Testing of electronic circuits

Industry

CPC
G01R31/28

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/28Testing of electronic circuits

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Heating structure and wafer test device
- Patent number 12,237,184
- Issue date Feb 25, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe Lian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Parallel test cell with self actuated sockets
- Patent number 12,235,314
- Issue date Feb 25, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Chip moving device
- Patent number 12,235,316
- Issue date Feb 25, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe Lian
- G01 - MEASURING TESTING
Information Patent Grant
Test system support component exchange system and method
- Patent number 12,235,315
- Issue date Feb 25, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Paul Ferrari
- G01 - MEASURING TESTING
Information Patent Grant
Testing method and testing system
- Patent number 12,237,029
- Issue date Feb 25, 2025
- NANYA TECHNOLOGY CORPORATION
- Bo Jung Peng
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuits and methods for supply voltage detection and timing monito...
- Patent number 12,237,832
- Issue date Feb 25, 2025
- Intel Corporation
- Miguel Bautista Gabriel
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
High voltage monitoring for optical switching applications
- Patent number 12,235,491
- Issue date Feb 25, 2025
- Google LLC
- Dennis Yen
- G01 - MEASURING TESTING
Information Patent Grant
System and method for fault sequence recording
- Patent number 12,235,319
- Issue date Feb 25, 2025
- Texas Instruments Incorporated
- Abhinay Patil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Battery pack simulation apparatus and method of checking battery ma...
- Patent number 12,228,606
- Issue date Feb 18, 2025
- LG ENERGY SOLUTION, LTD.
- Yeon Ok Yi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature compensation of optically isolated probe
- Patent number 12,228,607
- Issue date Feb 18, 2025
- Teledyne LeCroy, Inc.
- Matthew Weinstein
- G01 - MEASURING TESTING
Information Patent Grant
Electronics tester
- Patent number 12,228,609
- Issue date Feb 18, 2025
- AEHR Test Systems
- Gaylord Lewis Erickson
- G01 - MEASURING TESTING
Information Patent Grant
Module type sensor for detecting voltage and current of radio frequ...
- Patent number 12,228,605
- Issue date Feb 18, 2025
- NEWPOWERPLASMA CO., LTD.
- Jinjoong Kim
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe device
- Patent number 12,228,590
- Issue date Feb 18, 2025
- Winbond Electronics Corp.
- Ting-Ming Fu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe station capable of maintaining stable and accurate contact to...
- Patent number 12,228,608
- Issue date Feb 18, 2025
- NANYA TECHNOLOGY CORPORATION
- Yi-Kai Chao
- G01 - MEASURING TESTING
Information Patent Grant
Display device
- Patent number 12,228,830
- Issue date Feb 18, 2025
- Japan Display Inc.
- Takahiro Ochiai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method of measuring capacitance of device-under-test
- Patent number 12,228,598
- Issue date Feb 18, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Mao-Hsuan Chou
- G01 - MEASURING TESTING
Information Patent Grant
Illuminator method and device for semiconductor package testing
- Patent number 12,228,610
- Issue date Feb 18, 2025
- UTAC HEADQUARTERS PTE. LTD.
- Boon Chew Goh
- G01 - MEASURING TESTING
Information Patent Grant
Contact pins for test sockets and test sockets comprising the same
- Patent number 12,222,367
- Issue date Feb 11, 2025
- Okins Electronics Co., Ltd.
- Jin Kook Jun
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device inspection method and semiconductor device ins...
- Patent number 12,222,387
- Issue date Feb 11, 2025
- Hamamatsu Photonics K.K.
- Norimichi Chinone
- G01 - MEASURING TESTING
Information Patent Grant
Integrated communication link testing
- Patent number 12,222,388
- Issue date Feb 11, 2025
- Tektronix, Inc.
- Pirooz Hojabri
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for testing virtual functions of a device under...
- Patent number 12,222,844
- Issue date Feb 11, 2025
- Advantest Corporation
- Srdjan Malisic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated functional testing systems and methods of making and usin...
- Patent number 12,222,263
- Issue date Feb 11, 2025
- Myung Ki Kim
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Display device and bonding detection method of display device
- Patent number 12,224,215
- Issue date Feb 11, 2025
- Chengdu BOE Optoelectronics Technology Co., Ltd.
- Chienpang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuits and methods for detecting line short circuits and/or line...
- Patent number 12,222,384
- Issue date Feb 11, 2025
- Infineon Technologies AG
- Mario Motz
- G01 - MEASURING TESTING
Information Patent Grant
Testing method and testing system
- Patent number 12,222,385
- Issue date Feb 11, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yu-Ting Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method of generating device model and computing device performing t...
- Patent number 12,222,386
- Issue date Feb 11, 2025
- Samsung Electronics Co., Ltd.
- Gwangnae Gil
- G01 - MEASURING TESTING
Information Patent Grant
Forming trench in IC chip through multiple trench formation and dep...
- Patent number 12,219,709
- Issue date Feb 4, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Kao-Chih Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement instrument, measurement system, and testing method of t...
- Patent number 12,216,151
- Issue date Feb 4, 2025
- Rohde & Schwarz GmbH & Co. KG
- Paul Gareth Lloyd
- G01 - MEASURING TESTING
Information Patent Grant
Gallium nitride-based devices and methods of testing thereof
- Patent number 12,216,152
- Issue date Feb 4, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yi-An Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active thermal interposer device
- Patent number 12,216,154
- Issue date Feb 4, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROCESS FOR DIGITAL DIAGNOSIS OF A SYSTEM OF ACTUATORS IN AN AIRCRA...
- Publication number 20250058898
- Publication date Feb 20, 2025
- SAFRAN NACELLES
- Patrick ARCOUËT
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
TESTING MODULE
- Publication number 20250060405
- Publication date Feb 20, 2025
- NANYA TECHNOLOGY CORPORATION
- Wei-Zhong LI
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD HAVING AN EDGE CONTAINING CONDUCTIVE REGIONS
- Publication number 20250063664
- Publication date Feb 20, 2025
- Teradyne, Inc.
- Daniel L. Engel
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PREDICTION DEVICE, TEST SYSTEM, PREDICTION METHOD, AND PREDICTION P...
- Publication number 20250060408
- Publication date Feb 20, 2025
- TOKYO ELECTRON LIMITED
- Hiroaki HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Measurement Device for Process Metrology
- Publication number 20250060406
- Publication date Feb 20, 2025
- Berthold Technologies GmbH & Co. KG
- Steffen MUELLER
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE FOR OPTOELECTRONIC INTEGRATED CIRCUIT
- Publication number 20250060407
- Publication date Feb 20, 2025
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Jhih-Hong CHENG
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
- Publication number 20250052811
- Publication date Feb 13, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
UNIVERSAL SOCKET TEST CARD
- Publication number 20250052806
- Publication date Feb 13, 2025
- HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP.
- MIN-HUANG WU
- G01 - MEASURING TESTING
Information Patent Application
TEST AND/OR MEASUREMENT SYSTEM
- Publication number 20250052807
- Publication date Feb 13, 2025
- ROHDE & SCHWARZ GMBH & CO. KG
- Julian HARMS
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
WAFER ANALYZING DEVICE AND WAFER ANALYZING SYSTEM
- Publication number 20250052808
- Publication date Feb 13, 2025
- SK HYNIX INC.
- Tae Beom KIM
- G01 - MEASURING TESTING
Information Patent Application
DEVICE, METHOD AND SYSTEM FOR IN-FIELD LANE TESTING AND REPAIR WITH...
- Publication number 20250052809
- Publication date Feb 13, 2025
- Intel Corporation
- Fei Su
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE AND INTEGRATED CIRCUIT TEST USING SAME
- Publication number 20250054817
- Publication date Feb 13, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- Wei-Kuan Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONNECTING DEVICE, TESTING DEVICE, AND COMMUNICATION DEVICE
- Publication number 20250055169
- Publication date Feb 13, 2025
- Advantest Corporation
- Takahiro TSUSHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE PIN AND PROBE CARD
- Publication number 20250052784
- Publication date Feb 13, 2025
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Koki OKUMA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST CARRIER, SEMICONDUCTOR TEST APPARATUS INCLUDING...
- Publication number 20250044351
- Publication date Feb 6, 2025
- Samsung Electronics Co., Ltd.
- Heejin Baek
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTOR MOUNTED TO BRITTLE SUBSTRATE
- Publication number 20250044344
- Publication date Feb 6, 2025
- Tektronix, Inc.
- Forest E. Kernan
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE SUPPORTING DEVICE
- Publication number 20250044347
- Publication date Feb 6, 2025
- HERMES TESTING SOLUTIONS INC.
- Yi-Chun Yang
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER
- Publication number 20250044348
- Publication date Feb 6, 2025
- Aehr Test Systems
- Gaylord Lewis Erickson
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING PROBING PARAMETERS FOR PROBE SYSTEM TO TEST D...
- Publication number 20250044350
- Publication date Feb 6, 2025
- MPI Corporation
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
PREDICTION OF BATTERY FAILURE THROUGH THERMAL SIGNATURES
- Publication number 20250046891
- Publication date Feb 6, 2025
- National Technology & Engineering Solutions of Sandia, LLC
- Wyatt Lea Hodges
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL...
- Publication number 20250044349
- Publication date Feb 6, 2025
- MPI CORPORATION
- ANDREJ RUMIANTSEV
- G01 - MEASURING TESTING
Information Patent Application
HIGH-FREQUENCY COMPONENT TEST DEVICE AND METHOD THEREOF
- Publication number 20250044332
- Publication date Feb 6, 2025
- Industrial Technology Research Institute
- Sih-Han LI
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL...
- Publication number 20250044346
- Publication date Feb 6, 2025
- MPI CORPORATION
- ANDREJ RUMIANTSEV
- G01 - MEASURING TESTING
Information Patent Application
UNIVERSAL DETECTION DEVICE AND METHOD FOR HIGH SPEED DIGITAL INTERF...
- Publication number 20250044345
- Publication date Feb 6, 2025
- MACROTEST SEMICONDUCTOR TECHNOLOGY CO., LTD
- Guoliang MAO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING OPENING OF SEMICONDUCTOR DEVICE INCLUDING DETEC...
- Publication number 20250035701
- Publication date Jan 30, 2025
- SUMSUNG ELECTRONICS CO., LTD.
- Gyosoo CHOO
- G01 - MEASURING TESTING
Information Patent Application
BIAS CAUSE REDUCTION FOR LOCALIZING CONSTRAINTS
- Publication number 20250035697
- Publication date Jan 30, 2025
- Synopsys, Inc.
- Malay Ganai
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE, PROBE HOLDER AND PROBE UNIT
- Publication number 20250035699
- Publication date Jan 30, 2025
- NHK Spring Co., Ltd.
- Tsuyoshi Inuma
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20250035698
- Publication date Jan 30, 2025
- JCET STATS ChipPAC Korea Limited
- SeungHyeon JEONG
- G01 - MEASURING TESTING
Information Patent Application
TEST TRAY SYSTEM AND RELATED METHOD
- Publication number 20250035700
- Publication date Jan 30, 2025
- GLOBALFOUNDRIES U.S. Inc.
- Jae Hoon Kim
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND CONTACTING MEMBER THEREOF, METHOD OF MANUFACTURIN...
- Publication number 20250035671
- Publication date Jan 30, 2025
- MPI Corporation
- CHENG-NIEN SU
- G01 - MEASURING TESTING

Testing of electronic circuits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Heating structure and wafer test device

Parallel test cell with self actuated sockets

Chip moving device

Test system support component exchange system and method

Testing method and testing system

Circuits and methods for supply voltage detection and timing monito...

High voltage monitoring for optical switching applications

System and method for fault sequence recording

Battery pack simulation apparatus and method of checking battery ma...

Temperature compensation of optically isolated probe

Electronics tester

Module type sensor for detecting voltage and current of radio frequ...

Wafer probe device

Probe station capable of maintaining stable and accurate contact to...

Display device

System and method of measuring capacitance of device-under-test

Illuminator method and device for semiconductor package testing

Contact pins for test sockets and test sockets comprising the same

Semiconductor device inspection method and semiconductor device ins...

Integrated communication link testing

Systems and methods for testing virtual functions of a device under...

Automated functional testing systems and methods of making and usin...

Display device and bonding detection method of display device

Circuits and methods for detecting line short circuits and/or line...

Testing method and testing system

Method of generating device model and computing device performing t...

Forming trench in IC chip through multiple trench formation and dep...

Measurement instrument, measurement system, and testing method of t...

Gallium nitride-based devices and methods of testing thereof

Active thermal interposer device

Patents Applicationslast 30 patents

PROCESS FOR DIGITAL DIAGNOSIS OF A SYSTEM OF ACTUATORS IN AN AIRCRA...

TESTING MODULE

CIRCUIT BOARD HAVING AN EDGE CONTAINING CONDUCTIVE REGIONS

PREDICTION DEVICE, TEST SYSTEM, PREDICTION METHOD, AND PREDICTION P...

Measurement Device for Process Metrology

TEST DEVICE FOR OPTOELECTRONIC INTEGRATED CIRCUIT

INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES

UNIVERSAL SOCKET TEST CARD

TEST AND/OR MEASUREMENT SYSTEM

WAFER ANALYZING DEVICE AND WAFER ANALYZING SYSTEM

DEVICE, METHOD AND SYSTEM FOR IN-FIELD LANE TESTING AND REPAIR WITH...

TEST STRUCTURE AND INTEGRATED CIRCUIT TEST USING SAME

CONNECTING DEVICE, TESTING DEVICE, AND COMMUNICATION DEVICE

PROBE PIN AND PROBE CARD

SEMICONDUCTOR TEST CARRIER, SEMICONDUCTOR TEST APPARATUS INCLUDING...

ELECTRICAL CONNECTOR MOUNTED TO BRITTLE SUBSTRATE

ADJUSTABLE SUPPORTING DEVICE

ELECTRONICS TESTER

METHOD OF DETERMINING PROBING PARAMETERS FOR PROBE SYSTEM TO TEST D...

PREDICTION OF BATTERY FAILURE THROUGH THERMAL SIGNATURES

WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL...

HIGH-FREQUENCY COMPONENT TEST DEVICE AND METHOD THEREOF

WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL...

UNIVERSAL DETECTION DEVICE AND METHOD FOR HIGH SPEED DIGITAL INTERF...

METHOD OF DETECTING OPENING OF SEMICONDUCTOR DEVICE INCLUDING DETEC...

BIAS CAUSE REDUCTION FOR LOCALIZING CONSTRAINTS

CONTACT PROBE, PROBE HOLDER AND PROBE UNIT

APPARATUS FOR TESTING ELECTRONIC DEVICES

TEST TRAY SYSTEM AND RELATED METHOD

CONTACT PROBE AND CONTACTING MEMBER THEREOF, METHOD OF MANUFACTURIN...