Claims
- 1. A method for manufacturing a master die for a diffusion plate, comprising:providing a substrate having a photoresist; providing a mask having a master pattern, the master pattern including a least first and second patterns, each having a uniform arrangement superimposed over each other, the first and second patterns being at least one of out of rotational phase by a predetermined angle and having different dimensions; and illuminating the photoresist through the mask, thereby forming an image of the master pattern in the photoresist.
- 2. The method of manufacturing a master die of claim 1, wherein the first pattern includes a plurality of circles arranged with a maximum density.
- 3. The method of manufacturing a master die of claim 1, wherein the first pattern has a positional fluctuation.
- 4. The method of manufacturing a master die of claim 1, wherein the first pattern includes a plurality of hexagonal shapes having maximum density.
- 5. The method of claim 1, wherein said first and second patterns are out of rotational phase by 30°, and have identical dimensions.
- 6. The method of claim 1, wherein said first and second patterns are out of rotational phase by 21.78°, and have identical dimensions.
- 7. The method of claim 1, wherein said first and second patterns have different dimensions.
- 8. The method of claim 1, wherein said first and second patterns are out of rotational phase by 45°, and have identical dimensions.
- 9. The method of claim 1, wherein the first and second patterns are out of rotational phase by 45°, and have different lattice vectors.
- 10. The method of claim 1, wherein said first and second patterns are identical.
- 11. The method of claim 1, wherein at least one of said first and second patterns has a lattice vector with positional fluctuations.
- 12. A method for manufacturing a master die for a diffusion plate, comprising:providing a substrate having a photoresist; providing a mask having a master pattern, the master pattern including at least first and second patterns having arrangements superimposed over each other, the first and second patterns having different lattice vectors with positional fluctuation; and illuminating the photoresist through the mask, thereby forming an image of the master pattern in the photoresist.
- 13. The method of claim 12, wherein said first and second patterns are out of rotational phase by 90°.
- 14. The method of claim 12, wherein said mask is transparent, and said first and second patterns are opaque.
Priority Claims (3)
Number |
Date |
Country |
Kind |
3-357495 |
Dec 1991 |
JP |
|
4-90392 |
Feb 1992 |
JP |
|
4-263853 |
Oct 1992 |
JP |
|
Parent Case Info
This is a division of U.S. application Ser. No. 08/980,305, filed Nov. 28, 1997, now U.S. Pat. No. 5,965,327 which is a division of U.S. application No. Ser. No. 08/498,653, filed Jul. 3, 1995, now U.S. Pat. No. 5,733,710, issued Mar. 31, 1998, which is a continuation of U.S. application Ser. No. 08/411,862, filed Mar. 28, 1995, now abandoned, which is a continuation of U.S. application Ser. No. 08/339,295, filed Nov. 10, 1994, now abandoned, which is a continuation of U.S. application Ser. No. 07/985,251, filed Dec. 3, 1992, now abandoned, the contents of which are herein incorporated by reference in its entirety.
US Referenced Citations (17)
Foreign Referenced Citations (7)
Number |
Date |
Country |
2163925 |
Jul 1972 |
DE |
3125205 |
Mar 1982 |
DE |
55-90931 |
Jul 1980 |
JP |
57-148728 |
Sep 1982 |
JP |
59-133533 |
Jul 1984 |
JP |
63-221329 |
Sep 1988 |
JP |
2-226201 |
Sep 1990 |
JP |
Non-Patent Literature Citations (1)
Entry |
English language abstract of JP 2-22621. |
Continuations (3)
|
Number |
Date |
Country |
Parent |
08/411862 |
Mar 1995 |
US |
Child |
08/498653 |
|
US |
Parent |
08/339295 |
Nov 1994 |
US |
Child |
08/411862 |
|
US |
Parent |
07/985251 |
Dec 1992 |
US |
Child |
08/339295 |
|
US |