2002 A1
20030029632 Anthony, Jr. et al. Feb 2003 A1
20030029635 Anthony, Jr. et al. Feb 2003 A1
20030048029 DeDaran et al. Mar 2003 A1
20030067730 Anthony et al. Apr 2003 A1
20030161086 Anthony Aug 2003 A1
20030202312 Anthony et al. Oct 2003 A1
20030206388 Anthony et al. Nov 2003 A9
20030210125 Anthony Nov 2003 A1
20030231451 Anthony Dec 2003 A1
20030231456 Anthony et al. Dec 2003 A1
20040004802 Anthony et al. Jan 2004 A1
20040008466 Anthony et al. Jan 2004 A1
20040027771 Anthony Feb 2004 A1
20040032304 Anthony et al. Feb 2004 A1
20040054426 Anthony Mar 2004 A1
20040085699 Anthony May 2004 A1
20040105205 Anthony et al. Jun 2004 A1
20040124949 Anthony et al. Jul 2004 A1
20040130840 Anthony Jul 2004 A1
20040218332 Anthony et al. Nov 2004 A1
20040226733 Anthony et al. Nov 2004 A1
20050016761 Anthony, Jr. et al. Jan 2005 A9
20050018374 Anthony Jan 2005 A1
20050063127 Anthony Mar 2005 A1
20050248900 Anthony Nov 2005 A1
20050286198 Anthony et al. Dec 2005 A1
20060023385 Anthony et al. Feb 2006 A9
20060139836 Anthony Jun 2006 A1
20060139837 Anthony et al. Jun 2006 A1
20060193051 Anthony et al. Aug 2006 A1
20060202414 Chen Sep 2006 A1
20060203414 Anthony Sep 2006 A1
20070019352 Anthony Jan 2007 A1
20070047177 Anthony Mar 2007 A1
20070057359 Anthony et al. Mar 2007 A1
20070103839 Anthony et al. May 2007 A1
20070109709 Anthony et al. May 2007 A1
20080160681 Anthony et al. Jul 2008 A1
20090321127 Anthony et al. Dec 2009 A1
20100078199 Anthony et al. Apr 2010 A1
20100180438 Anthony et al. Jul 2010 A1
20100294555 Anthony et al. Nov 2010 A1
20100307810 Anthony et al. Dec 2010 A1
20100319978 Anthony et al. Dec 2010 A1
20110032657 Anthony Feb 2011 A1
20110141653 Anthony Jun 2011 A1
20110174523 Anthony et al. Jul 2011 A1
20110192642 Anthony et al. Aug 2011 A1
20120000045 Anthony et al. Jan 2012 A1
20120023741 Anthony et al. Feb 2012 A1
20120023742 Anthony et al. Feb 2012 A1
20120034774 Anthony et al. Feb 2012 A1
Foreign Referenced Citations (146)
Number Date Country
747079 Nov 1966 CA
1237534 May 1988 CA
197 28 692 Jan 1999 DE
198 57 043 Mar 2000 DE
295948 Dec 1988 EP
563873 Oct 1993 EP
279769 Sep 1994 EP
0623363 Nov 1994 EP
98915364 Nov 1994 EP
763867 Mar 1997 EP
0776016 May 1997 EP
872888 Oct 1998 EP
0933871 Aug 1999 EP
1022751 Jul 2000 EP
1024507 Aug 2000 EP
1061535 Dec 2000 EP
1128434 Aug 2001 EP
735606 Jan 2002 EP
1873872 Dec 2008 EP
2496970 Jun 1982 FR
2606207 May 1988 FR
2765417 Dec 1998 FR
2808135 Oct 2001 FR
2217136 Apr 1988 GB
2310967 Mar 2000 GB
2341980 Mar 2000 GB
06-053078 Feb 1994 JO
57-172130 Oct 1982 JP
63-269509 Nov 1988 JP
1-27251 Jan 1989 JP
01-120805 May 1989 JP
01-212415 Aug 1989 JP
02-267879 Nov 1990 JP
03-018112 Jan 1991 JP
03-071614 Mar 1991 JP
05-205966 Aug 1993 JP
5-283284 Oct 1993 JP
05-299292 Nov 1993 JP
06-020870 Jan 1994 JP
06-053048 Feb 1994 JP
06-053049 Feb 1994 JP
06-053075 Feb 1994 JP
06-053077 Feb 1994 JP
06-053078 Feb 1994 JP
06-084695 Mar 1994 JP
06-120704 Apr 1994 JP
06-151014 May 1994 JP
06-151244 May 1994 JP
06-151245 May 1994 JP
06-231995 Aug 1994 JP
06-251981 Sep 1994 JP
06-275463 Sep 1994 JP
6-302471 Oct 1994 JP
06-325977 Nov 1994 JP
11-214244 Nov 1994 JP
06-267790 Dec 1994 JP
07-022757 Jan 1995 JP
07-122757 May 1995 JP
07 161568 Jun 1995 JP
07-201651 Aug 1995 JP
07-202477 Aug 1995 JP
07-235406 Sep 1995 JP
07-235852 Sep 1995 JP
07-235862 Sep 1995 JP
07-240651 Sep 1995 JP
07-263871 Oct 1995 JP
07-263280 Nov 1995 JP
08-97328 Apr 1996 JP
08-124795 May 1996 JP
08-163122 Jun 1996 JP
08-172025 Jul 1996 JP
08-181035 Jul 1996 JP
8172025 Jul 1996 JP
08-273973 Oct 1996 JP
09-232185 Sep 1997 JP
9-266130 Oct 1997 JP
09-275145 Oct 1997 JP
09-284076 Oct 1997 JP
09-284077 Oct 1997 JP
09-284078 Oct 1997 JP
9-284078 Oct 1997 JP
09-293987 Nov 1997 JP
9-294041 Nov 1997 JP
10-12490 Jan 1998 JP
10-41637 Feb 1998 JP
10-41677 Feb 1998 JP
10-223470 Aug 1998 JP
11-21456 Apr 1999 JP
11-97291 Apr 1999 JP
11-102839 Apr 1999 JP
11-214256 Aug 1999 JP
11-215256 Aug 1999 JP
11-223396 Aug 1999 JP
11-219824 Oct 1999 JP
11-294908 Oct 1999 JP
11-305302 Nov 1999 JP
11-319222 Nov 1999 JP
11-345273 Dec 1999 JP
2000-188218 Apr 2000 JP
00-188218 Jul 2000 JP
2000-243646 Aug 2000 JP
00-261235 Sep 2000 JP
00-299249 Oct 2000 JP
2000-286665 Oct 2000 JP
WO9007785 Jul 1990 WO
WO 9115046 Oct 1991 WO
WO9622008 Jul 1996 WO
WO9641376 Dec 1996 WO
WO 9720332 Jun 1997 WO
WO 9743786 Nov 1997 WO
WO 9845921 Oct 1998 WO
WO 9904457 Jan 1999 WO
WO 9919982 Apr 1999 WO
WO 9937008 Jul 1999 WO
WO 9952210 Oct 1999 WO
WO 0016446 Mar 2000 WO
WO 0065740 Nov 2000 WO
WO 0074197 Dec 2000 WO
WO 0077907 Dec 2000 WO
0106631 Jan 2001 WO
WO 0110000 Feb 2001 WO
WO 0141232 Jun 2001 WO
WO 0141233 Jun 2001 WO
WO 0145119 Jun 2001 WO
WO 0171908 Sep 2001 WO
WO 0175916 Oct 2001 WO
WO 0184581 Nov 2001 WO
WO 0186774 Nov 2001 WO
WO 0259401 Jan 2002 WO
WO 0211160 Feb 2002 WO
WO 0215360 Feb 2002 WO
WO 0227794 Apr 2002 WO
WO 0233798 Apr 2002 WO
WO 0245233 Jun 2002 WO
WO 02065606 Aug 2002 WO
WO 02080330 Oct 2002 WO
WO 03005541 Jan 2003 WO
WO 2004070905 Aug 2004 WO
WO 2005002018 Jan 2005 WO
WO 2005015719 Feb 2005 WO
WO 2005065097 Jul 2005 WO
WO 2006093830 Sep 2006 WO
WO 2006093831 Sep 2006 WO
WO 2006099297 Sep 2006 WO
WO 2006104613 Oct 2006 WO
WO 2007103965 Sep 2007 WO
Non-Patent Literature Citations (299)
Entry
Oct. 1, 2002, PCT International Search Report for PCT/US01/48861.
Jan. 2, 2003, PCT International Search Report for PCT/US01/44681.
Greb, “An Intuitive Approach to EM Fields,” EMC Test & Design, Jan. 1, 1994, pp. 30-33.
Greb, “An Intuitive Approach to EM Coupling,” EMC Test & Design, Dec. 1, 1993, pp. 20-25.
Sakamoto, “Noiseproof Power Supplies: What's Important in EMI Reomoval Filters?” JEE, Jun. 1, 1986, pp. 80-85.
Jan. 1, 1999, Montrose, “Analysis on Loop Area Trace Radiated Emmissions from Decoupling Capacitor Placement on Printed Circuit Boards,” IEEE, 1999, pp. 423-428.
Jan. 1, 1999, Miyoshi, “Surface Mounted Distributed Constant Type Noise Filter,” 1999, pp. 157-160.
Jan. 1, 1999, Shigeta et al., “Improved EMI Performance by Use of a Three-Terminal-Capacitor Applied to an IC Power Line,” IEEE, 1999, pp. 161-164.
Jul. 19, 1999, PCT International Search Report for PCT/US99/07653.
Oct. 13, 1999, IPER for PCT/US99/07653.
U.S. Appl. No. 10/479,506, filed Dec. 10, 2003.
U.S. Appl. No. 10/189,339, filed Oct. 28, 2003.
U.S. Appl. No. 10/443,792, filed Oct. 28, 2003.
Aug. 19, 1998, PCT International Search Report for PCT/US98/06962.
Apr. 19, 1999, PCT International Search Report for PCT/US99/01040.
Sep. 18, 2000, PCT International Search Report for PCT/US00/11409.
Sep. 13, 2000, PCT International Search Report for PCT/US00/14626.
Nov. 8, 2000, PCT International Search Report for PCT/US00/16518.
Dec. 28, 2000, PCT International Search Report for PCT/US00/21178.
Sep. 1, 1996, Carpenter, Jr. et al., “A New Approach to TVSS Design,” Power Quality Assurance, Sep./Oct. 1996 p. 60-63.
Raychem, “Polyswitch Resettable Fuses,” Circuit Protection Databook, Jan. 1, 1996, pp. 11-18.
Dec. 28, 2001, PCT International Search Report for PCT/US01/41720.
Jun. 13, 2001, PCT International Search Report for PCT/US01/09185.
Jul. 1, 2000, Polka et al., “Package-Level Interconnect Design for Optimum Electrical Performance,” Intel Technology Journal Q3, 2000, pp. 1-17.
May 10, 2002, PCT International Search Report for PCT/US01/43418.
Mar. 13, 2002, PCT International Search Report for PCT/US01/32480.
Aug. 19, 2002, PCT International Search Report for PCT/US02/10302.
Feb. 28, 2003, PCT International Search Report for PCT/US02/21238.
Mar. 18, 2002, PCT International Search Report for PCT/US01/13911.
Jul. 16, 1991, PCT International Search Report for PCT/US91/02150.
Jun. 28, 2001, PCT International Search Report for PCT/US01/03792.
“Johanson Dielectrics, Inc. Licenses X2Y Circuit Conditioning Technology,” Press Release, Dec. 16, 1998, 1 page.
Beyne et al., “PSGA—an innovative IC package for single and multichip designs,” Components, Mar. 1, 1997, pp. 6-9.
“EMC Design for Brush Commutated DC Electric Motors,” Sep. 15, 1997, pp. 1-2.
Apr. 1, 1996, “Tomorrow's Capacitors,” Components, 1996, No. 4, p. 3.
Mason, “Valor—Understanding Common Mode Noise,” Mar. 30, 1998, pp. 1-7.
Anthony Anthony et al., U.S Appl. No. 10/237,079, filed Sep. 9, 2002.
David Anthony et al., U.S. Appl. No. 10/766,000, filed Jan. 29, 2004.
William Anthony, U.S. Appl. No. 10/399,630, filed Aug. 27, 2003.
Anthony Anthony et al., U.S Appl. No. 10/432,840, filed May 28, 2003.
William Anthony, U.S. Appl. No. 10/443,482,filed Jun. 12, 2003.
Anthony Anthony et al., U.S. Appl. No. 10/435,199, filed May 12, 2003.
Anthony Anthony et al., U.S. Appl. No. 10/115,159, filed Apr. 2, 2002.
Anthony Anthony et al., U.S. Appl. No. 10/189,338, filed Jul. 2, 2002.
Anthony Anthony et al., U.S. Appl. No. 10/189,339, filed Jul. 2, 2002.
Anthony Anthony et al., U.S. Appl. No. 10/479,506, filed Dec. 10, 2003.
Anthony Anthony, U.S. Appl. No. 10/443,764, filed Sep. 16, 2003.
Anthony Anthony, U.S. Appl. No. 10/443,792, May 23, 2003.
Anthony Anthony, U.S. Appl. No. 10/443,788, filed May 23, 2003.
Anthony Anthony et al., U.S. Appl. No. 10/443,778, filed May 23, 2003.
Anthony Anthony et al., U.S. Appl. No. 10/460,361, filed Jun. 13, 2003.
Anthony Anthony et al., U.S. Appl. No. 10/705,962, filed May 25, 2005.
Anthony Anthony, U.S. Appl. No. 10/369,335, Feb. 18, 2003.
Anthony Anthony et al., U.S. Appl. No. 09/647,648, filed Nov. 17, 2000.
Anthony Anthony, U.S. Appl. No. 10/328,942, filed Dec. 23, 2002.
Anthony Anthony et al., U.S. Appl. No. 09/632,048, filed Aug. 3, 2000.
Anthony Anthony et al., U.S. Appl. No. 09/996,355, filed Nov. 29, 2001.
Willian Anthony, U.S. Appl. No. 10/023,467, filed Dec. 17, 2001.
Jan. 1, 2005, Weir, et al., “DesignCon 2005, High Performance FPGA Bypass Networks”.
Apr. 25, 2002, U.S. Appl. No. 10/399,590, filed Apr. 23, 2004.
Feb. 11, 2005, PCT International Search Report for PCT/US04/00218.
Feb. 18, 2005, PCT International Search Report for PCT/US04/14539.
Mar. 24, 2005, Australian Patent Office Examination Report for SG 200303041-8.
Apr. 11, 2005, PCT International Search Report for PCT/US04/18938.
Nov. 2000, Muccioli, “EMC Society Seattle and Oregon Chapters—New X2Y Filter Technology Emerges as Singles Component Solution for Noise Suppression”.
Sep. 27, 2005, PCT Corrected IPER for PCT/US04/00218.
Nov. 8, 2005, Supplementary Partial European Search Report EP 99916477.
Oct. 27, 2005, Supplementary European Search Report EP 98915364.
Dec. 9, 2005, PCT ISR for PCT/US04/39777.
May 8, 2006, EP Examination Report for 99916477.5-2215.
PCT Written Opinion of the International Search Authority, PCT/US2007/063463.
PCT International Search Report, PCT/US2007/063463.
Oct. 31, 2007, PCT International Search Report PCT/US06/06609.
Oct. 31, 2007, PCT Written Opinion of the International Search Authority PCT/US06/06609.
Jun. 12, 2008, PCT International Search Report PCT/US06/06608.
Jun. 12, 2008, PCT Written Opinion of the International Search Authority PCT/US06/06608.
Jun. 12, 2008, PCT International Search Report PCT/US06/06607.
Jun. 12, 2008, PCT Written Opinion of the International Search Authority PCT/US06/06607.
Jun. 17, 2008, PCT International Search Report PCT/US06/08901.
Jun. 17, 2008, PCT Written Opinion of the International Search Authority PCT/US06/08901.
Jun. 6, 2008, European Search Report EP 07 01 9451.
Sep. 25, 2008, European Search Report EP 01 99 4116.
Sep. 25, 2008, European Search Report EP 01 99 9170.
Sep. 25, 2008 European Search Report EP 01 99 0677.
Sep. 18, 2008, PCT Written Opinion of the International Search Authority PCT/US07/063463.
Sep. 25, 2008, European Search Report EP 01 90 8876.
Sep. 25, 2008, European Search Report EP 01 92 2559.
Sep. 25, 2008, European Search Report EP 01 98 1731.
Jan. 24, 1995, Patent Abstracts of Japan, English translation of abstract for JP 07-022757.
Oct. 13, 2000, Patent Abstracts of Japan, English translation of abstract for JP 2000-28665.
Nov. 1, 1960, Cohn, “Characteristic Impedances of Broadside-Coupled Strip Transmission Lines”, IRE Transactions on Microwave Theory and Techniques, vol. 8.6, 633-637.
May 1, 1969, Goldmann, “Geometric Optimization of Controlled Collapse Interconnections”, IBM Journal of Research and Development, vol. 13.3, pp. 251-265.
Jan. 1, 1974, Howe, Stripline Circuit Design, pp. 1-308.
May 1, 1971, Hines, “Reciprocal and Nonreciprocal Modes of Propagation in Ferrite Stripline and Microstrip Devices”, IEEE Transactions on Mircowave Theory and Techniques, vol. MTT-19.5, pp. 442-451.
Sep. 1, 1976, Coda et al. “Design Considerations for High-Frequency Ceramic Chip Capacitors”, IEEE, vol. PHP-12.3, pp. 206-212.
Apr. 1, 1985, King, Texas Instruments Design Group Electromagnetic Compatibility Design Guide, pp. 1-98.
Sep. 1, 1987, Robinson et al., “A Midrange VLSI Hewlett-Packard Precision Architecture Computer”, Hewlett-Packard Journal, vol. 38.9, pp. 26-37.
Jan. 1, 1988, Chao et al., “Multilayer Thin-Film Substrate for Multichip Packaging”, Electronic Components Conference, Proceedings of the 38th, pp. 276-281.
Jan. 1, 1989, Quint et al., “Electrical Design Methodology of a 407 Pin Multi-Layer Ceramic Package”, Electronic Components Conference, Proceedings of the 39th, pp. 392-397.
Jan. 1, 1989, Bhat et al., Stripline-Like Transmission Lines for Microwave Integrated Circuits, pp. 1-695.
May 1, 1989, Paul, “A Comparison of the of Record Contributions of Common-mode and Differential Mode Currents in Radiated Emissions”, IEEE Transactions on Electromagnetic Compatability, vol. 31.2, pp. 189-193.
Aug. 1, 1989, King et al., Michael King Lecture Notes, pp. 1-14.
May 1, 1982, Bonner et al., “Advanced Printed-Circuit Board Design for High Performance Computer Applications”, IBM Journal of Research and Development vol. 26.3, pp. 297-305.
Jan. 1, 1989, Hnatek et al., “Quality Issues of High Pin Count Fine Pitch VLSI Packages”, IEEE International Test Conference, pp. 397-421.
May 1, 1989, Jayaraj et al., “Performance of Low Loss, High Speed Interconnects for Multi-GHz Digital Systems”, IEEE Proceedings of the Aerospace and Electronics Conference, vol. 4, pp. 1674-1681.
Jan. 1, 1989, Liang et al., “High-Performance VLSI Through Package-Level Interconnects”, IEEE Proceedings 39th Electronic Components Conference, pp. 518-523.
Jun. 1, 1987, Palusinski et al., “Electrical Modeling of Interconnections in Multilayer Packaging Structures”, IEEE Transactions on Components, Hybrids, and Manufacturing Technology, vol. 10.2, pp. 217-223.
Sep. 1, 1987, Kwon et al., “Closely Packed Microstrip Lines as Very High Speed Chip-to-Chip Interconnects”, IEEE Transactions on Components, Hybrids and Manufacturing Technology, vol. 10.3, pp. 314-320.
Dec. 1, 1985, Watari et al., “Packing Technology for the NEC SX Supercomputer”, IEEE Transactions on Components, Packaging, and Manufacturing Technology, vol. 8.4 pp. 462-467.
Jan. 1, 1989, Seraphim et al., “Principles of Electronic Packaging”, McGraw-Hill series in electrical engineering.
Nov. 1, 1989, Gisin, “Minimizing Electromagnetic Interference Through Proper Printed Circuit Board Layout Techniques”, Wescon/89 Conference Record, pp. 352-354.
Jan. 1, 1983, Wilson et al., “Theoretical and Experimental Analysis of Coupling Characteristics of Dual TEM Cells”, IEEE 1983 International Symposium on Electromagnetic Compatibility, pp. 513-517.
Jan. 1, 1985, Keenan, Decoupling and Layout of Digital Printed Circuits, 1.0 to A4-4.
Jan. 1, 1989, AMS International, Electronic Materials Handbook: Packaging, vol. 1, pp. 18-34; 76-88; 127-41; 597-610.
Sep. 1, 1987, Mangelsdorf et al., “A VLSI Processor for HP Precision Architecture”, Hewlett-Packard Journal, vol. 38.9, pp. 4-11.
Apr. 1, 1989, Jessen, “VXIbus Product Development Tools”, Hewlett-Packard Journal, vol. 40.2, 96-97.
Apr. 1, 1989, Jessen, “VXIbus: A New Interconnection Standard for Modular Instruments”, Hewlett-Packard Journal, vol. 40.2, pp. 91-95.
Jan. 1, 1990, Akihiro et al., “Packaging Technology for the NEC SX-3/SX Supercomputer”, IEEE Electronic Components and Technology Conference, pp. 525-533.
Jan. 1, 1990, Smith and Savara, “High-Speed Characteristics of Multilayer Ceramic Packages and Test Fixtures”, Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1990. Technical Digest 1990, 12th Annual, pp. 203-206.
Jan. 1, 1990, Shimada et al., “Large Scale Multilayer Glass-Ceramic Substrate for Supercomputer”, IEEE 40th Electronic Components and Technology Conference, 1990, vol. 1, pp. 76-83.
Jan. 1, 1990, Mielke et al., “High-Speed Fixture Interconnects for Mixed-Signal IC Testing”, IEEE International Test Conference, pp. 891-895.
Jan. 1, 1990, Walker, Capacitance, Inducatance, and Crosstalk Analysis, pp. 1-231.
May 1, 1990, Prymak, “Advanced Decoupling Using Ceramic MLC Capacitors”, 40th Electronic Components and Technology Conference, pp. 1014-1023.
Sep. 1, 1990, Moresco, “Electronic System Packaging: The Search for Manufacturing the Optimum in a Sea of Constraints”, IEEE Transactions on Components, Hybrids, and Manufacturing Technology, vol. 13.3, pp. 494-508.
Oct. 1, 1990, Quint et al., “Measurement of R, L, and C Parameters in VLSI Packages”, Hewlett-Packard Journal, vol. 41.5, pp. 73-77.
Feb. 1, 1991, Henke et al., “A Checklist for EMC-Controlled Printed Circuit Board Designs”, Printed Circuit Design, vol. 8.2.
Feb. 1, 1991, Tomlinson, “Bringing Board Layout Up to Speed”, Printed Circuit Design, vol. 8.2, pp. 6-10.
Aug. 1, 1991, Montrose, “Overview on Design Techniques for Printed Circuit Board Layout Used in High Technology Products”, IEEE International Symposium on Electromagnetic Compatibility 1991, pp. 61-66.
Sep. 1, 1991, Nghiem et al., “A General Analysis of Propagation Along Multi-Layer Superconducting Stripline and Microstrip Transmission Lines”, IEEE Transactions on Microwave Theory and Techniques, vol. 39.9, pp. 1553-1565.
Jan. 1, 1991, Tummala et al., “Packaging Technology for IBM's Latest Mainframe Computers (S/390/ES9000)”, IEEE, pp. 682-688.
Jan. 1, 1991, Institute for Interconnecting and Packaging Electronic Circuits, IPC-D-275: Design for Rigid Printed Boards and Rigid Printed Board Assemblies, pp. 1-97.
Jan. 1, 1991, Fluke, Controlling Conducted Emissions by Design, pp. 1-334.
Jan. 1, 1992, Becker et al., “Time Domain Electromagnetic Analysis of a Via in a Multilayer Computer Chip Package”, Microwave Symposium Digest, 1992, IEEE MTT-S International, pp. 1229-1232.
Jan. 1, 1992, Papsioannou et al., “Generic Design Rules for High Speed MCM'S”, IEMT 12th International Electronic Manufacturing Technology Symposium, 1992, pp. 237-244.
Jan. 1, 1992, Wu, “Resistance Computations for Multilayer Packaging Structures by Applying the Boundary Element Method”, IEEE Transactions on Components, Packaging, and Manufacturing Technology, vol. 15.1, pp. 87-96.
Feb. 1, 1992, Teener, “A Bus on a Diet—The Serial Bus Alternative—An Introduction to the P1394 High Performance Serial Bus”, IEEE Digest of Papers of 37th Computer Society International Conference, Compcon Spring 1992, pp. 316-321.
Feb. 1, 1992, Wyatt, “EMC Design of the HP 54600 Series Oscilloscopes”, Hewlett-Packard Journal, vol. 43.1, pp. 41-45.
Apr. 1, 1992, Carey, “Trends in Low Cost High-Performance Substrate Technology”, IEEE Micro, pp. 19-27.
Apr. 1, 1992, DesJardin, “VXIbus: A Standard for Test and Measurement System Architecture”, Hewlett-Packard Journal, vol. 43.2, pp. 6-14.
May 1, 1992, Gravelle et al., “EMI/EMC in Printed Circuit Boards—a Literature Review”, IEEE Transactions on Electromagnetic Compatibility, vol. 34.2, pp. 109-116.
Jul. 1, 1992, de Vreede, et al., “A High Frequency Model Based on the Physical Structure of the Ceramic Multilayer Capacitor”, IEEE Transactions on Microwave Theory and Techniques, vol. 40.7, pp. 1584-1587.
Jan. 1, 1992, Murano et al., “Packaging Technology for the NEC SX-3 Supercomputer”, IEEE Transaction on Components, Hybrids, and Manufacturing Technology, pp. 411-417.
Aug. 1, 1992, Pan et al., “The Simulation of High-Speed, High-Density Digital Interconnects in Single Chip Packages and Multichip Modules”, IEEE Transactions on Components, Hybrids, and Manufacturing Technology, vol. 15, No. 4, pp. 465-477.
Aug. 1, 1992 Daijavad et al., “Methodology for Evaluating Practical EMI Design Guidelines Using EM Analysis Programs”, IEEE International Symposium on Electromagnetic Compatibility, 1992, pp. 30-34.
Aug. 1, 1992, Frink et al., “High-Performace Designs for the Low-cost PA-RISC Desktop”, Hewlett-Packard Journal, vol. 43.4, pp. 55-63.
Aug. 1, 1992, Gleason et al., “VLSI Circuits for Low-End and Midrange PA-RISC Computers”, Hewlett-Packard Journal, vol. 43.4, pp. 12-22.
Aug. 1, 1992, Lettang, “ECL Clocks for High-Performance RISC Workstations”, Hewlett-Packard Journal, vol. 43.4, pp. 23-25.
Sep. 1, 1992, Davidson et al., “Physical and electrical design features of the IBM Enterprise System/9000 circuit Module”, IBM J. Res. Develop. vol. 36, No. 5, pp. 877-888.
Oct. 1, 1992, Foss et al., “Fast Interfaces for DRAMs”, IEEE SPECTRUM, vol. 29.10.
Nov. 1, 1992, Bussmann, “Active Compensation of Interconnection Losses for Multi-GHz Clock Distribution Networks”, IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, vol. 39.11, pp. 790-798.
Dec. 1, 1992, Matta, “Advances in Integrated Circuit Packaging: Demountable TAB”, Hewlett-Packard Journal, vol. 43.6, pp. 62-77.
Dec. 1, 1992, Thomas et al., “Software for the HP EISA SCSI Card”, Hewlett-Packard Journal, vol. 43.6, pp. 97-108.
Jan. 1, 1993, Rao et al., “Manufacture of Advanced Cu-PI Multi Chip Modules”, IEEE Proceedings 43rd Electronic Components and Technology Conference, pp. 920-934.
Jan. 1, 1993, “Finite-Difference Time-Domain Modeling of Noise in Computer Packages”, IEEE, pp. 123-127.
Feb. 1, 1993, Jouppi et al., “A 300MHz 115W 32b Bipolar ECL Microprocessor with On-Chip Caches”, IEEE 40th International Solid-State Circuits Conference, 1993 Digest of Papers, pp. 84-85.
Jan. 1, 1993, Iqbal et al., “Design Tradeoffs Among MCM-C, MCM-D and MCM- D/C Technologies”, Multi-Chip Module Conference, 1993. MCMC-93, Proceedings, 1993 IEEE, pp. 12-18.
Jan. 1, 1993, Becker et al., “Power Distribution Modelling of High Performance First Level Computer Packages”, IEEE Electrical Performance of Electronic Packaging, 1993, pp. 202-205.
Aug. 1, 1993, Downing et al., “Decoupling Capacitor Effects on Switching Noise”, IEEE Transactions on Components, Hybrids, and Manufacturing Technology, vol. 16.5, pp. 484-489.
Nov. 1, 1993, Blennemann et al., “High Aspect Ratio Lines as Low Distortion High Frequency Off-Chip Interconnects”, IEEE Transactions on Components, Hybrids, and Manufacturing Technology, vol. 16.7, pp. 692-698.
Oct. 1, 1993, Becker et al., “Finite-Difference Time-Domain Modeling of Currents in Multi-Layered Computer Chip Packages”, IEEE Electrical Performance of Electronic Packaging, 1993, pp. 181-184.
Oct. 1, 1993, Yamaguchi et al., “Packaging Technology for High-Speed Multichip Module Using Copper-Polyimide Thin Film Multilayer Substrate [for B-ISDN]”, Electronic Manufacturing Technology Symposium, 1993, Fifteenth IEEE/CHMT International, pp. 406-410.
Dec. 1, 1993, Intel, “AP-125: Designing Microcontroller Systems for Electrically Noisy Environments”, pp. 1-21.
Jan. 1, 1993, Institute for Interconneciting and Packaging Electronic Circuits, IPC-T-50: Terms and Definitions Interconnecting and Packaging Electronic Circuits, pp. 1-71.
Feb. 1, 1993, IEEE, IEEE Std 1155-1992: IEEE Standard for VMEbus Extentions for Instrumentation: VXIbus, pp. 1-199.
Jun. 1, 1993, Asprey et al., “Performance Features of the PA7100 Microprocessor”, IEEE Micro, vol. 13.3, pp. 22-35.
Jun. 1, 1993, McLellan, “The Alpha AXP Architecture and 21064 Processor”, IEEE Micro, vol. 13.3, pp. 36-47.
Jan. 1, 1994, Kambe et al., “MCM Substrate with of Record High Capacitance”, Proceedings of the 1994 International Conference on Multichip Modules, pp. 136-141.
Jan. 1, 1994, Center for Electronic Pacakaging Research, “Simulataneous Switching Noise: Influence of Plane-Plane and Plane-Signal Trace Coupling”, Electronic Components and Technology Conference, 1994. Proceedings, 44th, pp. 957-961.
Jan. 1, 1994, Dimos et al., “Thin Film Decoupling Capacitors for Multichip Modules”, Electronic Components and Technology Conference, 1994. Proceedings, 44th, pp. 894-899.
Jan. 1, 1994, Ida et al., “An L-Band Power Amplifier Multi-Chip-Module Using Multi-Layered Planar Circuits”, IEEE MTT-S International Microwave Symposium Digest 1994, vol. 3, pp. 1649-1652.
Jan. 1, 1994, Schaper et al., “Electrical Characterization of the Interconnected Mesh Power System (IMPS) MCM Topology”, IEEE Proceedings 44th Electronic Components and Technology Conference, 1994, pp. 791-795.
Jan. 1, 1994, Hirano et al., “Characterization and of Record Reduction of Simultaneous Switching Noise for a Multilayer Package”, IEEE Proceedings of 44th Electronic Components and Technology Conference, 1994, pp. 949-956.
Jan. 1, 1994, Huang et al., “CBGA Package Design for C4 PowerPC Microprocessor Chips: Trade-off Between Substrate Routability and Performance”, Electronic Components and Technology Conference, 1994. Proceedings, 44th, pp. 88-93.
Jan. 1, 1994, AT&T, Carrierless AM/PM (CAP) Host-DSL Transceiver Layout Guide, pp. 1-24.
May 1, 1994, Yamanak et al., “320 Gb/s High-Speed ATM Switching System Harware Technologies Based on Copper-Polyimide MCM”, IEEE 44th Electronic Components and Technology Confrerence, pp. 776-785.
Jan. 1, 1994, Iqbal et al., “Design Tradeoffs Among MCM-C, MCM-D and MCM-D/C Technologies”, IEEE Transactions on Components, Packaging, and Manufacturing Technology—Part B: Advanced Packaging, pp. 22-29.
Jul. 1, 1994, Schwab et al., “Multilayer Suspended Stripline and Coplanar Line Filters”, IEEE Transactions on Microwave Theory and Techniques, vol. 42.7, pp. 1403-1407.
Oct. 1, 1994, Garg et al., “Thermal Design of an Advanced Multichip Module for a RISC Processor”, IEEE International Conference on Computer Design: LVSI in Computers and Processors, 1994, pp. 608-611.
May 1, 1994, Light et al., “Process Considerations in the Fabrication of Teflon Printed Circuit Boards”, IEEE Proceedings of the Electronic Components and Technology Conference, 1994, pp. 542-549.
Jan. 1, 1994, Swaminathan et al., “Electrical Design of a MCM for a Multiprocessor Systems”, MCM '94 Proceedings, pp. 480-486.
May 1, 1994, Wu et al., “Modeling and Simulation of Integral Decoupling Capacitors in Single and Multichip Module Electronics Packaging”, IEEE Proceedings 44th Electronic Components and Technology Conference, 1994, pp. 945-948.
May 1, 1994, Panicker et al., “Low-Cost Ceramic Thin-Film Ball Grid Arrays”, IEEE Proceedings 44th Electronic Components and Technology Conference, 1994, pp. 29-31.
Jun. 1, 1994, Sudo, “Present and Future Directions for Multichip Module Technologies”, IEEE Symposium on VLSI Circuits, 1994. Digest of Technical Papers, pp. 51-54.
May 1, 1994, DeHaven and Dietz, “Controlled Collapse Chip Connection (C4)—an Enabling Technology”, IEEE Proceedings of 44th Electronic Components and Technology Conference, 1994, pp. 1-6.
Jan. 1, 1994, Fang et al., “Effects of Losses in Power Planes in the Simulation of Simultaneous Switching Noise”, Proceedings of the 3rd Topical Meeting on Electrical Performance of Electrical Packaging, pp. 110-112.
Apr. 1, 1994, Light et al., “Integrated Flex: Rigid-Flex Capability in a High Performance MCM”, MCM '94 Proceedings, pp. 430-442.
Jan. 1, 1994, Jastech, Advanced EMC Printed Circuit Board Design, pp. 1 to 8-15.
Jan. 1, 1994, Hannemann et al., Semiconductor Packaging a Multidisciplinary Approach, pp. 1-886.
Feb. 23, 2009, Intel Corp, Intel Corp Form 10-K of Record for period ending Dec. 17, 2008.
Feb. 20, 2008, Intel Corp, Intel Corp Form 10-K of Record for period ending Dec. 29, 2007.
Sep. 1, 1994, Ogasawara et al., “High Isolation Analog 4 X 4 Matrix Switch LSI for Centralized Control Microcell Radio Systems”, 5th IEEE International Symposium on Personal, Indoor and Mobile Radio Communications, 1994. Wireless Networks—Catching the Mobile Future, vol. 1, pp. 369-371.
Dec. 1, 1994, IEEE Standards Board, IEEE Standard for Medical Device Communications—Physical Layer Interface—Cable Connected.
Jan. 1, 1995, Vaidyanath et al., “Simultaneous Switching Noise: Influence of Plane-Plane and Plane-Signal Trace Coupling”, IEEE Transactions on Components, Packaging, and Manufacturing Technology—Part B, vol. 18.3, pp. 496-502.
Jan. 1, 1995, Lester et al., “Low Cost Miniaturized EHF Satcom Transceiver Featuring HEMT MMICS and LTCC Multilayer Packaging”, IEEE 1995 Microwave and Millimeter-Wave Monolithic Circuits Symposium, pp. 35-38.
Jan. 1, 1995, Liaw, “Simulation and Modeling of Mode Conversion at Vias in Multilayer Interconnections”, IEEE Proceedings of the 45th Electronic Components and Technology Conference, 1995, pp. 361-367.
Jan. 1, 1996, Montrose, Printed Circuit Board Design Techniques for EMC Compliance, pp. 1-238.
Feb. 1, 1995, Yamanaka et al., “30 Gb/s High-speed ATM Switching System Hardware Technologies Based on Copper-Polymide MCM”, IEEE Transactions on Components, Packaging, and Manufacturing Technology—Part B: Advanced Packaging, vol. 18.1, pp. 83-91.
Apr. 1, 1995, Pearson, “A Low-Cost, High-Performance PA-RISC Workstation with Built-in Graphics Multimedia, and Networking Capabilities”, Hewlett-Packard Journal, vol. 46.2, pp. 6-11.
Feb. 1, 1995, Kambe, et al., “MCM Substrate with of Record High Capacitance”, IEEE Transactions on Components, Packaging, and Manufacturing Technology- Part B, vol. 18.1, pp. 23-27.
Oct. 1, 1995, Cohn, “Shielded Coupled-Strip Transmission Line”, IRE Transactions on Microwave Theory and Techniques, vol. 3.5, pp. 29-38.
Sep. 1, 1995, Murphy et al., “High Frequency Performance of Multilayer Capacitors”, IEEE Transactions on Microwave Theory and Techniques, vol. 43, No. 9, 2007-2015.
Mar. 1, 1995, Dimos et al., “Thin-Film Decoupling Capacitors for Multichip Modules”, IEEE Transactions on Components Packaging, and Manufactuing Technology, Part A, vol. 18.1, pp. 174-179.
Feb. 1, 1995, Sarfaraz et al., “Electrical Design of an MCM Package for a Multi-Processor Digital System”, IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part B. vol. 18, No. 1, pp. 127-143.
Nov. 1, 1995, Lee et al., “Modeling and Analysis of Multichip Module Power Supply Planes”, IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, vol. 18.4, pp. 628-639.
May 1, 1995, Hussein, “FDTD Applications to Electromagnetic Interference and Shielding, WESCANEX 95. Communications, Power, and Computing”, Conference Proceedings. IEEE, pp. 478-482.
Feb. 1, 1995, Light et al., “Integrated Flex: Rigid-Flex Capability in a High Performance MCM”, IEEE Transactions on Components, Packaging and Manufacturing Technology, Part B, vol. 18.1, pp. 47-52.
Dec. 1, 1995, Huang et al., “A Packaging System for Built-in Microcircuits in Multilayer Substrates”, 1995 Japan IEMT Symposium: Proceedings of 1995 International Electronic Manufacturing Technology Symposium, pp. 460-463.
Jan. 1, 1995, Institute for Interconnecting and Pacakaging Electronic Circuits, IPC-D-137A: Design Guidelines for Electronic Packaging Utilizing High-Speed Techniques, pp. 1-70.
Nov. 6, 1995, Miskell, “Avoid EMI Woes in Power-Bus Layouts”, Electronic Design, vol. 43.23, pp. 147-150.
Jan. 1, 1995, Wu et al., “Precise CMOS Current Sample/Hold Circuits Using Differential Clock Feedthrough Attenuation Techniques”, IEEE Journal of Solid-State Circuitry, vol. 30.1, pp. 76-80.
Apr. 1, 1995, Lee, “Accelerating Multimedia with Enhanced Microprocessors”, IEEE Micro, vol. 15.2, p. 22-32.
Mar. 1, 1995, Hunt, “Advanced Performance Features of the 64-bit PA-8000”, Compcon '95, ‘Technologies for the Information Superhighway’, Digest of Papers, pp. 123-128.
Dec. 1, 1995, IEEE Standards Board, IEEE Standard for a High Performance Serial Bus.
Apr. 1, 1995, Edmondson et al., “Superscalar Instruction Execution in the 21164 Alpha Microprocessor”, IEEE Micro, vol. 15.2, 33-43.
Apr. 1, 1995, Bass et al., “The PA 7100LC Microprocessor: A Case Study of 1C Design Decisions in a Competitive Environment”, Hewlett-Packard Journal, vol. 46.2, 12-22.
Feb. 1, 1996, Fessler et al., “The Effectiveness of of Record an Image Plane in Reducing Radiated Emissions”, IEEE Transactions on Electromagnetic Compatibility, vol. 38.1, pp. 51-61.
Feb. 1, 1996, Kromann et al., “A Hi-Density C4/CBGA Interconnect Technology for a CMOS Microprocessor”, IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, vol. 19.1, pp. 166-173.
Feb. 1, 1996, Intel, AP-711: EMI Design Techniques for Microcontrollers in Automotive Applications, pp. 1-21.
Feb. 1, 1996, Wu et al., “1.2V CMOS Switched-Capacitor Circuits”, IEEE 42nd International Solid-State Circuits Conference, 1996, pp. 388-389, 479.
Feb. 1, 1996, Bryg et al., “A High-Performance, Low-Cost Multiprocessor Bus for Workstations and Midrange Servers”, Hewlett-Packard Journal, vol. 47.1, pp. 18-24.
Feb. 1, 1996, Chan et al., “Design of the HP PA 7200 CPU”, Hewlett-Packard Journal, vol. 47.1, pp. 25-33.
Feb. 1, 1996, Harline et al., “Symmetric Multiprocessing Workstations and Servers System-Designed for High Performance and Low Cost”, Hewlett-Packard Journal, vol. 47.1, pp. 8-17.
Feb. 1, 1996, Hotchkiss et al., “A New Memory System Design for Commercial and Technical Computing Products”, Hewlett-Packard Journal, vol. 47.1, pp. 44-51.
Mar. 1, 1996, Intel, AP-524 Pentium® Pro Processor GTL+ Guidelines, pp. 1-26.
Mar. 21, 1996, IEEE Standards Board, IEEE Standard for Low-Voltage Differential Signals (LVDS) for Scalable Coherent Interface (SCI), pp. 1-29.
Apr. 26, 1996, Bauer, “BGA and Flip-Chip Technologies: A to Z”, SEMICON/Test, Assembly & Paclahing 96.
May 1, 1996, Aguirre et al., “Numerical Investigation of Radiated Emissions Mechanisms in Single-Chip Packages”, IEEE Proceedings of 46th Electronic Components and Technology Conference, 1996, pp. 996-1001.
May 1, 1996, Madhaven et al., “A Novel High Speed Low Skew Clock Distribution Scheme in 0.8 Micron CMOS”, 1996 IEEE International Symposium on Circuits and Systems, 1996. ISCAS '96., Connecting the World, vol. 4, pp. 149-152.
Jul. 1, 1996, Ommodt et al., “Vertical Interconnects for Phased Array Packaging”, IEEE Antennas and Propagation Society International Symposium, vol. 2, pp. 1334-1337.
Oct. 1, 1996, Fang et al., “Reduction of Power and Ground Noise Coupling in Mixed Signal Modules”, IEEE 5th Topical Meeting on Electrical Performance of Electronic Packaging, 1996, pp. 90-92.
Oct. 1, 1996, Lei et al., “Power Distrubution Noise Suppression Using Transmission Line Termination Techniques”, Proceedings of the 5th Topical Meeting on the Electrical Performance of Electrical Packaging, pp. 100-102.
Jan. 1, 1996, Libous et al., “Measurement, Modeling and Simulation of Flip-Chip CMOS ASIC Simultaneous Switching Noise on a Multi-Layer Ceramic BGA”, IEEE, pp. 120-122.
Jan. 1, 1996, Institute for Inerconnecting and Packaging Electronic Circuits, IPC-T-50: Terms and Definitions Interconnecting and Packaging Electronic Circuits, pp. 1-101.
Dec. 1, 1996, Slater, “The Microprocessor Today”, IEEE Micro, vol. 16.6, pp. 32-44.
Dec. 1, 1996, Yu, The Future of Microprocessors, IEEE Micro, vol. 16.6, pp. 46-53.
Jan. 1, 1997, Konsowski et al., Electronic Packaging of High Speed Circuitry, pp. 1-417.
Jan. 1, 1997, Allan et al., “A Low-Cost Workstation with Enhanced Performance and I/O Capabilities”, Hewlett-Packard Journal, vol. 48.3, pp. 82-88.
Oct. 1, 1997, Pillai, “Coax Via—A Technique to Reduce Crosstalk and Enhance Impedance Match at Vias in High-Frquency Multilayer Packages Verified by FDTD and MoM Modeling”, IEEE Transactions on Microwave Theory and Techniques, vol. 45, No. 10, pp. 1981-1985.
Nov. 1, 1997, Koike et al., “High-Speed Signal Transmission at the Front of a Bookshelf Packaging System”, IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part B. vol. 20, No. 4, pp. 353-360.
Jan. 1, 1998, Petefish et al., “High Density Organic Flip Chip Package Substrate Technology”, IEEE 1998 Electronic Components and Technology Conference, pp. 1089-1097.
Feb. 1, 1998, Deutsch, “Electrical Characteristics of Interconnections for High-Performance Systems”, Proceedings of the IEEE, vol. 86.2, pp. 315-355.
Feb. 1, 1998, Vichot et al., “Numerical Modeling of a Clock Distribution Network for a Superconducting Multichip Module”, IEEE Transactions on Components, Packaging, and Manufacturing Technology—Part B, vol. 21, No. 1, pp. 98-104.
Feb. 1, 1998, Institute for Interconnecting and Packaging Electronic Circuits, IPC-2221: Generic Standard on Printed Board Design, pp. 1-97.
Aug. 1, 1998, Karies, “Radiated Emissions from Printed Circuit Board Traces Including the Effect of Vias, as a Function of Source, Termination and Board Characteristics”, IEEE International Symposium on Electromagnetic Compatibility 1998, vol. 2, pp. 872-877.
Oct. 1, 1998, Brown, Advanced Electronic Packaging with Emphasis on Multichip Modules, pp. 1-791.
Jan. 1, 1998, Low et al., “Via Design Optimisation for High Speed Device Packaging”, IEEE/CPMT Electronics Packaging Technology Conference, pp. 112-118.
Jan. 1, 1998, Lau et al., Electronic Packaging Design, Materials, Process, and Reliability, pp. 1-482.
Jan. 1, 1998, Martens, High-Frequency Characterization of Electronic Packaging, pp. 1-155.
Jan. 1, 1999, Shigeta et al., “Improved EMI Performance by Use of a Three-Terminal-Capacitor Applied to an IC Power Line”, IEEE International Symposium on Electromagnetic Compatibility, 1999, vol. 1, pp. 161-164.
Feb. 1, 1999, Intel Corporatio, AP-589: Design for EMI, pp. 1-14.
Aug. 1, 1999, Erdin et al., “Mixed Circuit/Electromagnetic Analysis of Field Coupling to High Speed Interconnects in Inhomogenous Medium”, IEEE International Symposium on Electromagnetic Compatibility, 1999, vol. 1, pp. 446-449.
Aug. 1, 1999, Armstrong, “PCB Design Techniques for Lowest-Cost EMC Compliance: Part 1”, Electronics & Communication Engineering Journal, pp. 218-226.
Oct. 1, 1999, Armstrong, “PCB Design Techniques for Lowest-Cost EMC Compliance: Part 2”, Electronics & Communication Engineering Journal, pp. 185-194.
Jan. 1, 1999, Li et al., “Validation of Integrated Capacitor-Via-Planes Model”, IEEE, pp. 121-124.
Jan. 1, 1999, Yew et al., “Design and Performance Evaluation of Chip Capacitors on Microprocessor Packaging”, IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging, pp. 175-178.
Jan. 1, 2000, Chen, “Effects of 20-H Rule and Sheilding Vias on Electromagnetic Radiation From Printed Circuit Boards”, IEEE, pp. 193-196.
Jan. 1, 2000, Ilavarasan et al., “Currect and Future EMI Challenges at Intel and How to Manage Them”, IEEE, pp. 281-283.
Jan. 1, 2000, Tadayon, “Thermal Challenges During Microprocessor Testing”, Intel Technology Journal.
Jan. 1, 2000, Dory et al., “Simultaneous Chip-Join and Underfill Assembly Technology for Flip-Chip Packaging”, Intel Technology Journal.
Jan. 1, 2000, Grayeli, “Microprocessor Packaging: Evolution and Future Challenges”, Intel Technology Journal.
Jan. 1, 2000, Viswanath et al., “Thermal Performance Challenges From Silicon to Systems”, Intel Technology Journal.
Jul. 1, 2000, Benedict, “PCB Design for EMI/EMC Compliance”, WEMPEC Seminar.
Aug. 1, 2000, Li et al., “Design and Performance Evaluation of Microprocessor Packaging Capcitors Using Integrated Capcitor-Via-Plane Model”, IEEE Transactions on Advanced Packaging, vol. 23.3, pp. 361-367.
Aug. 1, 2000, Mahajan et al., “The Evolution of Microprocessor Packaging”, Intel Technology Journal, vol. 4.3, pp. 1-10.
Aug. 1, 2000, Lii et al., “Flip-Chip Technology on Organic Pin Grid Array Packages”, Intel Technology Journal, vol. 4.3, pp. 1-9.
Aug. 1, 2000, Mencinger, “A Mechanism-Based Methodology for Processor Package Reliability Assessments”, Intel Technology Journal, vol. 4.3, pp. 1-8.
Jan. 1, 2001, Ye et al., “EMI Mitigation with Multilayer Power-Bus Stacks and Via Stitching of Reference Planes”, IEEE Transactions on Electromagnetic Compatibility, vol. 43.4, pp. 538-548.
Jan. 1, 2001, zilog.com, Product Update for Z86C02/E02/L02, Z86C04/E04/L04, Z86C08/E08/L08 to Clarify the Output Drive in Low-EMI Mode.
Aug. 1, 2001, Shim et al., “20-H Rule Modeling and Measurements”, IEEE International Symposium on Electromagnetic Compatibility 2001, vol. 2, pp. 939-942.
Sep. 1, 2001, Gisin et al., “Minimizing EMI Caused by Radially Propagating Waves Inside High Speed Digital Logic PCBs”, TELSIKS 2001, pp. 624-631.
Jan. 1, 2002, He et al., “Study of Package EMI Reduction for GHz Micropricessors”, IEEE, pp. 271-274.
Jan. 1, 2003, Muccioli et al., “A Microwave Test Fixture for Measuring Four-Terminal Passive Components from DC to 10 GHz”, Interference Technology.
Jan. 1, 2004, Sanders et al., “Comparison of MLCC and X2Y Technology for Use in Decoupling Circuits”, CARTS 2004: 24th Annual Capacitor and Resistor Technology Symposium, Mar. 29-Apr. 1.
Aug. 1, 2004, Sanders, A Better Approach to DC Power Filtering.
Mar. 21, 2005, Sanders et al., “The Quantitative Measurement of the Effectiveness of Decoupling Capacitors in Controlling Switching Transients from Microprocessors”, 25th Annual Passive Components Conference CARTS 2005 , pp. 1-16.
May 1, 2005, Montrose et al., “Analysis on the Effectiveness of the 20-H Rule for Printed-Circuit-Board Layout to Reduce Edge-Radiated Coupling”, IEEE Transactions on Electromagnetic Compatibility, vol. 47.2, pp. 227-233.
Nov. 9, 2005, Various, Various, Intel Technology Journal.
May 1, 2008, Ikami et al., “Practical Analysis on 20H Rule for PCB”, 2008 Asia-Pacific Symposium on Electromagnetic compatibility, pp. 180-183.
Apr. 26, 2012, Swigget of Prismark Partners LLC, “Product Teardown Report”, filed in ITC Investigation No. 33-TA-781.
Jan. 1, 1999, Montrose, EMC and the Printed of Record Circuit Board—Design, Theory, and Layout Made Simple, pp. 1-325.
Dec. 18, 1996, Lamson, U.S. Appl. No. 60/033,673.
Apr. 26, 2012, Stanley Shanfield, Expert Report on Stanley Shanfield, Ph.D Regarding Invalidity of U.S. Patent Nos, 6,738,249, 7,110,227, 7,609,500, 7,773,621, 7,916,444, and 8,023,241.
Apr. 26, 2012, Andreas Cangellaris, Expert Report of Andreas Cangellaris, Ph.D. Regarding Invalidity of U.S. Patent Nos. 6,738,249, 7,110,227, 7,609,500, 7,733,621, 7,916,777, and 8,023,241.
Apr. 26, 2012, Vivek Subramanian Initial Expert Report of Vivek Subramanian, Ph.D.
May 11, 2012, Vivek Subramanian, Rebuttal Expert Report of Vivek Subramanian, Ph.D.
Apr. 26, 2012, Dean P. Neikirk, Opening Expert Report of Dean P. Neikirk, PHD, Regarding X2Y's Patent Portfolio and Claim Construction, Infringement and Domestic Indusrty Technical Prong, for United States Patent Nos. 6,738,249, 7,110,227, 7,609,500, 7,733,621, 7,916,444, and 8,023,241, vol. 1.
May 11, 2012, Dean P. Neikirk, Rebuttal Expert Report of Dean P. Neikirk, PHD, Regarding Claim Construction, Validity, and Other Mtters Relating to United States Patent Nos. 6,738,249, 7,110,227, 7,609,500, 7,733,621, 7,916,444, and 8,023,241, vol. 1.
May 11, 2012, Dean P. Neikirk, Rebuttal Expert Report of Dean P. Neikirk, PHD, vol. 2.
May 11, 2012, Dean P. Neikirk, Rebuttal Expert Report of Dean P. Neikirk, PHD, vol. 8.
May 11, 2012, Dean P. Neikirk, Rebuttal Expert Report of Dean P. Neikirk, PHD, vol. 9.
May 11, 2012, Dean P. Neikirk, Rebuttal Expert Report of Dean P. Neikirk, PHD, vol. 10.
May 11, 2012, Dean P. Neikirk, Rebuttal Expert Report of Dean P. Neikirk, PHD, vol. 11.
May 11, 2012, Dean P. Neikirk, Rebuttal Expert Report of Dean P. Neikirk, PHD, vol. 12.
May 11, 2012, Dean P. Neikirk, Rebuttal Expert Report of Dean P. Neikirk, PHD, vol. 13.
May 11, 2012, Dean P. Neikirk, Rebuttal Expert Report of Dean P. Neikirk, PHD, vol. 14.
May 11, 2012, Dean P. Neikirk, Rebuttal Expert Report of Dean P. Neikirk, PHD, vol. 15.
May 21, 2012 Intel Corporation Apple Inc., and Hewlett-Packard Comapny, Respondents'Motion for Summary Determination of Indefiniteness of Asserted Claims of the '621, '444, and '241 Patents.
May 31, 2012, X2Y Attenuators, LLC, X2Y's Memorandum of Law in Oppositon to Respondents'Motion for Summary Determination of Indefiniteness of Asserted Claims of the 621, 444, and 241 Patents.
Feb. 22, 2012, X2Y Attenuators, LLC, Complainant X2Y Attenuators, LLC's Responses and Objesctions to Respondents'Eight Set of Interrogatories (No. 109-148).
Related Publications (1)
Number Date Country
20140116770 A1 May 2014 US
Provisional Applications (21)
Number Date Country
60280819 Apr 2001 US
60302429 Jul 2001 US
60310962 Aug 2001 US
60200327 Apr 2000 US
60215314 Jun 2000 US
60225497 Aug 2000 US
60255818 Dec 2000 US
60146987 Aug 1999 US
60165035 Nov 1999 US
60180101 Feb 2000 US
60185320 Feb 2000 US
60191196 Mar 2000 US
60203863 May 2000 US
60139182 Jun 1999 US
60136451 May 1999 US
60241128 Oct 2000 US
60253793 Nov 2000 US
60248914 Nov 2000 US
60252766 Nov 2000 US
60388388 Jun 2002 US
60349954 Jan 2002 US
Continuations (11)
Number Date Country
Parent 13195495 Aug 2011 US
Child 14082082 US
Parent 13079789 Apr 2011 US
Child 13195495 US
Parent 12749040 Mar 2010 US
Child 13079789 US
Parent 12030253 Feb 2008 US
Child 12749040 US
Parent 10479506 US
Child 12030253 US
Parent 13195495 Aug 2011 US
Child 14082082 US
Parent 13079789 Apr 2011 US
Child 13195495 US
Parent 12749040 Mar 2010 US
Child 13079789 US
Parent 12030253 Feb 2008 US
Child 12749040 US
Parent 10479506 Dec 2003 US
Child 12030253 US
Parent 09056379 Apr 1998 US
Child 09460218 US
Continuation in Parts (14)
Number Date Country
Parent 10023467 Dec 2001 US
Child 10479506 US
Parent 09996355 Nov 2001 US
Child 10023467 US
Parent 10003711 Nov 2001 US
Child 09996355 US
Parent 09982553 Oct 2001 US
Child 10003711 US
Parent 14082082 US
Child 10003711 US
Parent 10115159 Apr 2002 US
Child 10479506 US
Parent 09845680 Apr 2001 US
Child 10115159 US
Parent 09777021 Feb 2001 US
Child 09845680 US
Parent 09632048 Aug 2000 US
Child 09777021 US
Parent 09594447 Jun 2000 US
Child 09632048 US
Parent 09579606 May 2000 US
Child 09594447 US
Parent 09460218 Dec 1999 US
Child 09579606 US
Parent 09008769 Jan 1998 US
Child 09056379 US
Parent 08841940 Apr 1997 US
Child 09008769 US