Electroplating an yttrium-containing coating on a chamber component

Information

  • Patent Grant
  • 7833401
  • Patent Number
    7,833,401
  • Date Filed
    Thursday, June 21, 2007
    17 years ago
  • Date Issued
    Tuesday, November 16, 2010
    14 years ago
Abstract
A method of forming a component capable of being exposed to a plasma in a process chamber comprises forming a structure comprising a surface and electroplating yttrium, and optionally aluminum or zirconium, onto the surface. Thereafter, the electroplated layer can be annealed to oxide the yttrium and other electroplated species.
Description
BACKGROUND

The present invention relates to a substrate processing chamber component and methods of manufacturing the same.


In processing of a substrate in a process chamber, as in the manufacture of integrated circuits and displays, the substrate is typically exposed to energized gases that are capable of, for example, etching or depositing material on the substrate. The energized gases can also be provided to clean surfaces of the chamber. However, the energized gases can often comprise corrosive halogen-containing gases and other energized species that can erode components of the chamber, such as the chamber enclosure wall. For example, chamber components made of aluminum can chemically react with energized halogen-containing gases to form AlCl3 or AlF3, thereby corroding the components. The corroded portions of the components can flake off and contaminate the substrate, which reduces the substrate yield. Thus, the corroded components must often be replaced or removed from the chamber and cleaned, resulting in undesirable chamber downtime.


The corrosion resistance of a chamber component can be improved by forming a coating of a corrosion resistant material over surfaces of component that are susceptible to erosion, such as surfaces that would otherwise be exposed to the energized gas. The corrosion resistant coating can be formed by methods such as plasma spraying or thermal spraying coating material onto the surface of an underlying structure of the component. For example, a coating of aluminum oxide can be plasma sprayed onto the surface of an aluminum chamber wall to form a coating that exhibits improved corrosion resistance.


However, while such coatings improve the corrosion resistance of the chamber components, the components having the coatings can exhibit other problems during chamber processes. For example, thermal expansion mismatch between the coating and underlying component structure can lead to stresses at the interface between the coating and underlying structure that causes the coating to flake off the underlying structure, thereby exposing the underlying structure to the corrosive energized gas. The particles of loose coating material can also deposit on and contaminate the substrates being processed in the chamber. The thermal expansion mismatch problem is further exacerbated if there is frequent thermal cycling between or during substrate processing steps.


Thus, there is a need for a chamber and chamber components that exhibit improved corrosion or erosion resistance to energized gases. There is a further need for durable chamber components that are not easily susceptible to flaking off during operation of the chamber, especially when the chamber is subjected to thermal cycling.





DRAWINGS

These and other features, aspects, and advantages of the present invention will become better understood with regard to the following description, appended claims, and accompanying drawings which illustrate examples of the invention, where:



FIG. 1 is a schematic sectional side view of a version of an embodiment of a process chamber according to the present invention;



FIG. 2 is a partial sectional schematic side view of a chamber component comprising an integral surface coating comprising yttrium-containing species;



FIG. 3 is a schematic sectional side view of an electroplating apparatus;



FIG. 4 is a schematic sectional side view of an annealer;



FIG. 5
a is a flow chart of an embodiment of a process for electroplating layers comprising yttrium and aluminum on a surface of a component and annealing the layers to form an integral surface coating;



FIG. 5
b is a flow chart of an embodiment of a process for electroplating a layer comprising a mixture of yttrium and aluminum on the surface of a component and annealing the layer to form an integral surface coating;



FIG. 6
a is a partial sectional schematic side view of a chamber component comprising a coating having first and second electroplated layers;



FIG. 6
b is a partial sectional schematic side view of a chamber component comprising a coating having an electroplated layer comprising a mixture of yttrium-containing and other species.





DESCRIPTION

The corrosion resistance of a chamber component 114 is improved by providing an integral surface coating 117 comprising yttrium-containing species. The integral surface coating 117 is provided to protect the surfaces 115 of components 114 that are exposed to energized gas plasmas, high temperatures, corrosive gases, and/or erosive sputtering species in the process zone 108 of a process chamber, or that are otherwise susceptible to erosion. For example, the component 114 having the integral surface coating 117 can comprise at least a portion or structure of one or more of a chamber wall 107, chamber liner 105, substrate support 110, gas supply 130, gas energizer 154, gas exhaust 144, and substrate transport 101. For example, in one version, the component 114 having the integral surface coating 117 comprises a portion of the chamber liner 105, as shown in FIG. 1.


The integral surface coating 117 covers at least a portion of an underlying structure 111 of the component 114 and forms a unitary and continuous structure that is absent a discrete and sharp crystalline boundary therebetween, as schematically illustrated in FIG. 2 with a dotted line. In one version, the integral surface coating is formed in-situ from the surface of the component 114 using the underlying component material. By “growing” the surface coating 117 out of the underlying structure of which the component 114 is fabricated, the surface coating 117 is more strongly bonded to the underlying component material or structure than conventional coatings, such as plasma sprayed coatings, which have a discrete interface with the underlying component structure. The strongly bonded integral surface coating 117 can better withstand thermal stresses and reduces flaking off of the coating and resultant contamination of the substrates 104.


The integral surface coating 117 comprises yttrium-containing species that provide corrosion resistance in a processing environment, such as at least one of elemental yttrium and yttrium oxide (Y2O3). In particular, oxidized yttrium species improves corrosion resistance, and thus, the presence of these species in the coating 117 is desirable. The surface coating 117 can also comprise other corrosion resistant species in combination with the yttrium-containing species. For example, the coating 117 can comprise corrosion resistant species comprising aluminum-containing species, such as elemental aluminum and aluminum oxide. The coating 117 can also comprise yttrium-aluminum alloys and compounds, such as a yttrium-aluminum compound having a predefined stoichiometric ratio of yttrium oxide and aluminum oxide, as in yttrium aluminum garnet (YAG).


In another version, the coating 117 comprises zirconium-containing species in addition to the yttrium-containing species, such as for example, elemental zirconium or zirconium oxide. The combination of the yttrium-containing and zirconium-containing material can be tailored to provide partially stabilized zirconia (PSZ) or tetragonal zirconia polycrystals (TZP). PSZ comprises zirconia polymorphs, such as cubic and metastable tetragonal ZrO2, and is obtained by adding a controlled amount of cubic phase-forming stabilizer oxide material, such as yttrium oxide. The addition of stabilizer to zirconia forces the structure into a tetragonal phase at temperatures higher than 1,000° C., and a mixture of cubic phase and monoclinic (or tetragonal) phases at lower temperatures. The partially stabilized zirconia is also called tetragonal zirconia polycrystal (TZP). Typically, PSZ comprises at least about 3 wt % of MgO, 2 to 6 wt % of CaO, or 3 to 9 wt % of Y2O3. PSZ is a transformation-toughened material because of microcracks and induced stress phenomena. Microcracks, which occur due to the difference in thermal expansion between the cubic, and monoclinic or tetragonal phase, dissipate the energy of propagating cracks. Induced stress arises from the tetragonal-to-monoclinic transformation. The presence of the cubic matrix provides a compressive force that maintains the tetragonal phase. Energy from a propagating crack causes a transition from the metastable tetragonal to the stable monoclinic phase to slow or stop propagation of the cracks. The zirconium oxide can also form a zirconia dispersion toughened ceramic (ZTC) in which tetragonal zirconia is dispersed in another ceramic, such as aluminum oxide or yttrium oxide, to toughen the ceramic.


The coating 117 can also comprise a concentration gradient of yttrium-containing species through a thickness of the coating 117. In one version, the composition of the coating 117 gradually varies from the coating surface to the underlying interface. For example, the coating 117 can comprise a concentration gradient in which the concentration of a species varies so that is matches the composition of the underlying structure, and gradually changes with thickness to reach a desirable erosion resistant stoichiometric composition at the coating surface. The matching composition of the coating to the underlying structure 111 allows the coating to bond well to the underlying structure 111, while the surface composition is tailored to provide better corrosion or other resistance. In one version, the concentration gradient provides a first concentration of yttrium-containing species in a first region of the coating 117, such as at the surface 113 of the coating 117, and a second concentration in a second region, such as towards the surface 112 of the underlying structure 111 that is lower than the first. For example, the coating 117 can comprise a concentration gradient of one or more of elemental yttrium, yttrium oxide, and yttrium aluminum oxide that decreases the concentration of the yttrium-containing species from a first concentration at the surface 113 of the coating 117, to a second concentration at the surface 112 of the underlying structure 111, without forming discrete boundaries regions in the coating 117, and at a gradual rate throughout a thickness of the coating 117.


The surface coating 117 can also comprise a second concentration gradient of a second species, such as aluminum or zirconium-containing species, comprising at least one of elemental aluminum, elemental zirconium, aluminum oxide and zirconium oxide. The second concentration gradient can increase or decrease with the first concentration gradient of yttrium-containing species, or can be substantially opposite the yttrium-containing species concentration gradient. In one version, the second concentration gradient provides an increase in a first concentration of an aluminum-containing species at the surface 113 of the coating 117, to a second concentration that is higher than the first at the surface 112 of the underlying structure 111. The resulting structure provides enhanced bonding to the underlying structure 111 while also providing improved corrosion resistance.


The composition and thickness of the integral surface coating 117 is selected to enhance its resistance to corrosion and erosion, or other detrimental effects. For example, a thicker integral surface coating 117 may provide a more substantial barrier to corrosion of the chamber component 114, while a thinner coating is more suitable for thermal shock resistance. The integral surface coating 117 may even be formed such that the oxidized species extend throughout the depth of the component or just on its surface. A suitable thickness of the oxidized species in the integral surface coating 117 may be, for example, from about 12 micrometers (0.5 mils) to about 203 micrometers (8 mils), or even from about 25 micrometers (1 mil) to about 102 micrometers (4 mils.)


The component 114 having the integral surface coating 117 can be formed by electroplating yttrium metal onto the surface 112 of an underlying structure 111 and subsequently annealing the coating and underlying structure 111. One or more of the other corrosion resistant species, such as aluminum and zirconium metals, can also be electroplated onto the structure 111. Electroplating of the metals provides a layer that is well bonded to the underlying surface 112 and protects the underlying surface 112 from corrosion. Annealing the structure 111 and electroplated metals diffuses the electroplated metals and underlying structure 111 into one another to provide a unitary component structure.


The metals can be electroplated onto the structure 111 by reducing one or more of yttrium, aluminum and zirconium-containing species to their elemental metal state at the surface 112 of the structure 111. In the electroplating process, the surface 112 of the component 114 to be electroplated serves as a cathode and is connected to a negative terminal 401 of a voltage source 400, as shown for example in FIG. 3. The surface 112 is immersed in an electroplating bath 403 comprising, for example, an aqueous solution having one or more yttrium, aluminum and zirconium-containing electrolytes dissolved therein. An anode 404 connected to the positive terminal 402 of the voltage source is also immersed in the bath 403, the anode comprising an inert material or even the material to be electroplated. Application of a bias voltage to the cathode 114 and anode 404 from the voltage source 400 builds up a negative charge on the surface 112 of the structure 111, attracting the charged electrolyte species in the solution, which are then reduced to their elemental form at the surface 112. In other words, the metals are “plated out” onto the surface 112 of the structure 111.


The electroplating conditions, such as the concentration and composition of the electrolytes, the voltage applied, the pH of the bath solution and the temperature may be selected to provide electroplated layers having the desired composition and structure. Suitable yttrium containing electrolytes can comprise, for example, one or more of yttrium bromide, yttrium chloride, yttrium fluoride, yttrium nitrate, yttrium perchlorate, yttrium carbonate, yttrium sulfate, yttrium hydroxide, yttrium iodate and yttrium acetate. Aluminum containing electrolytes can comprise, for example, one or more of aluminum chloride, aluminum bromide, aluminum fluoride, and aluminum hydroxide. Zirconium containing electrolytes can comprise, for example, one or more of zirconium nitrate, zirconium silicate, zirconium sulfate and zirconium citrate. In addition or as an alternative to an aqueous (water-based) bath, the bath solution can comprise an organic solvent, such as for example dimethylformamide (DMF), dimethylsulfoxide (DMSO), dimethoxyethane (DME), and tetrahydrofuran (THF). Other suitable electroplating conditions, such as different plating bath compositions and other electrolytes can also be used.


In one version, the metals are electroplated onto the surface 112 of an underlying structure 111 that comprises a material that is similar to the electroplated metals, such as for example one or more of yttrium, aluminum and zirconium containing materials. By electroplating materials onto a structure 111 having a similar composition, the electroplated metals can be “grown” on the surface 112 of the underlying structure 111 to form a strongly bonded coating 117 without a discrete boundary between the coating 117 and underlying structure 111. For example, the underlying structure 111 can comprise an aluminum alloy that forms a strongly bonded continuous structure with an electroplated aluminum metal. The aluminum alloy is a mixture of aluminum with smaller amounts of one or more of copper, magnesium, manganese, gold, titanium, zinc, silicon and iron. In one version, the underlying structure comprises an aluminum alloy comprising at least about 90% by weight aluminum, and at most about 10% other metals. In another version, the underlying structure 111 comprises a yttrium containing material, such as a yttrium-aluminum alloy. The underlying structure 111 can also comprise a zirconium-containing alloy.


After electroplating one or more layers of metals onto the surface 112, the surface 112 of the component 114 and the electroplated material are annealed to form the integral surface coating 117. In the annealing process, the component 114 having the electroplated metals is heated to a temperature where the structure of the electroplated metals and underlying structure 111 begins to break up, and materials from the electroplated metal and structure 111 at least partially diffuse into each other. The intermixing of the materials between the electroplated layer and underlying structure 111 forms a more integral and unitary coating 117 without a discrete boundary, thereby strengthening the corrosion resistance of the coating 117. The mixture of the materials provides a gradual change in composition from the surface 112 of the underlying structure 111 to the surface 113 of the coating 117 that resists flaking of the coating 117 and reduces thermal mismatch problems between the underlying structure 111 and coating 117. The annealing process can also be repeated a desired number of times to achieve intermixing between the electroplated materials and underlying structure 111.


Furthermore, by annealing the coating 117 in a oxygen containing atmosphere, corrosion resistant oxides of one or more of yttrium, aluminum and zirconium can be formed in the electroplated coating 117. For example, the coating 117 can be annealed in the presence of one or more of O2, O3 and H2O to form oxides that show resistance to erosion by energized gases. The heat provided during the annealing process also facilitates the oxidation of the coating materials by speeding up the oxidation reaction. The oxidized species formed by annealing the component 114 can comprise one or more of as Y2O3 and Al2O3, as well as oxidized yttrium aluminum compounds, such as yttrium aluminum garnet (YAG.) Other oxidized species such as zirconium oxide (ZrO2) in various phases can also form, according to the composition of materials electroplated onto the structure. Also, because the oxygen containing atmosphere contacts the surface 113 of the coating 117, the annealing process results in a coating composition having a concentration gradient of oxidized species, with a greater concentration of oxidized species near the surface 113 of the coating 117, thus enhancing the corrosion resistance of the coating 117.


A version of an annealer 500 suitable for annealing the coating 117 is illustrated in FIG. 4. Typically, the annealer 500 comprises a heat source 510, such as an incoherent or coherent electromagnetic radiation source, that is capable of heating the component 114 to a suitable temperature for annealing. For example, the annealer 500 may heat the component 114 to a temperature of at least about 600° C., such as for example, at least about 900° C. In the embodiment shown in FIG. 4, the annealer 500 is a rapid thermal annealer 505 comprising a heat source 510 that includes tungsten halogen lamps 515 to generate radiation and a reflector 520 to reflect the radiation onto the component 114. A fluid 525, such as air or water is flowed along the heat source 510 to regulate the temperature of the heat source 510. In one version, a quartz plate 530 is provided between the heat source 510 and the component 114 to separate the fluid from the component 114. The rapid thermal annealer 505 may further comprise a temperature monitor 540 to monitor the temperature of the component 114. In one embodiment, the temperature monitor 540 comprises an optical pyrometer 545 that analyzes radiation emitted by the component 114 to determine a temperature of the component 114.



FIG. 5
a illustrates an embodiment of an electroplating and annealing method of chamber component manufacture. In this embodiment, a chamber component 114 comprising an underlying structure 111 is formed from a metal or an alloy, such as an aluminum alloy. A first layer 119 comprising a first material, such as aluminum, is electroplated onto the surface 112 of the structure 111. After the first layer 119 has been electroplated, a second layer 120 comprising a second material, such as yttrium, is electroplated onto the surface 112 of the structure 111. The first and second layers are then annealed to form the integral surface coating 117.


The coating 117 having the first and second layers 119, 120, is formed by exposing the surface 112 of the underlying structure 111 to electroplating conditions that result in selective plating of a desired material. For example, the surface 112 can be exposed to a bath comprising the desired first material present as an electrolyte in the solution and substantially absent the second material, to form a first layer 119 comprising the desired first material. Once the first layer 119 has been formed, the surface 112 is exposed to a bath comprising the desired second material, and substantially absent the first material, to form the second layer 120. FIG. 6a shows the integral surface coating 117 formed by electroplating the first and second layers 119,120. In one version, the surface 112 is exposed to conditions to electroplate a first layer 119 comprising aluminum, and thereafter exposed to conditions to electroplate a second layer 120 comprising yttrium. The electroplating conditions can alternatively be selected to electroplate a first layer 119 comprising yttrium, and a second layer 120 comprising aluminum. Electroplating conditions can be further selected to electroplate one or more of a first layer 119 and second layer 120 comprising zirconium. The layers may also be alternated a desired number of times to achieve a coating 117 having the desired composition.


In one version of an electroplating process suitable for the formation of the first and second layers 119,120, a first layer 119 comprising aluminum is electroplated onto the surface 112 by immersing the surface 112 in an aqueous solution comprising, for example, one or more of aluminum chloride, aluminum bromide, aluminum fluoride and aluminum hydroxide. A suitable bias voltage is applied to the surface 112 to form the layer 119 of aluminum metal. A second layer 120 comprising yttrium is then plated over the first layer 119 by immersing the surface of the first layer 119 in an aqueous solution comprising, for example, one or more of yttrium bromide, yttrium chloride, yttrium fluoride, yttrium nitrate, yttrium perchlorate, yttrium carbonate, yttrium sulfate, yttrium hydroxide, yttrium iodate and yttrium acetate, and applying a suitable bias voltage to bias the surface 112 and form the layer 120 of yttrium metal. Suitable concentrations of the aluminum and yttrium-containing electrolytes in the solutions may be, for example, from about 0.1 mM to about 50 M, and a suitable bias voltage for depositing the layers 119, 120 may be, for example, a bias voltage that is sufficient to provide a current density of from about 0.1 A/dm2 to about 100 A/dm2 (amps per decimeter squared). In addition or as an alternative to an aqueous (water-based) bath, the bath solution can comprise an organic solvent, such as for example one or more of dimethylformamide, dimethylsulfoxide, dimethoxyethane, and tetrahydrofuran.


The coating 117 having the first and second layers 119,120 is then annealed, for example in the annealer shown in FIG. 4, to provide the unitary coating structure, as shown in FIG. 2, and to form corrosion resistant oxides. Annealing of the layers 119,120 also inter-diffuses material between the layers 119,120 to form a concentration gradient of species that provides a gradual change in the coating composition throughout the thickness of the coating 117. The annealing of the layers 119, 120 can also provide a concentration gradient of one or more yttrium-containing species through the thickness of the coating 117 that improves bonding to the underlying structure 111 and enhances corrosion resistance.


Yet another embodiment of an electroplating and annealing method of chamber component manufacture is illustrated in the flow chart of FIG. 5b. In this embodiment, a chamber component 114 comprises an underlying structure 111 formed from a metal or an alloy. A layer 121 comprising a mixture of species, such as a mixture of aluminum and yttrium, is then electroplated onto the surface 112 of the component 114. The electroplated layer 121 is annealed to form the integral surface coating 117 and to provide corrosion resistant oxidized species.


The layer 121 comprising the mixture of species is formed by co-depositing metals such as yttrium and at least one of aluminum and zirconium metals on the surface 112 of the structure 111 in an electroplating process. For example, to form a co-deposited layer 121 of yttrium and aluminum, the surface 112 of the structure 111 is immersed in a bath 404 comprising electrolytes of both yttrium and aluminum, and the electroplating conditions, such as the voltage, electrolyte composition and concentration, and temperature, are set such that a mixture of both yttrium and aluminum are plated out simultaneously on the surface 112 of the structure 111, as shown in FIG. 6b. Following deposition of the co-deposited layer 121 comprising the mixture of materials, the structure 111 and layer 121 are annealed to form the integral surface coating 117 having improved corrosion resistance, as shown in FIG. 2. In one version, the co-deposited layer 121 comprises substantially the entire coating 117. One or more other layers of materials, such as layers of yttrium and aluminum, can also be electroplated on the structure 111 in addition to the co-deposited layer.


In one version, a co-deposited layer 121 comprising first and second concentration gradients of first and second materials can be formed by varying the electroplating conditions to provide a gradient co-deposition of one or more of metals, such as yttrium and at least one of aluminum and zirconium, on the surface 112 of the component 114. The gradient co-deposition of the metals provides a gradually varying concentration of the metals through a thickness of the coating 117. In one version, the electroplating conditions can be selected to electroplate aluminum at the surface 112 of the structure 111, and to gradually increase the amount of yttrium plated onto the structure 111 while decreasing the amount of electroplated aluminum as the thickness of the coating 117 increases. This provides opposing concentration gradients of yttrium and aluminum, with a first concentration of yttrium at the surface 112 of the structure that is lower than a second concentration of yttrium at the surface 113 of the coating 117, and a first concentration of aluminum at the surface 112 of the structure 111 that is higher than a second concentration of aluminum at the surface 113 of the coating 117. By providing opposing first and second composition gradients, the composition of the coating 117 may vary smoothly from the underlying structure 111 through the thickness of the coating, thereby providing a coating 117 that is integral with the underlying structure 111 and that provides improved corrosion resistance.


In one version of forming a coating 117 comprising opposing gradient concentrations of yttrium and aluminum-containing species, the concentration of yttrium-containing electrolytes in the electroplating bath solution is gradually increased with respect to the concentration of the aluminum-containing electrolytes as the coating thickness increases. For example, more yttrium-containing electrolytes can be added to the bath solution as the thickness of the coating increases. The amount of aluminum plated on the structure 111 can be decreased with increasing thickness of the coating 117 by, for example, allowing the aluminum-containing electrolytes in the electroplating bath to be gradually used up (plated out) until there are few or no aluminum-containing electrolytes remaining in the bath 403. Also, fresh electrolyte solution can be continuously provided to the electroplating bath, the fresh solution comprising increasingly higher concentrations of yttrium-containing electrolyte and lower concentrations of aluminum-containing electrolyte, until a coating having the desired thickness and composition is formed. Other electroplating conditions that can be varied to provide a compositional gradient can include the bias voltage and the pH of the bath solution.


Furthermore, although electroplating methods may be suitable for the deposition of zirconium onto the structure 111, other methods such as physical vapor deposition, plasma spraying, chemical vapor deposition, hot isostatic pressing, sintering, and ion vapor deposition can also be used. For example, the coating 117 may comprise yttrium-containing species deposited by electroplating, and zirconium-containing species that are deposited by another method, such as plasma spraying. In one version, the coating 117 comprises partially stabilized zirconium oxide deposited by plasma spraying. The coating 117 can also comprise alternating layers 119, 120 deposited by electroplating and non-electroplating means.


The corrosion resistant component 114 having the integral surface coating 117 may be provided in an apparatus 102 suitable for processing a substrate 104, an embodiment of which is shown in FIG. 1. Generally, the apparatus 102 comprises a process chamber 106 having a wall 107, such as an enclosure wall 103, which may comprise a ceiling 118, sidewalls 114, and a bottom wall 116 that enclose a process zone 108. The wall 107 may also comprise a chamber wall liner 105 that lines at least a portion of the enclosure wall 103 about the process zone 108. In operation, process gas is introduced into the chamber 106 through a gas supply 130 that includes a process gas source 138 and a gas distributor 137. The gas distributor 137 may comprise one or more conduits 136 having one or more gas flow valves 134, and one or more gas outlets 142 around a periphery of a substrate support 110 having a substrate receiving surface 180. Alternatively, the gas distributor 130 may comprise a showerhead gas distributor (not shown). Spent process gas and etchant byproducts are exhausted from the chamber 106 through an exhaust 144 which may include a pumping channel 170 that receives spent process gas from the process zone, a throttle valve 135 to control the pressure of process gas in the chamber 106, and one or more exhaust pumps 152.


The process gas may be energized by a gas energizer 154 that couples energy to the process gas in the process zone 108 of the chamber 106. In one version, the gas energizer 154 comprises process electrodes that are powered by a power supply to energize the process gas. The process electrodes may include an electrode that is in a wall, such as a sidewall 114 or ceiling 118 of the chamber 106, which may be capacitively coupled to another electrode, such as an electrode in the support 110 below the substrate 104. Alternatively or additionally, the gas energizer 154 may comprise an antenna comprising one or more inductor coils about the chamber 106. In yet another version, the gas energizer 154 may comprise a microwave source and waveguide to activate the process gas by microwave energy in a remote zone upstream from the chamber 106. To process a substrate 104, the process chamber 106 is evacuated and maintained at a predetermined sub-atmospheric pressure though an exhaust port 171 in the chamber. The substrate 104 is then provided on the support 110 by a substrate transport 101, such as for example, a robot arm and a lift pin system. The substrate support 110 may also comprise one or more rings 109 that at least partially surround a periphery of the substrate 104 to secure the substrate 104 on the support 110, or to otherwise aid in processing the substrate 104, for example by focusing energetic plasma species onto the substrate 104. The gas energizer 154 then energizes the gas to provide an energized gas in the process zone 108 to process the substrate 104 by coupling RF or microwave energy to the gas.


Although exemplary embodiments of the present invention are shown and described, those of ordinary skill in the art may devise other embodiments which incorporate the present invention, and which are also within the scope of the present invention. For example, the coating may comprise other suitable components, such as other metals without deviating from the scope of the present invention. Also, the underlying structure 111 may form portions of chamber components 114 other than those specifically mentioned, as would be apparent to those of ordinary skill in the art. Furthermore, the terms below, above, bottom, top, up, down, first and second and other relative or positional terms are shown with respect to the exemplary embodiments in the figures and are interchangeable. Therefore, the appended claims should not be limited to the descriptions of the preferred versions, materials, or spatial arrangements described herein to illustrate the invention.

Claims
  • 1. A method of forming a process chamber component capable of being exposed to a plasma in a process chamber, the method comprising: (a) forming a component structure comprising a surface;(b) electroplating yttrium-containing species onto the surface of the component structure to form a coating, the coating having a surface; and(c) annealing the coating in an oxygen containing atmosphere to form a coating comprising yttrium oxide with a greater concentration of oxidized yttrium species near the surface of the coating than near the surface of the underlying component structure.
  • 2. A method according to claim 1 comprising electroplating the yttrium-containing species by: (i) immersing the surface of the component structure in an electroplating bath comprising a solution of yttrium species;(ii) connecting the component structure to a negative terminal of a voltage source; and(iii) connecting an anode immersed in the electroplating bath to a positive terminal of the voltage source, the anode comprising an inert material or a material to be electroplated onto the component structure.
  • 3. A method according to claim 2 comprising immersing the surface of the component structure in an electroplating bath comprising a solution of one or more of yttrium bromide, yttrium chloride, yttrium fluoride, yttrium nitrate, yttrium perchlorate, yttrium carbonate, yttrium sulfate, yttrium hydroxide, yttrium iodide and yttrium acetate.
  • 4. A method according to claim 2 comprising maintaining a concentration of yttrium-containing species in the solution of from about 0.1 mM to about 50 M.
  • 5. A method according to claim 2 comprising maintaining a bias voltage across the positive and negative terminals that is sufficiently high to provide a current density of from about 0.1 A/dm2 to about 100 A/dm2 in the solution.
  • 6. A method according to claim 2 comprising electroplating the yttrium-containing species to form a coating having a thickness of from about 12 micrometers to about 203 micrometers.
  • 7. A method according to claim 1 comprising electroplating yttrium-containing species comprising elemental yttrium, and annealing the elemental yttrium to form yttrium oxide in an oxygen containing atmosphere comprising of one or more of O2, O3 and H2O.
  • 8. A method according to claim 7 comprising annealing the elemental yttrium to a temperature of at least about 600° C.
  • 9. A method according to claim 1 wherein (b) comprises immersing the surface in an electroplating bath comprising yttrium-containing species and a second species, the electroplating bath being maintained at electroplating conditions, and varying the electroplating conditions to form a coating having a thickness with a concentration gradient of yttrium therethrough.
  • 10. A method according to claim 1 further comprising depositing aluminum-containing species or zirconium-containing species onto the surface of the component structure.
  • 11. A method according to claim 10 comprising depositing the aluminum-containing species by electroplating in an electroplating bath comprising one or more of aluminum chloride, aluminum bromide, aluminum fluoride, and aluminum hydroxide.
  • 12. A method according to claim 10 comprising depositing the zirconium-containing species by electroplating in an electroplating bath comprising one or more of zirconium nitrate, zirconium silicate, zirconium sulfate and zirconium citrate.
  • 13. A method according to claim 10 comprising depositing the zirconium-containing species by physical vapor deposition, plasma spraying, or chemical vapor deposition.
  • 14. A method according to claim 1 comprising electroplating a plurality of layers comprising elemental yttrium, aluminum or zirconium onto the surface, and annealing the layers to form yttrium oxide, aluminum oxide or zirconium oxide.
  • 15. A method according to claim 14 comprising forming partially stabilized zirconia (PSZ) or tetragonal zirconia.
  • 16. A method according to claim 14 comprises forming yttrium aluminum garnet.
  • 17. A method according to claim 1 wherein (a) comprises forming a component structure comprising a metal or an alloy.
  • 18. A method according to claim 1 comprising annealing the coating in an oxygen containing atmosphere such that the concentration of the yttrium-containing species decreases from the surface of the coating to the surface of the component structure.
  • 19. A method of forming a plasma resistant component capable of being exposed to a plasma in a process chamber, the method comprising: (a) forming a structure comprising a surface;(b) electroplating onto the surface, a plurality of first layers comprising aluminum, zirconium, or both;(c) electroplating onto the surface, a plurality of second layers comprising yttrium; and(d) annealing the first and second layers in an oxygen containing atmosphere to form a coating comprising (i) oxidized yttrium, (ii) oxidized aluminum, oxidized zirconium, or both, and (iii) a greater concentration of oxidized yttrium species near a surface of the coating than near the surface of the structure.
  • 20. A method of forming a plasma resistant component capable of being exposed to a plasma in a process chamber, the method comprising: (a) forming an electroplated coating on a surface of a structure, the electroplated coating comprising elemental yttrium, elemental aluminum, and elemental zirconium; and(b) annealing the electroplated coating in an oxygen containing atmosphere to form an oxidized coating comprising oxidized yttrium, oxidized aluminum, and oxidized zirconium, such that the oxidized coating comprises a greater concentration of oxidized yttrium species near a surface of the oxidized coating than near the surface of the structure.
CROSS-REFERENCE

This application is a divisional of U.S. patent application Ser. No. 10/824,123, entitled “Process Chamber Component Having Electroplated Yttrium Containing Coating” to Han et al, filed on Apr. 13, 2004, now U.S. Pat. No. 7,371,467, which was a continuation-in-part of U.S. patent application Ser. No. 10/042,666, entitled “Process Chamber Having Yttrium-Aluminum Coating” to Han et al, and filed on Jan. 8, 2002, now U.S. Pat. No. 6,942,929; both of which are incorporated by reference herein and in their entireties.

US Referenced Citations (124)
Number Name Date Kind
3754903 Goward et al. Aug 1973 A
4244743 Blackburn et al. Jan 1981 A
4433004 Yonezawa et al. Feb 1984 A
4743493 Sioshansi et al. May 1988 A
4777090 Ovshinsky et al. Oct 1988 A
4861737 Prud'Homme van Reine Aug 1989 A
4888820 Chen et al. Dec 1989 A
4897315 Gupta Jan 1990 A
4910092 Olson et al. Mar 1990 A
4933239 Olson et al. Jun 1990 A
4939308 Maxfield et al. Jul 1990 A
4973445 Singheiser et al. Nov 1990 A
5162295 Behi et al. Nov 1992 A
5205051 Hurwitt Apr 1993 A
5244875 Hauser et al. Sep 1993 A
5272120 Kosuda et al. Dec 1993 A
5320719 Lasbmore et al. Jun 1994 A
5366585 Robertson et al. Nov 1994 A
5445776 Honma et al. Aug 1995 A
5455119 Taylor et al. Oct 1995 A
5458700 Masumoto et al. Oct 1995 A
5470820 Hauser et al. Nov 1995 A
5476837 Bharacharya et al. Dec 1995 A
5494713 Ootuki Feb 1996 A
5498313 Bailey et al. Mar 1996 A
5534309 Liu Jul 1996 A
5624632 Baumann et al. Apr 1997 A
5643394 Maydan et al. Jul 1997 A
5676205 White Oct 1997 A
5680013 Dornfest et al. Oct 1997 A
5746875 Maydan et al. May 1998 A
5753044 Hanawa et al. May 1998 A
5798016 Oehrlein et al. Aug 1998 A
5807613 Aguero et al. Sep 1998 A
5824205 Foster Oct 1998 A
5829939 Iwai et al. Nov 1998 A
5833829 Foster Nov 1998 A
5842491 Han et al. Dec 1998 A
5880031 Wong Mar 1999 A
5885360 Han et al. Mar 1999 A
5887605 Lee et al. Mar 1999 A
5901716 Hwang et al. May 1999 A
5948513 Turnbull et al. Sep 1999 A
5964928 Tomlinson et al. Oct 1999 A
5964952 Kunze-Concewitz Oct 1999 A
6004631 Mori Dec 1999 A
6095084 Shamouilian et al. Aug 2000 A
6120606 Peng Sep 2000 A
6123791 Han et al. Sep 2000 A
6129100 Kitagawa et al. Oct 2000 A
6158445 Olesen et al. Dec 2000 A
6179976 D'Souza et al. Jan 2001 B1
6183888 Alperine et al. Feb 2001 B1
6197150 Kwag et al. Mar 2001 B1
6231808 Hashikura et al. May 2001 B1
6257366 Gerretsen et al. Jul 2001 B1
6273108 Bergman et al. Aug 2001 B1
6287644 Jackson et al. Sep 2001 B1
6306276 Nobe et al. Oct 2001 B1
6306489 Hellmann et al. Oct 2001 B1
6352611 Han et al. Mar 2002 B1
6365010 Hollars Apr 2002 B1
6379575 Yin et al. Apr 2002 B1
6383964 Nakahara et al. May 2002 B1
6404615 Wijeyesekera et al. Jun 2002 B1
6410471 Kaneyoshi Jun 2002 B2
6447937 Murakawa et al. Sep 2002 B1
6509070 Voevodin et al. Jan 2003 B1
6517303 White et al. Feb 2003 B1
6593235 Uochi et al. Jul 2003 B2
6620520 O'Donnell et al. Sep 2003 B2
6623595 Han et al. Sep 2003 B1
6641697 Han et al. Nov 2003 B2
6645585 Ozono Nov 2003 B2
6776873 Sun et al. Aug 2004 B1
6780526 Payne et al. Aug 2004 B2
6783863 Harada et al. Aug 2004 B2
6789498 Kaushal et al. Sep 2004 B2
6942929 Han et al. Sep 2005 B2
6983892 Noorbakhsh et al. Jan 2006 B2
7086918 Hsiao et al. Aug 2006 B2
7131883 Park et al. Nov 2006 B2
7371467 Han et al. May 2008 B2
7446474 Maldonado et al. Nov 2008 B2
7479304 Sun et al. Jan 2009 B2
7479464 Sun et al. Jan 2009 B2
7618769 Brueckner et al. Nov 2009 B2
7645710 Olsen et al. Jan 2010 B2
20010003271 Otsuki Jun 2001 A1
20020009560 Ozono Jan 2002 A1
20020012791 Morita et al. Jan 2002 A1
20020086118 Chang et al. Jul 2002 A1
20020086153 O'Donnell et al. Jul 2002 A1
20020100554 Han et al. Aug 2002 A1
20030029563 Kaushal et al. Feb 2003 A1
20030127049 Han et al. Jul 2003 A1
20030159657 Kaushal et al. Aug 2003 A1
20040002221 O'Donnell et al. Jan 2004 A1
20040191545 Han et al. Sep 2004 A1
20050227118 Uchimaru et al. Oct 2005 A1
20050271984 Brueckner et al. Dec 2005 A1
20060055321 Maldonado et al. Mar 2006 A1
20070079936 Li et al. Apr 2007 A1
20070134416 Wang et al. Jun 2007 A1
20070151581 Wang et al. Jul 2007 A1
20070209930 Chua et al. Sep 2007 A1
20070212896 Olsen et al. Sep 2007 A1
20070218623 Chua et al. Sep 2007 A1
20080003151 Raoux et al. Jan 2008 A1
20080017516 Han et al. Jan 2008 A1
20080110760 Han et al. May 2008 A1
20080213496 Sun et al. Sep 2008 A1
20080223725 Han et al. Sep 2008 A1
20080264564 Sun et al. Oct 2008 A1
20080264565 Sun et al. Oct 2008 A1
20090025751 Wang et al. Jan 2009 A1
20090036292 Sun et al. Feb 2009 A1
20090068433 Rasheed Mar 2009 A1
20090072009 Crockett et al. Mar 2009 A1
20090110807 Koenig Apr 2009 A1
20090162647 Sun et al. Jun 2009 A1
20090214825 Sun et al. Aug 2009 A1
20090277874 Rui et al. Nov 2009 A1
20090302002 Collins et al. Dec 2009 A1
Foreign Referenced Citations (73)
Number Date Country
3543802 Jun 1987 DE
9421671 Aug 1996 DE
0268721 Jun 1988 EP
0413282 Feb 1991 EP
0413282 Feb 1992 EP
0849767 Jun 1998 EP
0997546 May 2000 EP
59-205468 Nov 1984 JP
59205468 Nov 1984 JP
62-174377 Jul 1987 JP
62174377 Jul 1987 JP
63-216943 Sep 1988 JP
02-159343 Jun 1990 JP
02-159344 Jun 1990 JP
04-333573 Nov 1992 JP
04333573 Nov 1992 JP
06-236913 Aug 1994 JP
62-036913 Aug 1994 JP
06-310363 Nov 1994 JP
06310065 Nov 1994 JP
10-045461 Feb 1998 JP
10-045467 Feb 1998 JP
10-067554 Mar 1998 JP
10067554 Mar 1998 JP
62174377 Jul 1998 JP
10-209354 Aug 1998 JP
11-029378 Feb 1999 JP
11029378 Feb 1999 JP
11-157916 Jun 1999 JP
11-229142 Aug 1999 JP
01-1335804 Dec 1999 JP
11-335804 Dec 1999 JP
2000-096176 Apr 2000 JP
01-059572 Jun 2000 JP
2000-159572 Jun 2000 JP
2000-164572 Jun 2000 JP
164572 Jun 2000 JP
01-091369 Jul 2000 JP
2000-191369 Jul 2000 JP
03-013656 Nov 2000 JP
03-027424 Nov 2000 JP
2000-313656 Nov 2000 JP
2000-327424 Nov 2000 JP
2001-164354 Jun 2001 JP
10-375080 Jan 2005 KR
20-0375080-0000 Jan 2005 KR
557642 Oct 2003 TW
WO 9716133 Jan 1998 WO
WO 9814980 Apr 1998 WO
WO-9814980 Apr 1998 WO
WO 9850599 Nov 1998 WO
WO 9920812 Apr 1999 WO
WO-9920812 Apr 1999 WO
WO 9916282 Jul 1999 WO
PCTUS9916282 Nov 1999 WO
WO-0007216 Feb 2000 WO
WO 0007216 Feb 2000 WO
WO-0220864 Mar 2002 WO
WO 02057506 Jul 2002 WO
WO-02057506 Jul 2002 WO
WO 02041150 Dec 2002 WO
WO-03001559 Jan 2003 WO
WO-03060187 Jul 2003 WO
WO 03060187 Jul 2003 WO
WO 2004003962 Jan 2004 WO
WO 2004003962 Jan 2004 WO
WO-2007106660 Sep 2007 WO
WO-2007121007 Oct 2007 WO
WO-2007131057 Nov 2007 WO
WO-2008089168 Jul 2008 WO
WO-2008130975 Oct 2008 WO
WO-2009014894 Jan 2009 WO
WO-2009102589 Aug 2009 WO
Related Publications (1)
Number Date Country
20080017516 A1 Jan 2008 US
Divisions (1)
Number Date Country
Parent 10824123 Apr 2004 US
Child 11766723 US
Continuation in Parts (1)
Number Date Country
Parent 10042666 Jan 2002 US
Child 10824123 US