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G01R1/04

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

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G01R1/04Housings Supporting members Arrangements of terminals

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Enclosure for testing electronic devices
- Patent number 12,323,227
- Issue date Jun 3, 2025
- Promptlink Communications, Inc.
- Foad Towfiq
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test socket and method of fabricating the same
- Patent number 12,320,827
- Issue date Jun 3, 2025
- Leeno Industrial Inc.
- Seungha Baek
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating test socket
- Patent number 12,320,833
- Issue date Jun 3, 2025
- Leeno Industrial Inc.
- Seungha Baek
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Multi-beam cantilever style contact pin for IC testing
- Patent number 12,313,650
- Issue date May 27, 2025
- Equiptest Engineering Pte Ltd
- Michael Goh
- G01 - MEASURING TESTING
Information Patent Grant
Pressurizing device for semiconductor testing and semiconductor tes...
- Patent number 12,313,677
- Issue date May 27, 2025
- Samsung Electronics Co., Ltd.
- Changgeun Yang
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for a semiconductor package
- Patent number 12,313,678
- Issue date May 27, 2025
- TSE CO., LTD.
- Min Cheol Kim
- G01 - MEASURING TESTING
Information Patent Grant
Injection device, semiconductor testing system and its testing method
- Patent number 12,313,654
- Issue date May 27, 2025
- Hermes Testing Solutions Inc.
- Bo-Lung Chen
- G01 - MEASURING TESTING
Information Patent Grant
Controlling alignment during a thermal cycle
- Patent number 12,298,328
- Issue date May 13, 2025
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for thermal control of devices in an electronics...
- Patent number 12,292,484
- Issue date May 6, 2025
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chip socket, testing fixture and chip testing method thereof
- Patent number 12,292,455
- Issue date May 6, 2025
- NANYA TECHNOLOGY CORPORATION
- Shih-Ting Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Test board and test device including the same
- Patent number 12,287,367
- Issue date Apr 29, 2025
- Samsung Electronics Co., Ltd.
- Hyung Il Kim
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope probe having probe identification module
- Patent number 12,287,354
- Issue date Apr 29, 2025
- Keysight Technologies, Inc.
- Paul Doyle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and compositions for increasing the potency of antifungal a...
- Patent number 12,280,032
- Issue date Apr 22, 2025
- Pacific Northwest Research Institute
- Catherine Ludlow
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Electronic component handling apparatus and electronic component te...
- Patent number 12,282,057
- Issue date Apr 22, 2025
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Current-sensing resistor
- Patent number 12,282,042
- Issue date Apr 22, 2025
- Isabellenhutte Heusler GmbH & Co. KG
- Benedikt Kramm
- G01 - MEASURING TESTING
Information Patent Grant
Wafer test system, probe card replacing method, and prober
- Patent number 12,282,061
- Issue date Apr 22, 2025
- Tokyo Seimitsu Co., Ltd.
- Akira Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Test carrier and carrier assembling apparatus
- Patent number 12,276,676
- Issue date Apr 15, 2025
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Contact pin and socket
- Patent number 12,278,443
- Issue date Apr 15, 2025
- Enplas Corporation
- Yoshinobu Hagiwara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Waveguide alignment system with dual plates
- Patent number 12,276,677
- Issue date Apr 15, 2025
- SAGE Millimeter, Inc.
- Dhanraj Vikram Doshi
- G01 - MEASURING TESTING
Information Patent Grant
Transfer switch with communication capability
- Patent number 12,270,840
- Issue date Apr 8, 2025
- North American Power Products, Inc.
- Mark Matyac
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Repackaging IC chip for fault identification
- Patent number 12,265,119
- Issue date Apr 1, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chien-Yi Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for thermal control of devices in electronics tester
- Patent number 12,265,136
- Issue date Apr 1, 2025
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Experimental multifunctional power supply processing device and exp...
- Patent number 12,259,431
- Issue date Mar 25, 2025
- GUANG'AN ELECTRICAL TESTING CENTER (GUANGDONG) CO., LTD.
- Zhili Lin
- G01 - MEASURING TESTING
Information Patent Grant
Pogo pin cooling system and method and electronic device testing ap...
- Patent number 12,253,541
- Issue date Mar 18, 2025
- CHROMA ATE INC.
- I-Shih Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Lidless BGA socket apparatus for testing semiconductor device
- Patent number 12,248,001
- Issue date Mar 11, 2025
- HICON CO., LTD.
- Dong Weon Hwang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radio frequency performance characterization of multi-carrier broad...
- Patent number 12,248,000
- Issue date Mar 11, 2025
- Charter Communications Operating, LLC
- Diana Linton
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Socketless or flush mount QFN (quad flat no lead) test board, fixtu...
- Patent number 12,241,912
- Issue date Mar 4, 2025
- Raytheon Company
- David Yu Shan Sun
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus
- Patent number 12,241,926
- Issue date Mar 4, 2025
- Advantest Corporation
- Naoyoshi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Shield box for testing mobile telecommunication terminal
- Patent number 12,235,286
- Issue date Feb 25, 2025
- Innowireless Co., Ltd.
- Kuei Nam Shin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Parallel test cell with self actuated sockets
- Patent number 12,235,314
- Issue date Feb 25, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTACT TERMINAL, TERMINAL ASSEMBLY, AND DEVICE TESTING APPARATUS
- Publication number 20250180602
- Publication date Jun 5, 2025
- Advantest Corporation
- Wataru Saeki
- G01 - MEASURING TESTING
Information Patent Application
CONDUCTIVE CONNECTOR AND SOCKET
- Publication number 20250183198
- Publication date Jun 5, 2025
- UNITED PRECISION TECHNOLOGIES CO., LTD.
- Norio HAMAUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cable peeling encapsulation system
- Publication number 20250172633
- Publication date May 29, 2025
- NEXANS
- Espen DOEDENS
- G01 - MEASURING TESTING
Information Patent Application
HEAT DISSIPATION STRUCTURE
- Publication number 20250176144
- Publication date May 29, 2025
- Siliconware Precision Industries Co., Ltd.
- Meng-Lin WU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TE...
- Publication number 20250172612
- Publication date May 29, 2025
- Advantest Corporation
- José MOREIRA
- G01 - MEASURING TESTING
Information Patent Application
Automated electrical characterization on HV cable peeling
- Publication number 20250172605
- Publication date May 29, 2025
- NEXANS
- Espen DOEDENS
- G01 - MEASURING TESTING
Information Patent Application
MODULAR TEST SOCKET
- Publication number 20250172586
- Publication date May 29, 2025
- TSE CO., LTD.
- Hoe Sik Moon
- G01 - MEASURING TESTING
Information Patent Application
DEVICE HANDLING APPARATUS AND DEVICE TESTING APPARATUS
- Publication number 20250172610
- Publication date May 29, 2025
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TE...
- Publication number 20250172613
- Publication date May 29, 2025
- Advantest Corporation
- José MOREIRA
- G01 - MEASURING TESTING
Information Patent Application
TERMINAL BLOCK TEST ADAPTER
- Publication number 20250164524
- Publication date May 22, 2025
- Cameron Woolsey
- G01 - MEASURING TESTING
Information Patent Application
TEST TRAY FOR SEMICONDUCTOR DEVICES AND TEST APPARATUS USING THE SAME
- Publication number 20250164552
- Publication date May 22, 2025
- ATECO INC.
- Taek Seon LEE
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TESTING FOR WIRE HARNESS ASSEMBLY STATIONS
- Publication number 20250155521
- Publication date May 15, 2025
- VOLEX PLC
- David Aguilar Aguilar
- G01 - MEASURING TESTING
Information Patent Application
TEST FIXTURE ASSEMBLY
- Publication number 20250155472
- Publication date May 15, 2025
- Universal Scientific Industrial (Shanghai) Co., Ltd.
- HAO LIANG HUNG
- G01 - MEASURING TESTING
Information Patent Application
CARTRIDGE FOR INSPECTION
- Publication number 20250157861
- Publication date May 15, 2025
- VueReal Inc.
- Gholamreza CHAJI
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR DOUBLE SIDE PROBING, METHOD OF OPERATING THE SAME...
- Publication number 20250147067
- Publication date May 8, 2025
- MPI Corporation
- PO-YI TING
- G01 - MEASURING TESTING
Information Patent Application
LOW FRICTION HORIZONTAL PROBING FIXTURE
- Publication number 20250147068
- Publication date May 8, 2025
- Kuan-Hung Chen
- G01 - MEASURING TESTING
Information Patent Application
MODULAR POWER METER ASSEMBLY
- Publication number 20250141154
- Publication date May 1, 2025
- Accuenergy (Canada) Inc.
- Yufan Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST MODULE FOR TESTING IMAGE SENSOR AND TEST SYSTEM INCLUDING THE...
- Publication number 20250138048
- Publication date May 1, 2025
- Samsung Electronics Co., Ltd.
- Insang SONG
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Module Inspection Device
- Publication number 20250130252
- Publication date Apr 24, 2025
- Nippon Telegraph and Telephone Corporation
- Masayuki Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Probe Integrated Circuit and Measurement System
- Publication number 20250123306
- Publication date Apr 17, 2025
- National Instruments Corporation
- Mark Whittington
- G01 - MEASURING TESTING
Information Patent Application
UNIVERSAL MATE-IN CABLE INTERFACE SYSTEM
- Publication number 20250116683
- Publication date Apr 10, 2025
- ZIOTA TECHNOLOGY INC.
- Alain Lussier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PACKAGE INSPECTION DEVICE
- Publication number 20250116684
- Publication date Apr 10, 2025
- Samsung Electronics Co., Ltd.
- Hyun YANG
- G01 - MEASURING TESTING
Information Patent Application
Process for Manufacturing an Electric Current Sensor by Additive Ma...
- Publication number 20250102537
- Publication date Mar 27, 2025
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Manuel FENDLER
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Application
TEST SOCKET FOR IC TESTING AND MANUFACTURING METHOD THEREOF
- Publication number 20250102538
- Publication date Mar 27, 2025
- He Chou Technology INC.
- WEI-BEEN YU
- G01 - MEASURING TESTING
Information Patent Application
BATTERY CELL TESTING UNIT AND BATTERY CELL TESTING SYSTEM
- Publication number 20250105379
- Publication date Mar 27, 2025
- AVL LIST GMBH
- AUGUSTIN GILLI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER TEST SYSTEM
- Publication number 20250093387
- Publication date Mar 20, 2025
- XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20250093408
- Publication date Mar 20, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT CONDUCTIVE STRUCTURE FOR CIRCUIT PROBE TESTING
- Publication number 20250076340
- Publication date Mar 6, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shu-Cheng Chin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOCKET AND INSPECTION SOCKET
- Publication number 20250067773
- Publication date Feb 27, 2025
- ENPLAS CORPORATION
- Rui Zhi LAW
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOCKET AND INSPECTION SOCKET
- Publication number 20250067772
- Publication date Feb 27, 2025
- ENPLAS CORPORATION
- Kazutaka KOSHIISHI
- G01 - MEASURING TESTING

Housings Supporting members Arrangements of terminals

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Enclosure for testing electronic devices

Test socket and method of fabricating the same

Method for fabricating test socket

Multi-beam cantilever style contact pin for IC testing

Pressurizing device for semiconductor testing and semiconductor tes...

Test apparatus for a semiconductor package

Injection device, semiconductor testing system and its testing method

Controlling alignment during a thermal cycle

Method and system for thermal control of devices in an electronics...

Chip socket, testing fixture and chip testing method thereof

Test board and test device including the same

Oscilloscope probe having probe identification module

Methods and compositions for increasing the potency of antifungal a...

Electronic component handling apparatus and electronic component te...

Current-sensing resistor

Wafer test system, probe card replacing method, and prober

Test carrier and carrier assembling apparatus

Contact pin and socket

Waveguide alignment system with dual plates

Transfer switch with communication capability

Repackaging IC chip for fault identification

Method and system for thermal control of devices in electronics tester

Experimental multifunctional power supply processing device and exp...

Pogo pin cooling system and method and electronic device testing ap...

Lidless BGA socket apparatus for testing semiconductor device

Radio frequency performance characterization of multi-carrier broad...

Socketless or flush mount QFN (quad flat no lead) test board, fixtu...

Test apparatus

Shield box for testing mobile telecommunication terminal

Parallel test cell with self actuated sockets

Patents Applicationslast 30 patents

CONTACT TERMINAL, TERMINAL ASSEMBLY, AND DEVICE TESTING APPARATUS

CONDUCTIVE CONNECTOR AND SOCKET

Cable peeling encapsulation system

HEAT DISSIPATION STRUCTURE

TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TE...

Automated electrical characterization on HV cable peeling

MODULAR TEST SOCKET

DEVICE HANDLING APPARATUS AND DEVICE TESTING APPARATUS

TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TE...

TERMINAL BLOCK TEST ADAPTER

TEST TRAY FOR SEMICONDUCTOR DEVICES AND TEST APPARATUS USING THE SAME

AUTOMATED TESTING FOR WIRE HARNESS ASSEMBLY STATIONS

TEST FIXTURE ASSEMBLY

CARTRIDGE FOR INSPECTION

PROBE SYSTEM FOR DOUBLE SIDE PROBING, METHOD OF OPERATING THE SAME...

LOW FRICTION HORIZONTAL PROBING FIXTURE

MODULAR POWER METER ASSEMBLY

TEST MODULE FOR TESTING IMAGE SENSOR AND TEST SYSTEM INCLUDING THE...

Semiconductor Module Inspection Device

Probe Integrated Circuit and Measurement System

UNIVERSAL MATE-IN CABLE INTERFACE SYSTEM

SEMICONDUCTOR PACKAGE INSPECTION DEVICE

Process for Manufacturing an Electric Current Sensor by Additive Ma...

TEST SOCKET FOR IC TESTING AND MANUFACTURING METHOD THEREOF

BATTERY CELL TESTING UNIT AND BATTERY CELL TESTING SYSTEM

WAFER TEST SYSTEM

ACTIVE THERMAL INTERPOSER DEVICE

INTEGRATED CIRCUIT CONDUCTIVE STRUCTURE FOR CIRCUIT PROBE TESTING

SOCKET AND INSPECTION SOCKET

SOCKET AND INSPECTION SOCKET