Patent Grant
9678437
The present invention relates to an exposure technology used to transfer mask-pattern on substrates such as wafers in a lithography process for fabricating various kinds of devices such as semiconductor elements, liquid crystal displays, thin-film magnetic heads and, more particularly to an exposure technology using an illuminating technology related to the so-called deformed illumination. Further, the present invention relates to a technology for fabricating the device using the exposure technology.
The apparatus for the projection exposure of the batch exposure system such as the step-and-repeat system or the scan exposure system such as the step-and-scan system have been used to transfer the pattern of the reticle (or photo-mask etc.) as the mask on the wafers (or vitreous plate etc.) as the substrates intended for exposure in the lithography process for fabricating semiconductor elements (or liquid crystal displays etc.). In the kind of apparatus for the projection exposure, it is desirable to transfer various kinds of pattern on the wafers with each high resolution.
The transferred pattern that requires very fine high resolution is the so-called contact hole. The contact hole includes the densely massed contact hole having a plurality of predetermined shaped aperture arranged with predetermined fine pitch and the isolated contact hole being substantially comprised of a single aperture. In order to transfer the pattern of the former densely massed contact hole on the wafer with high resolution, the so-called deformed illumination system (deformed light source system), which allows the amount of light of the illumination light to be enlarged in one or more areas (particularly four areas) being eccentric for optical axis at the pupil plane of the illumination system, is effective (refer to Japanese Patent Applications Laid-open No. Hei 5-67558 (corresponding with U.S. Pat. No. 6,094,305) and NO. 2001-176766 (corresponding to U.S. Pat. No. 6,563,567)).
On the other hand, in order to transfer the pattern of the later isolated contact hole on the wafer with high resolution, the illumination system, which allows the amount of light of the illumination light to be enlarged in a relatively small round area centering optical axis at the pupil plane of the illumination system, that is, the illumination system that allows the σ value, being a coherence factor of the illumination system to be relatively lessened (hereinafter, it will be called “small σ illumination system” for convenience of description), is known to be effective.
As described above, the pattern of the densely massed contact hole with fine pitch and the isolated contact hole can be transferred on the wafer with high resolution through the deformed illumination system and the small σ illumination system respectively. Recently with regard to this, for example, in fabricating semiconductor elements, it is becoming a requirement that transferring one reticle pattern being formed, the pattern being of the contact hole, with various kinds of pitch, which include the patterns ranging from the contact hole arranged with great pitch, which can be substantially regarded as the isolated contact hole, to the densely massed contact hole with fine pitch, on the wafer at one time exposure.
For that reason, however, it is a disadvantage that when using the deformed illumination system, the resolution is not sufficient for the contact hole with large pitch; while when using the small σ illumination system, the resolution is not sufficient for the densely massed contact hole with fine pitch.
Further, recently, for example, when fabricating semiconductors, it has come to be demanded to transfer the pattern of the so-called contact hole densely massed in one direction, which is arranged in the one direction with fine pitch and can be substantially regarded as the isolated pattern in terms of the direction orthogonal to it, to wafer with high resolution.
However, it is a disadvantage that the resolution is not sufficient in the direction in which the pattern can be regarded as the isolated pattern, with using the traditional deformed illumination system for this purpose. Whereas, it is not sufficient in the direction in which the pattern is arranged with the fine pitch, with using the small σ illumination system.
Considering this problem, the first object of the present invention is to provide an exposure technology for simultaneously transferring the pattern having various kinds of pitches with high resolution respectively.
And the second object of the present invention is to provide an exposure technology for transferring the pattern, which is arranged in one direction periodically and is substantially isolated (pattern densely massed in one direction) in terms of the orthogonal direction, with high resolution.
And the third object of the present invention is to provide a manufacturing technology for fabricating the device including various kinds of patterns or including the pattern densely massed in one direction with high accuracy and yet high throughput.
The first exposure method according to the present invention, which is an exposure method for illuminating a mask with an optical beam from an illumination system to expose a substrate with the optical beam through the mask and a projection system, characterized in that a light amount distribution of the optical beam on a predetermined plane with respect to the illumination system is set such that an amount of light is set larger in nine areas than in an area other than the nine areas, the nine areas including a first area and eight areas, an outer contour of the first area including an optical axis of the illumination system, and the eight areas being arranged so as to encompass the first area and each of the eight areas being smaller than the first area.
According to the present invention, such a pattern that is great in pitch and can be substantially regarded as the isolated contact hole by means of the optical beam passing through the first area is transferred with high resolution, and the pattern which includes the patterns ranging from the pattern with around middle pitch to the pattern with fine pitch like the densely massed contact hole by means of the optical beam passing through the eight areas enclosing the first area, is transferred with high resolution. Accordingly, it is able to simultaneously transfer the patterns having various kinds of pitches with high resolution respectively.
In this case, it is preferable that the first area to be located at the center is an annular zone area. With the annular illumination at the first area, the resolution and the depth of focus might be improved in some cases. Furthermore, the amount of light (intensity per unit area e.g.) at the first area to be located in the center may be made different from the amount of light at the surround areas enclosing it.
Furthermore, as an example, the predetermined plane is a pupil plane of the illumination system, and the nine areas in which the amount of light on the predetermined plane is greater than the amount of light at the area other than the nine areas, comprises the first area, four second areas which are arranged along a first circumference that encloses the first area and which are respectively smaller than the first area, and four third areas which are arranged along a second circumference that encloses the first circumference and which are respectively smaller than the first area.
With this composition, the pattern having the around middle pitch is transferred with high resolution by means of the optical beam passing through the second areas, and the pattern having the fine pitch is transferred with high resolution by means of the optical beam passing through the third areas.
Furthermore, it is preferable that the first area, two of the second areas, and two of the third areas are arranged along a first straight line passing through the optical axis of the illumination system, and the first area, the other two of the second areas, and the other two of the third areas are arranged along a second straight line which is orthogonal to the first straight line and which passes through the optical axis of the illumination system.
The conventional pattern intended to transfer is two-dimensionally arranged along two directions orthogonal to each other (one of them will be called “arranging direction of pattern”). Then, by making the direction of the first straight line (or the second straight line) intersect the arranging direction of the pattern (preferably making it intersect at 45 degree), the pattern having various kinds of the pitches two-dimensionally arranged can be transferred with high resolution respectively.
Further, the radius (r1) when the first area is made circular, and the radii (r2, r3) when the second and third areas are made circular are preferably set to the following bounds with the maximum σ value (this will be assumed σ) of the illumination system assumed to be a reference. In addition, also if the first area, second areas, and third areas are set to other shape different from the circles such as the square, the regular hexagon or the shape having one quarter circle, the sizes of them preferable equal those of the circulars. In addition, if the first area is annular, the outer radius (r1) is preferably set to the bounds of an equation (1), as follows:
0.2σ≦r1≦0.4σ (1)
0.075σ≦r2≦0.2σ (2)
0.075σ≦r3≦0.2σ (3)
If each area becomes smaller than the lower limit of the equation (1), equation (2), and equation (3), there is a possibility that the resolution deteriorates for some patterns from among the patterns having various kinds of the pitches. On the other hand, if each area becomes greater than the upper limit of the equation (1), equation (2), and equation (3), there is a possibility that the resolution deteriorates for the pattern having fine pitch because this system will be close to the conventional illumination system.
Next, the second exposure method according to the present invention, which is an exposure method for illuminating a mask with an optical beam from an illumination system to expose a substrate with the optical beam through the mask and a projection system, has a step of setting a light amount distribution of the optical beam on a predetermined plane with respect to the illumination system is set such that an amount of light is set larger in five areas than in an area other than the five areas, the five areas including a first area of an annular zone shape in which an outer contour of the first area including an optical axis of the illumination system, and the four areas being arranged so as to encompass the first area and each of the four areas being smaller than the first area.
According to the present invention, such a pattern that is large in the pitch and can be substantially regarded as the isolated contact hole is transferred by means of the optical beam passing through the annular first area is transferred with high resolution, and the pattern having fine pitch like the densely massed contact hole by means of the optical beam passing through the four areas enclosing the first area is transferred with high resolution. Accordingly, it is able to simultaneously transfer the patterns having various kinds of the pitches with high resolution respectively.
Further, as an example, the predetermined plane is a pupil plane of the illumination system, and the five areas in which the amount of light on the predetermined plane is greater than the amount of light at the area other than the five areas, comprises the first area and four second areas which are arranged, at intervals of substantially 90 degree therebetween, along a circumference that encloses the first area and which are respectively smaller than the first area.
With this composition, the pattern having the fine pitch is transferred with high resolution by means of the optical beam passing through the second areas. The conventional pattern intended to transfer is two-dimensionally arranged along two directions orthogonal to each other (one of them will be called “arranging direction of pattern”). Then, by making the direction, in which the second areas are arranged intersect the arranging direction of the pattern (preferably making it intersect at 45 degree), the pattern having various kinds of the pitches two-dimensionally arranged can be transferred with high resolution respectively.
Further, it is preferable that the radius (r1) when the first area is made annular with its contour assumed to be circular and the radius (r2) when the second area is made circular is preferably set within the bounds of the equations (1) and (2) described above with the maximum σ value (this will be assumed σ) of the illumination system assumed to be a reference. This enables the pattern having various kinds of the pitches to be transferred with high resolution.
In the present invention, an optical beam generated from each of the areas which have large amount of light which are arranged out of the optical axis of the illumination system on the predetermined plane is linear polarization. In this case, a direction of polarization of the optical beam on the predetermined plane is substantially coincident with a circumference direction (that is, the optical beam may be S polarization).
Next, the third method for exposure according to the present invention, which is an exposure method having a step for illuminating a mask with an optical beam from an illumination system to expose a substrate with the optical beam through the mask and a projection system, has a step of setting a light amount distribution of the optical beam on a predetermined plane with respect to the illumination system is set such that an amount of light is set larger in three areas than in the area other than these.
According to the present invention, if one direction dense patterns are formed at the mask, the patterns are transferred with high resolution the direction of which the patterns are isolate by means of optical beam passing through the center of the three areas, and the patterns are transferred with high resolution the direction of which the patterns are periodically arranged by means of optical beam passing through the two areas which sandwich the center area.
In this case, the three areas having large amount of light include a first area near an optical axis of the illumination system, and a second area and a third area which are arranged along a straight line passing through the optical axis so as to sandwich the first area. Alternatively, the three areas having large amount of light include a first area near an optical axis of the illumination system, and a second area and a third area which are arranged with the approximately same distance from the optical axis.
With these compositions, by providing (paralleling) the direction of which the three areas are arranged to the direction of which the one direction dense pattern is periodically arranged, it is able to transfer the one directional high density pattern to the two directions of the isolated and periodical ones with high resolution.
In other words, if a pattern formed on the mask includes a one directionally high density pattern which is periodically arranged along a predetermined first axis and which is substantially isolated in a direction of a second axis orthogonal to the first axis, the three areas having large amount of light are preferably arranged with a distance therebetween in a parallel direction to the first axis. Whereby, it is able to transfer the one directional high density pattern with high resolution along the first axis and the second axis respectively. Further, the three areas having large amount of light are preferably arranged along a straight line which is parallel to the first axis and which passes through the optical axis of the illumination system.
Furthermore, a center area of the three areas having large amount of light is preferably set such that an amount of light of a center part thereof is smaller than an amount of light of a part other than the center part. Whereby, it is able to increase the resolution in the direction of which the pattern is isolated and to widen the depth of focus.
In this case, the center area is around an annular zone area as an example. Furthermore, the center area comprises a plurality of areas separated from each other. The plurality of areas separated from each other, which are the center area, are arranged along a predetermined straight line passing through the optical axis of the illumination system on the predetermined plane as an example. Furthermore, an arranging direction of the plurality of areas separated from each other, which are the center area, is determined according to a size of the center area as another example.
Further, the three areas have outlines which are the substantially same with each other as an example. Further, the sizes of the three areas having large amount of light respectively correspond to 0.1 times 0.2 times of a maximum σ value of the illumination system. Whereby, the deep depth of focus is obtained according to the simulation of the present invention.
Furthermore, the two areas of the three areas having large amount of light, which are arranged at both ends with respect to the direction parallel to the first axis, may respectively have longitudinal directions which are substantially coincident with a direction parallel to the second axis. Whereby, it is able to enhance the resolution corresponding to the one directional high density pattern and to avoid the reduction of the amount of light.
Further, the center area of the three areas having large amount of light may have a longitudinal direction which is substantially coincident with the direction parallel to the first axis.
Furthermore, an optical beam generated from a center area of the three areas having large amount of light may linear polarization, a directions of polarization is substantially coincident with a direction parallel to the first axis.
Furthermore, an optical beam generated from a center area of the three areas having large amount of light and optical beams generated from the other two areas may have different polarization states from each other. In this case, a polarization direction of the optical beam generated from the center area and a polarization direction of the optical beams generated from the other two areas are orthogonal to each other.
Further, a size of the center area of the three areas having great amount of light and sizes of the other two areas may be different from each other.
Further, the optical beams generated from the other two areas except for the center area of the three areas having large amount of light may be respectively linear polarization. In this case, for an example, the directions of polarization of optical beams distributed in the other two areas on the predetermined plane may be respectively substantially coincident with a circumference direction (that is, the optical beam may be S polarization).
Further, for an example, the predetermined plane is a pupil plane of the illumination system. Furthermore, as another example, a predetermined plane is the conjugate plane for the pupil plane of the illumination system or the pupil of the projection system (or its conjugate plane). In this case, it is obtained the highest resolution.
Next, the first exposure apparatus according to the present invention, in an exposure apparatus which an illumination system illuminates a mask with an optical beam; and a projection system which exposes a substrate with the optical beam from the mask, characterized by comprising an optical member which sets a light amount distribution of the optical beam on a predetermined plane with respect to the illumination system such that an amount of light is set larger in nine areas than in an area other than the nine areas, the nine areas including a first area and eight areas, an outer contour of the first area including an optical axis of the illumination system, and the eight areas being arranged so as to encompass the first area and each of the eight areas being smaller than the first area.
According to the present invention, with the optical members, it is able to simultaneously transfer patterns having various kinds of pitch with high resolution respectively.
In this case, in order to more improve the resolution and the depth of focus, it is preferable that the central first area is an annular zone area.
Furthermore, as an example, the predetermined plane is a pupil plane of the illumination system, and the nine areas in which the amount of light at the predetermined plane is greater than the amount of light at the area other than the nine areas, comprises the first area, four second areas which are arranged along a first circumference that encloses the first area and which are respectively smaller than the first area, and four third areas which are arranged along a second circumference that encloses the first circumference and which are respectively smaller than the first area.
Furthermore, it is preferable that the first area, the two second areas, and two of the third areas are arranged along a first straight line passing through the optical axis of the illumination system, and the first area, the other two of the second areas, and the other two of the third areas are arranged along a second straight line which is orthogonal to the first straight line and which passes through the optical axis of the illumination system.
Also in this case, the size of each area preferably satisfies the conditions of the equations (1) to (3).
Next, the second exposure apparatus according to the present invention, in an exposure apparatus which an illumination system which illuminates a mask with an optical beam; and a projection system which exposes a substrate with the optical beam from the mask, characterized by comprising an optical member which sets a light amount distribution of the optical beam on a predetermined plane with respect to the illumination system such that an amount of light is set larger in five areas than in an area other than the five areas, the five areas including a first area of an annular zone shape and four areas, an outer contour of the first area including an optical axis of the illumination system, and the four areas being arranged so as to encompass the first area and each of the four areas being smaller than the first area.
According to the present invention, with the optical members, it is able to simultaneously transfer patterns having various kinds of pitch with high resolution respectively.
Further, as an example, the predetermined plane is a pupil plane of the illumination system, and the five areas in which the amount of light on the predetermined plane is greater than the amount of light at the area other than the five areas, comprises the first area and four second areas which are arranged, at intervals of substantially 90 degree therebetween, along a circumference that encloses the first area and which are respectively smaller than the first area.
Also in this case, the size of each area preferably satisfies the conditions of the equations (1) to (3).
Furthermore, as an example, the illumination system includes an optical integrator which substantially uniformize illuminance within an illuminant area on the mask on which the optical beam is irradiated, and the optical member is arranged at an incident side of the optical integrator in the illumination system, and the optical member includes a diffractive optical element which diffracts the optical beam to a plurality of directions. In particular, with using a phase type diffractive optical element, it is able to obtain high use-efficiency.
Furthermore, as another example, the illumination system includes an optical integrator which substantially uniformize illuminance within an illuminant area on the mask on which the optical beam is irradiated, and the optical member is arranged on the predetermined plane or a conjugate plane thereof, and the optical member includes an aperture stop defining an area in which an amount of light is enhanced on the predetermined plane. The aperture stop has a simple structure and can easily set the preferable distribution of the amount of light.
Further, the optical member can preferably set different plural light amount distributions including a distribution which enhances the amount of light at the plurality of areas. Whereby, it is able to expose various kinds of pattern with optimum irradiating condition.
In the exposure apparatus according to the present invention also, an optical beam generated from each of the areas which have large amount of light and which are arranged out of the optical axis of the illumination system on the predetermined plane may be linear polarization. In this case, a direction of polarization of the optical beam on the predetermined plane may substantially coincident with a circumference direction (that is, the optical beam may be S polarization).
Further, as an example, the optical member may further include a deflection member which generates optical beams respectively distributed at different areas on the predetermined plane, and a polarization setting member which sets polarization states of the optical beams generated from the deflection member in the illumination system.
An example of the deflection member is a diffractive optical element which generates diffracted light to a plurality of directions on an optical path of the illumination system.
Furthermore, the optical member includes movable members which are arranged at an exit side of the deflection member, and which can change a positional relation between each area outside the optical axis on the predetermined plane and the optical axis of the illumination system, and the polarization setting member may be arranged between the deflection member and the movable member.
Further, the movable members may include at least one movable prism which has an inclined plane through which an optical beam distributed in a predetermined area including a plurality of areas outside the optical axis except the first area on the predetermined plane passes, the at least one movable prism moves along the optical axis of the illumination system.
Further, the optical member includes at least one movable prism which can change positions of a plurality of areas which enclose the first area and which have greater amount of light than an area other than the plurality of areas. The movable prism, as an example, has an inclined plane through which an optical beam distributed in a predetermined area including a plurality of areas outside the optical axis except the first area on the predetermined plane passes, and the movable prism moves along the optical axis of the illumination system. Furthermore, the movable prism, as another example, has a flat plane through which an optical beam distributed in the first area passes and which is approximately orthogonal to the optical axis of the illumination system.
Next, the third exposure apparatus according to the present invention, in an exposure apparatus which an illumination system illuminates a mask with an optical beam; and a projection system which exposes a substrate with the optical beam from the mask, characterized by comprising an optical member which sets a light amount distribution of the optical beam on a predetermined plane with respect to the illumination system such that an amount of light is set larger in a first area and a plurality of areas than in an area other than the first area and the plurality of areas, the first area substantially including an optical axis of the illumination system, and the plurality of areas being arranged outside the first areas, wherein the optical member includes a deflection member which generates optical beams respectively distributed at different areas on the predetermined plane, and at least one movable prism having a flat plane through which an optical beam generated from the deflection member and distributed in the first area passes and which is approximately orthogonal to the optical axis of the illumination system and an inclined plane through which an optical beam distributed in a predetermined area including a plurality of areas outside the optical axis except the first area passes, to change a positional relation between each area outside the optical axis on the predetermined plane and the optical axis of the illumination system.
According to the present invention, with the deflection member, it is able to simultaneously transfer pattern having various kinds of pitch with high resolution respectively. Further, with the movable prism, it is able to adjust the characteristic of the image-forming according to the kind of the pattern to be transferred.
In the present invention, as an example, the illumination system includes an optical integrator which substantially uniformize illuminance within an illuminant area on the mask on which the optical beam is irradiated, and the movable prism is arranged at an incident side of the optical integrator in the illumination system, and the movable prism moves along the optical axis.
Further, optical beams generated from the plurality of areas arranged outside the first area are respectively linear polarization (S polarization) in which the polarization direction thereof being substantially coincident with a circumference direction on the predetermined plane.
Further, the optical member can preferably set different plural light amount distributions including a distribution which enhances the amount of light at the plurality of areas including the first area.
Next, the forth exposure apparatus according to the present invention, in an exposure apparatus an illumination system illuminates a mask with an optical beam; and a projection system which exposes a substrate with the optical beam from the mask, characterized by comprising optical members which set a light amount distribution of the optical beam on a predetermined plane with respect to the illumination system such that an amount of light is set larger in three areas separated from each other than in an area other than the three areas.
According to the present invention, with using the optical member, it is able to transfer the one direction dense pattern to the two directions of the isolated and periodical ones with high resolution.
In this case, the three areas having large amount of light preferably include a first area near an optical axis of the illumination optical system, and a second area and a third area which are arranged along a straight line passing through the optical axis so as to sandwich the first area. Alternatively, the three areas having large amount of light may include a first area near an optical axis of the illumination optical system, and a second area and a third area which are arranged with the approximately same distance from the optical axis.
In these compositions, if a first axis direction in which a high density pattern formed on the mask is periodically arranged and a second axis direction in which the high density pattern is arranged substantially isolatedly, the second axis direction being orthogonal to the first axis direction, the three areas having large amount of light are arranged with a distance therebetween in a parallel direction to the first axis direction. Whereby, it is able to transfer the one direction dense pattern with high resolution along the first axis and the second axis respectively. Further, the three areas having large amount of light are arranged along a straight line which passes through the optical axis of the illumination system and which is parallel to the first axis.
Further, a center area of the three areas having large amount of light is set such that an amount of light of a center part thereof is smaller than an amount of light of a part other than the center part. Whereby, it is able to increase the resolution in the direction of which the pattern is isolated and to widen the depth of focus.
In this case, the center area is substantially an annular zone area as an example. Furthermore, the center area comprises a plurality of areas separated from each other as another example. The plurality of areas separated from each other, which are the center area, are arranged along a predetermined straight line passing through the optical axis of the illumination optical system on the predetermined plane as an example. Furthermore, an arranging direction of the plurality of areas separated from each other, which are the center area, is determined according to a size of the center area as another example.
Further, the sizes of the three areas having large amount of light respectively correspond to 0.1 times to 0.2 times of a maximum σ value of the illumination system. Whereby, the deep depth of focus is obtained according to the present invention.
Further, in the present invention, two areas of the three areas having large amount of light, which are arranged at both ends with respect to the direction parallel to the first axis, respectively have longitudinal directions which are substantially coincident with a direction parallel to the second axis.
Further, a center area of the three areas having large amount of light has a longitudinal direction which is substantially coincident with the direction parallel to the first axis.
Further, an optical beam generated from a center area of the three areas having large amount of light is linear polarization, a directions of polarization is substantially coincident with a direction parallel to the first axis.
Further, an optical beam generated from a center area of the three areas having large amount of light and optical beams generated from the other two areas may have different polarization states from each other. In this case, as an example, a polarization direction of the optical beam generated from the center area and a polarization direction of the optical beams generated from the other two areas are orthogonal to each other.
Further, a size of the center area of the three areas having great amount of light and sizes of the other two areas may be different from each other.
Further, optical beams generated from the other two areas except for the center area of the three areas having large amount of light are respectively linear polarization. In this case, as an example, directions of polarization of optical beams distributed in the other two areas on the predetermined plane are respectively substantially coincident with a circumference direction (S polarization).
Further, as an example, the optical member includes a deflection member which generates optical beams respectively distributed at different areas on the predetermined plane, and the exposure apparatus further comprises a polarization setting member which sets polarization states of the optical beams generated from the deflection member in the illumination system. In this case, further, the optical member includes a movable member which is arranged at an exit side of the deflection member, and which can change a positional relation between the other two areas except for the center area of the three areas having large amount of light and the optical axis of the illumination system, and the polarization setting member is arranged between the deflection member and the movable member.
Further, the movable member includes at least one movable prism which has an inclined plane through which an optical beam distributed in a predetermined area including the other two areas except for the center area on the predetermined plane passes, and the at least one movable prism moves along the optical axis of the illumination system.
Further, the optical member may include at least one movable prism which can change positions of the other two areas except for the center area of the three areas having large amount of light. In this case, the movable prism, as an example, has an inclined plane through which an optical beam distributed in a predetermined area including the other two areas except for the center area on the predetermined plane passes, and the movable prism moves along the optical axis of the illumination system.
Further, the movable prism, as another example, may have a flat plane through which an optical beam distributed in the center area on the predetermined plane passes and which is approximately orthogonal to the optical axis of the illumination system. Further, as an example, the illumination system includes an optical integrator which substantially uniformize illuminance within an illuminant area on the mask on which the optical beam is irradiated, and the movable prism is arranged at an incident side of the optical integrator in the illumination system.
Further, a predetermined plane is, as an example, a pupil plane of the illumination system. In this case, the illumination system, as an example, includes an optical integrator which substantially uniformize illuminance within an illuminant area on the mask on which the optical beam is irradiated, and the optical members include a diffractive optical element which is arranged at an incident plane side of the optical integrator in the illumination system. With this constitution, it is able to obtain a high efficiency.
Further, as another constitution of a predetermined plane being the pupil plane, the illumination system includes an optical integrator which substantially uniformize illuminance within an illuminant area on the mask on which the optical beam is irradiated, and the optical member is arranged on the predetermined plane or a conjugate plane thereof, and the optical member includes an aperture stop defining the three areas. With this constitution, it is easily able to make the distribution of the amount of light at a predetermined plane desirable distribution.
Further, the optical members can preferably set different plural light amount distributions including a light amount distribution which enhances the amount of light in the three areas. Whereby, it is able to transfer various kinds of patterns with high resolution.
Next, method for fabricating device according to the present invention is method for fabricating device including lithography process in which patterns are transferred to the photosensitive material by using the exposure method or apparatus according to the present invention. With the exposure method or apparatus according to the present invention, the mass production of devices including various kinds of patterns or one direction pattern with high accuracy.
In the present invention, when setting the distribution of a predetermined plane relating to the illumination system so as to increase the amount of light at a predetermined nine or five areas, it is able to simultaneously transfer patterns having various kinds of pitches with high resolution respectively.
Further, by making the center first area annular, it is able to more improve the resolution and depth of focus. Furthermore, by controlling the state of polarization of the optical beam, it might be able to more improve the resolution and the like.
Furthermore, in the present invention, when setting the distribution of a predetermined plane relating to the illumination system so as to increase the amount of light at a predetermined three areas, it is able to transfer one direction patterns with high resolution.
Furthermore, if the pattern formed at the mask is periodically arranged along a predetermined first axis and includes the one direction dense pattern which is substantially isolated in the direction of the second axis orthogonal to the first axis, by arranging the three areas in which the amount of light is great with distance in the parallel direction to the first axis, it is able to transfer the one direction dense pattern with high resolution both directions of arranging the one direction dense pattern to periodical and isolatable ones. Further, in the present invention, with setting the state of polarization of the optical beam oriented from the three areas in which the amount of light is great, it might be to improve the resolution and the like for a predetermined pattern.
[The First Embodiment]
A preferably first embodiment will be described accompanying
This embodiment applies the present invention when doing exposure with the projection exposure apparatus using an illumination system which has a fly' eye lens as an optical integrator (uniformizer or homogenizer).
An illumination light IL comprised of ultraviolet pulse light as an optical beam for exposure (exposure beam) emitted from exposure light source 1 goes into the first diffractive optical element 21 through an optical path folding mirror 3, after changing the cross-sectional shape of the optical beam into the desirable shape with beam expander 2, and is changed into the optical beam DL which diffracts in plural directions in order to obtain a predetermined distribution amount of light at a predetermined plane (for example pupil plane of the illumination system) as described after. The diffractive optical element 21 as a part of the optical member for setting distribution amount of light is mounted to a revolver 24, the second diffractive optical element 22 having other diffractive characteristic, and a further diffractive optical element (not shown) having another diffractive characteristic are also mounted. In this embodiment, a main control system 17 which controls all operations of the apparatus controls the revolving angle of the revolver 24 through a driver 23, by setting one of the diffractive optical element 21 and 22 etc. on the optical path of the illumination light IL, to change the condition of illumination.
In
In this embodiment, the diffractive optical element 21, the first prism 71, and the second prism 72 are corresponding to an optical member for setting a predetermined distribution of amount of light. As shown in
Further, at least one of the first prism 71 and the second prism 72, for example in this embodiment, the second prism 72 is only supported movably by a driving mechanism (not shown), thus by changing the distance between the first prism 71 and the second prism 72 by moving the second prism 72 along the optical axis BX, the position of a plurality of peripheral areas in which the amount of light is great can adjust to the radial direction, without changing the central distribution (position of areas 28, 33 etc. described below) of the distribution of amount of light at the exit plane Q1 on the fly' eye lens 5.
In addition, a prism having not a cone but a pyramid may be used instead of the first prism 71 and the second prism 72. Furthermore, it is allow moving this position along the optical axis BX by only using the first prism 71 instead of the first prism 71 and the second prism 72. Further, as shown in
With this composition, by changing the distance between the prisms 71A, 71 B, positions (distance from the optical axis BX) of a peripheral area, in which amount of light is great, concerning the above and below direction of the paper in
In addition, however the prism described above whose slope plane is the cone, pyramid, or shaped like a letter V the center flat plate is the parallel flat plate, it may be aperture part (hollow part) by cutting at lest one part of the center part, or may be an integral solid by making a plurality of members independently. In particular, the latter may be an integral solid by only dividing the peripheral slope plate except the center flat plate part into a plurality of parts.
In
In addition, the fly' eye lens 5 is, as an example, a bundle of many lens elements each of which has a rectangular cross-section whose vertical and horizontal width is about a few of millimeter, the shape cross-section of each lens element is approximately similar to a slim piece of illumination area on a reticle. However, a micro fly' eye lens constructed by binding many micro lenses whose shape cross-section is rectangular with about a few tens of micrometer or circular with diameter of about a few tens of micrometer can be used.
The illumination light IL comprises optical beam emitted from the fly' eye lens 5 is onetime gathered on the plane Q2 by a condenser lens system 6. A fixed field stop (fixed blind) 7 for limiting an illumination area on a reticle R as an illuminated target to a slim shape orthogonal to scan direction, i.e., not-scan direction is arranged at slight front side of the plane Q2, a movable field stop (movable blind) 8 on the plane Q2. The movable field stop is used to prevent from useless exposure by controlling the width of the scan direction of the illumination area at the front and back of the scan exposure, and to limit the width of the not-scan direction of the illumination area during the scan exposure. As an example, a reticle stage driving system 16 described below controls open/close operation of the movable field stop 8 through a driving section 13 in sync with operation of the reticle stage.
The illumination light IL passing through the field stop 7 and 8, via an imaging-lens system 9, optical path folding mirror 10, and main condenser lens system 11, illuminates a slim illumination area on a circuit pattern area of a pattern plane (it will be called “reticle plane” hereinafter) of the reticle R as a mask with even intensity distribution. An illumination system 12 is composed of the exposure light source 1, a beam expander 2, the mirror 3, the diffractive optical element 21 (or other diffractive optical element), the relay lens 4, fly' eye lens 5, the condenser lens system 6, field stop 7, 8, the imaging-lens system 9, the mirror 10, and the main condenser lens system 11. An optical axis of the illumination system 12 is regarded as the optical axis BX. In this case, the exit plane Q1 of the fly' eye lens 5 is substantially coincident to an optical Fourier transform plane for the pupil plane of the illumination system 12, i.e., reticle: the plane Q2 in which the movable field stop 8 is arranged is a conjugate plane with the reticle plane. In addition, the fixed field stop 7, for example, may be arranged near the reticle plane.
Under the illumination light IL, the imaging-circuit patterns within illumination area of the reticle R, via a projection optical system PL of both side telecentric as a projection system, transfers a resist layer of one shot area among a plurality of shot areas on a wafer W as a substrate arranged on an image-forming plane of the projection optical system PL with a predetermined downsizing magnification β (for example, β ¼, ⅕ etc.). In addition, the reticle R and wafer W are respectively regarded as a first object and second object. Furthermore, the wafer W as substrate for exposure is a circular substrate such as semiconductor (silicon etc.) or SOI (silicon on insulator) whose diameter is 200 or 300 mm, for example.
An optical axis AX of the projection optical system PL is coincident to an optical axis BX of the illumination system on the reticle R. Furthermore, a pupil plane Q3 (optical Fourier transform plane for the reticle plane) on the projection optical system PL is conjugate with the exit plane Q1 (the pupil plane of the illumination system 12) of the fly' eye lens 5. As the projection optical system PL of this embodiment, other one except the diffractive system can be used, for example, a catadioptric projection optical system having a plurality of optical systems having optical cross-axes each other as disclosed in Japanese Patent Application: TOKUKAI 2000-47114 (corresponding to U.S. Pat. No. 6,496,306) or, for example, a catadioptric projection optical system and the like which has an optical system including an optical axis intends from a reticle to a wafer and a catadioptric optical system including an optical axis being approximately orthogonal to that optical axis, and which forms an intermediate image twice in its interior as disclosed in international publication (WO): 01/065296 brochure (corresponding to US publication 2003/0011755A1). It will be described the projection optical system PL, with considering that a Z axis is paralleled to the optical axis AX, a X axis is not-scan direction (the direction parallel to the paper in
First, the reticle R is adsorbed and held on the reticle stage 14; the reticle stage 14 is mounted so as to move with a constant velocity along the Y direction on a reticle base 15, and to slightly move along rotating directions about the X, Y, and Z axis. The position of the reticle stage 14 is measured by a laser interferometer in a reticle driving system 16. The reticle driving system 16 controls the position and velocity of the reticle stage through driving mechanism not shown, based on the measured information and control information from a main control system 17.
On the other hand, the wafer W is adsorbed and held on a wafer stage 18 through wafer holder not shown; the wafer stage 18 is movably mounted in the X and Y directions on a wafer base 19. The position of the wafer stage 18 is measured by a laser interferometer in a wafer driving system 20. The wafer driving system 20 controls the position and velocity of the wafer stage 18 through driving mechanism not shown, based on the measured information and control information from the main control system 17. Furthermore, a focusing mechanism for fitting the surface of the wafer into the image-forming plane of the projection optical system PL is assembled in the wafer stage 18 during the scan exposure, based on measured information of an auto-focus sensor not shown.
During scan exposure, under controlling of the main control system 17, the reticle driving system 16, and the wafer driving system 20, operation of scanning one shot area on the wafer W to a corresponding direction (+Y or −Y direction) for the slim exposure area (the illumination area of the illumination light IL being conjugated with the illumination area concerning projection optical system PL) with velocity β*VR (β is projection magnification) through the wafer stage 18, and operation of step-moving the wafer W to the X, Y directions through the wafer stage 18 are repeated, in sync with scanning the reticle R to the Y direction for the illumination area illuminated illumination light with velocity VR through reticle stage 14.
Next, an illumination system and an illumination method will be described in detail.
P1<P2<P3 (4)
If the projection magnification β of the projection optical system PL in
NA=β·NAPL (5)
Further, it is defined that the maximum value among the numerical apertures of the illumination light IL incident to the reticle R from the illumination system 12 is NAIL, the value of ratio (coherence factor) of the maximum numerical aperture NAIL to the numerical aperture NA of the projection optical system PL is called maximum σ value in this embodiment, and maximum σ value is σ. That is, the illumination light of maximum σ value is the light incident on the reticle R with the maximum angle among the illumination light IL. The maximum σ value (σ) can be expressed, as follows:
σ=NAIL/NA=NAIL/(β·NAPL) (6)
In a pupil plane of an illumination system shown in
First, the center area 28 is set larger than other eight areas 29A to 29D and 30A to 30D (r1>r2>r3). Further, since the arranging directions of the 2-dimensional patterns as the targets to transfer are the X direction and Y direction, it is defined that a straight line crossed to the X direction by 45 degrees in clock winding is a straight line 31A; a straight line (the straight line crossed to the X direction by 45 degrees in counter clock winding) is a straight line 31B. Furthermore, the center of the center area 28, the middle two areas 29A and 29C, and other most outer two areas 30A and 30C is arranged on the first straight line 31A; the center of the center area 28, the middle other two areas 29B and 29D, and other most outer two areas 30B and 30D is arranged on the second straight line 31B. That is, the eight areas 29A to 29D and 30A to 30D enclosing the center area 28 are arranged along the two directions being orthogonal with revolving the two arranging directions by 45 degrees, which are orthogonal, in which patterns as the targets for transfer.
Further, as an example, the radius r1 of the area 28, the radii r2 of the areas 29A to 29D, and the radii r3 of the areas 30A to 30D are set 0.3-fold, 0.1-fold, and 0.1-fold of the maximum σ value (σ) (the radius of circle 27, after being similar to this), as follows:
r1=0.3σ (7)
r2=r3=0.1σ (8)
Further, the radius R1 of the first circle 32A and the radius R2 of the second circle 32B are set 0.55-fold and 0.9-fold of the maximum σ value (σ), as follows:
R1=0.55σ (9)
R2=0.9σ (10)
In this case, the radial distance d1 between the outer of the area 28 and the first circle 32A, and the radial distance d2 between the first circle 32A and the second circle 32B are as follows:
d1=0.25σ, d2=0.35σ (11)
In this case, the diffractive characteristic of the diffractive optical element 21 in
In addition, with setting the distribution of amount of light obtained by the diffractive optical element 21 to around constant amount of light at the areas including the area 28, the areas 29A to 29D, and the areas 30A to 30D in
For this embodiment, this inventor have evaluated the CD (critical dimension), through the simulation of the computer, which is obtained by transferring a downsizing image of pattern of contact holes with various kinds of pith arranged on the reticle plane to the wafer through the projection optical system PL, under the distribution of amount of light in which the amount of light becomes constant at the nine areas comprising the area 28, the areas 29A to 29D, and the areas 30A to 30D in
NA=0.82, β=¼, σ=0.9 (12)
The curve 36 in
Accordingly, with using the distribution of amount of light on the pupil plane in
In addition, the distribution of amount of light on the pupil plane in
0.2σ≦r1≦0.4σ (13)
0.075σ≦r2≦0.2σ (14)
0.075σ≦r3≦0.2σ (15)
Further, the radius R1 of the first circle 32A and the radius R2 of the second circle 32B may be changed up to around ±10% of the equations (9) and (10). Furthermore, the numerical aperture NAPL of the image side, the projection magnification β, and the maximum σ value (σ) in the projection optical system PL can be taken any values though the values described above. For example, in order to control the maximum σ value (σ), by changing the distance between prism 71 and 72 in
In addition, about the distribution of amount of light in
Further, instead of the distribution of amount of light in
In addition, in order to more improve the resolution and depth of focus than using the amount of light of
When the amount of light in
Further, in this embodiment, the light distributed at the peripheral areas 29A to 29D, and the areas 30A to 30D in
In addition, if the light distributed at the peripheral eight or four areas with area in which the amount of light is great described above is non-polarization or whose polarization direction is not coincidental to the circumference direction, for example, by arranging a polarization setting member PSM such as ½ wave plate or ¼ wave plate on the optical path passed through the lights distributed at each area between diffractive optical element 21 (deflection member) and the fly' eye lens 5 (see, for example,
In this case, it is not necessary to move the polarization setting member in accordance with variation of direction of travel of the light beam (optical path) caused by exchange of the diffraction optical device or interval change of the plurality of prisms or so forth, or it is not necessary to form the polarization setting member largely in anticipation of its variation.
In addition, in the distribution of amount of light in
Further, the diffractive optical element 21 in this embodiment, however, sets the distribution of amount of light on the pupil plane of the illumination system 12 as a predetermined plane to a predetermined state; the predetermined plane may be the pupil plane Q3 of the projection optical system PL. In this case, if the reticle R is not in existence due to the diffractive optical element 21, the distribution of amount of light is set which is approximately constant at the first area including the axis AX and the eight areas enclosing it, and which is lower at the other areas.
In addition, in the examples of
Next, a second diffractive optical element 22 having different diffractive characteristic is provided to the revolver 24 in
Further, the value of ratio of the outer radius r4 and inner radius r4R (=r4R/r4) of the annular zone area 33R is any value between 0 and 1, as an example, 1/3 annular (r4R/r4=1/3), 1/2 annular (r4R/r4=1/2), 2/3 annular (r4R/r4=2/3) etc. can be used. Further, the preferable range of the radius r4 is similar to that of the radius r1 of the equation (13), and the preferable range of the radius R3 and radius r5 are similar to that of the radius R2 of the equation (10) and radius r2 of the equation (14) respectively.
Further, in this example, since the arranging direction of the 2-dimensional pattern is the X direction and Y direction, the outer four areas 34A to 34D are respectively arranged along the straight lines pass through the optical axis BX and cross by 45 degrees in the X direction (or Y direction).
Further, as an example, the radius r4 of the area 33R, the radius r5 of the areas 34A to 34D, and the radius R3 of the circle 35 are respectively set 0.2-fold, 0.1-fold, and 0.9-fold of the maximum σ value (σ), as follows:
r4=0.3σ, r5=0.1σ (16)
R3=0.9σ (17)
This inventor has evaluated the CD (critical dimension), through the simulation of the computer, which is obtained by transferring a downsizing image of pattern of contact holes with various kinds of pitch arranged on the reticle plane to the wafer through the projection optical system PL, under the distribution of amount of light in which the amount of light becomes constant at the five areas comprising the area 33, and the areas 34A to 34D in
The curves of line graph F1, F2 in
In addition, when the distribution of amount of light in
Further, about the distribution of amount of light in
Further, instead of the distribution of amount of light in
In addition, when, in
Further, in this example, the light distributed at the peripheral areas 34A to 34D in
In order to compare, the simulation result in which the amount of light is set constant at a circular area instead of the center annular zone area 33R in
In
r4=0.2σ r5=0.1 (18)
R3=0.9σ (19)
This inventor have evaluated the CD (critical dimension), through the simulation of the computer, which is obtained by transferring a downsizing image of pattern of contact holes with various kinds of pitch arranged on the reticle plane to the wafer through the projection optical system PL, under the distribution of amount of light in which the amount of light becomes constant at the five areas comprising the area 33, and the areas 34A to 34D in
The dotted line curve 37 in
Accordingly, it is understood that the case using the distribution of amount of light in which the amount of light becomes approximately constant at the nine areas on the pupil plane in
[The Second Embodiment]
Next, the second embodiment according to the present invention will be described accompanying
Further, as shown
With this constitution, by changing the distance between the prisms 71A, 71B, positions (distance from the optical axis BX) of a peripheral area in which the amount of light is great concerning above and bellow of within the paper in
Next, an illumination system and an illumination method will be described in detail. In this embodiment, a reticle RA is loaded on the reticle stage 14 instead of the reticle R in
Further, another pattern 53 for one directional high density pattern is also formed at a position distant from the pattern 52 in the Y direction, in which square aperture patterns 51 with pitch Q larger than the pitch P. The pattern 52 and 53 are actually small pattern whose length of X direction is a few μm or less, various kinds of other pattern (not shown) may be formed on the pattern region PA of the reticle RA. further, as shown in
In order to transfer image of these original patterns on wafer with high accuracy, as shown
NA=β·NAPL (5) (as with the first embodiment)
Further, it is defined that the maximum value among the numerical apertures of the illumination light IL incident to the reticle R from the illumination system 12 is NAIL, the value of ratio (coherence factor) of the maximum numerical aperture NAIL to the numerical aperture NA of the projection optical system PL is called maximum σ value in this embodiment, and maximum σ value is σIL. That is, the illumination light of maximum σ value is the light incident on the reticle R with the maximum angle among the illumination light IL. The maximum σ value (σIL) can be expressed, as follows:
σIL=NAIL/NA=NAIL/(β·NAPL) (6A)
In a pupil plane of an illumination system shown in
σ=NAIL=σIL·NA=σIL·β·NAPL (6B)
Further, in
Further, the annular zone area 54 has ½ annular in which the inner radius is ½ of the outer radius r4, ⅓ annular in which the inner radius is ⅓ of the outer radius r4, or ⅔ annular in which the inner radius is ⅔ of the outer radius r4 and the like. In addition, as shown
In this embodiment, the radii r4, r5 are preferably set within around 0.1σ to 0.2σrespectively, as follows:
0.1σ≦r4≦0.2σ (21)
0.1σ≦r5≦0.2σ (22)
If the values of the radii r4, r5 are smaller than the lower limit of the equation (21), equation (22), the depth of focus of the projection optical system PL becomes shallow for the optical beam in the isolated direction of one directional high density pattern; if the values of the radii r4, r5 are greater than the upper limit of the equation (21), equation (22), the depth of focus of the projection optical system PL becomes shallow for the optical beam in the periodic direction of one directional high density pattern (described bellow in detail). Furthermore, radius r4 and radius r5 are preferably equal, as follows:
r4≈r5 (23)
Further, the areas 55A and 55B of each end in
R3=σ−r5 (24)
In this case, the diffractive characteristic of the diffractive optical element 21 in
In addition, it is allowed that the amount of light distribution obtained by diffraction optical device 22A is set to be approximately the predetermined of light at a region including regions 54, 55A and 55B in
There will be explained, while referring to
On the other hand, as shown in
Further, wavelengths of incident light beams 58, 59 and 60 are taken to as λ, exit angle in the X direction to the normal line of the pattern 52 of the zero-order light 59 is taken to as θ, and exit angle in the X direction to the normal line of the pattern 52 of the zero-order light 60 is taken to as −θ, and in
ΔA=2·P·sin θ=λ (25)
Furthermore, the interval R3 in the X direction between the regions 55A and 55B, and the optical axis BX in
R3=σ−r5=sin θ (26)
In addition, equation (26) corresponds to the case in which focal distance fQ1 at the side of the emission plane Q1 of the partial optical system between the emission plane Q1 (pupil plane) in the illumination system 12 in
P=λ/(2·R3)=λ/{2(σ−r5)} (27A)
In other words, equation (27A) indicates resolution limit of X direction (cycle direction) in the object plane (reticle plane) of the projection exposure apparatus of this embodiment, in which the larger is the interval R3 while making σ larger or while making radius r5 smaller, the less it is possible to make the pitch P to be the resolution limit smaller. The pitch P is converted into pitch β·P as the following equation, which the pitch β·P is length on the wafer. The pitch β·P becomes the resolution limit in the X direction on the image plane (wafer plane) of the projection optical system PL.
β·P=β·λ/{2(σ−r5)} (27B)
In this embodiment, the wavelength λ is set to 193.306 nm. As one example, numerical aperture NAPL at the wafer side of the projection optical system PL is taken to be 0.85, projection scale factor β of the projection optical system PL is taken to be ¼, σIL to be σ value of illumination system 12 is taken to be 0.90, and radius r5 of the regions 55A and 55B in
β·P=146.7(nm) (28)
In addition, if a part of the positive primary light (negative primary light) of the light beam passing through the region 55B (55A) is passed through within the circumference 26, the image of the pattern 52 is imaged, therefore, actual resolution limit β·P at the image plane side becomes smaller value than that of the equation (28).
Concerning this embodiment, the present inventor, in order to obtain the optimum balance between radius r4 of central region 54 and radius r5 of the regions 55A and 55B at both ends in
The curved line 61 in
In addition, in the pattern 53 of the one directional high density contact hole existing in the position spaced from the pattern 52 of
As described above, by employing the amount of light distribution on the pupil plane of this embodiment in
In addition, for instance, when one directional high density pattern with X direction as cyclic direction and one directional high density pattern with Y direction as cyclic direction are formed on the reticle RA of
Furthermore, numerical aperture NAPL at the image side of the projection optical system PL, the projection scale factor β, and the maximum σ value (σIL) of the illumination system 12 are capable of taking arbitrary value without restricting the value to the above described values. For instance, position (distance of the optical axis BX concerning X direction to the region 55B) in the radius direction of the regions 55A and 55B where peripheral amount of light is large among amount of light distribution of
In addition, in the amount of light distribution of
In addition, when the lights which are respectively distributed at three regions having large peripheral amount of light described above while being generated from the light source 1 are non-polarized lights, or the polarizing direction thereof do not agree with the direction of the tangential line, it is preferable that the lights are converted into the light beam of the linear polarized light in which the polarizing direction approximately agrees with the direction of the tangential line upon disposing the polarization setting member such as a half-wave plate or a quarter-wave plate or so forth on the optical path through which the lights distributed at respective regions are passed between the diffraction optical element 21 (deflection member) and the fly eye lens 5, for instance. At this time, it is preferable that there is provided the polarization setting member at incident side of one prism (movable member), which is movable along the optical axis BX and disposed at the most upstream (light source side) between one pair of the prisms described above, for instance, between the movable member and the lens 4, or between the diffraction optical device described above and the lens 4. In this case, it is not necessary to move the polarization setting member in accordance with variation of direction of travel of the light beam (optical path) caused by exchange of the diffraction optical device or interval change of one pair of prisms or so forth, or it is not necessary to form the polarization setting member largely in anticipation of its variation.
In addition, the diffraction optical device 22A in this embodiment sets the amount of light distribution on the pupil plane of the illumination system 12 as the predetermined plane into predetermined condition, however, the predetermined plane is possible to be the pupil plane Q3 of the projection optical system PL of
In addition, in this embodiment, the regions 54, 55A and 55B, which have approximately constant amount of light on the pupil plane, have circular form (or annular form), however, outward form of those regions are possible to be respective oval regions. Further, outward form of each region is possible to be rectangular region as described later, furthermore, outward form of each region is possible to be combined between the circular (or oval) region and the rectangular region.
Next, from the above described equations (27A) or (27B), in the amount of light distribution of the illumination light on the pupil plane of
R4=(σ−t/2)>R3 (29A)
R5=R4+NA−t/2 (29B)
In order to bring the relation of R4>R3 into existence, on the assumption that the equation (22) is already brought into existence, ½ of the width t in the X direction of oval regions 63A and 63B, as one example, is set approximately to next range. Similarly, the radius r6 of the center circular region 62 is set within the range of approximately the degree of two times of t/2.
0.025σ≦t/2≦0.075σ (30)
0.05σ≦r6≦0.16σ (31)
More desirably, t/2 is set to the degree of 0.05σ. The resolution limit P in the X direction on the object plane of the corresponding projection optical system PL to the equation (27A) in these cases becomes smaller than the value of the equation (27A) as the following equation.
P=λ/(2·R4)<λ/(2·R3) (32)
Also, concerning the illumination condition in
The curved line 66 in
In addition, instead of the center circular region 62 in
In addition, in the amount of light distribution of
Furthermore, it is also allowed that distributed light in peripheral regions 63A and 63B in
In addition, when the lights distributed at the peripheral regions 63A and 63B are non-polarized lights, or the polarizing direction thereof do not agree with the longitudinal direction of the tangential line, in the amount of light distribution in
[Third Embodiment]
Next, there will be explained a third embodiment of the present invention referring to
The illumination light IL passed through the aperture stop 42 illuminates a slender illumination region of the pattern plane (reticle plane) of the reticle R as the mask with uniform intensity distribution via the condenser lens system 6, the field stops 7, 8, the image-forming lens system 9, the mirror 10 and the main condenser lens system 11. The illumination system 12 of the present embodiment is constituted by the exposure light source 1, the beam expander 2, the mirror 3, the fly-eye lens 5, the aperture stop 42 (or another aperture stop), the condenser lens system 6, the field stops 7, 8, the image-forming lens system 9, the mirror 10 and the main condenser lens system 11. The constitution in addition to the above is the same as the embodiment in
In this embodiment, the pattern on the reticle R of the object of transfer is the pattern including the contact hole having three-kind of different pitches as shown in
Accordingly, by employing the aperture stop 42, the amount of light distribution on the emission plane Q1 (pupil plane) of the fly-eye lens 5 becomes approximately constant at nine regions shown in
In addition, it is also allowed to use an aperture stop (also numbered 42) in which the center aperture is made the annular aperture 45R as shown in
Further, the aperture stop 44 in
In addition, it is possible to form the amount of light distribution, which is the same as that in
In addition, in the present embodiment, a part other than the aperture is taken to as the light shielding part in the aperture stops 42, 44, however, it is also allowed that a part other than the aperture is taken to as a light attenuating part (a part where the light transmittance is small). In this case, in the amount of light distribution on the pupil plane of the illumination system, like
[Fourth Embodiment]
Next, referring to
Also in this embodiment, it is assumed that the pattern of the reticle RA, being an object of transfer, is a pattern 52 including the pattern of one directional high density contact hole that is arranged in a pitch P in the X direction shown in
Accordingly, by employing the aperture stop 42, the distribution of amount of light on the exit plane Q1 (pupil plane) of the fly-eye lens 5 becomes approximately constant in three areas shown in
In addition, the second aperture stop 42B of
Additionally, in this embodiment, the aperture stop may be arranged not only on the pupil plane of the illumination system 12 or its conjugate plane, but also arranged closely to the incident plane of, for example, the fly-eye lens 5. In addition, in this embodiment, the section other than each of the aperture stops 42A and 42B is assumed to be a shading section; however the section other than its aperture may be assumed to be a light-reducing section (the portion having less quantity of light). In this case, with the distribution of amount of light on the pupil plane of the illumination optical-system 12, the amount of quantity does not become zero on the area other than three areas.
[Fifth Embodiment]
Next, referring to
In addition, the exit plane Q5 of the rod integrator 151 is a conjugate plane with the reticle plane, the fixed field stop 154 is arranged in the vicinity of this exit plane Q5, and closely hereto a movable field stop (not show in the figure) is arranged. In addition hereto, the illumination light to be injected from the rod integrator 151 illuminates a pattern of the reticle, which is not shown in the figure, through the optical system similar to the imaging lens system 9 and the main condenser lens system 11.
Also, in this embodiment, the distribution of amount of light shown in
In addition, also in this embodiment, instead of employing the diffractive optical element 21, the aperture stop provided with nine apertures similar to the aperture stop 42 of
Further, in
In addition, one pair of the interval-variable prisms 71 and 72 (movable prisms) of
Additionally, as the rod integrator 151 can be used the light-transmissive optical member that is of polygonal column shape, for example, of square column shape, of hexagonal column shape, etc. or the reflective member of such hollow metal etc. that is of polygonal column shape or of cylindrical column shape as mentioned above.
In addition, the focus point of the illumination light IL (diffracted light) IL by the condenser lens 153 should be deviated from the incident plane of the rod integrator 151.
Further, in this embodiment, the plane Q4 is assumed to be a predetermined plane (equivalent to the pupil plane of the optical system or its conjugate plane); however the predetermined plane is not limited hereto, and for example, it may be a plane between the rod integrator 151 and the reticle R (or the reticle RA). In addition, when, for example, any of the aperture stops 42 and 44 (or 42A and 42B) is employed instead of the diffractive optical element 21 (or 22A etc.), or in combination thereof, its aperture stop may be arranged in the downstream side (reticle side) of the rod integrator 151.
Additionally, in the above-mentioned first and fifth embodiments, in a case where both of the foregoing diffractive optical element and aperture stop are employed, thereby to set the distribution of amount of light of the illumination IL on the pupil plane of the illumination system, when the diffracted light to be generated from the diffractive optical element is distributed on the aperture stop as shown in
In addition, the aperture stop that is used in conjunction with the foregoing diffractive optical elements does not need always to have five or nine areas shown in
In addition, in the above-mentioned first and fifth embodiments, at least one part of the optical system (4; 152 and 153) that is provided between the diffractive optical element to be arranged within the illumination system and the optical integrator (5; 151) is assumed to be a zoom lens (afocal system), thereby to make the size of the nine or five areas, in which the illumination light IL on the pupil plane of the illumination system is distributed, variable. Further, at least one pair of the foregoing interval-variable prisms may be built in its optical system (4; 152 and 153). At this time, so as to distribute the illumination light IL on the center area (28; 33), each of the vicinities of the apexes of one pair of the prisms is cut out, thereby to assume the part, through which the illumination light IL to be distributed on the center area passes, to be an approximately vertical plane to the light axis BX of the illumination system.
Additionally, in the above-mentioned first and fifth embodiments, by means of the formation optical system (equivalent to the optical member), which is comprised of only a plurality of the diffractive optical elements that are arranged for replacement in the illumination system, or the formation optical system having its plurality of the diffractive optical elements and the optical system, in which at least one of the foregoing zoom lens and one pair of the prisms is built, combined, when the optical integrator is the fly eye lens 5, the intensity distribution of the illumination IL on its incident plane is caused to change, and when the optical integrator is the inner-plane reflection type integrator 151, the range of the incident angle of the illumination light IL that enters the its incident plane is changed, thereby allowing the distribution of amount of light (shape or size of the secondary light source) of the illumination light IL on the pupil plane of the illumination system, i.e. the illumination condition of the reticle to be changed arbitrarily. At this time, a plurality of the diffractive optical element to be hold in the revolver 24 are not limited to only the foregoing diffractive optical elements 21 and 22, and may include at least one out of the four diffractive optical elements to be used, for example, for each of the illuminating having small σ, the annular illumination, the bipolar illumination, and the tetra-polar illumination. In addition, the foregoing aperture stop may be combined with its formation optical system. At this time, for example, one (including the foregoing diffractive optical element etc. except the aperture stop) out of the formation optical system may be arranged in the upstream side of the optical integrator (between the light source 1 and the optical integrator), and its aperture stop may be arranged in the downstream side of the optical integrator.
In addition, in the above-mentioned first, and third, and fifth embodiments, the pitch in the X direction of three patterns 25A to 25C shown in
In addition, in the above-mentioned first, third, and fifth embodiments, by means of a plurality of the foregoing interval-variable prisms, each position of the four or eight areas except the center area, in which the light quantity on the pupil plane is enhanced, is made variable; however the number of its neighboring area is not limited to four or eight, and for example, two is acceptable.
Additionally, in the above-mentioned second, and fifth embodiments, in a case where both of the foregoing diffractive optical member and aperture stop are employed, thereby to set the distribution of amount of light of the illumination light IL on the pupil plane of the illumination system, when the diffracted light that is generated from the diffractive optical system is distributed on the aperture stop as shown in
In addition, the aperture stop, which is used in conjunction with the foregoing diffractive optical element, does not need always to have the three apertures shown in
In addition, in the above-mentioned second and fifth embodiments, at least one part of the optical system (4;152 and 153) that is provided between the diffractive optical element to be arrange within the illumination system and the optical integrator (4; 152 and 153) may be assumed to be a zoom lens (afocal system), thereby make the size of three areas, in which the illumination light IL on the pupil plane of the illumination system is distributed, variable. Further, one pair of the foregoing interval-variable prisms may be built in its optical system (4;152 and 153).
Additionally, in the above-mentioned second and fifth embodiments, by means of the formation optical system (equivalent to the optical member), which is comprised of only a plurality of the diffractive optical elements that are arranged for replacement in the illumination system, or the formation optical system, which has its plurality of the diffractive optical elements and the optical system, in which at least one of the foregoing zoom lens and one pair of the prisms is built, combined, when the optical integrator is the fly eye lens 5, the intensity distribution of the illumination IL on its incident plane is caused to change, and when the optical integrator is the inner-plane-reflection type integrator 151, the range of the incident angle of the illumination light IL that enters its incident plane is caused to change, thereby allowing the distribution of amount of light (shape or size of the secondary light source) of the illumination light IL on the pupil plane of the illumination system, i.e. the illumination condition of the reticle to be changed arbitrarily. At this time, a plurality of the diffractive optical element to be hold in the revolver 24 are not limited only to the foregoing diffractive optical elements 21 and 22, and may include at least one out of the four diffractive optical elements to be used for, for example, each of the small σ illumination, the annular illumination, the bipolar illumination, and the tetra-polar illumination. In addition, its formation optical system and the foregoing aperture stop may be combined.
At this time, for example, one (including the foregoing diffractive optical element etc.) except the aperture stop out of the formation optical system may be arranged in the upstream side of the optical integrator (between the light source 1 and the optical integrator), and its aperture stop may be arranged in the downstream side of the optical integrator.
In addition, in the above-mentioned second, fourth, and fifth embodiments, the pattern being an object of transfer, is the pattern of the one directional high density contact hole (one directional high density contact hole); however the pattern, being an object of transfer, can be regarded as a pattern that is substantially isolated in one direction, and it is apparent that any pattern is acceptable so log as it is a pattern including the pattern to be periodically formed in the direction intersecting it (for example, orthogonal hereto).
Further, in the above-mentioned second, fourth, and fifth embodiments and its modified examples, three areas in which the amount of light is enhanced with the distribution of amount of light of the illumination light IL on the pupil plane of the illumination light system 12, which is substantially conjugate with the pupil plane Q3 of the projection optical system PL, or its conjugate plane (or predetermined plane), are adapted to be arranged along a straight line, which is parallel to the periodical direction of the foregoing one directional high density pattern, on its predetermined plane, and passes through the optical axis of the illumination optical light system, however its three areas do not need always to be arranged on the identical straight line. For example, out of the three areas, at least one of the remaining two areas except the center area may be deviated from the above-mentioned straight line in the Y direction, and its two areas are caused to differ from each other in the distances to the optical axis of the illumination system with regard to the Y direction light.
In addition, in the above-mentioned second, fourth, and fifth embodiments and its modified examples, as shown in
Moreover, in the above-mentioned second, fourth, and fifth embodiments and its modified examples, while the positions of the remaining areas except the center area out of the foregoing three areas, i.e. the distances to the optical axis of the illumination system with regard to the direction (X direction) parallel to the periodical direction of the foregoing one directional high density pattern are kept approximately equal, they may be made variable responding to its pitch.
In addition, in each of the above-mentioned embodiments, the formation optical system to be employed for altering the illumination condition of the reticle is adapted to include a plurality of the diffractive optical elements; however instead of these diffractive optical elements, for example, a plurality of the lens elements having different aberrations may be employed for replacement. Further, in case of employing the first and second prisms 71 and 72 of which the periphery forms a cone, altering the interval of the prisms 71 and 72, i.e. the distance of each area, in which the intensity on the pupil plane of the illumination system 12 is enhanced, to the optical axis BX allows the shape of each area to be changed responding to its alteration. Thereupon, when its change quantity exceeds a predetermined allowable value, for example, the foregoing zoom lens, the foregoing cylindrical lens or the like may be employed, thereby to suppress (lessen) a change in its shape.
In addition, the projection exposure apparatus of
Additionally, in each of the above-mentioned embodiments, in a case of employing vacuum ultraviolet light having a frequency of, for example, less than 180 nm or something like it as the illumination IL, the optical material of the refractive member such as the substrate of the diffractive optical elements 21, 22, 22A, and 22B, the glass substrate composing the reticles R and RA, and the lens composing the projection optical system PL is preferably formed of the material selected from a group of fluoride crystal such as quartzite (CaF2), magnesium fluoride, and lithium fluoride, quartz glass having fluorine and hydrogen doped, quartz glass of which the structure determining temperature is 1200 K or less, and yet of which the hydroxyl group concentration is 1000 ppm or more (for example, disclosed in Japanese Patent No. 2770224 publication filed by this applicant), quartz glass of which the structure determining temperature is 1200 K or less, and yet of which the hydrogen molecule concentration is 1×1017molecules/cm3 or more, quartz glass of which the structure determining temperature is 1200 K or less, and yet of which the base concentration is 500 ppm or less, and quartz glass of which the structure determining temperature is 1200 K or less, of which the hydrogen molecule concentration is 1×1017 molecules/cm3 or more and yet of which the chlorine concentration is 50 ppm or less (For example, disclosed in Japanese Patent No. 2936138 publication filed by this applicant(corresponding to U.S. Pat. No. 5,908,482)). On the other hand, in case of employing the ArF excimer laser beam, the KrF excimer laser beam or the like, it is possible to employ the synthesized quarts in addition to each of the above-mentioned substances as its optical material.
Next, one example of the process for fabricating the semiconductor device using the projection exposure apparatus of the above-mentioned embodiments will be explained with a reference to
Next, in a step S16, the photo resist is coated on the wafer W (step S10), and thereafter, in a next step S18, the reticle R2 (for example, the reticle RA of
The exposure step to the pattern formation step described above (step S16 to step S20) are repeated by the number of times necessary for fabricating the desired semiconductor device. In addition hereto, through the dicing step of cutting each chip CP off the wafer W one by one (step S22), the bonding step, the packaging step (step S24) etc. the semiconductor device SP is fabricated as a product.
In addition, the illumination system to be composed of a plurality of lens and the projection optical system are built in the main frame of the exposure apparatus to make an optical adjustment, and the reticle stage and the wafer stage to be composed of a number of machine parts are mounted on the main frame of the exposure apparatus to connect the wiring cables and the pipes, and to further make a comprehensive adjustment (electric adjustment, operational confirmation, etc.), thereby enabling the projection exposure apparatus of the above-mentioned embodiments to be manufactured. Additionally, the projection exposure apparatus is desirably manufactured in a clean room in which the temperature and the cleanliness are controlled.
In addition, needless to say, the present invention can apply not only to the case of making an exposure with scan exposure type of the projection exposure apparatus, but also to the case of making an exposure with the batch exposure type of the projection exposure apparatus such as the stepper. The scale factor of the projection optical system in these cases may be a one-to-one factor, and may be an enlarged scale factor. Further, the present invention can apply, for example, to the case of making an exposure with the liquid-immersion type of projection exposure apparatus disclosed in international Publication Number (WO) 99/49504 etc., in which liquid LQ is provided between the projection system P1 and the wafer W (see
Additionally, the application of the liquid-penetration type of the projection exposure apparatus of the above-mentioned embodiment is not limited to that of the exposure apparatus for fabricating the semiconductor element, and for example, it can be widely applied for the exposure apparatus for the display apparatus such as the liquid display element or the plasma display, which is formed on the angular glass plate, or the exposure apparatus for fabricating the various devices such as the imaging element (CCD etc.), the micro-machine, the thinly coated magnetic head, and the DNA chip. Further, the present invention can apply to the exposure step (exposure apparatus) in fabricating the reticle having the reticle pattern of the various devices using the photolithography step.
The aforementioned disclosures of all the United States patents etc. are incorporated herein by reference, as far as the national laws of the designated states designated in the present international application or the elected states elected in the present international application permit.
The present invention is not limited to the above-mentioned embodiments, and the invention may, as a matter of course, be embodied in various forms without departing from the gist of the present invention. Furthermore, the entire disclosure of Japanese Patent Applications 2003-105920 filed on Apr. 9, 2003, 2003-299628 filed on Aug. 25, 2003, 2003-307806 filed on Aug. 29, 2003, 2003-329194 filed on Sep. 19, 2003, 2003-329309 filed on Sep. 22, 2003 including description, claims, drawings and abstract are incorporated herein by reference in its entirety.
In addition, in accordance with the method of fabricating the device, the device including the various patterns can be manufactured with a high precision and yet with a high throughput.
In addition, in the method of fabricating the device of the present invention, when the distribution of amount of light on a predetermined plane with regard to the illumination system is set so that the amount of light is enlarged in a predetermined three areas, the device including the one-direction mass pattern can be fabricated at a high precision.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2003-105920 | Apr 2003 | JP | national |
| 2003-299628 | Aug 2003 | JP | national |
| 2003-307806 | Aug 2003 | JP | national |
| 2003-329194 | Sep 2003 | JP | national |
| 2003-329309 | Sep 2003 | JP | national |
This is a continuation of U.S. application Ser. No. 11/902,282 filed Sep. 20, 2007, which is a continuation of U.S. application Ser. No. 11/246,642 filed Oct. 11, 2005, which is a Continuation of International Application No. PCT/JP2004/004522 filed Mar. 30, 2004, which claims priority to Japanese Application No. 2003-329194 filed on Sep. 19, 2003, Japanese Application No. 2003-329309 filed on Sep. 22, 2003, Japanese Application No. 2003-307806 filed on Aug. 29, 2003, Japanese Application No. 2003-299628 filed on Aug. 25, 2003 and Japanese Application No. 2003-105920 filed on Apr. 9, 2003. The entire disclosures of the prior applications are hereby incorporated herein by reference in their entirety.
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| Number | Date | Country |
|---|---|---|
| 1453645 | May 2003 | CN |
| 1501175 | Jun 2004 | CN |
| 1573571 | Feb 2005 | CN |
| 206 607 | Feb 1984 | DE |
| 221 563 | Apr 1985 | DE |
| 224 448 | Jul 1985 | DE |
| 242 880 | Feb 1987 | DE |
| 100 29 938 | Jul 2001 | DE |
| 101 23 725 | Nov 2002 | DE |
| 102 06 061 | Sep 2003 | DE |
| 103 43 333 | Apr 2005 | DE |
| 10 2006 015213 | Oct 2007 | DE |
| 0 023 231 | Feb 1981 | EP |
| 0 208 552 | Jan 1987 | EP |
| 0 230 931 | Aug 1987 | EP |
| 0 564 264 | Oct 1993 | EP |
| 0 656 555 | Jun 1995 | EP |
| 0 764 858 | Aug 1996 | EP |
| 0 744 664 | Nov 1996 | EP |
| 0 779 530 | Jun 1997 | EP |
| 0 937 999 | Aug 1999 | EP |
| 1 014 196 | Jun 2000 | EP |
| 1 071 292 | Jan 2001 | EP |
| 1069600 | Jan 2001 | EP |
| 1 139 521 | Oct 2001 | EP |
| 1 211 561 | Jun 2002 | EP |
| 1 260 849 | Nov 2002 | EP |
| 1 280 007 | Jan 2003 | EP |
| 1 489 462 | Feb 2004 | EP |
| 1 577 709 | Sep 2005 | EP |
| 1 662 553 | May 2006 | EP |
| 1 674 935 | Jun 2006 | EP |
| 1 681 710 | Jul 2006 | EP |
| 1 693 885 | Aug 2006 | EP |
| 1 798 758 | Jun 2007 | EP |
| 1 840 945 | Oct 2007 | EP |
| 1 953 805 | Aug 2008 | EP |
| 2 474 708 | Jul 1981 | FR |
| 856621 | Dec 1960 | GB |
| A-44-4993 | Feb 1969 | JP |
| A-56-6666 | Jan 1981 | JP |
| A-57-117238 | Jul 1982 | JP |
| A-57-152129 | Sep 1982 | JP |
| A-57-153433 | Sep 1982 | JP |
| A-58-49932 | Mar 1983 | JP |
| U-58-45502 | Mar 1983 | JP |
| A-58-115945 | Jul 1983 | JP |
| A-58-202448 | Nov 1983 | JP |
| A-59-19912 | Feb 1984 | JP |
| A-59-155843 | Sep 1984 | JP |
| A-59-226317 | Dec 1984 | JP |
| A-61-44429 | Mar 1986 | JP |
| A-61-45923 | Mar 1986 | JP |
| A-61-091662 | May 1986 | JP |
| A-61-91662 | May 1986 | JP |
| U-61-94342 | Jun 1986 | JP |
| A-61-156736 | Jul 1986 | JP |
| A-61-196532 | Aug 1986 | JP |
| A-61-217434 | Sep 1986 | JP |
| A-61-251025 | Nov 1986 | JP |
| A-61-270049 | Nov 1986 | JP |
| A-62-2539 | Jan 1987 | JP |
| A-62-2540 | Jan 1987 | JP |
| A-62-17705 | Jan 1987 | JP |
| A-62-65326 | Mar 1987 | JP |
| A-62-100161 | May 1987 | JP |
| A-62-120026 | Jun 1987 | JP |
| A-62-121417 | Jun 1987 | JP |
| A-62-122215 | Jun 1987 | JP |
| A-62-153710 | Jul 1987 | JP |
| A-62-183522 | Aug 1987 | JP |
| A-62-188316 | Aug 1987 | JP |
| A-62-203526 | Sep 1987 | JP |
| A-62-265722 | Nov 1987 | JP |
| A-63-12134 | Jan 1988 | JP |
| A-63-36526 | Feb 1988 | JP |
| A-63-73628 | Apr 1988 | JP |
| A-63-128713 | Jun 1988 | JP |
| A-63-131008 | Jun 1988 | JP |
| A-63-141313 | Jun 1988 | JP |
| A-63-157419 | Jun 1988 | JP |
| A-63-160192 | Jul 1988 | JP |
| A-63-231217 | Sep 1988 | JP |
| A-63-275912 | Nov 1988 | JP |
| A-63-292005 | Nov 1988 | JP |
| A-64-18002 | Jan 1989 | JP |
| A-64-26704 | Feb 1989 | JP |
| A-64-68926 | Mar 1989 | JP |
| A-1-91419 | Apr 1989 | JP |
| A-1-115033 | May 1989 | JP |
| A-1-147516 | Jun 1989 | JP |
| A-1-202833 | Aug 1989 | JP |
| A-1-214042 | Aug 1989 | JP |
| U-1-127379 | Aug 1989 | JP |
| A-1-255404 | Oct 1989 | JP |
| A-1-258550 | Oct 1989 | JP |
| A-1-276043 | Nov 1989 | JP |
| A-1-278240 | Nov 1989 | JP |
| A-1-286478 | Nov 1989 | JP |
| A-1-292343 | Nov 1989 | JP |
| A-1-314247 | Dec 1989 | JP |
| A-1-319964 | Dec 1989 | JP |
| A-2-42382 | Feb 1990 | JP |
| A-2-65149 | Mar 1990 | JP |
| A-2-65222 | Mar 1990 | JP |
| A-2-97239 | Apr 1990 | JP |
| A-2-106917 | Apr 1990 | JP |
| A-2-116115 | Apr 1990 | JP |
| A-2-139146 | May 1990 | JP |
| A-2-166717 | Jun 1990 | JP |
| A-2-261073 | Oct 1990 | JP |
| A-2-264901 | Oct 1990 | JP |
| A-2-285320 | Nov 1990 | JP |
| A-2-287308 | Nov 1990 | JP |
| A-2-298431 | Dec 1990 | JP |
| A-2-311237 | Dec 1990 | JP |
| A-3-41399 | Feb 1991 | JP |
| A-3-64811 | Mar 1991 | JP |
| A-3-72298 | Mar 1991 | JP |
| A-3-94445 | Apr 1991 | JP |
| A-3-132663 | Jun 1991 | JP |
| A-3-134341 | Jun 1991 | JP |
| A-3-167419 | Jul 1991 | JP |
| A-3-168640 | Jul 1991 | JP |
| A-3-211812 | Sep 1991 | JP |
| A-3-263810 | Nov 1991 | JP |
| A-4-11613 | Jan 1992 | JP |
| A-4-32154 | Feb 1992 | JP |
| A-4-065603 | Mar 1992 | JP |
| A-4-96315 | Mar 1992 | JP |
| A-4-101148 | Apr 1992 | JP |
| A-4-130710 | May 1992 | JP |
| A-4-132909 | May 1992 | JP |
| A-4-133414 | May 1992 | JP |
| A-4-152512 | May 1992 | JP |
| A-4-179115 | Jun 1992 | JP |
| A-4-186244 | Jul 1992 | JP |
| U-4-80052 | Jul 1992 | JP |
| A-4-211110 | Aug 1992 | JP |
| A-4-225357 | Aug 1992 | JP |
| A-4-235558 | Aug 1992 | JP |
| A-4-265805 | Sep 1992 | JP |
| A-4-273245 | Sep 1992 | JP |
| A-4-273427 | Sep 1992 | JP |
| A-4-280619 | Oct 1992 | JP |
| A-4-282539 | Oct 1992 | JP |
| A-4-296092 | Oct 1992 | JP |
| A-4-297030 | Oct 1992 | JP |
| A-4-305915 | Oct 1992 | JP |
| A-4-305917 | Oct 1992 | JP |
| U-4-117212 | Oct 1992 | JP |
| A-4-330961 | Nov 1992 | JP |
| A-4-343307 | Nov 1992 | JP |
| A-4-350925 | Dec 1992 | JP |
| A-5-21314 | Jan 1993 | JP |
| A-5-45886 | Feb 1993 | JP |
| A-5-62877 | Mar 1993 | JP |
| A-5-90128 | Apr 1993 | JP |
| A-5-109601 | Apr 1993 | JP |
| A-5-127086 | May 1993 | JP |
| A-5-129184 | May 1993 | JP |
| A-5-134230 | May 1993 | JP |
| A-5-160002 | Jun 1993 | JP |
| A-5-175098 | Jul 1993 | JP |
| A-5-199680 | Aug 1993 | JP |
| A-5-217837 | Aug 1993 | JP |
| A-5-217840 | Aug 1993 | JP |
| A-5-226225 | Sep 1993 | JP |
| A-5-241324 | Sep 1993 | JP |
| A-5-243364 | Sep 1993 | JP |
| A-5-259069 | Oct 1993 | JP |
| A-5-283317 | Oct 1993 | JP |
| A-5-304072 | Nov 1993 | JP |
| A-5-319774 | Dec 1993 | JP |
| A-5-323583 | Dec 1993 | JP |
| A 5-326370 | Dec 1993 | JP |
| A-6-29204 | Feb 1994 | JP |
| A-6-42918 | Feb 1994 | JP |
| A-6-53120 | Feb 1994 | JP |
| A-6-97269 | Apr 1994 | JP |
| A-6-104167 | Apr 1994 | JP |
| A-6-118623 | Apr 1994 | JP |
| A-6-120110 | Apr 1994 | JP |
| B2-6-29102 | Apr 1994 | JP |
| A-6-36054 | May 1994 | JP |
| A-6-124126 | May 1994 | JP |
| A-6-124872 | May 1994 | JP |
| A-6-124873 | May 1994 | JP |
| A-6-140306 | May 1994 | JP |
| A-6-148399 | May 1994 | JP |
| A-6-163350 | Jun 1994 | JP |
| A-6-168866 | Jun 1994 | JP |
| A-6-177007 | Jun 1994 | JP |
| A-6-181157 | Jun 1994 | JP |
| A-6-186025 | Jul 1994 | JP |
| A-6-188169 | Jul 1994 | JP |
| A-6-196388 | Jul 1994 | JP |
| A-6-204113 | Jul 1994 | JP |
| A-6-204121 | Jul 1994 | JP |
| A-6-229741 | Aug 1994 | JP |
| A-6-241720 | Sep 1994 | JP |
| A-6-244082 | Sep 1994 | JP |
| A-6-267825 | Sep 1994 | JP |
| A-06-281869 | Oct 1994 | JP |
| A-6-283403 | Oct 1994 | JP |
| A-06-291023 | Oct 1994 | JP |
| A-6-310399 | Nov 1994 | JP |
| A-6-325894 | Nov 1994 | JP |
| A-6-326174 | Nov 1994 | JP |
| A-6-349701 | Dec 1994 | JP |
| A-7-57992 | Mar 1995 | JP |
| A-7-57993 | Mar 1995 | JP |
| A-7-69621 | Mar 1995 | JP |
| A-7-92424 | Apr 1995 | JP |
| A-7-122469 | May 1995 | JP |
| A-7-132262 | May 1995 | JP |
| A-7-134955 | May 1995 | JP |
| A-7-135158 | May 1995 | JP |
| A-7-135165 | May 1995 | JP |
| A-7-147223 | Jun 1995 | JP |
| A-7-161622 | Jun 1995 | JP |
| A-7-167998 | Jul 1995 | JP |
| A-7-168286 | Jul 1995 | JP |
| A-7-174974 | Jul 1995 | JP |
| A-7-176468 | Jul 1995 | JP |
| A-7-183201 | Jul 1995 | JP |
| A-7-183214 | Jul 1995 | JP |
| A-7-190741 | Jul 1995 | JP |
| A-7-201723 | Aug 1995 | JP |
| A-7-220989 | Aug 1995 | JP |
| A-7-220990 | Aug 1995 | JP |
| A-7-220995 | Aug 1995 | JP |
| A-7-221010 | Aug 1995 | JP |
| A-7-230945 | Aug 1995 | JP |
| A-7-239212 | Sep 1995 | JP |
| A-7-243814 | Sep 1995 | JP |
| A-7-245258 | Sep 1995 | JP |
| A-7-263315 | Oct 1995 | JP |
| A-7-283119 | Oct 1995 | JP |
| A-7-297272 | Nov 1995 | JP |
| A-7-307268 | Nov 1995 | JP |
| A-7-318847 | Dec 1995 | JP |
| A-7-335748 | Dec 1995 | JP |
| A-8-10971 | Jan 1996 | JP |
| A-8-17709 | Jan 1996 | JP |
| A-8-22948 | Jan 1996 | JP |
| A-8-37149 | Feb 1996 | JP |
| A-8-37227 | Feb 1996 | JP |
| A-8-46751 | Feb 1996 | JP |
| A-8-63231 | Mar 1996 | JP |
| A-8-115868 | May 1996 | JP |
| A-8-136475 | May 1996 | JP |
| A-8-151220 | Jun 1996 | JP |
| A-8-162397 | Jun 1996 | JP |
| A-8-166475 | Jun 1996 | JP |
| A-8-171054 | Jul 1996 | JP |
| A-8-195375 | Jul 1996 | JP |
| A-8-203803 | Aug 1996 | JP |
| A-8-279549 | Oct 1996 | JP |
| A-8-288213 | Nov 1996 | JP |
| A-8-297699 | Nov 1996 | JP |
| A-8-316125 | Nov 1996 | JP |
| A-8-316133 | Nov 1996 | JP |
| A-8-330224 | Dec 1996 | JP |
| A-8-334695 | Dec 1996 | JP |
| A-8-335552 | Dec 1996 | JP |
| A-9-7933 | Jan 1997 | JP |
| A-9-15834 | Jan 1997 | JP |
| A-9-22121 | Jan 1997 | JP |
| A-9-61686 | Mar 1997 | JP |
| A-9-82626 | Mar 1997 | JP |
| A-9-83877 | Mar 1997 | JP |
| A-9-92593 | Apr 1997 | JP |
| A-9-108551 | Apr 1997 | JP |
| A-9-115794 | May 1997 | JP |
| A-9-134870 | May 1997 | JP |
| A-9-148406 | Jun 1997 | JP |
| A-9-151658 | Jun 1997 | JP |
| A-9-160004 | Jun 1997 | JP |
| A-09-160219 | Jun 1997 | JP |
| A-9-160219 | Jun 1997 | JP |
| A-9-162106 | Jun 1997 | JP |
| A-9-178415 | Jul 1997 | JP |
| A-9-184787 | Jul 1997 | JP |
| A-9-184918 | Jul 1997 | JP |
| A-9-186082 | Jul 1997 | JP |
| A-9-190969 | Jul 1997 | JP |
| A-9-213129 | Aug 1997 | JP |
| A 9-219358 | Aug 1997 | JP |
| A-9-219358 | Aug 1997 | JP |
| A-9-227294 | Sep 1997 | JP |
| A-9-232213 | Sep 1997 | JP |
| A-9-243892 | Sep 1997 | JP |
| A-9-246672 | Sep 1997 | JP |
| A-9-251208 | Sep 1997 | JP |
| A-9-281077 | Oct 1997 | JP |
| A-9-325255 | Dec 1997 | JP |
| A-9-326338 | Dec 1997 | JP |
| A-10-002865 | Jan 1998 | JP |
| A-10-3039 | Jan 1998 | JP |
| A-10-20195 | Jan 1998 | JP |
| A-10-32160 | Feb 1998 | JP |
| A-10-38517 | Feb 1998 | JP |
| A-10-38812 | Feb 1998 | JP |
| A-10-55713 | Feb 1998 | JP |
| A-10-62305 | Mar 1998 | JP |
| A-10-64790 | Mar 1998 | JP |
| A-10-79337 | Mar 1998 | JP |
| A-10-82611 | Mar 1998 | JP |
| A-10-503300 | Mar 1998 | JP |
| A-10-92735 | Apr 1998 | JP |
| A-10-97969 | Apr 1998 | JP |
| A-10-104427 | Apr 1998 | JP |
| A-10-116760 | May 1998 | JP |
| A-10-135099 | May 1998 | JP |
| A-H10-116778 | May 1998 | JP |
| A-H10-116779 | May 1998 | JP |
| A-H10-125572 | May 1998 | JP |
| A-H10-134028 | May 1998 | JP |
| A-10-163099 | Jun 1998 | JP |
| A-10-163302 | Jun 1998 | JP |
| A-10-169249 | Jun 1998 | JP |
| A-10-189427 | Jul 1998 | JP |
| A-10-189700 | Jul 1998 | JP |
| A-10-206714 | Aug 1998 | JP |
| A-10-208993 | Aug 1998 | JP |
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| A-10-228661 | Aug 1998 | JP |
| A-10-255319 | Sep 1998 | JP |
| A-10-294268 | Nov 1998 | JP |
| A-10-303114 | Nov 1998 | JP |
| A-10-340846 | Dec 1998 | JP |
| A-11-3849 | Jan 1999 | JP |
| A-11-3856 | Jan 1999 | JP |
| A-11-8194 | Jan 1999 | JP |
| A-11-14876 | Jan 1999 | JP |
| A-11-16816 | Jan 1999 | JP |
| A-11-40657 | Feb 1999 | JP |
| A-11-54426 | Feb 1999 | JP |
| A-11-74185 | Mar 1999 | JP |
| A-11-87237 | Mar 1999 | JP |
| A-11-111601 | Apr 1999 | JP |
| A-11-111818 | Apr 1999 | JP |
| A-11-111819 | Apr 1999 | JP |
| A-11-121328 | Apr 1999 | JP |
| A-11-135400 | May 1999 | JP |
| A-11-142556 | May 1999 | JP |
| A-11-150062 | Jun 1999 | JP |
| A-11-159571 | Jun 1999 | JP |
| A-11-162831 | Jun 1999 | JP |
| A-11-163103 | Jun 1999 | JP |
| A-11-164543 | Jun 1999 | JP |
| A-11-166990 | Jun 1999 | JP |
| A-11-98 | Jul 1999 | JP |
| A-11-176727 | Jul 1999 | JP |
| A-11-176744 | Jul 1999 | JP |
| A-11-195602 | Jul 1999 | JP |
| A-11-204390 | Jul 1999 | JP |
| A-11-204432 | Jul 1999 | JP |
| A-11-218466 | Aug 1999 | JP |
| A-11-219882 | Aug 1999 | JP |
| A-11-233434 | Aug 1999 | JP |
| A-11-238680 | Aug 1999 | JP |
| A-11-239758 | Sep 1999 | JP |
| A-11-260686 | Sep 1999 | JP |
| A-11-260791 | Sep 1999 | JP |
| A-11-264756 | Sep 1999 | JP |
| A-11-283903 | Oct 1999 | JP |
| A-11-288879 | Oct 1999 | JP |
| A-11-307610 | Nov 1999 | JP |
| A-11-312631 | Nov 1999 | JP |
| A-11-354624 | Dec 1999 | JP |
| A-2000-3874 | Jan 2000 | JP |
| A-2000-12453 | Jan 2000 | JP |
| A-2000-21742 | Jan 2000 | JP |
| A-2000-21748 | Jan 2000 | JP |
| A-2000-29202 | Jan 2000 | JP |
| A-2000-32403 | Jan 2000 | JP |
| A-2000-36449 | Feb 2000 | JP |
| A-2000-58436 | Feb 2000 | JP |
| A-2000-58441 | Feb 2000 | JP |
| A-2000-81320 | Mar 2000 | JP |
| A-2000-92815 | Mar 2000 | JP |
| A-2000-97616 | Apr 2000 | JP |
| A-2000-106340 | Apr 2000 | JP |
| A-2000-114157 | Apr 2000 | JP |
| A-2000-121491 | Apr 2000 | JP |
| A-2000-147346 | May 2000 | JP |
| A-2000-154251 | Jun 2000 | JP |
| A-2000-180371 | Jun 2000 | JP |
| A-2000-206279 | Jul 2000 | JP |
| A-2000-208407 | Jul 2000 | JP |
| A-2000-240717 | Sep 2000 | JP |
| A-2000-243684 | Sep 2000 | JP |
| A-2000-252201 | Sep 2000 | JP |
| A-2000-283889 | Oct 2000 | JP |
| A-2000-286176 | Oct 2000 | JP |
| A-2000-311853 | Nov 2000 | JP |
| A-2000-323403 | Nov 2000 | JP |
| A-2001-7015 | Jan 2001 | JP |
| A-2001-20951 | Jan 2001 | JP |
| A-2001-23996 | Jan 2001 | JP |
| A-2001-37201 | Feb 2001 | JP |
| A-2001-44097 | Feb 2001 | JP |
| A-2001-74240 | Mar 2001 | JP |
| A-2001-83472 | Mar 2001 | JP |
| A-2001-85307 | Mar 2001 | JP |
| A-2001-97734 | Apr 2001 | JP |
| A-2001-100311 | Apr 2001 | JP |
| A-2001-110707 | Apr 2001 | JP |
| A-2001-118773 | Apr 2001 | JP |
| A-2001-135560 | May 2001 | JP |
| A-2001-144004 | May 2001 | JP |
| A-2001-167996 | Jun 2001 | JP |
| A-2001-176766 | Jun 2001 | JP |
| A-2001-203140 | Jul 2001 | JP |
| A-2001-218497 | Aug 2001 | JP |
| A-2001-228401 | Aug 2001 | JP |
| A-2001-228404 | Aug 2001 | JP |
| A-2001-230323 | Aug 2001 | JP |
| A-2001-242269 | Sep 2001 | JP |
| A-2001-265581 | Sep 2001 | JP |
| A-2001-267227 | Sep 2001 | JP |
| A-2001-272764 | Oct 2001 | JP |
| A-2001-274083 | Oct 2001 | JP |
| A-2001-282526 | Oct 2001 | JP |
| A-2001-284228 | Oct 2001 | JP |
| A-2001-296105 | Oct 2001 | JP |
| A-2001-297976 | Oct 2001 | JP |
| A-2001-304332 | Oct 2001 | JP |
| A-2001-307982 | Nov 2001 | JP |
| A-2001-307983 | Nov 2001 | JP |
| A-2001-313250 | Nov 2001 | JP |
| A-2001-338868 | Dec 2001 | JP |
| A-2001-345262 | Dec 2001 | JP |
| A-2002-14005 | Jan 2002 | JP |
| A-2002-15978 | Jan 2002 | JP |
| A-2002-16124 | Jan 2002 | JP |
| B2-3246615 | Jan 2002 | JP |
| A-2002-43213 | Feb 2002 | JP |
| A-2002-57097 | Feb 2002 | JP |
| 2002-075859 | Mar 2002 | JP |
| A-2002-66428 | Mar 2002 | JP |
| A-2002-71513 | Mar 2002 | JP |
| A-2002-75816 | Mar 2002 | JP |
| A-2002-075816 | Mar 2002 | JP |
| A-2002-075835 | Mar 2002 | JP |
| A-2002-91922 | Mar 2002 | JP |
| A-2002-93686 | Mar 2002 | JP |
| A-2002-93690 | Mar 2002 | JP |
| A-2002-100561 | Apr 2002 | JP |
| A-2002-118058 | Apr 2002 | JP |
| A-2002-141270 | May 2002 | JP |
| A-2002-158157 | May 2002 | JP |
| A-2002-162655 | Jun 2002 | JP |
| A-2002-170495 | Jun 2002 | JP |
| A-2002-190438 | Jul 2002 | JP |
| A-2002-195912 | Jul 2002 | JP |
| A-2002-198284 | Jul 2002 | JP |
| A-2002-202221 | Jul 2002 | JP |
| A-2002-203763 | Jul 2002 | JP |
| A-2002-208562 | Jul 2002 | JP |
| A-2002-520810 | Jul 2002 | JP |
| A-2002-222754 | Aug 2002 | JP |
| A-2002-227924 | Aug 2002 | JP |
| A-2002-231619 | Aug 2002 | JP |
| A-2002-258487 | Sep 2002 | JP |
| A-2002-261004 | Sep 2002 | JP |
| A-2002-263553 | Sep 2002 | JP |
| A-2002-277742 | Sep 2002 | JP |
| A-2002-289505 | Oct 2002 | JP |
| A-2002-305140 | Oct 2002 | JP |
| A-2002-323658 | Nov 2002 | JP |
| A-2002-324743 | Nov 2002 | JP |
| A-2002-329651 | Nov 2002 | JP |
| A-2002-334836 | Nov 2002 | JP |
| 2002-359176 | Dec 2002 | JP |
| A-2002-353105 | Dec 2002 | JP |
| A-2002-357715 | Dec 2002 | JP |
| A-2002-359174 | Dec 2002 | JP |
| A-2002-362737 | Dec 2002 | JP |
| A-2002-365783 | Dec 2002 | JP |
| A-2002-367523 | Dec 2002 | JP |
| A-2002-367886 | Dec 2002 | JP |
| A-2002-373849 | Dec 2002 | JP |
| A-2003-15040 | Jan 2003 | JP |
| A-2003-015314 | Jan 2003 | JP |
| A-2003-17003 | Jan 2003 | JP |
| A-2003-17404 | Jan 2003 | JP |
| A-2003-28673 | Jan 2003 | JP |
| A-2003-35822 | Feb 2003 | JP |
| A-2003-43223 | Feb 2003 | JP |
| A-2003-45219 | Feb 2003 | JP |
| A-2003-45712 | Feb 2003 | JP |
| A-2003-59799 | Feb 2003 | JP |
| A-2003-59803 | Feb 2003 | JP |
| A-2003-059821 | Feb 2003 | JP |
| A-2003-59821 | Feb 2003 | JP |
| A-2003-59826 | Feb 2003 | JP |
| 2003-068607 | Mar 2003 | JP |
| A-2003-68600 | Mar 2003 | JP |
| A-2003-068604 | Mar 2003 | JP |
| A-2003-75703 | Mar 2003 | JP |
| A-2003-81654 | Mar 2003 | JP |
| A-2003-84445 | Mar 2003 | JP |
| A-2003-90978 | Mar 2003 | JP |
| A-2003-98651 | Apr 2003 | JP |
| A-2003-100597 | Apr 2003 | JP |
| A-2003-114387 | Apr 2003 | JP |
| A-2003-124095 | Apr 2003 | JP |
| A-2003-130132 | May 2003 | JP |
| A-2003-149363 | May 2003 | JP |
| A-2003-151880 | May 2003 | JP |
| A-2003-161882 | Jun 2003 | JP |
| A-2003-163158 | Jun 2003 | JP |
| A-2003-166856 | Jun 2003 | JP |
| A2003-173957 | Jun 2003 | JP |
| A-2003-188087 | Jul 2003 | JP |
| A-2003-224961 | Aug 2003 | JP |
| A-2003-229347 | Aug 2003 | JP |
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| Nov. 13, 2013 Office Action issued in U.S. Appl. No. 13/889,965. |
| Nov. 20, 2013 Office Action issued in U.S. Appl. No. 12/289,515. |
| Oct. 22, 2013, H.G.Oh, “Notarial Certificate of affiant Professor H.G.Oh” (with English translation). |
| Oct. 8, 2013, “Declaration of Dr. Michael Totzeck” (with English translation). |
| “Korean Patent Office Guidelines for Examination,” 2010 (with partial translation). |
| Oct. 25, 2013 Preparatory Document (2-1), Korean Invalidation Action 2013HEO03937 (with English translation). |
| Oct. 25, 2013 Preparatory Document (2-2), Korean Invalidation Action 2013HEO03937 (with English translation). |
| Dec. 13, 2013 Office Action issued in European Patent Application No. 09015058.2. |
| Dec. 4, 2013 Office Action issued in Chinese Patent Application No. 200710110950.X (with English translation). |
| Dec. 17, 2013 Office Action issued in Korean Patent Application No. 10-2013-7026632 (with English translation). |
| Dec. 18, 2013 Office Action issued in Korean Patent Application No. 10-2012-7034127 (with English translation.). |
| May 15, 2014 Decision Rendered by Division II of Korean Patent Court for Korean Patent Invalidation Action No. 2013HEO3920 (with English translation). |
| May 15, 2014 Decision Rendered by Division II of Korean Patent Court for Korean Patent Invalidation Action No. 2013HEO3937 (with English translation). |
| May 15, 2014 Decision Rendered by Division II of Korean Patent Court for Korean Patent Invalidation Action No. 2013HEO3944 (with English translation). |
| May 15, 2014 Decision Rendered by Division II of Korean Patent Court for Korean Patent Invalidation Action No. 2013HEO3951 (with English translation). |
| May 15, 2014 Decision Rendered by Division II of Korean Patent Court for Korean Patent Invalidation Action No. 2013HEO3975 (with English translation). |
| May 15, 2014 Decision Rendered by Division II of Korean Patent Court for Korean Patent Invalidation Action No. 2013HEO3982 (with English translation). |
| Apr. 4, 2014 Office Action issued in Chinese Patent Application No. 200910173718.X (with translation). |
| Apr. 16, 2014 Office Action issued in U.S. Appl. No. 12/458,635. |
| Apr. 23, 2014 Submission Document, Patent Invalidation Action No. 2013HEO3920, issued in Korean Patent Application No. 10-2007-7022489 (with translation). |
| Apr. 23, 2014 Submission Document, Patent Invalidation Action No. 2013HEO3937, issued in Korean Patent Application No. 10-2006-7008368 (with translation). |
| Apr. 23, 2014 Submission Document, Patent Invalidation Action No. 2013HEO3944, issued in Korean Patent Application No. 10-2008-7019081 (with translation). |
| Apr. 23, 2014 Submission Document, Patent Invalidation Action No. 2013HEO3951, issued in Korean Patent Application No. 10-2008-7019082 (with translation). |
| Apr. 23, 2014 Submission Document, Patent Invalidation Action No. 2013HEO3975, issued in Korean Patent Application No. 10-2007-7022489 (with translation). |
| Apr. 23, 2014 Submission Document, Patent Invalidation Action No. 2013HEO3982, issued in Korean Patent Application No. 10-2008-7019081 (with translation). |
| Apr. 29, 2014 Office Action issued in European Patent Application No. 13156325.6. |
| Apr. 29, 2014 Office Action issued in European Patent Application No. 13156324.9. |
| Apr. 29, 2014 Office Action issued in European Patent Application No. 13156322.3. |
| Feb. 13, 2014 Office Action issued in Chinese Patent Application No. 200910126047.1 (with translation). |
| Jan. 23, 2014 Reference Document, Patent Invalidation Action No. 2013HEO3920, issued in Korean Patent Application No. 10-2007-7022489 (with translation). |
| Jan. 23, 2014 Reference Document, Patent Invalidation Action No. 2013HEO3937, issued in Korean Patent Application No. 10-2006-7008368 (with translation). |
| Jan. 23, 2014 Reference Document, Patent Invalidation Action No. 2013HEO3944, issued in Korean Patent Application No. 10-2008-7019081 (with translation). |
| Jan. 23, 2014 Reference Document, Patent Invalidation Action No. 2013HEO3951, issued in Korean Patent Application No. 10-2008-7019082 (with translation). |
| Jan. 23, 2014 Reference Document, Patent Invalidation Action No. 2013HEO3975, issued in Korean Patent Application No. 10-2007-7022489 (with translation). |
| Jan. 23, 2014 Reference Document, Patent Invalidation Action No. 2013HEO3982, issued in Korean Patent Application No. 10-2008-7019081 (with translation). |
| Mar. 14, 2014 Office Action issued in U.S. Appl. No. 13/889,798. |
| Jun. 13, 2014 Office Action issued in Taiwanese Patent Application No. 101133189 (with translation). |
| Jun. 13, 2014 Office Action issued in Taiwanese Patent Application No. 101141665 (with translation). |
| Aug. 11, 2014 Office Action issued in Taiwanese Patent Application No. 101102214 (with translation). |
| Aug. 6, 2014 Office Action issued in U.S. Appl. No. 13/889,965. |
| Jun. 24, 2014 Office Action issued in European Patent Application No. 04 817 303.3. |
| Jun. 26, 2014 Search Report issued in European Patent Application No. 13 165 334.7. |
| Jun. 26, 2014 Search Report issued in European Patent Application No. 13 165 335.4. |
| Jun. 26, 2014 Search Report issued in European Patent Application No. 13 165 338.8. |
| Jun. 26, 2014 Search Report issued in European Patent Application No. 13 165 340.4. |
| Aug. 28, 2014 Office Action issued in Korean Patent Application No. 2012-7034128 (with translation). |
| Oct. 21, 2014 Office Action issued in Japanese Application No. P2013-272100 with translation. |
| Nov. 5, 2014 Office Action issued in Chinese Application No. 200910126047.1 with translation. |
| Dec. 2, 2014 Office Action issued in Japanese Application No. 2013-272068 with translation. |
| Jan. 6, 2014 Office Action issued in Chinese Patent Application No. 200910173717.5. |
| Feb. 5, 2014 Office Action issued in U.S. Appl. No. 12/382,277. |
| Feb. 6, 2014 Office Action issued in U.S. Appl. No. 13/890,547. |
| Jan. 29, 2015 Office Action issued in U.S. Appl. No. 13/889,860. |
| The Second Division of Korean Patent Court, “Preparatory Document (3), Re: Patent Invalidation Action 2013HEO3920, Plaintiff: Carl Zeiss SMT GmbH, Defendant: Nikon Corporation”Dec. 13, 2013. |
| The Second Division of Korean Patent Court, “Preparatory Document (2), Re: Patent Invalidation Action 2013HEO3920, Plaintiff: Carl Zeiss SMT GmbH, Defendant: Nikon Corporation”Oct. 30, 2013. |
| The Second Division of Korean Patent Court, “Preparatory Document (3), Re: Patent Invalidation Action 2013HEO3937, Plaintiff: Carl Zeiss SMT GmbH, Defendant: Nikon Corporation”Dec. 13, 2013. |
| The Second Division of Korean Patent Court, “Preparatory Document (3), Re: Patent Invalidation Action 2013HEO3944, Plaintiff: Carl Zeiss SMT GmbH, Defendant: Nikon Corporation”Dec. 13, 2013. |
| The Second Division of Korean Patent Court, “Preparatory Document (2), Re: Patent Invalidation Action 2013HEO3944, Plaintiff: Carl Zeiss SMT GmbH, Defendant: Nikon Corporation”Oct. 30, 2013. |
| The Second Division of Korean Patent Court, “Preparatory Document (3), Re: Patent Invalidation Action 2013HEO3951, Plaintiff: Carl Zeiss SMT GmbH, Defendant: Nikon Corporation”Dec. 13, 2013. |
| The Second Division of Korean Patent Court, “Preparatory Document (2), Re: Patent Invalidation Action 2013HEO3951, Plaintiff: Carl Zeiss SMT GmbH, Defendant: Nikon Corporation”Oct. 30, 2013. |
| The Second Division of Korean Patent Court, “Reference Document, Re: Patent Invalidation Action 2013HEO3975, Plaintiff: Nikon Corporation, Defendant: Carl Zeiss SMT GmbH ”Jan. 14, 2014. |
| Feb. 2, 2015 Office Action issued in U.S. Appl. No. 13/912,832. |
| Feb. 5, 2015 Office Action issued in U.S. Appl. No. 12/289,515. |
| Feb. 10, 2015 Office Action issued in Korean Patent Application No. 10-2014-7003559. |
| Feb. 11, 2015 Office Action issued in Korean Patent Application No. 10-2010-7008441. |
| Jun. 3, 2014 Office Action issued in Japanese Patent Application No. P2013-157042 (with translation). |
| Jun. 3, 2014 Office Action issued in Japanese Patent Application No. P2013-157044 (with translation). |
| Jun. 6, 2014 Office Action issued in Taiwanese Patent Application No. 101103772 (with translation). |
| Sep. 10, 2014 Office Action issued in U.S. Appl. No. 13/890,547. |
| Jun. 25, 2014 Office Action issued in U.S. Appl. No. 13/889,860. |
| Jun. 27, 2014 Office Action issued in U.S. Appl. No. 13/912,832. |
| Jul. 16, 2014 Office Action issued in U.S. Appl. No. 12/289,515. |
| Aug. 6, 2014 Office Action issued in U.S. Appl. No. 13/137,342. |
| Aug. 6, 2014 Office Action issued in U.S. Appl. No. 13/137,003. |
| Aug. 6, 2014 Office Action issued in U.S. Appl. No. 13/137,002. |
| Sep. 11, 2014 Office Action issued in U.S. Appl. No. 12/382,277. |
| Dec. 10, 2014 Office Action issued in U.S. Appl. No. 12/289,518. |
| Nov. 16, 2015 Office Action issued in Korean Application No. 10-2014-7003559. |
| Feb. 1, 2016 Office Action issued in Korean Application No. 10-2015-7005285. |
| Jan. 27, 2016 Office Action issued in Taiwanese Application No. 103116066. |
| Mar. 24, 2015 Office Action issued in Japanese Patent Application No. P2014-087750. |
| Apr. 6, 2015 Office Action issued in U.S. Appl. No. 14/048,563. |
| Apr. 27, 2015 Office Action issued in Korean Application No. 10-2014-7009172. |
| Apr. 21, 2015 Office Action issued in U.S. Appl. No. 13/890,547. |
| Jun. 23, 2015 Office Action issued in Japanese Application No. 2014-158994. |
| Jul. 16, 2015 Office Action issued in U.S. Appl. No. 13/912,832. |
| Jul. 20, 2015 Notice of Allowance issued in U.S. Appl. No. 13/067,958. |
| Jul. 15, 2015 Office Action issued in U.S. Appl. No. 12/289,515. |
| Jul. 16, 2015 Office Action issued in U.S. Appl. No. 13/889,860. |
| Aug. 4, 2015 Office Action issued in Japanese Application No. 2014-197119. |
| Aug. 4, 2015 Office Action issued in Japanese Application No. 2014-216961. |
| Aug. 4, 2015 Office Action issued in Japanese Application No. 2014-216964. |
| Oct. 8, 2015 Office Action issued in Korean application No. 10-2010-7008441. |
| Oct. 6, 2015 Office Action issued in Japanese Application No. 2014-256977. |
| Oct. 22, 2015 Office Action issued in U.S. Appl. No. 14/713,428. |
| Oct. 22, 2015 Office Action issued in U.S. Appl. No. 14/048,563. |
| Jan. 21, 2016 Advisory Action issued in U.S. Appl. No. 13/889,860. |
| Jan. 21, 2016 Advisory Action issued in U.S. Appl. No. 12/289,515. |
| Dec. 30, 2015 Office Action issued in Taiwanese Application No. 102142028. |
| Dec. 1, 2015 Office Action issued in Korean Application No. 10-2014-7036570. |
| Jan. 5, 2016 Office Action issued in Japanese Application No. 2015-018675. |
| Jan. 12, 2016 Office Action issued in Taiwanese Application No. 103116064. |
| Jun. 14, 2016 Office Action issued in Japanese Patent Application No. 2014-256977. |
| Sep. 6, 2016 Office Action issued in Japanese Application No. P2015-238871. |
| Mar. 24, 2016 Office Action issued in U.S. Appl. No. 13/890,547. |
| May 17, 2016 Office Action issued in U.S. Appl. No. 14/713,385. |
| May 24, 2016 Office Action issued in Japanese Application No. JP2015-165058. |
| Oct. 11, 2016 Office Action issued in Korean Application No. 10-2015-7005285. |
| Oct. 3, 2016 Office Action issued in Korean Application No. 10-2014-7036570. |
| Sep. 28, 2016 Office Action issued in Korean Application No. 10-2015-7022796. |
| Nov. 29, 2016 Office Action issued in Japanese Patent Application No. 2016-043787. |
| Jan. 17, 2017 Office Action issued in European Application No. 16167687.9. |
| Dec. 21, 2016 Office Action issued in U.S. Appl. No. 14/818,788. |
| Feb. 7, 2017 Office Action issued in Japanese Application No. 2015-198071. |
| Feb. 7, 2017 Office Action issued in Taiwanese Application No. 104133625. |
| Mar. 16, 2017 Office Action issued in Taiwanese Application No. 105123963. |
| Apr. 25, 2017 Office Action issued in Japanese Application No. 2016-145649. |
| Number | Date | Country | |
|---|---|---|---|
| 20130308113 A1 | Nov 2013 | US |
| Number | Date | Country | |
|---|---|---|---|
| Parent | 11902282 | Sep 2007 | US |
| Child | 13890142 | US | |
| Parent | 11246642 | Oct 2005 | US |
| Child | 11902282 | US | |
| Parent | PCT/JP2004/004522 | Mar 2004 | US |
| Child | 11246642 | US |
