by calibration or testing of interferometer

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CPC
G01B9/02072

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02072by calibration or testing of interferometer

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for determining the local position of at least on...
- Patent number 12,214,441
- Issue date Feb 4, 2025
- ADIGE S.P.A.
- Simone Donadello
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Optical coherence tomography-based intraoral scanner calibration de...
- Patent number 12,062,212
- Issue date Aug 13, 2024
- HUVITZ CO., LTD.
- Hyo Sang Jeong
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical phase locked loops for generating highly-linear frequency c...
- Patent number 12,034,268
- Issue date Jul 9, 2024
- JASR Systems, LLC
- Tianyi Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thickness evaluation method of cell sheet
- Patent number 11,906,301
- Issue date Feb 20, 2024
- SCREEN Holdings Co., Ltd.
- Ryo Hasebe
- G01 - MEASURING TESTING
Information Patent Grant
Frequency-domain interferometric based imaging systems and methods
- Patent number 11,890,052
- Issue date Feb 6, 2024
- Carl Zeiss Meditec, Inc.
- Tilman Schmoll
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus for interferometrically determining a surface s...
- Patent number 11,892,283
- Issue date Feb 6, 2024
- Carl Zeiss SMT GmbH
- Stefan Schulte
- G01 - MEASURING TESTING
Information Patent Grant
Manual calibration of imaging system
- Patent number 11,892,289
- Issue date Feb 6, 2024
- PHILIPS IMAGE GUIDED THERAPY CORPORATION
- Andreas Johansson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for semiconductor chip surface topography metro...
- Patent number 11,796,307
- Issue date Oct 24, 2023
- Yangtze Memory Technologies Co., Ltd.
- Sicong Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating a measuring apparatus
- Patent number 11,774,237
- Issue date Oct 3, 2023
- Carl Zeiss SMT GmbH
- Jochen Hetzler
- G01 - MEASURING TESTING
Information Patent Grant
Device for determining an orientation of an optical device of a coh...
- Patent number 11,623,299
- Issue date Apr 11, 2023
- Precitec GmbH & Co. KG
- Matthias Sauer
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Dynamical modeling of CMMs for numerically correcting measurement r...
- Patent number 11,585,650
- Issue date Feb 21, 2023
- Hexagon Technology Center GmbH
- Claudio Iseli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Calibration method
- Patent number 11,525,664
- Issue date Dec 13, 2022
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring complex degree of coherence of random optical...
- Patent number 11,366,017
- Issue date Jun 21, 2022
- Soochow University
- Yahong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Spatial accuracy correction method and apparatus
- Patent number 11,366,448
- Issue date Jun 21, 2022
- Mitutoyo Corporation
- Shinichiro Yanaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spatial accuracy correction method and apparatus
- Patent number 11,366,447
- Issue date Jun 21, 2022
- Mitutoyo Corporation
- Shinichiro Yanaka
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods for the stabilization of interferometric systems and interf...
- Patent number 11,313,667
- Issue date Apr 26, 2022
- LightOn SAS
- Kilian Müller
- G01 - MEASURING TESTING
Information Patent Grant
Cyclic error measurements and calibration procedures in interferome...
- Patent number 11,287,242
- Issue date Mar 29, 2022
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomographic device comprising dual correction bea...
- Patent number 11,243,066
- Issue date Feb 8, 2022
- Tomey Corporation
- Masahiro Yamanari
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for semiconductor chip surface topography metro...
- Patent number 11,243,067
- Issue date Feb 8, 2022
- Yangtze Memory Technologies Co., Ltd.
- Sicong Wang
- G01 - MEASURING TESTING
Information Patent Grant
Compensation optical system for an interferometric measuring system
- Patent number 11,199,396
- Issue date Dec 14, 2021
- Carl Zeiss SMT GmbH
- Jochen Hetzler
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for motion compensation in interferometric sen...
- Patent number 11,193,751
- Issue date Dec 7, 2021
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G01 - MEASURING TESTING
Information Patent Grant
Phase delay extraction and compensation method in PGC phase demodul...
- Patent number 11,168,975
- Issue date Nov 9, 2021
- Zhejiang Sci-Tech University
- Benyong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer system and use thereof
- Patent number 11,143,498
- Issue date Oct 12, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Huibert Visser
- G01 - MEASURING TESTING
Information Patent Grant
Optical phase measurement method and system
- Patent number 11,029,258
- Issue date Jun 8, 2021
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating an error of installation of an interferomete...
- Patent number 11,022,423
- Issue date Jun 1, 2021
- Tsinghua University
- Yu Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Calibration of an interferometer
- Patent number 11,009,337
- Issue date May 18, 2021
- Haag-Streit AG
- Lucio Robledo
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for optimizing the optical performance of inte...
- Patent number 10,962,348
- Issue date Mar 30, 2021
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Manual calibration of imaging system
- Patent number 10,942,022
- Issue date Mar 9, 2021
- PHILIPS IMAGE GUIDED THERAPY CORPORATION
- Andreas Johansson
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric method and apparatus using calibration information...
- Patent number 10,890,428
- Issue date Jan 12, 2021
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Artifact for determining resolution of imaging based on electromagn...
- Patent number 10,839,558
- Issue date Nov 17, 2020
- NANOFORM FINLAND OYJ
- Edward Hæggström
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ADJUSTMENT METHOD FOR SHAPE MEASURING DEVICE
- Publication number 20240393098
- Publication date Nov 28, 2024
- TOKYO SEIMITSU CO., LTD.
- Yoshiyuki KAWATA
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for 1-Micron Frequency Comb Optical Coherence T...
- Publication number 20240377184
- Publication date Nov 14, 2024
- The Regents of the University of California
- Tristan Melton
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20240361253
- Publication date Oct 31, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING WAFERS
- Publication number 20240310159
- Publication date Sep 19, 2024
- PRECITEC OPTRONIK GMBH
- Stephan Weiß
- G01 - MEASURING TESTING
Information Patent Application
MANUAL CALIBRATION OF IMAGING SYSTEM
- Publication number 20240288262
- Publication date Aug 29, 2024
- PHILIPS IMAGE GUIDED THERAPY CORPORATION
- Andreas JOHANSSON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NIRAF Calibration Packaging Phantom
- Publication number 20240125588
- Publication date Apr 18, 2024
- Canon U.S.A., Inc.
- Emily Chernich
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS
- Publication number 20240115128
- Publication date Apr 11, 2024
- Carl Zeiss Meditec, Inc.
- Tilman Schmoll
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
CALIBRATION OF IMAGING SYSTEM WITH COMBINED OPTICAL COHERENCE TOMOG...
- Publication number 20240027180
- Publication date Jan 25, 2024
- Alcon Inc.
- Wei Wei
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERFERENCE TOMOGRAPHIC IMAGING DEVICE
- Publication number 20230358527
- Publication date Nov 9, 2023
- NEC Corporation
- Shigeru NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM USING ENHANCED STATIC FRINGE CAPTURE
- Publication number 20230213334
- Publication date Jul 6, 2023
- BMV Optical Technologies Inc.
- Curtis Blake LaPlante
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION METHOD OF OPTICAL COHERENCE TOMOGRAPHY DEVICE
- Publication number 20230194238
- Publication date Jun 22, 2023
- HUVITZ CO., LTD.
- Hyo Sang JEONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATION OF AN OPTICAL MEASUREMENT SYSTEM AND OPTICAL...
- Publication number 20230168077
- Publication date Jun 1, 2023
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G01 - MEASURING TESTING
Information Patent Application
Systems, Methods and Computer Program Products for Optimizing Optic...
- Publication number 20230107680
- Publication date Apr 6, 2023
- Leica Microsystems Inc.
- Eric Lynch
- G02 - OPTICS
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING AND CONTROLLING THE SEPARATION DI...
- Publication number 20230013723
- Publication date Jan 19, 2023
- Adige S.p.A.
- Simone DONADELLO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING THE LOCAL POSITION OF AT LEAST ON...
- Publication number 20220410309
- Publication date Dec 29, 2022
- Adige S.p.A.
- Simone DONADELLO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
MEASURING APPARATUS FOR INTERFEROMETRIC SHAPE MEASUREMENT
- Publication number 20220349700
- Publication date Nov 3, 2022
- Carl Zeiss SMT GMBH
- Jochen HETZLER
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS FOR INTERFEROMETRICALLY DETERMINING A SURFACE S...
- Publication number 20220221269
- Publication date Jul 14, 2022
- Carl Zeiss SMT GMBH
- Stefan SCHULTE
- G01 - MEASURING TESTING
Information Patent Application
THICKNESS EVALUATION METHOD OF CELL SHEET
- Publication number 20220090909
- Publication date Mar 24, 2022
- SCREEN Holdings Co., Ltd.
- Ryo Hasebe
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP SURFACE TOPOGRAPHY METRO...
- Publication number 20220057191
- Publication date Feb 24, 2022
- Yangtze Memory Technologies Co., Ltd.
- Sicong Wang
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION METHOD
- Publication number 20220042782
- Publication date Feb 10, 2022
- MITUTOYO CORPORATION
- Masayuki NARA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20210364451
- Publication date Nov 25, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE LOCKED LOOPS FOR GENERATING HIGHLY-LINEAR FREQUENCY C...
- Publication number 20210328402
- Publication date Oct 21, 2021
- JASR Systems, LLC
- Tianyi Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MEASURING COMPLEX DEGREE OF COHERENCE OF RANDOM OPTICAL...
- Publication number 20210278283
- Publication date Sep 9, 2021
- SOOCHOW UNIVERSITY
- Yahong CHEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP SURFACE TOPOGRAPHY METRO...
- Publication number 20210262779
- Publication date Aug 26, 2021
- YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- Sicong Wang
- G01 - MEASURING TESTING
Information Patent Application
DYNAMICAL MODELING OF CMMS FOR NUMERICALLY CORRECTING MEASUREMENT R...
- Publication number 20210190475
- Publication date Jun 24, 2021
- HEXAGON TECHNOLOGY CENTER GMBH
- Claudio ISELI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MANUAL CALIBRATION OF IMAGING SYSTEM
- Publication number 20210190476
- Publication date Jun 24, 2021
- PHILIPS IMAGE GUIDED THERAPY CORPORATION
- Andreas JOHANSSON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR THE STABILIZATION OF NITERFEROMETRIC SYSTEMS AND INTERF...
- Publication number 20210041219
- Publication date Feb 11, 2021
- LightOn SAS
- Kilian Müller
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS
- Publication number 20210007601
- Publication date Jan 14, 2021
- Carl Zeiss Meditec, Inc.
- Tilman SCHMOLL
- G02 - OPTICS
Information Patent Application
AN ARTIFACT FOR DETERMINING RESOLUTION OF IMAGING BASED ON ELECTROM...
- Publication number 20200320741
- Publication date Oct 8, 2020
- ÅBO AKADEMI (ÅBO AKADEMI UNIVERSITY)
- Edward HÆGGSTRÖM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPENSATION OPTICAL SYSTEM FOR AN INTERFEROMETRIC MEASURING SYSTEM
- Publication number 20200225028
- Publication date Jul 16, 2020
- Carl Zeiss SMT GMBH
- Jochen HETZLER
- G01 - MEASURING TESTING

by calibration or testing of interferometer

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and system for determining the local position of at least on...

Optical coherence tomography-based intraoral scanner calibration de...

Optical phase locked loops for generating highly-linear frequency c...

Thickness evaluation method of cell sheet

Frequency-domain interferometric based imaging systems and methods

Measuring apparatus for interferometrically determining a surface s...

Manual calibration of imaging system

Systems and methods for semiconductor chip surface topography metro...

Method for calibrating a measuring apparatus

Device for determining an orientation of an optical device of a coh...

Dynamical modeling of CMMs for numerically correcting measurement r...

Calibration method

Method for measuring complex degree of coherence of random optical...

Spatial accuracy correction method and apparatus

Spatial accuracy correction method and apparatus

Methods for the stabilization of interferometric systems and interf...

Cyclic error measurements and calibration procedures in interferome...

Optical coherence tomographic device comprising dual correction bea...

Systems and methods for semiconductor chip surface topography metro...

Compensation optical system for an interferometric measuring system

Method and apparatus for motion compensation in interferometric sen...

Phase delay extraction and compensation method in PGC phase demodul...

Interferometer system and use thereof

Optical phase measurement method and system

Method for calibrating an error of installation of an interferomete...

Calibration of an interferometer

Method and apparatus for optimizing the optical performance of inte...

Manual calibration of imaging system

Interferometric method and apparatus using calibration information...

Artifact for determining resolution of imaging based on electromagn...

Patents Applicationslast 30 patents

ADJUSTMENT METHOD FOR SHAPE MEASURING DEVICE

Systems and Methods for 1-Micron Frequency Comb Optical Coherence T...

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

DEVICE AND METHOD FOR MEASURING WAFERS

MANUAL CALIBRATION OF IMAGING SYSTEM

NIRAF Calibration Packaging Phantom

FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS

CALIBRATION OF IMAGING SYSTEM WITH COMBINED OPTICAL COHERENCE TOMOG...

OPTICAL INTERFERENCE TOMOGRAPHIC IMAGING DEVICE

OPTICAL SYSTEM USING ENHANCED STATIC FRINGE CAPTURE

CALIBRATION METHOD OF OPTICAL COHERENCE TOMOGRAPHY DEVICE

METHOD FOR CALIBRATION OF AN OPTICAL MEASUREMENT SYSTEM AND OPTICAL...

Systems, Methods and Computer Program Products for Optimizing Optic...

METHOD AND SYSTEM FOR DETERMINING AND CONTROLLING THE SEPARATION DI...

METHOD AND SYSTEM FOR DETERMINING THE LOCAL POSITION OF AT LEAST ON...

MEASURING APPARATUS FOR INTERFEROMETRIC SHAPE MEASUREMENT

MEASURING APPARATUS FOR INTERFEROMETRICALLY DETERMINING A SURFACE S...

THICKNESS EVALUATION METHOD OF CELL SHEET

SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP SURFACE TOPOGRAPHY METRO...

CALIBRATION METHOD

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

OPTICAL PHASE LOCKED LOOPS FOR GENERATING HIGHLY-LINEAR FREQUENCY C...

METHOD FOR MEASURING COMPLEX DEGREE OF COHERENCE OF RANDOM OPTICAL...

SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP SURFACE TOPOGRAPHY METRO...

DYNAMICAL MODELING OF CMMS FOR NUMERICALLY CORRECTING MEASUREMENT R...

MANUAL CALIBRATION OF IMAGING SYSTEM

METHODS FOR THE STABILIZATION OF NITERFEROMETRIC SYSTEMS AND INTERF...

FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS

AN ARTIFACT FOR DETERMINING RESOLUTION OF IMAGING BASED ON ELECTROM...

COMPENSATION OPTICAL SYSTEM FOR AN INTERFEROMETRIC MEASURING SYSTEM