Testing of electronic circuits

Industry

CPC
G01R31/28

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/28Testing of electronic circuits

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Monitoring semiconductor reliability and predicting device failure...
- Patent number 12,203,973
- Issue date Jan 21, 2025
- Tartan Silicon Systems, Inc.
- Alan Paul Aronoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power-loss delay circuit and detection control circuit thereof
- Patent number 12,203,977
- Issue date Jan 21, 2025
- MORNSUN GUANGZHOU SCIENCE & TECHNOLOGY CO., LTD.
- Mengyang Xu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Wafer level methods of testing semiconductor devices using internal...
- Patent number 12,203,980
- Issue date Jan 21, 2025
- Samsung Electronics Co., Ltd.
- Ahn Choi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor fault analysis device and semiconductor fault analysi...
- Patent number 12,203,974
- Issue date Jan 21, 2025
- Hamamatsu Photonics K.K.
- Masataka Ikesu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing board having RF connector sets
- Patent number 12,203,975
- Issue date Jan 21, 2025
- BizLink International Corp.
- Chin-An Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Automated test system for testing singulated electronic components...
- Patent number 12,203,976
- Issue date Jan 21, 2025
- Cohu GmbH
- Anton Schuster
- G01 - MEASURING TESTING
Information Patent Grant
Multi-input multi-zone thermal control for device testing
- Patent number 12,203,979
- Issue date Jan 21, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic device
- Patent number 12,203,981
- Issue date Jan 21, 2025
- The Boeing Company
- Ian M. Dayton
- G01 - MEASURING TESTING
Information Patent Grant
Flexible sideband support systems and methods
- Patent number 12,203,978
- Issue date Jan 21, 2025
- Advantest Corporation
- Srdjan Malisic
- G01 - MEASURING TESTING
Information Patent Grant
Test method of storage device implemented in multi-chip package (MC...
- Patent number 12,205,852
- Issue date Jan 21, 2025
- Samsung Electronics Co., Ltd.
- Sangmin An
- G11 - INFORMATION STORAGE
Information Patent Grant
Shielded socket and carrier for high-volume test of semiconductor d...
- Patent number 12,203,958
- Issue date Jan 21, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Contacting module for contacting optoelectronic chips
- Patent number 12,203,983
- Issue date Jan 21, 2025
- Jenoptik Optical Systems GmbH
- Robert Buettner
- G01 - MEASURING TESTING
Information Patent Grant
Probe system and machine apparatus thereof
- Patent number 12,196,779
- Issue date Jan 14, 2025
- MPI CORPORATION
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Aging test system and aging test method for thermal interface mater...
- Patent number 12,196,806
- Issue date Jan 14, 2025
- CHROMA ATE INC.
- I-Shih Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Motorized chuck stage controlling method
- Patent number 12,196,808
- Issue date Jan 14, 2025
- MPI CORPORATION
- Sebastian Giessmann
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor device
- Patent number 12,196,822
- Issue date Jan 14, 2025
- Hitachi Astemo, Ltd.
- Tomoki Takamoto
- G01 - MEASURING TESTING
Information Patent Grant
Display substrate, manufacturing method thereof, and display device
- Patent number 12,200,986
- Issue date Jan 14, 2025
- Chengdu BOE Optoelectronics Technology Co., Ltd.
- Bo Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection device and method for inspecting semicondu...
- Patent number 12,196,802
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for testing inaccessible interface circuits i...
- Patent number 12,196,805
- Issue date Jan 14, 2025
- RAMBUS INC.
- Frederick A. Ware
- G01 - MEASURING TESTING
Information Patent Grant
Signal test
- Patent number 12,196,803
- Issue date Jan 14, 2025
- Infineon Technologies AG
- Muhammad Hassan
- G01 - MEASURING TESTING
Information Patent Grant
System for scan mode exit and methods for scan mode exit
- Patent number 12,196,804
- Issue date Jan 14, 2025
- NXP B.V.
- Tarun Kumar Goyal
- G01 - MEASURING TESTING
Information Patent Grant
Near field wireless communication system for mother to package and...
- Patent number 12,196,807
- Issue date Jan 14, 2025
- Intel Corporation
- Zhen Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Vector network analyzer with digital interface
- Patent number 12,196,794
- Issue date Jan 14, 2025
- Rohde & Schwarz GmbH & Co. KG
- Steffen Heuel
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for detecting a short circuit in an H-bridge elec...
- Patent number 12,196,819
- Issue date Jan 14, 2025
- Vitesco Technologies GmbH
- Baptiste Rol
- G01 - MEASURING TESTING
Information Patent Grant
Calibration system and calibration method for a vector network anal...
- Patent number 12,188,968
- Issue date Jan 7, 2025
- Rohde & Schwarz GmbH & Co. KG
- Maximilian Friesinger
- G01 - MEASURING TESTING
Information Patent Grant
Capture and storage from signal tap points in a radio
- Patent number 12,188,976
- Issue date Jan 7, 2025
- Dell Products L.P.
- John Bradley Deforge
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for accurate pad contact testing
- Patent number 12,188,961
- Issue date Jan 7, 2025
- International Business Machines Corporation
- Kushagra Sinha
- G01 - MEASURING TESTING
Information Patent Grant
Amplitude-modulating probe card and its probe and amplitude-modulat...
- Patent number 12,188,962
- Issue date Jan 7, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Ailin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Multiple circuit board tester
- Patent number 12,188,975
- Issue date Jan 7, 2025
- LAT Enterprises Inc.
- Laura Thiel
- G01 - MEASURING TESTING
Information Patent Grant
Probe structure for micro device inspection
- Patent number 12,188,978
- Issue date Jan 7, 2025
- VueReal Inc.
- Gholamreza Chaji
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEMPERATURE ADJUSTMENT SYSTEM AND ELECTRONIC COMPONENT TESTING APPA...
- Publication number 20250027988
- Publication date Jan 23, 2025
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE FOR CHARACTERIZING A DEVICE-UNDER-TEST
- Publication number 20250027986
- Publication date Jan 23, 2025
- ROHDE & SCHWARZ GMBH & CO. KG
- Thorsten LUECK
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE BUILT IN TEST FAILURE DETECTION APPARATUS
- Publication number 20250027989
- Publication date Jan 23, 2025
- Raytheon Company
- Micky Harris
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY MODULE INSPECTION DEVICE AND DISPLAY MODULE INSPECTION METH...
- Publication number 20250029535
- Publication date Jan 23, 2025
- SAMSUNG DISPLAY CO., LTD.
- HYEONSEO CHO
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
INSPECTION SYSTEM WITH THERMAL INTERFACE, AND ELECTRONIC COMPONENT...
- Publication number 20250027987
- Publication date Jan 23, 2025
- CHROMA ATE INC.
- I-Shih Tseng
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND TEST METHOD
- Publication number 20250027991
- Publication date Jan 23, 2025
- GENERAL TEST SYSTEMS INC.
- Wei YU
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERN...
- Publication number 20250020715
- Publication date Jan 16, 2025
- QUALCOMM Incorporated
- Chengyue YU
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE PACKAGE WITH BOARD LEVEL RELIABILITY
- Publication number 20250022761
- Publication date Jan 16, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Naweed Anjum
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADAPTIVE CHIP TESTING APPARATUS AND FORMATION METHOD THEREOF
- Publication number 20250020687
- Publication date Jan 16, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
THERMAL REGULATING DEVICE
- Publication number 20250024637
- Publication date Jan 16, 2025
- Northrop Grumman Systems Corporation
- ERIN MARIE THOMSON
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
HEAT GENERATION CONTROL FOR MEMORY SYSTEM EVALUATION
- Publication number 20250022528
- Publication date Jan 16, 2025
- Micron Technology, Inc.
- Natalia Tarazona Cordoba
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET FOR 224GBPS ULTRA-HIGH-SPEED COAXIAL TESTING
- Publication number 20250020688
- Publication date Jan 16, 2025
- SOLARIS NANOFAB LTD.
- Yuanjun Shi
- G01 - MEASURING TESTING
Information Patent Application
PROBES, PROBE BLADES, TOOLS FOR PROBE BLADES, BLADE HOLDERS, AND PR...
- Publication number 20250020689
- Publication date Jan 16, 2025
- FormFactor, Inc.
- Choon Beng Sia
- G01 - MEASURING TESTING
Information Patent Application
ADHERED MULTILAYER DIE UNIT AND PROBE HEAD, PROBE SEAT, PROBE CARD...
- Publication number 20250020692
- Publication date Jan 16, 2025
- MPI Corporation
- SHENG-YU LIN
- G01 - MEASURING TESTING
Information Patent Application
UNCERTAINTY ESTIMATION FOR A POSITION RECONSTRUCTION OF SEMICONDUCT...
- Publication number 20250020714
- Publication date Jan 16, 2025
- ROBERT BOSCH GmbH
- Eric Sebastian Schmidt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MARGIN TESTER MEASUREMENT USING MACHINE LEARNING
- Publication number 20250020713
- Publication date Jan 16, 2025
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD
- Publication number 20250020717
- Publication date Jan 16, 2025
- Anritsu Corporation
- Tatsuya IWAI
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE FOR MOL RELIABILITY EVALUATION
- Publication number 20250022759
- Publication date Jan 16, 2025
- International Business Machines Corporation
- HUIMEI ZHOU
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE AND METHOD FOR TESTING OF PIC WITH AN UPTURNED MIRROR
- Publication number 20250020716
- Publication date Jan 16, 2025
- POET Technologies, Inc.
- Lucas Soldano
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ESTIMATING PERFORMANCE VALUES OF CHIPS, COMPUTING SYSTEM...
- Publication number 20250012851
- Publication date Jan 9, 2025
- Global Unichip Corporation
- Ting-Hao WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS TO DISENGAGE A TEST HEAD FROM AN INTEGRATED C...
- Publication number 20250012853
- Publication date Jan 9, 2025
- Intel Corporation
- David Daniel Wieneke
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND MEASUREMENT APPLICATION SYSTEM CONFIGURATION SYSTEM
- Publication number 20250012850
- Publication date Jan 9, 2025
- Rohde& Schwarz GmbH & Co. KG
- Thomas BRAUNSTORFINGER
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT SIMULATOR FOR DEGRADATION ESTIMATION AND TIME-OF...
- Publication number 20250012852
- Publication date Jan 9, 2025
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE AND SEMICONDUCTOR MANUFACTURING APPARATUS INCLUDING TES...
- Publication number 20250012854
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Jihyun CHOI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND STRUCTURES FOR VENTING AND FLOW CONDITIONING OPERATIONS...
- Publication number 20250012855
- Publication date Jan 9, 2025
- ASML NETHERLANDS B.V.
- Dongchi YU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING AN INTEGRITY OF A FACE SEAL IN AN ELE...
- Publication number 20250012856
- Publication date Jan 9, 2025
- HAMILTON SUNDSTRAND CORPORATION
- Rajkumar Sengodan
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER
- Publication number 20250004042
- Publication date Jan 2, 2025
- Aehr Test Systems
- Gaylord Lewis Erickson
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PACKAGE AND METHOD FOR IDENTIFYING INTEGRATED CIRCUIT...
- Publication number 20250004045
- Publication date Jan 2, 2025
- AP MEMORY TECHNOLOGY CORPORATION
- WENLIANG CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FUSE LIFE EXPECTANCY PREDICTION DEVICE FOR ELECTRIC VEHICLE BATTERY...
- Publication number 20250004072
- Publication date Jan 2, 2025
- Hyundai Motor Company
- Bo Seon Lee
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE PULSE EXTRACTION FOR TRANSMITTER CALIBRATION
- Publication number 20250004014
- Publication date Jan 2, 2025
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING

Testing of electronic circuits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Monitoring semiconductor reliability and predicting device failure...

Power-loss delay circuit and detection control circuit thereof

Wafer level methods of testing semiconductor devices using internal...

Semiconductor fault analysis device and semiconductor fault analysi...

Testing board having RF connector sets

Automated test system for testing singulated electronic components...

Multi-input multi-zone thermal control for device testing

Diagnostic device

Flexible sideband support systems and methods

Test method of storage device implemented in multi-chip package (MC...

Shielded socket and carrier for high-volume test of semiconductor d...

Contacting module for contacting optoelectronic chips

Probe system and machine apparatus thereof

Aging test system and aging test method for thermal interface mater...

Motorized chuck stage controlling method

Semiconductor device

Display substrate, manufacturing method thereof, and display device

Semiconductor inspection device and method for inspecting semicondu...

Methods and apparatus for testing inaccessible interface circuits i...

Signal test

System for scan mode exit and methods for scan mode exit

Near field wireless communication system for mother to package and...

Vector network analyzer with digital interface

Method and device for detecting a short circuit in an H-bridge elec...

Calibration system and calibration method for a vector network anal...

Capture and storage from signal tap points in a radio

Method for accurate pad contact testing

Amplitude-modulating probe card and its probe and amplitude-modulat...

Multiple circuit board tester

Probe structure for micro device inspection

Patents Applicationslast 30 patents

TEMPERATURE ADJUSTMENT SYSTEM AND ELECTRONIC COMPONENT TESTING APPA...

MEASUREMENT DEVICE FOR CHARACTERIZING A DEVICE-UNDER-TEST

INTERFACE BUILT IN TEST FAILURE DETECTION APPARATUS

DISPLAY MODULE INSPECTION DEVICE AND DISPLAY MODULE INSPECTION METH...

INSPECTION SYSTEM WITH THERMAL INTERFACE, AND ELECTRONIC COMPONENT...

TEST SYSTEM AND TEST METHOD

INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERN...

ELECTRONIC DEVICE PACKAGE WITH BOARD LEVEL RELIABILITY

ADAPTIVE CHIP TESTING APPARATUS AND FORMATION METHOD THEREOF

THERMAL REGULATING DEVICE

HEAT GENERATION CONTROL FOR MEMORY SYSTEM EVALUATION

TEST SOCKET FOR 224GBPS ULTRA-HIGH-SPEED COAXIAL TESTING

PROBES, PROBE BLADES, TOOLS FOR PROBE BLADES, BLADE HOLDERS, AND PR...

ADHERED MULTILAYER DIE UNIT AND PROBE HEAD, PROBE SEAT, PROBE CARD...

UNCERTAINTY ESTIMATION FOR A POSITION RECONSTRUCTION OF SEMICONDUCT...

MARGIN TESTER MEASUREMENT USING MACHINE LEARNING

ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD

TEST STRUCTURE FOR MOL RELIABILITY EVALUATION

STRUCTURE AND METHOD FOR TESTING OF PIC WITH AN UPTURNED MIRROR

METHOD FOR ESTIMATING PERFORMANCE VALUES OF CHIPS, COMPUTING SYSTEM...

METHODS AND APPARATUS TO DISENGAGE A TEST HEAD FROM AN INTEGRATED C...

METHOD AND MEASUREMENT APPLICATION SYSTEM CONFIGURATION SYSTEM

INTEGRATED CIRCUIT SIMULATOR FOR DEGRADATION ESTIMATION AND TIME-OF...

TEST DEVICE AND SEMICONDUCTOR MANUFACTURING APPARATUS INCLUDING TES...

SYSTEMS AND STRUCTURES FOR VENTING AND FLOW CONDITIONING OPERATIONS...

SYSTEM AND METHOD FOR TESTING AN INTEGRITY OF A FACE SEAL IN AN ELE...

ELECTRONICS TESTER

SEMICONDUCTOR PACKAGE AND METHOD FOR IDENTIFYING INTEGRATED CIRCUIT...

FUSE LIFE EXPECTANCY PREDICTION DEVICE FOR ELECTRIC VEHICLE BATTERY...

MULTIPLE PULSE EXTRACTION FOR TRANSMITTER CALIBRATION