The present application relates to chemical vapor infiltration (CVI) processes, and more particularly, to CVI apparatuses and components thereof used in depositing a biocompatible material onto a porous implant in the CVI process.
Orthopedic implants may be constructed of, or coated with, porous biomaterial to encourage bone growth into the implant. The need for cancellous bone substitute and/or cell and tissue receptive material is significant. Bone ingrowth into the voids of a porous material provides ideal skeletal fixation for permanent implants used for the replacement of bone segments damaged or lost due to any number of reasons, or for joint prostheses in some instances. Biological compatibility, intimate contact with the surrounding bone, and adequate stability during the early period of bone ingrowth have been identified as important requirements, along with proper porosity. One example of such material with biological compatibility and other traits is a porous tantalum metal or metal alloy, produced using Trabecular Metal™ technology generally available from Zimmer Biomet, Inc., of Warsaw, Ind. Trabecular Metal™ is a trademark of Zimmer Biomet, Inc.
Processes for forming porous bio-compatible materials are known. In one such process, reticulated open cell carbon foam is infiltrated with a metal or metal alloy (e.g., tantalum, tantalum alloys, etc.) by a chemical vapor infiltration (CVI) (sometimes also referred to as chemical vapor deposition (CVD)) process. The resulting lightweight, strong, porous structure, mimics the microstructure of natural cancellous bone, and acts as a matrix for the incorporation of bone or reception of cells and tissue. Although this technique has proven to be very effective, in some instances, deposition of the metal can be uneven and/or deposition efficiency may be lower than desired. This can be due to lack of adequate mixing of gases used for the infiltration. Thus, portions of the carbon foam or porous metal can be over-densified or under-densified relative to a desired density. In some cases, these portions are removed necessitating additional processing steps and time.
The present inventors recognize, among other things, an opportunity to distribute gases so as to mix more uniformly during the CVI process. More particularly, the present inventors recognize that a separate mixing chamber in addition to the reaction chamber can facilitate mixing of precursor gases more uniformly with the result being a higher reaction efficiency. The more thoroughly mixed precursor gases can then enter the reaction chamber to react and infiltrate substrates. This better mixing of the precursor gases results in a higher reaction efficiency and helps achieve a more uniform density profile within and along the substrate. Although described in reference to CVI processes that utilize a metal or metal alloy (e.g., tantalum or tantalum alloy) in a precursor gas and a reticulated open cell carbon foam or porous metal substrate, the principles can be utilized for other CVI/CVD processes where a more uniform distribution of precursor gas is desirable.
The present inventors further recognize various apparatus configurations for the CVI apparatus and mixing chamber that can facilitate a higher efficiency reaction of the precursor gases due to better mixing. Other advantages are also realized. The CVI apparatus can have two reaction chambers separate from one another. The CVI apparatus can be configured to facilitate changing the inlets) location for a third gas (sometimes also referred to as “third precursor gas”, such as hydrogen gas (H2)) relative to a second gas (sometimes referred to as “second precursor gas”, such as tantalum pentachloride (TaCl5)). The present inventors additionally recognize a modular configuration for the CVI apparatuses that allows for a rapid change of inlet(s) location. The present inventors further recognize that the CVI apparatuses disclosed herein can facilitate the manufacture of medical implants, and permit the fabrication of load-bearing substrates with high or low density coating as desired. Post fabrication processing can thereby be reduced, saving time and cost.
To further illustrate apparatuses and methods disclosed herein, a non-limiting list of examples is provided here:
Example 1 is an apparatus for use in a chemical vapor infiltration process. The apparatus can optionally include any one or combination of a first reaction chamber, a mixing chamber and a second reaction chamber. The first reaction chamber can have an inlet configured to receive a first gas and can have outlet therefrom for a second gas reacted in the first reaction chamber. The mixing chamber can have an inlet in fluid communication with the outlet of the first reaction chamber. The mixing chamber can have one or more second inlets thereto configured to receive a third gas, the mixing chamber can have an outlet therefrom. The second reaction chamber can have an inlet in fluid communication with the outlet of the mixing chamber to receive a mixture of the second gas and the third gas therein. The second reaction chamber can be configured to hold a substrate therein that is coated by reaction of the second gas and the third gas within the second reaction chamber.
Example 2 is the apparatus of Example 1, wherein optionally the first reaction chamber has a frustoconical shape with a first cross-sectional area adjacent the outlet that is relatively smaller as compared with a second cross-sectional area adjacent the inlet.
Example 3 is the apparatus of any one of Examples 1-2, wherein optionally the one or more second inlets include one or more inlets through a side wall of the mixing chamber and/or one or more inlets through an end wall of the mixing chamber.
Example 4 is the apparatus of Example 3, wherein optionally the mixing chamber includes one or more vortex inducing features therein in fluid communication with the one or more inlets through the side wall.
Example 5 is the apparatus of Example 4, wherein optionally an interior of the side wall of the mixing chamber includes the one or more vortex inducing features.
Example 6 is the apparatus of any of Examples 3-5, wherein optionally the one or more inlets through the side wall of the mixing chamber and one or more inlets through the end wall of the mixing chamber are selectively closeable.
Example 7 is the apparatus of any one of Examples 1-6, wherein optionally the outlet of the mixing chamber has a flange and is tapered to have reduced cross-sectional area at an exit of the outlet.
Example 8 is an apparatus for use in a chemical vapor infiltration process. The apparatus can optionally include any one or any combination of a first reaction chamber, a mixing chamber and a second reaction chamber. The first reaction chamber can be configured to receive a first precursor gas and hold a biocompatible material. The first precursor gas and the biocompatible material can react within the first reaction chamber to form a second precursor gas. The mixing chamber can have at least a first inlet, a second inlet and an outlet. The first inlet can be in fluid communication with the first reaction chamber to receive the second precursor gas from the first reaction chamber and the second inlet can be in fluid communication to receive a third precursor gas. The second precursor gas and the third precursor gas can mix within the mixing chamber before passing to the outlet. The second reaction chamber can be configured to receive the second precursor gas and the third precursor gas mix and can have a pedestal to hold a substrate therein. The substrate can receive a film deposition from reaction of the second precursor gas and the third precursor gas within the second reaction chamber.
Example 9 is the apparatus of Example 8, wherein optionally the mixing chamber adjacent the outlet is tapered with a flange and has a first cross-sectional area at an exit of the outlet that is relatively smaller than a second cross-sectional area spaced from the exit.
Example 10 is the apparatus of any one of Examples 8-9, wherein optionally the first reaction chamber has a frustoconical shape with a first cross-sectional area adjacent the outlet that is relatively smaller as compared with a second cross-sectional area adjacent the inlet.
Example 11 is the apparatus of any one of Examples 8-10, wherein optionally the second inlet includes one or more inlets through a side wall of the mixing chamber and/or one or more inlets through an end wall of the mixing chamber.
Example 12 is the apparatus of Example 11, wherein optionally the mixing chamber includes one or more vortex inducing features therein in fluid communication with the one or more inlets through the side wall.
Example 13 is the apparatus of any one of Examples 8-12, wherein optionally the substrate comprises a reticulated carbon foam or porous metal.
Example 14 is the apparatus of any one of Examples 8-13, wherein optionally the second precursor gas includes a tantalum or tantalum alloy.
Example 14 is a chemical vapor deposition method. The method can include any one or any combination of: reacting a first precursor gas with a biocompatible material to form a second precursor gas in a first chamber, mixing the second precursor gas with a third precursor gas in a second chamber, reacting the second precursor gas with the third precursor gas after the mixing in a third. chamber, and depositing a film deposition on a substrate within the third chamber as a result of the reacting the second precursor gas with the third precursor gas.
Example 16 is the method of Example 15, wherein optionally the substrate comprises a reticulated carbon foam or porous metal structure having a porosity of between 55% and 90%.
Example 17 is the method of any one of Examples 15-16, wherein optionally the second precursor gas includes a tantalum or tantalum alloy.
Example 18 is the method of any one of Examples 15-17, wherein optionally mixing the second precursor gas with the third precursor gas optionally includes creating a vortex of a flow of the third precursor gas upon entry into the second chamber.
Example 19 is the method of any one of Examples 15-18, wherein optionally mixing the second precursor gas with the third precursor gas optionally includes passing the second precursor gas and the third precursor gas through one or more a turbulent flow inducing structures at an outlet from the second mixing chamber.
Example 20 is the method of any one of Examples 15-19, wherein optionally mixing the second precursor gas with the third precursor gas optionally includes passing the third precursor gas through one or more inlets through a side wall of the second chamber.
In Example 21, the apparatuses or method of any one or any combination of Examples 1-20 can optionally be configured such that all elements or combinations of elements or options recited are available to use or select from.
These and other examples and features of the present apparatuses and methods will be set forth in part in the following Detailed Description. This Overview is intended to provide non-limiting examples of the present subject matter—it is not intended to provide an exclusive or exhaustive explanation. The Detailed Description below is included to provide further information about the present apparatus, systems and methods.
In the drawings, which are not necessarily drawn to scale, like numerals may describe similar components in different views. Like numerals having different letter suffixes may represent different instances of similar components. The drawings illustrate generally, by way of example, but not by way of limitation, various embodiments discussed in the present document.
The present application relates to apparatuses and their use in CVI)/CVI processes. As previously discussed, the apparatuses disclosed herein contemplate the use of a dedicated mixing chamber for mixing of two or more precursor gases prior to entering a reaction chamber. Use of this mixing chamber can improve mixing of the gases and can result in a higher reaction efficiency,
The substrate 102 can include a plurality of ligaments 104 defining a plurality of highly interconnected, three-dimensional open spaces or pores 106 (highly exaggerated in
According to certain examples of the present disclosure, the porous implant 100 can have a porosity as low as 55%, 65%, or 75% or as high as 80%, 85%, or 90%, or within any range defined between any pair of the foregoing values. As will be discussed in further detail, the porous implant 100 can be formed from a reticulated vitreous carbon foam substrate, metal substrate, porous metal substrate or other material substrate which is infiltrated and coated with a biocompatible metal, such as tantalum, by a CVD process (also called a CVI process herein). Such a CVI) process is disclosed in detail in U.S. Pat. No. 5,282,861, in Levine, B. R., et al., “Experimental and Clinical Performance of Porous Tantalum in Orthopedic Surgery”, Biomaterials 27 (2006) 4671-4681, and U.S. Pat. Nos. 9,277,998 and 8,956,683, the disclosures of which are expressly incorporated herein by reference in their entirety. In addition to or alternative to tantalum, other biocompatible metals may also be used in the formation of the highly porous metal structure such as the coating. These biocompatible materials include titanium, a titanium alloy, cobalt chromium, cobalt chromium molybdenum, tantalum, a tantalum alloy, niobium, or alloys of tantalum and niobium with one another or with other metals such as those discussed previously. It is also within the scope of the present disclosure for the porous implant 100 to be in the form of a fiber metal pad or a sintered metal layer, such as a Cancellous-Structured Titanium™ (CSTi™) layer. CSTi™ porous layers are manufactured by Zimmer Biomet, Inc., of Warsaw, Ind. Cancellous-Structured Titanium™ and CSTi™ are trademarks of Zimmer Biomet, Inc.
Generally, the porous implant 100 will include the plurality of metallic ligaments 104 defining open pores 106 (e.g., voids) or channels therebetween. The open spaces between the ligaments form a matrix of continuous channels having few or no dead ends, such that growth of soft tissue and/or bone through open porous metal is substantially uninhibited. Thus, the porous implant 100 can provide a lightweight, strong porous structure which is substantially uniform and consistent in composition, and provides a matrix (e.g., closely resembling the structure of natural cancellous bone) into which soft tissue and bone may grow to provide fixation of the implant to surrounding bodily structures.
The porous implant 100 may also be fabricated such that it comprises a variety of densities in order to selectively tailor the structure for particular orthopedic applications. In particular, the porous implant 100 may be fabricated to virtually any desired density, porosity, and pore size (e.g., pore diameter), and can thus be matched with the surrounding natural tissue in order to provide an improved matrix for tissue ingrowth and mineralization. According to certain examples, the porous implant 100 can be fabricated to have a substantially uniform porosity, density, and/or void (pore) size throughout, or to comprise at least one of pore size, porosity, and/or density being varied within the structure. For example, the porous implant 100 may have a different pore size and/or porosity at different regions, layers, and surfaces of the structure. The ability to selectively tailor the structural properties of the porous implant 100, for example, enables tailoring of the structure for distributing stress loads throughout the surrounding tissue and promoting specific tissue ingrown within the porous implant 100.
With a reticulated vitreous carbon (RVC) substrate, polymer foam material can be converted into the RVC substrate by first impregnating the polymer foam with a carbonaceous resin and then heating the impregnated foam to a suitable pyrolysis temperature, on the order of 800° C.-2000° C., to convert the polymer foam and any carbonaceous resin into vitreous carbon having individual carbon foam ligaments. The RVC may be shaped into the final form of the orthopedic implant using machining or other shaping techniques. Using CVI, a biocompatible material, such as tantalum, niobium, tungsten, alloys thereof, or other metal(s) previously discussed may then be coated onto the RVC substrates in a heated reaction chamber. For example, in order to deposit tantalum onto the RVC substrates, solid tantalum metal (Ta) is heated to react with chlorine gas (Cl2) to form tantalum chloride gas, such as tantalum pentachloride (TaCl5), for example. The tantalum chloride gas flows into the reaction chamber and is mixed with hydrogen gas (H2). Upon contact with the heated surface of the substrates, as shown in Equation 1 below, tantalum metal deposits onto the substrates in a thin film over the individual ligaments of the substrates and the hydrogen and chlorine gases react to form hydrogen chloride gas (HCl), which is exhausted from the reaction chamber via one or more outlets.
TaCl5+5/2H2→Ta+5HCl Equation 1:
This CVI cycle may be repeated, with the positions of the substrates in the reaction chamber varied, until the substrates are uniformly coated with tantalum. Following each CVI cycle, the hydrogen chloride gas byproduct and any non-converted tantalum chloride gas may react with water and aqueous sodium hydroxide solution to precipitate tantalum oxide, sodium chloride, and water, as is shown in Equation 2.
2HCl(g)+2TaCl5(g)+H2O(l)+12NaOH(aq)→Ta2O5(g)+12NaCl(aq)+8H2O(l) Equation 2:
The second reaction chamber 208 includes one or more outlets at a second end generally opposing the end wall 230 and inlet 228 that are not specifically shown in the examples of
The first reaction chamber 204 can be in fluid communication with the mixing chamber 206, and the mixing chamber 206 can be in fluid communication with the second reaction chamber 208 as further discussed herein. In the example of
As shown in
The inlet 210 can pass through the end wall 214A. The end wall 214A can be a top of the apparatus 200 and can be generally opposed by the second end wall 214B and the outlet 216. The outlet 216 can pass through the end wall 214B. The outlet 216 can generally align with the inlet 210. Thus, the inlet 210 and the outlet 216 can generally oppose one another at opposite ends of the first reaction chamber 204. The side wall 212 can extend between the end wall 214A and the end wall 214B.
The side wall 212 and end walls 214A, 214B can be shaped to provide the first reaction chamber 204 with a frustoconical shape having a first cross-sectional area adjacent the outlet 216 that is relatively smaller as compared with a second cross-sectional area adjacent the inlet 210. The interior of the first reaction chamber 204 can be designed as a reservoir for a biocompatible material. Thus, the interior can be configured to hold solid elements such as pellets, nuggets, chunks or scraps of biocompatible material (e.g., tantalum, niobium, tungsten, alloys thereof, etc.). The biocompatible material is not specifically shown in
As discussed, the first reaction chamber 204 can comprise a chlorination chamber. In some cases, the first reaction chamber 204 can be designed as a hot wall furnace, A resistance heater (not shown) or other type of heating device can surround the first reaction chamber 204, and/or other chambers 206, 208. The heater could also be positioned within the first reaction chamber 204 (and/or other chambers 206, 208) or within the side wall 212 and/or end walls 214A, 214B according to other contemplated examples. The heater can heat the interior of the first reaction chamber 204 to at least 500° C. Side wall 212 and end walls 214A, 214B thus can be constructed of suitable mated al(s) to withstand heating.
The first precursor gas (e.g., chlorine gas) can pass from the inlet 210 over the biocompatible material and can react therewith to form a second precursor gas (e.g., gaseous tantalum pentachloride (TaCl5), gaseous niobium chloride, gaseous tungsten chloride, or gaseous alloys of one or more of tantalum, niobium or tungsten chloride). This second precursor gas can exit the first reaction chamber 204 via the outlet 216.
The first inlet 218 of the mixing chamber 206 can receive the second precursor gas from the first reaction chamber 204. The first inlet 218 can pass through the end wall 224A. The end wall 224A can be a topmost part or adjacent a topmost part of the mixing chamber 206 and can be generally opposed by the second end wall 224B and the outlet 226. Thus, the outlet 226 can generally align with the first inlet 218. The outlet 226 can pass through the end wall 224B. Thus, the first inlet 218 and the outlet 226 can generally oppose one another at opposite ends of the mixing chamber 206. The side wall(s) 222 can extend between the end wall 224A and the end wall 224B.
The second inlet 220 can pass through the end wall 224A but can be offset from the first inlet 218. The second inlet 220 can be located at a topmost part of the mixing chamber 206, for example. Although a single second inlet 220 is shown in
The side wall(s) 222 and end walls 224A, 224B can be shaped to provide the mixing chamber 206 any desired shape and size as appropriate Within the interior of the mixing chamber 206, the second precursor gas (e.g., gaseous tantalum pentachloride (TaCl5)) can mix with the third precursor gas (e.g., hydrogen (H2)) so as to become substantially homogenized within the mixing chamber 206. This mixing of the gases may be further facilitated by one or more features as discussed in
The inlet 228 of the second reaction chamber 208 can receive the mix of the second precursor gas and the third precursor gas and pass the mix of the second precursor gas and the third precursor gas into the second reaction chamber 208. The inlet 228 can be through the end wall 230 of the second reaction chamber 208. Side wall(s) 232 extend from the end wall 230 toward a second end wall and/or outlet (not shown). The pedestal 234 can be positioned within an interior of the second reaction chamber 208 such as directly below the inlet 228 and can be configured to hold the substrate 102 (
The second reaction chamber 208 can be designed as a hot wall furnace with a cylindrical shape. However, other shapes are contemplated. A resistance heater (not shown) or other type of heating device can surround the second reaction chamber 208. The heater could also be positioned within the second reaction chamber 208 or within the side wall(s) 232 and/or end wall 230 according to other contemplated examples. The heater can heat the interior of the second reaction chamber 208 to at least 900° C. in order to drive the deposition reaction between hydrogen gas (example of the third precursor gas), air, and tantalum chloride gas (example of the second precursor gas). The reaction can produce a surface reaction that deposits metal (e.g., Ta) as a coating on the substrate 102 (
The CVI process and the apparatus 100 may be configured to facilitate adjustment of certain processing parameters, such as time, temperature, gas flow rates, and pressure levels. To determine the effect of varying these parameters, and in order to improve the CVI process, deposition efficiency and weight variance are measured. Deposition efficiency is a process output that determines the percentage of tantalum (or other suitable metal) that successfully deposits onto the substrate 102 (
Deposition Efficiency=(Material Adeposited/Material Asource) Equation 3
The present inventors have recognized that deposition efficiency can be increased by adequate mixing of the second precursor gas and the third precursor gas prior to entry into the second reaction chamber 208. This mixing is facilitated by the dedicated mixing chamber 206.
It should be noted that increasing the deposition efficiency is not equivalent to increasing the deposition rate. Deposition rate, in contrast to deposition efficiency, is the rate at which tantalum is deposited onto the substrate 102. If tantalum is deposited onto the substrate 102 too rapidly, the tantalum may not effectively infiltrate the pores (not shown) of the substrate 102 and therefore may be thicker and non-uniform on the exterior of the substrate 102 but thinner on the internal ligaments of the substrate 102.
Weight variance (WV) is a process output measuring the variance, or standard deviation squared, in the weight of one of the substrate 102 after one CVI cycle. To determine the change in weight variance, the weight variance of an individual substrate 102 after one CVI cycle is subtracted from the weight variance measured for that same substrate 102 in the subsequent CVI cycle, as is shown in Equation 4: ΔWV=WVafter−WVbefore
Deposition efficiency and weight variance affect the number of CVI cycles that must be performed in order to uniformly coat each substrate 102. Therefore, by decreasing the weight variance and increasing the deposition efficiency, the overall time required to produce a porous metal implant decreases because fewer CVI cycles are needed to form a uniform metal coating on the substrate 102. Additionally, improvements in weight variance and deposition efficiency may eliminate some processing steps, such as rearranging the substrate 102 after each CVI cycle in order to deposit a uniform metal coating onto the substrate 102.
An outlet 326 of the mixing chamber 304 can be configured to additionally provide for further mixing of the third precursor gas with the second precursor gas. This can be provided by the outlet 326 of the mixing chamber 304 having a flange 308 or other structure. The outlet 326 can further be tapered to have reduced cross-sectional area at an exit 326A of the outlet 326 relative to an entrance 326B of the outlet 326. The flange 308 and/or taper can provide for turbulent flow at the outlet 326 and into the inlet of the second reaction chamber that can further mix the third precursor gas with the second precursor gas.
The method 600 can optionally include the substrate comprises a reticulated carbon foam or porous metal structure having a porosity of between 55% and 90%. The second precursor gas can include a tantalum or tantalum alloy. The mixing the second precursor gas with the third precursor gas can include creating a vortex of a flow of the third precursor gas upon entry into the second chamber. The mixing the second precursor gas with the third precursor gas can include passing the second precursor gas and the third precursor gas through one or more a turbulent flow inducing structures at an outlet from the second mixing chamber. The mixing the second precursor gas with the third precursor gas can include passing the third precursor gas through one or more inlets through a side wall of the second chamber.
The above detailed description includes references to the accompanying drawings, which form a part of the detailed description. The drawings show, by way of illustration, specific embodiments in which the invention can be practiced. These embodiments are also referred to herein as “examples.” Such examples can include elements in addition to those shown or described. However, the present inventors also contemplate examples in which only those elements shown or described are provided. Moreover, the present inventors also contemplate examples using any combination or permutation of those elements shown or described (or one or more aspects thereof), either with respect to a particular example (or one or more aspects thereof), or with respect to other examples (or one or more aspects thereof) shown or described herein.
In the event of inconsistent usages between this document and any documents so incorporated by reference, the usage in this document controls. In this document, the terms “a” or “an” are used, as is common in patent documents, to include one or more than one, independent of any other instances or usages of “at least one” or “one or more.” In this document, the term “or” is used to refer to a nonexclusive or, such that “A or B” includes “A but not B,” “B but not A,” and “A and B,” unless otherwise indicated. In this document, the terms “including” and “in which” are used as the plain-English equivalents of the respective terms “comprising” and “wherein.” Also, in the following claims, the terms “including” and “comprising” are open-ended, that is, a system, device, article, composition, formulation, or process that includes elements in addition to those listed after such a term in a claim are still deemed to fall within the scope of that claim. Moreover, in the following claims, the terms “first,” “second,” and “third,” etc. are used merely as labels, and are not intended to impose numerical requirements on their objects.
The above description is intended to be illustrative, and not restrictive. For example, the above-described examples (or one or more aspects thereof) may be used in combination with each other. Other embodiments can be used, such as by one of ordinary skill in the art upon reviewing the above description. The Abstract is provided to comply with 37 C.F.R. § 1.72(b), to allow the reader to quickly ascertain the nature of the technical disclosure. 11t is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims. Also, in the above Detailed Description, various features may be grouped together to streamline the disclosure. This should not be interpreted as intending that an unclaimed disclosed feature is essential to any claim. Rather, inventive subject matter may lie in less than all features of a particular disclosed embodiment. Thus, the following claims are hereby incorporated into the Detailed Description as examples or embodiments, with each claim standing on its own as a separate embodiment, and it is contemplated that such embodiments can be combined with each other in various combinations or permutations. The scope of the invention should be determined with reference to the appended claims, along with the full scope of equivalents to which such claims are entitled.
This application claims the benefit of U.S. Provisional Patent Application Ser. No. 63/303,695, filed on Jan. 27, 2022, the benefit of priority of which is claimed hereby, and which is incorporated by reference herein in its entirety.
Number | Date | Country | |
---|---|---|---|
63303695 | Jan 2022 | US |