Number | Date | Country | Kind |
---|---|---|---|
P2001-107409 | Apr 2001 | JP |
Number | Name | Date | Kind |
---|---|---|---|
5129060 | Pfeiffer et al. | Jul 1992 | A |
5146592 | Pfeiffer et al. | Sep 1992 | A |
5535134 | Cohn et al. | Jul 1996 | A |
5994913 | Lee | Nov 1999 | A |
6061813 | Goishi | May 2000 | A |
6360341 | Yoshinaga | Mar 2002 | B1 |
6502216 | Takano | Dec 2002 | B1 |
6505324 | Cowan et al. | Jan 2003 | B1 |
Number | Date | Country |
---|---|---|
11-251389 | Sep 1999 | JP |
2001-84793 | Mar 2001 | JP |
Entry |
---|
Tanoi et al., “On-Wafer BIST of a 200Gb/s Failed-Bit Search for 1Gb DRAM”, IEEE, p. 70-73, 1997.* |
Ubar, R.et al.; “Generation of tests for the localization of single gate design errors in combinational circuits using the stuck-at fault model”; XI Brazilian Symposium on 30 Sep.-3 Oct. 1998. Page(s): 51-54.* |
Yoshimura, et al.; “A three-dimensional sensor for automatic visual inspection of soldered parts”; 15th Annual Conference of IEEE, Nov. 6-10, 1989; Page(s): 562-567 vol. 3. |