Contactless interconnection system

Information

  • Patent Grant
  • 6362972
  • Patent Number
    6,362,972
  • Date Filed
    Thursday, April 13, 2000
    25 years ago
  • Date Issued
    Tuesday, March 26, 2002
    24 years ago
Abstract
A contactless interconnecting system is provided between a computer chip package and a circuit board. The system includes a computer chip package having a silicon wafer mounted on a support structure which includes a wall with a substantially planar upper surface. The wall is fabricated of a dielectric material. A pattern of discrete terminal lands are disposed on the upper surface of the wall and are electrically coupled to the silicon wafer. A circuit board is juxtaposed below the wall of the chip package and includes a substantially planar upper surface having a pattern of discrete circuit pads aligned with the terminal lands.
Description




FIELD OF THE INVENTION




This invention generally relates to the art of electrical connections and, particularly, to a contactless interconnecting system between a computer chip package and a circuit board.




BACKGROUND OF THE INVENTION




As semiconductor devices become more complex, the interconnections between the silicon wafer or “die” and appropriate circuit hardware continue to evolve and become more complex because of the difficulty of mechanical interconnections. This is due, in part, to the ever-increasing miniaturization and high density of electronic circuitry. Transmitted signals are becoming faster and faster (i.e., higher frequencies) and semi-conductor packages are becoming thinner and thinner (i.e., closely compacted). In some anticipated applications, it may be practically impossible to use conventional interconnecting systems, i.e., typical metal contacts or terminals.




Typical mechanical interconnecting systems incorporate conventional terminal pins and sockets or other male and female configurations or interengaging spring connections. With such traditional metal-to-metal interconnections, it is essential to provide a wiping action between the terminals or contacts to remove contaminants or oxidants. Unfortunately, miniaturized semi-conductor interconnections are so small that such traditional mechanical interconnecting systems are not possible. Even traditional solder connections are difficult if at all possible because of the extremely complex hard tooling required for use with miniaturized or closely spaced components of a semi-conductor interconnecting system. In some applications, it may be necessary to rely on electrical or magnetic field coupling as a possible alternative, and the present invention is directed to satisfying this need and solving the problems enumerated above.




SUMMARY OF THE INVENTION




An object, therefore, of the invention is to provide a new and improved contactless interconnecting system, particularly such a system between a computer chip package and a circuit board.




In the exemplary embodiment of the invention, the system includes a computer chip package having a silicon wafer or “die”. A support structure mounts the wafer and includes a wall with a substantially planar upper surface and a substantially planar lower surface. The wall is fabricated of a material having a relatively high dielectric constant. A pattern of discrete terminal lands are provided on the upper surface of the wall and are electrically coupled to the silicon wafer. A circuit board is disposed below the wall of the computer chip package and includes a substantially planar upper surface having a pattern of discrete circuit pads aligned with the terminal lands.




As disclosed herein, the wall of the chip package comprises an exterior wall of a housing within which the silicon wafer is packaged. The wall may be fabricated of a material having a relatively high dielectric constant.




Other objects, features and advantages of the invention will be apparent from the following detailed description taken in connection with the accompanying drawings.











BRIEF DESCRIPTION OF THE DRAWING




The features of this invention which are believed to be novel are set forth with particularity in the appended claims. The invention, together with its objects and the advantages thereof, may be best understood by reference to the following description taken in conjunction with the accompanying drawing in which

FIG. 1

is a fragmented vertical section through a contactless interconnecting system according to the invention.











DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT




Referring to the drawing in greater detail, the invention is embodied in a contactless interconnecting system, generally designated


10


, between a computer chip package, generally designated


12


, and a circuit board


14


or other substrate, such as a printed circuit board. As used herein and in the claims hereof, such terms as “upper”, “lower”, “top”, “bottom”, “vertical” and the like are not in any way intended to be limiting. Such terms are used only to provide a clear and concise description and understanding of the invention in view of the drawings. Obviously, the system herein is omni-directional in use and application.




Chip package


12


of system


10


includes a housing


15


having a bottom outside wall


16


. A silicon wafer or “die”


18


is mounted on a substantially planar upper surface


20


of a wall


16


, whereby the wall provides a support structure for the wafer. A pattern of discrete terminal lands


22


are provided on upper surface


20


of wall


16


and are electrically coupled to silicon wafer


18


. The pattern of terminal lands define gaps


23


therebetween. The wall


16


also has a substantially planar lower surface


21


.




Circuit board


14


of system


10


is disposed in a generally parallel relationship below wall


16


of chip package


12


. The circuit board has a substantially planar upper surface


26


with a pattern of discrete circuit pads


28


aligned with terminal lands


22


. The pattern of discrete circuit pads


28


also define spaces


29


therebetween similar to the gaps


23


defined by the pattern of discrete terminal lands


22


. The circuit pads


28


are electrically connected to respective circuitry on the circuit board.




The invention contemplates that wall


16


of computer chip package


12


is disposed directly between terminal lands


22


of the chip package and circuit pads


28


of circuit board


14


. In one embodiment, the lower surface


21


of the wall


16


mounts directly on the circuit pads


28


. In another embodiment, the wall is fabricated of a material having a high dielectric constant relative to the material (e.g., air) filling the gaps


23


and spaces


29


to prevent cross coupling between adjacent terminal lands


22


and prevent cross coupling between adjacent circuit pads


28


. In a further embodiment, the wall is fabricated of a material that has a dielectric constant of at least 200. Of course, a variety of materials or compositions could provide such a desired dielectric constant. However, as signal frequencies increase, the magnitude of the dielectric constant required of the wall


16


may decrease. In an additional embodiment, the thickness of the wall


16


should be thin relative to the width of gaps


23


between terminal lands


22


and spaces


29


between circuit pads


28


to promote coupling between aligned terminal lands


22


and circuit pads


28


and to prohibit cross coupling between adjacent terminal lands


22


or adjacent circuit pads


28


.




It can be seen from the above, that a portion of the computer chip package (i.e., wall


16


) is efficiently used to provide an electromagnetic coupling between silicon wafer


18


and circuit board


14


. In essence, the wall


16


provides both a support structure as well as an interposing dielectric medium in a plurality of capacitors where terminal lands


22


and the circuit pads


28


act as half-capacitors on opposite sides of the interposing dielectric medium provided by wall


16


. Signals are capacitively transferred between the terminal lands


22


of the chip package and the circuit pads


28


of the circuit board


14


. Therefore, all other extraneous interconnecting components are eliminated, and the circuit board


14


, along with circuit pads


28


, can be interconnectingly mounted immediately adjacent the bottom surface of wall


16


of the chip package.




It will be understood that the invention may be embodied in other specific forms without departing from the spirit or central characteristics thereof. The present examples and embodiments, therefore, are to be considered in all respects as illustrative and not restrictive, and the invention is not to be limited to the details given herein.



Claims
  • 1. A contactless interconnecting system between a computer chip package and a circuit board, comprising:a computer chip package including a silicon wafer; a support structure mounting the silicon wafer, the support structure including a wall with a substantially planar upper surface, the wall being fabricated of a dielectric material, a pattern of discrete conductive terminal lands disposed on the upper surface of said wall and electrically coupled to the silicon wafer; and, a circuit board positioned below said wall of the computer chip package, the circuit board including a substantially planar upper surface having a pattern of discrete, conductive circuit pads aligned with said chip package terminal lands, said circuit pads and terminal pads being separated from each other by said support structure wall and not being conductively connected.
  • 2. The contactless interconnecting system of claim 1, wherein said support structure includes a housing within which the silicon wafer is packaged, and said wall defines an exterior wall of the housing.
  • 3. The contactless interconnecting system of claim 1 wherein said wall is fabricated of a material having a dielectric constant of at least 200.
  • 4. A contactless interconnecting system between a computer chip package and a circuit board, comprising:a computer chip package including a housing having an exterior wall including a substantially planar inner surface, the wall being fabricated of a dielectric material, and a silicon wafer mounted in the housing, a pattern of discrete, conductive terminal lands on the interior surface of said wall and electrically coupled to the silicon wafer; and, a circuit board juxtaposed against the exterior of said wall, the circuit board including a substantially planar surface, said circuit board further including a pattern of discrete, conductive circuit pads disposed on a surface thereof that lies against said wall, the circuit pads being aligned with said terminal lands through the wall.
  • 5. The contactless interconnecting system of claim 4 wherein said wall is fabricated of a material having a dielectric constant of at least 200.
  • 6. A contactless interconnecting system between a computer chip package and a circuit board, comprising:a computer chip package including a silicon wafer, a support structure mounting the silicon wafer and including a dielectric wall with a substantially planar upper surface and a lower surface, a pattern of discrete terminal lands disposed on the upper surface of said wall and electrically coupled to the silicon wafer; and, a circuit board below said wall of the computer chip package and including a substantially planar upper surface having a pattern of discrete circuit pads aligned with said terminal lands, said lower surface of said wall engaging said discrete circuit pads, said circuit pads and terminal lands being separated from each other by said dielectric wall and not being conductively connected together.
  • 7. A contactless interconnecting system between a computer chip package and a circuit board, comprising:a computer chip package including a silicon wafer, a support structure mounting the silicon wafer, said support structure including at least one solid dielectric wall with a substantially planar upper surface, a pattern of discrete terminal lands disposed on the upper surface of said wall and electrically coupled to the silicon wafer; and, a circuit board below said wall of the computer chip package and including a substantially planar upper surface having a plurality of discrete circuit pads disposed thereon in a pattern matching that of said terminal lands so that said circuit pads are aligned with said terminal lands and separated therefrom by said dielectric wall.
US Referenced Citations (103)
Number Name Date Kind
3585368 Nunamaker Jun 1971 A
3593319 Barber Jul 1971 A
3604900 Kalt Sep 1971 A
3621478 Johnson et al. Nov 1971 A
3629733 Podell Dec 1971 A
3719804 Illing Mar 1973 A
3869082 Ludin Mar 1975 A
3974332 Abe et al. Aug 1976 A
4139827 Russell Feb 1979 A
4144485 Akita Mar 1979 A
4145624 Upadhyayula Mar 1979 A
4280119 May Jul 1981 A
4480178 Miller, II et al. Oct 1984 A
4553026 Arlowe Nov 1985 A
4633291 Koyama Dec 1986 A
4634847 Jürgen Jan 1987 A
4700152 Wilson Oct 1987 A
4752680 Larson Jun 1988 A
4763340 Yoneda et al. Aug 1988 A
4795898 Bernstein et al. Jan 1989 A
4798322 Bernstein et al. Jan 1989 A
4816653 Anderl et al. Mar 1989 A
4816654 Anderl et al. Mar 1989 A
4818855 Mongeon et al. Apr 1989 A
4835373 Adams et al. May 1989 A
4841128 Gröttrup et al. Jun 1989 A
4853523 Talmadge Aug 1989 A
4876535 Ballmer et al. Oct 1989 A
4918416 Walton et al. Apr 1990 A
4931991 Cvijanovich Jun 1990 A
4953123 Takeuchi et al. Aug 1990 A
5012321 Magarshack Apr 1991 A
5021767 Fockens et al. Jun 1991 A
5027191 Bourdelaise et al. Jun 1991 A
5073761 Waterman et al. Dec 1991 A
5148263 Hamai Sep 1992 A
5159181 Bartels et al. Oct 1992 A
5175418 Tanaka Dec 1992 A
5212402 Higgins, III May 1993 A
5229652 Hough Jul 1993 A
5266821 Chern et al. Nov 1993 A
5309324 Herandez et al. May 1994 A
5324205 Ahmad et al. Jun 1994 A
5378887 Kobayashi Jan 1995 A
5435733 Chernicky et al. Jul 1995 A
5451763 Pickett et al. Sep 1995 A
5471040 May Nov 1995 A
5532658 Tonegawa et al. Jul 1996 A
5572441 Boie Nov 1996 A
5579207 Hayden et al. Nov 1996 A
5583378 Marrs et al. Dec 1996 A
5589709 Dobkin et al. Dec 1996 A
5593322 Swamy et al. Jan 1997 A
5594233 Kenneth et al. Jan 1997 A
5598029 Suzuki Jan 1997 A
5598032 Fidalgo Jan 1997 A
5629838 Knight et al. May 1997 A
5640306 Gaumet et al. Jun 1997 A
5652423 Saitoh et al. Jul 1997 A
5668399 Cronin et al. Sep 1997 A
5672911 Patil et al. Sep 1997 A
5682061 Khandros et al. Oct 1997 A
5701032 Fisher et al. Dec 1997 A
5701037 Weber et al. Dec 1997 A
5706174 Distefano et al. Jan 1998 A
5714864 Rose et al. Feb 1998 A
5771157 Zak Jun 1998 A
5777383 Stager et al. Jul 1998 A
5786979 Douglass Jul 1998 A
5793668 Krakovyak Aug 1998 A
5804811 Saitoh et al. Sep 1998 A
5810606 Ballast et al. Sep 1998 A
5818112 Weber et al. Oct 1998 A
5834832 Kweon et al. Nov 1998 A
5841122 Kirchhoff Nov 1998 A
5847447 Rozin et al. Dec 1998 A
5854480 Noto Dec 1998 A
5856710 Baughman et al. Jan 1999 A
5929510 Geller et al. Jul 1999 A
5929517 Distefano et al. Jul 1999 A
5936841 Kantner et al. Aug 1999 A
5938452 Wojnarowski Aug 1999 A
5938479 Paulson et al. Aug 1999 A
5949060 Schattschneider et al. Sep 1999 A
5949155 Tamura et al. Sep 1999 A
5952709 Kitazawa et al. Sep 1999 A
5965867 Haghiri-Tehrani Oct 1999 A
5977631 Notani Nov 1999 A
5977841 Lee et al. Nov 1999 A
6001211 Hiroyuki Dec 1999 A
6005777 Bloom et al. Dec 1999 A
6028497 Allen et al. Feb 2000 A
6049463 O'Malley et al. Apr 2000 A
6057600 Kitazawa et al. May 2000 A
6069404 Aufinger et al. May 2000 A
6073855 MacKenthun Jun 2000 A
6081030 Jaouen et al. Jun 2000 A
6118357 Tomasevic et al. Sep 2000 A
6124625 Chern et al. Sep 2000 A
6124636 Kusamitsu Sep 2000 A
6152373 Roberts et al. Nov 2000 A
6173897 Halpern Jan 2001 B1
6191479 Herrell et al. Feb 2001 B1
Non-Patent Literature Citations (16)
Entry
IBM Technical Disclosure Bulletin, Nonmechanical Connection Technique for High Speed, High Density Integrity Circuit Application, Jan., 1968.
IBM Technical Disclosure Bulletin, Cross Talk Coupled Transmission Line Driver, Mar. 1972.
IBM Technical Disclosure Bulletin, Capacative Coupled Connector, Jul., 1975.
EDO Electro-Ceramic Products, Piezoelectric Ceramic Overview & Power Compositon Formulation.
Thomas D. Simon and Thomas F. Knight, Jr., M.I.T. Transit Project, Transit Note #57, A Fast Static Gate.
Lipeng Cao and J. Peter Krusius, School of Electrical Engineering, Cornell University, Smart Packages and Interconnect Substrates-Computing Functions Using Signal Line Coupling.
David B. Salzman, Ph.D., Polychip, Inc. and Thomas F. Knight, Jr. Ph.D., MIT Artificial Intelligence Laboratory, Capacitively Coupled Multichip Modules.
Thomas F. Knight, Jr., Ph.D., MIT Artificial Intelligence Laboratory and David B. Salzman, Polychip, Inc., Ph.D., Manufacturability of Capacitively Coupled Multichip Modules.
David Salzman, Ph.D., Poly Chip, Inc., Thomas Knight, Jr., Ph.D., Polychip, Inc. and MIT A.I. Lab and Paul Franzon, Ph.D., North Carolina State University, Application of Capacitive Coupling to Switch Fabrics.
J.S. Yuan and J.J. Liou, University of Central Florida, Parasitic Capacitance Effects.
Wally Meinel, Burr Brown Corporation, Plastic Molded Analog Isolation Amplifier.
Paul D. Franzon, Department of Electrical and Computer Engineering, North Carolina State University, Low-Power, High-Performance MEMS-based Switch Fabric.
A.D. Berard, J.J. Pitarra and J. R. Pivnichny, IBM, Jul. 1975, Capacitive Coupled Connector.
G.M. Krembs, IBM, Apr., 1971, Capacitive-Coupled Connectors for Gaseous Discharge Display Panels.
W.T. Pimbley, IBM, Jul. 1975, Magnetic Ink Container for supplying Constant Density Magnetic Ink.
Mitsuru Sekiguchi, Toyokazu Fujii and Michinari Yamanaka, Semiconductor Research Center, Matsuhita Electric Industries Co, Inc., Feb. 1996, Suppression of Resistance Increase in Annealed A1/W Interconnects by Capacitively Coupled Plasma Nitridation on W Surface.