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4610774 | Sakata et al. | Sep 1986 | |
4752335 | Korb | Jun 1988 | |
4820397 | Fielder et al. | Apr 1989 | |
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4838935 | Dunlop et al. | Jun 1989 | |
4889772 | Bergmann et al. | Dec 1989 | |
4961831 | Bergmann et al. | Oct 1990 | |
4961832 | Shagun et al. | Oct 1990 | |
4963239 | Shimamura et al. | Oct 1990 | |
4963240 | Fukasawa et al. | Oct 1990 | |
4964962 | Nobutani et al. | Oct 1990 | |
4964968 | Arita | Oct 1990 | |
4964969 | Kusakabe et al. | Oct 1990 | |
4966676 | Fukasawa et al. | Oct 1990 | |
4966677 | Aichert et al. | Oct 1990 | |
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5066381 | Ohta et al. | Nov 1991 | |
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5397050 | Mueller | Mar 1995 | |
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Number | Date | Country |
---|---|---|
370211 | May 1990 | EPX |
0575166 | Dec 1993 | EPX |
0590904 | Apr 1994 | EPX |
63-157102 | Jun 1988 | JPX |
63-270459 | Aug 1988 | JPX |
1283367 | Nov 1989 | JPX |
1301855 | Dec 1989 | JPX |
6-322530 | Nov 1994 | JPX |
7-278804 | Oct 1995 | JPX |
Entry |
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John Dunlop et al., "Effects of Ti-W Target Processing Methods on Defect Generation During VLSI Device Fabrication", American Vacuum Society 37th Annual Symposium and Topical Conferences, Toronto, Canada, Oct. 8-12, 1990, 17 pages. |