Housings Supporting members Arrangements of terminals

Industry

CPC
G01R1/04

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/04Housings Supporting members Arrangements of terminals

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Vehicular camera testing system using spring-loaded electrical conn...
- Patent number 12,184,830
- Issue date Dec 31, 2024
- Magna Electronics Inc.
- Anthony N. Rinaldo
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Probe head and substrate inspection device including the same
- Patent number 12,181,492
- Issue date Dec 31, 2024
- Kee Bok Seo
- G01 - MEASURING TESTING
Information Patent Grant
Universal mate-in cable interface system
- Patent number 12,174,219
- Issue date Dec 24, 2024
- ZIOTA TECHNOLOGY INC.
- Alain Lussier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probing device and inspection method using the same
- Patent number 12,174,249
- Issue date Dec 24, 2024
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe card having different probes
- Patent number 12,146,897
- Issue date Nov 19, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Universal test interface systems and methods
- Patent number 12,140,609
- Issue date Nov 12, 2024
- Advantest Corporation
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Grant
Test carrier and carrier assembling apparatus
- Patent number 12,140,610
- Issue date Nov 12, 2024
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Chip-fixing device for a socket
- Patent number 12,142,868
- Issue date Nov 12, 2024
- CHROMA ATE INC.
- Hui-Jung Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semi-automatic prober
- Patent number 12,135,335
- Issue date Nov 5, 2024
- QualiTau, Inc.
- Edward McCloud
- G01 - MEASURING TESTING
Information Patent Grant
Core electrodes based on multiple rod, and underwater electric fiel...
- Patent number 12,130,402
- Issue date Oct 29, 2024
- Agency for Defense Development
- Sangkyu Lee
- G01 - MEASURING TESTING
Information Patent Grant
Module substrate for semiconductor module, semiconductor module and...
- Patent number 12,130,306
- Issue date Oct 29, 2024
- Samsung Electronics Co., Ltd.
- Kwangkyu Bang
- G01 - MEASURING TESTING
Information Patent Grant
Fault tolerance decision-making method and system for sensor failur...
- Patent number 12,126,286
- Issue date Oct 22, 2024
- Zhejiang University of Science and Technology
- Zihui Wang
- B60 - VEHICLES IN GENERAL
Information Patent Grant
End launch termination devices
- Patent number 12,123,896
- Issue date Oct 22, 2024
- Krytar, Inc.
- Douglas John Hagan
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection system
- Patent number 12,117,485
- Issue date Oct 15, 2024
- Tokyo Electron Limited
- Junichi Hagihara
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating test socket
- Patent number 12,105,133
- Issue date Oct 1, 2024
- Leeno Industrial Inc.
- Seungha Baek
- G01 - MEASURING TESTING
Information Patent Grant
Anti-tamper device, enclosure for a utility meter and same
- Patent number 12,106,685
- Issue date Oct 1, 2024
- Landis+Gyr AG
- Nikhil Tanwani
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Test socket
- Patent number 12,105,138
- Issue date Oct 1, 2024
- Leeno Industrial Inc.
- Young taek Shin
- G01 - MEASURING TESTING
Information Patent Grant
Sample fixation mechanism for test with nano-probe, apparatus for t...
- Patent number 12,099,076
- Issue date Sep 24, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jiabao Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Socket
- Patent number 12,099,077
- Issue date Sep 24, 2024
- Enplas Corporation
- Yuki Ueyama
- G01 - MEASURING TESTING
Information Patent Grant
Test equipment for testing a device under test having an antenna
- Patent number 12,099,088
- Issue date Sep 24, 2024
- Advantest Corporation
- Jan Hesselbarth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Connector seating detection system
- Patent number 12,092,701
- Issue date Sep 17, 2024
- Dell Products L.P.
- Kannan Karuppiah
- G01 - MEASURING TESTING
Information Patent Grant
Assembly for carrying chip, and device and method for testing chip
- Patent number 12,092,654
- Issue date Sep 17, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jinrong Huang
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation jig and evaluation method
- Patent number 12,095,191
- Issue date Sep 17, 2024
- Toyota Jidosha Kabushiki Kaisha
- Hisato Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus and test method thereof
- Patent number 12,092,656
- Issue date Sep 17, 2024
- Samsung Electronics Co., Ltd.
- Sungyoon Ryu
- G01 - MEASURING TESTING
Information Patent Grant
Clamp-type AC voltage probe
- Patent number 12,092,662
- Issue date Sep 17, 2024
- Nidec-Read Corporation
- Masahiro Kawaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Testing devices and method for testing semiconductor devices
- Patent number 12,092,655
- Issue date Sep 17, 2024
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scalable tester for testing multiple devices under test
- Patent number 12,085,606
- Issue date Sep 10, 2024
- Albert Gaoiran
- G01 - MEASURING TESTING
Information Patent Grant
Voltage sensor for high and medium voltage use and a method of maki...
- Patent number 12,078,655
- Issue date Sep 3, 2024
- ABB Schweiz AG
- Radek Javora
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Split insulated input post for electrical measurement tool
- Patent number 12,078,660
- Issue date Sep 3, 2024
- Fluke Corporation
- Yinhong Yang
- G08 - SIGNALLING
Information Patent Grant
Two-terminator RF adapter for background/environment noise measurement
- Patent number 12,078,656
- Issue date Sep 3, 2024
- National Technology & Engineering Solutions of Sandia, LLC
- Jeffrey Kolski
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
TESTING DEVICE AND ITS ADAPTER HOLDER
- Publication number 20250012830
- Publication date Jan 9, 2025
- CHROMA ATE INC.
- Ching-Li LIN
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET FOR PREVENTING SIGNAL LOSS
- Publication number 20250004011
- Publication date Jan 2, 2025
- SAE HAN MICRO TECH CO., LTD.
- Jea Hyoung LEE
- G01 - MEASURING TESTING
Information Patent Application
Scalable Tester for Testing Multiple Devices Under Test
- Publication number 20240426897
- Publication date Dec 26, 2024
- Albert Gaoiran
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTION APPARATUS
- Publication number 20240426903
- Publication date Dec 26, 2024
- Kabushiki Kaisha Nihon Micronics
- Souichi KANOSUE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICS IN ELECTRONICS TESTER
- Publication number 20240426938
- Publication date Dec 26, 2024
- Aehr Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...
- Publication number 20240426939
- Publication date Dec 26, 2024
- Aehr Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPLIT INSULATED INPUT POST FOR ELECTRICAL MEASUREMENT TOOL
- Publication number 20240418748
- Publication date Dec 19, 2024
- FLUKE CORPORATION
- Yinhong YANG
- G08 - SIGNALLING
Information Patent Application
ADAPTIVE FLEXIBLE CHIP TEST SOCKET AND FORMATION METHOD THEREOF
- Publication number 20240410917
- Publication date Dec 12, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...
- Publication number 20240402217
- Publication date Dec 5, 2024
- Smiths Interconnect Americas, Inc.
- Khaled Elmadbouly
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED INTERFACE FOR CHECKING AND NEUTRALIZING AN ELECTRICAL POWE...
- Publication number 20240402232
- Publication date Dec 5, 2024
- Airbus Operations SAS
- Sébastien FORASACCO
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
CABLE MONITORING APPARATUS AND METHOD
- Publication number 20240402233
- Publication date Dec 5, 2024
- C-KORE SYSTEMS LIMITED
- Timothy Mark OVERFIELD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EVALUATION JIG AND EVALUATION METHOD
- Publication number 20240396244
- Publication date Nov 28, 2024
- Toyota Jidosha Kabushiki Kaisha
- Hisato KAWAHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR TEST SOCKETS HAVING SCRUBBING CONTACTS
- Publication number 20240393364
- Publication date Nov 28, 2024
- Smiths Interconnect Americas, Inc.
- Jiachun Zhou
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
TEST SOCKET
- Publication number 20240385214
- Publication date Nov 21, 2024
- TSE CO., LTD.
- Hae Guk Cho
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURATION METHOD OF CONFIGURING A MEASUREMENT INSTRUMENT
- Publication number 20240385213
- Publication date Nov 21, 2024
- ROHDE &SCHWARZ GMBH & CO. KG
- Julius SEEGER
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD THEREOF
- Publication number 20240385220
- Publication date Nov 21, 2024
- Sungyoon RYU
- G01 - MEASURING TESTING
Information Patent Application
CONTACTOR FOR MULTI DEVICE SOCKETS AND RELATED
- Publication number 20240377454
- Publication date Nov 14, 2024
- SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Raffy CELIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER TEST SYSTEM, PROBE CARD REPLACING METHOD, AND PROBER
- Publication number 20240369623
- Publication date Nov 7, 2024
- TOKYO SEIMITSU CO., LTD.
- Akira YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SUPPORTING DEVICE AND PROTECTIVE CASE FOR PROBE CARD
- Publication number 20240369596
- Publication date Nov 7, 2024
- GUDENG PRECISION INDUSTRIAL CO., LTD.
- MING-CHIEN CHIU
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET
- Publication number 20240369597
- Publication date Nov 7, 2024
- TSE CO., LTD.
- Yee Sun Kang
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND ASSEMBLY DEVICE THEREOF
- Publication number 20240361352
- Publication date Oct 31, 2024
- okins electronics Co.,Ltd
- Jin Kook JUN
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND SEMICONDUCTOR DEVICE INSPECTION SYSTEM INCLUDING THE...
- Publication number 20240353442
- Publication date Oct 24, 2024
- Korea University Research and Business Foundation
- Moonil Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TESTING A CHIP
- Publication number 20240353483
- Publication date Oct 24, 2024
- Lenovo (Singapore) Pte, Ltd.
- Xueyong Yang
- G01 - MEASURING TESTING
Information Patent Application
PROBE AND INSPECTION SOCKET
- Publication number 20240353444
- Publication date Oct 24, 2024
- Yamaichi Electronics Co., Ltd.
- Seiya YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND METHOD OF USING THE SAME
- Publication number 20240345130
- Publication date Oct 17, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jian-Ting Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOUNTING SYSTEM, AND METHODS THEREOF
- Publication number 20240337681
- Publication date Oct 10, 2024
- Ferroelectric Memory GmbH
- Michael BATHON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMMUTATOR ON-OFF DETECTION MECHANISM WITH SELF-CHECKING FUNCTION A...
- Publication number 20240337704
- Publication date Oct 10, 2024
- Hangzhou Dianzi University
- Xin Zhai
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING SEMICONDUCTOR PACKAGE
- Publication number 20240337688
- Publication date Oct 10, 2024
- TSE CO., LTD.
- Dae Hyun ROH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...
- Publication number 20240329080
- Publication date Oct 3, 2024
- Smiths Interconnect Americas, Inc.
- Khaled Elmadbouly
- G01 - MEASURING TESTING
Information Patent Application
TEST FIXTURE AND EARLY WARNING SYSTEM
- Publication number 20240329079
- Publication date Oct 3, 2024
- TRIPLE WIN TECHNOLOGY(SHENZHEN) CO.LTD.
- YING-QUAN ZHAO
- G01 - MEASURING TESTING

Housings Supporting members Arrangements of terminals

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Vehicular camera testing system using spring-loaded electrical conn...

Probe head and substrate inspection device including the same

Universal mate-in cable interface system

Probing device and inspection method using the same

Vertical probe card having different probes

Universal test interface systems and methods

Test carrier and carrier assembling apparatus

Chip-fixing device for a socket

Semi-automatic prober

Core electrodes based on multiple rod, and underwater electric fiel...

Module substrate for semiconductor module, semiconductor module and...

Fault tolerance decision-making method and system for sensor failur...

End launch termination devices

Wafer inspection system

Method for fabricating test socket

Anti-tamper device, enclosure for a utility meter and same

Test socket

Sample fixation mechanism for test with nano-probe, apparatus for t...

Socket

Test equipment for testing a device under test having an antenna

Connector seating detection system

Assembly for carrying chip, and device and method for testing chip

Evaluation jig and evaluation method

Test apparatus and test method thereof

Clamp-type AC voltage probe

Testing devices and method for testing semiconductor devices

Scalable tester for testing multiple devices under test

Voltage sensor for high and medium voltage use and a method of maki...

Split insulated input post for electrical measurement tool

Two-terminator RF adapter for background/environment noise measurement

Patents Applicationslast 30 patents

TESTING DEVICE AND ITS ADAPTER HOLDER

TEST SOCKET FOR PREVENTING SIGNAL LOSS

Scalable Tester for Testing Multiple Devices Under Test

ELECTRICAL CONNECTION APPARATUS

METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICS IN ELECTRONICS TESTER

METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...

SPLIT INSULATED INPUT POST FOR ELECTRICAL MEASUREMENT TOOL

ADAPTIVE FLEXIBLE CHIP TEST SOCKET AND FORMATION METHOD THEREOF

SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...

ENHANCED INTERFACE FOR CHECKING AND NEUTRALIZING AN ELECTRICAL POWE...

CABLE MONITORING APPARATUS AND METHOD

EVALUATION JIG AND EVALUATION METHOD

SYSTEMS AND METHODS FOR TEST SOCKETS HAVING SCRUBBING CONTACTS

TEST SOCKET

CONFIGURATION METHOD OF CONFIGURING A MEASUREMENT INSTRUMENT

TEST APPARATUS AND TEST METHOD THEREOF

CONTACTOR FOR MULTI DEVICE SOCKETS AND RELATED

WAFER TEST SYSTEM, PROBE CARD REPLACING METHOD, AND PROBER

SUPPORTING DEVICE AND PROTECTIVE CASE FOR PROBE CARD

TEST SOCKET

TEST SOCKET AND ASSEMBLY DEVICE THEREOF

PROBE CARD AND SEMICONDUCTOR DEVICE INSPECTION SYSTEM INCLUDING THE...

METHOD AND SYSTEM FOR TESTING A CHIP

PROBE AND INSPECTION SOCKET

TESTING APPARATUS AND METHOD OF USING THE SAME

MOUNTING SYSTEM, AND METHODS THEREOF

COMMUTATOR ON-OFF DETECTION MECHANISM WITH SELF-CHECKING FUNCTION A...

APPARATUS FOR TESTING SEMICONDUCTOR PACKAGE

SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...

TEST FIXTURE AND EARLY WARNING SYSTEM