Testing of electronic circuits

Industry

CPC
G01R31/28

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/28Testing of electronic circuits

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and method for performing crack detection oper...
- Patent number 12,366,602
- Issue date Jul 22, 2025
- SK hynix Inc.
- Hyun Seung Kim
- G01 - MEASURING TESTING
Information Patent Grant
Structure and method for testing of PIC with an upturned mirror
- Patent number 12,366,603
- Issue date Jul 22, 2025
- POET Technologies, Inc.
- Lucas Soldano
- G01 - MEASURING TESTING
Information Patent Grant
Channel impedance measurement instrument
- Patent number 12,366,601
- Issue date Jul 22, 2025
- Dell Products L.P.
- Sandor Farkas
- G01 - MEASURING TESTING
Information Patent Grant
Wireless channel reproduction device
- Patent number 12,360,154
- Issue date Jul 15, 2025
- Electronics and Telecommunications Research Institute
- Dong-Uk Sim
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Self-detection circuit based on power detector
- Patent number 12,360,156
- Issue date Jul 15, 2025
- University of Electronic Science and Technology of China
- Yiming Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for automatic height adjustment for chip testing
- Patent number 12,360,157
- Issue date Jul 15, 2025
- Diodes Incorporated
- Jie Ren
- G01 - MEASURING TESTING
Information Patent Grant
Device that includes a MEMS tunable filter and a method for operati...
- Patent number 12,360,147
- Issue date Jul 15, 2025
- UNISPECTRAL LTD.
- Peleg Levin
- G02 - OPTICS
Information Patent Grant
Terahertz plasmonics for testing very large-scale integrated circui...
- Patent number 12,360,159
- Issue date Jul 15, 2025
- The Government of the United States, as represented by the Secretary of the Army
- Greg Rupper
- G01 - MEASURING TESTING
Information Patent Grant
Optical probe, probe card, measuring system, and measuring method
- Patent number 12,360,155
- Issue date Jul 15, 2025
- Kabushiki Kaisha Nihon Micronics
- Michitaka Okuta
- G01 - MEASURING TESTING
Information Patent Grant
Tray carrier and corresponding method
- Patent number 12,362,213
- Issue date Jul 15, 2025
- STMicroelectronics (Malta) Ltd.
- Silvio Spiteri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for and method of frequency testing printed circuit board un...
- Patent number 12,352,803
- Issue date Jul 8, 2025
- Raytheon Company
- Mark Ryan Northrup
- G01 - MEASURING TESTING
Information Patent Grant
Additively manufactured printed electronics tester
- Patent number 12,352,804
- Issue date Jul 8, 2025
- Honeywell Federal Manufacturing & Technologies, LLC
- Daniel Benjamin Hartley
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
System and method for testing IoT tags
- Patent number 12,352,805
- Issue date Jul 8, 2025
- Wiliot, LTD.
- Eylon Gersten
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ultra-compact and micropower circuit to monitor process, voltage, a...
- Patent number 12,352,807
- Issue date Jul 8, 2025
- Avago Technologies International Sales Pte. Limited
- Alberto Grassi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Substrate inspection apparatus and substrate inspection method
- Patent number 12,352,808
- Issue date Jul 8, 2025
- Samsung Electronics Co., Ltd.
- Sekye Jeon
- G01 - MEASURING TESTING
Information Patent Grant
Devices and methods for smart sensor application
- Patent number 12,352,806
- Issue date Jul 8, 2025
- Analog Devices International Unlimited Company
- GuangYang Qu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for burn-in board alignment and sealing betwee...
- Patent number 12,352,809
- Issue date Jul 8, 2025
- MSV SYSTEMS & SERVICES PTE LTD
- Teck Huat Tan
- G01 - MEASURING TESTING
Information Patent Grant
System for testing performance of device in temperature load test
- Patent number 12,352,810
- Issue date Jul 8, 2025
- ATECO INC.
- Taek Seon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit test socket with integrated device picking mecha...
- Patent number 12,352,780
- Issue date Jul 8, 2025
- SanDisk Technologies, Inc.
- Yalaj Goyal
- G01 - MEASURING TESTING
Information Patent Grant
Substrate with crack detection function
- Patent number 12,352,812
- Issue date Jul 8, 2025
- TRIPLE WIN TECHNOLOGY(SHENZHEN) CO. LTD.
- Kai-Li Wang
- G01 - MEASURING TESTING
Information Patent Grant
Measurement application device calibration unit, measurement system...
- Patent number 12,355,498
- Issue date Jul 8, 2025
- Rohde & Schwarz GmbH & Co. KG
- Florian Ramian
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Validating test patterns ported between different levels of a hiera...
- Patent number 12,352,811
- Issue date Jul 8, 2025
- Synopsys, Inc.
- Andrea Costa
- G01 - MEASURING TESTING
Information Patent Grant
Downhole fault detection in well system using spread spectrum time...
- Patent number 12,352,158
- Issue date Jul 8, 2025
- Halliburton Energy Services, Inc.
- Jonathon N. Joubran
- E21 - EARTH DRILLING MINING
Information Patent Grant
Reverse recovery measurements and plots
- Patent number 12,345,755
- Issue date Jul 1, 2025
- Tektronix, Inc.
- Vivek Shivaram
- G01 - MEASURING TESTING
Information Patent Grant
Charging pile and testing device, system and method thereof
- Patent number 12,344,113
- Issue date Jul 1, 2025
- SUNGROW POWER SUPPLY CO., LTD.
- Hongchuang Chen
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Semiconductor test apparatus and semiconductor test method
- Patent number 12,345,739
- Issue date Jul 1, 2025
- Mitsubishi Electric Corporation
- Yoshiyuki Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Decoupling cells testability
- Patent number 12,345,757
- Issue date Jul 1, 2025
- Mellanox Technologies, Ltd.
- Ido Bourstein
- G01 - MEASURING TESTING
Information Patent Grant
Pluggable load module to test a voltage regulator
- Patent number 12,345,775
- Issue date Jul 1, 2025
- LOGIICDEV GMBH
- Deepak V Katkoria
- G01 - MEASURING TESTING
Information Patent Grant
Integrated test cell using active thermal interposer (ATI) with par...
- Patent number 12,345,756
- Issue date Jul 1, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for probing device-under-test
- Patent number 12,345,760
- Issue date Jul 1, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chuan-Hsiang Sun
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SWITCH DEVICE AND TESTING DEVICE
- Publication number 20250233586
- Publication date Jul 17, 2025
- Advantest Corporation
- Takahiro TSUSHIMA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST DEVICE, ELECTRONIC DEVICE, AND OPERATING METHOD OF TEST DEVICE
- Publication number 20250231232
- Publication date Jul 17, 2025
- Samsung Electronics Co., Ltd.
- Ingoo Heo
- G01 - MEASURING TESTING
Information Patent Application
DETERIORATION CORRECTION CIRCUITRY
- Publication number 20250231831
- Publication date Jul 17, 2025
- Micron Technology, Inc.
- Leon Zlotnik
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REPACKAGING IC CHIP FOR FAULT IDENTIFICATION
- Publication number 20250231233
- Publication date Jul 17, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Yi Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR EVALUATING INFLUENCE OF PROCESS ON SEMICON...
- Publication number 20250233027
- Publication date Jul 17, 2025
- SK HYNIX INC.
- Seong Joo Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING METHOD, DEVICE UNDER TEST, PROBE CARD AND PROBE SYSTEM FOR...
- Publication number 20250231219
- Publication date Jul 17, 2025
- MPI Corporation
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
PHOTONIC INTEGRATED CHIP, ARRAY AND TESTING METHOD THEREOF
- Publication number 20250224306
- Publication date Jul 10, 2025
- SILITH TECHNOLOGY PTE. LTD.
- Xiaojun SHI
- G01 - MEASURING TESTING
Information Patent Application
TESTING SEMICONDUCTOR MODULES
- Publication number 20250224438
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Sunhee Kim
- G01 - MEASURING TESTING
Information Patent Application
Two-Phase Helium Convection Loop for Cryogenic Cooling
- Publication number 20250224441
- Publication date Jul 10, 2025
- Massachusetts Institute of Technology
- John CUMMINGS
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Voltage Stress Condition Optimization Method and Dynamic Vo...
- Publication number 20250224442
- Publication date Jul 10, 2025
- MEDIATEK INC.
- Yu-Lin Yang
- G01 - MEASURING TESTING
Information Patent Application
DIE-TO-DIE AND CHIP-TO-CHIP INTERCONNECT CLOCK SKEW COMPENSATION
- Publication number 20250224447
- Publication date Jul 10, 2025
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST PAD STRUCTURE AND METHOD OF MANUFACTURING AND OPERATING THE SAME
- Publication number 20250226269
- Publication date Jul 10, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- MING-CHUNG WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMMON VOLTAGE LOADING ANALOG CIRCUIT AND DISPLAY DEVICE
- Publication number 20250224439
- Publication date Jul 10, 2025
- Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd.
- Yihua ZHANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BURN-IN BOARD AND BURN-IN TEST METHOD USING THE SAME
- Publication number 20250224440
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Seonhaeng LEE
- G01 - MEASURING TESTING
Information Patent Application
ANTENNA DEVICE FOR OTA DEVICE TESTING USING AUTOMATED TEST EQUIPMENT
- Publication number 20250224435
- Publication date Jul 10, 2025
- Advantest Corporation
- José Moreira
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Voltage Stress Condition Optimization Method and Dynamic Vo...
- Publication number 20250224443
- Publication date Jul 10, 2025
- MEDIATEK INC.
- Yu-Lin Yang
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE TRACKING CIRCUIT AND METHOD OF OPERATING THE SAME
- Publication number 20250224444
- Publication date Jul 10, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiang-Hui CHENG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20250224445
- Publication date Jul 10, 2025
- TOKYO ELECTRON LIMITED
- Shigeru KASAI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20250224423
- Publication date Jul 10, 2025
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
CLOCKLESS AND CALIBRATION-LESS DIFFERENTIAL AGING MONITOR
- Publication number 20250216441
- Publication date Jul 3, 2025
- Intel Corporation
- Minki CHO
- G01 - MEASURING TESTING
Information Patent Application
PROCEDURE FOR MAKING ON-DIE-PARAMETRIC MEASUREMENTS OF CIRCUIT DEVICES
- Publication number 20250216447
- Publication date Jul 3, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Jordan Wenske
- G01 - MEASURING TESTING
Information Patent Application
FLOATING-CONNECTION CHIP TEST CONNECTOR
- Publication number 20250219324
- Publication date Jul 3, 2025
- RESEARCH ON ELECTRICAL APPLIANCES OF SHANGHAI ASTRONAUTICS
- Hongji Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHIP COOLING MODULE AND CHIP TESTING APPARATUS HAVING SAME
- Publication number 20250216445
- Publication date Jul 3, 2025
- CHROMA ATE INC.
- Yu-Wei Chuang
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TESTING STRUCTURE FOR PAD BOND MISALIGNMENT DETE...
- Publication number 20250216449
- Publication date Jul 3, 2025
- Intel Corporation
- Jagat Shakya
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR LOOPBACK TESTING AND METHODS OF FORMING THE SAME
- Publication number 20250216419
- Publication date Jul 3, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Tsai-Ning LU
- G01 - MEASURING TESTING
Information Patent Application
RELIABILITY TESTING USING FUNCTIONAL DEVICES
- Publication number 20250216440
- Publication date Jul 3, 2025
- Octavo Systems LLC
- Masood MURTUZA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR WIRELESS POWER RECEPTION
- Publication number 20250219455
- Publication date Jul 3, 2025
- Reach Power, Inc.
- Christopher Joseph Davlantes
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MEASUREMENT APPLICATION DEVICE
- Publication number 20250216427
- Publication date Jul 3, 2025
- Rohde& Schwarz GmbH & Co. KG
- Andreas LAGLER
- G01 - MEASURING TESTING
Information Patent Application
ANTI-CONDENSATION LOW-TEMPERATURE TESTING MODULE AND CHIP TESTING A...
- Publication number 20250216444
- Publication date Jul 3, 2025
- CHROMA ATE INC.
- Yu-Wei Chuang
- G01 - MEASURING TESTING
Information Patent Application
SOCKET ASSEMBLY AND ELECTRONIC COMPONENT TEST APPARATUS
- Publication number 20250216442
- Publication date Jul 3, 2025
- Advantest Corporation
- Natsuki Shiota
- G01 - MEASURING TESTING

Testing of electronic circuits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor device and method for performing crack detection oper...

Structure and method for testing of PIC with an upturned mirror

Channel impedance measurement instrument

Wireless channel reproduction device

Self-detection circuit based on power detector

System and method for automatic height adjustment for chip testing

Device that includes a MEMS tunable filter and a method for operati...

Terahertz plasmonics for testing very large-scale integrated circui...

Optical probe, probe card, measuring system, and measuring method

Tray carrier and corresponding method

Device for and method of frequency testing printed circuit board un...

Additively manufactured printed electronics tester

System and method for testing IoT tags

Ultra-compact and micropower circuit to monitor process, voltage, a...

Substrate inspection apparatus and substrate inspection method

Devices and methods for smart sensor application

Apparatus and method for burn-in board alignment and sealing betwee...

System for testing performance of device in temperature load test

Integrated circuit test socket with integrated device picking mecha...

Substrate with crack detection function

Measurement application device calibration unit, measurement system...

Validating test patterns ported between different levels of a hiera...

Downhole fault detection in well system using spread spectrum time...

Reverse recovery measurements and plots

Charging pile and testing device, system and method thereof

Semiconductor test apparatus and semiconductor test method

Decoupling cells testability

Pluggable load module to test a voltage regulator

Integrated test cell using active thermal interposer (ATI) with par...

Apparatus for probing device-under-test

Patents Applicationslast 30 patents

SWITCH DEVICE AND TESTING DEVICE

TEST DEVICE, ELECTRONIC DEVICE, AND OPERATING METHOD OF TEST DEVICE

DETERIORATION CORRECTION CIRCUITRY

REPACKAGING IC CHIP FOR FAULT IDENTIFICATION

METHOD AND APPARATUS FOR EVALUATING INFLUENCE OF PROCESS ON SEMICON...

TESTING METHOD, DEVICE UNDER TEST, PROBE CARD AND PROBE SYSTEM FOR...

PHOTONIC INTEGRATED CHIP, ARRAY AND TESTING METHOD THEREOF

TESTING SEMICONDUCTOR MODULES

Two-Phase Helium Convection Loop for Cryogenic Cooling

Dynamic Voltage Stress Condition Optimization Method and Dynamic Vo...

DIE-TO-DIE AND CHIP-TO-CHIP INTERCONNECT CLOCK SKEW COMPENSATION

TEST PAD STRUCTURE AND METHOD OF MANUFACTURING AND OPERATING THE SAME

COMMON VOLTAGE LOADING ANALOG CIRCUIT AND DISPLAY DEVICE

BURN-IN BOARD AND BURN-IN TEST METHOD USING THE SAME

ANTENNA DEVICE FOR OTA DEVICE TESTING USING AUTOMATED TEST EQUIPMENT

Dynamic Voltage Stress Condition Optimization Method and Dynamic Vo...

VOLTAGE TRACKING CIRCUIT AND METHOD OF OPERATING THE SAME

INSPECTION APPARATUS

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

CLOCKLESS AND CALIBRATION-LESS DIFFERENTIAL AGING MONITOR

PROCEDURE FOR MAKING ON-DIE-PARAMETRIC MEASUREMENTS OF CIRCUIT DEVICES

FLOATING-CONNECTION CHIP TEST CONNECTOR

CHIP COOLING MODULE AND CHIP TESTING APPARATUS HAVING SAME

INTEGRATED CIRCUIT TESTING STRUCTURE FOR PAD BOND MISALIGNMENT DETE...

PROBE HEAD FOR LOOPBACK TESTING AND METHODS OF FORMING THE SAME

RELIABILITY TESTING USING FUNCTIONAL DEVICES

SYSTEM AND METHOD FOR WIRELESS POWER RECEPTION

MEASUREMENT APPLICATION DEVICE

ANTI-CONDENSATION LOW-TEMPERATURE TESTING MODULE AND CHIP TESTING A...

SOCKET ASSEMBLY AND ELECTRONIC COMPONENT TEST APPARATUS