Claims
- 1. A method for applying a metal catalyst to an amorphous semiconductor layer, said method comprising the steps of:a) image-wise exposing a photopolymeric layer to cause exposed areas of said layer to crosslink and exhibit an increase in resistivity in comparison with unexposed areas of said photopolymeric layer; b) charging said photopolymeric layer, said exposed areas of said photopolymeric layer retaining a charge longer than said unexposed areas; c) applying a catalyst metal containing toner to said photopolymeric layer, said toner attracted by retained charge on said exposed areas; and d) juxtaposing said photopolymeric layer toned in step c) to a layer of amorphous semiconductor and applying an electric field therebetween to cause said toner that is adherent to said photopolymeric layer to migrate to said amorphous semiconductor.
- 2. The method as recited in claim 1, wherein said toner comprises metal particles encompassed by polymeric shells.
- 3. The method as recited in claim 2, wherein said metal particles are selected from the group consisting of palladium, nickel and chromium.
- 4. The method as recited in claim 1, wherein step d) interposes a nonconductive fluid between said juxtaposed photopolymeric layer and said layer of amorphous semiconductor.
- 5. The method as recited in claim 1, wherein said semiconductor is silicon.
- 6. The method as recited in claim 1, further comprising the step of:e) annealing said toned amorphous silicon layer to enable formation of polycrystalline semiconductor areas only in areas where said toner is adherent.
- 7. The method as recited in claim 1, wherein said toner comprises an organosol with an included metal catalyst.
- 8. The method as recited in claim 1, wherein said photopolymer is configured on a flat support.
- 9. A method for applying a metal catalyst to an amorphous semiconductor layer, said method comprising the steps of:a) image-wise exposing a photopolymeric layer to cause exposed areas of said layer to crosslink and exhibit an increase in resistivity in comparison with unexposed areas of said photopolymeric layer; b) charging said photopolymeric layer, said exposed areas of said photopolymeric layer retaining a charge longer than said unexposed areas; c) applying a catalyst metal containing toner to said photopolymeric layer, said toner attracted by retained charge on said exposed areas; d) juxtaposing said photopolymeric layer toned in step c) to a substrate and applying an electric field therebetween to cause said toner that is adherent to said photopolymeric layer to migrate to said substrate; and e) depositing a layer of an amorphous semiconductor on said substrate and over said toner thereon.
- 10. The method as recited in claim 9, wherein said toner comprises metal particles encompassed by polymeric shells.
- 11. The method as recited in claim 10, wherein said metal particles are selected from the group consisting of palladium, nickel and chromium.
- 12. The method as recited in claim 9, wherein step d) interposes a nonconductive fluid between said juxtaposed photopolymeric layer and said substrate.
- 13. The method as recited in claim 9, wherein said semiconductor is silicon.
- 14. The method as recited in claim 9, further comprising the step of:e) annealing said amorphous silicon layer to enable formation of polycrystalline semiconductor areas only in areas where said toner is in contact with said amorphous semiconductor.
- 15. The method as recited in claim 9, wherein said toner comprises an organosol with an included metal catalyst.
- 16. The method as recited in claim 9, wherein said photopolymer is configured on a flat support.
Parent Case Info
This Application claims priority from U.S. Provisional Patent Application Serial No. 60/090,663, filed Jun. 25, 1998 pending.
US Referenced Citations (11)
Provisional Applications (1)
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Number |
Date |
Country |
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60/090663 |
Jun 1998 |
US |