Testing of electronic circuits

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CPC
G01R31/28

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/28Testing of electronic circuits

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Onboard circuits and methods to predict the health of critical elem...
- Patent number 12,174,237
- Issue date Dec 24, 2024
- University of Houston System
- Harish Krishnamoorthy
- G01 - MEASURING TESTING
Information Patent Grant
Field collapse pulser
- Patent number 12,174,236
- Issue date Dec 24, 2024
- Pragma Design, Inc.
- Jeffrey C. Dunnihoo
- G01 - MEASURING TESTING
Information Patent Grant
Ball grid array current meter with a current sense wire
- Patent number 12,174,240
- Issue date Dec 24, 2024
- International Business Machines Corporation
- Layne A. Berge
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus and method for tin whisker isolation and detection
- Patent number 12,174,241
- Issue date Dec 24, 2024
- International Business Machines Corporation
- Matthew Doyle
- G01 - MEASURING TESTING
Information Patent Grant
Recipe information presentation system and recipe error inference s...
- Patent number 12,174,245
- Issue date Dec 24, 2024
- HITACHI HIGH-TECH CORPORATION
- Kouichi Hayakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Terahertz device
- Patent number 12,174,114
- Issue date Dec 24, 2024
- Rohm Co., Ltd.
- Kazuisao Tsuruda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Portable test apparatus and method of testing RF/microwave treatmen...
- Patent number 12,174,242
- Issue date Dec 24, 2024
- Emblation Limited
- Eamon McErlean
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Probe assembly, system and method for testing rf device of phased a...
- Patent number 12,174,243
- Issue date Dec 24, 2024
- TRON FUTURE TECH INC.
- Yu-Jiu Wang
- G01 - MEASURING TESTING
Information Patent Grant
Device under test simulation equipment
- Patent number 12,174,244
- Issue date Dec 24, 2024
- Teradyne (Asia) Pte. Ltd.
- Min Nie
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring circuit and semiconductor device
- Patent number 12,174,247
- Issue date Dec 24, 2024
- SK Hynix Inc.
- Tae-Pyeong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ergonomic loading for a test interface board (TIB) / burn-in-board...
- Patent number 12,174,248
- Issue date Dec 24, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Probing device and inspection method using the same
- Patent number 12,174,249
- Issue date Dec 24, 2024
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- G01 - MEASURING TESTING
Information Patent Grant
Security circuitry for bonded structures
- Patent number 12,174,246
- Issue date Dec 24, 2024
- ADEIA SEMICONDUCTOR BONDING TECHNOLOGIES INC.
- Javier A. DeLaCruz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronics tester
- Patent number 12,169,217
- Issue date Dec 17, 2024
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for fault detection and reporting through seria...
- Patent number 12,169,218
- Issue date Dec 17, 2024
- Maxim Integrated Products, Inc.
- Ling Liu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing a semiconductor package
- Patent number 12,169,219
- Issue date Dec 17, 2024
- TSE CO., LTD.
- Min Cheol Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method for monitoring the vitality of devices of a distributed system
- Patent number 12,169,403
- Issue date Dec 17, 2024
- Pilz GmbH & Co. KG
- Christoph Weishaar
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit spike check probing apparatus and method
- Patent number 12,169,220
- Issue date Dec 17, 2024
- Texas Instruments Incorporated
- William Joshua Bush
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip with rigid frame and flexible tip portion
- Patent number 12,169,210
- Issue date Dec 17, 2024
- Keysight Technologies, Inc.
- Nicholas Fernandez
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and probe card comprising same
- Patent number 12,169,212
- Issue date Dec 17, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Microbump cluster probing architecture for 2.5D and 3D dies
- Patent number 12,163,982
- Issue date Dec 10, 2024
- Intel Corporation
- Jagat Shakya
- G01 - MEASURING TESTING
Information Patent Grant
Electronic circuit board testing system
- Patent number 12,163,996
- Issue date Dec 10, 2024
- MAGNALYTIX, LLC
- Michael L. Bixenman
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 12,163,999
- Issue date Dec 10, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
3D tap and scan port architectures
- Patent number 12,164,001
- Issue date Dec 10, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring semiconductor multilayer structure...
- Patent number 12,165,931
- Issue date Dec 10, 2024
- SHANGHAI ASPIRING SEMICONDUCTOR EQUIPMENT CO., LTD.
- Chongji Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power supply control device, test method, and computer program
- Patent number 12,166,342
- Issue date Dec 10, 2024
- Autonetworks Technologies, Ltd.
- Shunichi Sawano
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Sensor system, and sensor system failure detecting method
- Patent number 12,163,917
- Issue date Dec 10, 2024
- NITERRA CO., LTD.
- Yuzo Higuchi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Testing an electronic circuit having a voltage monitor circuit
- Patent number 12,163,997
- Issue date Dec 10, 2024
- STMicroelectronics S.r.l.
- Nicola De Campo
- G01 - MEASURING TESTING
Information Patent Grant
TSV testing
- Patent number 12,163,998
- Issue date Dec 10, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-chip checker for on-chip safety area
- Patent number 12,164,000
- Issue date Dec 10, 2024
- STMicroelectronics S.r.l.
- Alessandro Cannone
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR TESTING FUNCTIONALITY AND PERFORMANCE OF A...
- Publication number 20240426896
- Publication date Dec 26, 2024
- The ADT Security Corporation
- Jeron E. BORNSTEIN
- G01 - MEASURING TESTING
Information Patent Application
TEST SIGNAL CIRCUIT FOR TESTING A RADIO FREQUENCY RECEIVER CIRCUIT,...
- Publication number 20240426898
- Publication date Dec 26, 2024
- INFINEON TECHNOLOGIES AG
- Faisal AHMED
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, VEHICLE-MOUNTED APPLIANCE,...
- Publication number 20240426899
- Publication date Dec 26, 2024
- Rohm Co., Ltd.
- Takumi YAMADA
- G01 - MEASURING TESTING
Information Patent Application
TESTING PADDLE FOR SEMICONDUCTOR DEVICE CHARACTERIZATION
- Publication number 20240426904
- Publication date Dec 26, 2024
- Western Digital Technologies, Inc.
- Lenny Rayzman
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS FOR SEMICONDUCTOR PACKAGE
- Publication number 20240426905
- Publication date Dec 26, 2024
- TSE CO., LTD
- Min Cheol KIM
- G01 - MEASURING TESTING
Information Patent Application
Scalable Tester for Testing Multiple Devices Under Test
- Publication number 20240426897
- Publication date Dec 26, 2024
- Albert Gaoiran
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE ANALYSIS
- Publication number 20240426901
- Publication date Dec 26, 2024
- The Regents of the University of Michigan
- Al-Thaddeus Avestruz
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTION APPARATUS
- Publication number 20240426903
- Publication date Dec 26, 2024
- Kabushiki Kaisha Nihon Micronics
- Souichi KANOSUE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICS IN ELECTRONICS TESTER
- Publication number 20240426938
- Publication date Dec 26, 2024
- Aehr Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...
- Publication number 20240426939
- Publication date Dec 26, 2024
- Aehr Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WLCSP DEVICE ENCLOSURE
- Publication number 20240426900
- Publication date Dec 26, 2024
- Silicon Laboratories Inc.
- Wenshui Zhang
- G01 - MEASURING TESTING
Information Patent Application
SELF-DETECTION CIRCUIT BASED ON POWER DETECTOR
- Publication number 20240426902
- Publication date Dec 26, 2024
- Yiming YU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20240418768
- Publication date Dec 19, 2024
- Hioki E. E. Corporation
- Kazuaki HANEDA
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...
- Publication number 20240418770
- Publication date Dec 19, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
SHORT-CIRCUIT DETECTION DEVICE
- Publication number 20240421584
- Publication date Dec 19, 2024
- STMicroelectronics International N.V.
- Ghafour BENABDELAZIZ
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SELF-TEST AUTO MONITOR GROUND FAULT CIRCUIT INTERRUPTER (GFCI) WITH...
- Publication number 20240418767
- Publication date Dec 19, 2024
- HUBBELL INCORPORATED
- Thomas James Batko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHIP TESTING STRUCTURE AND CHIP TESTING METHOD
- Publication number 20240418771
- Publication date Dec 19, 2024
- HYGON INFORMATION TECHNOLOGY CO., LTD.
- Xiaodi Xue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE RELATED TO DETECTION OF INTERNAL VOLTAGE
- Publication number 20240418769
- Publication date Dec 19, 2024
- SK HYNIX INC.
- Seung Han OAK
- G01 - MEASURING TESTING
Information Patent Application
MONITORING CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, AND VE...
- Publication number 20240418772
- Publication date Dec 19, 2024
- ROHM CO., LTD.
- Takashi FUJIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Diagnostic Device
- Publication number 20240418773
- Publication date Dec 19, 2024
- The Boeing Company
- Ian M. Dayton
- G01 - MEASURING TESTING
Information Patent Application
ADAPTIVE FLEXIBLE CHIP TEST SOCKET AND FORMATION METHOD THEREOF
- Publication number 20240410917
- Publication date Dec 12, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER
- Publication number 20240410934
- Publication date Dec 12, 2024
- NANYA TECHNOLOGY CORPORATION
- Wei Zhong LI
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THE...
- Publication number 20240410918
- Publication date Dec 12, 2024
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
CHIP TEST PRESSING-DOWN APPARATUS AND FORMATION METHOD THEREOF
- Publication number 20240410935
- Publication date Dec 12, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
Improved Thermal and Electrical Conductivity Between Metal Contacts
- Publication number 20240410939
- Publication date Dec 12, 2024
- Wolfspeed, Inc.
- Alexander Komposch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETERMINING A FIGURE OF MERIT OF AT LEAST ONE COMPONENT U...
- Publication number 20240410933
- Publication date Dec 12, 2024
- ROHDE &SCHWARZ GMBH & CO. KG
- Matthias RUENGELER
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUES FOR DETECTING PROBE LANDING IN INTEGRATED CIRCUIT TESTIN...
- Publication number 20240410937
- Publication date Dec 12, 2024
- FEI Company
- James S. Vickers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITSMETHOD...
- Publication number 20240410938
- Publication date Dec 12, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
INTERPOSER FOR SEMICONDUCTOR-BASED SINGLE PHOTON EMISSION COMPUTED...
- Publication number 20240413186
- Publication date Dec 12, 2024
- Siemens Medical Solutions USA, Inc.
- Patanit Sanpitak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...
- Publication number 20240410936
- Publication date Dec 12, 2024
- FormFactor, Inc.
- Ernest Gammon McReynolds
- G01 - MEASURING TESTING

Testing of electronic circuits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Onboard circuits and methods to predict the health of critical elem...

Field collapse pulser

Ball grid array current meter with a current sense wire

Apparatus and method for tin whisker isolation and detection

Recipe information presentation system and recipe error inference s...

Terahertz device

Portable test apparatus and method of testing RF/microwave treatmen...

Probe assembly, system and method for testing rf device of phased a...

Device under test simulation equipment

Monitoring circuit and semiconductor device

Ergonomic loading for a test interface board (TIB) / burn-in-board...

Probing device and inspection method using the same

Security circuitry for bonded structures

Electronics tester

Systems and methods for fault detection and reporting through seria...

Apparatus for testing a semiconductor package

Method for monitoring the vitality of devices of a distributed system

Integrated circuit spike check probing apparatus and method

Probe tip with rigid frame and flexible tip portion

Probe head and probe card comprising same

Microbump cluster probing architecture for 2.5D and 3D dies

Electronic circuit board testing system

Apparatus for testing electronic devices

3D tap and scan port architectures

Method and device for measuring semiconductor multilayer structure...

Power supply control device, test method, and computer program

Sensor system, and sensor system failure detecting method

Testing an electronic circuit having a voltage monitor circuit

TSV testing

On-chip checker for on-chip safety area

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR TESTING FUNCTIONALITY AND PERFORMANCE OF A...

TEST SIGNAL CIRCUIT FOR TESTING A RADIO FREQUENCY RECEIVER CIRCUIT,...

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, VEHICLE-MOUNTED APPLIANCE,...

TESTING PADDLE FOR SEMICONDUCTOR DEVICE CHARACTERIZATION

TEST APPARATUS FOR SEMICONDUCTOR PACKAGE

Scalable Tester for Testing Multiple Devices Under Test

TEMPERATURE ANALYSIS

ELECTRICAL CONNECTION APPARATUS

METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICS IN ELECTRONICS TESTER

METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...

WLCSP DEVICE ENCLOSURE

SELF-DETECTION CIRCUIT BASED ON POWER DETECTOR

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...

SHORT-CIRCUIT DETECTION DEVICE

SELF-TEST AUTO MONITOR GROUND FAULT CIRCUIT INTERRUPTER (GFCI) WITH...

CHIP TESTING STRUCTURE AND CHIP TESTING METHOD

ELECTRONIC DEVICE RELATED TO DETECTION OF INTERNAL VOLTAGE

MONITORING CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, AND VE...

Diagnostic Device

ADAPTIVE FLEXIBLE CHIP TEST SOCKET AND FORMATION METHOD THEREOF

SEMICONDUCTOR WAFER

PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THE...

CHIP TEST PRESSING-DOWN APPARATUS AND FORMATION METHOD THEREOF

Improved Thermal and Electrical Conductivity Between Metal Contacts

METHOD OF DETERMINING A FIGURE OF MERIT OF AT LEAST ONE COMPONENT U...

TECHNIQUES FOR DETECTING PROBE LANDING IN INTEGRATED CIRCUIT TESTIN...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITSMETHOD...

INTERPOSER FOR SEMICONDUCTOR-BASED SINGLE PHOTON EMISSION COMPUTED...

SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...