Housings Supporting members Arrangements of terminals

Industry

CPC
G01R1/04

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/04Housings Supporting members Arrangements of terminals

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Socket
- Patent number 12,362,522
- Issue date Jul 15, 2025
- Enplas Corporation
- Ryuichi Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer structure including probe marked test pads
- Patent number 12,354,921
- Issue date Jul 8, 2025
- Powerchip Semiconductor Manufacturing Corporation
- Chun-Lin Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test kit for testing a device under test
- Patent number 12,352,781
- Issue date Jul 8, 2025
- Mediatek Inc.
- Jing-Hui Zhuang
- G01 - MEASURING TESTING
Information Patent Grant
System for testing performance of device in temperature load test
- Patent number 12,352,810
- Issue date Jul 8, 2025
- ATECO INC.
- Taek Seon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit test socket with integrated device picking mecha...
- Patent number 12,352,780
- Issue date Jul 8, 2025
- SanDisk Technologies, Inc.
- Yalaj Goyal
- G01 - MEASURING TESTING
Information Patent Grant
Charging test apparatus and method
- Patent number 12,352,828
- Issue date Jul 8, 2025
- HONOR DEVICE CO., LTD.
- Longlong Meng
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Semiconductor testing socket
- Patent number 12,352,782
- Issue date Jul 8, 2025
- Antares Advanced Test Technologies (Suzhou) Limited
- Long Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Probe holder and probe unit
- Patent number 12,345,738
- Issue date Jul 1, 2025
- NHK Spring Co., Ltd.
- Osamu Ito
- G01 - MEASURING TESTING
Information Patent Grant
Battery capacity meter and lithium battery
- Patent number 12,345,766
- Issue date Jul 1, 2025
- HUIZHOU ROYPOW TECHNOLOGY CO., LTD
- Fuqun Ye
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical testing method for semiconductor device
- Patent number 12,339,313
- Issue date Jun 24, 2025
- Renesas Electronics Corporation
- Osamu Mizoguchi
- G01 - MEASURING TESTING
Information Patent Grant
Test socket connector having latch with a bottom guiding portion
- Patent number 12,326,461
- Issue date Jun 10, 2025
- FOXCONN (KUNSHAN) COMPUTER CONNECTOR CO., LTD.
- Ming-Yue Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enclosure for testing electronic devices
- Patent number 12,323,227
- Issue date Jun 3, 2025
- Promptlink Communications, Inc.
- Foad Towfiq
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test socket and method of fabricating the same
- Patent number 12,320,827
- Issue date Jun 3, 2025
- Leeno Industrial Inc.
- Seungha Baek
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating test socket
- Patent number 12,320,833
- Issue date Jun 3, 2025
- Leeno Industrial Inc.
- Seungha Baek
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Multi-beam cantilever style contact pin for IC testing
- Patent number 12,313,650
- Issue date May 27, 2025
- Equiptest Engineering Pte Ltd
- Michael Goh
- G01 - MEASURING TESTING
Information Patent Grant
Pressurizing device for semiconductor testing and semiconductor tes...
- Patent number 12,313,677
- Issue date May 27, 2025
- Samsung Electronics Co., Ltd.
- Changgeun Yang
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for a semiconductor package
- Patent number 12,313,678
- Issue date May 27, 2025
- TSE CO., LTD.
- Min Cheol Kim
- G01 - MEASURING TESTING
Information Patent Grant
Injection device, semiconductor testing system and its testing method
- Patent number 12,313,654
- Issue date May 27, 2025
- Hermes Testing Solutions Inc.
- Bo-Lung Chen
- G01 - MEASURING TESTING
Information Patent Grant
Controlling alignment during a thermal cycle
- Patent number 12,298,328
- Issue date May 13, 2025
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Chip socket, testing fixture and chip testing method thereof
- Patent number 12,292,455
- Issue date May 6, 2025
- NANYA TECHNOLOGY CORPORATION
- Shih-Ting Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for thermal control of devices in an electronics...
- Patent number 12,292,484
- Issue date May 6, 2025
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test board and test device including the same
- Patent number 12,287,367
- Issue date Apr 29, 2025
- Samsung Electronics Co., Ltd.
- Hyung Il Kim
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope probe having probe identification module
- Patent number 12,287,354
- Issue date Apr 29, 2025
- Keysight Technologies, Inc.
- Paul Doyle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic component handling apparatus and electronic component te...
- Patent number 12,282,057
- Issue date Apr 22, 2025
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Methods and compositions for increasing the potency of antifungal a...
- Patent number 12,280,032
- Issue date Apr 22, 2025
- Pacific Northwest Research Institute
- Catherine Ludlow
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Current-sensing resistor
- Patent number 12,282,042
- Issue date Apr 22, 2025
- Isabellenhutte Heusler GmbH & Co. KG
- Benedikt Kramm
- G01 - MEASURING TESTING
Information Patent Grant
Wafer test system, probe card replacing method, and prober
- Patent number 12,282,061
- Issue date Apr 22, 2025
- Tokyo Seimitsu Co., Ltd.
- Akira Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Contact pin and socket
- Patent number 12,278,443
- Issue date Apr 15, 2025
- Enplas Corporation
- Yoshinobu Hagiwara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test carrier and carrier assembling apparatus
- Patent number 12,276,676
- Issue date Apr 15, 2025
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Waveguide alignment system with dual plates
- Patent number 12,276,677
- Issue date Apr 15, 2025
- SAGE Millimeter, Inc.
- Dhanraj Vikram Doshi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SIGNAL TRSANSMISSION CONNECTOR
- Publication number 20250237674
- Publication date Jul 24, 2025
- TSE CO., LTD.
- Bo Hyun Kim
- G01 - MEASURING TESTING
Information Patent Application
REPACKAGING IC CHIP FOR FAULT IDENTIFICATION
- Publication number 20250231233
- Publication date Jul 17, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Yi Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST SOCKET
- Publication number 20250231218
- Publication date Jul 17, 2025
- ISC CO., LTD
- Jong Woo OH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20250224423
- Publication date Jul 10, 2025
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
PREFABRICATED RUBBER SOCKET
- Publication number 20250216414
- Publication date Jul 3, 2025
- Jong Cheon Shin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POSITION FINE-TUNING STRUCTURE
- Publication number 20250216413
- Publication date Jul 3, 2025
- CHROMA ATE INC.
- Sheng-Hung WANG
- G01 - MEASURING TESTING
Information Patent Application
SOCKET ASSEMBLY AND ELECTRONIC COMPONENT TEST APPARATUS
- Publication number 20250216442
- Publication date Jul 3, 2025
- Advantest Corporation
- Natsuki Shiota
- G01 - MEASURING TESTING
Information Patent Application
ANISOTROPICALLY CONDUCTIVE CONNECTOR, ANISOTROPICALLY CONDUCTIVE CO...
- Publication number 20250208165
- Publication date Jun 26, 2025
- Shin-Etsu Polymer Co., Ltd.
- Yuichiro SASAKI
- G01 - MEASURING TESTING
Information Patent Application
SOCKET SYSTEMS WITH INTEGRATED PARTIALLY-CONDUCTIVE SUBSTRATES AND...
- Publication number 20250208192
- Publication date Jun 26, 2025
- Chiplytics Inc.
- Matthew Skeels
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING DEVICE AND METHOD OF OPERATING THEREOF
- Publication number 20250199030
- Publication date Jun 19, 2025
- KINGTIGER TESTING INC.
- Aihua Wang
- G01 - MEASURING TESTING
Information Patent Application
SOCKET APPARATUS FOR SECURE PLACEMENT OF CHIP PACKAGE
- Publication number 20250189557
- Publication date Jun 12, 2025
- Microsoft Technology Licensing, LLC
- Manoj B KESHAVAN
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL SOCKET WITH AN IMPROVED ELEVATING MECHANISM FOR A HEATIN...
- Publication number 20250189558
- Publication date Jun 12, 2025
- FOXCONN (KUNSHAN) COMPUTER CONNECTOR CO., LTD.
- MING-YUE CHEN
- G01 - MEASURING TESTING
Information Patent Application
INSERT MODULE FOR TEST HANDER AND TEST TRAY COMPRISING THE SAME
- Publication number 20250189556
- Publication date Jun 12, 2025
- ATECO INC.
- Taek Seon LEE
- G01 - MEASURING TESTING
Information Patent Application
CONTACT TERMINAL, TERMINAL ASSEMBLY, AND DEVICE TESTING APPARATUS
- Publication number 20250180602
- Publication date Jun 5, 2025
- Advantest Corporation
- Wataru Saeki
- G01 - MEASURING TESTING
Information Patent Application
CONDUCTIVE CONNECTOR AND SOCKET
- Publication number 20250183198
- Publication date Jun 5, 2025
- UNITED PRECISION TECHNOLOGIES CO., LTD.
- Norio HAMAUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cable peeling encapsulation system
- Publication number 20250172633
- Publication date May 29, 2025
- NEXANS
- Espen DOEDENS
- G01 - MEASURING TESTING
Information Patent Application
HEAT DISSIPATION STRUCTURE
- Publication number 20250176144
- Publication date May 29, 2025
- Siliconware Precision Industries Co., Ltd.
- Meng-Lin WU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TE...
- Publication number 20250172612
- Publication date May 29, 2025
- Advantest Corporation
- José MOREIRA
- G01 - MEASURING TESTING
Information Patent Application
Automated electrical characterization on HV cable peeling
- Publication number 20250172605
- Publication date May 29, 2025
- NEXANS
- Espen DOEDENS
- G01 - MEASURING TESTING
Information Patent Application
MODULAR TEST SOCKET
- Publication number 20250172586
- Publication date May 29, 2025
- TSE CO., LTD.
- Hoe Sik Moon
- G01 - MEASURING TESTING
Information Patent Application
DEVICE HANDLING APPARATUS AND DEVICE TESTING APPARATUS
- Publication number 20250172610
- Publication date May 29, 2025
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TE...
- Publication number 20250172613
- Publication date May 29, 2025
- Advantest Corporation
- José MOREIRA
- G01 - MEASURING TESTING
Information Patent Application
TERMINAL BLOCK TEST ADAPTER
- Publication number 20250164524
- Publication date May 22, 2025
- Cameron Woolsey
- G01 - MEASURING TESTING
Information Patent Application
TEST TRAY FOR SEMICONDUCTOR DEVICES AND TEST APPARATUS USING THE SAME
- Publication number 20250164552
- Publication date May 22, 2025
- ATECO INC.
- Taek Seon LEE
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TESTING FOR WIRE HARNESS ASSEMBLY STATIONS
- Publication number 20250155521
- Publication date May 15, 2025
- VOLEX PLC
- David Aguilar Aguilar
- G01 - MEASURING TESTING
Information Patent Application
TEST FIXTURE ASSEMBLY
- Publication number 20250155472
- Publication date May 15, 2025
- Universal Scientific Industrial (Shanghai) Co., Ltd.
- HAO LIANG HUNG
- G01 - MEASURING TESTING
Information Patent Application
CARTRIDGE FOR INSPECTION
- Publication number 20250157861
- Publication date May 15, 2025
- VueReal Inc.
- Gholamreza CHAJI
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR DOUBLE SIDE PROBING, METHOD OF OPERATING THE SAME...
- Publication number 20250147067
- Publication date May 8, 2025
- MPI Corporation
- PO-YI TING
- G01 - MEASURING TESTING
Information Patent Application
LOW FRICTION HORIZONTAL PROBING FIXTURE
- Publication number 20250147068
- Publication date May 8, 2025
- Kuan-Hung Chen
- G01 - MEASURING TESTING
Information Patent Application
MODULAR POWER METER ASSEMBLY
- Publication number 20250141154
- Publication date May 1, 2025
- Accuenergy (Canada) Inc.
- Yufan Wang
- H01 - BASIC ELECTRIC ELEMENTS

Housings Supporting members Arrangements of terminals

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Socket

Wafer structure including probe marked test pads

Test kit for testing a device under test

System for testing performance of device in temperature load test

Integrated circuit test socket with integrated device picking mecha...

Charging test apparatus and method

Semiconductor testing socket

Probe holder and probe unit

Battery capacity meter and lithium battery

Electrical testing method for semiconductor device

Test socket connector having latch with a bottom guiding portion

Enclosure for testing electronic devices

Test socket and method of fabricating the same

Method for fabricating test socket

Multi-beam cantilever style contact pin for IC testing

Pressurizing device for semiconductor testing and semiconductor tes...

Test apparatus for a semiconductor package

Injection device, semiconductor testing system and its testing method

Controlling alignment during a thermal cycle

Chip socket, testing fixture and chip testing method thereof

Method and system for thermal control of devices in an electronics...

Test board and test device including the same

Oscilloscope probe having probe identification module

Electronic component handling apparatus and electronic component te...

Methods and compositions for increasing the potency of antifungal a...

Current-sensing resistor

Wafer test system, probe card replacing method, and prober

Contact pin and socket

Test carrier and carrier assembling apparatus

Waveguide alignment system with dual plates

Patents Applicationslast 30 patents

SIGNAL TRSANSMISSION CONNECTOR

REPACKAGING IC CHIP FOR FAULT IDENTIFICATION

TEST SOCKET

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

PREFABRICATED RUBBER SOCKET

POSITION FINE-TUNING STRUCTURE

SOCKET ASSEMBLY AND ELECTRONIC COMPONENT TEST APPARATUS

ANISOTROPICALLY CONDUCTIVE CONNECTOR, ANISOTROPICALLY CONDUCTIVE CO...

SOCKET SYSTEMS WITH INTEGRATED PARTIALLY-CONDUCTIVE SUBSTRATES AND...

CHIP TESTING DEVICE AND METHOD OF OPERATING THEREOF

SOCKET APPARATUS FOR SECURE PLACEMENT OF CHIP PACKAGE

ELECTRICAL SOCKET WITH AN IMPROVED ELEVATING MECHANISM FOR A HEATIN...

INSERT MODULE FOR TEST HANDER AND TEST TRAY COMPRISING THE SAME

CONTACT TERMINAL, TERMINAL ASSEMBLY, AND DEVICE TESTING APPARATUS

CONDUCTIVE CONNECTOR AND SOCKET

Cable peeling encapsulation system

HEAT DISSIPATION STRUCTURE

TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TE...

Automated electrical characterization on HV cable peeling

MODULAR TEST SOCKET

DEVICE HANDLING APPARATUS AND DEVICE TESTING APPARATUS

TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TE...

TERMINAL BLOCK TEST ADAPTER

TEST TRAY FOR SEMICONDUCTOR DEVICES AND TEST APPARATUS USING THE SAME

AUTOMATED TESTING FOR WIRE HARNESS ASSEMBLY STATIONS

TEST FIXTURE ASSEMBLY

CARTRIDGE FOR INSPECTION

PROBE SYSTEM FOR DOUBLE SIDE PROBING, METHOD OF OPERATING THE SAME...

LOW FRICTION HORIZONTAL PROBING FIXTURE

MODULAR POWER METER ASSEMBLY