Testing of electronic circuits

Industry

CPC
G01R31/28

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/28Testing of electronic circuits

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Probe card
- Patent number 12,270,828
- Issue date Apr 8, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Organic light emitting diode display substrate and preparing method...
- Patent number 12,274,136
- Issue date Apr 8, 2025
- Chengdu BOE Optoelectronics Technology Co., Ltd.
- Hongjun Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Benchmark device and method for evaluating a semiconductor wafer
- Patent number 12,270,854
- Issue date Apr 8, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Lan-Chou Cho
- G02 - OPTICS
Information Patent Grant
Method and system for wafer-level testing
- Patent number 12,270,852
- Issue date Apr 8, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Jun He
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer configured for single touch-down testing
- Patent number 12,270,853
- Issue date Apr 8, 2025
- SanDisk Technologies, Inc.
- Toru Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including through-package debug features
- Patent number 12,272,609
- Issue date Apr 8, 2025
- SanDisk Technologies, Inc.
- Nir Amir
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Repackaging IC chip for fault identification
- Patent number 12,265,119
- Issue date Apr 1, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chien-Yi Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe apparatus and manufacturing method for probe apparatus
- Patent number 12,265,117
- Issue date Apr 1, 2025
- Nihon Kohden Corporation
- Shohei Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for thermal control of devices in electronics tester
- Patent number 12,265,136
- Issue date Apr 1, 2025
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flexible circuit board test device
- Patent number 12,265,118
- Issue date Apr 1, 2025
- HONOR DEVICE CO., LTD.
- Ruifei Wang
- G01 - MEASURING TESTING
Information Patent Grant
Information processing apparatus and non-transitory computer readab...
- Patent number 12,259,424
- Issue date Mar 25, 2025
- FUJIFILM Business Innovation Corp.
- Yuta Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit and method for calibrating a plurality of automated test eq...
- Patent number 12,259,425
- Issue date Mar 25, 2025
- Advantest Corporation
- Bernhard Roth
- G01 - MEASURING TESTING
Information Patent Grant
Multiplexed thermal control wafer and coldplate
- Patent number 12,259,428
- Issue date Mar 25, 2025
- AEM SINGAPORE PTE. LTD.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Over the air test chamber with optimized air circulation
- Patent number 12,259,426
- Issue date Mar 25, 2025
- Rohde & Schwarz GmbH & Co. KG
- Ralf Meissner
- G01 - MEASURING TESTING
Information Patent Grant
Voltage tracking circuit and method of operating the same
- Patent number 12,259,429
- Issue date Mar 25, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsiang-Hui Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Technologies for on-circuit board de-embedding
- Patent number 12,259,430
- Issue date Mar 25, 2025
- Intel Corporation
- Bishnu Prasad Patra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal head comprising a plurality of adapters for independent the...
- Patent number 12,259,427
- Issue date Mar 25, 2025
- AEM Singapore Pte, LTD.
- Thomas P. Jones
- G01 - MEASURING TESTING
Information Patent Grant
System and method for wireless power reception
- Patent number 12,261,455
- Issue date Mar 25, 2025
- Reach Power, Inc.
- Christopher Joseph Daviantes
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Electronic device
- Patent number 12,253,557
- Issue date Mar 18, 2025
- INNOLUX CORPORATION
- Ming-Jou Tai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Circuit test structure and method of using
- Patent number 12,253,558
- Issue date Mar 18, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ching-Fang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alignment method and inspection apparatus
- Patent number 12,253,559
- Issue date Mar 18, 2025
- Tokyo Electron Limited
- Shinjiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Electronics tester
- Patent number 12,253,560
- Issue date Mar 18, 2025
- AEHR Test Systems
- Gaylord Lewis Erickson
- G01 - MEASURING TESTING
Information Patent Grant
Test key and semiconductor die including the same
- Patent number 12,255,112
- Issue date Mar 18, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tse-Pan Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alignment method and alignment device
- Patent number 12,255,113
- Issue date Mar 18, 2025
- STAR TECHNOLOGIES (WUHAN) CO., LTD.
- Choon Leong Lou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanowire-based interconnects for sub-millimeter wave integrated cir...
- Patent number 12,255,108
- Issue date Mar 18, 2025
- Regents of The University of Minnesota
- Rhonda Franklin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pogo pin cooling system and method and electronic device testing ap...
- Patent number 12,253,541
- Issue date Mar 18, 2025
- CHROMA ATE INC.
- I-Shih Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Lidless BGA socket apparatus for testing semiconductor device
- Patent number 12,248,001
- Issue date Mar 11, 2025
- HICON CO., LTD.
- Dong Weon Hwang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Constant force ultrasound probe handle
- Patent number 12,248,002
- Issue date Mar 11, 2025
- New York Society for the Relief of the Ruptured and Crippled, Maintaining the...
- Daniel R. Sturnick
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Arc fault current health check circuit
- Patent number 12,248,017
- Issue date Mar 11, 2025
- Lunar Energy, Inc.
- Maisam Gulamabbas Pyarali Bandali
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Semiconductor chip and test method of the same
- Patent number 12,248,018
- Issue date Mar 11, 2025
- Samsung Electronics Co., Ltd.
- Yeon Ho Jung
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLE CIRCUIT BOARD TESTER
- Publication number 20250116696
- Publication date Apr 10, 2025
- LAT Enterprises Inc., d/b/a MediPak Energy Systems
- Laura Thiel
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING APPARATUS AND METHOD FOR TESTING SEMICONDUCTO...
- Publication number 20250116698
- Publication date Apr 10, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Hsuan CHANG
- G01 - MEASURING TESTING
Information Patent Application
TEST ENVIRONMENT CONTROL SYSTEM
- Publication number 20250116699
- Publication date Apr 10, 2025
- YISHI Industrial Co.,Ltd
- WEN-HSIN LEE
- G01 - MEASURING TESTING
Information Patent Application
CURRENT PATH DIAGNOSIS WITH THE AID OF AN ELECTRONIC FUSE
- Publication number 20250116697
- Publication date Apr 10, 2025
- HELLA GmbH & Co. KGaA
- Christopher LANKEIT
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PACKAGE INSPECTION DEVICE
- Publication number 20250116684
- Publication date Apr 10, 2025
- Samsung Electronics Co., Ltd.
- Hyun YANG
- G01 - MEASURING TESTING
Information Patent Application
POWER MODULE AND POWER CONVERTER INCLUDING SAME
- Publication number 20250116700
- Publication date Apr 10, 2025
- Mitsubishi Heavy Industries, Ltd.
- Norihito Yanagita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS, SYSTEMS, ARTICLES OF MANUFACTURE, AND APPARATUS FOR IMPROV...
- Publication number 20250110173
- Publication date Apr 3, 2025
- Intel Corporation
- Gregorio R. Murtagian
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS TO DETECT COMPUTING SYSTEM HARDWARE DEFECTS US...
- Publication number 20250110175
- Publication date Apr 3, 2025
- Intel Corporation
- Rakesh KANDULA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR THERMAL TESTING WITHIN ELECTRONIC COMPONE...
- Publication number 20250110174
- Publication date Apr 3, 2025
- QUALCOMM Incorporated
- Palkesh JAIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PACKAGES WITH THROUGH VIA STRUCTURES AND METHODS FOR...
- Publication number 20250110172
- Publication date Apr 3, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ying-Chih Hsu
- G01 - MEASURING TESTING
Information Patent Application
CURRENT LIMIT TESTING SYSTEM FOR A TRANSISTOR
- Publication number 20250110171
- Publication date Apr 3, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Abhinay PATIL
- G01 - MEASURING TESTING
Information Patent Application
DEVICE VARIATION EXTRACTION CHIP
- Publication number 20250102556
- Publication date Mar 27, 2025
- Shanghai Huali Integrated Circuit Corporation
- Pinhan CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING
- Publication number 20250102565
- Publication date Mar 27, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM AND MACHINE APPARATUS THEREOF
- Publication number 20250102539
- Publication date Mar 27, 2025
- MPI CORPORATION
- STOJAN KANEV
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20250102561
- Publication date Mar 27, 2025
- International Controls and Measurements Corporation
- Hemanth Ramachandran
- G01 - MEASURING TESTING
Information Patent Application
MULTI-USER DEVELOPMENT SYSTEM FOR SYSTEM LEVEL DEVICE TESTING
- Publication number 20250102562
- Publication date Mar 27, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Jess Gillespie
- G01 - MEASURING TESTING
Information Patent Application
EVENT DETECTION SYSTEM RESPONSE CONTROLLER
- Publication number 20250102563
- Publication date Mar 27, 2025
- Raytheon Company
- Gregory L. Bass
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE TILE TWO-LAYERED MOTHERBOARD TESTER
- Publication number 20250102564
- Publication date Mar 27, 2025
- Intelligent Memory Limited
- Peter Poechmueller
- G01 - MEASURING TESTING
Information Patent Application
DEVICE INSPECTION APPARATUS AND DEVICE INSPECTION METHOD
- Publication number 20250102566
- Publication date Mar 27, 2025
- Mitsubishi Electric Corporation
- Takayuki ONAKA
- G01 - MEASURING TESTING
Information Patent Application
CHIP ELECTRICAL PROPERTY DETECTION DEVICE AND METHOD OF MANUFACTURI...
- Publication number 20250102559
- Publication date Mar 27, 2025
- ASTI GLOBAL INC., TAIWAN
- CHIEN-SHOU LIAO
- G01 - MEASURING TESTING
Information Patent Application
CHIP ELECTRICAL PROPERTY DETECTION DEVICE AND METHOD OF MANUFACTURI...
- Publication number 20250102567
- Publication date Mar 27, 2025
- ASTI GLOBAL INC., TAIWAN
- CHIEN-SHOU LIAO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE TESTER
- Publication number 20250102568
- Publication date Mar 27, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Ting-Yu CHIU
- G01 - MEASURING TESTING
Information Patent Application
3D TAP & SCAN PORT ARCHITECTURES
- Publication number 20250102569
- Publication date Mar 27, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE TILE MOTHERBOARD TESTER
- Publication number 20250102560
- Publication date Mar 27, 2025
- Intelligent Memory Limited
- Peter Poechmueller
- G01 - MEASURING TESTING
Information Patent Application
INPUT SIGNAL DETECTION CIRCUIT, ELECTRONIC DEVICE, AND SYSTEM
- Publication number 20250093402
- Publication date Mar 20, 2025
- YOKOGAWA ELECTRIC CORPORATION
- Shinya KUSUNOKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF HAVING GOOD THERMAL ISOLATION IN WAFER TEST CASSETTE
- Publication number 20250093407
- Publication date Mar 20, 2025
- XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBER, PERFORMANCE BOARD, PROBE CARD, AND SUBSTRATE INSPECTING APP...
- Publication number 20250093384
- Publication date Mar 20, 2025
- KIOXIA Corporation
- Hiroki KAMATA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PACKAGE AND METHOD OF TESTING THE SAME
- Publication number 20250096047
- Publication date Mar 20, 2025
- Samsung Electronics Co., Ltd.
- YEONGSEON KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER TEST SYSTEM
- Publication number 20250093387
- Publication date Mar 20, 2025
- XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
SHELL FOR WAFER LEVEL BURN-IN (WLBI) CHIP TEST, METHOD FOR LOADING...
- Publication number 20250093405
- Publication date Mar 20, 2025
- Microtest S.p.A.
- Giuseppe AMELIO
- G01 - MEASURING TESTING

Testing of electronic circuits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Probe card

Organic light emitting diode display substrate and preparing method...

Benchmark device and method for evaluating a semiconductor wafer

Method and system for wafer-level testing

Semiconductor wafer configured for single touch-down testing

Semiconductor device including through-package debug features

Repackaging IC chip for fault identification

Probe apparatus and manufacturing method for probe apparatus

Method and system for thermal control of devices in electronics tester

Flexible circuit board test device

Information processing apparatus and non-transitory computer readab...

Circuit and method for calibrating a plurality of automated test eq...

Multiplexed thermal control wafer and coldplate

Over the air test chamber with optimized air circulation

Voltage tracking circuit and method of operating the same

Technologies for on-circuit board de-embedding

Thermal head comprising a plurality of adapters for independent the...

System and method for wireless power reception

Electronic device

Circuit test structure and method of using

Alignment method and inspection apparatus

Electronics tester

Test key and semiconductor die including the same

Alignment method and alignment device

Nanowire-based interconnects for sub-millimeter wave integrated cir...

Pogo pin cooling system and method and electronic device testing ap...

Lidless BGA socket apparatus for testing semiconductor device

Constant force ultrasound probe handle

Arc fault current health check circuit

Semiconductor chip and test method of the same

Patents Applicationslast 30 patents

MULTIPLE CIRCUIT BOARD TESTER

SEMICONDUCTOR TESTING APPARATUS AND METHOD FOR TESTING SEMICONDUCTO...

TEST ENVIRONMENT CONTROL SYSTEM

CURRENT PATH DIAGNOSIS WITH THE AID OF AN ELECTRONIC FUSE

SEMICONDUCTOR PACKAGE INSPECTION DEVICE

POWER MODULE AND POWER CONVERTER INCLUDING SAME

METHODS, SYSTEMS, ARTICLES OF MANUFACTURE, AND APPARATUS FOR IMPROV...

METHOD AND APPARATUS TO DETECT COMPUTING SYSTEM HARDWARE DEFECTS US...

APPARATUS AND METHODS FOR THERMAL TESTING WITHIN ELECTRONIC COMPONE...

SEMICONDUCTOR PACKAGES WITH THROUGH VIA STRUCTURES AND METHODS FOR...

CURRENT LIMIT TESTING SYSTEM FOR A TRANSISTOR

DEVICE VARIATION EXTRACTION CHIP

MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING

PROBE SYSTEM AND MACHINE APPARATUS THEREOF

METHOD AND APPARATUS FOR TESTING ELECTRONIC DEVICES

MULTI-USER DEVELOPMENT SYSTEM FOR SYSTEM LEVEL DEVICE TESTING

EVENT DETECTION SYSTEM RESPONSE CONTROLLER

MULTIPLE TILE TWO-LAYERED MOTHERBOARD TESTER

DEVICE INSPECTION APPARATUS AND DEVICE INSPECTION METHOD

CHIP ELECTRICAL PROPERTY DETECTION DEVICE AND METHOD OF MANUFACTURI...

CHIP ELECTRICAL PROPERTY DETECTION DEVICE AND METHOD OF MANUFACTURI...

SEMICONDUCTOR DEVICE TESTER

3D TAP & SCAN PORT ARCHITECTURES

MULTIPLE TILE MOTHERBOARD TESTER

INPUT SIGNAL DETECTION CIRCUIT, ELECTRONIC DEVICE, AND SYSTEM

METHOD OF HAVING GOOD THERMAL ISOLATION IN WAFER TEST CASSETTE

PROBER, PERFORMANCE BOARD, PROBE CARD, AND SUBSTRATE INSPECTING APP...

SEMICONDUCTOR PACKAGE AND METHOD OF TESTING THE SAME

WAFER TEST SYSTEM

SHELL FOR WAFER LEVEL BURN-IN (WLBI) CHIP TEST, METHOD FOR LOADING...