Integrated interference scanning method

Abstract

An integrated interference scanning method, mainly used to integrate the respective advantages of VSI and PSI measurements, hereby achieving the characteristic of high precision and limitless measurement range. In particular, the slope correction factor and the displacement correction factor between the VSI measurement and PSI measurement may be utilized to execute the integration calculation of the height data arrays of the VSI and PSI, so that the scanning procedure may be achieved through merely using the wideband light source of the interference scanning system, as such reducing the errors and complexity of the interference scanning system.

Description

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to an integrated interference scanning method, and in particular to an interference scanning method integrating the VSI and PSI measurements.

2. The Prior Arts

In the prior art, the interferometry is utilized to obtain the surface profile of the object to be measured through the interference fringes by making use of the light path difference and interference principle. In general, in terms of computation algorithm, this kind of technology can be classified into: the Vertical Scanning Interferometry (VSI) and Phase Shifting Interferometry (PSI).

In the VSI scanning technology, the advantage of white light having short coherent wavelength is utilized to get rid of the interference noise, and derive the 3-D profile according to the wave-packet interference distribution. The measurement range of VSI algorithm does not have any limitations, and can be utilized to measure the object to be measured having large step height differences. However, if the resolution in the vertical direction is to be raised, then the step magnitude of scan in the vertical direction must be reduced, thus the time spent on measurement will be increased correspondingly. Besides, its major drawback is that the accuracy or precision of measurement is not very satisfactory. In summary, the Vertical Scanning Interferometry (VSI) is suitable for the measurement environment not requiring too much precision, or the object to be measured having rough surface and large step differences. In addition, in PSI scanning technology, it can be used to restore the 3-D profile of the object in cooperation with various phase rebuilt technology. Compared with VSI, PSI may be used to provide better precision, however, the depth measurement range is limited by the measuring light wavelength and the 2π ambiguity, thus it is not suitable for measuring object having step difference grater than λ/4, such as the object to be measured having large step heights. Regarding this, a double-wavelength light wave phase-shift interferometry has been developed recently, which can be used to enlarge the measurement range of large step height. However, when the wavelength of the coherent light wave is longer, it is liable to cause the increase of noise due to self-interference, and this problem is difficult to solve with the present technology.

In this respect, some integrated measurement method is proposed to fully utilize the advantage and redress the shortcomings of the VSI and PSI measurements.

Since the zero optical path difference of VSI is calculated and obtained by utilizing the wave-packet information of the vertical scanning, every individual pixel is independent and is not affected by other pixels. However, in PSI, the height of said point is calculated and obtained by the phase change relative to the adjacent pixels. Yet, in the measurement utilizing PSI, if the light of wideband is utilized as the light source, then the spacings between the interference fringes (namely, the average wavelength) of the interference spectrum are practically affected by the numeral aperture (NA) of the optical system, thus resulting in the deviation between the average wavelength calculated from the spacing between the interference fringes and the actual average wavelength, so that when merging the height information of VSI and PSI, their heights can not be merged directly (since there are the inconsistence of height difference (intersection distance) and inclination (affected by the slope-NA value). For this reason, the conventional technology requires a single frequency light of known wavelength to eliminate such a deviation and achieve precise PSI measurement. Therefore, in this conventional scanning system, in addition to the wideband light source used for VSI measurement, another narrow-band light source is required for PSI measurement

As such, in the conventional scanning system, both the wideband light source and narrow-band light source are provided. Thus, the VSI measurement is first performed utilizing the white light source, then the system is switched to a narrow-band light source by making use of a switching mechanism to perform PSI measurement of the object required, hereby realizing a two-stage measurement. However, in the implementation of this technology, two light sources are required to perform the VSI and PSI measurements respectively, thus an additional mechanism is required to do the switching, hereby raising the cost of the system. Moreover, since a two-stage scanning is required in this conventional measurement, the vertical scan-image-fetching action has to be performed both in VSI and PSI, thus the measurement efficiency is adversely affected.

Therefore, in view of the shortcomings and drawbacks of the interference measurement system of the prior art, the research and development of an integrated interference scanning method, which is capable of providing much more simple, fast and accurate measurement, is the most urgent and important task in this field.

SUMMARY OF THE INVENTION

In view of the shortcomings and drawbacks of the prior art, the objective of the present invention is to provide an integrated interference scanning method, which is utilized to execute the integration calculation of the height data arrays of VSI and PSI by making use of the NA factor (slope correction factor) and the Base Height (displacement correction factor) between the VSI measurement and PSI measurement, so that the interference scanning system of the present invention may be utilized to realize the scanning procedures required by merely utilizing the wideband light source. In other words, in the present invention the slope correction factor is used to correct the wavelength deviation of the distant field, so that there is no need to add an additional narrow-band light source just for the PSI measurement, as such reducing the error and complexity of the interference scanning system. In the following description, for easy explanation and understanding, the NA factor is referred to as the slope correction factor, and the Base Height is referred to as the displacement correction factor.

In accordance with the above-mentioned objective, the present invention provides an integrated interference scanning method, which can be utilized to integrate the height data arrays obtained by making use of Vertical Scanning Interferometry (VSI) and Phase Shifting Interferometry (PSI).

In practice, the integrated interference scanning method of the present invention is realized by firstly proceeding with the scanning of the object to be measured by means of the wideband light source of the interference scanning system, thus obtaining the scanned information. Next, utilizing the VSI to measure and obtain the VSI height data arrays as based on the scanned information thus obtained. Then, utilizing PSI measurement to obtain the PSI height data arrays relative to the position of zero-light-path-difference as based on the same scanned information. And finally, implementing the integration calculation of the VSI height data array and PSI height data array based on the slope correction factor and displacement correction factor between the VSI measurement and PSI measurement.

Further scope of the applicability of the present invention will become apparent from the detailed description given hereinafter. However, it should be understood that the detailed description and specific examples, while indicating preferred embodiments of the present invention, are given by way of illustration only, since various changes and modifications within the spirit and scope of the present invention will become apparent to those skilled in the art from this detailed description.

BRIEF DESCRIPTION OF THE DRAWINGS

The related drawings in connection with the detailed description of the present invention to be made later are described briefly as follows, in which:

FIG. 1 is a schematic diagram of the structure of an interference scanning system according to an embodiment of the present invention; and

FIG. 2A is a schematic diagram of a 90-degree phase shift scanning scheme, which is mainly used on the height distribution of the object in a small range according an embodiment of the present invention; and

FIG. 2B is a schematic diagram of a two-stage scanning scheme, which is mainly used on the height distribution of the object in a large range according an embodiment of the present invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT

The purpose, construction, features, and functions of the present invention can be appreciated and understood more thoroughly through the following detailed description with reference to the attached drawings.

Firstly, please refer to FIG. 1 for a schematic diagram of the structure of an interference scanning system according to an embodiment of the present invention. As shown in FIG. 1, the interference scanning system of the present invention includes: a light source 1, a set of object lenses 2, a light beam guidance device 3, an imaging device 4, and a logic and arithmetic control unit 5.

In short, the essence of the integrated interference scanning method of the present invention lies in conducting the scanning of the object to be measured 6 by utilizing a single and white light source (wideband light source), thus reducing the error and complexity of the scanning system. In implementing the integration calculation of the height data array obtained by the VSI and PSI measurements through scanning by making use of the light emitted by a single white light source (wideband light source), the method of the present invention may be used to obtain the same or better result than that of conventional technology through the utilization of the slope correction factor, displacement correct factor between the VSI measurement and PSI measurement, in particular through the correction of the distant field wavelength deviation with the slope correction factor. Namely, the method of the present invention can be used to achieve the advantages and characteristics of high precision and limitless measurement range by integrating the respective merits of VSI and PSI measurements, thus reducing the error and complexity of the scanning system.

Compared with conventional technology, the method of the present invention may likewise be utilized to conduct gross measurement of the object 6 to be measured by utilizing the characteristics of large range measurement and large step difference measuring capability of the VSI measurement, and then conduct further measurement of the portion requiring minute measurement at the position of the selected zero-light-path-difference by making use of the high degree precision of PSI. Therefore, the similar portions of the present invention relating to PSI and VSI measurements will not be described here in detail, and only the portions different to those of conventional technology will be described in detail.

In the following, two methods of integrating the VSI and PSI measurements will first be described; then it will be described as to how the measured results of VSI and PSI can be integrated by means of slope correction factor and displacement correction factor; and finally, the interference scanning system of the present invention as shown in FIG. 1 will be described in detail.

In the present invention, two methods are utilized to integrate the measurements of VSI and PSI: 90-degree phase shift scanning and two-stage scanning, which is selected to implement according to the height distribution of the object 6 to be measured.

Next, referring to FIGS. 2A to 2B for the schematic diagrams indicating the schemes of integrating the VSI and PSI measurements. FIG. 2A indicates the 90-degree phase shift scanning scheme, which is mainly used on the height distribution of the object 6 in a small range. Since the scanning range is relatively small, thus the scanning needs only be done once on the object 6 to be scanned by the wideband light source of the interference scanning system, then the scanned information thus obtained is used to proceed with the VSI and PSI measurements. On the other hand, the two-stage scanning of the present invention as shown in FIG. 2B is only suitable to use for the height distribution of the object 6 to be measured in a large range.

The reason for the above is that, when the object 6 to be measured is a step height or bump of height of tens of microns, then in this condition if the 90-degree phase shift scanning scheme shown in FIG. 2A is utilized, then the entire scanning process will last too long. However, for the height distribution of the object 6 to be measured in a large range, the two-stage scanning scheme as shown in FIG. 2B is used, so that the scanning process may be completed in a shorter period of time.

In the 90-degree phase shift scanning scheme as shown in FIG. 2A, the wideband light source of the interference scanning system is first utilized to perform the scanning of the object 6 to be measured, then the scanned information thus obtained is provided to use in the subsequent VSI and VPI measurement. Next, the VSI is utilized to measure and obtain the VSI height data array (VSI(i, j)) based on the scanned information. Then, PSI is utilized to measure and obtain the PSI height data array (PSI(i, j)) relative to the position of zero-optical-path-difference (OPD) shown in FIG. 2A as based on the scanned information. And finally, integration calculation of the VSI height data array and PSI height data array is implemented as based on the slope correction factor and the displacement correction factor between VSI measurement and PSI measurement (the details of the integration calculation will be explained in detail later).

In the two-stage scanning scheme as shown in FIG. 2B, the scanning is performed twice by utilizing a first scan interval and a second scan interval respectively (with the first scan interval greater than the second scan interval, and the second scan interval is 90°), thus obtaining the first scanning information and the second scanning information, then proceed to implement the integration calculation required.

More specifically, in the integrated interference scanning method of the present invention, the light emitted from the wideband light source of the interference scanning system is first used to scan the object 6 to be measured according to the first scan interval, thus obtaining the first scanned information. Then, VSI is utilized to measure and obtain the VSI height data array (VSI(i, j)) based on the first scanned information. Then, the interference scan system having wideband light source is used to perform the scanning of the object 6 to be measured by using the second scan interval to obtain the second scanned information, and utilize PSI to measure and obtain the PSI height data array (PSI (i, j)) based on the second scanned information. And finally, the integration calculation is performed for the VSI height data array and PSI height data array based on the slope correction factor and the displacement correction factor.

Regardless of the above-mentioned VSI and PSI height data array obtained through the 90-degree phase shift scan as shown in FIG. 2A or the two-stage scan as shown in FIG. 2B, the VSI height data array VSI (i, j) and PSI height data array PSI (i, j) obtained by utilizing the integrated interference scanning method or the technology as disclosed in U.S. Pat. No. 5,471,303, have to be combined and then corrected due to the difference of the their seeding points. In the method of the present invention, the combination and correction are realized by slope and displacement respectively, namely, it is realized through the slope correction factor and displacement correction factor between the VSI measurement and the PSI measurement.

Since in the PSI height data array, the pixel point of the best quality is selected as the PSI seeding point, while the scan starting point for the object to be measured is selected as the VSI seeding point, thus the difference of height of VSI seeding point VSI(X_{seeding point}, Y_{seeding point}) and PSI seeding point PSI (X_{seeding point}, Y_{seeding point}) is considered as the displacement correction factor. For detailed description of the algorithm of the displacement correction factor, please refer to U.S. Pat. No. 5,471,303.

In order to overcome and correct the distant field wavelength deviation produced during PSI measurement by utilizing the wideband light source, in the integrated interference scanning method of the present invention, the slope correction factor is used to correct the wavelength deviation of distant field without having to additionally install narrow-band light source just for PSI measurement, thus reducing the error and complexity of the scanning system. The calculation of the slope correction factor (NA factor) is as follows: NA factor=Slope (VSI(i,j))/Slope (PSI(i,j));

Namely, the slopes {Slope(VSI(i, j), Slope(PSI(i, j))) of VSI and PSI are calculated respectively through the linear equation fitting coefficient according to the height data arrays of VSI and PSI. Then, the slope correction factor is obtained through dividing the slope of VSI by the slope of PSI.

Upon obtaining the slope correction factor and the displacement correction factor, the integration calculation may be performed to convert the PSI height data array into the VSI height data array by using these two factors. The integration equation is as follows: If (Height (i,j) is in the selected PSI area), then Height (i,j)=PSI(i,j)×NA factor+Base Height Else Height(i,j)=VSI(i,j) Namely, the PSI height data array multiplied by the slope correction factor and then added by the displacement correction factor, and the resulting PSI height data array thus obtained can then be put together with the VSI height data array for integration calculation.

In the following, the structure and functions of the interference scanning system utilized by the interference scanning method of the present invention will be described in detail.

Compared with the structure disclosed in U.S. Pat. No. 5,471,303, only one set of wideband light source 1 is required to be used in the interference scanning system of the present invention. Moreover, since there is need to switch between two light sources, thus the interference scanning system of the present invention is not provided with switching device.

As shown in FIG. 1, the interference scanning system includes the following devices: a light source 1, which is used to generate the incident light beam 11 of the light source signal, and in particular generate the incident light beam 11 of the white light source signal; a set of object lenses 2, which includes the interference object lenses and the focal length adjustment means; a light beam guidance device 3, which is an optical mechanism and is used to guide the light source signal in the light beam guidance system, and it can be for example, a light splitter; an imaging device 4, which is an optical device having image fetching means, and it can be for example a CCD or CMOS optical sensing element and the related control and signal transmission circuit; and a logic-arithmetic-control unit 5, which is composed of a logic-arithmetic means, a memory means, and a control means, and can be realized with an electronic circuit or a computer system, and its logic-arithmetic means can be used to perform the VSI operation and PSI operation. Thus, in the above-mentioned structure, an incident light beam 11 coming from a light source 1 is reflected by the light beam guidance device 3 to a set of object lenses 2, so that the incident light beam 11 reaches the object 6 to be measured and is reflected into the reflected light 41 containing interference signal, which passes the set of object lenses 2 and is fetched by the imaging device 4 after penetrating through the light beam guidance device 3. As such, the logic-arithmetic-control unit 5 may proceed to record the optical information of the object 6 to be measured as fetched by the imaging device 4 by means of the control means and the memory means, so that the interference scanning method of the present invention may be utilized to calculate the optical information fetched by the imaging device 4 and obtain the surface profile information of the object 6 to be measured through the logic-arithmetic means of the logic-arithmetic-control unit 5.

The above detailed description of the preferred embodiment is intended to describe more clearly the characteristics and spirit of the present invention. However, the preferred embodiments disclosed above are not intended to be any restrictions to the scope of the present invention. Conversely, its purpose is to include the various changes and equivalent arrangements that are within the scope of the appended claims.

Claims

1. An integrated interference scanning method, which is used to integrate a height data array measured and obtained by the vertical scanning interferometry (VSI) and a height data array measured and obtained by the phase shifting interferometry (PSI), said height data array can be used to calculate the surface profile of an object to be measured, the integrated interference scanning method comprising the following steps: scanning said object to be measured through an interference scanning system having a wideband light source, and obtaining the scanned information; utilizing VSI to measure said height data array of VSI based on said scanned information thus obtained; utilizing PSI to measure said height data array of PSI relative to the position of zero-light-path-difference as based on said scanned information; and executing the integration calculation of said VSI height data array and PSI height data array as based on a slope correction factor and a displacement correction factor between the VSI measurement and PSI measurement.

2. The integrated interference scanning method as claimed in claim 1, wherein said interference scanning system comprises a wideband light source, a set of object lenses, a light beam guidance device, an imaging device, and a logic-arithmetic-control unit.

3. The integrated interference scanning method as claimed in claim 1, wherein the step of calculating said slope correction factor further comprising: obtaining the slopes of VSI and PSI respectively through the linear equation fitting coefficient as based on said height data arrays of VSI and PSI; and obtaining said slope correction factor by dividing the slope of VSI by the slope of PSI.

4. The integrated interference scanning method as claimed in claim 1, wherein the pixel point having the best phase quality in said height data array of PSI is selected as a PSI seeding point, and the scanning starting point of said object to be measured is selected as a VSI seeding point, the step of calculating said displacement correction factor further comprising: calculating the height difference of said VSI seeding point and said PSI seeding point as said displacement correction factor.

5. The integrated interference scanning method as claimed in claim 1, wherein the step of executing the integration calculation of said VSI height data array and said PSI height data array further comprising the step of: executing the integration calculation of said PSI height data array and said VSI height data array, only after multiplying said PSI height data array by said slope correction factor, and then adding to the result thus obtained with said displacement correction factor.

6. An integrated interference scanning method, which is used to integrate a height data array measured and obtained by the vertical scanning interferometry (VSI) and a height data array measured and obtained by the phase shifting interferometry (PSI), said height data array can be used to calculate the surface profile of an object to be measured, the integrated interference scanning method comprising the following steps: scanning the object to be measured with a first scan interval through an interference scanning system having a wideband light source, and obtaining a first scanned information; utilizing VSI to measure said height data array of VSI based on said first scanned information thus obtained; scanning the object to be measured relative to a position of zero-light-path-difference with a second scan interval through an interference scanning system having a wideband light source, and obtaining a second scanned information; utilizing PSI to measure said height data array of PSI relative to the position of zero-light-path-difference as based on said second scanned information; and executing the integration calculation of said VSI height data array and said PSI height data array as based on a slope correction factor and a displacement correction factor between the VSI measurement and PSI measurement; wherein, said first scan interval is larger than said second scan interval.

7. The integrated interference scanning method as claimed in claim 6, wherein said integrated interference scanning system is mainly composed of a wideband light source, a set of object lenses, a light beam guidance device, an imaging device, and a logic-arithmetic-control unit.

8. The integrated interference scanning method as claimed in claim 6, wherein the step of calculating said slope correction factor further comprising: obtaining the slopes of VSI and PSI respectively through the linear equation fitting coefficient as based on said height data arrays of VSI and PSI; and obtaining said slope correction factor by dividing the slope of VSI by the slope of PSI.

9. The integrated interference scanning method as claimed in claim 6, wherein the pixel point having the best phase quality in said height data array of PSI is selected as a PSI seeding point, and the scanning starting point of said object to be measured is selected as a VSI seeding point, the step of calculating said displacement correction factor further comprising: calculating the height difference of said VSI seeding point and said PSI seeding point as said displacement correction factor.

10. The integrated interference scanning method as claimed in claim 6, wherein the 7 steps of executing the integration calculation of said VSI height data array and said PSI height data array further comprising the step of: executing the integration calculation of said PSI height data array and said VSI height data array, only after multiplying said PSI height data array by said slope correction factor, and then adding to the result thus obtained with said displacement correction factor.