Patent Application
20090114156
1. Field of the Invention
The present invention relates to a film formation apparatus for a semiconductor process for forming a thin film, such as a silicon nitride film, on a target substrate, such as a semiconductor wafer. The term “semiconductor process” used herein includes various kinds of processes which are performed to manufacture a semiconductor device or a structure having wiring layers, electrodes, and the like to be connected to a semiconductor device, on a target substrate, such as a semiconductor wafer or a glass substrate used for an FPD (Flat Panel Display), e.g., an LCD (Liquid Crystal Display), by forming semiconductor layers, insulating layers, and conductive layers in predetermined patterns on the target substrate.
2. Description of the Related Art
In manufacturing semiconductor devices, a process, such as CVD (Chemical Vapor Deposition), is performed to form a thin film, such as a silicon nitride film or silicon oxide film, on a target substrate, such as a semiconductor wafer. For example, a film formation process of this kind is arranged to form a thin film on a semiconductor wafer, as follows.
At first, the interior of the reaction-tube (reaction chamber) of a heat-processing apparatus is heated by a heater at a predetermined load temperature, and a wafer boat that holds a plurality of semiconductor wafers is loaded. Then, the interior of the reaction tube is heated up to a predetermined process temperature, and gas inside the reaction tube is exhausted through an exhaust port, so that the pressure inside the reaction tube is decreased to a predetermined pressure.
Then, while the interior of the reaction tube is kept at the predetermined temperature and pressure (kept exhausted), a film formation gas is supplied through a gas supply line into the reaction tube. For example, in the case of CVD, when a film formation gas is supplied into a reaction tube, the film formation gas causes a thermal reaction and thereby produces reaction products. The reaction products are deposited on the surface of each semiconductor wafer, and form a thin film on the surface of the semiconductor wafer.
Reaction products generated during the film formation process are deposited (adhered) not only on the surface of the semiconductor wafer, but also on, e.g., the inner surface of the reaction tube and other members, the latter being as by-product films. If the film formation process is continued while by-product films are present on the inner surface of the reaction tube and so forth, a stress is generated and causes peeling of some of the by-product films and the quartz of the reaction tube and so forth due to a difference in coefficient of thermal expansion between the quartz and by-product films. Consequently, particles are generated, and may decrease the yield of semiconductor devices to be fabricated and/or deteriorate some components of the processing apparatus.
In order to solve this problem, cleaning of the interior of the reaction tube is performed after the film formation process is repeated several times. In this cleaning, the interior of the reaction tube is heated at a predetermined temperature by a heater, and a cleaning gas, such as a mixture gas of fluorine and a halogen-containing acidic gas, is supplied into the reaction tube. The by-product films deposited on the inner surface of the reaction tube and so forth are thereby dry-etched and removed by the cleaning gas (for example, Jpn. Pat. Appln. KOKAI Publication No. 3-293726). However, as described later, the present inventors have found that conventional film formation apparatuses of this kind entail problems in relation to a cleaning process performed inside a reaction tube such that the cleaning process may be less effective on the upper side of the reaction tube or a gas nozzle of a cleaning gas is easily deteriorated.
An object of the present invention is to provide a film formation apparatus for a semiconductor process, which allows a cleaning process to be uniformly and effectively performed overall inside a reaction tube. Another object of the present invention is to provide a film formation apparatus for a semiconductor process, which can prevent a gas nozzle of a cleaning gas from being deteriorated.
According to a first aspect of the present invention, there is provided a film formation apparatus for a semiconductor process, the apparatus comprising: a reaction chamber configured to accommodate a plurality of target substrates at intervals in a vertical direction; a support member having a plurality of support levels configured to support the target substrates inside the reaction chamber; a heater disposed around the reaction chamber to heat the target substrates; a film formation gas supply system configured to supply a film formation gas into the reaction chamber, the film formation gas supply system including a gas distribution nozzle with a plurality of gas spouting holes formed thereon at predetermined intervals over all the support levels of the support member; a cleaning gas supply system configured to supply a cleaning gas for etching a by-product film deposited inside the reaction chamber; and an exhaust system configured to exhaust gas from inside the reaction chamber, the exhaust system including an exhaust port at a position opposite to the gas distribution nozzle with the support member interposed therebetween, wherein the cleaning gas supply system includes a gas nozzle disposed near a bottom of the reaction chamber and having a gas supply port at its top directed upward, and the gas supply port is located below the lowermost one of the support levels of the support member.
According to a second aspect of the present invention, there is provided a film formation apparatus for a semiconductor process, the apparatus comprising: a reaction chamber configured to accommodate a plurality of target substrates at intervals in a vertical direction; a support member having a plurality of support levels configured to support the target substrates inside the reaction chamber; a heater disposed around the reaction chamber to heat the target substrates; a first film formation gas supply system configured to supply a first film formation gas containing a silane family gas into the reaction chamber; a second film formation gas supply system configured to supply a second film formation gas containing a nitriding gas into the reaction chamber; a plasma generation section attached outside the reaction chamber and forming a plasma generation space that communicates through an outlet opening with a process space for accommodating the target substrates, the second film formation gas being supplied through the plasma generation space into the process space; a cleaning gas supply system configured to supply a cleaning gas for etching a by-product film generated by a reaction between the first and second film formation gases and deposited inside the reaction chamber; and an exhaust system configured to exhaust gas from inside the reaction chamber, the exhaust system including an exhaust port at a position opposite to the outlet opening of the plasma generation section with the support member interposed therebetween, wherein the cleaning gas supply system includes a gas nozzle disposed near a bottom of the reaction chamber and having a gas supply port at its top directed upward, and the gas supply port is located below the lowermost one of the support levels of the support member and below a bottom of the exhaust port.
Additional objects and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. The objects and advantages of the invention may be realized and obtained by means of the instrumentalities and combinations particularly pointed out hereinafter.
The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate embodiments of the invention, and together with the general description given above and the detailed description of the embodiments given below, serve to explain the principles of the invention.
In the process of developing the present invention, the inventors studied problems entailed by conventional film formation apparatuses for a semiconductor process in relation to a cleaning process inside a reaction chamber. As a result, the inventors have arrived at the findings given below.
Specifically, film formation apparatuses of this kind include a type in which a reaction tube is provided with a cleaning gas nozzle disposed on a lower side for supplying a cleaning gas and an exhaust port formed on a lower side for exhausting gas from inside the reaction tube. In such a film formation apparatus, the cleaning gas supplied from the cleaning gas nozzle may insufficiently reach the upper side of the reaction tube. If supply of the cleaning gas is insufficient on the upper side of the reaction tube, by-product films are left on the upper side, and thus the cleaning process becomes less effective for the film formation apparatus.
On the other hand, the cleaning gas nozzle may be formed of a so-called long injector that extends to the upper side of the reaction tube, so that by-product films deposited on the upper side of the reaction tube are reliably removed. However, where a long injector is used as the cleaning gas nozzle, the long injector may be deteriorated by the cleaning gas and thereby bent down.
An embodiment of the present invention achieved on the basis of the findings given above will now be described with reference to the accompanying drawings. In the following description, the constituent elements having substantially the same function and arrangement are denoted by the same reference numerals, and a repetitive description will be made only when necessary.
As shown in
The reaction tube 2 is provided with an exhaust space 21 that extends in a vertical direction along the reaction tube 2 on one side for exhausting gas from inside the reaction tube 2. The process space S and exhaust space 21 are partitioned by a partition wall 22, and a plurality of exhaust holes 3h are formed in the partition wall 22 at predetermined intervals in the vertical direction at positions corresponding to the process space S. The exhaust holes 3h are used as an exhaust port that allows the process space S to communicate with the exhaust space 21. The bottom of the lowermost one of the exhaust holes 3h is located above the lowermost one of support levels of a wafer boat 6 for supporting the wafers W, as described later. The top of the uppermost one of the exhaust holes 3h is located below the uppermost one of the support levels.
The lower end of the exhaust space 21 is connected to an exhaust section GE through an airtight exhaust line 4 attached to the sidewall of the reaction tube 2 near the bottom. The exhaust section GE has a pressure adjusting mechanism including, e.g., a valve and a vacuum exhaust pump (not shown in
A lid 5 is disposed below the reaction tube 2. The lid 5 is made of a heat-resistant and corrosion-resistant material, such as quartz. The lid 5 is moved up and down by a boat elevator described later (not shown in
The wafer boat 6 made of, e.g., quartz is placed on the lid 5. The wafer boat 6 has a plurality of support levels to respectively hold a plurality of semiconductor wafers W at predetermined intervals in the vertical direction. A thermally insulating cylinder may be disposed on the lid 5 to prevent the temperature inside the reaction tube 2 from being lowered due to the load port of the reaction tube 2. Further, a rotary table may be disposed to rotatably mount thereon the wafer boat 6 that holds semiconductor wafers W. In this case, the temperature of the semiconductor wafers W placed on the wafer boat 6 can be more uniform.
The reaction tube 2 is surrounded by a thermally insulating cover 71 and a heater 7 made of, e.g., a resistive heating body is disposed on the inner surface of the cover 71. The interior of the reaction tube 2 is heated by the heater 7, so that the semiconductor wafers W are heated up (increase in temperature) to a predetermined temperature.
Gas distribution nozzles 8 and 9 and gas nozzles 10 penetrate the sidewall of the reaction tube 2 near the bottom, and are used for supplying process gases (such as film formation gases, a cleaning gas, and an inactive gas for dilution, purge, or pressure control) into the reaction tube 2. Each of the gas distribution nozzles 8 and 9 and gas nozzles 10 is connected to a process gas supply section GS through a mass-flow controller (MFC) and so forth (not shown). The process gas supply section GS includes gas sources of reactive gases and a gas source of nitrogen (N2) gas used as an inactive gas, so as to prepare film formation gases and a cleaning gas, as follows.
Specifically, in this embodiment, in order to form a silicon nitride film (product film) on semiconductor wafers W by CVD, a first film formation gas containing a silane family gas and a second film formation gas containing a nitriding gas are used. In this embodiment, the silane family gas is dichlorosilane (DCS: SiH2Cl2) gas and the nitriding gas is ammonia (NH3) gas. Each of the first and second film formation gases may be mixed with a suitable amount of carrier gas (dilution gas, such as N2 gas), as needed. However, such a carrier gas will not be mentioned, hereinafter, for the sake of simplicity of explanation.
As a cleaning gas for etching by-product films which contain silicon nitride as the main component (it means 50% or more), a halogen-containing acidic gas or a mixture gas of a halogen gas and hydrogen gas is used. In this embodiment, the cleaning gas is a mixture gas of fluorine (F2) gas, hydrogen fluoride (HF) gas, and nitrogen gas used as a dilution gas.
The gas distribution nozzle 8 is connected to gas sources of NH3 gas and N2 gas, and the gas distribution nozzle 9 is connected to gas sources of DCS gas and N2 gas. On the other hand, the gas nozzles 10 consist of two gas nozzles 10a and 10b, wherein the gas nozzle 10a is connected to gas sources of F2 gas and N2 gas, and the gas nozzle 10b is connected to gas sources of HF gas and N2 gas. A gas nozzle exclusively used for a purge gas (such as, N2 gas) may be additionally disposed.
Each of the gas distribution nozzles 8 and 9 is formed of a quartz pipe which penetrates the sidewall of the reaction tube 2 from the outside and then turns and extends upward (see
A plasma generation section 11 is attached to the sidewall of the reaction tube 2 and extends in the vertical direction. The plasma generation section 11 has a vertically long narrow opening 11b formed by cutting a predetermined width of the sidewall of the reaction tube 2, in the vertical direction. The opening 11b is covered with a quartz cover 11a airtightly connected to the outer surface of the reaction tube 2 by welding. The cover 11a has a vertically long narrow shape with a concave cross-section, so that it projects outward from the reaction tube 2.
With this arrangement, the plasma generation section 11 is formed such that it projects outward from the sidewall of the reaction tube 2 and is opened on the other side to the interior of the reaction tube 2. In other words, the inner space of the plasma generation section 11 communicates with the process space S within the reaction tube 2. The opening 11b has a vertical length sufficient to cover all the wafers W on the wafer boat 6 in the vertical direction.
A pair of long narrow electrodes 12 are disposed on the opposite outer surfaces of the cover 11a, and face each other while extending in the longitudinal direction (the vertical direction). The electrodes 12 are connected to an RF (Radio Frequency) power supply 12a for plasma generation, through feed lines. An RF voltage of, e.g., 13.56 MHz is applied to the electrodes 12 to form an RF electric field for exciting plasma between the electrodes 12. The frequency of the RF voltage is not limited to 13.56 MHz, and it may be set at another frequency, e.g., 400 kHz.
The gas distribution nozzle 8 of the second film formation gas is bent outward in the radial direction of the reaction tube 2, at a position lower than the lowermost wafer W on the wafer boat 6. Then, the gas distribution nozzle 8 vertically extends at the deepest position (the farthest position from the center of the reaction tube 2) in the plasma generation section 11. As shown also in
At a position near and outside the opening 11b of the plasma generation section 11, the gas distribution nozzle 9 of the first film formation gas is disposed. The gas distribution nozzle 9 extends vertically upward on one side of the outside of the opening 11b (inside the reaction tube 2). The first film formation gas comprising DCS gas is spouted from the gas spouting holes of the gas distribution nozzle 9 toward the center of the reaction tube 2.
Further, on both sides near and outside the opening 11b of the plasma generation section 11, the two gas nozzles 10a and 10b for the cleaning gas are respectively disposed. The gas nozzles 10a and 10b are arranged such that fluorine (F2) gas is supplied from the gas nozzle 10a while hydrogen fluoride (HF) gas is supplied from the gas nozzle 10b. Each of the gas nozzles 10 has an L-shape with a gas supply port 10t at the top, which is directed upward. The gas supply port 10t is located below the lowermost one of the support levels of the wafer boat 6 for supporting the wafers W and below the position P of the bottom of the lowermost one of the exhaust holes 3h. Further, the gas supply port 10t is preferably located below the bottom plate 6a of the wafer boat 6. In this respect, as described above, the bottom of the lowermost one of the exhaust holes 3h is located above the lowermost one of the support levels of the wafer boat 6 for supporting the wafers W.
As described above, since the gas supply ports 10t of the gas nozzles 10 are directed upward, the cleaning gas is sufficiently supplied even to the upper side of the reaction tube 2, so that a cleaning process can be uniformly and effectively performed overall inside the reaction tube 2. Since the gas nozzles 10 are short and located at the bottom of the reaction tube 2, deterioration of the gas nozzles 10 due to a combination of the cleaning gas and heat is retarded. Since the gas nozzles 10 are disposed opposite to the exhaust holes 3h with the wafer boat 6 interposed therebetween and below the exhaust holes 3h, the cleaning gas supplied from the gas nozzles 10 is prevented from coming into contact with the gas nozzles 10, so that deterioration of the gas nozzles 10 is further retarded. Since the gas supply ports 10t of the gas nozzles 10 are located below the lowermost one of the support levels of the wafer boat 6 (the level of the lowermost wafer W), a cleaning process can be effectively performed on those portions of the wafer boat 6 which suffer by-product films deposited thereon.
A plurality of temperature sensors 122, such as thermocouples, for measuring the temperature inside the reaction tube 2 and a plurality of pressure gages (not shown in
The film formation apparatus 1 further includes a control section 100 for controlling respective portions of the apparatus.
The operation panel 121 includes a display screen and operation buttons, and is configured to transmit operator's instructions to the control section 100, and show various data transmitted from the control section 100 on the display screen. The (group of) temperature sensors 122 are configured to measure the temperature at respective portions inside the reaction tube 2, exhaust line 4, and so forth, and to transmit measurement values to the control section 100. The (group of) pressure gages 123 are configured to measure the pressure at respective portions inside the reaction tube 2, exhaust line 4, and so forth, and to transmit measurement values to the control section 100.
The heater controller 124 is configured to control the heater 7. The heater controller 124 turns on the heater to generate heat in accordance with instructions from the control section 100. Further, the heater controller 124 measures the power consumption of the heater, and transmits it to the control section 100.
The MFC controllers 125 are configured to respectively control the MFCs (not shown) disposed on the gas distribution nozzles 8 and 9 and the gas nozzles 10. The MFC controllers 125 control the flow rates of gases flowing through the MFCs in accordance with instructions from the control section 100. Further, the MFC controllers 125 measure the flow rates of gases flowing through the MFCs, and transmit them to the control section 100.
The valve controllers 126 are respectively disposed on piping lines and configured to control the opening rate of valves disposed on piping lines in accordance with instructed values received from the control section 100. The vacuum pump 127 is connected to the exhaust line 4 and configured to exhaust gas from inside the reaction tube 2.
The boat elevator 128 is configured to move up the lid 5, so as to load the wafer boat 6 (semiconductor wafers W) into the reaction tube 2. The boat elevator 128 is also configured to move the lid 5 down, so as to unload the wafer boat 6 (semiconductor wafers W) from the reaction tube 2.
The plasma controller 129 is configured to control the plasma generation section 11 in accordance with instructions from the control section 100, so that ammonia supplied into the plasma generation section 11 is activated to generate ammonia radicals.
The control section 100 includes a recipe storage portion 111, a ROM 112, a RAM 113, an I/O port 114, and a CPU 115. These members are inter-connected via a bus 116 so that data can be transmitted between them through the bus 116.
The recipe storage portion 111 stores a setup recipe and a plurality of process recipes. After the film formation apparatus 1 is manufactured, only the setup recipe is initially stored. The setup recipe is executed when a thermal model or the like for a specific film formation apparatus is formed. The process recipes are prepared respectively for heat processes to be actually performed by a user. Each process recipe prescribes temperature changes at respective portions, pressure changes inside the reaction tube 2, start/stop timing for supply of process gases, and supply rates of process gases, from the time semiconductor wafers W are loaded into the reaction tube 2 to the time processed wafers W are unloaded.
The ROM 112 is a storage medium formed of an EEPROM, flash memory, or hard disc, and is used to store operation programs executed by the CPU 115 or the like. The RAM 113 is used as a work area for the CPU 115.
The I/O port 114 is connected to the operation panel 121, temperature sensors 122, pressure gages 123, heater controller 124, MFC controllers 125, valve controllers 126, vacuum pump 127, boat elevator 128, and plasma controller 129, and is configured to control output/input of data or signals.
The CPU (Central Processing Unit) 115 is the hub of the control section 100. The CPU 115 is configured to run control programs stored in the ROM 112, and control an operation of the film formation apparatus 1, in accordance with a recipe (process recipe) stored in the recipe storage portion 111, following instructions from the operation panel 121. Specifically, the CPU 115 causes the (group of) temperature sensors 122, (group of) pressure gages 123, and MFC controllers 125 to measure temperatures, pressures, and flow rates at respective portions inside the reaction tube 2, exhaust line 4, and so forth. Further, the CPU 115 outputs control signals, based on measurement data, to the heater controller 124, MFC controllers 125, valve controllers 126, and vacuum pump 127, to control the respective portions mentioned above in accordance with a process recipe.
Next, an explanation will be given of a method for using the film formation apparatus 1 described above, with reference to
The respective components of the film formation apparatus 1 described below are operated under the control of the control section 100 (CPU 115). The temperature and pressure inside the reaction tube 2 and the gas flow rates during the processes are set in accordance with the recipe shown in
<Film Formation Process>
At first, the wafer boat 6 at room temperature, which supports a number of, e.g., 50 to 100, wafers having a diameter of 300 mm, is loaded into the reaction tube 2 heated at a predetermined temperature, and the reaction tube 2 is airtightly closed. Then, the interior of the reaction tube 2 is vacuum-exhausted and kept at a predetermined process pressure, and the wafer temperature is increased to a process temperature for film formation. At this time, the apparatus is in a waiting state until the pressure and temperature become stable. Then, a pre-treatment stage is performed to treat the surface of the wafers W by ammonia radicals, as described below. During the film formation process comprising the pre-treatment stage as well as adsorption and nitridation stages alternately repeated thereafter, the wafer boat 6 is preferably kept rotated by the rotary table.
In the pre-treatment stage, at first, nitrogen gas is supplied from the gas distribution nozzle 9 into the reaction tube 2 at a predetermined flow rate, as shown in
When the reaction tube 2 is stabilized at the predetermined pressure and temperature, an RF power is applied between the electrodes 12 (RF: ON), as shown in
In the pre-treatment stage, when the pre-treatment is performed on the surface of the wafers W by ammonia radicals, —OH groups and —H groups present on the surface of the wafers W are partly replaced with —NH2 groups. Accordingly, when the adsorption stage performed thereafter is started, —NH2 groups are present on the surface of the wafers W. When DCS is supplied in this state, the DCS is thermally activated and reacts with —NH2 groups on the surface of the wafers W, thereby accelerating adsorption of Si on the surface of the wafers W.
After ammonia gas is supplied for a predetermined time period, the supply of ammonia gas is stopped and the application of RF power is stopped. On the other hand, nitrogen gas is kept supplied into the reaction tube 2 at a predetermined flow rate, as shown in
It should be noted that, in light of the film formation sequence, the temperature inside the reaction tube 2 is preferably set to be constant during the film formation. Accordingly, in this embodiment, the temperature inside the reaction tube 2 is set at 550° C. over the pre-treatment, adsorption, and nitridation stages. Further, the reaction tube 2 is kept exhausted over the pre-treatment, adsorption, and nitridation stages.
In the adsorption stage subsequently performed, at first, while nitrogen gas is supplied from the gas distribution nozzle 9 into the reaction tube 2 at a predetermined flow rate, as shown in
When the reaction tube 2 is stabilized at the predetermined pressure and temperature, DCS gas is supplied from the gas distribution nozzle 9 into the reaction tube 2 at a predetermined flow rate, such as 2 slm, as shown in
After DCS gas is supplied for a predetermined time period, the supply of DCS gas is stopped. On the other hand, nitrogen gas is supplied from, e.g., the gas distribution nozzle 9 into the reaction tube 2 at a predetermined flow rate, as shown in
In the nitridation stage subsequently performed, at first, while nitrogen gas is supplied from the gas distribution nozzle 9 into the reaction tube 2 at a predetermined flow rate, as shown in
When the reaction tube 2 is stabilized at the predetermined pressure and temperature, an RF power is applied between the electrodes 12 (RF: ON), as shown in
The radicals flow out from the opening 11b of the plasma generation section 11 toward the center of the reaction tube 2, and are supplied into gaps between the wafers W in a laminar flow state. When radicals containing nitrogen atoms are supplied onto the wafers W, they react with Si in the adsorption layer on the wafers W, and a thin film of silicon nitride is thereby formed on the wafers W.
After ammonia gas is supplied for a predetermined time period, the supply of ammonia gas is stopped and the application of RF power is stopped. On the other hand, nitrogen gas is supplied from the gas distribution nozzle 9 into the reaction tube 2 at a predetermined flow rate, as shown in
As described above, the film formation method according to this embodiment is arranged to alternately repeat a cycle comprising adsorption and nitridation stages in this orders a predetermined number of times. In each cycle, DCS is supplied onto the wafers W to form an adsorption layer, and then radicals containing nitrogen atoms are supplied to nitride the adsorption layer, so as to form a silicon nitride film. As a result, a silicon nitride film of high quality can be formed with high efficiency.
When the silicon nitride film formed on the surface of the semiconductor wafers W reaches a predetermined thickness, the wafers W are unloaded. Specifically, nitrogen gas is supplied from the gas distribution nozzle 9 into the reaction tube 2 at a predetermined flow rate, so that the pressure inside the reaction tube 2 is returned to atmospheric pressure, and the reaction tube 2 is set at a predetermined temperature. Then, the lid 18 is moved down by the boat elevator 25, and the wafer boat 6 is thereby unloaded out of the reaction tube 2, along with the wafers W.
<Cleaning Process>
Repeating this film formation process a plurality of times, silicon nitride produced by the film formation process is deposited (adhered) not only on the surface of semiconductor wafers W, but also on the inner surface of the reaction tube 2 and so forth, as by-product films. Accordingly, after the film formation process is repeated a predetermined number of times, a cleaning process is performed to remove by-product films which contain silicon nitride as the main component and are deposited on the inner surface of the reaction tube 2 and so forth.
At first, the reaction tube 2 is heated by the heater 7 at a predetermined load temperature, and nitrogen gas is supplied into the reaction tube 2 at a predetermined flow rate. Then, the wafer boat 6 used in the former process is set in an empty state with no wafers W supported thereon and is placed on the lid 5. Then, the lid 5 with this empty wafer boat 6 is moved up by the boat elevator 128, so that the wafer boat 6 is loaded into the reaction tube 2, and the reaction tube 2 is airtightly closed.
Then, nitrogen gas is supplied from the gas distribution nozzle 8 into the reaction tube 2 at a predetermined flow rate, as shown in
When the cleaning gas is supplied into the reaction tube 2, the cleaning gas is heated, and fluorine contained in the cleaning gas is activated, thereby forming a state in which a number of reactive free atoms are present. The activated fluorine comes into contact with (reacts with) by-product films deposited on the inner surface of the reaction tube 2 and so forth, and etches the by-product films.
After cleaning gas is supplied into the reaction tube 2 for a predetermined time period, the supply of fluorine and hydrogen fluoride gases from the gas nozzles 10a and 10b is stopped. Further, nitrogen gas is supplied from, e.g., the gas distribution nozzle 9 into the reaction tube 2 at a predetermined flow rate, and gas is exhausted from inside the reaction tube 2 by the exhaust section GE (purge step).
After the cleaning process is completed, nitrogen gas is supplied from the gas distribution nozzle 9 into the reaction tube 2 at a predetermined flow rate, so that the pressure inside the process tube 2 is returned to atmospheric pressure. Further, the temperature inside the reaction tube 2 is maintained by the heater 7 at a predetermined value. Then, the lid 5 is moved down by the boat elevator 128, so that the wafer boat 6 is unloaded and the reaction tube 2 is opened. Thereafter, the wafer boat 6 with a new lot of semiconductor wafers W mounted thereon is placed on the lid 5, and the film formation process is started again in the manner described above.
<Experiment>
An experiment was conducted to examine removal of by-product films deposited inside the reaction tube 2 by performing a film formation process and a cleaning process in the film formation apparatus 1 shown in
<Consequence and Modification>
As described above, according to this embodiment, since the gas supply ports 10t of the gas nozzles 10 are directed upward, the cleaning gas is sufficiently supplied even to the upper side of the reaction tube 2, so that a cleaning process can be uniformly and effectively performed overall inside the reaction tube 2. Since the gas nozzles 10 are short and located at the bottom of the reaction tube 2, deterioration of the gas nozzles 10 due to a combination of the cleaning gas and heat is retarded. Since the gas nozzles 10 are disposed opposite to the exhaust holes 3h with the wafer boat 6 interposed therebetween and below the exhaust holes 3h, the cleaning gas supplied from the gas nozzles 10 is prevented from coming into contact with the gas nozzles 10, so that deterioration of the gas nozzles 10 is further retarded. Since the gas supply ports 10t of the gas nozzles 10 are located below the lowermost one of the support levels of the wafer boat 6 (the level of the lowermost wafer W), a cleaning process can be effectively performed on those portions of the wafer boat 6 which suffer by-product films deposited thereon.
In the embodiment described above, the film formation apparatus 1 is provided with the exhaust space 21 on one side of the reaction tube 2 for exhausting gas from inside the reaction tube 2, wherein a plurality of exhaust holes 3h are formed in the partition wall 22 between the process space S and exhaust space 21. Alternatively, for example, as shown in
The embodiment described above utilizes a combination of all the following arrangements: i.e., the arrangement that the gas nozzles 10 are disposed opposite to the exhaust holes 3h or exhaust port 3 with the wafer boat 6 interposed therebetween; the arrangement that the gas supply ports lot of the gas nozzles 10 are directed upward; the arrangement that the gas supply ports 10t are located below the position P of the bottom of the exhaust holes 3h or exhaust port 3; and the arrangement that the gas supply ports 10t are located below the lowermost one of the support levels of the wafer boat 6. However, even where these arrangements are separately used or partly combined for use, they can exhibit their own effects separately or partly combined.
In the embodiment described above, an MLD method is used to form a silicon nitride film, but a thermal CVD method may be used to form a silicon nitride film, for example. In the embodiment described above, the film formation apparatus 1 includes the plasma generation section 11. Alternatively, the present invention may be applied to a film formation apparatus including a gas activation section that utilizes another medium, such as a catalyst, UV, heat, or magnetic force. In the embodiment described above, the film formation apparatus 1 is designed to form a silicon nitride film. Alternatively, the present invention may be applied to a film formation apparatus designed to form another thin film, such as a silicon oxide film, silicon oxynitride film, or poly-silicon film.
In the embodiment described above, the cleaning gas for etching by-product films which contain silicon nitride as the main component (it means 50% or more) comprises a gas containing fluorine gas and hydrogen fluoride gas. However, the cleaning gas may be any gas, such as a gas containing fluorine gas and hydrogen gas, as long as it can remove a by-product film deposited due to a film formation process.
In the embodiment described above, nitrogen gas is supplied as a dilution gas when each of the process gases, such as DCS gas, is supplied. In this respect, no nitrogen gas may be supplied when each of the process gases is supplied. However, each of the process gases preferably contains nitrogen gas as a dilution gas, because the process time can be more easily controlled if it is so arranged. The dilution gas consists preferably of an inactive gas, such as nitrogen gas, or helium gas (He), neon gas (Ne), argon gas (Ar), or xenon gas (Xe) in place of nitrogen gas.
Additional advantages and modifications will readily occur to those skilled in the art. Therefore, the invention in its broader aspects is not limited to the specific details and representative embodiments shown and described herein. Accordingly, various modifications may be made without departing from the spirit or scope of the general inventive concept as defined by the appended claims and their equivalents.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2007-265328 | Oct 2007 | JP | national |
