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G01R1/04

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

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G01R1/04Housings Supporting members Arrangements of terminals

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Electronic component handling apparatus and electronic component te...
- Patent number 12,282,057
- Issue date Apr 22, 2025
- Advantest Corporation
- G01 - MEASURING TESTING
Information Patent Grant
Methods and compositions for increasing the potency of antifungal a...
- Patent number 12,280,032
- Issue date Apr 22, 2025
- Pacific Northwest Research Institute
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Current-sensing resistor
- Patent number 12,282,042
- Issue date Apr 22, 2025
- Isabellenhutte Heusler GmbH & Co. KG
- G01 - MEASURING TESTING
Information Patent Grant
Wafer test system, probe card replacing method, and prober
- Patent number 12,282,061
- Issue date Apr 22, 2025
- Tokyo Seimitsu Co., Ltd.
- G01 - MEASURING TESTING
Information Patent Grant
Contact pin and socket
- Patent number 12,278,443
- Issue date Apr 15, 2025
- Enplas Corporation
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test carrier and carrier assembling apparatus
- Patent number 12,276,676
- Issue date Apr 15, 2025
- Advantest Corporation
- G01 - MEASURING TESTING
Information Patent Grant
Waveguide alignment system with dual plates
- Patent number 12,276,677
- Issue date Apr 15, 2025
- SAGE Millimeter, Inc.
- G01 - MEASURING TESTING
Information Patent Grant
Transfer switch with communication capability
- Patent number 12,270,840
- Issue date Apr 8, 2025
- North American Power Products, Inc.
- Mark Matyac
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Repackaging IC chip for fault identification
- Patent number 12,265,119
- Issue date Apr 1, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chien-Yi Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for thermal control of devices in electronics tester
- Patent number 12,265,136
- Issue date Apr 1, 2025
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Experimental multifunctional power supply processing device and exp...
- Patent number 12,259,431
- Issue date Mar 25, 2025
- GUANG'AN ELECTRICAL TESTING CENTER (GUANGDONG) CO., LTD.
- Zhili Lin
- G01 - MEASURING TESTING
Information Patent Grant
Pogo pin cooling system and method and electronic device testing ap...
- Patent number 12,253,541
- Issue date Mar 18, 2025
- CHROMA ATE INC.
- I-Shih Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Lidless BGA socket apparatus for testing semiconductor device
- Patent number 12,248,001
- Issue date Mar 11, 2025
- HICON CO., LTD.
- Dong Weon Hwang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radio frequency performance characterization of multi-carrier broad...
- Patent number 12,248,000
- Issue date Mar 11, 2025
- Charter Communications Operating, LLC
- Diana Linton
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Socketless or flush mount QFN (quad flat no lead) test board, fixtu...
- Patent number 12,241,912
- Issue date Mar 4, 2025
- Raytheon Company
- David Yu Shan Sun
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus
- Patent number 12,241,926
- Issue date Mar 4, 2025
- Advantest Corporation
- Naoyoshi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Shield box for testing mobile telecommunication terminal
- Patent number 12,235,286
- Issue date Feb 25, 2025
- Innowireless Co., Ltd.
- Kuei Nam Shin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Parallel test cell with self actuated sockets
- Patent number 12,235,314
- Issue date Feb 25, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Cartridge for inspection
- Patent number 12,237,236
- Issue date Feb 25, 2025
- VueReal Inc.
- Gholamreza Chaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma reactor having array of coaxial multiple pins and processing...
- Patent number 12,230,481
- Issue date Feb 18, 2025
- HANGZHOU CITY UNIVERSITY
- Qi Qiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Current sensor assembly and inverter assembly having a plurality of...
- Patent number 12,222,366
- Issue date Feb 11, 2025
- LG Magna e-Powertrain Co., Ltd.
- Somi Sim
- G01 - MEASURING TESTING
Information Patent Grant
Contact pins for test sockets and test sockets comprising the same
- Patent number 12,222,367
- Issue date Feb 11, 2025
- Okins Electronics Co., Ltd.
- Jin Kook Jun
- G01 - MEASURING TESTING
Information Patent Grant
Active thermal interposer device
- Patent number 12,216,154
- Issue date Feb 4, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive flexible chip test socket and formation method thereof
- Patent number 12,216,139
- Issue date Feb 4, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe Lian
- G01 - MEASURING TESTING
Information Patent Grant
Test socket for semiconductor integrated circuits
- Patent number 12,210,036
- Issue date Jan 28, 2025
- Smiths Interconnect Americas, Inc.
- Peter Ursu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shielded socket and carrier for high-volume test of semiconductor d...
- Patent number 12,203,958
- Issue date Jan 21, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Vehicular camera testing system using spring-loaded electrical conn...
- Patent number 12,184,830
- Issue date Dec 31, 2024
- Magna Electronics Inc.
- Anthony N. Rinaldo
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Probe head and substrate inspection device including the same
- Patent number 12,181,492
- Issue date Dec 31, 2024
- Kee Bok Seo
- G01 - MEASURING TESTING
Information Patent Grant
Universal mate-in cable interface system
- Patent number 12,174,219
- Issue date Dec 24, 2024
- ZIOTA TECHNOLOGY INC.
- Alain Lussier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probing device and inspection method using the same
- Patent number 12,174,249
- Issue date Dec 24, 2024
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Module Inspection Device
- Publication number 20250130252
- Publication date Apr 24, 2025
- Nippon Telegraph and Telephone Corporation
- Masayuki Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Probe Integrated Circuit and Measurement System
- Publication number 20250123306
- Publication date Apr 17, 2025
- National Instruments Corporation
- Mark Whittington
- G01 - MEASURING TESTING
Information Patent Application
UNIVERSAL MATE-IN CABLE INTERFACE SYSTEM
- Publication number 20250116683
- Publication date Apr 10, 2025
- ZIOTA TECHNOLOGY INC.
- Alain Lussier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PACKAGE INSPECTION DEVICE
- Publication number 20250116684
- Publication date Apr 10, 2025
- Samsung Electronics Co., Ltd.
- Hyun YANG
- G01 - MEASURING TESTING
Information Patent Application
Process for Manufacturing an Electric Current Sensor by Additive Ma...
- Publication number 20250102537
- Publication date Mar 27, 2025
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Manuel FENDLER
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Application
TEST SOCKET FOR IC TESTING AND MANUFACTURING METHOD THEREOF
- Publication number 20250102538
- Publication date Mar 27, 2025
- He Chou Technology INC.
- WEI-BEEN YU
- G01 - MEASURING TESTING
Information Patent Application
BATTERY CELL TESTING UNIT AND BATTERY CELL TESTING SYSTEM
- Publication number 20250105379
- Publication date Mar 27, 2025
- AVL LIST GMBH
- AUGUSTIN GILLI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER TEST SYSTEM
- Publication number 20250093387
- Publication date Mar 20, 2025
- XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20250093408
- Publication date Mar 20, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT CONDUCTIVE STRUCTURE FOR CIRCUIT PROBE TESTING
- Publication number 20250076340
- Publication date Mar 6, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shu-Cheng Chin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOCKET AND INSPECTION SOCKET
- Publication number 20250067773
- Publication date Feb 27, 2025
- ENPLAS CORPORATION
- Rui Zhi LAW
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOCKET AND INSPECTION SOCKET
- Publication number 20250067772
- Publication date Feb 27, 2025
- ENPLAS CORPORATION
- Kazutaka KOSHIISHI
- G01 - MEASURING TESTING
Information Patent Application
CABLE TESTING SYSTEMS AND METHODS FOR TROUBLESHOOTING AND REPAIR IN...
- Publication number 20250052835
- Publication date Feb 13, 2025
- Brian Daniel Markus
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SOCKET
- Publication number 20250052782
- Publication date Feb 13, 2025
- YOKOWO CO., LTD
- Hirotaka TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
DETACHABLE PROTECTIVE STRUCTURE OF DETECTION DEVICE
- Publication number 20250044320
- Publication date Feb 6, 2025
- NATIONAL APPLIED RESEARCH LABORATORIES
- GUO-WEI HUANG
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE FOR CAPACITANCE OF SEMICONDUCTOR DEVICE AND MEASUR...
- Publication number 20250035689
- Publication date Jan 30, 2025
- Mitsubishi Electric Corporation
- Masayoshi HIRAO
- G01 - MEASURING TESTING
Information Patent Application
PHASE-CHANGE TEMPERATURE REGULATING SYSTEM AND ELECTRONIC COMPONENT...
- Publication number 20250040095
- Publication date Jan 30, 2025
- CHROMA ATE INC.
- Xin-Yi Wu
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
DATA SIGNAL TRANSMISSION CONNECTOR AND MANUFACTURING METHOD FOR THE...
- Publication number 20250027972
- Publication date Jan 23, 2025
- TSE CO., LTD
- Bo Hyun KIM
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM WITH THERMAL INTERFACE, AND ELECTRONIC COMPONENT...
- Publication number 20250027987
- Publication date Jan 23, 2025
- CHROMA ATE INC.
- I-Shih Tseng
- G01 - MEASURING TESTING
Information Patent Application
ADAPTIVE CHIP TESTING APPARATUS AND FORMATION METHOD THEREOF
- Publication number 20250020687
- Publication date Jan 16, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET FOR 224GBPS ULTRA-HIGH-SPEED COAXIAL TESTING
- Publication number 20250020688
- Publication date Jan 16, 2025
- SOLARIS NANOFAB LTD.
- Yuanjun Shi
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE AND ITS ADAPTER HOLDER
- Publication number 20250012830
- Publication date Jan 9, 2025
- CHROMA ATE INC.
- Ching-Li LIN
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET FOR PREVENTING SIGNAL LOSS
- Publication number 20250004011
- Publication date Jan 2, 2025
- SAE HAN MICRO TECH CO., LTD.
- Jea Hyoung LEE
- G01 - MEASURING TESTING
Information Patent Application
Scalable Tester for Testing Multiple Devices Under Test
- Publication number 20240426897
- Publication date Dec 26, 2024
- Albert Gaoiran
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTION APPARATUS
- Publication number 20240426903
- Publication date Dec 26, 2024
- Kabushiki Kaisha Nihon Micronics
- Souichi KANOSUE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICS IN ELECTRONICS TESTER
- Publication number 20240426938
- Publication date Dec 26, 2024
- Aehr Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...
- Publication number 20240426939
- Publication date Dec 26, 2024
- Aehr Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPLIT INSULATED INPUT POST FOR ELECTRICAL MEASUREMENT TOOL
- Publication number 20240418748
- Publication date Dec 19, 2024
- FLUKE CORPORATION
- Yinhong YANG
- G08 - SIGNALLING
Information Patent Application
ADAPTIVE FLEXIBLE CHIP TEST SOCKET AND FORMATION METHOD THEREOF
- Publication number 20240410917
- Publication date Dec 12, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...
- Publication number 20240402217
- Publication date Dec 5, 2024
- Smiths Interconnect Americas, Inc.
- Khaled Elmadbouly
- G01 - MEASURING TESTING

Housings Supporting members Arrangements of terminals

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electronic component handling apparatus and electronic component te...

Methods and compositions for increasing the potency of antifungal a...

Current-sensing resistor

Wafer test system, probe card replacing method, and prober

Contact pin and socket

Test carrier and carrier assembling apparatus

Waveguide alignment system with dual plates

Transfer switch with communication capability

Repackaging IC chip for fault identification

Method and system for thermal control of devices in electronics tester

Experimental multifunctional power supply processing device and exp...

Pogo pin cooling system and method and electronic device testing ap...

Lidless BGA socket apparatus for testing semiconductor device

Radio frequency performance characterization of multi-carrier broad...

Socketless or flush mount QFN (quad flat no lead) test board, fixtu...

Test apparatus

Shield box for testing mobile telecommunication terminal

Parallel test cell with self actuated sockets

Cartridge for inspection

Plasma reactor having array of coaxial multiple pins and processing...

Current sensor assembly and inverter assembly having a plurality of...

Contact pins for test sockets and test sockets comprising the same

Active thermal interposer device

Adaptive flexible chip test socket and formation method thereof

Test socket for semiconductor integrated circuits

Shielded socket and carrier for high-volume test of semiconductor d...

Vehicular camera testing system using spring-loaded electrical conn...

Probe head and substrate inspection device including the same

Universal mate-in cable interface system

Probing device and inspection method using the same

Patents Applicationslast 30 patents

Semiconductor Module Inspection Device

Probe Integrated Circuit and Measurement System

UNIVERSAL MATE-IN CABLE INTERFACE SYSTEM

SEMICONDUCTOR PACKAGE INSPECTION DEVICE

Process for Manufacturing an Electric Current Sensor by Additive Ma...

TEST SOCKET FOR IC TESTING AND MANUFACTURING METHOD THEREOF

BATTERY CELL TESTING UNIT AND BATTERY CELL TESTING SYSTEM

WAFER TEST SYSTEM

ACTIVE THERMAL INTERPOSER DEVICE

INTEGRATED CIRCUIT CONDUCTIVE STRUCTURE FOR CIRCUIT PROBE TESTING

SOCKET AND INSPECTION SOCKET

SOCKET AND INSPECTION SOCKET

CABLE TESTING SYSTEMS AND METHODS FOR TROUBLESHOOTING AND REPAIR IN...

INSPECTION SOCKET

DETACHABLE PROTECTIVE STRUCTURE OF DETECTION DEVICE

MEASURING DEVICE FOR CAPACITANCE OF SEMICONDUCTOR DEVICE AND MEASUR...

PHASE-CHANGE TEMPERATURE REGULATING SYSTEM AND ELECTRONIC COMPONENT...

DATA SIGNAL TRANSMISSION CONNECTOR AND MANUFACTURING METHOD FOR THE...

INSPECTION SYSTEM WITH THERMAL INTERFACE, AND ELECTRONIC COMPONENT...

ADAPTIVE CHIP TESTING APPARATUS AND FORMATION METHOD THEREOF

TEST SOCKET FOR 224GBPS ULTRA-HIGH-SPEED COAXIAL TESTING

TESTING DEVICE AND ITS ADAPTER HOLDER

TEST SOCKET FOR PREVENTING SIGNAL LOSS

Scalable Tester for Testing Multiple Devices Under Test

ELECTRICAL CONNECTION APPARATUS

METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICS IN ELECTRONICS TESTER

METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...

SPLIT INSULATED INPUT POST FOR ELECTRICAL MEASUREMENT TOOL

ADAPTIVE FLEXIBLE CHIP TEST SOCKET AND FORMATION METHOD THEREOF

SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...