Claims
- 1. A method of producing an ink jet print head, the method which comprises:providing a substrate and placing ink ejection elements at locations of the substrate where ink ducts of the ink jet print head are to be formed, the substrate defining side walls of the ducts to be formed; depositing a first layer on the substrate; structuring the first layer with a multiplicity of openings above locations where the ink ducts are to be formed; isotropicaly etching the substrate through the openings in the first layer until the ink ducts have been etched in the substrate; depositing a second layer on the first layer and closing the openings; and forming each of the ducts with an outlet opening at a respective end thereof.
- 2. The method according to claim 1, wherein the providing step comprises depositing the substrate from a material selected from the group consisting of plasma oxide, polysiloxanes, and polyimide with a thickness of between substantially 5 μm to 50 μm onto a base plate.
- 3. The method according to claim 1, wherein the structuring step comprises a photolithographic and subsequent dry etching process.
- 4. The method according to claim 1, wherein the substrate is formed from a material selected from the group consisting of plasma oxide and polysiloxanes, and wherein the first layer is formed from a material selected from the group consisting of polysilicon and silicon nitride, and wherein the structuring step comprises a photolithographic and subsequent isotropic etching process.
- 5. The method according to claim 4, wherein the isotropic etching process is a dry etching process with a fluorine-containing plasma in HF steam.
- 6. The method according to claim 4, wherein the isotropic etching process is a wet etching process with BHF.
- 7. The method according to claim 1, wherein the substrate is formed of organic material, and the structuring step comprises a photolithographic and subsequent isotropic etching process with O2 plasma.
- 8. The method according to claim 7, wherein the substrate is formed of polyimide.
- 9. The method according to claim 1, wherein the step of depositing the second layer comprises depositing boron phosphorus silicate glass by CVD deposition.
- 10. The method according to claim 9, which comprises, subsequently to depositing the second layer onto the first layer, performing a flow process at high temperatures.
- 11. The method according to claim 1, wherein the step of depositing the second layer comprises plasma-Si3N4 deposition.
- 12. The method according to claim 11, which comprises, subsequently to depositing the second layer onto the first layer, performing a flow process at high temperatures.
- 13. The method according to claim 1, wherein the providing step comprises, in a first step, depositing the substrate to approximately half a desired thickness of the substrate; in an ensuing step, applying a resistance layer and structuring the resistance layer; and in a further step, depositing a second half of the substrate onto the resistance layer.
- 14. The method according to claim 13, which comprises forming the resistance layer as an erosionproof layer.
- 15. The method according to claim 1, which comprises forming a given opening in the first layer at the ends of each of the ducts, the openings being large enough so that an ensuing operation of depositing the second layer does not close the given openings, and wherein the given openings form the outlet openings.
Priority Claims (1)
| Number |
Date |
Country |
Kind |
| 195 36 429 |
Sep 1995 |
DE |
|
CROSS-REFERENCE TO RELATED APPLICATION
This is a division of U.S. application Ser. No. 09/052,346, filed Mar. 30, 1998 and now U.S. Pat. No. 6,099,106, which was a continuation of copending international application PCT/DE96/01858, filed Sept. 27, 1996, which designated the United States.
US Referenced Citations (8)
Foreign Referenced Citations (5)
| Number |
Date |
Country |
| 30 12 698 |
Mar 1981 |
DE |
| 0 359 417 |
Mar 1990 |
EP |
| 0 434 946 |
Jul 1991 |
EP |
| 0 443 722 |
Aug 1991 |
EP |
| 4-2790 |
Jan 1992 |
JP |
Continuations (1)
|
Number |
Date |
Country |
| Parent |
PCT/DE96/01858 |
Sep 1996 |
US |
| Child |
09/052346 |
|
US |